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JPH07117426B2 - Optical encoder - Google Patents

Optical encoder

Info

Publication number
JPH07117426B2
JPH07117426B2 JP60054017A JP5401785A JPH07117426B2 JP H07117426 B2 JPH07117426 B2 JP H07117426B2 JP 60054017 A JP60054017 A JP 60054017A JP 5401785 A JP5401785 A JP 5401785A JP H07117426 B2 JPH07117426 B2 JP H07117426B2
Authority
JP
Japan
Prior art keywords
light
diffracted light
polarization
diffracted
scale
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60054017A
Other languages
Japanese (ja)
Other versions
JPS61212728A (en
Inventor
哲治 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP60054017A priority Critical patent/JPH07117426B2/en
Publication of JPS61212728A publication Critical patent/JPS61212728A/en
Publication of JPH07117426B2 publication Critical patent/JPH07117426B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/34707Scales; Discs, e.g. fixation, fabrication, compensation
    • G01D5/34715Scale reading or illumination devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は光学式エンコーダーに関し、特に円周上に例え
ば透光部と反射部の格子模様を複数個、周期的に刻んだ
放射格子を回転物体に取付け、該放射格子に例えばレー
ザーからの光束を照射し、該放射格子からの回折光を利
用して、放射格子若しくは回転物体の回転角度等の回転
情報を光電的に検出するロータリーエンコーダーに良好
に適用できるものである。
Description: TECHNICAL FIELD The present invention relates to an optical encoder, and more particularly, to rotating a radiation grating in which a plurality of grating patterns of a light transmitting portion and a reflecting portion are periodically engraved on a circumference. Attached to an object, irradiating the radiation grating with a light beam from a laser, for example, and using the diffracted light from the radiation grating, a rotary encoder for photoelectrically detecting rotation information such as the rotation angle of the radiation grating or the rotating object. It can be applied well.

(従来の技術) 従来よりフロッピーディスクの駆動等のコンピューター
機器、プリンター等の事務機器、あるいはNC工作機械、
さらにはVTRのキャプステンモーターや回転ドラム等の
回転機構の回転速度や回転速度の変動量を検出する為の
手段として光電的なロータリーエンコーダーが利用され
てきている。
(Prior Art) Conventionally, computer equipment such as drive of floppy disk, office equipment such as printer, or NC machine tool,
Furthermore, a photoelectric rotary encoder has been used as a means for detecting the rotational speed of a rotating mechanism such as a VTR capstain motor or a rotating drum and the amount of fluctuation of the rotational speed.

光電的なロータリーエンコーダーを用いる方法は、回転
軸に連結した円板の周囲に透光部と遮光部を等間隔に設
けた、所謂メインスケールとこれに対応してメインスケ
ールと等しい間隔で透光部と遮光部とを設けた所謂固定
のインデックススケールとの双方のスケールを投光手段
と受光手段で挟んで対向配置した所謂インデックススケ
ール方式の構造を採っている。この方法はメインスケー
ルの回転に伴って双方のスケールの透光部と遮光部の間
隔に同期した信号が得られ、この信号を周波数解析して
回転軸の回転速度の変動を検出している。この為双方の
スケールの透光部と遮光部とのスケール間隔を細かくす
ればする程、検出精度を高めることができる。しかしな
がらスケール間隔を細かくすると回折光の影響で受光手
段からの出力信号のS/N比が低下し検出精度が低下して
しまう欠点があった。この為メインスケールの透光部と
遮光部の格子の総本数を固定し、透光部と遮光部の間隔
を回折光の影響を受けない程度まで拡大しようとすると
メインスケールの円板の直径が増大し更に厚さも増大し
装置全体が大型化し、この結果被回転物体への負荷が大
きくなってくる等の欠点があった。
The method using a photoelectric rotary encoder is a so-called main scale in which a light-transmitting part and a light-shielding part are provided at equal intervals around a disk connected to a rotary shaft, and correspondingly, a light-transmitting part is provided at the same interval as the main scale. The structure employs a so-called index scale system in which both scales of a so-called fixed index scale provided with a light-shielding portion and a light-shielding portion are opposed to each other by sandwiching them between the light projecting means and the light receiving means. With this method, a signal synchronized with the distance between the light-transmitting portion and the light-shielding portion of both scales is obtained with the rotation of the main scale, and the frequency analysis of this signal is performed to detect the fluctuation of the rotation speed of the rotating shaft. Therefore, the finer the scale interval between the light-transmitting portion and the light-shielding portion of both scales, the higher the detection accuracy can be. However, if the scale interval is made fine, there is a drawback that the S / N ratio of the output signal from the light receiving means is lowered due to the influence of the diffracted light and the detection accuracy is lowered. Therefore, if the total number of gratings of the light-transmitting part and the light-shielding part of the main scale is fixed and the distance between the light-transmitting part and the light-shielding part is expanded to the extent that it is not affected by the diffracted light, the diameter of the disc of the main scale will change. There is a drawback in that the load is increased, the thickness is increased, the size of the entire device is increased, and as a result, the load on the rotated object is increased.

