JPH08176408A - Conductive resin paste - Google Patents
Conductive resin pasteInfo
- Publication number
- JPH08176408A JPH08176408A JP32005194A JP32005194A JPH08176408A JP H08176408 A JPH08176408 A JP H08176408A JP 32005194 A JP32005194 A JP 32005194A JP 32005194 A JP32005194 A JP 32005194A JP H08176408 A JPH08176408 A JP H08176408A
- Authority
- JP
- Japan
- Prior art keywords
- conductive resin
- resin paste
- formula
- represented
- curing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229920005989 resin Polymers 0.000 title claims abstract description 33
- 239000011347 resin Substances 0.000 title claims abstract description 33
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 14
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000003822 epoxy resin Substances 0.000 claims abstract description 11
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims abstract description 4
- 150000002460 imidazoles Chemical class 0.000 claims description 11
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 claims description 7
- 239000007788 liquid Substances 0.000 claims description 7
- MGTVNFGFEXMEBM-UHFFFAOYSA-N 4-ethenyltriazine Chemical compound C=CC1=CC=NN=N1 MGTVNFGFEXMEBM-UHFFFAOYSA-N 0.000 claims description 4
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 abstract description 9
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 abstract description 4
- 239000000460 chlorine Substances 0.000 abstract description 4
- 229910052708 sodium Inorganic materials 0.000 abstract description 4
- 239000011734 sodium Substances 0.000 abstract description 4
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 abstract description 3
- 229910052801 chlorine Inorganic materials 0.000 abstract description 3
- 238000013329 compounding Methods 0.000 abstract description 2
- 238000001723 curing Methods 0.000 description 24
- 239000004593 Epoxy Substances 0.000 description 8
- 239000003795 chemical substances by application Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 238000010521 absorption reaction Methods 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 4
- -1 halogen ions Chemical class 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229920003986 novolac Polymers 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- CUFXMPWHOWYNSO-UHFFFAOYSA-N 2-[(4-methylphenoxy)methyl]oxirane Chemical compound C1=CC(C)=CC=C1OCC1OC1 CUFXMPWHOWYNSO-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- BRLQWZUYTZBJKN-UHFFFAOYSA-N Epichlorohydrin Chemical compound ClCC1CO1 BRLQWZUYTZBJKN-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical group C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000004898 kneading Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- PZVOOXOMADTHHD-UHFFFAOYSA-N 2-(2-hydroxy-4,6-dimethylphenyl)-3,5-dimethylphenol Chemical compound OC1=CC(C)=CC(C)=C1C1=C(C)C=C(C)C=C1O PZVOOXOMADTHHD-UHFFFAOYSA-N 0.000 description 1
- YSUQLAYJZDEMOT-UHFFFAOYSA-N 2-(butoxymethyl)oxirane Chemical compound CCCCOCC1CO1 YSUQLAYJZDEMOT-UHFFFAOYSA-N 0.000 description 1
- YCUKMYFJDGKQFC-UHFFFAOYSA-N 2-(octan-3-yloxymethyl)oxirane Chemical compound CCCCCC(CC)OCC1CO1 YCUKMYFJDGKQFC-UHFFFAOYSA-N 0.000 description 1
- HJEORQYOUWYAMR-UHFFFAOYSA-N 2-[(2-butylphenoxy)methyl]oxirane Chemical compound CCCCC1=CC=CC=C1OCC1OC1 HJEORQYOUWYAMR-UHFFFAOYSA-N 0.000 description 1
- KUAUJXBLDYVELT-UHFFFAOYSA-N 2-[[2,2-dimethyl-3-(oxiran-2-ylmethoxy)propoxy]methyl]oxirane Chemical compound C1OC1COCC(C)(C)COCC1CO1 KUAUJXBLDYVELT-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- OECTYKWYRCHAKR-UHFFFAOYSA-N 4-vinylcyclohexene dioxide Chemical compound C1OC1C1CC2OC2CC1 OECTYKWYRCHAKR-UHFFFAOYSA-N 0.000 description 1
- LCFVJGUPQDGYKZ-UHFFFAOYSA-N Bisphenol A diglycidyl ether Chemical compound C=1C=C(OCC2OC2)C=CC=1C(C)(C)C(C=C1)=CC=C1OCC1CO1 LCFVJGUPQDGYKZ-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- FQYUMYWMJTYZTK-UHFFFAOYSA-N Phenyl glycidyl ether Chemical compound C1OC1COC1=CC=CC=C1 FQYUMYWMJTYZTK-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 1
- AWMVMTVKBNGEAK-UHFFFAOYSA-N Styrene oxide Chemical compound C1OC1C1=CC=CC=C1 AWMVMTVKBNGEAK-UHFFFAOYSA-N 0.000 description 1
