JPH07152160A - Photoconductor characteristic evaluation device - Google Patents
Photoconductor characteristic evaluation deviceInfo
- Publication number
- JPH07152160A JPH07152160A JP29968793A JP29968793A JPH07152160A JP H07152160 A JPH07152160 A JP H07152160A JP 29968793 A JP29968793 A JP 29968793A JP 29968793 A JP29968793 A JP 29968793A JP H07152160 A JPH07152160 A JP H07152160A
- Authority
- JP
- Japan
- Prior art keywords
- photoconductor
- light
- photosensitive drum
- unit
- surface potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Photoreceptors In Electrophotography (AREA)
Abstract
(57)【要約】
【目的】この発明は、感光体の感光特性を測定する際に
同時に感光体の光反射強度も測定できて取扱いミスによ
る感光体不良の低減と感光体検査時間の短縮を計ること
を目的とする。
【構成】 この発明は、帯電部12、露光部13、除電
部16および表面電位測定用プローブ14を有する感光
体特性評価装置において、感光体11における露光部1
3による露光範囲外の位置に光を照射して感光体11か
らの反射光の強さを感光体11の回転方向について検出
する受発光素子15と、この受発光素子15の出力信号
を演算して表示する演算表示部19,20とを備えたも
のである。
(57) [Abstract] [Purpose] The present invention is capable of simultaneously measuring the light reflection intensity of a photoconductor when measuring the photosensitivity of the photoconductor, thereby reducing the photoconductor defect due to mishandling and shortening the photoconductor inspection time. The purpose is to measure. According to the present invention, in an apparatus for evaluating a characteristic of a photoconductor having a charging unit 12, an exposing unit 13, a discharging unit 16, and a surface potential measuring probe 14, the exposing unit 1 in a photoconductor 11 is
3, a light emitting / receiving element 15 for irradiating the position outside the exposure range by 3 to detect the intensity of the reflected light from the photosensitive element 11 in the rotation direction of the photosensitive element 11, and an output signal of the light receiving / emitting element 15 are calculated. The calculation display units 19 and 20 for displaying the above are provided.
Description
【0001】[0001]
【産業上の利用分野】本発明は電子写真複写機等の画像
形成装置に用いられる感光体の特性を評価する感光体特
性評価装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photoreceptor characteristic evaluation apparatus for evaluating the characteristics of a photoreceptor used in an image forming apparatus such as an electrophotographic copying machine.
【0002】[0002]
【従来の技術】従来、感光体特性評価装置としては、特
開平4ー26852号公報に記載された感光体ドラムの
感光特性測定装置が知られている。この装置は、複写機
等の画像形成装置の感光体ドラムが装着され、感光体ド
ラムを回転させる回転手段を有する。感光体ドラムの周
囲にはその回転方向へ順に帯電装置、露光装置、表面電
位センサおよび除電装置が配置されている。露光装置は
レーザ光源が用いられ、表面電位センサは感光体ドラム
の軸方向に移動可能に設けられる。2. Description of the Related Art Conventionally, as a photoconductor characteristic evaluation device, a photoconductor drum characteristic measurement device described in JP-A-4-26852 is known. This apparatus is equipped with a photosensitive drum of an image forming apparatus such as a copying machine, and has a rotating means for rotating the photosensitive drum. A charging device, an exposure device, a surface potential sensor, and a charge eliminating device are sequentially arranged around the photosensitive drum in the rotation direction. A laser light source is used for the exposure device, and the surface potential sensor is provided so as to be movable in the axial direction of the photosensitive drum.
【0003】この感光体ドラムは回転手段により回転さ
れて帯電装置により一様に帯電され、その1周分の帯電
電位(感光体ドラムの暗電位)が表面電位センサにより
測定される。その後、感光体ドラムは、除電装置で除電
されて露光装置によりレーザ光が露光され、その1周分
の露光部分の電位(感光体ドラムの明電位)が表面電位
センサにより測定される。This photosensitive drum is rotated by a rotating means and uniformly charged by a charging device, and the charging potential for one revolution (dark potential of the photosensitive drum) is measured by a surface potential sensor. After that, the photoconductor drum is destaticized by the destaticizing device and exposed to the laser beam by the exposure device, and the potential of the exposed portion for one revolution (bright potential of the photoconductor drum) is measured by the surface potential sensor.
