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JPH0943096A - Characteristics measuring method for light amplifier - Google Patents

Characteristics measuring method for light amplifier

Info

Publication number
JPH0943096A
JPH0943096A JP19139595A JP19139595A JPH0943096A JP H0943096 A JPH0943096 A JP H0943096A JP 19139595 A JP19139595 A JP 19139595A JP 19139595 A JP19139595 A JP 19139595A JP H0943096 A JPH0943096 A JP H0943096A
Authority
JP
Japan
Prior art keywords
light
power
optical amplifier
probe light
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19139595A
Other languages
Japanese (ja)
Other versions
JP3220723B2 (en
Inventor
Akira Sasaki
亮 佐々木
Shigeru Shikii
滋 式井
Mikiya Suzuki
幹哉 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP19139595A priority Critical patent/JP3220723B2/en
Publication of JPH0943096A publication Critical patent/JPH0943096A/en
Application granted granted Critical
Publication of JP3220723B2 publication Critical patent/JP3220723B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To enable characteristics measurement for the light amplifier even containing an isolator by, under the conditions when the light amplifier of measuring system is included and not included, measuring probe light and signal light according to the power difference between them, and finding input/output powers of the light amplifier for calculation of the gain. SOLUTION: With the measuring system excluding a light amplifier 15, the probe light of specified wave length is emitted from a light source 17, and the power of input probe light of the amplifier 15 is measured at a measurement end 14. At this time, light attenuators 12 and 18 change the power difference of the signal light and the probe light. Then, the power of natural emission light possessed by the signal light near the probe light is measured. From this, relating to the probe light inputted in the amplifier 15, the power is obtained in correspondence with the power difference from the signal light. Then, with the measuring system containing the amplifier 15, the power of natural emission light of both the probe light and the signal light are, likewise, measured at a measurement end 16 for each power difference. From this, the output power of the probe light of the amplifier 15 is obtained, and based on this and the input power, the gain of the amplifier 15 is calculated.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、光通信に用いられ
る光増幅器の利得や雑音指数などの特性を測定する方法
に関し、特に信号光によって固定された光増幅器の反転
分布状態に影響を与えない程度にパワーが弱いプローブ
光を利用した光増幅器の特性測定方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring characteristics such as gain and noise figure of an optical amplifier used in optical communication, and particularly does not affect the population inversion state of the optical amplifier fixed by signal light. The present invention relates to a characteristic measuring method of an optical amplifier using a probe light whose power is moderately weak.

【0002】[0002]

【従来の技術】この種の測定方法として、従来、文献
「S.L.Hansen et al.,IEEE PHOTONICS TECHNOLOGY LETT
ERS,VOL.5,NO.12,pp.1433-1435 DECEMBER 1993」に開示
された方法が知られている。すなわち、この測定方法
は、信号光によって固定された光増幅器の反転分布状態
に影響を与えない程度にパワーが弱いプローブ光を用い
て光増幅器の利得を測定するものである。ここに、反転
分布状態とは、遷移が行われる2つの準位の間で、ある
エネルギー準位に分布する粒子の数が、より低いエネル
ギー準位に分布する粒子の数よりも多くなった状態を言
う。
2. Description of the Related Art As a measuring method of this kind, a conventional method "SL Hansen et al., IEEE PHOTONICS TECHNOLOGY LETT" has been used.
ERS, VOL.5, NO.12, pp.1433-1435 DECEMBER 1993 ”is known. That is, this measuring method is to measure the gain of the optical amplifier by using the probe light whose power is weak enough not to affect the population inversion state of the optical amplifier fixed by the signal light. Here, the population inversion state is a state in which the number of particles distributed at a certain energy level between two levels at which transition occurs is larger than the number of particles distributed at a lower energy level. Say

【0003】図8に、従来の測定方法が適用される測定
系の構成を示す。図8において、信号光用光源81から
出射される信号光は、光減衰器82で減衰された後、光
カプラ83を介して入力信号光パワーモニタ用測定端8
4に導かれるとともに、測定対象の光増幅器85を通過
した後光カプラ86を介して出力信号光パワーモニタ用
測定端87に導かれる。一方、プローブ光用光源88か
ら出射される測定のためのプローブ光は、光を決められ
た方向にのみ通過させるための光アイソレータ89を通
過した後、光カプラ86を介して入力プローブ光パワー
モニタ用測定端90に導かれるとともに、光増幅器85
をその出力側から通過した後光カプラ83を介して出力
プローブ光パワーモニタ用測定端91に導かれる。
FIG. 8 shows the configuration of a measuring system to which a conventional measuring method is applied. In FIG. 8, the signal light emitted from the signal light source 81 is attenuated by the optical attenuator 82, and then is transmitted through the optical coupler 83 to the input signal light power monitor measuring end 8.
4 and the optical amplifier 85 to be measured, and then is guided to the output signal light power monitor measuring end 87 via the optical coupler 86. On the other hand, the probe light for measurement emitted from the light source 88 for probe light passes through the optical isolator 89 for passing the light only in a predetermined direction, and then the input probe light power monitor via the optical coupler 86. Optical amplifier 85
After passing from the output side, it is guided to the output probe light power monitor measuring end 91 via the optical coupler 83.

