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JPH09289375A - Multilayer wiring board - Google Patents

Multilayer wiring board

Info

Publication number
JPH09289375A
JPH09289375A JP10111396A JP10111396A JPH09289375A JP H09289375 A JPH09289375 A JP H09289375A JP 10111396 A JP10111396 A JP 10111396A JP 10111396 A JP10111396 A JP 10111396A JP H09289375 A JPH09289375 A JP H09289375A
Authority
JP
Japan
Prior art keywords
organic resin
insulating layer
resin insulating
thin film
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10111396A
Other languages
Japanese (ja)
Inventor
Seiichi Takami
征一 高見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP10111396A priority Critical patent/JPH09289375A/en
Publication of JPH09289375A publication Critical patent/JPH09289375A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/115Via connections; Lands around holes or via connections
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

(57)【要約】 【課題】有機樹脂絶縁層の上面に形成される段差によっ
て薄膜配線導体に断線が生じる。 【解決手段】絶縁基板1上に、有機樹脂絶縁層2と薄膜
配線導体3とを交互に積層するとともに上下に位置する
薄膜配線導体3を各有機樹脂絶縁層2に設けたスルーホ
ール5の内壁に被着させたスルーホール導体6を介して
接続して成る多層配線基板であって、前記各有機樹脂絶
縁層2のスルーホール5内に上面が各有機樹脂絶縁層2
の上面と実質的に同一である充填物7を充填させた。
(57) Abstract: A disconnection occurs in a thin film wiring conductor due to a step formed on an upper surface of an organic resin insulating layer. SOLUTION: An inner wall of a through hole 5 in which organic resin insulation layers 2 and thin film wiring conductors 3 are alternately laminated on an insulating substrate 1 and upper and lower thin film wiring conductors 3 are provided in each organic resin insulation layer 2 A multi-layer wiring board formed by connecting via through-hole conductors 6 attached to the organic resin insulating layer 2 and having an upper surface in each through hole 5 of each organic resin insulating layer 2.
Was filled with a filling material 7 that was substantially the same as the upper surface.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、多層配線基板に関
し、より詳細には混成集積回路装置や半導体素子を収容
する半導体素子収納用パッケージ等に使用される多層配
線基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multilayer wiring board, and more particularly to a multilayer wiring board used for a hybrid integrated circuit device, a semiconductor element housing package for housing a semiconductor element, and the like.

【0002】[0002]

【従来の技術】従来、混成集積回路装置や半導体素子収
納用パッケージ等に使用される多層配線基板はその配線
導体がMoーMn法等の厚膜形成技術によって形成され
ている。
2. Description of the Related Art Conventionally, in a multilayer wiring board used for a hybrid integrated circuit device, a package for housing a semiconductor element, etc., its wiring conductor is formed by a thick film forming technique such as Mo--Mn method.

【0003】このMoーM法は通常、タングステン、モ
リブデン、マンガン等の高融点金属粉末に有機溶剤、溶
媒を添加混合し、ペースト状となした金属ペーストを生
セラミック体の外表面にスクリーン印刷法により所定パ
ターンに印刷塗布し、次ぎにこれを複数枚積層するとと
もに還元雰囲気中で焼成し、高融点金属粉末と生セラミ
ック体とを焼結一体化させる方法である。
The Mo-M method is usually a screen-printing method in which a high-melting metal powder of tungsten, molybdenum, manganese or the like is mixed with an organic solvent and a solvent to form a paste-like metal paste on the outer surface of the green ceramic body. Is applied in a predetermined pattern by printing, and then a plurality of these are laminated and fired in a reducing atmosphere to sinter and integrate the high melting point metal powder and the green ceramic body.

【0004】尚、前記配線導体が形成されるセラミック
体としては通常、酸化アルミニウム質焼結体やムライト
質焼結体等の酸化物系セラミックス、或いは表面に酸化
物膜を被着させた窒化アルミニウム質焼結体や炭化珪素
質焼結体等の非酸化物系セラミックが使用される。
Incidentally, the ceramic body on which the wiring conductor is formed is usually an oxide ceramic such as an aluminum oxide sintered body or a mullite sintered body, or an aluminum nitride having an oxide film adhered on the surface. Non-oxide ceramics such as a sintered compact or a silicon carbide sintered compact are used.