- 125000002723 alicyclic group Chemical group 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- VCCBEIPGXKNHFW-UHFFFAOYSA-N biphenyl-4,4'-diol Chemical compound C1=CC(O)=CC=C1C1=CC=C(O)C=C1 VCCBEIPGXKNHFW-UHFFFAOYSA-N 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- CDQSJQSWAWPGKG-UHFFFAOYSA-N butane-1,1-diol Chemical compound CCCC(O)O CDQSJQSWAWPGKG-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 1
- BQQUFAMSJAKLNB-UHFFFAOYSA-N dicyclopentadiene diepoxide Chemical compound C12C(C3OC33)CC3C2CC2C1O2 BQQUFAMSJAKLNB-UHFFFAOYSA-N 0.000 description 1
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 1
- 239000003085 diluting agent Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 239000010946 fine silver Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- WJRBRSLFGCUECM-UHFFFAOYSA-N hydantoin Chemical compound O=C1CNC(=O)N1 WJRBRSLFGCUECM-UHFFFAOYSA-N 0.000 description 1
- 229940091173 hydantoin Drugs 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 238000004255 ion exchange chromatography Methods 0.000 description 1
- 238000013035 low temperature curing Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- FZZQNEVOYIYFPF-UHFFFAOYSA-N naphthalene-1,6-diol Chemical compound OC1=CC=CC2=CC(O)=CC=C21 FZZQNEVOYIYFPF-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- USFPINLPPFWTJW-UHFFFAOYSA-N tetraphenylphosphonium Chemical compound C1=CC=CC=C1[P+](C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 USFPINLPPFWTJW-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Plural Heterocyclic Compounds (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Epoxy Resins (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Conductive Materials (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明はIC、LSI等の半導体
素子を金属フレーム等に接着する導電性樹脂ペーストに
関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive resin paste for adhering semiconductor elements such as IC and LSI to a metal frame or the like.
【0002】[0002]
【従来の技術】半導体製造工程における半導体素子の接
着、いわゆるダイボンド工程において生産性の向上を目
的としダイボンダー、ワイヤーボンダー等を同一ライン
上に配置したインライン硬化方式が採用され、今後益々
増加する傾向にある。インライン硬化方式では、従来か
ら行われてきたバッチ方式による導電性樹脂ペーストの
硬化に比較し、硬化に要する時間は著しく制限される。
例えば、オーブン硬化方式の場合には、150〜200
℃、60〜90分間で硬化を行っていたが、インライン
硬化方式の場合には15〜90秒間での硬化が要求され
ている。更に、チップサイズが大きく、銅フレームを用
いる半導体製品のインライン硬化に際して、チップと銅
フレームの熱膨張係数の差に基づく、チップの反り量の
最小限化及びフレームの酸化防止のためにも低温硬化が
求められ、又硬化時間に関してもより短時間での硬化が
要求されている。2. Description of the Related Art In-line curing method in which a die bonder, a wire bonder, etc. are arranged on the same line is adopted for the purpose of improving the productivity in the so-called die-bonding process, which is the bonding of semiconductor elements in the semiconductor manufacturing process. is there. In the in-line curing method, the time required for curing is significantly limited as compared with the conventional method of curing the conductive resin paste by the batch method.
For example, in the case of the oven curing method, 150 to 200
The curing was carried out at 60 ° C. for 60 to 90 minutes, but in the case of the in-line curing method, curing in 15 to 90 seconds is required. Furthermore, due to the large chip size and in-line curing of semiconductor products that use a copper frame, low-temperature curing is used to minimize chip warpage and prevent frame oxidation due to the difference in thermal expansion coefficient between the chip and copper frame. In addition, the curing time is required to be shorter.
【0003】従来より用いられてきたポリイミド系の導
電性ペーストの場合、N−メチル−2−ピロリドン、ジ
メチルホルムアミド等の高沸点溶媒を使用しているため
90秒以下の短時間での硬化は難しく、短時間で硬化を
行うには硬化温度を250℃以上にしなければならない
ため、硬化中に多量のボイドが発生し接着力の低下、導
電性、熱伝導性の悪化等半導体製品の特性の低下につな
がっていた。一方、現在主流のエポキシ系の導電性ペー
ストの場合には、例えばアミン系硬化剤等を用いること
により60秒程度での硬化は可能であるが、15〜30
秒といった超短時間硬化への対応はなされていない。In the case of the conventional polyimide-based conductive paste, it is difficult to cure in a short time of 90 seconds or less because a high boiling point solvent such as N-methyl-2-pyrrolidone or dimethylformamide is used. However, in order to carry out curing in a short time, the curing temperature must be 250 ° C or higher, so a large amount of voids are generated during curing, resulting in deterioration of adhesive strength, deterioration of electrical conductivity and thermal conductivity, and deterioration of semiconductor product characteristics. Was connected to. On the other hand, in the case of the epoxy-based conductive paste, which is the mainstream at present, it is possible to cure in about 60 seconds by using, for example, an amine-based curing agent, but 15 to 30.
