JPH0736796A - I / O device system test method - Google Patents

Abstract

(57) [Summary] [Object] The present invention relates to a system testing method for an input / output device, and tests each input / output device as a member of a machine number group under the control of each input / output device. [Structure] Acquire the unique ID of the input / output control device to which the input / output device has the device number (device number, input / output control device number, channel number), and group the device numbers with the same unique ID. And activate the program task (TC) that controls the test program task (TM) corresponding to each machine number in the group, then activates each TM described above and executes the test while communicating between each TM. The statistical information of the test result for each input / output device is collectively output corresponding to the input / output control device. In particular, in a system having a large number of machine numbers for each of the input / output control devices, the TMs are activated in the functional units of the input / output control devices, and the TMs of the functional units are grouped into the groups. Use number to test.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a system test method for an input / output device. With the recent diversification of data processing, the system configuration of the data processing system has become large in scale, and the types and number of channel devices, input / output control devices, and input / output devices have increased.

Therefore, conventionally, the test program task (TM) is configured corresponding to the machine number (consisting of the device number, the input / output control device number, and the channel number) provided in each input / output device. In this case, the number of test program tasks (TM) increases, and the memory capacity of the data processing system cannot support.

Further, an input / output control device such as a disk control device has a multi-sense function, a dynamic cross call path function, and an NVS write back mode function.

To explain the above-mentioned multi-sense function, normally, the sense byte of the drive is set in a predetermined area of the input / output control device every time the drive is accessed, and unless the operating system (OS) cuts it off, the control unit is controlled. (CU) It becomes busy and the next I / O device cannot be accessed. However, with this multi-sense function,
For example, since a sense byte for each drive under the disk control device can be accumulated for, for example, a maximum of 8 drives, it is a function that enables access to the next input / output device without cutting off the sense band. The multi-sense function is a machine number under the control of one input / output control device, and requires a plurality of input / output devices to work together.

Further, the dynamic cross call path function dynamically reserves a drive that can be used from each channel device, so that important information in the disk device, for example, a known VTOC (volume list), can be transferred to another device. This is a function to prevent destruction by access from the channel device, and this also requires coordinated operation with machine numbers under the same input / output control device.

The NVS write-back mode function is a function for enabling the NVS memory in the input / output control device. With this function, when the channel device sends a write command to the input / output control device, the command is issued. Is stored in the NVS memory in the input / output control device, and at the same time, the channel end and the device end are immediately obtained, and the next operation can be performed. If the device number is 0, the channel device
When (CH0) is operating in the NVS write-back mode and the channel device (CH1) whose device number is 1 that does not know that it is in this mode accesses the I / O controller, a response is returned. It will be different and normal operation will not be possible.

Such a function test has a problem in that it cannot be tested by the conventional test method in which communication between test program tasks (TM) generated corresponding to the machine number provided in the input / output device is not performed. , Effective testing methods are needed.

[0008]

2. Description of the Related Art FIGS. 7 and 8 are diagrams for explaining a conventional system test method for an input / output device. FIG. 7 is a flow chart showing the conventional system test method, and FIG. The relationship between the conversion table and the TM is schematically shown.

First, in FIG. 7, using the machine number of one input / output device, the sense input / output device type (SENSE IO TYPE)
A command is issued to obtain the device type name of the input / output control device, the obtained device type names are grouped, and the input / output device device numbers are displayed in the form of a grouping table shown in FIG. , Is stored in the main memory for the machine numbers of all input / output devices. {Refer to processing steps 100 and 101 in FIG. 7} Next, as shown in FIG. 8, a test program task (TM) corresponding to each device type name is generated for each input / output device unit number. Specifically, a test program task (TM) that is manually created in advance.
Then, the control information (for example, machine number information) is linked so that the input / output device of the machine number can be tested.
{Refer to processing step 102 of FIG. 7} Device-specific information generated when each test program task (TM) tests each function of the device,
That is, the statistical information for each machine number, for example, the value of the error counter, the number of times of writing, reading, the number of times of automatic correction, etc. are stored in the unique area in each test program task (TM), and the test is completed. At this point, each test program task (TM)
The stored device-specific information is output. {Fig. 7
FIG. 8 shows the relationship among the same device type name / machine number grouping table, the test program task (TM), and the unique information list in the above-mentioned conventional system test method for input / output devices. Shows. That is, in the conventional system test method, each test program task (TM) is generated in unit of machine number for each device model name of the input / output control device, and the execution result of each test program task (TM) is It is output for each test program task (TM).