【0005】しかしながら、このMoーMn法を用いて
配線導体を形成した場合、配線導体は金属ペーストをス
クリーン印刷することにより形成されることから微細化
が困難で配線導体を高密度に形成することができないと
いう欠点を有していた。
However, when the wiring conductor is formed by using this Mo-Mn method, the wiring conductor is formed by screen-printing a metal paste. Therefore, it is difficult to miniaturize the wiring conductor and the wiring conductor can be formed at a high density. It had the drawback of not being able to.

【0006】そこで上記欠点を解消するために配線導体
を従来の厚膜形成技術で形成するのに変えて微細化が可
能な薄膜形成技術を用いて高密度に形成した多層配線基
板が使用されるようになってきた。
In order to solve the above-mentioned drawbacks, therefore, a multilayer wiring board is used which is formed at a high density by using a thin film forming technique capable of miniaturization instead of forming the wiring conductor by a conventional thick film forming technique. It's starting to happen.

【0007】かかる配線導体を薄膜形成技術により形成
した多層配線基板は、酸化アルミニウム質焼結体等から
成るセラミックやガラス繊維を織り込んだガラス布にエ
ポキシ樹脂を含浸させて形成されるガラスエポキシ等か
ら成る絶縁基板の上面にスピンコート法及び熱硬化処理
等によって形成されるエポキシ樹脂等の有機樹脂から成
る絶縁層と、銅やアルミニウム等の金属を無電解メッキ
法や蒸着法等の薄膜形成技術及びフォトリソグラフィー
技術を採用することによって形成される薄膜配線導体と
を交互に多層に配設させるとともに、上下に位置する薄
膜配線導体を有機樹脂絶縁層に設けたスルーホールの内
壁に被着させたスルーホール導体を介して電気的に接続
させた構造を有している。
A multilayer wiring board in which such a wiring conductor is formed by a thin film forming technique is made of glass epoxy or the like formed by impregnating a ceramic made of an aluminum oxide sintered body or the like or a glass cloth woven glass cloth with an epoxy resin. An insulating layer made of an organic resin such as an epoxy resin formed on the upper surface of an insulating substrate by a spin coating method or a thermosetting process, and a thin film forming technique such as an electroless plating method or a vapor deposition method for a metal such as copper or aluminum; Through which thin film wiring conductors formed by adopting photolithography technology are alternately arranged in multiple layers and upper and lower thin film wiring conductors are attached to the inner wall of the through hole provided in the organic resin insulation layer. It has a structure in which it is electrically connected through a hole conductor.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、この従
来の多層配線基板においては、有機樹脂絶縁層と薄膜配
線導体とを交互に積層して多層配線基板となす際、上部
に配される有機樹脂絶縁層の表面に下部に配される有機
樹脂絶縁層に設けたスルーホールに起因して段差が形成
され、該段差によって各有機樹脂絶縁層上に薄膜形成技
術及びフォトリソグラフィー技術を採用することにより
形成される薄膜配線導体の厚みにバラツキや断線が生
じ、多層配線基板として所望する特性を充分に発揮させ
ることができないという欠点を有していた。
However, in this conventional multilayer wiring board, when the organic resin insulating layers and the thin film wiring conductors are alternately laminated to form a multilayer wiring board, the organic resin insulating layer disposed on the upper side is arranged. A step is formed on the surface of the layer due to a through hole provided in the organic resin insulating layer disposed below, and the step is formed by adopting a thin film forming technique and a photolithography technique on each organic resin insulating layer. The thin film wiring conductor thus produced has variations in thickness and wire breakage, and thus has a drawback that the desired characteristics as a multilayer wiring board cannot be sufficiently exhibited.

【0009】[0009]

【課題を解決するための手段】本発明は上記欠点に鑑み
案出されたもので、その目的は有機樹脂絶縁層と薄膜配
線導体とを交互に多層に積層して成る多層配線基板であ
って、前記薄膜配線導体の厚みバラツキ及び断線を有効
に防止し、これによって所望する特性を充分に発揮する
ことがてきる多層配線基板を提供することにある。
SUMMARY OF THE INVENTION The present invention has been devised in view of the above-mentioned drawbacks, and an object thereof is to provide a multilayer wiring board in which organic resin insulating layers and thin film wiring conductors are alternately laminated in multiple layers. Another object of the present invention is to provide a multilayer wiring board which can effectively prevent thickness variation and disconnection of the thin film wiring conductor, and thereby can sufficiently exhibit desired characteristics.

