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JPH0751794Y2 - Semiconductor mounting structure - Google Patents

Semiconductor mounting structure

Info

Publication number
JPH0751794Y2
JPH0751794Y2 JP1991094453U JP9445391U JPH0751794Y2 JP H0751794 Y2 JPH0751794 Y2 JP H0751794Y2 JP 1991094453 U JP1991094453 U JP 1991094453U JP 9445391 U JP9445391 U JP 9445391U JP H0751794 Y2 JPH0751794 Y2 JP H0751794Y2
Authority
JP
Japan
Prior art keywords
semiconductor chip
film carrier
semiconductor
mounting structure
tab
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1991094453U
Other languages
Japanese (ja)
Other versions
JPH0546033U (en
Inventor
健一 森永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Funai Electric Co Ltd
Original Assignee
Funai Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Funai Electric Co Ltd filed Critical Funai Electric Co Ltd
Priority to JP1991094453U priority Critical patent/JPH0751794Y2/en
Publication of JPH0546033U publication Critical patent/JPH0546033U/en
Application granted granted Critical
Publication of JPH0751794Y2 publication Critical patent/JPH0751794Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】本考案は、フィルムキャリヤ(T
AB:Tape Automated Bondin
g)を利用して、例えば半導体チップ等の電子部品を配
線基板上に実装する半導体の実装構造に関するものであ
る。
[Industrial application] This invention is a film carrier (T
AB: Tape Automated Bondin
The present invention relates to a semiconductor mounting structure for mounting an electronic component such as a semiconductor chip on a wiring board using g).

【0002】[0002]

【従来の技術】従来より、ICやLSI等の半導体チッ
プの高性能化にともない、著しく高密度の実装技術が要
求されるようになって来た。そこで近年、ICチップ等
の高密度多端子を有する半導体チップ等の電子部品を高
い信頼性で配線基板上に接続する技術として、フィルム
キャリヤ(TAB)を利用して電子部品を印刷配線基板
上に高密度表面実装する実装技術が開発され実用される
ようになってきている。
2. Description of the Related Art Conventionally, as the performance of semiconductor chips such as ICs and LSIs has been improved, remarkably high-density mounting technology has been required. Therefore, in recent years, as a technique for connecting electronic components such as semiconductor chips having high-density multi-terminals such as IC chips onto a wiring board with high reliability, a film carrier (TAB) is used to mount electronic components on a printed wiring board. Mounting technology for high-density surface mounting has been developed and put into practical use.

【0003】[0003]

【考案が解決しようとする課題】しかしながら、上述し
た従来の実装技術において、半導体チップを搭載しフィ
ルムキャリヤにより形成されたTABパッケージを、基
板に実装させた際には、当然ながら半導体チップと基板
とは接続されているものの、この基板と他の基板との接
続には、別個に接続用コネクタや接続用ワイヤ等が必要
となり、実装の高密度化に対応できないという問題があ
った。
However, in the above-mentioned conventional mounting technique, when a TAB package formed by a film carrier on which a semiconductor chip is mounted is mounted on a substrate, the semiconductor chip and the substrate are naturally attached to each other. However, there is a problem that a connection connector, a connection wire, and the like are separately required to connect this board to another board, and it is not possible to cope with high packaging density.

【0004】従って、本考案は上記した事情を考慮して
なされたもので、半導体チップを搭載しフィルムキャリ
ヤにより形成されたTABパッケージにおいて、半導体
チップの接続と基板同士との接続とが可能となり、実装
の高密度化に対応できる半導体の実装構造を提供するこ
とを目的とするものである。
Therefore, the present invention has been made in consideration of the above circumstances, and in a TAB package formed by a film carrier on which a semiconductor chip is mounted, it becomes possible to connect the semiconductor chips and the substrates to each other. It is an object of the present invention to provide a semiconductor mounting structure that can cope with higher packaging density.

【0005】[0005]

【課題を解決するための手段】本考案は上記した目的を
達成するために、半導体チップを搭載しフィルムキャリ
ヤにより形成されるTABパッケージにバイパス用の配
線パターンを形成したことを特徴とするものである。
In order to achieve the above-mentioned object, the present invention is characterized in that a bypass wiring pattern is formed in a TAB package formed by a film carrier on which a semiconductor chip is mounted. is there.

