JPH0831394B2 - Method for manufacturing multilayer capacitor element - Google Patents
Method for manufacturing multilayer capacitor elementInfo
- Publication number
- JPH0831394B2 JPH0831394B2 JP31229086A JP31229086A JPH0831394B2 JP H0831394 B2 JPH0831394 B2 JP H0831394B2 JP 31229086 A JP31229086 A JP 31229086A JP 31229086 A JP31229086 A JP 31229086A JP H0831394 B2 JPH0831394 B2 JP H0831394B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- internal electrode
- dielectric
- temperature
- capacitor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 title claims description 17
- 238000004519 manufacturing process Methods 0.000 title claims description 14
- 238000000034 method Methods 0.000 title claims description 11
- 239000007789 gas Substances 0.000 claims description 30
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 16
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 claims description 14
- 229910001882 dioxygen Inorganic materials 0.000 claims description 14
- 238000010304 firing Methods 0.000 claims description 14
- 239000010949 copper Substances 0.000 claims description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 9
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 claims description 7
- 239000007858 starting material Substances 0.000 claims description 5
- 239000005751 Copper oxide Substances 0.000 claims description 4
- 229910000431 copper oxide Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 3
- 239000002994 raw material Substances 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 21
- CPLXHLVBOLITMK-UHFFFAOYSA-N Magnesium oxide Chemical compound [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 18
- 229910052573 porcelain Inorganic materials 0.000 description 10
- 230000007547 defect Effects 0.000 description 9
- 239000000395 magnesium oxide Substances 0.000 description 9
- 230000007423 decrease Effects 0.000 description 6
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 5
- 235000011114 ammonium hydroxide Nutrition 0.000 description 5
- 239000003985 ceramic capacitor Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 239000011230 binding agent Substances 0.000 description 4
- 239000002003 electrode paste Substances 0.000 description 4
- 238000007667 floating Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000011946 reduction process Methods 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000001856 Ethyl cellulose Substances 0.000 description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 2
- 230000005587 bubbling Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 229920001249 ethyl cellulose Polymers 0.000 description 2
- 235000019325 ethyl cellulose Nutrition 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000004898 kneading Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- -1 oxygen gas Chemical compound 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229910002076 stabilized zirconia Inorganic materials 0.000 description 1
Landscapes
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は積層コンデンサ素子の製造方法に関し、特に
鉛ペロブスカイト酸化物に誘電体に用い銅または銅を主
成分とする合金を内部電極とする積層コンデンサ素子の
製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a multilayer capacitor element, and more particularly to a multilayer capacitor element which uses lead or perovskite oxide as a dielectric and uses copper or an alloy containing copper as a main component as an internal electrode. Manufacturing method.
従来の技術 近年セラミックコンデンサは素子の小型化、大容量化
への要求から積層型セラミックコンデンサが急速に普及
しつつある。また回路の高周波化により従来電界コンデ
ンサが用いられていた領域に積層型にセラミックコンデ
ンサ素子を用いる必要が発生している。積層型セラミッ
クコンデンサは内部電極とセラミックを一体焼成する工
程によって通常製造される。従来より高誘電率系のセラ
ミックコンデンサ材料にはチタン酸バリウム系の材料が
用いられてきたが、焼成温度が1300℃程度と高いため、
内部電極材料としてはPt,Pdなどの高価な金属を用いる
必要があった。このため安価な卑金属を内部電極に用い
ようとする試みが成されている。2. Description of the Related Art In recent years, as a ceramic capacitor, a multilayer ceramic capacitor is rapidly becoming popular due to demands for smaller size and larger capacity of the element. Further, as the frequency of the circuit becomes higher, it is necessary to use a laminated ceramic capacitor element in a region where an electric field capacitor has been conventionally used. Multilayer ceramic capacitors are usually manufactured by a process of integrally firing internal electrodes and ceramics. Conventionally, barium titanate-based materials have been used as high-dielectric-constant ceramic capacitor materials, but since the firing temperature is as high as 1300 ° C,
It was necessary to use expensive metals such as Pt and Pd as the internal electrode material. For this reason, attempts have been made to use inexpensive base metals for the internal electrodes.