これはロータリーエンコーダーに限らず光学式エンコー
ダーでも被検体への負荷が大きくなるという問題があっ
た。
This is not limited to the rotary encoder, but there is a problem that the load on the subject is increased not only by the optical encoder.

(本発明の目的) 本発明は被検体への負荷を小さくした光学式エンコーダ
ーを提供することを目的とする。
(Object of the Present Invention) An object of the present invention is to provide an optical encoder that reduces the load on the subject.

本発明は特に2回回折光同士の干渉により変位検出を行
う光学式エンコーダーにおいて、精度の安定化のために
高度な調整、または特殊な光学素子が必要な2回回折用
の光学系にできるかぎり自由度を与えることを可能にし
た光学式エンコーダーを提供することを目的とする。
The present invention is particularly applicable to an optical encoder for detecting displacement by interference between two-time diffracted light, as far as possible for an optical system for two-time diffraction, which requires a high degree of adjustment for stabilizing accuracy or a special optical element. It is an object to provide an optical encoder capable of giving a degree of freedom.

(本発明の主たる特徴) 本発明の光学式エンコーダーは、変位検出方向に沿って
回折格子が形成されたスケールと、可干渉性の直線偏光
光束を生成する光源と、前記光源からの光束の直線偏光
方向に対して方位が45゜を成し前記光源からの光束を2
分割するための偏光ビームスプリッターと、前記偏光ビ
ームスプリッターで分割生成された2つの光束を、それ
ぞれ前記スケールの回折格子上の2つの位置M1,M2に入
射させ、前記位置M1で発生する+m次の回折光を光路を
略逆行させて再度前記スケールの回折格子上の略前記位
置M1に入射させて+m次の2回回折光を発生させると共
に、前記位置M2で発生する−m次の回折光を光路を略逆
行させて再度前記スケールの回折格子の略前記位置M2
入射させて−m次の2回回折光を発生させる光学系と、
前記光学系内に前記2つの光束それぞれに対応して設け
られ且つ前記光学系を進行する光束が往復で2回通過す
るように配置された第1及び第2の1/4波長板と、前記
光学系により発生した±m次の2回回折光同士を前記偏
光ビームスプリッターで合成して得られた回折光が通過
する位置に設けられた第3の1/4波長板と、該第3の1/4
波長板を通過した前記回折光から互いに異なる複数の偏
光方位成分を選択してそれぞれ複数の受光素子で検出す
るように配置された受光手段とを有することを特徴とし
ている。
(Main Features of the Present Invention) An optical encoder of the present invention includes a scale in which a diffraction grating is formed along a displacement detection direction, a light source that generates a coherent linearly polarized light beam, and a straight line of the light beam from the light source. The azimuth is 45 ° with respect to the polarization direction, and the luminous flux from the light source is 2
A polarization beam splitter for splitting the two light beams split produced by the polarization beam splitter, is incident to the two positions M 1, M 2 on the diffraction grating of the scale, occurring at the position M 1 The + m-th order diffracted light is made to substantially go backward in the optical path and is made incident again to the position M 1 on the diffraction grating of the scale to generate + m-th order diffracted light twice, and −m generated at the position M 2. An optical system for causing the next diffracted light to travel substantially backward in the optical path and to enter the diffracted light at approximately the position M 2 of the diffraction grating of the scale again to generate diffracted light of the −m th order twice.
First and second quarter-wave plates provided in the optical system corresponding to each of the two light beams and arranged so that a light beam traveling through the optical system passes twice in a reciprocating manner; A third quarter-wave plate provided at a position through which the diffracted light obtained by combining the ± m-order two-time diffracted lights generated by the optical system with each other by the polarization beam splitter, and the third 1/4
It is characterized in that it has a light receiving means arranged so that a plurality of different polarization azimuth components are selected from the diffracted light that has passed through the wave plate and are detected by a plurality of light receiving elements.

