JPH08181168A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPH08181168A JPH08181168A JP6337226A JP33722694A JPH08181168A JP H08181168 A JPH08181168 A JP H08181168A JP 6337226 A JP6337226 A JP 6337226A JP 33722694 A JP33722694 A JP 33722694A JP H08181168 A JPH08181168 A JP H08181168A
- Authority
- JP
- Japan
- Prior art keywords
- lead
- semiconductor chip
- heat dissipation
- dissipation plate
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H10W72/701—
Landscapes
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Abstract
(57)【要約】
【目的】 実装の際にリードの平坦度や整列性等による
悪影響がなく、また放熱板による半導体チップの放熱を
効果的に行うことができるようにする。
【構成】 フィルム基材2上に形成したリード3のイン
ナーリード部3aを半導体チップ1の回路面1aの電極
に接合し、チップ1の非回路面1bを放熱板6の上面6
aに固着する。放熱板6の上面6aにはリード接続部7
が設けられ、放熱板6の外端にはリード接続部7と導通
する端子部8が設けられている。チップ1の回路面1a
から延設されたリード3のアウターリード部3bを放熱
板6のリード接続部7に接合する。放熱板6の上面6a
で全体を樹脂10により封止する。実装時には、放熱板
6の下面6bを実装基板20の表面に密着させ、放熱板
6の端子部8を実装基板20の配線パターン21に半田
22等により接続する。
(57) [Summary] [Purpose] To prevent the flatness and alignment of leads from being adversely affected during mounting, and to effectively dissipate heat from a semiconductor chip by means of a heat sink. An inner lead portion 3a of a lead 3 formed on a film substrate 2 is bonded to an electrode on a circuit surface 1a of a semiconductor chip 1, and a non-circuit surface 1b of the chip 1 is attached to an upper surface 6 of a heat dissipation plate 6.
Stick to a. The lead connecting portion 7 is provided on the upper surface 6 a of the heat sink 6.
Is provided, and a terminal portion 8 that is electrically connected to the lead connection portion 7 is provided at the outer end of the heat dissipation plate 6. Circuit surface 1a of chip 1
The outer lead portion 3b of the lead 3 extended from the above is joined to the lead connecting portion 7 of the heat dissipation plate 6. The upper surface 6a of the heat sink 6
Then, the whole is sealed with resin 10. At the time of mounting, the lower surface 6b of the heat sink 6 is brought into close contact with the surface of the mounting board 20, and the terminal portion 8 of the heat sink 6 is connected to the wiring pattern 21 of the mounting board 20 by solder 22 or the like.
Description
【0001】[0001]
【産業上の利用分野】本発明は、例えばTAB方式によ
り半導体チップにリードを接続すると共にその半導体チ
ップに放熱板を固着して樹脂封止した半導体装置に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device in which leads are connected to a semiconductor chip by, for example, a TAB method and a heat sink is fixed to the semiconductor chip and resin-sealed.
【0002】[0002]
【従来の技術】従来、この種の半導体装置は、例えば図
7に示すように構成されている。即ち、半導体チップ1
01の表面の電極に、フィルム基材102上に形成され
たリード103のインナーリード部103aが、バンプ
104を介して接合されている。そして、半導体チップ
101の裏面に接着剤105を用いて放熱板106が固
着され、アウターリード部103bと放熱板106の下
面とが露出するように全体が樹脂110により封止され
ている。2. Description of the Related Art Conventionally, this type of semiconductor device is constructed as shown in FIG. 7, for example. That is, the semiconductor chip 1
The inner lead portion 103 a of the lead 103 formed on the film base material 102 is bonded to the electrode on the surface of 01 through the bump 104. A heat dissipation plate 106 is fixed to the back surface of the semiconductor chip 101 with an adhesive 105, and the whole is sealed with a resin 110 so that the outer lead portion 103b and the bottom surface of the heat dissipation plate 106 are exposed.
【0003】このような半導体装置は、複数のアウター
リード部103bが実装状態に適合する所定の形状に成
形された後、放熱板106の下面が実装基板120の表
面に密着され、各アウターリード部103bが実装基板
120上の複数の配線パターン121にそれぞれ接合さ
れることにより、実装基板120に実装される。In such a semiconductor device, after the plurality of outer lead portions 103b are formed into a predetermined shape suitable for the mounting state, the lower surface of the heat radiating plate 106 is brought into close contact with the surface of the mounting substrate 120, and each outer lead portion is formed. The 103b is mounted on the mounting board 120 by being joined to the plurality of wiring patterns 121 on the mounting board 120, respectively.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、上述し
たような従来の半導体装置において、樹脂110から突
出する複数のアウターリード部103bは成形されてい
るのだが、成形後の内部応力やハンドリング時の振動等
によって、これら各アウターリード部103bは平坦度
や整列性等が悪化し易い。このため、半導体装置を実装
基板120に実装する際に、各アウターリード部103
bと実装基板120の各配線パターン121との接合不
良が生じ易いという問題があった。However, in the conventional semiconductor device as described above, the plurality of outer lead portions 103b protruding from the resin 110 are molded. However, internal stress after molding and vibration during handling are generated. As a result, the flatness, alignment, etc. of each of the outer lead portions 103b are likely to deteriorate. Therefore, when the semiconductor device is mounted on the mounting substrate 120, each outer lead portion 103
There is a problem that a defective connection between the wiring pattern b and each wiring pattern 121 of the mounting substrate 120 is likely to occur.