これに対し発明者らは鉛ペロブスカイト酸化物を誘電
体に用い銅または銅を主成分とする合金を内部電極に用
いた積層コンデンサ素子とその製造方法を提案してき
た。このうち内部電極の出発原料に銅酸化物を用いる積
層コンデンサ素子の製造方法は、バインダのバーンアウ
トが容易で安価な原料を用いることができる利点を有し
ている。この製造方法においては内部電極を焼成前に還
元する工程において雰囲気ガスとして0.1%〜1%H2を
含む窒素ガスもしくはアンモニア水をバブリングした窒
素ガスをもちいている。On the other hand, the inventors have proposed a multilayer capacitor element in which lead perovskite oxide is used as a dielectric and copper or an alloy containing copper as a main component is used as an internal electrode, and a manufacturing method thereof. Among them, the method for manufacturing a multilayer capacitor element using copper oxide as a starting material for the internal electrodes has an advantage that a binder can be burned out easily and an inexpensive material can be used. In this manufacturing method, nitrogen gas containing 0.1% to 1% H 2 or nitrogen gas bubbling ammonia water is used as an atmospheric gas in the step of reducing the internal electrode before firing.
発明が解決しようとする問題点 内部電極を焼成まえに還元する雰囲気ガスに0.1%〜
1%H2を含む窒素ガスを用いた場合、還元時に容器内に
配置した試料のうち周辺部に配置した試料に誘電体が還
元されすぎた試料が発生し、量産性に問題を有してい
た。またアンモニア水をバブリングした窒素ガスを用い
た場合アンモニア水温度により還元状態が異なり、また
アンモニア水濃度が徐々に低下するなどアンモニア水の
管理に困難があった。本願発明はこれらの問題点を解決
し、安定かつ容易に最適の内部電極還元状態が得られる
量産性富む積層コンデンサ素子の製造方法を提供するこ
とを目的とする。Problems to be Solved by the Invention 0.1% to atmosphere gas that reduces internal electrodes before firing
When nitrogen gas containing 1% H 2 is used, there is a problem in mass productivity because some of the samples placed in the container at the time of reduction have their dielectrics reduced too much in the samples placed in the periphery. It was Further, when nitrogen gas bubbling ammonia water is used, the reduction state varies depending on the temperature of the ammonia water, and the ammonia water concentration gradually decreases, making it difficult to manage the ammonia water. SUMMARY OF THE INVENTION It is an object of the present invention to solve these problems and provide a method for manufacturing a multilayer capacitor element which is stable and easily obtains an optimal reduced state of an internal electrode and which is rich in mass productivity.
問題点を解決するための手段 内部電極の還元時の保持温度が450℃以上650℃以下で
あり、その時の雰囲気ガスが素子ガス、水蒸気ガス、お
よび酸素ガスを含む酸素ガスからなり、室温時還元炉内
に投入前に水素ガス、水蒸気ガス、酸素ガスの体積百分
率をそれぞれx%,y%,z%とした時、 2z+0.01≦x≦2z+0.16 0.4≦y≦3.00 0<z≦2.00 の範囲内とする。Means for Solving Problems The holding temperature of the internal electrode during reduction is 450 ° C or higher and 650 ° C or lower, and the atmosphere gas at that time is element gas, water vapor gas, and oxygen gas including oxygen gas, and is reduced at room temperature. When the volume percentages of hydrogen gas, water vapor gas, and oxygen gas are respectively x%, y%, and z% before being put into the furnace, 2z + 0.01 ≤ x ≤ 2z + 0.16 0.4 ≤ y ≤ 3.00 0 <z ≤ 2.00 Within the range of.