【0004】また、従来、電子写真複写機等の画像形成
装置においては、感光体ドラムの外周上に転写紙等が巻
き付く事故(ジャム)が生じたことを検知するために、
あるいは、常に一定の画像濃度を得るために、感光体ド
ラムに光を照射してその反射光を受光する検知装置を設
け、感光体ドラムから検知装置に入射する反射光の強度
を基準としてこれと、感光体ドラムの外周上に巻き付い
た転写紙等から検知装置に入射する反射光の強度、ある
いは、感光体ドラム上の現像された基準濃度の原稿によ
る画像から検知装置に入射する反射光の強度とを比較し
て信号を発するようにしている。Further, conventionally, in an image forming apparatus such as an electrophotographic copying machine, in order to detect occurrence of an accident (jam) in which transfer paper or the like is wrapped around the outer periphery of a photosensitive drum,
Alternatively, in order to always obtain a constant image density, a detection device that irradiates the photosensitive drum with light and receives the reflected light is provided, and the intensity of the reflected light that enters the detection device from the photosensitive drum is used as a reference. , Intensity of reflected light that enters the detector from a transfer paper wrapped around the outer periphery of the photosensitive drum, or intensity of reflected light that enters the detector from an image of a developed reference density document on the photosensitive drum The signal is compared by comparing with.
【0005】上記検知装置は一般的に反射型フォトセン
サが用いられ、この反射型フォトセンサにおける発光素
子のピーク発振波長は940nmのレベルである。この
波長は、感光体ドラムの光導電層(セレン層)に吸収さ
れず、大部分が感光体ドラムの基体(一般的にはアルミ
ニウム)に達してその表面で反射される。感光体ドラム
の光導電層表面で反射された光と、感光体ドラムの基体
で反射された光とが反射型フォトセンサの受光素子で検
知される。A reflection type photosensor is generally used as the detection device, and the peak oscillation wavelength of the light emitting element in this reflection type photosensor is at a level of 940 nm. This wavelength is not absorbed by the photoconductive layer (selenium layer) of the photosensitive drum, and most of it reaches the substrate (generally aluminum) of the photosensitive drum and is reflected by the surface thereof. The light reflected by the surface of the photoconductive layer of the photosensitive drum and the light reflected by the base of the photosensitive drum are detected by the light receiving element of the reflective photosensor.
【0006】この場合、感光体ドラムの光導電層表面で
反射された光と、感光体ドラムの基体で反射された光と
を反射型フォトセンサの受光素子で検知し、かつ、感光
体ドラムから反射型フォトセンサに入射する反射光の強
度を基準とするので、感光体ドラムの光反射率を一定に
するために、感光体ドラムの基体表面の凹凸粗さのバラ
ツキや光導電層表面の凹凸粗さのバラツキが一定である
ことが要求される。In this case, the light reflected by the surface of the photoconductive layer of the photoconductor drum and the light reflected by the substrate of the photoconductor drum are detected by the light receiving element of the reflection type photo sensor, and the light is emitted from the photoconductor drum. Since the intensity of the reflected light incident on the reflection type photo sensor is used as a reference, in order to keep the light reflectance of the photoconductor drum constant, the unevenness of the unevenness of the substrate surface of the photoconductor drum and the unevenness of the photoconductive layer surface are uneven. Roughness variation is required to be constant.
【0007】そこで、従来は、感光体ドラムからの反射
光の強さが一定のレベルになっていることを確認するた
めに、感光体ドラムを画像形成装置に実装して感光体ド
ラムからの反射光の強さを測定したり、専用の測定器で
感光体ドラムからの反射光の強さを測定したりしてい
た。Therefore, conventionally, in order to confirm that the intensity of the reflected light from the photosensitive drum is at a constant level, the photosensitive drum is mounted in an image forming apparatus and reflected from the photosensitive drum. The intensity of light was measured, and the intensity of light reflected from the photosensitive drum was measured with a dedicated measuring device.