【0005】また、上述したような従来の半導体装置に
おいては、動作時に半導体チップ101から発生した熱
が、放熱板106を介して実装基板120に拡散され、
一部がアウターリード部103bを介して実装基板12
0及び外気にも放散されるが、その放熱効果は必ずしも
充分ではないという問題があった。Further, in the conventional semiconductor device as described above, the heat generated from the semiconductor chip 101 during operation is diffused to the mounting substrate 120 via the heat dissipation plate 106,
The mounting substrate 12 is partially mounted via the outer lead portion 103b.
However, there is a problem that its heat radiation effect is not always sufficient.
【0006】そこで本発明は、実装の際にリードの平坦
度や整列性等による悪影響がなく、また放熱板による半
導体チップの放熱を効果的に行うことができる半導体装
置を提供することを目的とする。Therefore, an object of the present invention is to provide a semiconductor device which is not adversely affected by flatness and alignment of leads during mounting and which can effectively radiate heat of a semiconductor chip by a heat radiating plate. To do.
【0007】[0007]
【課題を解決するための手段】上記目的を達成するため
に、本発明は、半導体チップにリードを接続すると共に
前記半導体チップに放熱板を固着して樹脂封止してなる
半導体装置において、前記放熱板の上面で前記半導体チ
ップが搭載される領域の外側に、前記半導体チップに接
続された前記リードと対応するリード接続部を設け、前
記半導体チップの非回路面を前記放熱板の上面に固着す
ると共に、前記半導体チップの回路面から延設された前
記リードの先端を前記放熱板の前記リード接続部に接合
し、前記放熱板の上面において封止用の樹脂部を形成し
たことを特徴とする。In order to achieve the above-mentioned object, the present invention provides a semiconductor device in which leads are connected to a semiconductor chip and a heat sink is fixed to the semiconductor chip and resin-sealed. A lead connection portion corresponding to the lead connected to the semiconductor chip is provided outside the area where the semiconductor chip is mounted on the upper surface of the heat sink, and the non-circuit surface of the semiconductor chip is fixed to the upper surface of the heat sink. In addition, the tip of the lead extending from the circuit surface of the semiconductor chip is joined to the lead connection portion of the heat sink, and a resin portion for sealing is formed on the upper surface of the heat sink. To do.
【0008】また、本発明は、半導体チップにリードを
接続すると共に前記半導体チップに放熱板を固着して樹
脂封止してなる半導体装置において、前記放熱板の上面
で前記半導体チップが搭載される領域の外側に、前記半
導体チップに接続された前記リードと対応するリード接
続部を設け、少なくとも前記半導体チップの回路面を絶
縁材を介して前記放熱板の上面に固着すると共に、前記
半導体チップの回路面から延設された前記リードの先端
を前記放熱板の前記リード接続部に接合し、かつ前記半
導体チップの非回路面に放熱フィンを固着し、この放熱
フィンが露出するように前記放熱板の上面において封止
用の樹脂部を形成したことを特徴とする。Further, according to the present invention, in a semiconductor device in which leads are connected to a semiconductor chip and a heat sink is fixed to the semiconductor chip and resin-sealed, the semiconductor chip is mounted on the upper surface of the heat sink. A lead connecting portion corresponding to the lead connected to the semiconductor chip is provided outside the region, and at least the circuit surface of the semiconductor chip is fixed to the upper surface of the heat sink through an insulating material, and The tip of the lead extending from the circuit surface is joined to the lead connection portion of the heat dissipation plate, and the heat dissipation fin is fixed to the non-circuit surface of the semiconductor chip, so that the heat dissipation fin is exposed. A resin portion for sealing is formed on the upper surface of the.
【0009】なお、前記各半導体装置において、前記放
熱板の外端に前記リード接続部と導通する端子部を設
け、前記放熱板の下面を実装基板に密着させた実装時
に、前記端子部が前記実装基板の配線部に接続されるこ
とを特徴とする。この場合、前記放熱板の下面の外端近
傍に凹部を設け、この凹部内に前記端子部を露出させる
とよい。In each of the semiconductor devices, a terminal portion is provided on the outer end of the heat dissipation plate so as to be electrically connected to the lead connection portion, and the terminal portion is abutted when the lower surface of the heat dissipation plate is brought into close contact with a mounting board. It is characterized in that it is connected to the wiring portion of the mounting substrate. In this case, a recess may be provided near the outer end of the lower surface of the heat dissipation plate, and the terminal portion may be exposed in the recess.
