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JPH01165300A - Method for measuring characteristic of loudspeaker system - Google Patents

Method for measuring characteristic of loudspeaker system

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Publication number
JPH01165300A
JPH01165300A JP32435987A JP32435987A JPH01165300A JP H01165300 A JPH01165300 A JP H01165300A JP 32435987 A JP32435987 A JP 32435987A JP 32435987 A JP32435987 A JP 32435987A JP H01165300 A JPH01165300 A JP H01165300A
Authority
JP
Japan
Prior art keywords
measured
acoustic
speaker system
characteristic
acoustic characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32435987A
Other languages
Japanese (ja)
Inventor
Kiyoshi Ito
伊藤 精
Kazuhiro Sakamoto
和博 坂本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Columbia Co Ltd
Original Assignee
Nippon Columbia Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Columbia Co Ltd filed Critical Nippon Columbia Co Ltd
Priority to JP32435987A priority Critical patent/JPH01165300A/en
Publication of JPH01165300A publication Critical patent/JPH01165300A/en
Pending legal-status Critical Current

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  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Abstract

PURPOSE:To obtain the acoustic characteristic of a loudspeaker system with high accuracy by calculating the acoustic characteristic of the system by using three kinds of the acoustic characteristics. CONSTITUTION:The acoustic characteristic found by integrating the surface acoustic pressures on a virtual spherical surface, with a loudspeaker to be measured at the center, in the operating state of an enclosed type loudspeaker system while the passive acoustic output section of the loudspeaker system to be measured is closed tight and the passive operation is checked is represented by A1 and the acoustic characteristic measured in a state where a microphone is brought nearer to the loudspeaker to be measured while the enclosed type loudspeaker system is an operating state is represented by A2. Moreover, the acoustic characteristic found by integrating the acoustic pressures on a virtual spherical surface, with the loudspeaker system to be measured at the center, in a state where the passive acoustic output section of the loudspeaker system to be measured is in an operating state is represented by A3. The acoustic characteristic of the loudspeaker system is calculated by subtracting a correcting characteristic S which is obtained by subtracting the characteristic A2 from the characteristic A1, from the acoustic characteristic A3. Therefor, the acoustic characteristic, especially in a low frequency range, can be measured with high accuracy.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はパッシブな音響出力部を有するスピーカシステ
ムの音響特性の測定方法に関し、特に低域を高精度に測
定する方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for measuring the acoustic characteristics of a speaker system having a passive acoustic output section, and particularly to a method for measuring low frequencies with high accuracy.

〔従来技術〕[Prior art]

従来よシスビーカシステムの音響特性は、一般に無響室
内において第8図のような構成で測定されている。
Conventionally, the acoustic characteristics of a system beaker system have generally been measured in an anechoic chamber with a configuration as shown in FIG.

図に示すように、測定に供されるスピーカシステム2を
無響室81の内部に設置し、この無響室81内に前記ス
ピーカシステム2に対してマイクロホン82を対向設置
する。そして正弦波発振器83の出力信号を信号増幅器
84で増幅してスピーカシステム2を駆動し、スピーカ
システムの音響出力を前記マイクロホン82で検出しマ
イクロホン増幅器85で増幅して記録器86に記録して
いる。
As shown in the figure, the speaker system 2 to be subjected to measurement is installed inside an anechoic chamber 81, and a microphone 82 is installed in the anechoic chamber 81 to face the speaker system 2. Then, the output signal of the sine wave oscillator 83 is amplified by a signal amplifier 84 to drive the speaker system 2, and the acoustic output of the speaker system is detected by the microphone 82, amplified by the microphone amplifier 85, and recorded on a recorder 86. .

該無響室81で測定した特性を第9図91に示すが、完
全な自由音場(音源から距離が2倍離れると、音圧レベ
ルが6dB低下する環境)で得られる特性92と比べて
低域特性で誤差を生じる。
The characteristics measured in the anechoic chamber 81 are shown in FIG. 991, and compared with the characteristics 92 obtained in a completely free sound field (an environment where the sound pressure level decreases by 6 dB when the distance from the sound source is doubled). Errors occur in the low-frequency characteristics.