【0010】本発明は、絶縁基板上に、有機樹脂絶縁層
と薄膜配線導体とを交互に積層するとともに上下に位置
する薄膜配線導体を各有機樹脂絶縁層に設けたスルーホ
ールの内壁に被着させたスルーホール導体を介して接続
して成る多層配線基板であって、前記各有機樹脂絶縁層
のスルーホール内に上面が各有機樹脂絶縁層の上面と実
質的に同一である充填物を充填させたことを特徴とする
ものである。
According to the present invention, an organic resin insulating layer and a thin film wiring conductor are alternately laminated on an insulating substrate, and thin film wiring conductors located above and below are adhered to the inner wall of a through hole provided in each organic resin insulating layer. A multi-layer wiring board formed by connecting via through-hole conductors, the upper surface of which is substantially the same as the upper surface of each organic resin insulating layer in the through hole of each organic resin insulating layer. It is characterized by having done.

【0011】また本発明は、前記充填物がスルーホール
導体の表面に被着させたメッキ金属よりなることを特徴
とするものである。
Further, the present invention is characterized in that the filling is made of a plated metal deposited on the surface of the through-hole conductor.

【0012】本発明の多層配線基板によれば、各有機樹
脂絶縁層に設けたスルーホール内に充填物を充填し、各
有機樹脂絶縁層の上面を平坦としたことから各有機樹脂
絶縁層の上面に薄膜形成技術及びフォトリソグラフィー
技術を採用することによって薄膜配線導体を形成した
際、形成される薄膜配線導体に厚みのバラツキや断線が
生じることはなく、その結果、多層配線基板に所望する
特性を充分に発揮させることが可能となる。
According to the multilayer wiring board of the present invention, the filling is filled in the through holes provided in each organic resin insulating layer and the upper surface of each organic resin insulating layer is made flat. When a thin film wiring conductor is formed by adopting thin film forming technology and photolithography technology on the upper surface, there is no variation in thickness or disconnection in the formed thin film wiring conductor, and as a result, the desired characteristics of the multilayer wiring board are obtained. It becomes possible to fully demonstrate.

【0013】また本発明の多層配線基板によれば、前記
各有機樹脂絶縁層に設けたスルーホール内に充填される
充填物をスルーホール導体の表面に被着させたメッキ金
属で形成するようにしておくと、スルーホール内への充
填物の充填が確実、かつ容易となる。
Further, according to the multilayer wiring board of the present invention, the filling material filled in the through holes provided in each of the organic resin insulating layers is formed by the plated metal deposited on the surface of the through hole conductor. If so, the filling of the filling material into the through hole becomes reliable and easy.

【0014】[0014]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。図1は、本発明の多層配線基板の一実
施例を示し、1は絶縁基板、2は有機樹脂絶縁層、3は
薄膜配線導体である。
Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment of a multilayer wiring board according to the present invention, wherein 1 is an insulating substrate, 2 is an organic resin insulating layer, and 3 is a thin film wiring conductor.

【0015】前記絶縁基板1はその上面に有機樹脂絶縁
層2と薄膜配線導体3とから成る多層配線4が配設され
ており、該多層配線4を支持する支持部材として作用す
る。
On the upper surface of the insulating substrate 1, a multi-layer wiring 4 composed of an organic resin insulating layer 2 and a thin-film wiring conductor 3 is disposed, and functions as a support member for supporting the multi-layer wiring 4.