作用 内部電極の還元処理は内部電極を完全に還元する必要
があるが、誘電体を還元してはいけない。還元力の強い
条件下で還元処理を行った場合、誘電体を還元してしま
う可能性がある。H2−N2系ガスでは室温時還元炉内投入
前の水素ガス濃度が酸素ガス濃度の2倍を越える付近で
急速に還元力が大きくなる。この水素ガス濃度が酸素ガ
ス濃度の2倍を越える領域では水蒸気濃度が高くなると
還元力は弱くなる。雰囲気ガスに水蒸気を含まないH2−
N2ガスを用いた場合、雰囲気ガスの供給が多く、自成雰
囲気である銅酸化物の還元で発生する水蒸気ガスが飛散
しやすい、容器周辺部に配置した試料では強い還元を受
けてしまう可能性がある。本願発明では雰囲気ガス中に
あらかじめ水蒸気ガスを混合しておくこと、および水素
ガス濃度を酸素ガス濃度の2倍より大きい限定された範
囲にすることにより、自成雰囲気である水蒸気ガスが飛
散しても、還元力があまり大きくならないため、誘電体
が還元しない。このため安定に電極部のみが還元した試
料を得ることができる。Action The reduction treatment of the internal electrodes requires complete reduction of the internal electrodes, but not reduction of the dielectric. When the reduction treatment is performed under the condition of strong reducing power, the dielectric substance may be reduced. With H 2 —N 2 system gas, the reducing power rapidly increases near room temperature when the hydrogen gas concentration before charging into the reduction furnace exceeds twice the oxygen gas concentration. In the region where the hydrogen gas concentration exceeds twice the oxygen gas concentration, the reducing power becomes weaker as the water vapor concentration becomes higher. Atmospheric gas does not contain water vapor H 2 −
When N 2 gas is used, the atmosphere gas is often supplied, and the steam gas generated by the reduction of copper oxide, which is a self-made atmosphere, tends to scatter, and samples placed around the container may undergo strong reduction. There is a nature. According to the present invention, by mixing water vapor gas in the atmosphere gas in advance and setting the hydrogen gas concentration to a limited range that is more than twice the oxygen gas concentration, the water vapor gas which is a self-made atmosphere scatters. However, since the reducing power does not become so large, the dielectric does not reduce. Therefore, it is possible to stably obtain a sample in which only the electrode portion is reduced.
実施例 実施例1 誘電体として次に示す組成式で表される材料を用い
た。Example 1 A material represented by the following composition formula was used as a dielectric.
(Ph1.00Ca0.025)(Mg1/3Nb2/3)0.70Ti0.25(Ni1/2W
1/2)0.05O3.025 誘電体粉末は通常のセラミック製造方法に従い製造し
た。仮焼条件は800℃2時間とした。粉砕した仮焼粉末
は仮焼粉末に対し5wt%のポリビニルブチラール樹脂、5
0wt%の溶剤と共にボールミルで混合しドクターブレー
ドを用い厚さ35μmにシート化した。内部電極としては
平均粒径0.8μmのCu2O(Cu2Oとして純度99%)を出発
原料に用いCu2Oに対し0.5wt%のエチルセルロース、25w
t%の溶剤とともに三本ロールで混練し電極ペーストと
しスクリーン印刷法を用い誘電体グリーンシート上に内
部電極パターンを印刷した。これを電極が左右交互に引
き出されるように積層し切断した。(Ph 1.00 Ca 0.025 ) (Mg 1/3 Nb 2/3 ) 0.70 Ti 0.25 (Ni 1/2 W
1/2 ) 0.05 O 3.025 Dielectric powder was manufactured according to the usual ceramic manufacturing method. The calcination condition was 800 ° C. for 2 hours. The pulverized calcinated powder is 5 wt% of polyvinyl butyral resin, 5%
The mixture was mixed with a 0 wt% solvent in a ball mill and formed into a sheet having a thickness of 35 μm using a doctor blade. For the internal electrode, Cu 2 O with an average particle size of 0.8 μm (purity 99% as Cu 2 O) was used as the starting material, and 0.5 wt% of ethyl cellulose to Cu 2 O, 25w
An internal electrode pattern was printed on the dielectric green sheet using a screen printing method by kneading with a t% solvent using a three-roll mill to form an electrode paste. This was laminated and cut so that the electrodes could be drawn out alternately to the left and right.
電極が交互に引き出された端面に上述の電極ペースト
を塗布し外部電極とした。The above-mentioned electrode paste was applied to the end faces from which the electrodes were alternately drawn out to form external electrodes.
このようにして作成した積層体は磁器ボート(50mm×
120mm、深さ15mm)内に粗粒マグネシアを敷きその上に
約400個載せ空気中で550℃でバインダーをバーンアウト
した。The laminated body created in this way is a porcelain boat (50 mm ×
Coarse-grained magnesia was laid in 120 mm, depth 15 mm), and about 400 pieces were placed on it, and the binder was burned out at 550 ° C in the air.