これは無響室81の自由音場が低域で成立しなくなるた
めである。
This is because the free sound field of the anechoic chamber 81 is no longer established at low frequencies.

もし20Hztで自由音場を成立させるには、−辺が2
0m以上の長さの大きな空間をもつ無響室が必要となシ
犬掛シな設備で大変高価なものになってしまう。
If you want to establish a free sound field at 20Hzt, the − side should be 2.
This requires an anechoic chamber with a large space with a length of 0 m or more, making the equipment very expensive.

低域の測定に関し、無響室を用いずに自由音場特性を得
る方法として、 (1) スピーカシステムにマイクロホンを近接させて
測定する方法 (2)  スピーカシステムのインピーダンス特性のf
oやQ。から算出する方法 (8)  もう一つのスピーカシステムを用いて被測定
用スピーカシステムと近接させ、交互に一方をマイクロ
ホンとして他方のスピーカシステムの音響出力を計測し
、相反の定理を用いて算出する方法 がある。
Regarding low-frequency measurements, there are two ways to obtain free-field characteristics without using an anechoic chamber: (1) Measuring by placing a microphone close to the speaker system (2) Determining f of the impedance characteristics of the speaker system
o and Q. Method (8) Using another speaker system, place it close to the speaker system under test, alternately use one speaker system as a microphone to measure the acoustic output of the other speaker system, and calculate using the reciprocity theorem. There is.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし前述の低域測定法は被測定用スピーカシステムが
密閉蓋で低域の音響出力部がキャビネットのバックル面
に単一に存在する場合は、第10図101.102に示
すように自由音場特性103に近似した特性が得られる
が、第11図に示すように例えばバスレフ型スピーカシ
ステム2で、ボートの開口部111が後面板に設置され
た構造のものは大きな誤差を生じてしまう。
However, when the speaker system under test has a closed lid and the low-frequency sound output section is located solely on the buckle surface of the cabinet, the above-mentioned low-frequency measurement method uses a free sound field as shown in Figure 10 101 and 102. A characteristic similar to characteristic 103 can be obtained, but as shown in FIG. 11, for example, a bass reflex type speaker system 2 having a structure in which the opening 111 of the boat is installed in the rear plate causes a large error.

それは前述のマイクロホンを近接させて測定する方法(
1ンや相反の定理を用いて算出する方法(3)では、前
記バスレフ型システムのボートの音響出力を含めた測定
ができないからである。またインピーダンス特性より算
出する方法(2)では、位相特性を含めた多重共振系の
複雑な計算が必要となシ、さらに音響レベルの較正を別
の方法で算出しなければならず面倒である。
The method described above is to measure by placing the microphones close together (
This is because the calculation method (3), which uses the equation 1 and the reciprocity theorem, does not allow measurement including the acoustic output of the boat of the bass reflex type system. In addition, method (2) of calculating from impedance characteristics requires complicated calculations of a multiple resonance system including phase characteristics, and furthermore, the calibration of the sound level must be calculated using another method, which is troublesome.

本発明は無響室等の高価な設備を用いずに、例えば−船
釣な室内において、バスレフ、パッシブラジェータ、バ
ックロードホーン等のパッシブな音響出力部を有するス
ピーカシステムの低域の自由音場特性を高精度に測定す
る方法を提供するものである。
The present invention enables low-frequency free sound field of a speaker system having a passive acoustic output section such as a bass reflex, a passive radiator, a backload horn, etc., without using expensive equipment such as an anechoic chamber, for example, in a boat fishing room. The present invention provides a method for measuring characteristics with high precision.