【0004】この測定系においては、利得を測定するた
めのプローブ光を、光増幅器85に対してその出力側か
ら入射させることによって信号光と逆方向に伝搬させる
構成を採っており、これにより十分なダイナミックレン
ジを確保しつつ利得を測定することができる。なお、パ
ワーモニタ用測定端84,87,90,91には、光ス
ペクトルアナライザ(図示せず)を配することによって
光パワーの測定が行われ、その測定結果に基づいて所定
の演算式を用いて利得の算出が行われる。
In this measuring system, the probe light for measuring the gain is made to enter the optical amplifier 85 from the output side thereof and propagated in the direction opposite to the signal light, which is sufficient. It is possible to measure the gain while ensuring a wide dynamic range. An optical spectrum analyzer (not shown) is arranged at the power monitor measuring ends 84, 87, 90, 91 to measure the optical power, and a predetermined arithmetic expression is used based on the measurement result. Then, the gain is calculated.

【0005】[0005]

【発明が解決しようとする課題】ところで、光増幅器と
しては、通常、反射による特性劣化防止用に光アイソレ
ータを内蔵したものが用いられる。ここに、光アイソレ
ータとは、入射側から出射側に進む順方向の光について
は低損失で、出射側から入射側に戻る逆方向の光につい
ては高損失の特性を持たせ、光を決められた方向にのみ
通過させる光受動部品である。
By the way, as an optical amplifier, one having an optical isolator for preventing characteristic deterioration due to reflection is usually used. Here, an optical isolator is characterized by low loss for forward light traveling from the incident side to the outgoing side and high loss for backward light returning from the outgoing side to the incident side. It is an optical passive component that allows light to pass through only in the vertical direction.

【0006】しかしながら、上述した従来の光増幅器の
特性測定方法では、プローブ光を信号光と逆方向に伝搬
させる構成を採っていることから、光アイソレータを内
蔵しない光増幅器には対応できるものの、光アイソレー
タを内蔵した光増幅器については、プローブ光を信号光
と逆方向に伝搬させることができないため、その特性を
測定することはできないという問題があった。また、プ
ローブ光のパワーについては、どの程度が信号光によっ
て固定された光増幅器の反転分布状態に影響を与えない
程度に弱いパワーであるかが不明確であるという問題も
あった。
However, the above-described conventional optical amplifier characteristic measuring method adopts a configuration in which the probe light is propagated in the opposite direction to the signal light, so that it can be applied to an optical amplifier without a built-in optical isolator. The optical amplifier with a built-in isolator has a problem that its characteristics cannot be measured because the probe light cannot be propagated in the opposite direction to the signal light. Further, there is a problem in that it is unclear as to how much the power of the probe light is such weak power that it does not affect the population inversion state of the optical amplifier fixed by the signal light.

【0007】[0007]

【課題を解決するための手段】本発明による光増幅器の
特性測定方法では、先ず、光増幅器を取り除いた測定系
において、光増幅器に入力する所定波長のプローブ光の
パワーおよびプローブ光近傍の信号光が持つ自然放出光
のパワーを、信号光とプローブ光のパワー差を変化させ
つつ測定し、この測定したプローブ光のパワーおよび自
然放出光のパワーに基づいて光増幅器に入力する真のプ
ローブ光の入力パワーを算出する一方、光増幅器を含め
た測定系において、光増幅器に対してその入力側からプ
ローブ光および信号光を入射させ、光増幅器から出力さ
れるプローブ光のパワーおよびプローブ光近傍の増幅さ
れた自然放出光のパワーを、信号光とプローブ光のそれ
ぞれのパワー差に対して測定し、この測定したプローブ
光のパワーおよび自然放出光のパワーに基づいて光増幅
器から出力される真のプローブ光の出力パワーを算出
し、この算出した入力パワーおよび出力パワーに基づい
て光増幅器の利得を算出する。
In the method for measuring the characteristics of an optical amplifier according to the present invention, first, in a measurement system in which the optical amplifier is removed, the power of the probe light having a predetermined wavelength input to the optical amplifier and the signal light near the probe light are input. The power of the spontaneous emission light possessed by is measured while changing the power difference between the signal light and the probe light, and the true probe light input to the optical amplifier based on the measured power of the probe light and the power of the spontaneous emission light is measured. While calculating the input power, in the measurement system including the optical amplifier, the probe light and the signal light are made incident on the optical amplifier from the input side, and the power of the probe light output from the optical amplifier and the amplification in the vicinity of the probe light are amplified. The power of the spontaneous emission light is measured with respect to the power difference between the signal light and the probe light, and the measured power of the probe light and Natural calculates the true output power of the probe light output from the optical amplifier based on the power of the emitted light, and calculates the gain of the optical amplifier based on the calculated input power and output power.