内部電極の還元処理は第1図に示すように、バーンア
ウトした積層体試料14を載せた磁器ボート12を管状炉中
に内径70mmの炉心管11の内部に入れ、0.001%酸素ガス
を含む窒素ガスと1.0%水素ガスを含む窒素ガスを浮遊
流量計15をもちいて流量を測定後混合し、混合後純水16
を三回バブリングしこのガスを炉心管内に毎分1リット
ル流し所定温度で保持し、内部電極を還元した。水蒸気
濃度はバブリングする純水の温度を調節してコントロー
ルし、マグネシア−クロミア系の温度センサー17により
測定した。As shown in FIG. 1, the reduction treatment of the internal electrodes was performed by placing a porcelain boat 12 on which a burned-out laminated body sample 14 was placed inside a core tube 11 having an inner diameter of 70 mm in a tubular furnace, and using nitrogen containing 0.001% oxygen gas. Gas and nitrogen gas containing 1.0% hydrogen gas are mixed after measuring the flow rate using a floating flow meter 15 and then mixed with pure water 16
Was bubbled three times, and 1 liter / min of this gas was flowed into the furnace core tube to maintain it at a predetermined temperature to reduce the internal electrode. The water vapor concentration was controlled by adjusting the temperature of pure water to be bubbled, and measured by a magnesia-chromia temperature sensor 17.
第2図に焼成時の積層体を入れるマグネシア磁器容器
の断面を、第3図に焼成炉炉心管の断面を示す。マグネ
シア磁器容器21の大きさはバーンアウト、内部電極還元
処理にもちいた磁器ボートと同じく(50mm×120mm、深
さ15mm)で容器内には上述の仮焼粉22を体積の1/3程度
敷きつめた上に粗粒マゲネシア23を約1mm敷き、そのう
えに上述のバーンアウト、還元処理した積層体25を全量
400個置いた。マグネシア磁器の蓋24をし、管状電気炉
の炉心管26内に挿入し、炉心管内をロータリーポンプで
脱気したのちN2−H2−H2O混合ガスで置換し、酸素分圧
が1x10-8となるようN2とH2ガスの混合比を調節しながら
混合ガスを流し、980℃まで400℃/hrで昇温し2時間保
持後400℃/hrで降温した。炉心管内のPo2は挿入した安
定化ジルコニア酸素センサー27の大気側と炉内部側に構
成した白金電極から引き出した電極間の電圧E(V)よ
り次式より求めた。FIG. 2 shows a cross section of the magnesia porcelain container in which the laminated body at the time of firing is put, and FIG. 3 shows a cross section of the firing furnace core tube. The size of the magnesia porcelain container 21 is the same as the porcelain boat used for burnout and internal electrode reduction treatment (50 mm × 120 mm, depth 15 mm), and the above-mentioned calcined powder 22 is spread about 1/3 of the volume in the container. Coarse-grained Magnesia 23 is laid on top of it for about 1 mm, and the above-mentioned burn-out and reduction-processed laminate 25 is fully
I put 400 pieces. The lid 24 of the magnesia porcelain, inserted into tubular electric furnace core tube 26 of, and replaced with N 2 -H 2 -H 2 O gas mixture After degassing the reactor core tube in a rotary pump, the oxygen partial pressure is 1x10 The mixed gas was caused to flow while adjusting the mixing ratio of N 2 and H 2 gas to be −8 , the temperature was raised to 980 ° C. at 400 ° C./hr, and the temperature was kept for 2 hours, and then lowered at 400 ° C./hr. Po 2 in the furnace core tube was obtained from the following formula from the voltage E (V) between the electrodes drawn from the platinum electrodes formed on the atmosphere side and inside the furnace of the stabilized zirconia oxygen sensor 27 inserted.
Po2=0.2・exp(4FE/RT) ここで、Fはファラデー定数96489クーロン、Rはガ
ス定数8.3144/deg・mol、Tは絶対温度である。Po 2 = 0.2 · exp (4FE / RT) where F is the Faraday constant 96489 coulomb, R is the gas constant 8.3144 / deg · mol, and T is the absolute temperature.
積層コンデンサ素子の外形は2.8x1.4x0.9mmで有効電
極面積は一層当たり1.3125mm2(1.75x0.75mm)、電極層
の厚みは2.0μm、誘電体層は一層当たり25.0μmで有
効層は30層、上下に無効層を2層ずつ設けた。積層コン
デンサ素子は容量、tanδを1Vの交流電圧を印加し1KHz
の周波数で測定した。また抵抗値は50V/mmの電圧を印加
後1分値から求めた。電気的測定は全試料について行い
容量が140nF以下、tanδが5.0%以上、抵抗値が1×10
+9Ω以下のいずれかの条件を満たすものを不良としそれ
以外のものを良品とした。The outer shape of the multilayer capacitor element is 2.8x1.4x0.9mm, the effective electrode area is 1.3125mm 2 (1.75x0.75mm) per layer, the thickness of the electrode layer is 2.0μm, the dielectric layer is 25.0μm per layer and the effective layer is 30. A layer and two ineffective layers were provided above and below. The multilayer capacitor element has a capacity and tanδ of 1KHz when an AC voltage of 1V is applied.