No cure for ultra-short time such as seconds has been made.
【0004】[0004]
【発明が解決しようとする課題】本発明は、200℃以
下で30秒以下の硬化条件でも硬化可能で、かつナトリ
ウム、塩素等のイオン性不純物の少ない高信頼性の導電
性樹脂ペーストを提供するものである。DISCLOSURE OF THE INVENTION The present invention provides a highly reliable conductive resin paste which can be cured even at a curing condition of 200 ° C. or lower for 30 seconds or less and has a small amount of ionic impurities such as sodium and chlorine. It is a thing.
【0005】[0005]
【課題を解決するための手段】本発明は、(A)銀粉、
(B)常温で液状のエポキシ樹脂、(C)下記式(1)
で示されるビフェノール誘導体、(D)下記式(2)で
示されるイミダゾール誘導体を必須成分とする導電性樹
脂ペーストであって、かつ全導電性樹脂ペースト中に銀
粉(A)を60〜85重量%、式(1)で示されるビフ
ェノール誘導体(C)を0.5〜5重量%、式(2)で
示されるイミダゾール誘導体(D)を0.5〜3.0重
量%含む導電性樹脂ペーストであり、塗布作業性が良好
で、かつ式(1)で示されるビフェノール誘導体及び式
(2)で示されるイミダゾール誘導体を併用することに
より、200℃以下で30秒以下の硬化が可能になると
共に、高温での接着性、応力緩和特性、低吸水性に優
れ、かつ十分なポットライフを有するものである。The present invention provides (A) silver powder,
(B) Epoxy resin that is liquid at room temperature, (C) The following formula (1)
A biphenol derivative represented by the formula (D), a conductive resin paste containing an imidazole derivative represented by the following formula (2) as an essential component, and 60 to 85% by weight of silver powder (A) in the total conductive resin paste. A conductive resin paste containing 0.5 to 5% by weight of the biphenol derivative (C) represented by the formula (1) and 0.5 to 3.0% by weight of the imidazole derivative (D) represented by the formula (2). By using the biphenol derivative represented by the formula (1) and the imidazole derivative represented by the formula (2) together, it is possible to cure at 200 ° C. or lower for 30 seconds or less, It has excellent adhesiveness at high temperatures, stress relaxation characteristics, low water absorption, and a sufficient pot life.
【0006】[0006]
【化3】 (Rは、H、又はCH3で、同一でも異なってもよい)Embedded image (R is H or CH 3 and may be the same or different)
【0007】[0007]
【化4】 (R1=CH3、C2H5、C11H23、又はフェニル、
R2、R3=H、CH3、又はC2H5)[Chemical 4] (R 1 = CH 3 , C 2 H 5 , C 11 H 23 , or phenyl,
R 2 , R 3 = H, CH 3 , or C 2 H 5 )
【0008】本発明に用いる銀粉は用いる分野が電子電
気分野のためハロゲンイオン、アルカリ金属イオン等の
イオン性不純物量が10ppm以下であることが望まし
い。又、形状としてはフレーク状、樹枝状あるいは球状
のものを単独あるいは混合して用いることができる。更
に粒径に関しては、通常平均粒径が2〜10μm、最大
粒径は50μm程度のものが好ましく、比較的細かい銀
粉と粗い銀粉を混合して用いてもよい。全導電性樹脂ペ
ースト中の銀粉量が60重量%未満だと、硬化物の電気
伝導性が低下し、85重量%を越えると樹脂ペーストの
粘度が高くなり過ぎ塗布作業性の低下の原因となるので
好ましくない。The silver powder used in the present invention is preferably used in an electronic and electrical field because the amount of ionic impurities such as halogen ions and alkali metal ions is 10 ppm or less. As the shape, flaky, dendritic or spherical shapes can be used alone or in combination. Regarding the particle size, it is usually preferable that the average particle size is 2 to 10 μm and the maximum particle size is about 50 μm, and relatively fine silver powder and coarse silver powder may be mixed and used. If the amount of silver powder in the total conductive resin paste is less than 60% by weight, the electrical conductivity of the cured product will decrease, and if it exceeds 85% by weight, the viscosity of the resin paste will be too high, which will cause deterioration of coating workability. It is not preferable.