【0008】この特性測定方法では、光増幅器を含めた
測定系において、光増幅器に対してその入力側からプロ
ーブ光および信号光を入射させて、光増幅器から出力さ
れるプローブ光のパワーおよびプローブ光近傍の増幅さ
れた自然放出光のパワーを測定することになり、したが
ってプローブ光を信号光と同一方向に伝搬させての測定
となる。
According to this characteristic measuring method, in a measuring system including an optical amplifier, the probe light and the signal light are made incident on the optical amplifier from the input side thereof, and the power of the probe light and the probe light outputted from the optical amplifier. The power of the amplified spontaneous emission light in the vicinity is measured, and therefore, the measurement is performed by propagating the probe light in the same direction as the signal light.

【0009】本発明による光増幅器の特性測定方法では
さらに、一度測定した光増幅器の測定結果を利用し、信
号光とプローブ光のそれぞれのパワー差を変化させつつ
光増幅器の利得の変化を評価し、その評価の結果から信
号光によって固定された光増幅器の反転分布状態に影響
を与えないプローブ光のパワー範囲を決定する。
In the optical amplifier characteristic measuring method according to the present invention, the change in the gain of the optical amplifier is evaluated while changing the power difference between the signal light and the probe light by using the measurement result of the optical amplifier once measured. The power range of the probe light that does not affect the population inversion state of the optical amplifier fixed by the signal light is determined from the result of the evaluation.

【0010】この特性測定において、光増幅器に入力す
る信号光とプローブ光のパワー差を横軸に、光増幅器の
利得、即ちプローブ光および信号光の各利得を縦軸にし
て示すことで、プローブ光および信号光の各利得が、光
増幅器に入力する信号光とプローブ光のパワー差によっ
て変化しない領域が求まる。この領域が、信号光によっ
て固定された光増幅器の反転分布状態に影響を与えない
プローブ光の領域、即ちパワー範囲となる。
In this characteristic measurement, the power difference between the signal light and the probe light input to the optical amplifier is shown on the abscissa, and the gain of the optical amplifier, that is, each gain of the probe light and the signal light is shown on the ordinate. A region where the respective gains of the light and the signal light do not change due to the power difference between the signal light and the probe light input to the optical amplifier can be obtained. This region is the region of the probe light that does not affect the population inversion state of the optical amplifier fixed by the signal light, that is, the power range.

【0011】[0011]

【発明の実施の形態】以下、本発明の実施の形態につい
て図面を参照しつつ詳細に説明する。図2は、本発明に
よる特性測定方法が適用される測定系の構成図である。
図2において、信号光用光源11から出射される信号光
は、光減衰器12で減衰された後、光カプラ13を介し
て入力信号光パワーモニタ用測定端14に導かれるとと
もに、測定対象の光増幅器15を通過して出力信号光パ
ワーモニタ用測定端16に導かれる。一方、プローブ光
用光源17から出射されるプローブ光は、光減衰器18
で減衰された後、光カプラ13を介してプローブ光パワ
ーモニタ用測定端14に導かれるとともに、光増幅器1
5を通過してプローブ光パワーモニタ用測定端16に導
かれる。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 2 is a configuration diagram of a measurement system to which the characteristic measuring method according to the present invention is applied.
In FIG. 2, the signal light emitted from the signal light source 11 is attenuated by the optical attenuator 12, then guided to the input signal light power monitor measuring end 14 via the optical coupler 13, and the signal light of the measurement target is measured. It passes through the optical amplifier 15 and is guided to the output signal light power monitor measuring end 16. On the other hand, the probe light emitted from the probe light source 17 is transmitted to the optical attenuator 18
After being attenuated by the optical amplifier 1, it is guided to the probe light power monitor measuring end 14 through the optical coupler 13 and the optical amplifier 1
After passing through 5, the light is guided to the measuring end 16 for the probe light power monitor.

【0012】上記構成の測定系において、光減衰器1
2,18としては、その減衰量が可変な構成のものが用
いられる。また、入力信号光/プローブ光のパワーおよ
び出力信号光/プローブ光のパワーについては、測定端
14および16に配される光スペクトルアナライザ(図
示せず)によって測定するものとする。なお、光増幅器
15については、測定系から適宜取り外し可能な構成と
なっている。
In the measurement system having the above structure, the optical attenuator 1
As the elements 2 and 18, those having a variable attenuation amount are used. Further, the power of the input signal light / probe light and the power of the output signal light / probe light are measured by an optical spectrum analyzer (not shown) arranged at the measuring ends 14 and 16. The optical amplifier 15 has a configuration that can be appropriately removed from the measurement system.

【0013】次に、本発明の第1の実施形態に係る特性
測定方法の測定手順について、図1のフローチャートに
したがって説明する。先ず、光増幅器15を取り除いた
測定系において、プローブ光用光源17から所定波長の
プローブ光を出射し、光増幅器15に入力するプローブ
光のパワーPin(λcenter)[dBm] を測定する(ステ
ップS11)。このとき、入力するプローブ光のパワー
については、信号光によって固定された光増幅器15の
反転分布状態に影響を与えない程度に弱いことが必須で
ある。
Next, the measurement procedure of the characteristic measuring method according to the first embodiment of the present invention will be described with reference to the flowchart of FIG. First, in the measurement system without the optical amplifier 15, the probe light source 17 emits probe light of a predetermined wavelength, and the power Pin (λcenter) [dBm] of the probe light input to the optical amplifier 15 is measured (step S11). ). At this time, it is essential that the power of the input probe light is weak enough not to affect the population inversion state of the optical amplifier 15 fixed by the signal light.