As described above, the system test program of the conventional input / output device generates one test program task (TM) for each of the input / output device numbers existing in one host system, that is, Test program tasks (TM) for all existing I / O devices
, And each test program task (TM) independently performs the test (without communicating with each other). In other words, the test was performed without being aware of which input / output control device the device number belongs to which device number group belongs to.

[0011]

Therefore, the conventional system testing method for the input / output device has the following problems.

(1) A test that cannot be tested unless the device numbers subordinate to the same I / O device control device work together. (A) For example, the above-mentioned multi-sense function and dynamic cross call path function of the disk control device. In the NVS write-back mode, a test that can only be performed by operating in cooperation with the device number under the I / O control device, or (b) For example, in the library device, the link test between the accessor device and the drive device cannot be executed. There was a problem.

(2) When a plurality of input / output control devices of the same type (that is, having the same device type name) are connected to one host, the unique information of each input / output device (for example, the above-mentioned statistical information) However, since it is only output in each test end order, the unique information of each input / output device cannot be output in the form of being combined into an input / output device group under the control of one input / output device.
There is a problem that the tester needs to visually check the unique information of the input / output device belonging to the input / output control device on the list of the test results, resulting in extremely poor work efficiency.

(3) In a large-scale system, for example, when the number of input / output devices is very large, such as a DASD device, it is attempted to generate the test program tasks (TM) for the number of device numbers. , When the memory capacity of the data processing system is not enough, it is not possible to generate the test program tasks (TM) for the number of all DASD devices, which makes it impossible to test all DASD devices. There was a problem.

In view of the above-mentioned conventional drawbacks, the present invention provides a system test method for an input / output device in which each input / output device can be tested in cooperation as a member of a machine number group under each input / output control device. Its purpose is to provide a test method.

[0016]

1 and 2 are explanatory views of the principle of the present invention. The above problems can be solved by the system test method of the input / output device configured as follows.

(1) By acquiring the unique ID of the input / output control device 2 to which the machine number of each input / output device 3 belongs,
Group machine numbers with the same unique ID,
After activating the program task that controls the test program task corresponding to each machine number in the group, activate each test program task above, execute the test while communicating between each test program task, and execute each input / output. The statistical information of the test results for each device 3 is configured to be output collectively for the input / output control device 2.

(2) By obtaining the unique ID of the input / output control device 2 to which the machine number of each input / output device 3 belongs,
Group machine numbers with the same unique ID,
After activating the program task that controls the test program task corresponding to each machine number in the group, activate the test program task a corresponding to the plurality of functions of the input / output control device 2 to activate each function. For the unit test program task a, the test numbers are grouped as described above, and the test is executed while communicating between the test program tasks a, and the statistical information of the test results for each input / output device 3 is displayed. The input / output control device 2 is configured to output collectively.

[0019]

That is, in the present invention, the input / output device machine number (device number, input / output control device number, channel device number) of each input / output device is recognized to identify which input / output device is connected, and the same. 1 under the I / O control device
After creating one group and generating a program task (hereinafter, TC) that controls the test program task (hereinafter, TM) of the machine number in the group,
The TC generates a TM corresponding to each machine number, specifically, as described above, for linking with control information for operating the TM, for example, machine number information, and for switching a plurality of tasks. The timer interrupt mechanism is activated, each TM is activated by the timer interrupt, and the corresponding input / output device is tested.

As a method of grouping the machine numbers under the same I / O controller, the unique ID of the I / O controller to which each machine number belongs (in the case of a DASD device, a subsystem in the sense byte) In the case of ID and library device, a sense command or the like is used to acquire the library ID in the library information, and a machine number having a unique ID of the same input / output control device is configured as one group (that is, grouping). It is realized by configuring the table).