【0016】前記絶縁基板1は酸化アルミニウム質焼結
体やムライト質焼結体等の酸化物系セラミックス、或い
は表面に酸化物膜を有する窒化アルミニウム質焼結体、
炭化珪素質焼結体等の非酸化物系セラミックス、更には
ガラス繊維を織り込んだ布にエポキシ樹脂を含浸させた
ガラスエポキシ樹脂等の電気絶縁材料で形成されてお
り、例えば酸化アルミニウム質焼結体で形成されている
場合には、アルミナ(Al2 3 )、シリカ(Si
2 )、カルシア(CaO)、マグネシア(MgO)等
の原料粉末に適当な有機溶剤、溶媒を添加混合して泥漿
状となすとともにこれを従来周知のドクターブレード法
やカレンダーロール法を採用することによってセラミッ
クグリーンシート(セラミック生シート)を形成し、し
かる後、前記セラミックグリーンシートに適当な打ち抜
き加工を施し、所定形状となすとともに高温(約160
0℃)で焼成することによって、或いはアルミナ等の原
料粉末に適当な有機溶剤、溶媒を添加混合して原料粉末
を調整するとともに該原料粉末をプレス成形機によって
所定形状に成形し、最後に前記成形体を約1600℃の
温度で焼成することによって製作される。
The insulating substrate 1 is made of an oxide ceramic such as an aluminum oxide sintered body or a mullite sintered body, or an aluminum nitride sintered body having an oxide film on its surface.
It is made of a non-oxide ceramic such as a silicon carbide sintered body, and an electrically insulating material such as a glass epoxy resin obtained by impregnating a cloth woven with glass fiber with an epoxy resin. For example, an aluminum oxide sintered body. In the case of being formed of, alumina (Al 2 O 3 ) and silica (Si
O 2 ), calcia (CaO), magnesia (MgO), and other raw material powders are mixed with an appropriate organic solvent and solvent to form a slurry, which is then applied by the well-known doctor blade method or calendar roll method. To form a ceramic green sheet (ceramic green sheet), and then subject the ceramic green sheet to an appropriate punching process to form a predetermined shape and a high temperature (about 160).
(0 ° C.) or by mixing a raw material powder such as alumina with an appropriate organic solvent and solvent to prepare the raw material powder, and molding the raw material powder into a predetermined shape by a press molding machine, and finally It is manufactured by firing the molded body at a temperature of about 1600 ° C.

【0017】また前記絶縁基板1はその上面に有機樹脂
絶縁層2と薄膜配線導体3とが交互に多層に配設されて
多層配線4が被着されており、該多層配線4を構成する
有機樹脂絶縁層2は上下に位置する薄膜配線導体3の電
気的絶縁を図る作用を為すとともに薄膜配線導体3は電
気信号を伝達するための伝達路として作用する。
On the upper surface of the insulating substrate 1, an organic resin insulating layer 2 and thin film wiring conductors 3 are alternately arranged in multiple layers and a multilayer wiring 4 is attached. The resin insulating layer 2 functions to electrically insulate the thin film wiring conductors 3 positioned above and below, and the thin film wiring conductor 3 functions as a transmission path for transmitting an electric signal.

【0018】前記多層配線4の有機樹脂絶縁層2は、エ
ポキシ樹脂、ポリイミド樹脂、ビスマレイミドポリアジ
ド樹脂、ポリフェニレンエーテル樹脂、ふっ素樹脂等の
樹脂から成り、例えば、エポキシ樹脂からなる場合、ビ
スフェノールA型エポキシ樹脂、ノボラック型エポキシ
樹脂、グリシジルエステル型エポキシ樹脂等にアミン系
硬化剤、イミダゾール系硬化剤、酸無水物系硬化剤等の
硬化剤を添加混合してペースト状のエポキシ樹脂前駆体
を得るとともに該エポキシ樹脂前駆体を絶縁基板1の上
部にスピンコート法により被着させ、しかる後、これを
80℃乃至200℃の熱で0.5乃至3時間熱処理し、
熱硬化させることによって形成される。
The organic resin insulation layer 2 of the multi-layer wiring 4 is made of a resin such as an epoxy resin, a polyimide resin, a bismaleimide polyazide resin, a polyphenylene ether resin or a fluorine resin. For example, when it is made of an epoxy resin, it is a bisphenol A type. Along with the epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, etc., a curing agent such as an amine curing agent, an imidazole curing agent, an acid anhydride curing agent is added and mixed to obtain a pasty epoxy resin precursor. The epoxy resin precursor is applied to the upper part of the insulating substrate 1 by spin coating, and then heat-treated at 80 ° C. to 200 ° C. for 0.5 to 3 hours,
It is formed by thermosetting.