【0014】このため、光減衰器12,18の減衰量を
変えることによって信号光とプローブ光のパワー差を変
化させる。一例として、信号光とプローブ光のパワー差
は、5〜50dBとする。また、光増幅器15に入力す
るプローブ光の波長は、信号光の波長とは異なる波長と
する。一例として、光増幅器15に入力するプローブ光
の波長を、信号光の波長に対して±2nm程度離れた波
長とする。
Therefore, the power difference between the signal light and the probe light is changed by changing the attenuation amount of the optical attenuators 12 and 18. As an example, the power difference between the signal light and the probe light is 5 to 50 dB. The wavelength of the probe light input to the optical amplifier 15 is different from the wavelength of the signal light. As an example, it is assumed that the wavelength of the probe light input to the optical amplifier 15 is a wavelength separated by about ± 2 nm from the wavelength of the signal light.

【0015】次いで、ステップS11の場合と同じ系、
即ち光増幅器15を取り除いた測定系において、光増幅
器15に入力するプローブ光近傍の信号光が持つ自然放
出光のパワーPsse(λ)[dBm] を測定する(ステップ
S12)。図3(a)に、入力信号光/プローブ光パワ
ーモニタ用測定端14で測定される光スペクトルとその
測定値の関係を示す。そして、その測定結果に基づい
て、(1)式を用いて光増幅器15に入力する真のプロ
ーブ光のパワーPin(λ)[dBm] を、信号光とプロー
ブ光のそれぞれのパワー差に対して算出する(ステップ
S13)。
Next, the same system as in step S11,
That is, in the measurement system from which the optical amplifier 15 is removed, the power Psse (λ) [dBm] of the spontaneous emission light of the signal light near the probe light input to the optical amplifier 15 is measured (step S12). FIG. 3A shows the relationship between the optical spectrum measured at the measuring end 14 for the input signal light / probe light power monitor and its measured value. Then, based on the measurement result, the power Pin (λ) [dBm] of the true probe light input to the optical amplifier 15 is calculated with respect to the power difference between the signal light and the probe light by using the equation (1). Calculate (step S13).

【数1】 [Equation 1]

【0016】次に、光増幅器15を含めた測定系におい
て、光増幅器15から出力されるプローブ光のパワーP
out(λcenter)[dBm] を、信号光とプローブ光のそれ
ぞれのパワー差に対して測定する(ステップS14)。
次いで、ステップS14と同じ系、即ち光増幅器15を
含めた測定系において、光増幅器15から出力されるプ
ローブ光近傍の増幅された自然放出光のパワーPase
(λ)[dBm] を、信号光とプローブ光のそれぞれのパ
ワー差に対して測定する(ステップS15)。図3
(b)に、出力信号光/プローブ光パワーモニタ用測定
端16で測定される光スペクトルとその測定値の関係を
示す。そして、その測定結果に基づいて、(2)式を用
いて光増幅器15から出力される真のプローブ光のパワ
ーPout(λ)[dBm] を算出する(ステップS16)。
Next, in the measurement system including the optical amplifier 15, the power P of the probe light output from the optical amplifier 15
out (λcenter) [dBm] is measured for each power difference between the signal light and the probe light (step S14).
Next, in the same system as in step S14, that is, in the measurement system including the optical amplifier 15, the power Pase of the amplified spontaneous emission light near the probe light output from the optical amplifier 15 is increased.
(λ) [dBm] is measured for each power difference between the signal light and the probe light (step S15). FIG.
(B) shows the relationship between the optical spectrum measured at the output signal light / probe optical power monitor measuring end 16 and its measured value. Then, based on the measurement result, the power Pout (λ) [dBm] of the true probe light output from the optical amplifier 15 is calculated using the equation (2) (step S16).

【数2】 [Equation 2]

【0017】以上の測定および算出結果から、(3)式
を用いて、光増幅器15の利得Gain(λ)を、信号
光とプローブ光のそれぞれのパワー差に対して算出する
(ステップS17)。
From the above measurement and calculation results, the gain Gain (λ) of the optical amplifier 15 is calculated for each power difference between the signal light and the probe light using the equation (3) (step S17).

【数3】 次いで、光増幅器15に入力する信号光とプローブ光の
パワー差Dを横軸に、光増幅器15の利得(プローブ光
および信号の各利得)を縦軸にしたグラフを作成し、プ
ローブ光の利得と信号光の利得が、光増幅器15に入力
する信号光とプローブ光のパワー差Dによって変化しな
いパワー範囲、即ちプローブ光が信号光によって固定さ
れた光増幅器15の反転分布状態に影響を与えない領域
を求める(ステップS18)。
(Equation 3) Next, a graph is created in which the horizontal axis represents the power difference D between the signal light and the probe light input to the optical amplifier 15, and the vertical axis represents the gain of the optical amplifier 15 (probe light and signal gain). And the gain of the signal light does not affect the power range in which the power difference D between the signal light and the probe light input to the optical amplifier 15 does not change, that is, the population inversion of the optical amplifier 15 in which the probe light is fixed by the signal light is not affected. The area is obtained (step S18).