〔問題点を解決するための手段〕[Means for solving problems]

本発明はパッシブな音響出力部を有する被測定用スピー
カシステムのパッシブな音響出力部を密閉してパッシブ
動作を制止させ、密閉蓋スピーカシステムの動作状態で
該スピーカシステムを中心とした仮想球面上の表面音圧
を積分して求めた音響特性A、と、前記密閉蓋スピーカ
システムの動作状態でスピーカにマイクロホンを近接さ
せて測定した音響特性A2と、前記被測定用スピーカシ
ステムのパッシブな音響出力部を動作状態にして、該ス
ピーカシステムを中心とした仮想球面上の表面音圧を積
分して求めた音響特性A3とを用いて、上記音響特性人
、から上記音響特性人、を差し引いて補正特性Sとし、
該補正特性Sを上記音響特性A、から差し引いてパッシ
ブな音響出力部を有する被測定用スピーカシステムの音
響特性を算出することによシスピーカシステムの自由音
場特性を測定するものである。
The present invention seals the passive acoustic output section of a speaker system under test having a passive acoustic output section to prevent passive operation, and when the closed-lid speaker system is in operation, a virtual spherical surface centered on the speaker system is formed. Acoustic characteristic A obtained by integrating surface sound pressure; Acoustic characteristic A2 measured by bringing a microphone close to the speaker in the operating state of the sealed lid speaker system; and a passive acoustic output section of the speaker system to be measured. is in an operating state, and the acoustic characteristic A3 obtained by integrating the surface sound pressure on a virtual spherical surface centered on the speaker system is used to subtract the acoustic characteristic human from the acoustic characteristic human to obtain a correction characteristic. S and
The free sound field characteristics of the system speaker system are measured by subtracting the correction characteristic S from the acoustic characteristic A to calculate the acoustic characteristics of the speaker system under test having a passive acoustic output section.

〔作用〕[Effect]

すなわち自由音場において波長の長い低域では、スピー
カシステムのキャビネットは回折効果によシ特性に影響
を及ぼさなくなるので無指向性となシ、スピーカシステ
ムを中心とした半径R(m)の距離をもつ第2図b−に
のような仮想球面上の表面音圧を積分して求めた音響特
性と、スピーカシステムの音響出力放射面中心に対向す
る距離R〔m〕の位置、第2図aにマイクロホンを設置
し測定した音響特性は同じ特性を示す。さらに前述の一
般的な室内において低域の音響出力を単一に有する密閉
蓋スピーカシステムは、スピーカシステムにマイクロホ
ンを近接させて測定する方法(1)やスピーカシステム
のf。+Q、から算出する方法(2)、さらに相反の定
理を用いる方法(3)によっても同様な特性を示す。
In other words, in the low range with long wavelengths in the free field, the cabinet of the speaker system does not affect the characteristics due to diffraction effects, so it is non-directional, and the distance of radius R (m) from the center of the speaker system is The acoustic characteristics obtained by integrating the surface sound pressure on a virtual spherical surface as shown in Fig. 2 b-, and the position at a distance R [m] facing the center of the acoustic output radiation surface of the speaker system, Fig. 2 a The acoustic characteristics measured by installing a microphone in the same area show the same characteristics. Furthermore, the closed-lid speaker system that has a single low-frequency sound output in a general room described above can be measured using method (1) in which a microphone is placed close to the speaker system or f of the speaker system. Similar characteristics are also exhibited by method (2), which is calculated from +Q, and method (3), which uses the reciprocity theorem.

一方一般的なスピーカシステムの音響出力放射面に対向
する位置にマイクロホンを設置して測定した音響!時性
は、室内の壁面からの反射波と直接波との干渉を大きく
受は山谷の大きな特性になる。
On the other hand, the sound was measured by installing a microphone in a position facing the sound output radiation surface of a general speaker system! Temporality is a major characteristic of peaks and troughs, which receive a large amount of interference between reflected waves from indoor walls and direct waves.

またマイクロホンやスピーカシステムの設置位置のわず
かな変化で干渉する周波数が変化するため再現性が乏し
くなるが、一般的な室内でスピーカシステムを中心とす
る仮想球面の表面音圧を積分して求めた音響特性は、前
述の干渉による影響が平均化されるので平滑化した特性
となシ再現性が高くなる。
Furthermore, slight changes in the installation position of the microphone or speaker system will cause the interfering frequencies to change, resulting in poor reproducibility. Since the effects of the above-mentioned interference are averaged out, the acoustic characteristics are smoothed and have high reproducibility.