【0019】更に前記多層配線4の有機樹脂絶縁層2は
その各々の所定位置に最小径が有機樹脂絶縁層2の厚み
に対して約1.5倍程度のスルーホール5が形成されて
おり、該スルーホール5は後述する有機樹脂絶縁層2を
介して上下に位置する薄膜配線導体3の各々を電気的に
接続するスルーホール導体6を形成するための形成孔と
して作用する。
Further, the organic resin insulating layer 2 of the multi-layer wiring 4 has through holes 5 each having a minimum diameter of about 1.5 times the thickness of the organic resin insulating layer 2 at a predetermined position thereof. The through hole 5 functions as a forming hole for forming a through hole conductor 6 that electrically connects each of the thin film wiring conductors 3 located above and below via the organic resin insulating layer 2 described later.

【0020】前記有機樹脂絶縁層2に設けるスルーホー
ル5は有機樹脂絶縁層2に従来周知のフォトリソグラフ
ィ技術を採用することによって所定の径に形成される。
The through hole 5 provided in the organic resin insulating layer 2 is formed in the organic resin insulating layer 2 to have a predetermined diameter by adopting a conventionally known photolithography technique.

【0021】また前記各有機樹脂絶縁層2の上面には所
定パターンの薄膜配線導体3が、更に各有機樹脂絶縁層
2に設けたスルーホール5の内壁にはスルーホール導体
6が各々配設されており、スルーホール導体6によって
間に有機樹脂絶縁層2を挟んで上下に位置する各薄膜配
線導体3の各々が電気的に接続されるようになってい
る。
A thin-film wiring conductor 3 having a predetermined pattern is provided on the upper surface of each organic resin insulating layer 2, and a through-hole conductor 6 is provided on the inner wall of a through hole 5 provided in each organic resin insulating layer 2. Each of the thin-film wiring conductors 3 located above and below the organic resin insulating layer 2 with the through-hole conductor 6 interposed therebetween is electrically connected.

【0022】前記各有機樹脂絶縁層2の上面及びスルー
ホール5の内壁に配設される薄膜配線導体3及びスルー
ホール導体6は銅、ニッケル、金、アルミニウム等の金
属材料を無電解メッキ法や蒸着法、スパッタリング法等
の薄膜形成技術及びエッチング加工技術を採用すること
によって形成され、例えば銅で形成されている場合に
は、有機樹脂絶縁層2の上面及びスルーホール5の内表
面に硫酸銅0.06モル/リットル、ホルマリン0.3
モル/リットル、水酸化ナトリウム0.35モル/リッ
トル、エチレンジアミン四酢酸0.35モル/リットル
から成る無電解メッキ浴を用いて厚さ1μm乃至40μ
mの銅層を被着させ、しかる後、前記銅層をエッチング
加工法により所定パターンに加工することによって各有
機樹脂絶縁層2間に配設される。この場合、薄膜配線導
体3及びスルーホール導体6は薄膜形成技術により形成
されることから配線の微細化が可能であり、これによっ
て薄膜配線導体3を極めて高密度に形成することが可能
となる。
The thin-film wiring conductors 3 and the through-hole conductors 6 provided on the upper surface of each organic resin insulating layer 2 and the inner wall of the through-hole 5 are made of a metal material such as copper, nickel, gold or aluminum by an electroless plating method. It is formed by adopting a thin film forming technique such as a vapor deposition method and a sputtering method and an etching processing technique. For example, when it is made of copper, copper sulfate is formed on the upper surface of the organic resin insulating layer 2 and the inner surface of the through hole 5. 0.06 mol / l, formalin 0.3
Mol / liter, sodium hydroxide 0.35 mol / liter, ethylenediaminetetraacetic acid 0.35 mol / liter, using an electroless plating bath, thickness of 1 μm to 40 μ
m copper layers are deposited, and then the copper layers are processed into a predetermined pattern by an etching processing method so as to be disposed between the organic resin insulating layers 2. In this case, since the thin-film wiring conductor 3 and the through-hole conductor 6 are formed by a thin-film forming technique, the wiring can be miniaturized, and thereby the thin-film wiring conductor 3 can be formed at an extremely high density.