Was measured at the following frequency. The resistance value was calculated from the value of 1 minute after applying a voltage of 50 V / mm. Electrical measurement is performed on all samples, capacity is 140 nF or less, tan δ is 5.0% or more, and resistance is 1 × 10
Those satisfying any of the conditions of +9 Ω or less were regarded as defective, and the others were regarded as good.
第1表に内部電極の還元処理時の水素ガス、水蒸気ガ
ス濃度と、温度、時間、および良品の容量、tanδ、抵
抗値の平均値、さらに不良数を示す。Table 1 shows the hydrogen gas and water vapor gas concentrations during the reduction treatment of the internal electrodes, the temperature, the time, the capacity of good products, tan δ, the average resistance value, and the number of defects.
第1表より明らかなように、水素ガス濃度が0.011%
より小さいと還元処理に時間がかかり、内部電極の還元
が不十分となり、まだ酸化している電極が焼成時に誘電
体と反応するため電極面積の低下による、容量低下、お
よび抵抗値の低下が発生し、不良数も増加する。水素ガ
ス濃度が0.161%より大きくなると、誘電体の還元が発
生し、誘電体が焼結せず、容量が大幅に小さくなる。水
蒸気濃度が0.4%より小さくなると、還元処理時に容器
周辺に配置した試料に、誘電体が還元して焼結しない不
良が発生する。水蒸気濃度が3%より大きくなると、還
元が不十分になり、不良が多く発生した。また電極還元
時の保持温度が250℃より小さいと、電極が充分還元せ
ず酸化したまま残存し、焼成時に誘電体層に拡散するた
め、絶縁抵抗値が低下し、また電極層が完全な金属層と
ならないため、高周波における誘電損失が低下する。ま
た還元に長い保持時間を要する。650℃より大きいと、
誘電体が還元され焼成後の積層コンデンサ素子として機
能しない。 As is clear from Table 1, the hydrogen gas concentration is 0.011%
If it is smaller, the reduction process will take longer, the reduction of the internal electrode will be insufficient, and the electrode that is still oxidizing will react with the dielectric during firing, resulting in a decrease in the electrode area, resulting in a decrease in capacity and a decrease in resistance value. However, the number of defects also increases. When the hydrogen gas concentration exceeds 0.161%, reduction of the dielectric occurs, the dielectric does not sinter, and the capacity is significantly reduced. When the water vapor concentration is less than 0.4%, the sample placed around the container during the reduction process has a defect that the dielectric substance is not reduced and does not sinter. When the water vapor concentration was more than 3%, the reduction was insufficient and many defects occurred. If the holding temperature during electrode reduction is lower than 250 ° C, the electrode will not be sufficiently reduced and will remain oxidized, and will diffuse into the dielectric layer during firing, which will lower the insulation resistance value and reduce the electrode layer to completely metal. Since it does not form a layer, the dielectric loss at high frequencies is reduced. Further, the reduction requires a long holding time. Above 650 ° C,
The dielectric is reduced and does not function as a multilayer capacitor element after firing.
実施例2 誘電体として次に示す組成式で表される材料を用い
た。Example 2 As the dielectric, a material represented by the following composition formula was used.
(Pb1.00Sr0.025)(Ni1/3Nb2/3)0.50Ti0.400(Ni1/2
W1/2)0.10O3.025 誘電体材料のシート化については実施例1と同様の方
法を用いた。内部電極としては平均粒径1.2μmのCuO
(CuOとして純度97%)を出発原料に用いCuOに対し0.5w
t%のエチルセルロース、25wt%の溶剤とともに三本ロ
ールで混練し電極ペーストとしスクリーン印刷法を用い
誘電体グリーンシート上に内部電極パターンを印刷し
た。これを電極が左右交互に引き出されるように積層し
切断した。(Pb 1.00 Sr 0.025 ) (Ni 1/3 Nb 2/3 ) 0.50 Ti 0.400 (Ni 1/2
W 1/2 ) 0.10 O 3.025 The same method as in Example 1 was used for forming the dielectric material into a sheet. CuO with an average particle size of 1.2 μm for the internal electrodes
(Purity of 97% as CuO) is used as a starting material, and 0.5w is used for CuO.