【0008】[0008]
【発明が解決しようとする課題】上記画像形成装置で
は、感光体ドラムを画像形成装置に実装して感光体ドラ
ムからの反射光の強さを測定したり、専用の測定器で感
光体ドラムからの反射光の強さを測定したりしていたの
で、感光体ドラムを画像形成装置に出し入れする機会が
増えて取扱いミスにより感光体ドラムの不良が増加し、
一度感光体ドラムに光を当てることからその暗順応時間
が必要になって感光体ドラムの検査時間が増大するなど
の不具合があった。In the above image forming apparatus, the photoconductor drum is mounted on the image forming apparatus to measure the intensity of the reflected light from the photoconductor drum, or a dedicated measuring device is used to measure the intensity of the light from the photoconductor drum. Since the intensity of the reflected light was measured, the chances of taking the photosensitive drum in and out of the image forming apparatus increased, and the number of defective photosensitive drums increased due to mishandling.
Since light is applied to the photosensitive drum once, the dark adaptation time is required, and the inspection time of the photosensitive drum is increased.
【0009】本発明は、上記欠点を改善し、感光体の感
光特性を測定する際に同時に感光体の光反射強度も測定
することができて取扱いミスによる感光体不良の低減と
感光体検査時間の短縮を計ることができる感光体特性評
価装置を提供することを目的とする。The present invention solves the above-mentioned drawbacks, and at the same time when measuring the photosensitivity of the photoconductor, it is possible to measure the light reflection intensity of the photoconductor at the same time. It is an object of the present invention to provide a photoconductor characteristic evaluation device capable of shortening the above.
【0010】[0010]
【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の発明は、感光体が着脱される位置の
周辺に配置された、前記感光体を帯電させる帯電部、前
記感光体に露光を行う露光部、前記感光体を除電する除
電部、および前記感光体の表面電位を測定する表面電位
測定用プローブを有し、前記感光体を回転させて前記表
面電位測定用プローブによる測定値により前記感光体の
特性を評価する感光体特性評価装置において、前記感光
体における前記露光部による露光範囲外の位置に光を照
射して前記感光体からの反射光の強さを前記感光体の回
転方向について検出する受発光素子と、この受発光素子
の出力信号を演算して表示する演算表示部とを備えたも
のである。In order to achieve the above object, the invention according to claim 1 is arranged such that a charging portion for charging the photosensitive member is provided around a position where the photosensitive member is attached and detached, and the photosensitive member. Having an exposure unit for performing exposure on the surface, a charge removal unit for removing charge from the photoconductor, and a surface potential measurement probe for measuring the surface potential of the photoconductor, and the measurement by the surface potential measurement probe by rotating the photoconductor. In a photoconductor characteristic evaluation device for evaluating the characteristic of the photoconductor by a value, the intensity of the reflected light from the photoconductor is measured by irradiating light to a position outside the exposure range of the exposure unit of the photoconductor. The light emitting / receiving element for detecting the rotation direction of the light emitting element and the calculation display section for calculating and displaying the output signal of the light receiving / emitting element are provided.
【0011】請求項2記載の発明は、請求項1記載の感
光体特性評価装置において、前記受発光素子を複数個備
えたものである。According to a second aspect of the present invention, the photoreceptor characteristic evaluation apparatus according to the first aspect is provided with a plurality of the light emitting / receiving elements.
【0012】[0012]
【作用】請求項1記載の発明では、感光体は、回転され
て帯電部により帯電され、その帯電電位が表面電位測定
用プローブにより測定される。また、感光体は除電部で
除電された後に帯電部により帯電されて露光部により露
光され、その表面電位が表面電位測定用プローブにより
測定される。さらに、受発光素子が感光体における露光
部による露光範囲外の位置に光を照射して感光体からの
反射光の強さを感光体の回転方向について検出し、演算
表示部が受発光素子の出力信号を演算して表示する。According to the first aspect of the invention, the photosensitive member is rotated and charged by the charging section, and the charging potential is measured by the surface potential measuring probe. Further, the photoconductor is decharged by the charge removing unit, then charged by the charging unit and exposed by the exposing unit, and the surface potential thereof is measured by the surface potential measuring probe. Further, the light emitting / receiving element emits light to a position outside the exposure range of the exposure section of the photoconductor to detect the intensity of the reflected light from the photoconductor in the rotation direction of the photoconductor, and the calculation display section displays Calculate and display the output signal.