【0023】尚、前記有機樹脂絶縁層2と薄膜配線導体
3とを交互に多層に配設して形成される多層配線4は各
有機樹脂絶縁層2の上面を中心線平均粗さ(Ra)で
0.05μm≦Ra≦5μmの粗面としておくと有機樹
脂絶縁層2と薄膜配線導体3との接合及び上下に位置す
る有機樹脂絶縁層2同士の接合を強固となすことができ
る。従って、前記多層配線4の各有機樹脂絶縁層2はそ
の上面をエッチング加工法等によって粗し、中心線平均
粗さ(Ra)で0.05μm≦Ra≦5μmの粗面とし
ておくことが好ましい。
The multi-layer wiring 4 formed by alternately arranging the organic resin insulating layers 2 and the thin film wiring conductors 3 in multiple layers forms the center line average roughness (Ra) on the upper surface of each organic resin insulating layer 2. With a rough surface of 0.05 μm ≦ Ra ≦ 5 μm, the organic resin insulating layer 2 and the thin film wiring conductor 3 can be joined firmly and the organic resin insulating layers 2 located above and below can be firmly joined. Therefore, it is preferable that the upper surface of each organic resin insulating layer 2 of the multilayer wiring 4 is roughened by an etching method or the like so that the center line average roughness (Ra) is a rough surface of 0.05 μm ≦ Ra ≦ 5 μm.

【0024】また前記有機樹脂絶縁層2はその各々の厚
みが100μmを越えると有機樹脂絶縁層2にフォトリ
ソグラフィ技術を採用することによってスルーホール5
を形成する際、エッチング加工時間が長くなってスルー
ホール5を所望する鮮明な形状に形成するのが困難とな
り、また5μmm未満となると有機樹脂絶縁層2の上面
に上下に位置する有機樹脂絶縁層2の接合強度を上げる
ための粗面加工を施す際、有機樹脂絶縁層2に不要な穴
が形成され上下に位置する薄膜配線導体3に不要な電気
的短絡を招来してしまう危険性がある。従って、前記有
機樹脂絶縁層2はその各々の厚みを5μm乃至100μ
mの範囲としておくことが好ましい。
When the thickness of each of the organic resin insulating layers 2 exceeds 100 μm, the through holes 5 are formed by applying the photolithography technique to the organic resin insulating layer 2.
When forming, the etching processing time becomes long and it becomes difficult to form the through hole 5 into a desired and clear shape, and when it is less than 5 μm, the organic resin insulating layers located above and below the organic resin insulating layer 2 are formed. There is a risk that unnecessary holes will be formed in the organic resin insulation layer 2 and unnecessary electrical shorts will be caused in the upper and lower thin film wiring conductors 3 when roughening is performed to increase the bonding strength of the second resin. . Therefore, the organic resin insulating layer 2 has a thickness of 5 μm to 100 μm.
It is preferable to set it in the range of m.

【0025】更に前記多層配線4の各薄膜配線導体3は
その厚みが1μm未満となると各薄膜配線導体3の電気
抵抗が大きなものとなって各薄膜配線導体3に所定の電
気信号を伝達させることが困難なものとなり、また40
μmを越えると薄膜配線導体3を有機樹脂絶縁層2に被
着させる際に薄膜配線導体3の内部に大きな応力が内在
し、該大きな内在応力によって薄膜配線導体3が有機樹
脂絶縁層2から剥離し易いものとなる。従って、前記多
層配線4の各薄膜配線導体3の厚みは1μm乃至40μ
mの範囲としておくことが好ましい。
Further, when the thickness of each thin film wiring conductor 3 of the multi-layer wiring 4 is less than 1 μm, the electric resistance of each thin film wiring conductor 3 becomes large and a predetermined electric signal is transmitted to each thin film wiring conductor 3. Becomes difficult, and again 40
If the thickness exceeds μm, a large stress is present inside the thin film wiring conductor 3 when the thin film wiring conductor 3 is applied to the organic resin insulating layer 2, and the thin film wiring conductor 3 is separated from the organic resin insulating layer 2 by the large intrinsic stress. It is easy to do. Therefore, the thickness of each thin film wiring conductor 3 of the multilayer wiring 4 is 1 μm to 40 μm.
It is preferable to set it in the range of m.