特に、前記複数の受光素子は、前記第3の1/4波長板を
通過した回折光が分岐されて互いに偏光方位をずらされ
た複数の偏光板をそれぞれ通過した位置に各々配置され
ていることを特徴としている。
In particular, the plurality of light receiving elements are respectively arranged at positions where the diffracted light that has passed through the third quarter-wave plate is branched and passed through the plurality of polarizing plates whose polarization directions are shifted from each other. Is characterized by.

(実施例) 第1図は本発明の一実施例の概略図である。(Example) FIG. 1 is a schematic view of an example of the present invention.

同図においては、1はレーザー等の可干渉性の光源、2
はコリメーターレンズ、3は偏光ビームスプリッター
で、レーザー1からの直線偏光に対して、その偏光軸が
45゜となるように配置されている。41,42,43は各々1/4
波長板で、各々、偏光ビームスプリッター3の、反射及
び透過光束の直線偏光に対して、各々の偏光軸が45゜と
なるように配置されている。すなわち、1/4波長板41
偏光ビームスプリッター3の反射光束の直線偏光方位に
対してその偏光軸が45゜となるように配置され、1/4波
長板42は偏光ビームスプリッター3の透過光束の直線偏
光方位に対してその偏光軸が45゜となるように配置され
ている。また1/4波長板43は、偏光ビームスプリッター
3の透過あるいは反射光束のいずれかの偏光方位に対し
てその偏光軸が45゜となるように配置されている。5は
反射鏡である。61,62,61′,62′は各々シリンドリカル
レンズ、7,7′は反射鏡である。8は円板上に例えば透
光部と反射部の格子模様を等角度で設けたスケールを形
成する放射格子、9は不図示の被検回転物体の回転軸で
ある。10はビームスプリッター、11,11′は偏光板で、
偏光方位が互いに45゜になるように配置されている。1
2,12′は受光素子である。
In the figure, 1 is a coherent light source such as a laser, 2
Is a collimator lens, 3 is a polarization beam splitter, and its polarization axis is
It is arranged at 45 °. 4 1 , 4 2 and 4 3 are 1/4 each
The wavelength plates are arranged so that their respective polarization axes are 45 ° with respect to the linearly polarized light of the reflected and transmitted light beams of the polarization beam splitter 3. That is, the 1/4 wavelength plate 4 1 is arranged so that its polarization axis is 45 ° with respect to the linear polarization direction of the reflected light beam of the polarization beam splitter 3, and the 1/4 wavelength plate 4 2 is It is arranged so that its polarization axis is 45 ° with respect to the linear polarization direction of the transmitted light flux. The quarter-wave plate 4 3 is arranged so that its polarization axis with respect to either the polarization direction of the transmitted or reflected light beam of the polarization beam splitter 3 is 45 °. Reference numeral 5 is a reflecting mirror. 6 1 , 6 2 , 6 1 ′ and 6 2 ′ are cylindrical lenses, and 7 and 7 ′ are reflecting mirrors. Reference numeral 8 denotes a radiation grating forming a scale in which, for example, a grid pattern of a light transmitting portion and a reflecting portion is provided at equal angles on a disc, and 9 is a rotation axis of a rotating object to be inspected (not shown). 10 is a beam splitter, 11 and 11 'are polarizing plates,
It is arranged so that the polarization directions are 45 ° to each other. 1
2, 12 'are light receiving elements.