このような性質を利用して、一般的な室内においてバッ
クプな音響出力部を有するスピーカシステムの自由音場
における音響特性を得るものである0 〔実施例〕 以下本発明の一実施例を図面に基づいて説明する。第1
図は同実施例を示す基本的な測定系統図である。同図に
おいて壁面の一辺が2.5m以上の長さを有する測定す
る部屋1の略中夫に被測定スピーカシステム2を測定す
る部屋の床面よシ上方約1mKスピーカスタンド3を用
いて設置する。
Utilizing these properties, the free field acoustic characteristics of a speaker system having a back-up acoustic output section can be obtained in a general room. I will explain based on this. 1st
The figure is a basic measurement system diagram showing the same embodiment. In the same figure, a speaker system 2 to be measured is installed using a speaker stand 3 approximately 1 m above the floor of the room to be measured approximately in the middle of a room 1 to be measured whose wall surface has a length of 2.5 m or more on one side. .

マイクロホン4aはスピーカシステム2の低音用スピー
カの振動板面中央よシ対向する位置に近接した距離rm
に設置する。該距離rについては詳細を後述する。
The microphone 4a is located at a distance rm close to a position opposite to the center of the diaphragm surface of the bass speaker of the speaker system 2.
to be installed. The distance r will be described in detail later.

マイクロホン4b〜4eはマイクロホンアレーを形成し
ておシ、スピーカシステム2を中心とした仮想半球面の
音圧を積分するためJI8Z8732に定められたマイ
クロホン位置第2図b−にで測定できるように半径1m
の垂直円周上に設置され、水平方向に回転自在にマイク
ロホンアレーが移動して所定の位置で音響特性が得られ
る構成となっている。
The microphones 4b to 4e form a microphone array, and in order to integrate the sound pressure of a virtual hemisphere centered on the speaker system 2, the microphone positions defined in JI8Z8732 are set at a radius so that the microphone position can be measured at the position shown in Fig. 2b-. 1m
The microphone array is installed on the vertical circumference of the microphone, and the microphone array is rotatably moved in the horizontal direction to obtain acoustic characteristics at a predetermined position.

正弦波発振器5の出力を増幅器6によって所定の信号レ
ベルに増幅したのち、被測定用スピーカシステム2に印
加する。その音響出力は、マイクロホン4a〜4eで検
出し切換スイッチ7を介して音響測定器8によって音圧
レベルとして表示される。
After the output of the sine wave oscillator 5 is amplified to a predetermined signal level by the amplifier 6, it is applied to the speaker system 2 under test. The sound output is detected by the microphones 4a to 4e, and displayed as a sound pressure level by the sound measuring device 8 via the changeover switch 7.

以上の構成において第11図に示す後面板にバスレフボ
ートの開口部111を有するバスレフ型スピーカシステ
ム2の測定例で説明する。まf、(スレフポートの開口
部111を木板で密閉して、密閉蓋スピーカシステムの
動作状態とする。そして正弦波発振器5よシ求める周波
数帯域で、特定の周波数の連続した正弦波信号を増幅器
6を介してスピーカシステム2に印加し、マイクロホン
4aによって該スピーカシステムの音響出力を検出し、
音圧レベルの校正された音響測定器8によって音圧レベ
ルL a [dB]を得る。このときのスピーカシステ
ム2とマイクロホン4aとの距離rは10crnとした
。距離r 10(m付近では、20Hzから200Hz
付近まで第3図に示すように自由音場を示す逆2乗特性
が成立し、さらに測定している場所の影響をほとんど受
けずに測定できるので、次式によって1mの距離の自由
音場における音圧レベルLAI (dB)  に換算す
ることができる。
A measurement example of a bass reflex type speaker system 2 having the above configuration and having a bass reflex boat opening 111 in the rear plate shown in FIG. 11 will be explained. (The opening 111 of the slave port is sealed with a wooden board to put the sealed lid speaker system into operation. Then, the sine wave oscillator 5 transmits a continuous sine wave signal of a specific frequency in the desired frequency band to the amplifier 6. to the speaker system 2 via the microphone 4a, and detecting the acoustic output of the speaker system by the microphone 4a;
The sound pressure level L a [dB] is obtained by the sound measuring device 8 whose sound pressure level has been calibrated. The distance r between the speaker system 2 and the microphone 4a at this time was 10 crn. Distance r 10 (20Hz to 200Hz near m)
As shown in Figure 3, an inverse square characteristic indicating a free sound field is established up to the vicinity, and the measurement can be performed with almost no influence from the location where the measurement is being made, so the following equation can be used to calculate It can be converted into sound pressure level LAI (dB).