The above-mentioned TC is between TC-TM or TM
-After securing a memory area that can be commonly accessed between TMs, generate each TM and notify each TM of the address of the common access area.

In order to link each TM, each TM
However, it is realized by setting and referring to the above-mentioned common access memory area, the control information (for example, the information for recognizing the above-mentioned multi-sense function, the test conditions, etc.) necessary for each TM to execute the test. To do.

In order to output the above-mentioned device-specific information (statistical information) acquired by each TM in a form of being collected by a machine number group under one input / output control device, the common access memory area between the above-mentioned TC-TMs is used. In addition, each TM writes the device-specific information (statistical information), and the TC reads and edits / outputs it.

By thus executing the test linked with the machine number under the control of the input / output control device, it is possible to test the linked test such as the multi-sense function which cannot be realized by the conventional test method. Like

Further, for example, in a system having a large number of DASD machine numbers, in order to test all DASD devices, the above TMa is generated for each functional unit of the disk controller, and the TMa generated for each functional unit is generated. Refers to the grouping table generated by grouping the machine numbers under the disk control device, recognizes all the machine numbers under the disk control device, and randomly selects the machine numbers, and Run the test. By this method, TM
It is only necessary to generate the number of disk control devices existing in the system x the number of functions, and it is possible to significantly reduce the number of TMs as compared with the conventional number of disk control devices x number of machine numbers. , With limited memory capacity, all DAS
The D device can be tested.

[0026]

Embodiments of the present invention will be described in detail below with reference to the drawings. 1 and 2 described above are explanatory views of the principle of the present invention.
FIG. 3 is a diagram showing a configuration example of the data processing system, and FIGS. 4 to 6 are diagrams showing a flow chart of an embodiment of the present invention.

In the present invention, the unique ID of the input / output control device (IOC: abbreviated below) 2 to which the machine number of each input / output device (device: abbreviated below) 3 belongs
, The machine numbers having the same unique ID are grouped, and the program task (TC) that controls the test program task (TM) corresponding to each machine number in the group is activated, and then the above test programs A test program task (TM) that activates a task (TM) and executes a test while communicating between the test program tasks (TM), or supports a plurality of functions of the input / output control device 2 a is activated, and for the test program task a of each functional unit, the test is executed while communicating between the test program tasks using the grouped machine numbers, and Means for collectively outputting the statistical information of the test results corresponding to the input / output control device 2 is a means necessary for carrying out the present invention. The same reference numerals indicate the same objects throughout the drawings.

Hereinafter, referring to FIGS. 1 and 2, FIGS.
The system test method of the input / output device of the present invention will be described with reference to FIG. FIG. 3 (a) shows an example of the hardware configuration of the data processing system, and FIG. 3 (b) shows an example of the configuration of the model number of the input / output device.

First, a central processing unit (CP
U) executes the I / O instruction, the channel device (CH0-) 1
However, the input / output device (device) 3 is accessed by reading and executing a command from a predetermined area of the main memory (not shown).

At this time, considering an access path to the input / output device (device) 3, each channel device (CH0-)
It can be seen that it depends on the combination of 1, I / O controller (IOC) 2, and I / O device (device) 3.

FIG. 3B shows the device number (DV) of the input / output device (device) 3 that determines the access path, the device number (IOC) of the input / output control device 2, and the channel device number (CH). )
It shows a machine number composed of and, and the machine number is
It indicates the access path from each channel device (CH0-) 1 to the I / O device (device) 3 to be accessed.

In the present invention, the device number of each input / output device, that is, the above-mentioned access path indicates which input / output control device 2
The same I / O controller (I
OC) A program task (T that configures one group with the machine numbers under its control (specifically, a grouping table) and controls the TM of the machine numbers in the group (T
C) is generated (the program can be operated)
After that, the TC dispatches the TM of each machine number, for example, dispatches by a timer interrupt and starts up, and executes the test.

A large number of the machine numbers are usually assigned to DASD devices and the like, and it is usual for the library devices and the like to be several at most in the data processing system. .