レーザー1より放射された光束は、コリメーターレンズ
2によって略平行光束となり、偏光ビームスプリッター
3に入射する。偏光ビームスプリッター3は、その方位
が、レーザー1の直線偏光方位に対して45゜となるよう
に配置されておりレーザー1からの光束を略等しい光量
の反射光束と透過光束に分割する。分割された2つの光
束は各々1/4波長板41及び42を通過後、円偏光となる。
このうち、透過光束はシリンドリカルレンズ61を介し
て、放射格子8上の位置M1上に線状照射される。一方、
反射光束は、反射鏡5及びシリンドリカルレンズ61′を
介して、放射格子8上の位置M2上に線状照射される。こ
こで、シリンドリカルレンズ61,61′は光束を放射格子
8の放射方向と直交する方向に線状照射するように必要
に応じて配置されている。このように線状照射すること
により、放射格子8上での光束の照射部分に相当する透
光部と反射部の格子模様のピッチ誤差を軽減することが
できる。また、放射格子8上の照射位置M1とM2は、不図
示の被検回転物体の回転中心に対して略点対称な位置関
係となるように設定されている。
The light beam emitted from the laser 1 is made into a substantially parallel light beam by the collimator lens 2 and is incident on the polarization beam splitter 3. The polarization beam splitter 3 is arranged so that its azimuth is 45 ° with respect to the linear polarization azimuth of the laser 1, and splits the light flux from the laser 1 into a reflected light flux and a transmitted light flux having substantially equal light amounts. After passing through the divided two light beams each quarter-wave plate 4 1 and 4 2, a circularly polarized light.
Among them, the transmitted light beam via a cylindrical lens 61, is linear irradiance on position M 1 on the radiation grid 8. on the other hand,
The reflected light flux is linearly irradiated onto the position M 2 on the radiation grating 8 via the reflecting mirror 5 and the cylindrical lens 6 1 ′. Here, the cylindrical lenses 6 1 , 6 1 ′ are arranged as necessary so as to linearly irradiate the light flux in a direction orthogonal to the radiation direction of the radiation grating 8. By performing the linear irradiation in this way, it is possible to reduce the pitch error of the lattice pattern of the light transmitting portion and the reflecting portion, which corresponds to the irradiation portion of the light flux on the radiation grating 8. Further, the irradiation positions M 1 and M 2 on the radiation grating 8 are set so as to have a substantially point-symmetrical positional relationship with respect to the rotation center of the rotating object to be inspected (not shown).

放射格子8に入射した光束は、放射格子8の格子模様に
よって反射回折される。いま、光束の照射位置における
格子模様のピッチをpとすれば、m次の反射回折光L,
L′の回折角度θは、次の(I)式で表される。
The light beam incident on the radiation grating 8 is reflected and diffracted by the grating pattern of the radiation grating 8. Now, if the pitch of the lattice pattern at the irradiation position of the luminous flux is p, the reflected diffracted light L of the m-th order,
The diffraction angle θ m of L ′ is represented by the following formula (I).

sinθ=mλ/p ‥‥‥(1) ここで、λは光束の波長である。sin θ m = mλ / p (1) where λ is the wavelength of the light beam.

いま、放射格子8が、角速度ωで回転しているとし、放
射格子の回転中心から、照射位置M1,M2までの距離をr
とすると、照射位置M1,M2での周速度はv=rωとな
る。
Now, assuming that the radiation grating 8 is rotating at an angular velocity ω, the distance from the rotation center of the radiation grating to the irradiation positions M 1 and M 2 is r.
Then, the peripheral velocity at the irradiation positions M 1 and M 2 is v = rω.

ここで、M1,M2への入射光束を、波数ベクトル表示で
iと表わし、反射回折光L及び、L′を波数ベクトル表
示でs及び′sと表わし、位置M1,M2における放射
格子8の周速度をベクトル表示でと表わし、その関係
を示すと第2図のようになる。そして反射回折光L及び
L′の周波数は、次式で表わされる量Δf及びΔf′だ
け、所謂ドップラーシフトを受ける。
Here, the incident light fluxes to M 1 and M 2 are represented by i in the wave number vector representation, the reflected diffracted lights L and L ′ are represented as s and ′ s in the wave number vector representation, and the radiation at the positions M 1 and M 2 The peripheral velocity of the grating 8 is represented by a vector display and the relationship is shown in FIG. Then, the frequencies of the reflected diffracted lights L and L ′ undergo so-called Doppler shift by the amounts Δf and Δf ′ expressed by the following equations.

ここで・はベクトルの内積を表わす。 Here, · represents the dot product of the vector.

そして、シリンドリカルレンズ62,62′を介して、反射
鏡7,7′で位置M1,M2を再照射する。そうすると位置M1,M
2で再び回折されこのときのm次の反射回折光束は、元
の光路を戻るが、再回折時に再び(2)式で表わされる
量のドップラーシフトを受ける。この為位置M1で再回折
されて元の光路を戻る光束は、周波数2Δfのドップラ
ーシフトを受け、位置M2で再回折されて元の光路を戻る
光束は周波数−2Δfのドップラーシフトを受ける。
Then, the positions M 1 and M 2 are re-irradiated by the reflecting mirrors 7 and 7 ′ through the cylindrical lenses 6 2 and 6 2 ′. Then position M 1 , M
Reflected diffracted light beam of the m-th order diffracted this time again 2 is back to the original optical path, it undergoes a Doppler shift amount expressed again during re-diffraction (2). Therefore, the light beam re-diffracted at the position M 1 and returning to the original optical path undergoes the Doppler shift of frequency 2Δf, and the light beam re-diffracted at the position M 2 and returning to the original optical path undergoes the Doppler shift of frequency −2Δf.

