JPH07110448A - Wave plate feeder - Google Patents

Abstract

PURPOSE:To set the optical axis direction of a wavelength plate according to the type of a microscope by providing a means positioning the wavelength plate between a first and a second positions where the optical axis direction of the wavelength plate is deviated by a specified angle between a frame and a slider. CONSTITUTION:The wavelength plate 1 is held by the circular holding frame 2. Then, the frame 2 is positioned and arranged on the slider 6 and inserted in a capacitor unit. The capacitor unit is fitted to a microscope main body. The slider 6 is provided with a central hole and a circular groove which is formed at the periphery thereof and holds the frame 2. A positioning pin 7 is projectingly provided at the prescribed position of the circular groove and engaged with the positioning grooves 4 and 5 of the frame 2. The grooves 4 and 5 are formed on the frame 2 and they form 90 deg. with the center of the frame 2 as a reference point. Therefore, the wavelength plate 1 can be positioned with respect to the slider 6 by moving the direction of the frame 2 by 90 deg. between the first and the second positions.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a differential interference device for an optical microscope.

[0002]

2. Description of the Related Art FIGS. 7 and 8 show a microscope equipped with a wave plate feeding device for performing this differential interference observation, and show an upright microscope and an inverted microscope, respectively. As shown in FIGS. 7 and 8, such a microscope includes a light source 32, 52 and a stage 33, 5 on the microscope body 31, 51.
3. In addition to the eyepiece lens barrels 34 and 54, the condenser units 35 and 55 and the objective units 36 and 56 are connected. The objective units 36 and 56 include, in addition to the plurality of objective lenses 37 and 57 mounted on the objective revolver, Wollaston prisms 38 and 58 arranged at predetermined positions on the optical axis.
In addition to the condenser lenses 40 and 60, the condenser units 35 and 55 include analyzers 39 and 59, and polarizers 41 and 61, quarter wavelength plates 42 and 62, and
It has wave plates 43 and 63 and Wollaston prisms 44 and 64.

In the differential interference observation using such a microscope, it is possible to observe by changing the background color by rotating the polarizers 41 and 61 on the optical axis. At this time, the optical axes of the wave plates 42 and 62 are changed. Must be set,
Moreover, as shown in FIGS. 9A and 9B, the inverted microscope and the upright microscope are set in different directions. Therefore, the inverted microscope and the upright microscope require wave plates having different optical axis directions λ1 and λ2.

Therefore, in the conventional erecting microscope and inverted microscope, the wavelength plate having the aligned optical axis direction is incorporated into the condenser unit equipped with the device necessary for the differential interference observation together with the wavelength plate, or each microscope is dedicated. In addition, a dedicated slider for holding the wave plate with the optical axis aligned was prepared.

[0005]

However, when a dedicated slider is used to hold the wave plate, a user who owns both an upright microscope and an inverted microscope is
The same wave plate can be used as long as the optical axis direction is set, but it is uneconomical to purchase the wave plate held by each slider.

Similarly, when the capacitor unit is incorporated into the condenser unit, the unit size and the like are often different between the upright and the inverted microscopes and also between the same upright microscopes and the inverted microscopes. Because I can't share it,
It is necessary to prepare a unitized wave plate for each, which is also uneconomical. The present invention has been made in view of such a problem, and an object of the present invention is to provide a wave plate supply device capable of setting the optical axis direction of the wave plate according to the type of microscope. is there.

[0007]

In order to solve the above-mentioned problems, a wavelength plate supply device of the present invention is used in a microscope for performing differential interference observation, and holds a frame for holding the wave plate and a frame for holding the frame. In a wavelength plate supply device including a slider arranged on the optical axis of a microscope, the first and second wavelength plates in which the optical axis direction of the wavelength plate is deviated by 90 degrees between the frame and the slider. Positioning means for selectively positioning between the positions are provided.

[0008]

According to the present invention, it is possible to position the frame by moving the direction of the frame with respect to the slider by 90 degrees between the first and second positions. It can be set in different directions.