【0010】また、前記各半導体装置において、前記リ
ード接続部に接合された前記リードの先端を前記放熱板
の外端から突出させ、前記放熱板の下面を実装基板に密
着させた実装時に、前記リードの突出部分が前記実装基
板の配線部に接続されることを特徴とする。Further, in each of the semiconductor devices, the tip of the lead joined to the lead connecting portion is projected from the outer end of the heat dissipation plate, and the lower surface of the heat dissipation plate is brought into close contact with the mounting board, and the semiconductor device is mounted at the time of mounting. The projecting portion of the lead is connected to the wiring portion of the mounting board.
【0011】さらに、前記各半導体装置において、前記
リードをフィルム基材上に形成し、このフィルム基材か
ら内側へ突出するインナーリード部を前記半導体チップ
に接続し、前記フィルム基材から外側へ突出するアウタ
ーリード部を前記放熱板の前記リード接続部に接合した
ことを特徴とする。Further, in each of the semiconductor devices, the leads are formed on a film base material, inner lead portions projecting inward from the film base material are connected to the semiconductor chip, and the leads are projected outward from the film base material. The outer lead portion is joined to the lead connecting portion of the heat dissipation plate.
【0012】[0012]
【作用】上記のように構成された本発明の半導体装置に
おいては、半導体チップから延設されたリードの先端
が、放熱板に設けられたリード接続部に接合されてお
り、放熱板の外端でリード接続部と導通する端子部また
は放熱板の外端から突出するリードの突出部分が、実装
基板の配線部に対する接続部分となる。これによって、
実装時に、従来のように樹脂から突出するリードを成形
して実装基板の配線部に接合する必要がないので、リー
ドの平坦度や整列性等の影響を受けることなく、放熱板
の端子部またはリードの突出部分によって、実装基板の
配線部に対する接続を確実に行うことができる。In the semiconductor device of the present invention configured as described above, the tips of the leads extending from the semiconductor chip are joined to the lead connecting portions provided on the heat sink, and the outer end of the heat sink is formed. The projecting portion of the lead projecting from the terminal portion or the outer end of the heat dissipation plate which is electrically connected to the lead connecting portion serves as the connecting portion to the wiring portion of the mounting board. by this,
When mounting, it is not necessary to mold the leads protruding from the resin and bond them to the wiring part of the mounting board as in the past, so it is not affected by the flatness or alignment of the leads, The protruding portion of the lead can ensure the connection to the wiring portion of the mounting substrate.
【0013】また、半導体チップが放熱板に固着される
と共に、半導体チップのリードが放熱板のリード接続部
に接合されることによって、半導体チップから放熱板へ
の熱伝導に加え、リードから放熱板への熱伝導も効果的
に行われるので、放熱効果を高めることができる。しか
も、半導体装置の下側全体が放熱板となり、従来に比べ
て放熱板の占有面積が拡がるので、実装基板への熱伝導
効率を向上させることができる。Further, since the semiconductor chip is fixed to the heat sink and the leads of the semiconductor chip are joined to the lead connecting portions of the heat sink, the heat is conducted from the semiconductor chip to the heat sink and the leads are also connected to the heat sink. Since the heat conduction to the is also effectively performed, the heat dissipation effect can be enhanced. Moreover, since the entire lower side of the semiconductor device serves as a heat dissipation plate, and the area occupied by the heat dissipation plate is expanded as compared with the conventional case, the heat conduction efficiency to the mounting substrate can be improved.
【0014】[0014]
【実施例】以下、本発明による半導体装置の実施例につ
いて図1〜図6を参照して説明する。まず、図1〜図3
は第1実施例を示し、図1は半導体装置を基板に実装し
た状態の断面図、図2はリードを接続した半導体チップ
とリード接続部を設けた放熱板との要部の分解斜視図、
図3は半導体装置を基板に実装した状態の要部の斜視図
である。Embodiments of the semiconductor device according to the present invention will be described below with reference to FIGS. First, FIGS. 1 to 3
1 shows a first embodiment, FIG. 1 is a cross-sectional view of a semiconductor device mounted on a substrate, FIG. 2 is an exploded perspective view of essential parts of a semiconductor chip to which leads are connected and a heat radiating plate provided with lead connecting portions,
FIG. 3 is a perspective view of a main part of the semiconductor device mounted on a substrate.
【0015】図1に示すように、半導体チップ1の表面
である回路面1aの電極に、ポリイミド等のフィルム基
材2上に形成されたCu等のリード3のインナーリード
部3aが、Au等のバンプ4を介して接合されている。
そして、半導体チップ1の裏面である非回路面1bが、
Agペースト等の接着剤5を用いて放熱板6の上面6a
に固着されている。As shown in FIG. 1, the inner lead portion 3a of the lead 3 made of Cu or the like formed on the film base material 2 made of polyimide or the like is formed on the electrode of the circuit surface 1a which is the surface of the semiconductor chip 1 by Au or the like. The bumps 4 are joined together.