【0018】一例として、エルビウムドープ光ファイバ
増幅器の測定結果を図4に示す。なお、このときの信号
光の波長は1552nmであり、プローブ光の波長は1
548〜1550nmの範囲の利得を平均化している。
図4より、プローブ光によって光増幅器の利得が受ける
影響を0.1dB以下とするためには、信号光とプロー
ブ光のパワー差Dを15dB以上にすれば良いことがわ
かる。
As an example, the measurement result of an erbium-doped optical fiber amplifier is shown in FIG. The wavelength of the signal light at this time is 1552 nm, and the wavelength of the probe light is 1
The gain in the range of 548 to 1550 nm is averaged.
From FIG. 4, it is understood that the power difference D between the signal light and the probe light may be set to 15 dB or more in order to reduce the influence of the probe light on the gain of the optical amplifier to 0.1 dB or less.

【0019】上述したように、本発明の第1の実施形態
では、光増幅器15を含めた測定系において、光増幅器
15に対してその入力側からプローブ光および信号光を
入射させて、光増幅器15から出力されるプローブ光の
パワーPout(λcenter)[dBm] およびプローブ光近傍
の増幅された自然放出光のパワーPase(λ)[dBm]を
測定するようにしたことにより、プローブ光を信号光と
同一方向に伝搬させての測定となるため、反射による特
性劣化防止用に光アイソレータを内蔵した光増幅器につ
いてもその利得などの特性の測定が可能となる。
As described above, in the first embodiment of the present invention, in the measurement system including the optical amplifier 15, the probe light and the signal light are made incident on the optical amplifier 15 from the input side thereof, and the optical amplifier 15 is inputted. By measuring the power Pout (λcenter) [dBm] of the probe light output from 15 and the power Pase (λ) [dBm] of the amplified spontaneous emission light near the probe light, the probe light is converted into the signal light. Since the measurement is performed by propagating in the same direction as above, it is possible to measure the characteristics such as the gain of an optical amplifier including an optical isolator for preventing characteristic deterioration due to reflection.

【0020】また、プローブ光により光増幅器15の利
得特性を調べ、光増幅器15に入力する信号光とプロー
ブ光のパワー差Dを横軸に、光増幅器15のプローブ光
の利得と信号光の利得を縦軸にして示すことにより、プ
ローブ光の利得と信号光の利得が、光増幅器15に入力
する信号光とプローブ光のパワー差Dによって変化しな
いパワー範囲、即ちプローブ光が信号光によって固定さ
れた光増幅器15の反転分布状態に影響を与えない領域
を求めることができるため、当該反転分布状態に影響を
与えないプローブ光のパワーの程度がどの程度かを明確
にすることができる。
Further, the gain characteristic of the optical amplifier 15 is examined with the probe light, and the gain D of the probe light and the gain of the signal light of the optical amplifier 15 are plotted with the power difference D between the signal light and the probe light input to the optical amplifier 15 as the horizontal axis. Is plotted on the vertical axis, the power range in which the gain of the probe light and the gain of the signal light do not change due to the power difference D between the signal light and the probe light input to the optical amplifier 15, that is, the probe light is fixed by the signal light. Since it is possible to obtain a region that does not affect the population inversion state of the optical amplifier 15, it is possible to clarify how much the probe light power does not affect the population inversion state.

【0021】次に、本発明の第2の実施形態に係る特性
測定方法の測定手順について、図5のフローチャートに
したがって説明する。なお、この第2の実施形態では、
第1の実施形態で求めた信号光によって固定された光増
幅器15の反転分布状態に影響を与えないパワー範囲の
プローブ光を用いて測定を行うものとする。一例とし
て、信号光とのパワー差が15dBのプローブ光を用い
る。このパワー差は、光減衰器12,18の減衰量を変
えることによって調整可能である。
Next, the measurement procedure of the characteristic measuring method according to the second embodiment of the present invention will be described with reference to the flowchart of FIG. In the second embodiment,
It is assumed that the measurement is performed using the probe light in the power range that does not affect the population inversion state of the optical amplifier 15 fixed by the signal light obtained in the first embodiment. As an example, probe light with a power difference of 15 dB from the signal light is used. This power difference can be adjusted by changing the attenuation amount of the optical attenuators 12 and 18.

【0022】先ず、光増幅器15を取り除いた測定系に
おいて、プローブ光用光源17から所定の波長(一例と
して、信号光の波長に対して±2nm)のプローブ光を
出射し、光増幅器15に入力するプローブ光のパワーP
in(λcenter)[dBm] を測定する(ステップS2
1)。次いで、ステップS21の場合と同じ系、即ち光
増幅器15を取り除いた測定系において、光増幅器15
に入力するプローブ光近傍の信号光が持つ自然放出光の
パワーPsse(λ)[dBm] を測定する(ステップS2
2)。そして、その測定結果に基づいて、(1)式を用
いて光増幅器15に入力する真のプローブ光のパワーP
in(λ)[dBm] を、信号光とプローブ光のそれぞれの
パワー差に対して算出する(ステップS23)。
First, in the measurement system from which the optical amplifier 15 is removed, the probe light source 17 emits a probe light of a predetermined wavelength (for example, ± 2 nm with respect to the wavelength of the signal light) and inputs it to the optical amplifier 15. Power of probe light P
in (λcenter) [dBm] is measured (step S2
1). Next, in the same system as in step S21, that is, in the measurement system in which the optical amplifier 15 is removed, the optical amplifier 15
The power Psse (λ) [dBm] of the spontaneous emission light of the signal light near the probe light input to the laser is measured (step S2).
2). Then, based on the measurement result, the power P of the true probe light input to the optical amplifier 15 using the equation (1) is obtained.
in (λ) [dBm] is calculated for each power difference between the signal light and the probe light (step S23).