Therefore, in the present invention, as described above, for the library device having a small number of machine numbers, the grouping table is generated, and the TM is generated corresponding to the machine number in the group. Start each TM by TC that controls each TM corresponding to the machine number in the group,
When a test is executed and a TM is created corresponding to the machine number in the data processing system including the input / output device 3 having a large number of machine numbers like the DASD device, if the number of TMs increases, Is a unit of the function of the disk controller 2
Ma is generated, and each generated TMa is configured to test the corresponding function while randomly selecting a device number under the control of the disk control device 2 by referring to the above-mentioned grouping table. Then, the number of TMa is
Number of disk control units x function.

FIG. 1 shows the relationship between the grouping table, TC, and TM when testing an input / output device 3 having a small number of machine numbers, such as a library device, and FIG. 2 shows the relationship. The relationship between the grouping table, TC, and TM when testing an input / output device 3 having a large number of machine numbers, such as a DASD device, is shown.

That is, in the example of FIG. 1, the grouping table is generated corresponding to the accessor device and the drive device constituting the library device, and TM corresponds to each machine number in each grouping table. Since it is generated, it is sufficient to actually test the input / output device by dispatching each TM under the control of TC and executing the test.

However, as shown in FIG. 2, DASD having a large number of machine numbers (that is, access paths from the above-mentioned channel device) is large.
For the device, TMa is generated corresponding to a plurality of functions of the disk controller 2.

Each TMa is the above DASD device.
By referring to the grouping table of the machine numbers of 3 and testing the function while randomly selecting the machine numbers, the disk controller 2 is equipped with all of the large machine numbers with less TMa. You can test it for the features you have.

4 to 6 are flow charts showing one embodiment of the present invention. The above test method will be described in more detail based on the flow chart. First, issue a sense I / O device model name command (SENSE IO TYPE command) to the I / O controller (IOC) 2 from the specified channel device (CH0-) 1 using the device number of one I / O device. Then, the device type name of the input / output control device (IOC) 2 is acquired for all the input / output device numbers. {Processing step 2 in FIG. 4
If the acquired device type name is a DASD device, jump to processing step 300 in FIG. 5, and if the acquired device type name is a library device, jump to processing step 400 in FIG.
{Refer to processing steps 201 and 202 in FIG. 4} Next, when the acquired device type name is a DASD device, a sense command (SENSE command) is issued from the channel device (CH0 to) 1 at that device number, and a sub command is issued. The system ID is acquired, and the machine numbers that have acquired the same subsystem ID are grouped and stored as a DASD device machine number grouping table in the main storage area corresponding to the subsystem ID. {Refer to processing steps 300 and 301 in FIG. 5} If the acquired device type name is the accessor device of the library device, the read library status command (READ LIBRARY ST
(ATUS command) to acquire the library ID, group the accessor machine numbers that have acquired the same library ID, and store the accessor machine machine number grouping table in the main storage area corresponding to the library ID. . {Refer to processing steps 400, 401, 402 in Fig. 6} If the acquired device type name is the drive device of the library device, a sense cell address command (SENSE CELL ADDRESS command) is issued from the channel device (CH0 to) 1 at that device number. Then, the library ID is acquired, the drive machine numbers having the same library ID are grouped, and stored in the main storage area corresponding to the library ID as a drive device machine number grouping table.
{Refer to processing steps 400, 403, 404 in FIG. 6} One input / output control device, in the above example, the above-mentioned TC is generated for each of the above-mentioned machine number groups under the control of the disk control device and the library control device 2. Specifically, the control information for activating each TM is set in a predetermined main storage area, and the interrupt timer for dispatching each TM is activated to activate the TC. {Refer to processing step 204 in FIG. 4} The activated TC secures a memory area commonly accessible between TC-TM and TM-TM, and then generates a TM for the input / output device, The TM is notified of the address of the common access memory area. The TM
Specifically, the input / output device (DASD device,
T prepared for testing library device 3
It is realized by giving predetermined control information (for example, machine number, test condition, etc.) to M and activating it. At this time, when the input / output device 3 is a DASD device, the TM is generated corresponding to the function of the disk control device 2, but when the input / output device 3 is a library device, The T
M is generated corresponding to the machine number. {Processing step 2 in FIG. 4
See 05} The activated TM is stored in the common access memory area.
Required control information (test content, for example, information corresponding to the above-described multi-sense function test) between TM-TM and TC-TM is set and referred to, and the above-mentioned device-specific information (statistical information: While setting the contents of the error counter, the number of bytes read and written, the number of automatic corrections, etc.,
The test is repeated until the test end instruction can be recognized.
{Refer to processing steps 205, 206, 207 in FIG. 4} When the TC recognizes that a series of tests has been completed,
The TC reads, edits and outputs the device-specific information (statistical information) for each TM set in the common access memory area between the TC and TM. {Refer to processing step 208 in FIG. 5} As described above, in the system test method of the input / output device according to the present invention, the machine number (device number, input / output control device number, channel number) possessed by each input / output device belongs. Acquire the unique ID of the input / output control device, group the machine numbers with the same unique ID, and activate the program task (TC) that controls the test program task (TM) corresponding to each machine number in the group. After doing
The TMs are activated, a test is executed while communication is performed between the TMs, and statistical information of test results for each input / output device is collectively output corresponding to the input / output control device.
Particularly, in a system having a large number of machine numbers for each of the input / output control devices, the functional units included in the input / output control devices are:
The TMa is activated, the TMa of each functional unit is tested by using the grouped machine numbers, and the statistical information of the test result for each input / output device is
The feature is that the above-mentioned input / output control devices are collectively output.