【0013】請求項2記載の発明では、請求項1記載の
感光体特性評価装置において、複数個の受発光素子が感
光体における露光部による露光範囲外の位置に光を照射
して感光体からの反射光の強さを感光体の回転方向につ
いて検出し、演算表示部が複数個の受発光素子の出力信
号を演算して表示する。According to a second aspect of the present invention, in the photoconductor characteristic evaluation apparatus according to the first aspect, the plurality of light receiving and emitting elements irradiate light to a position outside the exposure range of the exposure section of the photoconductor to remove the light from the photoconductor. The intensity of the reflected light is detected in the rotation direction of the photoconductor, and the calculation display unit calculates and displays the output signals of the plurality of light emitting / receiving elements.
【0014】[0014]
【実施例】図1及び図2は本発明の一実施例を示す。こ
の実施例は、感光体ドラムの感光特性測定装置に、感光
体ドラムの反射光の強さを感光体ドラムの円周方向につ
いて検知するセンサと、このセンサの出力信号を演算し
て表示する機能を付加したものである。電子写真複写機
等の画像形成装置に用いられる、感光特性及び反射光の
強さを測定すべき感光体ドラム11は、本実施例に着脱
可能に装着される。この感光体ドラム11が着脱される
位置の周辺には、帯電部12、露光部13、表面電位計
の表面電位測定用プローブ14、反射型フォトセンサ1
5、除電部16が感光体ドラム11の回転方向に沿って
順に配置される。帯電部12、除電部16は感光体ドラ
ム11の全長に対応して設けられ、感光体ドラム11の
全面にわたって帯電及び除電をそれぞれ行う。1 and 2 show an embodiment of the present invention. In this embodiment, a sensor for detecting the intensity of reflected light from the photosensitive drum in the circumferential direction of the photosensitive drum and a function for calculating and displaying an output signal of this sensor are provided in a photosensitive characteristic measuring device for the photosensitive drum. Is added. The photoconductor drum 11, which is used in an image forming apparatus such as an electrophotographic copying machine and whose photosensitive property and reflected light intensity are to be measured, is detachably mounted in this embodiment. Around the position where the photosensitive drum 11 is attached and detached, a charging unit 12, an exposure unit 13, a surface potential measuring probe 14 of a surface electrometer, a reflection type photo sensor 1 are provided.
5, the charge removing unit 16 is sequentially arranged along the rotation direction of the photosensitive drum 11. The charging unit 12 and the discharging unit 16 are provided corresponding to the entire length of the photosensitive drum 11, and charge and discharge the entire surface of the photosensitive drum 11, respectively.
【0015】露光部13は感光体ドラム11の軸方向に
配列された3つの露光部13a,13b,13cからな
り、同時に感光体ドラム11の3箇所の感光特性測定を
可能にしている。これらの露光部13a,13b,13
cは、レーザ光源が用いられ、シャフト17a,17b
で感光体ドラム11の軸方向に自在に移動可能に支持さ
れている。表面電位測定用プローブ14は露光部13
a,13b,13cに対応して感光体ドラム11の軸方
向に配列された3つの表面電位測定用プローブ14a,
14b,14cからなり、これらの表面電位測定用プロ
ーブ14a,14b,14cは露光部13a,13b,
13cと一体に設けられている。The exposure unit 13 is composed of three exposure units 13a, 13b, 13c arranged in the axial direction of the photosensitive drum 11, and at the same time, it is possible to measure the photosensitive characteristics of the photosensitive drum 11 at three locations. These exposure parts 13a, 13b, 13
A laser light source is used for c, and shafts 17a and 17b are used.