【0023】次に、光増幅器15を含めた測定系におい
て、光増幅器15から出力されるプローブ光のパワーP
out(λcenter)[dBm] を、信号光とプローブ光のそれ
ぞれのパワー差に対して測定する(ステップS24)。
次いで、ステップS24と同じ系、即ち光増幅器15を
含めた測定系において、光増幅器15から出力されるプ
ローブ光近傍の増幅された自然放出光のパワーPase
(λ)[dBm] を、信号光とプローブ光のそれぞれのパ
ワー差に対して測定する(ステップS25)。そして、
その測定結果に基づいて、(2)式を用いて光増幅器1
5から出力される真のプローブ光のパワーPout(λ)[d
Bm] を算出する(ステップS26)。
Next, in the measurement system including the optical amplifier 15, the power P of the probe light output from the optical amplifier 15
out (λcenter) [dBm] is measured for each power difference between the signal light and the probe light (step S24).
Next, in the same system as in step S24, that is, in the measurement system including the optical amplifier 15, the power Pase of the amplified spontaneous emission light near the probe light output from the optical amplifier 15 is increased.
(λ) [dBm] is measured for each power difference between the signal light and the probe light (step S25). And
Based on the measurement result, the optical amplifier 1
The power Pout (λ) [d of the true probe light output from 5
Bm] is calculated (step S26).

【0024】以上の測定および算出結果から、(3)式
を用いて光増幅器15の利得Gain(λ)を信号光と
プローブ光のそれぞれのパワー差に対して算出し(ステ
ップS27)、さらに(4)式を用いて光増幅器15の
雑音指数NF(λ)を信号光とプローブ光のそれぞれの
パワー差に対して算出する(ステップS28)。
From the above measurement and calculation results, the gain Gain (λ) of the optical amplifier 15 is calculated for each power difference between the signal light and the probe light using the equation (3) (step S27), and The noise figure NF (λ) of the optical amplifier 15 is calculated using the equation (4) for each power difference between the signal light and the probe light (step S28).

【数4】 ただし、hはプランク定数(6.626×10-34[J・
s] )、νはプローブ光の周波数(ν=c/λ[l/s] 、
c:光の速度(2.998×108[m/s]、λ:プローブ
光の波長、したがって、λ=1550nmのとき、ν=
1.93×1014[l/s] )、ΔνはPase(λ)測定
時の周波数帯域[l/s] である。
(Equation 4) However, h is Planck's constant (6.626 × 10 −34 [J ・
s]), ν is the frequency of the probe light (ν = c / λ [l / s],
c: speed of light (2.998 × 10 8 [m / s], λ: wavelength of probe light, therefore, when λ = 1550 nm, ν =
1.93 × 10 14 [l / s]), and Δν is a frequency band [l / s] at the time of measuring Pase (λ).

【0025】一例として、エルビウムドープ光ファイバ
増幅器の利得Gain(λ)および雑音指数NF(λ)
の測定結果を図6および図7に示す。なお、このときの
信号光の波長は1552nmであり、プローブ光の波長
は1547〜1557nmの範囲で変化させ、信号光と
プローブ光のパワー差を15dBとしている。
As an example, the gain Gain (λ) and the noise figure NF (λ) of the erbium-doped optical fiber amplifier are shown.
The measurement results of are shown in FIGS. 6 and 7. The wavelength of the signal light at this time is 1552 nm, the wavelength of the probe light is changed in the range of 1547 to 1557 nm, and the power difference between the signal light and the probe light is 15 dB.

【0026】上述したように、本発明による第2の実施
形態では、信号光によって固定された光増幅器15の反
転分布状態に影響を与えない程度にパワーが弱いプロー
ブ光の最適なパワー範囲を予め求め、このパワー範囲の
プローブ光を用いて光増幅器15の利得Gain(λ)
および雑音指数NF(λ)を測定を行うようにしたこと
により、最適なパワーのプローブ光を利用しての測定を
実現できるため、光増幅器15の利得Gain(λ)お
よび雑音指数NF(λ)を精度良く測定することができ
る。
As described above, in the second embodiment of the present invention, the optimum power range of the probe light whose power is weak enough not to affect the population inversion state of the optical amplifier 15 fixed by the signal light is set in advance. The gain Gain (λ) of the optical amplifier 15 is obtained by using the probe light in this power range.
By measuring the noise figure NF (λ) and the measurement using the probe light with the optimum power, the gain Gain (λ) and the noise figure NF (λ) of the optical amplifier 15 can be realized. Can be accurately measured.