【0006】[0006]

【実施例】以下、本考案に係る半導体の実装構造の好適
一実施例を図面に基づいて説明する。図1は本実施例に
おける半導体の実装構造を示す全体斜視図、図2はフィ
ルムキャリヤ(TAB)型半導体の構造を示す平面図で
ある。また、図3の(a)乃至(b)は実装構造の側面
図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of a semiconductor mounting structure according to the present invention will be described below with reference to the drawings. FIG. 1 is an overall perspective view showing a semiconductor mounting structure in this embodiment, and FIG. 2 is a plan view showing the structure of a film carrier (TAB) type semiconductor. 3A and 3B are side views of the mounting structure.

【0007】まず、フィルムキャリヤ(TAB)型半導
体の構造は図2に示す如く、搬送及び位置決め用スプロ
ケットホール(11)と、半導体チップ(1)が入る開
孔部であるデバイスホール(19)及びOLB用ホール
(20)を有するポリイミド等の絶縁フィルム上に、銅
等の金属箔を接着し、金属箔をエッチング等により所望
の形状のリード(インナーリード(15),アウターリ
ード(16))と電気選別のためのパッド(14)とを
形成してフィルムキャリヤテープ(10)を製造する。
また、半導体チップ(1)の電極端子上に金属突起物で
あるバンプを形成する。
First, as shown in FIG. 2, the structure of a film carrier (TAB) type semiconductor has a sprocket hole (11) for transportation and positioning, a device hole (19) which is an opening portion into which a semiconductor chip (1) is inserted, and A metal foil such as copper is adhered onto an insulating film such as a polyimide having an OLB hole (20), and the metal foil is etched to form leads (inner leads (15) and outer leads (16)) having a desired shape. A film carrier tape (10) is manufactured by forming a pad (14) for electrical screening.
Further, bumps which are metal protrusions are formed on the electrode terminals of the semiconductor chip (1).

【0008】次に、フィルムキャリヤテープ(10)の
インナーリード(15)と半導体チップ(1)のバンプ
とを熱圧着法又は共晶法等によりインナーリードボンデ
ィング(ILB)し、フィルムキャリヤテープに装着さ
れた状態で電気選別用パッド(14)上に接触子を接触
させて半導体チップ(1)の電気選別及びバイアス試験
を実施する。これにより、フィルムキャリヤ型半導体装
置が完成する。なお、信頼性向上及び機械的保護のた
め、樹脂をポッテングして樹脂封止を行っても良い。
Next, the inner leads (15) of the film carrier tape (10) and the bumps of the semiconductor chip (1) are inner lead bonded (ILB) by a thermocompression bonding method or a eutectic method, and attached to the film carrier tape. In this state, a contactor is brought into contact with the electric selection pad (14) to perform electric selection and bias test of the semiconductor chip (1). As a result, the film carrier type semiconductor device is completed. In addition, in order to improve reliability and mechanical protection, the resin may be potted for resin sealing.

【0009】そして、上記したフィルムキャリヤ型半導
体装置を配線基板(2)に実装するために、所定の長さ
(所定形状)に切断し、TABパッケージ(5)を形成
する。
Then, in order to mount the above film carrier type semiconductor device on the wiring board (2), it is cut into a predetermined length (predetermined shape) to form a TAB package (5).

【0010】なお、本実施例では、上記TABパッケー
ジ(5)に配線基板(2)との接続部(4)(4)が設
けられている。更に、上記TABパッケージ(5)には
バイパス用の配線パターン(6)が複数設けられてお
り、両端の接続部(7)と(7)とが半導体チップ
(1)を介さずに電気的に接続された構成をなすよう
に、導電性金属材料によって形成されている。
In this embodiment, the TAB package (5) is provided with the connecting portions (4) and (4) for connecting to the wiring board (2). Further, the TAB package (5) is provided with a plurality of bypass wiring patterns (6), and the connecting portions (7) and (7) at both ends are electrically connected without passing through the semiconductor chip (1). It is formed of a conductive metal material so as to form a connected configuration.