第4図41に測定する周波数域で各周波数の音圧レベル
L、1を算出して得た特性を示す。
FIG. 441 shows the characteristics obtained by calculating the sound pressure level L, 1 of each frequency in the frequency range to be measured.

次にマイクロホンアレー4b〜4eを用いて、JIf!
3Z8732で指定された各測定位置第2図b−にの音
圧レベルを測定し次式によって仮想半球面の表面音圧の
積分値LA2 (dB:lを算出する。
Next, using the microphone arrays 4b to 4e, JIf!
The sound pressure level at each measurement position in FIG. 2b designated by 3Z8732 is measured, and the integrated value LA2 (dB:l) of the surface sound pressure of the virtual hemisphere is calculated using the following equation.

ここにL 、ti は各測定位置における音圧レベル、
Nは測定点の数を表わす。
Here, L and ti are the sound pressure levels at each measurement position,
N represents the number of measurement points.

算出して得られた音圧レベルLA、は、1mのマイクロ
ホン距離における音圧レベルIJIと測定した室内の環
境の影響を含んでいる。第4図42に測定する周波数域
で各周波数の音圧レベルLA2を算出して得た特性を示
す。
The calculated sound pressure level LA includes the sound pressure level IJI at a microphone distance of 1 m and the influence of the measured indoor environment. FIG. 42 shows the characteristics obtained by calculating the sound pressure level LA2 of each frequency in the frequency range to be measured.

次に被測定用スピーカシステム2の密閉していたバスレ
フ開口部111の木版を外し、求める動作状態にして前
記音圧レベルL、2を測定した同一環境、同一測定条件
で音圧レベルを測定し次式によって仮想半球面の表面音
圧の積分値” A 3を算出する。
Next, remove the wooden block of the sealed bass reflex opening 111 of the speaker system 2 to be measured, set it to the desired operating state, and measure the sound pressure level in the same environment and under the same measurement conditions in which the sound pressure levels L and 2 were measured. The integral value of the surface sound pressure of the virtual hemispherical surface "A3" is calculated using the following equation.

ここにI’ A 3 i は各測定位置における音圧レ
ベルを表わす。
Here, I' A 3 i represents the sound pressure level at each measurement position.

この音圧レベルL A IIは、前記音圧レベルL、!
と同じ周囲の測定環境の影響と求める音圧レベルLMを
含んでいる。第5図に測定する周波数域で各周波数の音
圧レベルL A 3を算出して得た特性を示す。
This sound pressure level L A II is equal to the sound pressure level L,!
This includes the influence of the surrounding measurement environment and the desired sound pressure level LM. FIG. 5 shows the characteristics obtained by calculating the sound pressure level L A 3 of each frequency in the frequency range to be measured.

そこで測定した環境によって自由音場よシ変化した音圧
レベルを補正量り、とし次式によって求める。
Then, the sound pressure level that has changed from the free sound field depending on the environment in which it was measured is corrected and calculated using the following equation.

L、  =  L轟2    L−i    (ctB
l]測定する周波数域で各周波数の補正量り、を算出し
て得た特性を第6図に示す。
L, = L Todoroki 2 Li (ctB
Figure 6 shows the characteristics obtained by calculating the correction amount for each frequency in the frequency range to be measured.

補正量り、と音圧レベルLA3から求める音圧レベルL
、4を次式によって算出スル。
Sound pressure level L obtained from correction scale and sound pressure level LA3
, 4 are calculated using the following formula.