Is supported so as to be freely movable in the axial direction of the photosensitive drum 11. The surface potential measuring probe 14 is the exposure unit 13.
Three surface potential measuring probes 14a arranged in the axial direction of the photoconductor drum 11 corresponding to a, 13b, 13c,
14b, 14c, and these surface potential measuring probes 14a, 14b, 14c are exposed portions 13a, 13b,
It is provided integrally with 13c.
【0016】反射型フォトセンサ15は、ピーク発光波
長940nmの受発光素子を備えたものであり、感光体
ドラム11の導電層において露光部13a,13b,1
3cから光が照射される位置、露光幅から外れる位置に
対応して設けられて感光体ドラム11における露光部1
3a,13b,13cによる露光範囲外の位置に光を照
射する。これは、フォトセンサ15から感光体ドラム1
1への光照射により感光体ドラム11の特性評価に影響
を与えないためである。感光体ドラム11は感光体ドラ
ム回転駆動用モータ18により回転駆動される。フォト
センサ15は、図3に示すようにピーク発光波長940
nmの発光素子15aと受光素子15bからなり、抵抗
R1、R2及び可変抵抗VRと組み合わされて検出回路を
構成している。The reflection type photo sensor 15 is provided with a light emitting / receiving element having a peak light emission wavelength of 940 nm, and is exposed in the conductive layer of the photoconductor drum 11 by exposing portions 13a, 13b, 1b.
The exposure unit 1 of the photosensitive drum 11 is provided corresponding to a position where light is emitted from 3c and a position outside the exposure width.
Light is irradiated to positions outside the exposure range of 3a, 13b, and 13c. This is from the photo sensor 15 to the photosensitive drum 1.
This is because the irradiation of light on No. 1 does not affect the characteristic evaluation of the photosensitive drum 11. The photosensitive drum 11 is rotationally driven by a photosensitive drum rotation driving motor 18. The photo sensor 15 has a peak emission wavelength 940 as shown in FIG.
The light emitting element 15a and the light receiving element 15b each have a wavelength of 0.1 nm and are combined with the resistors R 1 and R 2 and the variable resistor VR to form a detection circuit.
【0017】感光体ドラム11の感光特性を測定する際
には、制御部19がモータ18、帯電部12及び除電部
16を動作させ、感光体ドラム11がモータ18により
回転駆動されて帯電部12により均一に帯電される。こ
のとき、露光部13a,13b,13cは動作していな
い。感光体ドラム11の帯電電位(暗電位)は中央部及
び両端側の3箇所で表面電位測定用プローブ14a,1
4b,14cを介して表面電位計により測定され、制御
部19がそれらの測定値を感光体ドラム11の1周分
(1回転分)にわたって取り込んでメモリに記憶する。
感光体ドラム11は表面電位測定用プローブ14a,1
4b,14cを通過した後に除電部16で除電される。When measuring the photosensitivity of the photoconductor drum 11, the control unit 19 operates the motor 18, the charging unit 12 and the charge eliminating unit 16, and the photoconductor drum 11 is rotationally driven by the motor 18 to charge the charging unit 12. Are uniformly charged by. At this time, the exposure units 13a, 13b, 13c are not operating. The charging potential (dark potential) of the photoconductor drum 11 is measured at three points, that is, the central portion and both end sides, by the surface potential measuring probes 14a,
Measured by the surface electrometer via 4b and 14c, the control unit 19 fetches the measured values for one rotation (one rotation) of the photosensitive drum 11 and stores them in the memory.
The photoconductor drum 11 includes the surface potential measuring probes 14a, 1
After passing 4b and 14c, the charge is removed by the charge removing unit 16.