【0011】そして、本実施例では図1に示すように、
上記の如く形成されたTABパッケージ(5)を基板
(2)に実装させた際には、半導体チップ(1)と基板
(2)とはリード(16)により接続され、なお且つこ
の基板(2)と他の基板(2a)とはバイパス用の配線
パターン(6)により相互に接続されることになる。こ
のようなTABパッケージ(5)の場合、100μmピ
ッチ程度の配線パターンは可能である為、例えば配線パ
ターン(6)部の許容幅(A)を略3mmとすると30
本、両側で60本は可能となり、多数本の接続が一度に
できる利点がある。
In this embodiment, as shown in FIG.
When the TAB package (5) formed as described above is mounted on the substrate (2), the semiconductor chip (1) and the substrate (2) are connected by the leads (16), and the substrate (2) ) And the other substrate (2a) are connected to each other by a wiring pattern (6) for bypass. In the case of such a TAB package (5), a wiring pattern having a pitch of about 100 μm is possible, and for example, if the allowable width (A) of the wiring pattern (6) portion is about 3 mm, 30
The number of books, 60 on both sides, is possible, which is an advantage that many can be connected at one time.

【0012】なお、アウターリード(16)及び配線パ
ターン(6)を配線基板(2)及び(2a)の導電パタ
ーンにアウターリードボンディング(OLB)する工程
はILB工程と同様に加圧ツールにより、リードを加圧
加熱して実施するもので、接合は熱圧着法又は共晶法又
は半田を使用したろう付け等により実施される。また、
配線パターン(6)はファインピッチ0.2mm程度で
あれば、上記の半田付け等に限定せず、異方性導電膜で
接続を行っても良い。
The step of outer lead bonding (OLB) the outer leads (16) and the wiring pattern (6) to the conductive patterns of the wiring boards (2) and (2a) is performed by a pressure tool as in the ILB step. Is performed by heating under pressure, and the joining is performed by a thermocompression bonding method, a eutectic method, brazing using solder, or the like. Also,
The wiring pattern (6) is not limited to the above-mentioned soldering and the like as long as the fine pitch is about 0.2 mm, and the connection may be made with an anisotropic conductive film.

【0013】ところで、本実施例のTABパッケージ
(5)には、該TABパッケージ(5)を折り曲げ可能
とするための屈曲部(例えばスリット)(3)が複数形
成されている。従って、図3の(a)乃至(b)に示す
如く、実装した基板(2)と他の基板(2a)とを例え
ば略180°や略90°など、基板の配置状態に応じて
任意な角度に設定できる利点がある。
By the way, the TAB package (5) of this embodiment is provided with a plurality of bent portions (for example, slits) (3) for allowing the TAB package (5) to be bent. Therefore, as shown in (a) and (b) of FIG. 3, the mounted substrate (2) and the other substrate (2a) are arbitrary, such as approximately 180 ° or approximately 90 °, depending on the arrangement state of the substrates. There is an advantage that it can be set to an angle.

【0014】なお、上記TABパッケージ(5)におい
て、バイパス用の配線パターン(6)が不用の場合に
は、IC部のみ打ち抜いて従来通りのTAB形状として
の使用も可能となるよう構成されている。
In the TAB package (5), when the wiring pattern (6) for bypass is unnecessary, only the IC portion is punched out so that it can be used as a conventional TAB shape. .

【0015】以上、本考案の好適一実施例について詳細
に説明したが、本考案はこれに限定されるものではな
く、本考案の範囲を逸脱することなく種々の修正が可能
であることは明白である。
The preferred embodiment of the present invention has been described above in detail, but the present invention is not limited to this, and it is apparent that various modifications can be made without departing from the scope of the present invention. Is.

【0016】例えば、上述した実施例では、TABパッ
ケージ(5)の両側にバイパス用の配線パターン(6)
を設けたが、片側にだけ設ける構成としても良い。ま
た、上述した実施例では、TABパッケージ(5)に半
導体チップ(1)を1個搭載した例で説明したが、これ
に限らず、2個以上(複数)搭載できることは勿論であ
る。また、屈曲部(3)は本実施例のようなスリット形
状に限らず、凹み,ミシン目,薄み等、TABパッケー
ジ(5)の屈曲を可能にする種々の構造に置き換えるこ
とができる。また、上述した実施例では、TABパッケ
ージ(5)を接続する基板として印刷配線基板(PC
B)を例に挙げたが、これに限定されず、フレキシブル
印刷配線基板(FPC)等にも適用できることは勿論で
ある。
For example, in the above-described embodiment, bypass wiring patterns (6) are provided on both sides of the TAB package (5).
Although it is provided, it may be provided only on one side. Further, in the above-described embodiments, the example in which one semiconductor chip (1) is mounted on the TAB package (5) has been described, but the present invention is not limited to this, and it is needless to say that two or more (plural) semiconductor chips can be mounted. Further, the bent portion (3) is not limited to the slit shape as in the present embodiment, and can be replaced with various structures such as dents, perforations and thinness, which enable the TAB package (5) to be bent. Further, in the above-described embodiment, a printed wiring board (PC) is used as a board for connecting the TAB package (5).
Although B) is taken as an example, the present invention is not limited to this, and it is needless to say that it can be applied to a flexible printed wiring board (FPC) or the like.