【0026】また更に前記多層配線4の各有機樹脂絶縁
層2はその各々に設けたスルーホール5内に充填物7が
その上面を各有機樹脂絶縁層2の上面と実質的に同一と
なるようにして充填されている。
Further, each organic resin insulating layer 2 of the multi-layer wiring 4 has a through hole 5 provided in each of them so that a filling material 7 has its upper surface substantially the same as the upper surface of each organic resin insulating layer 2. It is filled with.

【0027】前記充填物7は各有機樹脂絶縁層2の上面
を大きな段差のない平坦なものとなす作用をし、これに
よって各有機樹脂絶縁層2の上面に薄膜形成技術及びフ
ォトリソグラフィー技術を採用し薄膜配線導体3を形成
する際、形成される薄膜配線導体3はその厚みが均一に
なるとともに断線が発生することはなく、その結果、多
層配線基板に所望する特性を充分に発揮させることが可
能となる。
The filler 7 acts to make the upper surface of each organic resin insulating layer 2 flat without a large step, and thus a thin film forming technique and a photolithography technique are applied to the upper surface of each organic resin insulating layer 2. When the thin-film wiring conductor 3 is formed, the thin-film wiring conductor 3 to be formed has a uniform thickness and does not cause disconnection. As a result, the multilayer wiring board can sufficiently exhibit desired characteristics. It will be possible.

【0028】前記充填物7は例えば、金属材料より成
り、各有機樹脂絶縁層2に設けたスルーホール5内に印
刷やメッキ法等によって上面が各有機樹脂絶縁層2の上
面と実質的に同一となるように充填される。
The filler 7 is made of, for example, a metal material, and the upper surface of the filler 7 is substantially the same as the upper surface of each organic resin insulating layer 2 in the through holes 5 provided in each organic resin insulating layer 2 by printing or plating. To be filled.

【0029】また前記充填物7はそれをスルーホール導
体6表面にメッキ法によって被着されるメッキ金属で形
成するようにすると充填物7のスルーホール5内への充
填が確実、かつ容易となる。従って、前記充填物7の充
填の作業性を考慮すれば充填物7をスルーホール導体6
の表面にメッキ法によって被着されるメッキ金属で形成
するようにしておくことが好ましい。
If the filling 7 is formed of a plated metal that is deposited on the surface of the through-hole conductor 6 by a plating method, the filling of the filling 7 into the through-hole 5 will be reliable and easy. . Therefore, considering the workability of the filling of the filling material 7, the filling material 7 can be used as the through-hole conductor 6.
It is preferable to form a plated metal on the surface of the plate by a plating method.

【0030】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば種
々の変更は可能であり、例えば、上述の実施例において
薄膜配線導体3の厚みが薄ければ、充填物7の上面を薄
膜配線導体3の上面に対し同じとなるように有機樹脂絶
縁層2の上面より若干突出させておいてもよい。
The present invention is not limited to the above-mentioned embodiments, and various modifications can be made without departing from the scope of the present invention. For example, in the above-mentioned embodiments, the thin film wiring conductor 3 is used. If the thickness is small, the upper surface of the filler 7 may be slightly projected from the upper surface of the organic resin insulating layer 2 so as to be the same as the upper surface of the thin film wiring conductor 3.

【0031】[0031]

【発明の効果】本発明の多層配線基板によれば、各有機
樹脂絶縁層に設けたスルーホール内に充填物を充填し、
各有機樹脂絶縁層の上面を平坦としたことから各有機樹
脂絶縁層の上面に薄膜形成技術及びフォトリソグラフィ
ー技術を採用することによって薄膜配線導体を形成した
際、形成される薄膜配線導体に厚みのバラツキや断線が
生じることはなく、その結果、多層配線基板に所望する
特性を充分に発揮させることが可能となる。
According to the multilayer wiring board of the present invention, the filling is filled in the through holes provided in each organic resin insulating layer,
When the thin film wiring conductor is formed by adopting the thin film forming technology and the photolithography technology on the upper surface of each organic resin insulating layer because the upper surface of each organic resin insulating layer is made flat, There is no variation or disconnection, and as a result, it is possible to fully exhibit the desired characteristics of the multilayer wiring board.