【0027】なお、本発明による光増幅器の特性測定方
法は、例えば、エルビウムドープ光ファイバ増幅器やプ
ラセオジウムドープ光ファイバ増幅器等、他の希土類を
添付した光ファイバ増幅器、および半導体光増幅器等、
反転分布を形成する光増幅器の利得や雑音指数などの特
性の測定に適用することができる。
The optical amplifier characteristic measuring method according to the present invention is, for example, an erbium-doped optical fiber amplifier, a praseodymium-doped optical fiber amplifier, an optical fiber amplifier to which other rare earths are attached, a semiconductor optical amplifier, or the like.
It can be applied to measurement of characteristics such as gain and noise figure of an optical amplifier that forms an inverted distribution.

【0028】なお、本発明による第1の実施形態では、
プローブ光の最適なパワー範囲を求めるために、光増幅
器15の利得Gain(λ)を算出するとしたが、第1
の実施形態で用いるプローブ光のパワーが最適なもので
あれば、算出した利得Gain(λ)を正式な測定値と
することができるとともに、利得Gain(λ)のみな
らず雑音指数NF(λ)についても、第2の実施形態と
同様にして第1の実施形態で求めることができる。
In the first embodiment according to the present invention,
The gain Gain (λ) of the optical amplifier 15 is calculated in order to obtain the optimum power range of the probe light.
If the power of the probe light used in the embodiment is optimum, the calculated gain Gain (λ) can be used as a formal measurement value, and the gain Gain (λ) as well as the noise figure NF (λ) can be obtained. The same can be obtained in the first embodiment as in the second embodiment.

【0029】[0029]

【発明の効果】以上詳細に説明したように、本発明によ
れば、光増幅器を含めた測定系において、光増幅器に対
してその入力側からプローブ光および信号光を入射させ
て、光増幅器から出力されるプローブ光のパワーおよび
プローブ光近傍の増幅された自然放出光のパワーを測定
するようにしたことにより、プローブ光を信号光と同一
方向に伝搬させての測定となるため、光アイソレータを
内蔵した光増幅器についても、その特性を測定すること
が可能となる。
As described above in detail, according to the present invention, in the measurement system including the optical amplifier, the probe light and the signal light are made incident on the optical amplifier from the input side thereof, and the optical amplifier is operated. By measuring the power of the output probe light and the power of the amplified spontaneous emission light in the vicinity of the probe light, the measurement is performed by propagating the probe light in the same direction as the signal light. The characteristics of the built-in optical amplifier can also be measured.

【0030】また、一度測定した光増幅器の測定結果を
利用し、信号光とプローブ光のそれぞれのパワー差を変
化させつつ光増幅器の利得の変化を評価し、その評価の
結果から信号光によって固定された光増幅器の反転分布
状態に影響を与えないプローブ光のパワー範囲を決定す
るようにしたことにより、プローブ光および信号光の各
利得が、光増幅器に入力する信号光とプローブ光のパワ
ー差によって変化しないパワー範囲、即ちプローブ光が
信号光によって固定された光増幅器の反転分布状態に影
響を与えない領域を求めることができる。したがって、
そのプローブ光を利用すれば、光増幅器の利得や雑音指
数などの特性をより精度良く測定することができる。
Further, by utilizing the measurement result of the optical amplifier once measured, the change of the gain of the optical amplifier is evaluated while changing the power difference between the signal light and the probe light, and the result of the evaluation is fixed by the signal light. By determining the power range of the probe light that does not affect the population inversion of the optical amplifier, the gains of the probe light and the signal light are different from each other. It is possible to obtain a power range that does not change due to, that is, a region where the probe light does not affect the population inversion state of the optical amplifier fixed by the signal light. Therefore,
By using the probe light, the characteristics such as the gain and noise figure of the optical amplifier can be measured more accurately.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施形態に係るフローチャート
である。
FIG. 1 is a flowchart according to a first embodiment of the present invention.

【図2】本発明に係る測定系の構成図である。FIG. 2 is a configuration diagram of a measurement system according to the present invention.

【図3】光スペクトルとその測定値の関係を示す図であ
る。
FIG. 3 is a diagram showing a relationship between an optical spectrum and its measured value.

【図4】エルビウムドープ光ファイバ増幅器におけるパ
ワー差対プローブ光および信号光の各利得の特性図であ
る。
FIG. 4 is a characteristic diagram of power difference vs. gain of probe light and signal light in an erbium-doped optical fiber amplifier.

【図5】本発明の第2の実施形態に係るフローチャート
である。
FIG. 5 is a flowchart according to a second embodiment of the present invention.

【図6】エルビウムドープ光ファイバ増幅器における波
長対プローブ光利得の特性図である。
FIG. 6 is a characteristic diagram of wavelength versus probe light gain in an erbium-doped optical fiber amplifier.

【図7】エルビウムドープ光ファイバ増幅器における波
長対雑音指数の利得の特性図である。
FIG. 7 is a characteristic diagram of gain of wavelength versus noise figure in an erbium-doped optical fiber amplifier.