LA4=L、3−L、 CdB:] 第77図1に測定する周波数域で各周波数の音圧レベル
LA4を算出して得た特性を示す。該特性71は自由音
場で測定した特性72と同じ特性となっている。なお本
発明は前記実施例をデジタル化し高速7−リエ変換器と
コンピュータを利用して測定、計算及び制御を行っても
よい。その場合には信号源としてインパルスやランダム
ノイズが適当であシ、またスピーカシステムの印加信号
とマイクロホンの検出信号との伝達関数から周波数応答
を求める方法を利用すれば非定常な連続信号を用いるこ
とも可能である。
LA4=L, 3-L, CdB:] FIG. 77 shows the characteristics obtained by calculating the sound pressure level LA4 of each frequency in the frequency range to be measured. The characteristic 71 is the same as the characteristic 72 measured in a free sound field. Note that the present invention may digitize the above embodiments and perform measurement, calculation, and control using a high-speed 7-lier converter and a computer. In that case, an impulse or random noise is appropriate as the signal source, and if you use a method to calculate the frequency response from the transfer function between the applied signal of the speaker system and the detected signal of the microphone, you can use an unsteady continuous signal. is also possible.

音圧レベルLcL(dB)を得る他の方法としては前記
スピーカシステムのインピーダンス特性のf。
Another method for obtaining the sound pressure level LcL (dB) is to obtain f of the impedance characteristic of the speaker system.

やQ、から算出する方法(2)や相反の定理(3)を用
いて算出する方法を用いてもよい。また、スピーカシス
テムにマイクロホンを近接させて測定する方法(1]の
場合は振動板とマイクロホンとの間の距離を振動板の振
幅で接触しない程度に近づけてもよいし、逆2乗特性の
成立する距離の範囲内で設定してもよい。さらに仮想半
球面上の表面音圧を測定するときのマイクロホン距離R
(m)は被測定スピーカシステムの大きさや測定する部
屋の大きさによって大きくしてもよい。
The method (2) of calculating from ,Q, or the method of calculating using the reciprocity theorem (3) may be used. In addition, in the case of method (1), in which the microphone is placed close to the speaker system for measurement, the distance between the diaphragm and the microphone may be set close enough to avoid contact due to the amplitude of the diaphragm, or the inverse square characteristic can be established. In addition, the microphone distance R when measuring the surface sound pressure on the virtual hemispherical surface may be set within the range of distance R.
(m) may be increased depending on the size of the speaker system to be measured and the size of the room to be measured.

このように本発明はその要旨を逸脱しない範囲で種々変
形して実施することができる。
As described above, the present invention can be implemented with various modifications without departing from the spirit thereof.

〔発明の効果〕〔Effect of the invention〕

本発明によれば無響室を用いずとも例えば−膜室内で、
パッシブな音響出力部の放射方向が、どのような方向に
一つ又は多数有するスピーカシステムでも高精度に音響
特性を得ることが可能となシ、実用上極めて有用である
According to the invention, without using an anechoic chamber, for example - in a membrane chamber,
This is extremely useful in practice since it is possible to obtain acoustic characteristics with high accuracy even in a speaker system having one or a plurality of passive acoustic output parts in any direction.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す測定図、第2図は測定
するマイクロホン位置を示す仮想球面図、第3図は一般
的な室内における逆2乗特性を示す特性図、第4図から
第7図は本発明を説明する特性図、第8図は従来の測定
方法を示す測定系統図、第9図、第10図は従来技術を
説明する特性図、第11図は被測定用スピーカシステム
の断面図を示す。 1・・・測定する部屋 2・・・被測定用スピーカシステム 81・・・無響室 特許出願人   日本コロムビア株式会社第1図 眉液秋(+−I Zl 手続補正書 昭和62年4月20日 昭和62年 特許願 第324359号2 発明の名称 スピーカシステムの特性測定方法 3 補正をする者 事件との関係  特許出願人 住所 郵便番号107 東京都港区赤坂4丁目14番1
4号名称    (4161日本コロムビア株式会社代
表取締役  望月和夫 4 代理人 住所 郵便番号210 神奈川県川崎市川崎区港町5番
1号日本コロムビア株式会社川崎工場内 明細書第1頁3行目「スピーカシステムの特性測定法」
とあろを「スピーカシステムの特性測定方法」と訂正す
る。
Fig. 1 is a measurement diagram showing an embodiment of the present invention, Fig. 2 is a virtual spherical diagram showing the microphone position to be measured, Fig. 3 is a characteristic diagram showing the inverse square characteristic in a general room, and Fig. 4 Fig. 7 is a characteristic diagram explaining the present invention, Fig. 8 is a measurement system diagram showing a conventional measurement method, Figs. A cross-sectional view of the speaker system is shown. 1... Room to be measured 2... Speaker system to be measured 81... Anechoic chamber Patent applicant Nippon Columbia Co., Ltd. Japan, 1986 Patent Application No. 324359 2 Name of the invention Method for measuring characteristics of speaker system 3 Relationship with the case of the person making the amendment Patent applicant address Postal code 107 4-14-1 Akasaka, Minato-ku, Tokyo
No. 4 Name (4161 Nippon Columbia Co., Ltd. Representative Director Kazuo Mochizuki 4 Agent Address Zip Code 210 5-1 Minato-cho, Kawasaki-ku, Kawasaki-shi, Kanagawa Prefecture Nippon Columbia Co., Ltd. Kawasaki Factory Details page 1 line 3 "Speaker system Characteristic measurement method”
Toro is corrected to read "method for measuring characteristics of speaker systems."