【0018】次に、制御回路19がモータ18、帯電部
12、露光部13a,13b,13c及び除電部16を
動作させ、感光体ドラム11はモータ18により回転駆
動されて帯電部12により均一に帯電された後に露光部
13a,13b,13cによりレーザ光が露光されて帯
電電位が低下する。この感光体ドラム11の露光部分の
表面電位(明電位)は中央部及び両端側の3箇所で表面
電位測定用プローブ14a,14b,14cを介して表
面電位計により測定され、制御部19がそれらの測定値
を感光体ドラム11の1周分(1回転分)にわたって取
り込んでメモリに記憶する。感光体ドラム11は表面電
位測定用プローブ14a,14b,14cを通過した後
に除電部16で除電される。Next, the control circuit 19 operates the motor 18, the charging unit 12, the exposure units 13a, 13b, 13c, and the charge eliminating unit 16, and the photosensitive drum 11 is rotationally driven by the motor 18 so that the charging unit 12 can make it uniform. After being charged, the laser light is exposed by the exposure parts 13a, 13b, 13c, and the charging potential is lowered. The surface potential (bright potential) of the exposed portion of the photosensitive drum 11 is measured by the surface potential meter at the central portion and at three locations on both ends via the surface potential measuring probes 14a, 14b, 14c, and the control unit 19 controls them. The measured value of 1 is taken in for one rotation (one rotation) of the photosensitive drum 11 and stored in the memory. The photoconductor drum 11 is neutralized by the neutralization unit 16 after passing through the surface potential measuring probes 14a, 14b, 14c.
【0019】制御部19は上記メモリに記憶した感光体
ドラム11の3箇所の暗電位及び明電位をグラフ化して
表示部20に表示させるとともに、各箇所毎に暗電位と
明電位との差を演算し、これらの差が所定の範囲内に有
るか否かを判断して所定の範囲内に有る場合には感光体
ドラム11の感光特性が適正であることを表示部20に
表示させ、いずれかの箇所で上記差が所定の範囲内に無
い場合には感光体ドラム11の感光特性が適正でないこ
とを表示部20に表示させる。The control unit 19 graphs the dark potential and the bright potential of the three locations of the photosensitive drum 11 stored in the memory and displays them on the display unit 20, and displays the difference between the dark potential and the bright potential at each location. It is calculated, and it is judged whether or not these differences are within a predetermined range. If they are within a predetermined range, the display section 20 displays that the photosensitive characteristics of the photosensitive drum 11 are appropriate, and If the difference is not within the predetermined range at some point, the display section 20 displays that the photosensitive characteristic of the photosensitive drum 11 is not appropriate.
【0020】また、感光体ドラム11の感光特性を測定
する際に、制御部19からの指令LEDによりフォトセ
ンサ15の発光素子15aがレーザ光を感光体ドラム1
1に照射する。感光体ドラム11は支持体上に光導電層
を設けたものであり、その支持体からの反射光と光導電
層からの反射光がフォトセンサ15の受光素子15bで
受光されて受光素子15bに流れる電流の強さがその反
射光の強さにより変わる。When measuring the photosensitivity of the photoconductor drum 11, the light emitting element 15a of the photosensor 15 emits a laser beam to the photoconductor drum 1 by a command LED from the controller 19.
Irradiate 1. The photoconductor drum 11 is provided with a photoconductive layer on a support, and the reflected light from the support and the reflected light from the photoconductive layer are received by the light receiving element 15b of the photosensor 15 and are received by the light receiving element 15b. The intensity of the flowing current changes depending on the intensity of the reflected light.
【0021】この受光素子15bに流れる電流は抵抗R
2により電圧として取り出され、制御部19はその抵抗
R2の電圧を感光体ドラム11の1周分(1回転分)に
わたって取り込んでメモリに記憶するとともに、その1
周分の電圧の平均値を演算して表示部20に表示させ
る。フォトセンサ15の出力電圧(抵抗R2の電圧)は
感光体ドラム11の1周分が図4に示すように変化し、
制御部19は例えばフォトセンサ15の出力電圧を感光
体ドラム11の1周分について30等分して加算した後
にその平均値を求めて表示部20に表示させる。The current flowing through the light receiving element 15b is the resistance R
The voltage of the resistance R 2 is taken out by the control unit 19 for one rotation (one rotation) of the photosensitive drum 11 and stored in the memory.