The non-circuit surface 1b, which is the back surface of the semiconductor chip 1, is
Using adhesive 5 such as Ag paste, the upper surface 6a of the heat dissipation plate 6
It is stuck to.
【0016】この放熱板6は、熱良導性の材料によっ
て、ほぼアウターリード部3bの先端に対応する大きさ
に形成されている。放熱板6の中央部は半導体チップ1
が搭載される領域であるが、その外側にはCu等の導電
性材料によりリード接続部7がアウターリード部3bに
対応してパターン形成されている。そして、放熱板6の
外端にはPb−Sn合金等により端子部8が形成され、
この端子部8にリード接続部7の先端が接続されてい
る。なお、リード接続部7と端子部8とを一体に形成し
てもよい。また、放熱板6が導電性を有する場合には、
リード接続部7及び端子部8を形成する部分に予め絶縁
を施しておく。The heat radiating plate 6 is made of a material having good heat conductivity and is formed to have a size substantially corresponding to the tip of the outer lead portion 3b. The central portion of the heat sink 6 is the semiconductor chip 1
The lead connection portion 7 is formed by patterning on the outer side thereof with a conductive material such as Cu so as to correspond to the outer lead portion 3b. Then, the terminal portion 8 is formed on the outer end of the heat dissipation plate 6 with a Pb-Sn alloy or the like,
The tip of the lead connecting portion 7 is connected to the terminal portion 8. The lead connecting portion 7 and the terminal portion 8 may be integrally formed. When the heat sink 6 has conductivity,
The portions forming the lead connection portion 7 and the terminal portion 8 are previously insulated.
【0017】図1及び図2に示すように、半導体装置の
製造の際には、まず、半導体チップ1とインナーリード
部3aとを接合し、アウターリード部3bを所定の形状
に成形する。そして、半導体チップ1の非回路面1bを
放熱板6の上面6aに固着し、アウターリード部3bを
放熱板6のリード接続部7に熱圧着や半田溶融等により
接合する。さらに、トランスファモールド法或いはポッ
ティング法等を用いて放熱板6の上面6aにおいて全体
を樹脂10で封止する。なお、樹脂10は有機系、Si
系の樹脂でもよい。As shown in FIGS. 1 and 2, when manufacturing a semiconductor device, first, the semiconductor chip 1 and the inner lead portion 3a are bonded to each other, and the outer lead portion 3b is formed into a predetermined shape. Then, the non-circuit surface 1b of the semiconductor chip 1 is fixed to the upper surface 6a of the heat dissipation plate 6, and the outer lead portion 3b is joined to the lead connection portion 7 of the heat dissipation plate 6 by thermocompression bonding or solder melting. Further, the entire upper surface 6a of the heat dissipation plate 6 is sealed with the resin 10 by using the transfer molding method or the potting method. The resin 10 is an organic type, Si
A system resin may be used.
【0018】上述のようにして完成した半導体装置は、
図1及び図3に示すように、放熱板6の下面6bを実装
基板20の表面に密着させ、放熱板6の端子部8を実装
基板20上の配線パターン21に接続する。この接続
は、配線パターン21上に例えばボール状の半田バンプ
を配置或いはクリーム半田を塗布し、その溶融半田22
によって行うことができる。The semiconductor device completed as described above is
As shown in FIGS. 1 and 3, the lower surface 6 b of the heat sink 6 is brought into close contact with the surface of the mounting board 20, and the terminal portion 8 of the heat sink 6 is connected to the wiring pattern 21 on the mounting board 20. For this connection, for example, ball-shaped solder bumps are arranged on the wiring pattern 21 or cream solder is applied, and the molten solder 22
Can be done by
【0019】上記のように構成され且つ実装される半導
体装置によれば、アウターリード部3bの先端が放熱板
6のリード接続部7に接合されており、放熱板6の端子
部8が実装基板20の配線パターン21に対する接続部
分となるので、実装時には、アウターリード部3bの平
坦度や整列性等の影響を全く受けることなく、放熱板6
の端子部8を実装基板20の配線パターン21に極めて
確実に接続することができる。なお、本実施例でもアウ
ターリード部3bを成形しているが、この成形は、半導
体チップ1の回路面1aと放熱板6のリード接続部7と
の段差を解消するためなので、必要に応じて行えばよ
い。According to the semiconductor device constructed and mounted as described above, the tips of the outer lead portions 3b are joined to the lead connecting portions 7 of the heat sink 6, and the terminal portions 8 of the heat sink 6 are mounted on the mounting substrate. Since it becomes a connecting portion of the wiring pattern 21 to the wiring pattern 21, the heat radiating plate 6 is not affected by the flatness and the alignment of the outer lead portion 3b at the time of mounting.