An internal electrode pattern was printed on the dielectric green sheet by using a screen printing method by kneading with 3% rolls together with t% ethyl cellulose and 25 wt% solvent to form an electrode paste. This was laminated and cut so that the electrodes could be drawn out alternately to the left and right.
このようにして作成した積層体は、磁器ボート(50mm
×120mm、深さ15mm)内に粗粒マグネシアを敷きその上
に約400個載せ、空気中で600℃でバインダーをバーンア
ウトした。The laminated body created in this way is made of porcelain boat (50 mm
Coarse-grained magnesia was laid in 120 mm, depth 15 mm), and about 400 pieces were placed on it, and the binder was burned out at 600 ° C in the air.
内部電極の還元処理は第4図に示すように、バーンア
ウトした積層体試料44を載せた磁器ボート42を管状炉中
の内径70mmの炉心管41の内部に入れ、0.001%酸素ガス
を含む窒素ガスと1.0%水素ガスを含む窒素ガスと1.0%
酸素ガスを含む窒素ガスを浮遊流量計45をもちいて流量
を測定後混合し、混合後純水46を三回バブリングしこの
ガスを炉心管内に毎分1リットル流し所定温度で保持
し、内部電極を還元した。水蒸気濃度はバブリングする
純水の温度を調節してコントロールし、マグネシア−ク
ロミア系の湿度センサー47により測定した。As shown in FIG. 4, the reduction treatment of the internal electrodes was carried out by placing a porcelain boat 42 on which a burned-out laminated body sample 44 was placed inside a core tube 41 having an inner diameter of 70 mm in a tubular furnace, and using nitrogen containing 0.001% oxygen gas. Gas and 1.0% nitrogen gas containing 1.0% hydrogen gas
Nitrogen gas containing oxygen gas was mixed after measuring the flow rate using a floating flow meter 45, and after mixing, pure water 46 was bubbled three times to flow 1 liter / min of this gas into the core tube and hold it at a predetermined temperature. Was reduced. The water vapor concentration was measured by a magnesia-chromia humidity sensor 47, which was controlled by adjusting the temperature of pure water to be bubbled.
焼成は実施例1と同様の方法で行った。焼成した積層
体は金属銅とガラスフリットを含む外部電極ペーストを
内部電極が露出した端面に塗布し、窒素中600℃で焼き
付けた。The firing was performed in the same manner as in Example 1. In the fired laminate, an external electrode paste containing metallic copper and glass frit was applied to the end face where the internal electrode was exposed, and baked at 600 ° C. in nitrogen.
積層コンデンサ素子の外形は2.8x1.4x0.9mmで有効電
極面積は一層当たり1.3125mm2(1.75x0.75mm)、電極層
の厚みは2.0μm、誘電体層は一層当たり25.0μmで有
効層は30層、上下に無効層を2層ずつ設けた。積層コン
デンサ素子は容量、tanδを1Vの交流電圧を印加し1KHz
の周波数で測定した。また抵抗値は50V/mmの電圧を印加
後1分値から求めた。電気的測定は全試料について行い
容量が50nF以下、tanδが5.0%以上、抵抗値が1×10+9
Ω以下のいずれかの条件を満たすものを不良としそれ以
外のものを良品とした。The outer shape of the multilayer capacitor element is 2.8x1.4x0.9mm, the effective electrode area is 1.3125mm 2 (1.75x0.75mm) per layer, the thickness of the electrode layer is 2.0μm, the dielectric layer is 25.0μm per layer and the effective layer is 30. A layer and two ineffective layers were provided above and below. The multilayer capacitor element has a capacity and tanδ of 1KHz when an AC voltage of 1V is applied.
Was measured at the following frequency. The resistance value was calculated from the value of 1 minute after applying a voltage of 50 V / mm. Electrical measurement is performed on all samples, capacity is 50nF or less, tanδ is 5.0% or more, and resistance is 1 × 10 +9.
Those satisfying any of the conditions of Ω or less were regarded as defective, and the others were regarded as good products.