【0009】本発明に用いるエポキシ樹脂は、常温で液
状のものであり、常温で液状のものでないと銀粉との混
練において溶剤を必要とする。溶剤は気泡の原因となり
硬化物の接着強度、熱伝導率を低下させてしまうので好
ましくない。常温で液状のエポキシ樹脂とは、例えば常
温で固形のものでも常温で液状のエポキシ樹脂と混合す
ることで常温で安定して液状を示すものを含む。本発明
に用いるエポキシ樹脂としては、ビスフェノールA、ビ
スフェノールF、フェノールノボラック樹脂、クレゾー
ル型ノボラック樹脂等とエピクロルヒドリンとの反応に
より得られるポリグリシジルエーテル、1、6ージヒド
ロキシナフタレンジグリシジルエーテル、ブタンジオー
ルジグリシジルエーテル、ネオペンチルグリコールジグ
リシジルエーテル等の脂肪族エポキシ、ジグリシジルヒ
ダントイン等の複素環式エポキシ、ビニルシクロヘキセ
ンジオキサイド、ジシクロペンタジエンジオキサイド、
アリサイクリックジエポキシーアジペイト等の脂環式エ
ポキシ、更にはn−ブチルグリシジルエーテル、バーサ
ティック酸グリシジルエステル、スチレンオキサイド、
エチルヘキシルグリシジルエーテル、フェニルグリシジ
ルエーテル、クレジルグリシジルエーテル、ブチルフェ
ニルグリシジルエーテル等の通常のエポキシ樹脂の希釈
剤として用いられるものがあり、これらは単独でも混合
して用いても差し支えない。The epoxy resin used in the present invention is liquid at room temperature, and unless it is liquid at room temperature, a solvent is required for kneading with silver powder. The solvent is not preferable because it causes bubbles and reduces the adhesive strength and thermal conductivity of the cured product. The epoxy resin which is liquid at room temperature includes, for example, those which are solid at room temperature and which are stable at room temperature when mixed with the epoxy resin which is liquid at room temperature. Examples of the epoxy resin used in the present invention include polyglycidyl ether obtained by the reaction of bisphenol A, bisphenol F, phenol novolac resin, cresol type novolac resin and epichlorohydrin, 1,6-dihydroxynaphthalene diglycidyl ether, butanediol diglycidyl. Ethers, aliphatic epoxies such as neopentyl glycol diglycidyl ether, heterocyclic epoxies such as diglycidyl hydantoin, vinylcyclohexene dioxide, dicyclopentadiene dioxide,
Alicyclic epoxies such as alicyclic diepoxy-adipate, n-butyl glycidyl ether, versatic acid glycidyl ester, styrene oxide,
Some are used as diluents for ordinary epoxy resins such as ethylhexyl glycidyl ether, phenyl glycidyl ether, cresyl glycidyl ether, butyl phenyl glycidyl ether, and these may be used alone or in combination.
【0010】本発明で用いる式(1)のビフェノール誘
導体は、融点が高く、又通常のエポキシ樹脂には常温で
溶解しないので、導電性樹脂ペースト中に粉末にして分
散させるため保存性に優れている。又ビフェニル骨格は
内部回転のエネルギーが比較的小さいため得られた硬化
物は強靭であり、更に硬化物の自由体積が小さくなるの
で低吸水化が図れる。式(1)のRは、H、又はCH3
で、同一でも異なってもよいが、好ましいのは、全ての
Rが、CH3又はHである。式(1)のビフェノール誘
導体は、全導電性樹脂ペースト中に0.5〜5重量%、
好ましくは1〜3重量%含まれる。0.5重量%未満だ
と、目的とする強靭性、低吸水性が発現されず、5重量
%を越えると導電性樹脂ペーストの粘度が高くなり過ぎ
実用的でない。The biphenol derivative of the formula (1) used in the present invention has a high melting point and does not dissolve in ordinary epoxy resins at room temperature. There is. Further, since the biphenyl skeleton has a relatively small internal rotation energy, the obtained cured product is tough, and the free volume of the cured product is small, so that low water absorption can be achieved. R in the formula (1) is H or CH 3
, And may be the same or different, but preferred is that all R are CH 3 or H. The biphenol derivative of the formula (1) is 0.5 to 5% by weight in the total conductive resin paste,
It is preferably contained in an amount of 1 to 3% by weight. If it is less than 0.5% by weight, the desired toughness and low water absorption are not exhibited, and if it exceeds 5% by weight, the viscosity of the conductive resin paste becomes too high, which is not practical.