【0017】以上の如く本実施例によれば、半導体チッ
プ(1)を搭載しフィルムキャリヤにより形成されるT
ABパッケージ(5)にバイパス用の配線パターン
(6)を形成したことにより、半導体チップ(1)の接
続と基板(2)(2a)同士との接続とが可能となり、
実装の高密度化に対応できる利点がある。また、上記T
ABパッケージ(5)に屈曲部(3)を設け屈曲可能に
構成したことにより、実装した基板(2)(2a)の配
置状態に応じて任意な角度に設定できる利点がある。
As described above, according to this embodiment, the T formed by the film carrier on which the semiconductor chip (1) is mounted.
By forming the bypass wiring pattern (6) on the AB package (5), the semiconductor chip (1) and the substrates (2) and (2a) can be connected to each other.
It has the advantage of being able to handle high-density mounting. Also, the above T
Since the AB package (5) is provided with the bending portion (3) and can be bent, there is an advantage that it can be set to an arbitrary angle according to the arrangement state of the mounted boards (2) and (2a).

【0018】[0018]

【考案の効果】以上詳細に説明したように本考案によれ
ば、半導体チップを搭載しフィルムキャリヤにより形成
されるTABパッケージにバイパス用の配線パターンを
形成したことにより、半導体チップの接続と基板同士と
の接続とが可能となり、実装の高密度化に対応できると
いう効果を奏し得るものである。
As described above in detail, according to the present invention, a semiconductor chip is mounted and a wiring pattern for bypass is formed on a TAB package formed by a film carrier. It is possible to connect with, and it is possible to achieve the effect of being able to cope with higher packaging density.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本考案に係る半導体の実装構造の一実施例を
示す斜視図。
FIG. 1 is a perspective view showing an embodiment of a semiconductor mounting structure according to the present invention.

【図2】 半導体チップを搭載したフィルムキャリヤ
(TAB)型半導体の構造を示す平面図。
FIG. 2 is a plan view showing the structure of a film carrier (TAB) type semiconductor on which a semiconductor chip is mounted.

【図3】 本考案に係る半導体の実装構造の他の一例を
示す側面図。
FIG. 3 is a side view showing another example of a semiconductor mounting structure according to the present invention.

【符号の説明】[Explanation of symbols]

(1) 半導体チップ (2)(2a) 配線基板 (3) 屈曲部 (4)(7) 接続部 (5) TABパッケージ (6) 配線パターン (1) Semiconductor chip (2) (2a) Wiring board (3) Bent portion (4) (7) Connection portion (5) TAB package (6) Wiring pattern

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 半導体チップを搭載しフィルムキャリヤ
により形成されるTABパッケージにバイパス用の配線
パターンを形成したことを特徴とする半導体の実装構
造。
1. A semiconductor mounting structure in which a bypass wiring pattern is formed on a TAB package formed by a film carrier on which a semiconductor chip is mounted.
JP1991094453U 1991-11-19 1991-11-19 Semiconductor mounting structure Expired - Lifetime JPH0751794Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1991094453U JPH0751794Y2 (en) 1991-11-19 1991-11-19 Semiconductor mounting structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1991094453U JPH0751794Y2 (en) 1991-11-19 1991-11-19 Semiconductor mounting structure

Publications (2)

Publication Number Publication Date
JPH0546033U JPH0546033U (en) 1993-06-18
JPH0751794Y2 true JPH0751794Y2 (en) 1995-11-22

Family

ID=14110687

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1991094453U Expired - Lifetime JPH0751794Y2 (en) 1991-11-19 1991-11-19 Semiconductor mounting structure

Country Status (1)

Country Link
JP (1) JPH0751794Y2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2650949B2 (en) * 1988-03-14 1997-09-10 株式会社日立製作所 Liquid crystal display
JPH01237523A (en) * 1988-03-18 1989-09-22 Hitachi Ltd liquid crystal display device

Also Published As

Publication number Publication date
JPH0546033U (en) 1993-06-18

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