第2表に内部電極の還元処理時の水素ガス、水蒸気ガ
ス濃度と、温度、時間、および良品の容量、tanδ、抵
抗値の平均値、さらに不良数を示す。Table 2 shows hydrogen gas and water vapor gas concentrations during the reduction treatment of the internal electrodes, temperature, time, and capacity of good products, tan δ, average resistance value, and the number of defects.
第2表より明らかなように、水素ガス濃度が酸素ガス
濃度をz%とした時2z+0.01%より小さいと還元処理に
時間がかかり、内部電極の還元が不十分となり、まだ酸
化している電極が焼成時に誘電体と反応するため電極面
積の低下による、容量低下、および抵抗値の低下が発生
し、不良数も増加する。水素ガス濃度が2z+0.16%より
大きくなると、誘電体の還元が発生し、誘電体が焼結せ
ず、容量が大幅に小さくなる。酸素濃度が2%を越える
と爆発の危険性があるので、好ましくない。水蒸気濃度
が0.4%より小さくなると、還元処理時に容器周辺に配
置した試料に、誘電体が還元して焼結しない不良が発生
する。水蒸気濃度が3%より大きくなると、還元が不十
分になり、不良が多く発生した。 As is clear from Table 2, when the hydrogen gas concentration is less than 2z + 0.01% when the oxygen gas concentration is z%, the reduction process takes time, the reduction of the internal electrode is insufficient, and it is still oxidized. Since the electrode reacts with the dielectric during firing, the area of the electrode is reduced, resulting in a decrease in capacity and a decrease in resistance, and the number of defects also increases. When the hydrogen gas concentration exceeds 2z + 0.16%, reduction of the dielectric occurs, the dielectric does not sinter, and the capacity is significantly reduced. If the oxygen concentration exceeds 2%, there is a risk of explosion, which is not preferable. When the water vapor concentration is less than 0.4%, the sample placed around the container during the reduction process has a defect that the dielectric substance is not reduced and does not sinter. When the water vapor concentration was more than 3%, the reduction was insufficient and many defects occurred.
以上の2つの実施例より明らかなように、鉛ペロブス
カイト系酸化物の誘電体を用い、銅を内部電極とする積
層コンデンサ素子の製造方法において、銅内部電極の出
発原料に銅酸化物を主成分とする原料を用い、内部電極
パターンを誘電体グリーンシートに印刷し積層したの
ち、空気中でバインダ成分のバーンアウトを行い、その
後内部電極を還元して金属化し、焼成する製造方法をと
る場合の内部電極の還元処理において、内部電極の還元
時の保持温度が450℃以上650℃以下であり、その時の雰
囲気ガスが水素ガス、水蒸気ガス、酸素ガスを含む窒素
ガスからなり、室温時還元炉内に投入前に水素ガス、水
蒸気ガス、酸素ガスの体積百物率をそれぞれx%,y%,z
%とした時、 2Z+0.01≦x≦2Z+0.16 0.4≦y≦3.00 0<z≦2.00 の範囲内にあることにより、絶縁抵抗のおおきく、優れ
た特性の積層コンデンサ素子が安定的にえられ、量産時
の不良数も現象する。As is clear from the above two examples, in a method for manufacturing a multilayer capacitor element using a lead perovskite oxide dielectric and using copper as an internal electrode, copper oxide is used as a starting material for the copper internal electrode. When the internal electrode pattern is printed on the dielectric green sheet using the raw material to be laminated and then laminated, the binder component is burned out in the air, and then the internal electrode is reduced to metallize and fired. In the reduction treatment of the internal electrodes, the holding temperature during reduction of the internal electrodes is 450 ° C or higher and 650 ° C or lower, and the atmosphere gas at that time is hydrogen gas, steam gas, nitrogen gas containing oxygen gas, Prior to charging, the volume percentage of hydrogen gas, water vapor gas, and oxygen gas should be x%, y%, z, respectively.
%, When within the range of 2Z + 0.01 ≦ x ≦ 2Z + 0.16 0.4 ≦ y ≦ 3.00 0 <z ≦ 2.00, a multilayer capacitor element with large insulation resistance and excellent characteristics can be stably obtained. The number of defects in mass production also occurs.