The terminal portion 8 of can be connected to the wiring pattern 21 of the mounting substrate 20 extremely reliably. Although the outer lead portion 3b is also molded in this embodiment, this molding is for eliminating the step between the circuit surface 1a of the semiconductor chip 1 and the lead connecting portion 7 of the heat dissipation plate 6, so that it is necessary. Just go.
【0020】ところで従来は、アウターリード部の平坦
度等の問題によって、実装時にアウターリード部をボン
ディングツールにより実装基板の配線部に押圧して接合
する必要があったが、本実施例の半導体装置によれば、
放熱板6の端子部8を実装基板20の配線パターン21
に接続する構造を用いることによって、半田リフローに
よる一括接続が可能となり、生産性を大幅に向上させる
ことができる。By the way, conventionally, due to a problem such as the flatness of the outer lead portion, it was necessary to press and join the outer lead portion to the wiring portion of the mounting substrate with a bonding tool at the time of mounting. According to
The terminal portion 8 of the heat sink 6 is connected to the wiring pattern 21 of the mounting board 20.
By using the structure for connecting to, it is possible to perform collective connection by solder reflow, and it is possible to greatly improve productivity.
【0021】また、半導体チップ1が放熱板6に固着さ
れると共に、アウターリード部3bが放熱板6のリード
接続部7に接合されているので、動作時には、半導体チ
ップ1から放熱板6への熱伝導に加え、アウターリード
部3bから放熱板6への熱伝導も効果的に行われること
になり、放熱効果を高めることができる。しかも、半導
体装置の下側全体が放熱板6であり、従来に比べて放熱
板6の占有面積が拡がるので、実装基板20への熱伝導
効率を向上させることができる。Further, since the semiconductor chip 1 is fixed to the heat sink 6 and the outer lead portion 3b is joined to the lead connecting portion 7 of the heat sink 6, the semiconductor chip 1 is connected to the heat sink 6 during operation. In addition to heat conduction, heat conduction from the outer lead portion 3b to the heat dissipation plate 6 is also effectively performed, and the heat dissipation effect can be enhanced. Moreover, since the entire lower side of the semiconductor device is the heat dissipation plate 6, and the area occupied by the heat dissipation plate 6 is expanded as compared with the conventional case, the heat conduction efficiency to the mounting substrate 20 can be improved.
【0022】さらに、樹脂10を成形する際には、半導
体チップ1が固着された放熱板6の上面6aで行うと共
に、アウターリード部3bも既に放熱板6のリード接続
部7に接合されているので、樹脂10内での半導体チッ
プ1の上下変動やリード3の変形等が防止され、樹脂成
形状態を改善することができる。Further, the resin 10 is molded on the upper surface 6a of the heat sink 6 to which the semiconductor chip 1 is fixed, and the outer lead portion 3b is already joined to the lead connecting portion 7 of the heat sink 6. Therefore, the vertical movement of the semiconductor chip 1 and the deformation of the leads 3 in the resin 10 are prevented, and the resin molding state can be improved.
【0023】ところで、この種の半導体装置における半
導体チップの動作チェック等の際、従来は、樹脂から突
出するアウターリード部が変形し易いので、半導体装置
をケースいわゆるTABキャリアに収容して行っていた
が、本実施例の半導体装置によれば、アウターリード部
3bが剛性のある放熱板6のリード接続部7に接合され
ているので、特にTABキャリア等を用いなくても、放
熱板6上のアウターリード部3bを介して、半導体チッ
プ1の動作チェック等を極めて容易に行うことができ
る。By the way, when checking the operation of a semiconductor chip in this type of semiconductor device, conventionally, the outer lead portion protruding from the resin is easily deformed, so that the semiconductor device is housed in a so-called TAB carrier. However, according to the semiconductor device of the present embodiment, the outer lead portion 3b is joined to the lead connecting portion 7 of the rigid heat dissipation plate 6, so that the heat dissipation plate 6 on the heat dissipation plate 6 is not particularly required. Through the outer lead portion 3b, the operation check of the semiconductor chip 1 and the like can be performed extremely easily.
【0024】次に、図4は第2実施例を示し、半導体装
置を基板に実装した状態の断面図である。前記第1実施
例と同様に、半導体チップ1とインナーリード部3aと
を接合した後、この例においては、半導体チップ1がフ
ェイスダウンで放熱板6に固着されている。Next, FIG. 4 shows a second embodiment and is a sectional view of a semiconductor device mounted on a substrate. Similar to the first embodiment, after the semiconductor chip 1 and the inner lead portion 3a are joined together, in this example, the semiconductor chip 1 is fixed face down to the heat sink 6.