【図8】従来例に係る測定系の構成図である。FIG. 8 is a configuration diagram of a measurement system according to a conventional example.

【符号の説明】[Explanation of symbols]

11 信号光用光源 12,18 光減衰器 13 光カプラ 14 入力信号光/プローブ光パワーモニタ用測定端 15 光増幅器 16 出力信号光/プローブ光パワーモニタ用測定端 17 プローブ光用光源 11 Light source for signal light 12, 18 Optical attenuator 13 Optical coupler 14 Measuring end for input signal light / probe light power monitor 15 Optical amplifier 16 Measuring end for output signal light / probe light power monitor 17 Light source for probe light

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 信号光によって固定された光増幅器の反
転分布状態に影響を与えない程度にパワーが弱いプロー
ブ光を利用した光増幅器の特性測定方法であって、 先ず、光増幅器を取り除いた測定系において、光増幅器
に入力する所定の波長のプローブ光のパワーおよびプロ
ーブ光近傍の信号光が持つ自然放出光のパワーを、信号
光とプローブ光のパワー差を変化させつつ測定し、 この測定したプローブ光のパワーおよび自然放出光のパ
ワーに基づいて光増幅器に入力する真のプローブ光の入
力パワーを算出し、 次いで、光増幅器を含めた測定系において、光増幅器に
対してその入力側からプローブ光および信号光を入射さ
せ、光増幅器から出力されるプローブ光のパワーおよび
プローブ光近傍の増幅された自然放出光のパワーを、信
号光とプローブ光のそれぞれのパワー差に対して測定
し、 この測定したプローブ光のパワーおよび自然放出光のパ
ワーに基づいて光増幅器から出力される真のプローブ光
の出力パワーを算出し、 前記入力パワーおよび前記出力パワーに基づいて光増幅
器の利得を算出することを特徴とする光増幅器の特性測
定方法。
1. A method for measuring the characteristics of an optical amplifier using probe light whose power is so weak that it does not affect the population inversion state of the optical amplifier fixed by signal light. In the system, the power of the probe light of a predetermined wavelength input to the optical amplifier and the power of the spontaneous emission light of the signal light near the probe light were measured while changing the power difference between the signal light and the probe light. Calculate the input power of the true probe light input to the optical amplifier based on the power of the probe light and the power of the spontaneous emission light, and then, in the measurement system including the optical amplifier, probe the optical amplifier from its input side. Light and signal light are incident, and the power of the probe light output from the optical amplifier and the power of the amplified spontaneous emission light near the probe light are changed to signal light. The output power of the true probe light output from the optical amplifier is calculated based on the measured power of the probe light and the power of the spontaneous emission light measured for each power difference of the probe light. A method for measuring characteristics of an optical amplifier, comprising calculating a gain of the optical amplifier based on the output power.
【請求項2】 前記入力パワーおよび前記出力パワーに
基づいて光増幅器の雑音指数を算出することを特徴とす
る請求項1記載の光増幅器の特性測定方法。
2. The optical amplifier characteristic measuring method according to claim 1, wherein a noise figure of the optical amplifier is calculated based on the input power and the output power.
【請求項3】 信号光とプローブ光のそれぞれのパワー
差を変化させつつ光増幅器の利得の変化を評価し、 その評価の結果から信号光によって固定された光増幅器
の反転分布状態に影響を与えないプローブ光のパワー範
囲を決定することを特徴とする請求項1記載の光増幅器
の特性測定方法。
3. The change in the gain of the optical amplifier is evaluated while changing the power difference between the signal light and the probe light, and the result of the evaluation affects the population inversion state of the optical amplifier fixed by the signal light. 2. The characteristic measuring method for an optical amplifier according to claim 1, wherein the power range of the probe light which is not present is determined.
【請求項4】 請求項3記載の特性測定方法で決定され
たパワー範囲のプローブ光を用いて請求項1又は請求項
2記載の特性測定方法による測定を行うことを特徴とす
る光増幅器の特性測定方法。
4. A characteristic of an optical amplifier, characterized in that measurement is performed by the characteristic measuring method according to claim 1 or 2 by using a probe light having a power range determined by the characteristic measuring method according to claim 3. Measuring method.
JP19139595A 1995-07-27 1995-07-27 Optical amplifier characteristics measurement method Expired - Fee Related JP3220723B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19139595A JP3220723B2 (en) 1995-07-27 1995-07-27 Optical amplifier characteristics measurement method

Publications (2)

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JPH0943096A true JPH0943096A (en) 1997-02-14
JP3220723B2 JP3220723B2 (en) 2001-10-22

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Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999043054A1 (en) * 1998-02-23 1999-08-26 Anritsu Corporation Optical amplifier evaluating method and optical amplifier evaluating apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6516815B1 (en) 1999-07-09 2003-02-11 Applied Materials, Inc. Edge bead removal/spin rinse dry (EBR/SRD) module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999043054A1 (en) * 1998-02-23 1999-08-26 Anritsu Corporation Optical amplifier evaluating method and optical amplifier evaluating apparatus
US6212003B1 (en) 1998-02-23 2001-04-03 Anritsu Corporation Optical amplifier evaluating method and optical amplifier evaluating apparatus

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