The average value of the voltage for one cycle is calculated and displayed on the display unit 20. The output voltage of the photosensor 15 (voltage of the resistor R 2 ) changes for one rotation of the photosensitive drum 11 as shown in FIG.
For example, the control unit 19 divides the output voltage of the photo sensor 15 into 30 equal parts for one rotation of the photosensitive drum 11, adds them, and then obtains an average value thereof to display on the display unit 20.
【0022】フォトセンサ15の受発光素子15a,1
5bは複写機のトナー濃度制御又はジャム検知に用いる
素子であれば用いることができ、この実施例では松下製
ON2153GLを用いた。なお、フォトセンサ15と
して感光体ドラム11の軸方向の反射光強さのバラツキ
を測定するために複数個のフォトセンサを感光体ドラム
11の軸方向に配列して感光体ドラム11からの反射光
の強さを感光体ドラム11の軸方向の異なる複数箇所で
測定し、制御部19にてその複数個のフォトセンサの出
力信号を上述と同様に演算して表示部20に表示させる
ようにしてもよい。また、感光体ドラムの感光特性測定
装置で感光体ドラム11の帯電特性、光減衰特性だけで
なく、残留電位特性などを測定するようにしてもよい。Light receiving / emitting elements 15a, 1 of the photo sensor 15
5b can be used as long as it is an element used for toner density control or jam detection of a copying machine. In this embodiment, ON2153GL manufactured by Matsushita was used. As the photosensor 15, a plurality of photosensors are arranged in the axial direction of the photoconductor drum 11 in order to measure variations in the intensity of the reflected light in the photoconductor drum 11 in the axial direction. Is measured at a plurality of different positions in the axial direction of the photoconductor drum 11, and the control unit 19 calculates the output signals of the plurality of photosensors in the same manner as described above and displays them on the display unit 20. Good. Further, not only the charging characteristic and the light attenuation characteristic of the photosensitive drum 11 but also the residual potential characteristic may be measured by the photosensitive characteristic measuring device of the photosensitive drum.
【0023】本実施例では、感光体ドラムの感光特性測
定装置で感光体ドラムの感光特性を測定する際に同時に
感光体ドラムの光反射強度も測定することができて取扱
いミスによる感光体ドラム不良の低減と感光体ドラム検
査時間の短縮を計ることができる。In this embodiment, when measuring the photosensitive characteristic of the photosensitive drum with the photosensitive characteristic measuring device of the photosensitive drum, the light reflection intensity of the photosensitive drum can be measured at the same time. Can be reduced and the inspection time of the photoconductor drum can be shortened.
【0024】[0024]
【発明の効果】以上のように請求項1記載の発明によれ
ば、感光体が着脱される位置の周辺に配置された、前記
感光体を帯電させる帯電部、前記感光体に露光を行う露
光部、前記感光体を除電する除電部、および前記感光体
の表面電位を測定する表面電位測定用プローブを有し、
前記感光体を回転させて前記表面電位測定用プローブに
よる測定値により前記感光体の特性を評価する感光体特
性評価装置において、前記感光体における前記露光部に
よる露光範囲外の位置に光を照射して前記感光体からの
反射光の強さを前記感光体の回転方向について検出する
受発光素子と、この受発光素子の出力信号を演算して表
示する演算表示部とを備えたので、感光体の感光特性を
測定する際に同時に感光体の光反射強度も測定すること
ができて取扱いミスによる感光体不良の低減と感光体検
査時間の短縮を計ることができる。As described above, according to the first aspect of the present invention, the charging section for charging the photosensitive member, which is arranged around the position where the photosensitive member is attached and detached, and the exposure for exposing the photosensitive member Section, a charge removing section for removing charge from the photoconductor, and a surface potential measuring probe for measuring the surface potential of the photoconductor,
In a photoconductor characteristic evaluation device that rotates the photoconductor and evaluates the characteristic of the photoconductor by the measurement value by the surface potential measurement probe, irradiates light to a position outside the exposure range of the exposure unit of the photoconductor. Since a photoreceptive element for detecting the intensity of light reflected from the photoconductor in the rotational direction of the photoconductor and a calculation display section for computing and displaying an output signal of the photoreceptive element are provided, The light reflection intensity of the photoconductor can be measured at the same time when the photosensitivity is measured, and the photoconductor defect due to a handling error can be reduced and the photoconductor inspection time can be shortened.