【0025】半導体チップ1の回路面1a及びリード3
が下向きになるので、放熱板6の上面6aとの間に絶縁
材11が介在されている。この絶縁材11としては、ポ
リイミドフィルム等の絶縁保護シートを用いることがで
きる。なお、リード3の下側にフィルム基材2がある場
合には、半導体チップ1の回路面1a及びインナーリー
ド部3aに対応して絶縁材11を介在させればよい。The circuit surface 1a of the semiconductor chip 1 and the leads 3
Is directed downward, the insulating material 11 is interposed between the heat dissipation plate 6 and the upper surface 6a. An insulating protective sheet such as a polyimide film can be used as the insulating material 11. When the film base material 2 is located below the leads 3, the insulating material 11 may be interposed so as to correspond to the circuit surface 1a of the semiconductor chip 1 and the inner lead portions 3a.
【0026】そして、第1実施例と同様に、アウターリ
ード部3bが放熱板6のリード接続部7に接合されてい
る。さらに、半導体チップ1の非回路面1bには、Ag
ペースト等の接着剤12を用いて放熱フィン13が固着
されている。そして、この放熱フィン13が露出するよ
うに、放熱板6の上面6aにおいて全体が樹脂10で封
止されている。Then, similarly to the first embodiment, the outer lead portion 3b is joined to the lead connecting portion 7 of the heat dissipation plate 6. Further, Ag is not formed on the non-circuit surface 1b of the semiconductor chip 1.
The radiation fins 13 are fixed by using an adhesive 12 such as paste. The entire upper surface 6a of the heat dissipation plate 6 is sealed with the resin 10 so that the heat dissipation fins 13 are exposed.
【0027】この半導体装置は、第1実施例と同様に実
装基板20に実装されるが、この第2実施例によれば、
放熱板6に加えて放熱フィン13からも放熱されるの
で、放熱効果をさらに向上させることができる。This semiconductor device is mounted on the mounting substrate 20 as in the first embodiment, but according to the second embodiment,
Since the heat is dissipated not only from the heat dissipation plate 6 but also from the heat dissipation fin 13, the heat dissipation effect can be further improved.
【0028】次に、図5は前記各実施例の変形例を示
し、半導体装置を基板に実装した状態の要部の拡大断面
図である。放熱板6の下面6bの外端近傍に凹部9が形
成されており、この凹部9内に端子部8の下端が露出さ
れている。この例によれば、実装基板20の配線パター
ン21上に端子部8の下端を位置させた場合でも、放熱
板6の下面6bを実装基板20の表面に完全に密着させ
ることができる。Next, FIG. 5 shows a modification of each of the above-described embodiments, and is an enlarged cross-sectional view of a main portion of a semiconductor device mounted on a substrate. A recess 9 is formed near the outer end of the lower surface 6b of the heat sink 6, and the lower end of the terminal portion 8 is exposed in the recess 9. According to this example, even when the lower end of the terminal portion 8 is located on the wiring pattern 21 of the mounting board 20, the lower surface 6b of the heat dissipation plate 6 can be completely adhered to the surface of the mounting board 20.
【0029】次に、図6は別の変形例を示し、半導体装
置を基板に実装した状態の要部の拡大断面図である。放
熱板6のリード接続部7に接合されたアウターリード部
3bの先端が、その放熱板6の外端よりも外方へ突出さ
れて突出部分3b′となっている。そして、実装時に
は、突出部分3b′が実装基板20の配線パターン21
に半田22により接続されている。この例によれば、放
熱板6の外端に第1実施例のような端子部8を設けなく
てもよいので、放熱板6を薄く形成する場合には特に有
効である。Next, FIG. 6 shows another modified example, and is an enlarged cross-sectional view of a main portion of a semiconductor device mounted on a substrate. The tip of the outer lead portion 3b joined to the lead connecting portion 7 of the heat radiating plate 6 is projected further outward than the outer end of the heat radiating plate 6 to form a protruding portion 3b '. Then, at the time of mounting, the protruding portion 3 b ′ has the wiring pattern 21 of the mounting substrate 20.
Are connected to each other by solder 22. According to this example, since it is not necessary to provide the terminal portion 8 at the outer end of the heat dissipation plate 6 as in the first embodiment, it is particularly effective when the heat dissipation plate 6 is formed thin.
【0030】以上、本発明の実施例について説明した
が、本発明は上記実施例に限定されることなく、本発明
の技術的思想に基づいて各種の有効な変更並びに応用が
可能である。例えば、本実施例では放熱板をほぼアウタ
ーリード部の先端に対応する大きさとしたが、放熱板を
さらに大きくしてリード接続部を外方へ延長してもよ
い。また、本実施例ではフィルム基材上のリードがイン
ナーリード部とアウターリード部とを有するTAB方式
について説明したが、一端が半導体チップに接続されて
他端が放熱板のリード接続部に接合されるリードであれ
ば、他の各種の構造のリードを用いることができる。Although the embodiments of the present invention have been described above, the present invention is not limited to the above embodiments, and various effective modifications and applications can be made based on the technical idea of the present invention. For example, in the present embodiment, the heat dissipation plate has a size substantially corresponding to the tip of the outer lead portion, but the heat dissipation plate may be further enlarged to extend the lead connecting portion outward. Further, in the present embodiment, the TAB method in which the leads on the film base material have the inner lead portion and the outer lead portion has been described, but one end is connected to the semiconductor chip and the other end is joined to the lead connecting portion of the heat sink. Lead having various structures can be used.