[0040]

As described above in detail, according to the system test method for an input / output device of the present invention, 1) it is necessary to operate in cooperation with machine numbers under the same input / output control device, for example, The above-mentioned multi-sense function, dynamic cross-call path function, NVS write-back mode test, and link test between the accessor device and the drive device in the library device can be realized. 2) When multiple I / O controllers of the same type are connected to one host, unique information for each I / O device (statistical information described above)
Can be output in the form of being collected by the input / output device groups under the control of each input / output control device, so that the tester improves the work efficiency when visually confirming the test results on the list.
3) Even in systems with many machine numbers such as DASD devices, all D
The ASD device is tested by a relatively small number of T, which is the unit of function TMa provided in the DASD controller.
M allows testing of all DASD devices.

[Brief description of drawings]

FIG. 1 is an explanatory diagram (1) of the principle of the present invention.

FIG. 2 is an explanatory diagram of the principle of the present invention (No. 2)

FIG. 3 is a diagram showing a configuration example of a data processing system.

FIG. 4 is a flowchart showing an embodiment of the present invention (No. 1).

FIG. 5 is a flowchart showing an embodiment of the present invention (part 2).

FIG. 6 is a flowchart showing an embodiment of the present invention (part 3).

FIG. 7 is a diagram (part 1) illustrating a conventional system test method for an input / output device.

FIG. 8 is a diagram (part 2) illustrating a conventional system test method for an input / output device.

[Explanation of symbols]

1 channel device (CH0-) 2 I / O controller (IOC), disk controller, library controller 3 I / O device 100-105,200-208,300-301,400-404 Processing step Machine ID Library ID, unique ID I / O device machine number Grouping table, grouping program task (TC) test program task (TM) device specific information (statistical information), specific information list function

Claims (2)

[Claims] 1. A machine number () possessed by each input / output device (3)
Acquire the unique ID () of the I / O controller (2) to which the belongs, and group () the machine numbers () with the same unique ID (), and perform a test corresponding to each machine number () in the group. After activating the program task () that controls the program task (), activate each test program task () above, execute the test while communicating between each test program task (), and execute each test 3) A system test method for an input / output device, wherein statistical information () for each test result is collectively output corresponding to the input / output control device (2). 2. A machine number () possessed by each input / output device (3)
Acquire the unique ID () of the I / O controller (2) to which the belongs, and group () the machine numbers () with the same unique ID (), and perform a test corresponding to each machine number () in the group. After activating the program task () that controls the program task (), the test program task () corresponding to the multiple functions () of the I / O controller (2) is provided.
a) is activated, and the test program task (a) of each functional unit is tested while communicating between the test program tasks (a) using the machine numbers () grouped () above. A system test method for an input / output device, which is executed, and statistical information () of a test result for each input / output device (3) is collectively output corresponding to the input / output control device (2).