【0032】また本発明の多層配線基板によれば、前記
各有機樹脂絶縁層に設けたスルーホール内に充填される
充填物をスルーホール導体の表面に被着させたメッキ金
属で形成するようにしておくと、スルーホール内への充
填物の充填が確実、かつ容易となる。
Further, according to the multilayer wiring board of the present invention, the filling material filled in the through holes provided in each of the organic resin insulating layers is formed by the plated metal deposited on the surface of the through hole conductor. If so, the filling of the filling material into the through hole becomes reliable and easy.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の多層配線基板の一実施例を示す断面図
である。
FIG. 1 is a sectional view showing one embodiment of a multilayer wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・絶縁基板 2・・・有機樹脂絶縁層 3・・・薄膜配線導体 4・・・多層配線 5・・・スルーホール 6・・・スルーホール導体 7・・・充填物 DESCRIPTION OF SYMBOLS 1 ... Insulating substrate 2 ... Organic resin insulating layer 3 ... Thin film wiring conductor 4 ... Multilayer wiring 5 ... Through hole 6 ... Through hole conductor 7 ... Filling material

フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H05K 3/24 H01L 23/12 N Continuation of the front page (51) Int.Cl. 6 Identification code Office reference number FI Technical display location H05K 3/24 H01L 23/12 N

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】絶縁基板上に、有機樹脂絶縁層と薄膜配線
導体とを交互に積層するとともに上下に位置する薄膜配
線導体を各有機樹脂絶縁層に設けたスルーホールの内壁
に被着させたスルーホール導体を介して接続して成る多
層配線基板であって、前記各有機樹脂絶縁層のスルーホ
ール内に上面が各有機樹脂絶縁層の上面と実質的に同一
である充填物を充填させたことを特徴とする多層配線基
板。
1. An organic resin insulating layer and a thin film wiring conductor are alternately laminated on an insulating substrate, and the upper and lower thin film wiring conductors are attached to the inner walls of through holes provided in each organic resin insulating layer. A multilayer wiring board formed by connecting through through-hole conductors, wherein a filling material having an upper surface substantially the same as the upper surface of each organic resin insulating layer is filled in the through hole of each organic resin insulating layer. A multilayer wiring board characterized by the above.
【請求項2】前記充填物がスルーホール導体の表面に被
着させたメッキ金属であることを特徴とする請求項1に
記載の多層配線基板。
2. The multilayer wiring board according to claim 1, wherein the filling material is a plated metal deposited on the surface of the through-hole conductor.
JP10111396A 1996-04-23 1996-04-23 Multilayer wiring board Pending JPH09289375A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10111396A JPH09289375A (en) 1996-04-23 1996-04-23 Multilayer wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10111396A JPH09289375A (en) 1996-04-23 1996-04-23 Multilayer wiring board

Publications (1)

Publication Number Publication Date
JPH09289375A true JPH09289375A (en) 1997-11-04

Family

ID=14292027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10111396A Pending JPH09289375A (en) 1996-04-23 1996-04-23 Multilayer wiring board

Country Status (1)

Country Link
JP (1) JPH09289375A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000016597A1 (en) * 1998-09-14 2000-03-23 Ibiden Co., Ltd. Printed wiring board and its manufacturing method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000016597A1 (en) * 1998-09-14 2000-03-23 Ibiden Co., Ltd. Printed wiring board and its manufacturing method
US7230188B1 (en) 1998-09-14 2007-06-12 Ibiden Co., Ltd. Printed wiring board and its manufacturing method
EP1919266A3 (en) * 1998-09-14 2009-08-05 Ibiden Co., Ltd. Electroless plating solution, electroless plating process, and printed circuit board
US7691189B2 (en) 1998-09-14 2010-04-06 Ibiden Co., Ltd. Printed wiring board and its manufacturing method
US7827680B2 (en) 1998-09-14 2010-11-09 Ibiden Co., Ltd. Electroplating process of electroplating an elecrically conductive sustrate
US8065794B2 (en) 1998-09-14 2011-11-29 Ibiden Co., Ltd. Printed wiring board and its manufacturing method
EP1667506B1 (en) * 1998-09-14 2012-02-01 Ibiden Co., Ltd. Electroless plating process and printed circuit board

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