【0011】本発明の式(2)のイミダゾール誘導体
は、式(1)のビフェノール誘導体単独では硬化性が悪
く、インライン硬化対応材としての速硬化性を有してい
ないため併用するものである。又式(2)以外の通常の
イミダゾール類を用いた場合、反応性は良好となるが、
反面保存性が悪くなり実用性に乏しい。本発明のイミダ
ゾール類とビニルトリアジンとの付加物を使用すること
により反応性と保存性を両立することが可能となった。
式(2)で示されるイミダゾール誘導体は、全導電性樹
脂ペースト中に0.5〜3.0重量%含まれる。0.5
重量%未満だと十分な硬化性が発現されず、3.0重量
%を越えるとイミダゾール類を用いた硬化物の欠点であ
る高温での接着力が低下するので好ましくない。式
(2)のR1は、CH3、C2H5、C11H23、又はフェニ
ル、R2、R3=H、CH3、又はC2H5であるが、好ま
しいのは、R1がCH3で、R2とR3はHである。即ち、
2−メチルイミダゾールとビニルトリアジンの付加物で
ある。The imidazole derivative of the formula (2) of the present invention is used in combination because the biphenol derivative of the formula (1) alone has poor curability and does not have fast curability as an in-line curable material. In addition, when the usual imidazoles other than the formula (2) are used, the reactivity becomes good,
On the other hand, it is poor in storability and poor in practicality. By using the adduct of the imidazoles of the present invention and vinyltriazine, it becomes possible to achieve both reactivity and storage stability.
The imidazole derivative represented by the formula (2) is contained in the total conductive resin paste in an amount of 0.5 to 3.0% by weight. 0.5
If it is less than wt%, sufficient curability will not be exhibited, and if it exceeds 3.0 wt%, the adhesive strength at high temperature, which is a drawback of a cured product using an imidazole, decreases, which is not preferable. R 1 in formula (2) is CH 3 , C 2 H 5 , C 11 H 23 , or phenyl, R 2 , R 3 ═H, CH 3 , or C 2 H 5 , with preference for R 1. 1 is CH 3 and R 2 and R 3 are H. That is,
It is an adduct of 2-methylimidazole and vinyltriazine.
【0012】又必要に応じ、潜在性アミン硬化剤等の他
の硬化剤と併用してもよい。併用するものとして、例え
ば第3級アミン、他のイミダゾール類、トリフェニルホ
スフィン、テトラフェニルホスフィン・テトラフェニル
ボレート、1,8−ジアザビシクロウンデセン等の一般
にエポキシ樹脂とフェノール系硬化剤との硬化促進剤が
挙げられる。本発明においては、必要に応じ可撓性付与
剤、消泡剤、カップリング剤等を用てもよい。本発明の
製造方法は例えば各成分を予備混合した後、3本ロール
を用いて混練し、混練後真空下脱泡し樹脂ペーストを得
るなどがある。If desired, it may be used in combination with another curing agent such as a latent amine curing agent. Examples of the concomitant use include curing of generally epoxy resins such as tertiary amines, other imidazoles, triphenylphosphine, tetraphenylphosphine / tetraphenylborate, and 1,8-diazabicycloundecene with a phenolic curing agent. Examples include accelerators. In the present invention, a flexibility-imparting agent, a defoaming agent, a coupling agent, etc. may be used if necessary. The production method of the present invention includes, for example, premixing the respective components, kneading them using a three-roll mill, and defoaming under vacuum to obtain a resin paste.