発明の効果 本発明の積層コンデンサ素子の製造方法は、鉛ペロブ
スカイトを誘電体に用い銅を内部電極とする積層コンデ
ンサ素子において、絶縁抵抗値が大きく、優れた特性の
積層コンデンサ素子が安定的にえられ、量産性にもとむ
工業的に有用な製造方法である。Advantageous Effects of Invention The method for manufacturing a multilayer capacitor element according to the present invention is a multilayer capacitor element using lead perovskite as a dielectric and copper as an internal electrode. It is an industrially useful manufacturing method based on mass productivity.
第1図、第4図は本発明の一実施例における内部電極の
還元装置を示す断面図、第2図は焼成時のマグネシア容
器の断面図、第3図は焼成炉炉心管断面図である。 11……炉心管、12……磁器ボート、13……粗粒マグネシ
ア、14……積層体試料、15……浮遊流量計、16……純
水。7……湿度センサー、41……炉心管、42……磁器ボ
ート、43……粗粒マグネシア、44……積層体試料、45…
…浮遊流量計、46……純水。47……湿度センサー1 and 4 are cross-sectional views showing a reduction device for internal electrodes in one embodiment of the present invention, FIG. 2 is a cross-sectional view of a magnesia container during firing, and FIG. 3 is a cross-sectional view of a firing furnace core tube. . 11 …… Reactor tube, 12 …… Porcelain boat, 13 …… Coarse-grained magnesia, 14 …… Laminated sample, 15 …… Floating flow meter, 16 …… Pure water. 7 ... Humidity sensor, 41 ... Core tube, 42 ... Porcelain boat, 43 ... Coarse-grained magnesia, 44 ... Laminated sample, 45 ...
… Floating flow meter, 46 …… Pure water. 47 ... Humidity sensor
───────────────────────────────────────────────────── フロントページの続き (72)発明者 倉光 秀紀 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 加藤 純一 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 三原 敏弘 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Hideki Kuramitsu 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (72) Junichi Kato 1006 Kadoma, Kadoma City, Osaka Matsushita Electric Industrial Co., Ltd. 72) Inventor Toshihiro Mihara 1006 Kadoma, Kadoma-shi, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.
Claims (1)
する原料を用い、焼成温度より低い温度で内部電極を還
元して金属化することを特徴とする、銅または銅を主成
分とする合金を内部電極として用い、鉛ペロブスカイト
系酸化物を誘電体として用いた積層コンデンサ素子の製
造方法において、前記内部電極の還元時の保持温度が45
0℃以上650℃以下であり、その時の雰囲気ガスが水素ガ
ス、水蒸気ガス、および酸素ガスを含む窒素ガスからな
り、室温時還元炉内に投入前の水素ガス、水蒸気ガス、
酸素ガスの体積百分率をそれぞれx%,y%,z%とした
時、 2z+0.01≦x≦2z+0.16 0.4≦y≦3.00 0<z≦2.00 の範囲内にあることを特徴とする積層コンデンサ素子の
製造方法。1. A copper or copper-based main component, characterized in that a raw material containing copper oxide as a main component is used as a starting material for the internal electrode, and the internal electrode is reduced to metallize at a temperature lower than a firing temperature. In the method for manufacturing a multilayer capacitor element using the alloy as an internal electrode and a lead perovskite oxide as a dielectric, the holding temperature of the internal electrode during reduction is 45
The temperature is 0 ° C or higher and 650 ° C or lower, and the atmosphere gas at that time is composed of hydrogen gas, steam gas, and nitrogen gas containing oxygen gas, and hydrogen gas before charging into the reducing furnace at room temperature, steam gas,
When the volume percentages of oxygen gas are x%, y%, and z%, respectively, they are in the range of 2z + 0.01 ≦ x ≦ 2z + 0.16 0.4 ≦ y ≦ 3.00 0 <z ≦ 2.00. Device manufacturing method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31229086A JPH0831394B2 (en) | 1986-12-26 | 1986-12-26 | Method for manufacturing multilayer capacitor element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31229086A JPH0831394B2 (en) | 1986-12-26 | 1986-12-26 | Method for manufacturing multilayer capacitor element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63164416A JPS63164416A (en) | 1988-07-07 |
| JPH0831394B2 true JPH0831394B2 (en) | 1996-03-27 |
Family
ID=18027468
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31229086A Expired - Lifetime JPH0831394B2 (en) | 1986-12-26 | 1986-12-26 | Method for manufacturing multilayer capacitor element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0831394B2 (en) |
-
1986
- 1986-12-26 JP JP31229086A patent/JPH0831394B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63164416A (en) | 1988-07-07 |
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