ここで位置M1で再回折されて元の光路を戻る光束は、1/
4波長板42を再び透過すると、その方位が入射時とは90
度回転した直線偏光となり、偏光ビームスプリッター3
で反射される。また位置M2で再回折されて元の光路を戻
る光束も、1/4波長板41を再び透過すると、その方位が
入射時とは90度回転した直線偏光となり、偏光ビームス
プリッター3を透過する。位置M1,M2で再回折された光
束は、重なり合い、1/4波長板43を通って、ビームスプ
リッター10で2光束に分割され偏光板11,11′を透過し
て受光素子12,12′に入射する。
Here, the light beam that is re-diffracted at the position M 1 and returns to the original optical path is 1 /
4 When again transmitted through the wavelength plate 4 2, its orientation as the incoming 90
Polarized beam splitter 3
Is reflected by. The light beam is again diffracted back to its original light path at a location M 2 also, when again passing through the 1/4-wave plate 4 1, becomes linearly polarized light whose direction is from the incoming rotated 90 degrees, transmitted through the polarization beam splitter 3 To do. The light flux re-diffracted by the position M 1, M 2 may overlap, 1/4 through the wavelength plate 4 3, the light receiving element 12 is transmitted through the divided by the beam splitter 10 into two beams polarizing plates 11, 11 ', It is incident on 12 '.

このように周波数2Δf及び周波数−2Δfのドップラ
ーシフトを受けた2つの光束が重なり合うため、受光素
子12,12′の出力信号の周波数は、2Δf−(−2Δ
f)=4Δfとなる。つまり、受光素子12,12′の出力
信号の周波数Fは、F=4Δf=4rωsinθm/λとな
り、(1)式の回折条件の式から、F=4mrω/pとな
る。放射格子8の格子模様の総本数をN、等角度ピッチ
をΔφとすれば、p=rΔφ,Δφ=2π/Nより、 F=2mNω/π ‥‥‥(3) となる。いま、時間Δtの間での受光素子の出力信号の
波数をn、Δtの間での放射格子8の回転角をθとすれ
は、n=FΔT,θ=ωΔtより、 n=2Nθ/π ‥‥‥(4) となり、受光素子の出力信号波形の波数nをカウントす
ることによって、放射格子8の回転角θを、(4)式に
よって求めることができる。
In this way, the two light beams subjected to the Doppler shift of the frequency 2Δf and the frequency −2Δf overlap each other, so that the frequency of the output signals of the light receiving elements 12 and 12 ′ is 2Δf − (− 2Δf
f) = 4Δf. That is, the frequency F of the output signals of the light receiving elements 12 and 12 'is F = 4Δf = 4rωsin θ m / λ, and F = 4mrω / p from the equation of the diffraction condition of the equation (1). Assuming that the total number of the lattice patterns of the radiation grating 8 is N and the equiangular pitch is Δφ, p = rΔφ and Δφ = 2π / N, and thus F = 2mNω / π (3). Now, if the wave number of the output signal of the light receiving element during the time Δt is n and the rotation angle of the radiation grating 8 between the times Δt is θ, then n = FΔT, θ = ωΔt, then n = 2Nθ / π ... (4) The rotation angle θ of the radiation grating 8 can be obtained by the equation (4) by counting the wave number n of the output signal waveform of the light receiving element.

ところで、回転角度を検出する際、回転方向が検出出来
れば更に好ましい。そのため本実施例においては、従来
の光電式ロータリーエンコーダーなどにおいて公知のよ
うに、複数個の受光素子を用意して、互いの信号の位相
が90度ずれるように配置し、回転に伴う90度位相差信号
から、回転方向を示す信号を取り出す方式を用いてい
る。
By the way, when detecting the rotation angle, it is more preferable if the rotation direction can be detected. Therefore, in this embodiment, as is known in conventional photoelectric rotary encoders, etc., a plurality of light receiving elements are prepared, and the signals are arranged so that their phases are shifted by 90 degrees. A method of extracting a signal indicating the rotation direction from the phase difference signal is used.

本実施例においては、2つの受光素子12,12′で得られ
る出力信号間の90゜の位相ずれをつけており、これを偏
光ビームスプリッターと、1/4波長板43及び偏光板11,1
1′を組み合わせて作り出している。
In this embodiment, a 90 ° phase shift is provided between the output signals obtained by the two light receiving elements 12 and 12 ', which is used as a polarization beam splitter, a 1/4 wavelength plate 43 and polarizing plates 11 and 1.
It is created by combining 1 '.