【0013】以下実施例を用いて本発明を具体的に説明
する。配合割合は重量部で示す。 実施例1〜5 粒径1〜30μmで平均粒径3μmのフレーク状銀粉
と、ビスフェノールAとエピクロルヒドリンとの反応に
より得られるジグリシジルビスフェノールA(エポキシ
当量180、常温で液体、以下ビスAエポキシ)、クレ
ジルグリシジルエーテル(エポキシ当量185)、3,
3’,5,5’−テトラメチルビフェノール(本州化学
工業(株)・製、以下ビフェノールA)、2−メチルイ
ミダゾールアジン(2−メチルイミダゾールとビニルト
リアジンの付加物)(四国化成工業(株)・製2MZ−
A、以下2MZ−A)、ジシアンジアミド、1,8−ジ
アザビシクロウンデセンを表1に示す割合で配合し、3
本ロールで混練して導電性樹脂ペーストを得た。この導
電性樹脂ペーストを真空チャンバーにて2mmHgで3
0分間脱泡した後、以下の方法により各種性能を評価し
た。The present invention will be specifically described below with reference to examples. The blending ratio is shown in parts by weight. Examples 1 to 5 Diglycidyl bisphenol A (epoxy equivalent 180, liquid at room temperature, hereinafter bis A epoxy) obtained by reaction of flaky silver powder having a particle size of 1 to 30 μm and an average particle size of 3 μm with bisphenol A and epichlorohydrin, Cresyl glycidyl ether (epoxy equivalent 185), 3,
3 ', 5,5'-Tetramethylbiphenol (manufactured by Honshu Chemical Industry Co., Ltd., hereinafter biphenol A), 2-methylimidazole azine (addition product of 2-methylimidazole and vinyltriazine) (Shikoku Chemicals Co., Ltd.)・ Production 2MZ-
A, hereafter 2MZ-A), dicyandiamide, and 1,8-diazabicycloundecene were mixed in the proportions shown in Table 1, and 3
It kneaded with this roll and obtained the conductive resin paste. This conductive resin paste is 3 mm at 2 mmHg in a vacuum chamber.
After defoaming for 0 minutes, various performances were evaluated by the following methods.
【0014】ゲルタイム :導電性樹脂ペースト1cc
を170℃の熱板上に置きスパチュラでかきまぜ導電性
樹脂ペーストが流動性を示さなくなるまでの時間を測
定。 粘度 :E型粘度計(3°コーン)を用い、25
℃、2.5rpmでの値を測定し粘度とした。又、25
℃で3日間放置後の粘度を測定。 糸引き性 :導電性樹脂ペーストの中へ直径1mmφ
のピンを深さ5mmまで入れ、ピンを300mm/分の
速度で引き上げ、ペーストが切れたときの高さを測定。 体積抵抗率 :スライドガラス上に導電性樹脂ペースト
を幅4mm、厚さ30μmに塗布し、200℃のホット
プレート上で30秒間硬化した後、硬化物の体積抵抗率
を測定。 弾性率 :テフロンシート上に導電性樹脂ペースト
を10×150×0.1mmになるように塗布し、15
0℃のオーブン中で30分間硬化した後引張り試験機に
て試験長100mm、試験速度1mm/分で加重−変位
曲線を測定し、その初期勾配より弾性率を算出。Gel time: 1 cc of conductive resin paste
Place on a hot plate at 170 ° C, stir with a spatula, and measure the time until the conductive resin paste shows no fluidity. Viscosity: E type viscometer (3 ° cone), 25
The viscosity was measured by measuring the value at 2.5 ° C. at 2.5 ° C. Also, 25
Measure the viscosity after standing for 3 days at ℃. String pullability: Diameter of 1mmφ into conductive resin paste
Insert the pin up to a depth of 5 mm, pull up the pin at a speed of 300 mm / min, and measure the height when the paste is broken. Volume resistivity: A conductive resin paste having a width of 4 mm and a thickness of 30 μm was applied on a slide glass and cured on a hot plate at 200 ° C. for 30 seconds, and then the volume resistivity of the cured product was measured. Elastic modulus: A conductive resin paste is applied on a Teflon sheet so as to have a size of 10 × 150 × 0.1 mm, and then 15
After curing in an oven at 0 ° C. for 30 minutes, a load-displacement curve was measured with a tensile tester at a test length of 100 mm and a test speed of 1 mm / min, and the elastic modulus was calculated from the initial gradient.
【0015】吸水率 :テフロンシート上に導電性
樹脂ペーストを50×50×0.1mmになるように塗
布し、150℃のオーブン中で30分間硬化した後、8
5℃、85%、72時間吸水処理を行い、処理前後の重
量変化より吸水率を算出。 チップの反り:6×15×0.3mmシリコンチップを
銅フレーム(厚さ200μm)に導電性樹脂ペーストで
マウントし、200℃、30秒硬化した後、チップの反
りを表面粗さ計(測定長13mm)で測定。 接着強度 :5×5mmのシリコンチップを導電性樹
脂ペーストを用いて銅フレームにマウントし200℃の
ホットプレート上で、30秒間硬化した。硬化後プッシ
ュプルゲージを用い240℃での熱時ダイシェア強度を
測定。 不純物 :硬化、粉砕した導電性樹脂ペースト2g
及び純水40mlを125℃、20時間抽出して、得ら
れた抽出液のナトリウムおよび塩素イオン濃度をイオン
クロマトグラフィーにて測定。Water absorption: A conductive resin paste was applied on a Teflon sheet so as to have a size of 50 × 50 × 0.1 mm and cured in an oven at 150 ° C. for 30 minutes, and then 8
Water absorption treatment was performed at 5 ° C for 85 hours at 85%, and the water absorption rate was calculated from the weight change before and after the treatment. Chip warpage: A 6x15x0.3mm silicon chip was mounted on a copper frame (thickness: 200 µm) with a conductive resin paste and cured at 200 ° C for 30 seconds, and then the chip warpage was measured using a surface roughness meter (measurement length). 13 mm). Adhesive strength: A 5 × 5 mm silicon chip was mounted on a copper frame using a conductive resin paste and cured on a hot plate at 200 ° C. for 30 seconds. After curing, measure the die shear strength when heated at 240 ° C using a push-pull gauge. Impurity: 2g of hardened and crushed conductive resin paste
And 40 ml of pure water was extracted at 125 ° C. for 20 hours, and the sodium and chloride ion concentrations of the obtained extract were measured by ion chromatography.