Claims (1)

【特許請求の範囲】[Claims] パッシブな音響出力部を有する被測定用スピーカシステ
ムのパッシブな音響出力部を密閉してパッシブ動作を制
止させ、密閉蓋スピーカシステムの動作状態で該スピー
カシステムを中心とした仮想球面上の表面音圧を積分し
て求めた音響特性A_1と、前記密閉蓋スピーカシステ
ムの動作状態でスピーカにマイクロホンを近接させて測
定した音響特性A_2と、前記被測定用スピーカシステ
ムのパッシブな音響出力部を動作状態にして、該スピー
カシステムを中心とした仮想球面上の表面音圧を積分し
て求めた音響特性A_3とを用いて、上記音響特性A_
1から上記音響特性A_2を差し引いて補正特性Sとし
、該補正特性Sを上記音響特性A_3から差し引いてパ
ッシブな音響出力部を有する被測定用スピーカシステム
の音響特性を算出するスピーカシステムの特性測定方法
The passive sound output part of the speaker system under test having a passive sound output part is sealed to prevent passive operation, and the surface sound pressure on a virtual sphere centered on the speaker system is measured in the operating state of the sealed lid speaker system. Acoustic characteristic A_1 obtained by integrating , Acoustic characteristic A_2 measured by bringing a microphone close to the speaker with the sealed lid speaker system in the operating state, and the passive acoustic output part of the speaker system to be measured in the operating state. Then, using the acoustic characteristic A_3 obtained by integrating the surface sound pressure on a virtual spherical surface centered on the speaker system, the above acoustic characteristic A_
A method for measuring characteristics of a speaker system, in which the acoustic characteristic A_2 is subtracted from 1 to obtain a correction characteristic S, and the correction characteristic S is subtracted from the acoustic characteristic A_3 to calculate an acoustic characteristic of a speaker system to be measured having a passive acoustic output section. .
JP32435987A 1987-12-22 1987-12-22 Method for measuring characteristic of loudspeaker system Pending JPH01165300A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32435987A JPH01165300A (en) 1987-12-22 1987-12-22 Method for measuring characteristic of loudspeaker system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32435987A JPH01165300A (en) 1987-12-22 1987-12-22 Method for measuring characteristic of loudspeaker system

Publications (1)

Publication Number Publication Date
JPH01165300A true JPH01165300A (en) 1989-06-29

Family

ID=18164903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32435987A Pending JPH01165300A (en) 1987-12-22 1987-12-22 Method for measuring characteristic of loudspeaker system

Country Status (1)

Country Link
JP (1) JPH01165300A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008541654A (en) * 2005-05-18 2008-11-20 リアル サウンド ラボ,エスアイエー Method for correcting acoustic parameters of electroacoustic transducer and apparatus for realizing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008541654A (en) * 2005-05-18 2008-11-20 リアル サウンド ラボ,エスアイエー Method for correcting acoustic parameters of electroacoustic transducer and apparatus for realizing the same

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