[0009]

EXAMPLES As shown in FIG. 1, a wave plate 1 is held by a holding frame 2 formed in a circular shape. The holding frame 2 is positioned and arranged on the slider 6, and is inserted into the slot 10 from the right side of the capacitor unit 13 as shown in FIG. The capacitor unit 13 is shown in FIG.
It is attached to the microscope body as shown in.

The slider 6 has a hole formed in the center,
And a circular groove for holding the holding frame 2 formed around the hole. A positioning pin 7 is provided at a predetermined position of the circular groove, and the protruding pin 7 engages with the positioning groove 4 or 5 of the holding frame 2. Positioning groove 4,
5 is formed on the holding frame 2 as shown in FIG.
The engagement grooves 4 and 5 are formed so as to form an angle of 90 degrees with each other with the center of the holding frame 2 as a reference point.

An index 3 is engraved on the surface of the holding frame 2, and the index 3 has an engaging groove 4 as shown in FIG.
The wave plate 1 is set so that its vibration direction is parallel to a straight line connecting the index 3 and the center of the holding frame 2. The slider 6 is provided with an index 8 at a position indicating the position of the positioning pin 7, and another index 9 is provided at a position shifted by 90 degrees. These indexes 8 and 9 are guides for the index 3 of the holding frame 2 when positioning the holding frame 2 on the slider 6, and the index 8 is an inverted microscope (Inverted Microscop).
e) and the index 9 is used with an upright microscope. The indexes 8 and 9 are provided in axial symmetry with respect to the slider insertion direction (arrow).

The slider 6 on which the wave plate 1 is positioned is
As shown in FIG. 3, the capacitor unit 13 for an inverted microscope is inserted into the slot 10 from the right side. In the condenser unit 13, the condenser lens 12 is arranged on the side of the objective lens (lower side of the drawing) (not shown), and the slot 10
Polarizers 11 are arranged on the opposite sides of each other. The polarizer 11 is provided so that its polarization direction p1 is parallel to the insertion direction of the slider 6. Further, when the analyzer (not shown) is arranged in the microscope as shown in FIG.
Are arranged so as to be orthogonal to the vibration direction p1. Therefore, when the slider 6 positioned as shown in FIG. 1 is inserted and the wavelength plate 1 is arranged on the optical axis of the microscope, the polarization direction of the polarizer 11, the analyzer, and the vibration direction of the wavelength plate 1 from above the microscope are as shown in FIG. The relationship of 8 (a) is satisfied.

Next, the case of an upright microscope will be described with reference to FIGS. As shown in FIG. 4, for positioning, the holding frame 2 is arranged on the slider 6 such that the index 3 of the holding frame 2 faces the index 9 of the slider 6. Therefore, the positioning pin 7 fits into the engagement groove 5 of the holding frame 2. The slider 6 positioned as shown in FIG. 4 is inserted into the slot 14 of the condenser unit 17 mounted on the base of the upright microscope as shown in FIG. In this condenser unit 17, the condenser lens 16 is arranged on the side of the objective lens (not shown) (upper side of the drawing), and the slot 1
A volatilizer 15 is arranged on the side opposite to each other with 4 in between. The vibration direction p2 of the volatilizer 15 is set parallel to the insertion direction of the slider 6 as in the case of the upright microscope. Further, the vibration direction a2 of the analyzer (not shown) is also set to be orthogonal to the vibration direction of the polarizer 15. The vibrating direction λ2 of the wave plate 1 is set by the positioning as shown in FIG. 5, and when the slider 6 is inserted into the slot 14 and the wave plate 1 is arranged on the optical axis of the microscope, Therefore, the polarization direction of the polarizer 11, the analyzer, and the vibration direction of the wave plate 1 satisfy the relationship of FIG.