【0031】[0031]
【発明の効果】以上説明したように、本発明によれば、
半導体チップが固着される放熱板にリード接続部を設
け、半導体チップに接続されたリードの先端を放熱板の
リード接続部に接合することによって、リードの平坦度
や整列性等による影響を受けることなく、実装基板への
実装を極めて確実に行うことができる。また、リードか
ら放熱板への熱伝導及び放熱板の占有面積の拡大によ
り、放熱板による半導体チップの放熱効果を大幅に向上
させることができる。As described above, according to the present invention,
By providing a lead connection part on the heat dissipation plate to which the semiconductor chip is fixed and joining the tip of the lead connected to the semiconductor chip to the lead connection part of the heat dissipation plate, it may be affected by the flatness or alignment of the leads. Therefore, the mounting on the mounting board can be performed very reliably. In addition, heat conduction from the leads to the heat sink and the occupied area of the heat sink are increased, so that the heat dissipation effect of the semiconductor chip by the heat sink can be significantly improved.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の第1実施例における半導体装置を基板
に実装した状態の断面図である。FIG. 1 is a cross-sectional view of a semiconductor device according to a first embodiment of the present invention mounted on a substrate.
【図2】上記第1実施例の半導体装置においてリードを
接続した半導体チップとリード接続部を設けた放熱板と
の要部の分解斜視図である。FIG. 2 is an exploded perspective view of essential parts of a semiconductor chip to which leads are connected and a heat radiating plate provided with lead connecting portions in the semiconductor device of the first embodiment.
【図3】上記第1実施例の半導体装置を基板に実装した
状態の要部の斜視図である。FIG. 3 is a perspective view of a main portion of the semiconductor device of the first embodiment mounted on a substrate.
【図4】本発明の第2実施例における半導体装置を基板
に実装した状態の断面図である。FIG. 4 is a cross-sectional view of a semiconductor device according to a second embodiment of the present invention mounted on a substrate.
【図5】上記各実施例の変形例における半導体装置を基
板に実装した状態の要部の拡大断面図である。FIG. 5 is an enlarged cross-sectional view of a main part of a semiconductor device according to a modification of each of the above-described embodiments mounted on a substrate.
【図6】上記各実施例の別の変形例における半導体装置
を基板に実装した状態の要部の拡大断面図である。FIG. 6 is an enlarged cross-sectional view of a main part of a semiconductor device according to another modification of each of the above-described embodiments mounted on a substrate.
【図7】従来の半導体装置を基板に実装した状態の断面
図である。FIG. 7 is a cross-sectional view of a conventional semiconductor device mounted on a substrate.
1 半導体チップ 1a 回路面 1b 非回路面 2 フィルム基材 3 リード 3a インナーリード部 3b アウターリード部 3b′ 突出部分 4 バンプ 5、12 接着剤 6 放熱板 6a 上面 6b 下面 7 リード接続部 8 端子部 9 凹部 10 封止樹脂 11 絶縁材 13 放熱フィン 20 実装基板 21 配線パターン 22 半田 1 semiconductor chip 1a circuit surface 1b non-circuit surface 2 film base material 3 lead 3a inner lead portion 3b outer lead portion 3b 'protruding portion 4 bumps 5 and 12 adhesive 6 heat sink 6a upper surface 6b lower surface 7 lead connection portion 8 terminal portion 9 Recess 10 Sealing resin 11 Insulating material 13 Radiating fin 20 Mounting board 21 Wiring pattern 22 Solder
Claims (6)
前記半導体チップに放熱板を固着して樹脂封止してなる
半導体装置において、 前記放熱板の上面で前記半導体チップが搭載される領域
の外側に、前記半導体チップに接続された前記リードと
対応するリード接続部を設け、 前記半導体チップの非回路面を前記放熱板の上面に固着
すると共に、前記半導体チップの回路面から延設された
前記リードの先端を前記放熱板の前記リード接続部に接
合し、前記放熱板の上面において封止用の樹脂部を形成
したことを特徴とする半導体装置。1. A semiconductor device in which a lead is connected to a semiconductor chip, and a heat sink is fixed to the semiconductor chip and resin-sealed, wherein the upper surface of the heat sink is outside an area where the semiconductor chip is mounted. A lead connecting portion corresponding to the lead connected to the semiconductor chip is provided, the non-circuit surface of the semiconductor chip is fixed to an upper surface of the heat dissipation plate, and the lead extended from the circuit surface of the semiconductor chip. The semiconductor device is characterized in that the tip of the heat radiation plate is joined to the lead connection part of the heat radiation plate, and a resin portion for sealing is formed on the upper surface of the heat radiation plate.