第6図は第1図の偏光ビームスプリッター3以降の各要
素の光学的作用を示す模式図である。
FIG. 6 is a schematic view showing the optical action of each element after the polarization beam splitter 3 in FIG.

すなわち、第6図に示すように放射格子8上の位置M1,M
2で再回折されて元の光路を戻る光束LM1,LM2は偏光ビー
ムスプリッター3で各々反射及び透過されて重なり合
い、1/4波長板43を透過することによって右回りの円偏
光TM1と左回りの円偏光TM2となる。
That is, as shown in FIG. 6, the positions M 1 , M on the radiation grating 8 are
The light beams LM 1 and LM 2 that are re-diffracted by 2 and return to the original optical path are reflected and transmitted by the polarization beam splitter 3 to overlap with each other, and pass through the 1/4 wavelength plate 4 3 to transmit clockwise circularly polarized light TM 1 And the left-handed circularly polarized light TM 2 .

この2つの円偏光TM1,TM2が重なり合うと、一部偏光成
分が相殺された結果的に所定方向に偏光面を有する直線
偏光TLとなる。
When the two circularly polarized light TM 1 and TM 2 are overlapped with each other, the polarized light components are partially canceled to result in a linearly polarized light TL having a polarization plane in a predetermined direction.

このときの直線偏光TLの偏光方位は放射格子8の回転に
伴って変化する。そしてこの直線偏光TLをハーフミラー
10で2つの光束TL1,TL2に分割して各々偏光板11,11′に
導光している。
The polarization direction of the linearly polarized light TL at this time changes as the radiation grating 8 rotates. And this linearly polarized light TL is a half mirror
The light beam is divided into two light beams TL 1 and TL 2 at 10 and guided to the polarizing plates 11 and 11 ′, respectively.

そして分割した2つの光束TL1,TL2を偏光板11,11′を介
して一定の振動方向の成分だけとしてこの成分だけを受
光素子12,12′で受光している。このとき受光素子12,1
2′からは初めて放射格子8の回転に伴う明暗信号S1,S2
が得られる。
Then, the two divided light beams TL 1 and TL 2 are passed through the polarization plates 11 and 11 ′, and only the component in the constant vibration direction is received by the light receiving elements 12 and 12 ′. At this time, the light receiving element 12,1
For the first time from 2 ', the bright and dark signals S 1 , S 2 accompanying the rotation of the radiation grating 8
Is obtained.

本実施例では2つの偏光板11,11′の方位を互いに45゜
ずらしており、これにより受光素子12,12′から互いに9
0゜位相がずれた明暗信号S1,S2を得ている。
In this embodiment, the orientations of the two polarizing plates 11 and 11 'are shifted from each other by 45 °, so that the light receiving elements 12 and 12' are separated from each other by 9 °.
Bright and dark signals S 1 and S 2 with a 0 ° phase shift are obtained.

そして第1図に示すように例えば受光素子12,12′の出
力信号を波形整形し、回転方向を検出した後カウンター
に積算し、回転角度を求めている。
Then, as shown in FIG. 1, for example, the output signals of the light-receiving elements 12 and 12 'are waveform-shaped, and after detecting the rotation direction, they are integrated in the counter to obtain the rotation angle.

第3図は第1図の放射格子8と2つの光束の放射格子8
上の照射位置M1,M2と被検回転物体の回転中心との説明
図である。
FIG. 3 shows the radiation grating 8 of FIG. 1 and the radiation grating 8 of two light beams.
FIG. 3 is an explanatory diagram of upper irradiation positions M 1 and M 2 and a rotation center of a rotating object to be inspected.