【0016】実施例6 硬化剤としてp,p’−ビフェノール(本州化学工業
(株)・製、以下ビフェノールB)を使用した他は、実
施例1〜5と同様にして導電性樹脂ペーストを作製し評
価した。評価結果を表1に示す。 比較例1〜6 表2に示す配合割合で実施例と全く同様にして導電性樹
脂ペーストを作製した。なお比較例5では、硬化剤とし
てフェノールノボラック樹脂(水酸基当量104、軟化
点85℃)を用いた。又比較例6では使用する硬化剤と
して2−メチルイミダゾール(四国化成工業(株)・
製、2MZ、以下2MZ)を用いた。評価結果を表2に
示す。Example 6 A conductive resin paste was prepared in the same manner as in Examples 1 to 5 except that p, p'-biphenol (manufactured by Honshu Chemical Industry Co., Ltd., hereinafter biphenol B) was used as a curing agent. And evaluated. Table 1 shows the evaluation results. Comparative Examples 1 to 6 Conductive resin pastes were prepared with the compounding ratios shown in Table 2 in exactly the same manner as in the examples. In Comparative Example 5, a phenol novolac resin (hydroxyl group equivalent 104, softening point 85 ° C.) was used as a curing agent. In Comparative Example 6, 2-methylimidazole (Shikoku Chemicals Co., Ltd.) was used as the curing agent.
Manufactured by 2MZ, hereinafter 2MZ) was used. Table 2 shows the evaluation results.
【0017】[0017]
【表1】 [Table 1]
【0018】[0018]
【表2】 [Table 2]
【0019】[0019]
【発明の効果】本発明の導電性樹脂ペーストは、ディス
ペンス塗布時の作業性が良好で、又ナトリウム、塩素な
どのイオン性不純物が少なく銅、42合金等の金属フレ
ーム、セラミック基板、ガラスエポキシ等の有機基板へ
のIC,LSI等の半導体素子の接着に用いることがで
きる。特に硬化性が良好なため、200℃以下、30秒
以下で硬化が可能であり、従来になかった高信頼性の半
導体素子接着用の導電性樹脂ペーストである。EFFECTS OF THE INVENTION The conductive resin paste of the present invention has good workability at the time of dispensing and has less ionic impurities such as sodium and chlorine, copper, metal frame such as 42 alloy, ceramic substrate, glass epoxy, etc. It can be used for adhering semiconductor elements such as IC and LSI to the organic substrate. In particular, since it has good curability, it can be cured at 200 ° C. or lower for 30 seconds or less, and it is a highly reliable conductive resin paste for bonding semiconductor elements, which has never existed before.
フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 C09J 9/02 Continuation of front page (51) Int.Cl. 6 Identification code Office reference number FI technical display area C09J 9/02
Claims (2)
シ樹脂、(C)下記式(1)で示されるビフェノール誘
導体、(D)下記式(2)で示されるイミダゾール誘導
体を必須成分とする導電性樹脂ペーストであって、かつ
全導電性樹脂ペースト中に銀粉(A)を60〜85重量
%、式(1)で示されるビフェノール誘導体(C)を
0.5〜5重量%、式(2)で示されるイミダゾール誘
導体(D)を0.5〜3.0重量%含むことを特徴とす
る導電性樹脂ペースト。 【化1】 (Rは、H、又はCH3で、同一でも異なってもよい) 【化2】 (R1=CH3、C2H5、C11H23、又はフェニル、
R2、R3=H、CH3、又はC2H5)1. An essential component comprising (A) silver powder, (B) an epoxy resin which is liquid at room temperature, (C) a biphenol derivative represented by the following formula (1), and (D) an imidazole derivative represented by the following formula (2). Which is a conductive resin paste containing 60 to 85% by weight of silver powder (A) and 0.5 to 5% by weight of the biphenol derivative (C) represented by the formula (1) in the entire conductive resin paste, A conductive resin paste containing 0.5 to 3.0% by weight of the imidazole derivative (D) represented by the formula (2). Embedded image (R is H or CH 3 and may be the same or different.) (R 1 = CH 3 , C 2 H 5 , C 11 H 23 , or phenyl,
R 2 , R 3 = H, CH 3 , or C 2 H 5 )
ダゾールとビニルトリアジンの付加物である請求項1記
載の導電性樹脂ペースト。2. The conductive resin paste according to claim 1, wherein the imidazole derivative is an adduct of 2-methylimidazole and vinyltriazine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32005194A JP3214685B2 (en) | 1994-12-22 | 1994-12-22 | Conductive resin paste |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32005194A JP3214685B2 (en) | 1994-12-22 | 1994-12-22 | Conductive resin paste |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08176408A true JPH08176408A (en) | 1996-07-09 |
| JP3214685B2 JP3214685B2 (en) | 2001-10-02 |
Family
ID=18117185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP32005194A Expired - Fee Related JP3214685B2 (en) | 1994-12-22 | 1994-12-22 | Conductive resin paste |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3214685B2 (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11140280A (en) * | 1997-11-11 | 1999-05-25 | Ngk Spark Plug Co Ltd | Paste for filling through hole and printed wiring board using the same |
| JPH11199759A (en) * | 1997-11-11 | 1999-07-27 | Ngk Spark Plug Co Ltd | Filler for printed wiring board and printed wiring board using the same |
| WO2004083332A1 (en) * | 2003-03-18 | 2004-09-30 | Dow Corning Corporation | A conductive adhesive composition |
| WO2011036836A1 (en) * | 2009-09-25 | 2011-03-31 | 株式会社Adeka | Solvent-free and one-pack type cyanic ester/epoxy composite resin composition |
| JP2012224733A (en) * | 2011-04-19 | 2012-11-15 | Mitsui Chemicals Inc | Adhesive composition, production method of the same, cured material of the same, and electronic device using the same |
| JP2016011406A (en) * | 2014-06-03 | 2016-01-21 | 太陽インキ製造株式会社 | Conductive adhesive and electronic component using the same |
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| US8105690B2 (en) | 1998-03-03 | 2012-01-31 | Ppg Industries Ohio, Inc | Fiber product coated with particles to adjust the friction of the coating and the interfilament bonding |
| US6949289B1 (en) | 1998-03-03 | 2005-09-27 | Ppg Industries Ohio, Inc. | Impregnated glass fiber strands and products including the same |
| US6593255B1 (en) | 1998-03-03 | 2003-07-15 | Ppg Industries Ohio, Inc. | Impregnated glass fiber strands and products including the same |
| US6419981B1 (en) | 1998-03-03 | 2002-07-16 | Ppg Industries Ohio, Inc. | Impregnated glass fiber strands and products including the same |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11140280A (en) * | 1997-11-11 | 1999-05-25 | Ngk Spark Plug Co Ltd | Paste for filling through hole and printed wiring board using the same |
| JPH11199759A (en) * | 1997-11-11 | 1999-07-27 | Ngk Spark Plug Co Ltd | Filler for printed wiring board and printed wiring board using the same |
| WO2004083332A1 (en) * | 2003-03-18 | 2004-09-30 | Dow Corning Corporation | A conductive adhesive composition |
| WO2011036836A1 (en) * | 2009-09-25 | 2011-03-31 | 株式会社Adeka | Solvent-free and one-pack type cyanic ester/epoxy composite resin composition |
| CN102574987A (en) * | 2009-09-25 | 2012-07-11 | Adeka株式会社 | Solvent-free one-component cyanate ester-epoxy composite resin composition |
| US9601401B2 (en) | 2009-09-25 | 2017-03-21 | Adeka Corporation | Solventless one liquid type cyanate ester-epoxy composite resin composition |
| JP2012224733A (en) * | 2011-04-19 | 2012-11-15 | Mitsui Chemicals Inc | Adhesive composition, production method of the same, cured material of the same, and electronic device using the same |
| JP2016011406A (en) * | 2014-06-03 | 2016-01-21 | 太陽インキ製造株式会社 | Conductive adhesive and electronic component using the same |
| WO2018164042A1 (en) * | 2017-03-07 | 2018-09-13 | 日本化薬株式会社 | Curable resin composition, cured product thereof, and method for producing curable resin composition |
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| Publication number | Publication date |
|---|---|
| JP3214685B2 (en) | 2001-10-02 |
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