前記半導体チップに放熱板を固着して樹脂封止してなる
半導体装置において、 前記放熱板の上面で前記半導体チップが搭載される領域
の外側に、前記半導体チップに接続された前記リードと
対応するリード接続部を設け、 少なくとも前記半導体チップの回路面を絶縁材を介して
前記放熱板の上面に固着すると共に、前記半導体チップ
の回路面から延設された前記リードの先端を前記放熱板
の前記リード接続部に接合し、かつ前記半導体チップの
非回路面に放熱フィンを固着し、この放熱フィンが露出
するように前記放熱板の上面において封止用の樹脂部を
形成したことを特徴とする半導体装置。2. A semiconductor device in which a lead is connected to a semiconductor chip and a heat sink is fixed to the semiconductor chip and resin-sealed, wherein the upper surface of the heat sink is outside the region where the semiconductor chip is mounted. A lead connection portion corresponding to the lead connected to the semiconductor chip is provided, and at least the circuit surface of the semiconductor chip is fixed to the upper surface of the heat sink through an insulating material and extends from the circuit surface of the semiconductor chip. The tip of the provided lead is joined to the lead connection portion of the heat dissipation plate, and a heat dissipation fin is fixed to the non-circuit surface of the semiconductor chip, and the heat dissipation fin is sealed on the upper surface of the heat dissipation plate so as to be exposed. A semiconductor device having a resin portion for stopping formed.
導通する端子部を設け、前記放熱板の下面を実装基板に
密着させた実装時に、前記端子部が前記実装基板の配線
部に接続されることを特徴とする請求項1または2記載
の半導体装置。3. A terminal portion, which is electrically connected to the lead connecting portion, is provided at an outer end of the heat dissipation plate, and the terminal portion serves as a wiring portion of the mounting board when the lower surface of the heat dissipation plate is closely attached to the mounting board. The semiconductor device according to claim 1, wherein the semiconductor device is connected.
け、この凹部内に前記端子部を露出させたことを特徴と
する請求項3記載の半導体装置。4. The semiconductor device according to claim 3, wherein a recess is provided near the outer end of the lower surface of the heat dissipation plate, and the terminal portion is exposed in the recess.
ドの先端を前記放熱板の外端から突出させ、前記放熱板
の下面を実装基板に密着させた実装時に、前記リードの
突出部分が前記実装基板の配線部に接続されることを特
徴とする請求項1または2記載の半導体装置。5. The projecting portion of the lead is mounted at the time of mounting when the tip of the lead joined to the lead connecting portion is projected from the outer end of the heat dissipation plate and the lower surface of the heat dissipation plate is brought into close contact with a mounting board. The semiconductor device according to claim 1, wherein the semiconductor device is connected to a wiring portion of a mounting substrate.
このフィルム基材から内側へ突出するインナーリード部
を前記半導体チップに接続し、前記フィルム基材から外
側へ突出するアウターリード部を前記放熱板の前記リー
ド接続部に接合したことを特徴とする請求項1または2
記載の半導体装置。6. The lead is formed on a film substrate,
An inner lead portion projecting inward from the film base material is connected to the semiconductor chip, and an outer lead portion projecting outward from the film base material is joined to the lead connecting portion of the heat dissipation plate. Item 1 or 2
13. The semiconductor device according to claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6337226A JPH08181168A (en) | 1994-12-26 | 1994-12-26 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6337226A JPH08181168A (en) | 1994-12-26 | 1994-12-26 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH08181168A true JPH08181168A (en) | 1996-07-12 |
Family
ID=18306631
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6337226A Withdrawn JPH08181168A (en) | 1994-12-26 | 1994-12-26 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH08181168A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6275220B1 (en) | 1997-03-17 | 2001-08-14 | Nec Corporation | Flat panel type display apparatuses having driver ICs formed on plate for holding display glasses |
| US6774872B1 (en) | 1998-12-04 | 2004-08-10 | Fujitsu Limited | Flat display device |
| KR100474193B1 (en) * | 1997-08-11 | 2005-07-21 | 삼성전자주식회사 | BG Package and Manufacturing Method |
-
1994
- 1994-12-26 JP JP6337226A patent/JPH08181168A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6275220B1 (en) | 1997-03-17 | 2001-08-14 | Nec Corporation | Flat panel type display apparatuses having driver ICs formed on plate for holding display glasses |
| KR100474193B1 (en) * | 1997-08-11 | 2005-07-21 | 삼성전자주식회사 | BG Package and Manufacturing Method |
| US6774872B1 (en) | 1998-12-04 | 2004-08-10 | Fujitsu Limited | Flat display device |
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