本実施例においては放射格子8の中心と被検回転物体の
回転中心に対して略点対称の2点M1,M2を測定点とする
ことにより放射格子8の中心と、被検回転体の回転中心
との偏心の影響を軽減している。すなわち、放射格子8
の中心と、回転中心とを完全に一致させることは機構上
困難であり、両者の偏心は避けられない。たとえば、第
3図に示すように、放射格子8の中心Oと、回転中心
O′との間に、偏心量がaだけあったとき、回転中心か
ら距離rの位置にある測定点M1でのドップラー周波数シ
フトは、偏心がないときとくらべて、r/(r+a)か
ら、r/(r−a)まで変化する。一方、このとき位置M1
と、回転中心に対して点対称な位置にある測定点M2での
周波数シフトは、位置M1での変化とは逆に、r/r−aか
らr/r+aまで変化するから、位置M1とM2の2点を同時
に測定することによって、偏心の影響を軽減している。
In this embodiment, two points M 1 and M 2 that are substantially point-symmetric with respect to the center of the radiation grating 8 and the center of rotation of the rotating object to be measured are used as measurement points, so that the center of the radiation grating 8 and the rotating body to be measured are measured. The effect of eccentricity with the rotation center of is reduced. That is, the radiation grating 8
It is mechanically difficult to completely match the center of with the center of rotation, and eccentricity of both is inevitable. For example, as shown in FIG. 3, when the amount of eccentricity is a between the center O of the radiation grating 8 and the rotation center O ′, at the measurement point M 1 located at the distance r from the rotation center. The Doppler frequency shift of changes from r / (r + a) to r / (r−a) compared to when there is no eccentricity. On the other hand, at this time position M 1
, And the frequency shift at the measurement point M 2 that is point-symmetric with respect to the center of rotation changes from r / r−a to r / r + a, which is the reverse of the change at position M 1 , The effect of eccentricity is reduced by simultaneously measuring two points, 1 and M 2 .

また本実施例においては例えば従来から使用されている
インデックススケール方式の光電式ロータリーエンコー
ダーでは、前述の(4)式に対応する、受光素子からの
出力信号の波数nと、メインスケールの総本数Nと、回
転角θとの関係は、 n=Nθ/2π ‥‥‥(5) であるから、波数1個あたりの回転角Δθは、 Δθ=2π/N(ラジアン) ‥‥‥(6) である。これに対して、本実施例では、(4)式から、 Δθ=π/2mN(ラジアン) ‥‥‥(7) である。
Further, in the present embodiment, for example, in the index scale type photoelectric rotary encoder which has been conventionally used, the wave number n of the output signal from the light receiving element and the total number N of the main scales corresponding to the above formula (4) are used. And the rotation angle θ is n = Nθ / 2π (5), the rotation angle Δθ per wave number is Δθ = 2π / N (radian) (6) is there. On the other hand, in the present embodiment, from the equation (4), Δθ = π / 2mN (radian) (7)

従って、本実施例によれば、同じ分割数のスケールを用
いても従来例に比べて4m倍の精度で回転角度の検出が出
来ることになる。
Therefore, according to the present embodiment, it is possible to detect the rotation angle with accuracy of 4 m times as compared with the conventional example even if the scale with the same division number is used.

また、従来の光電式ロータリーエンコーダーにおいて
は、透光部と遮光部の間隔は、光の回折の影響を考慮す
ると、10μm程度が限度である。
Further, in the conventional photoelectric rotary encoder, the distance between the light transmitting portion and the light shielding portion is limited to about 10 μm in consideration of the influence of light diffraction.

いま、回転角度検出精度として、例えば30秒を得るため
には、従来例では、メインスケールの分割数として前述
の(6)式から、 N=360×60×60/30=43,200 だけ必要である。そこで、メインスケール最外周での透
光部、遮光部の間隔を10μmとすれば、メインスケール
の直径は、 0.01mm×43,200/π=137.5mm 必要になる。
Now, in order to obtain the rotation angle detection accuracy of, for example, 30 seconds, in the conventional example, only N = 360 × 60 × 60/30 = 43,200 is required as the number of divisions of the main scale from the above equation (6). . Therefore, if the distance between the light-transmitting portion and the light-shielding portion at the outermost periphery of the main scale is 10 μm, the diameter of the main scale needs to be 0.01 mm × 43,200 / π = 137.5 mm.

しかるに、本実施例によれば、従来例と同じ回転角の検
出精度を得るためには、放射格子の分割数は1/4mでよ
い。±1次の回折光を用いたm=1の場合、30秒の回転
角検出精度を得るための放射格子8の格子の分割数は、 43,200/4=10,800 でよい。そして本実施例においてレーザーの回折光を用
いれば透光部と反射部の間隔は狭くてよいので、たとえ
ば、これを4μmとすると、放射格子の直径は、 0.004mm×10,800/π=13.75mm でよいことになる。すなわち、本実施例によれば従来の
インデックススケール方式の光電式ロータリーエンコー
ダーと同等の回転角検出精度を得る形状としては、1/10
以下の大きさでよいことになる。従って、被検回転物体
への負荷も、従来例とくらべて、はるかに小さくなり、
正確な測定が行える。
However, according to the present embodiment, in order to obtain the same rotation angle detection accuracy as in the conventional example, the number of divisions of the radiation grating may be 1/4 m. When m = 1 using the ± 1st order diffracted light, the number of divisions of the radiation grating 8 for obtaining the rotation angle detection accuracy of 30 seconds may be 43,200 / 4 = 10,800. In the present embodiment, if the diffracted light of the laser is used, the distance between the light transmitting portion and the reflecting portion may be narrow. Therefore, for example, if this is 4 μm, the diameter of the radiation grating is 0.004 mm × 10,800 / π = 13.75 mm. It will be good. That is, according to the present embodiment, as a shape for obtaining the rotation angle detection accuracy equivalent to that of the conventional index scale type photoelectric rotary encoder,
The following size will suffice. Therefore, the load on the rotating object to be inspected is much smaller than that of the conventional example,
Accurate measurement is possible.