As described above, according to this embodiment, the vibration direction of the wave plate can be easily changed to an analyzer or a polarizer regardless of whether the microscope is an inverted microscope or an upright microscope and without preparing a plurality of wave plates. On the other hand, it can be set in a predetermined direction. In the embodiment, the polarization direction of the polarizer is fixed, that is, parallel to the insertion direction of the wave plate. However, the present invention is not limited to this, and may be set so as to satisfy the relationship of FIG. When there are a plurality of polarization directions of the polarizer, it is possible to perform positioning at a plurality of positions so that the vibration direction of the wave plate can be set to an appropriate direction satisfying the condition of FIG. 8 for each polarization direction. It is desirable that the holding frame be provided with a required number of engaging grooves and that the slider 6 be provided with an index indicating a setting position in each case.

Next, a modification of positioning will be described with reference to FIG. As shown in FIG. 6, the wave plate 21 includes a holding frame 22.
The holding frame 22 has a positioning pin 23 protruding therefrom. Further, the slider 24 has a handle protruding from one end, a hole formed in the center, and a fitting groove formed around the hole to fit the holding frame. Positioning grooves are formed around the fitting groove at intervals of 90 degrees, and an index indicating whether it is upright or upright is provided near the positioning groove.

In this modification, the relationship between the convex portion and the concave portion between the holding frame and the slider is just opposite to that of the embodiment. Therefore, for example, if the slider has the same size as a slider for inserting another optical element, the slider can also be used. That is, for an optical element that needs to be set in a predetermined direction, by using the fitting groove and the positioning pin provided on the holding frame for positioning, the directionality is adjusted and the optical element that does not need to be set. The element may be fitted in the groove of the slider by providing no pin on the holding frame.

Although the pin and the groove are used for the positioning, other methods such as mounting a mount like an attachment may be used.

[0018]

According to the present invention, since the positioning means is provided between the holding frame and the slider, the vibration directions of the wave plate can be set to two directions different from each other by 90 degrees. Therefore, even when the same differential interference observation is performed as in the case of using an inverted microscope and an upright microscope, even if it is necessary to set the vibration direction of the wave plate by shifting 90 degrees, it is necessary to use each of them exclusively. A set of wave plates and a slider can be used together without preparing a slider or a wave plate.

[Brief description of drawings]

FIG. 1 is a perspective exploded view showing a main part of a wavelength plate supply device according to an embodiment.

2A is a top view of the wave plate and the holding frame of FIG.
(B) It is a front view and (c) is a bottom view.

FIG. 3 is a perspective view showing a capacitor unit according to an embodiment.

FIG. 4 is a perspective exploded view showing a main part of the wavelength plate supply device of the embodiment.

FIG. 5 is a perspective exploded view showing a main part of the wavelength plate supply device of the embodiment.

FIG. 6 is a perspective exploded view showing a main part of a modified wavelength plate supply device.

FIG. 7 is a diagram showing main optical elements of a conventional inverted microscope.

FIG. 8 is a diagram showing main optical elements of a conventional upright microscope.

FIG. 9 is a diagram showing the relationship between the polarization direction of the polarizing element and the vibration direction of the wave plate.

[Explanation of symbols]

 1 ... Wave plate 2 ... Wave plate frame 3 ... Wave plate orientation index 4, 5 ... Positioning groove 6 ... Sled 7 ... Positioning pin 8 ... Inverted microscope index 9 ... Upright microscope index 11 , 15 ... Polarizer 12, 16 ... Condenser lens

Claims (3)

[Claims] 1. A wavelength plate supply device for use in a microscope for performing differential interference observation, comprising: a frame for holding a wave plate; and a slider for holding the frame and arranged on an optical axis of the microscope. Positioning means for selectively positioning between the frame and the slider, between the first and second positions in which the optical axis direction of the wave plate is deviated by 90 degrees, are provided. Supply device. 2. The positioning means engages with one pin projectingly provided on either one of the frame and the slider, and is arranged concentrically in a plane orthogonal to the optical axis of the microscope. 2. The wave plate supplying device according to claim 1, wherein the wave plate supplying device comprises two fitting grooves provided on the other side. 3. The wavelength plate supply according to claim 1, wherein a display indicating whether the inverted microscope or the upright microscope is a reference position is provided near each of the two fitting grooves. apparatus.