【0025】請求項2記載の発明によれば、請求項1記
載の感光体特性評価装置において、前記受発光素子を複
数個備えたので、感光体の軸方向の反射光強さのバラツ
キを測定することが可能となる。According to the invention described in claim 2, in the photoconductor characteristic evaluation device according to claim 1, since a plurality of the light emitting and receiving elements are provided, the variation in the reflected light intensity in the axial direction of the photoconductor is measured. It becomes possible to do.
【図1】本発明の一実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.
【図2】同実施例の断面図である。FIG. 2 is a sectional view of the same embodiment.
【図3】同実施例の検出回路を示す回路図である。FIG. 3 is a circuit diagram showing a detection circuit of the same embodiment.
【図4】同実施例におけるフォトセンサの出力波形を示
す波形図である。FIG. 4 is a waveform diagram showing an output waveform of the photo sensor in the example.
11 感光体ドラム 12 帯電部 13,13a,13b,13c 露光部 14 表面電位測定用プローブ 15 フォトセンサ 16 除電部 19 制御部 20 表示部 11 Photoreceptor Drum 12 Charging Section 13, 13a, 13b, 13c Exposure Section 14 Surface Potential Measuring Probe 15 Photosensor 16 Static Elimination Section 19 Control Section 20 Display Section
Claims (2)
た、前記感光体を帯電させる帯電部、前記感光体に露光
を行う露光部、前記感光体を除電する除電部、および前
記感光体の表面電位を測定する表面電位測定用プローブ
を有し、前記感光体を回転させて前記表面電位測定用プ
ローブによる測定値により前記感光体の特性を評価する
感光体特性評価装置において、前記感光体における前記
露光部による露光範囲外の位置に光を照射して前記感光
体からの反射光の強さを前記感光体の回転方向について
検出する受発光素子と、この受発光素子の出力信号を演
算して表示する演算表示部とを備えたことを特徴とする
感光体特性評価装置。1. A charging unit for charging the photosensitive member, a charging unit for exposing the photosensitive member, a charge removing unit for discharging the photosensitive member, and a photosensitive member arranged around a position where the photosensitive member is attached and detached. A photoconductor characteristic evaluation device having a surface potential measuring probe for measuring the surface potential of a body, wherein the photoconductor is rotated to evaluate the characteristic of the photoconductor by the value measured by the surface potential measuring probe, A light emitting / receiving element that irradiates light to a position outside the exposure range of the exposure unit on the body to detect the intensity of reflected light from the photoconductor in the rotation direction of the photoconductor, and an output signal of the light receiving / emitting element. A photoconductor characteristic evaluation device, comprising: a calculation display unit that calculates and displays.
て、前記受発光素子を複数個備えたことを特徴とする感
光体特性評価装置。2. A photoconductor characteristic evaluation apparatus according to claim 1, wherein the photoconductor characteristic evaluation apparatus is provided with a plurality of the light emitting and receiving elements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29968793A JPH07152160A (en) | 1993-11-30 | 1993-11-30 | Photoconductor characteristic evaluation device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29968793A JPH07152160A (en) | 1993-11-30 | 1993-11-30 | Photoconductor characteristic evaluation device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07152160A true JPH07152160A (en) | 1995-06-16 |
Family
ID=17875753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29968793A Pending JPH07152160A (en) | 1993-11-30 | 1993-11-30 | Photoconductor characteristic evaluation device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07152160A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10775161B2 (en) * | 2017-06-02 | 2020-09-15 | Konica Minolta, Inc. | Roll object inspection apparatus |
-
1993
- 1993-11-30 JP JP29968793A patent/JPH07152160A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10775161B2 (en) * | 2017-06-02 | 2020-09-15 | Konica Minolta, Inc. | Roll object inspection apparatus |
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