第4図は、本発明の他の実施例の一部分の概略図であ
り、第1図の放射格子8に光束が入射する付近部分を示
している。同図において各要素に付された番号は第1図
で示したものと同じ要素を示す。放射格子8の位置M1
びM2に入射した光束の±m次の透過回折光をシリンドリ
カルレンズ62,62′、反射鏡7,7′を介して、放射格子8
に再度入射させ、元の光路に戻すことにより第1図に示
した実施例と同様の効果を得ている。
FIG. 4 is a schematic view of a part of another embodiment of the present invention, and shows the vicinity of the part where the luminous flux is incident on the radiation grating 8 of FIG. In the figure, the numbers given to the respective elements indicate the same elements as those shown in FIG. The transmission / diffracted light of the ± mth order of the luminous flux incident on the positions M 1 and M 2 of the radiation grating 8 is transmitted through the cylindrical lenses 6 2 , 6 2 ′ and the reflecting mirrors 7, 7 ′ to the radiation grating 8
The same effect as that of the embodiment shown in FIG. 1 is obtained by re-entering the beam and returning it to the original optical path.

第5図は、本発明の更に別の実施例の第4図と同様の概
略図である。
FIG. 5 is a schematic view similar to FIG. 4 of still another embodiment of the present invention.

第5図において13及び13′は各々コーナーキューブ反射
鏡である。放射格子8の位置M1及びM2に入射した光束の
±m次の反射(あるいは第4図のように透過でもよ
い。)回折光を、シリンドリカルレンズ62,62′を介し
て、コーナーキューブ反射鏡での元の光路に戻し、第1
図に示した実施例と同様の効果を得ている。放射格子8
の中心と、被検回転物体の回転中心とが偏心している場
合、場所によって、放射格子8の透光部及び反射部の間
隔が変化するため、回折光L及びL′の回折角が変化す
ることになる。また、第1図の実施例において、光源1
としては、半導体レーザーが、その小型・低価格・高出
力という点で、最も望ましい。
In FIG. 5, 13 and 13 'are corner cube reflectors, respectively. The ± mth-order reflected (or transmitted as shown in FIG. 4) diffracted light of the light beam incident on the positions M 1 and M 2 of the radiation grating 8 is passed through the cylindrical lenses 6 2 and 6 2 ′ to the corners. Return to the original optical path of the cube reflector, and first
The same effect as the embodiment shown in the figure is obtained. Radiant grating 8
When the center of the eccentricity and the center of rotation of the rotating object to be inspected are eccentric, the distance between the light transmitting portion and the reflecting portion of the radiation grating 8 changes depending on the location, so the diffraction angles of the diffracted lights L and L'change. It will be. Further, in the embodiment of FIG. 1, the light source 1
For this reason, semiconductor lasers are the most desirable because of their small size, low cost, and high output.

しかるに、半導体レーザーは、周囲の温度変化によっ
て、その発振波長が変化することが知られている。第1
図の実施例において、光源1の波長が変化すると、回折
光L及びL′の回折角が変化する。このとき、回折光L
及びL′の反射鏡として第1図の7及び7′の如く平面
鏡を用いると、反射鏡は所謂ティルト状態になって、受
光素子12,12′の前面には、干渉縞が多数発生し、受光
素子12,12′の出力信号のS/Nが低下する場合がある。そ
こで第5図の如く、反射鏡としてコーナーキューブ反射
鏡13及び13′を用いることにより、放射格子8で回折さ
れた回折光L及びL′の回折角が上記理由で変化して
も、コーナーキューブ反射鏡13及び13′で反射された光
束を元の光路を戻すことができる。これにより受光素子
12,12′の前面で干渉縞が多数発生するのを防止し、受
光素子12,12′の出力信号のS/N比の向上を図っている。
However, it is known that the oscillation wavelength of the semiconductor laser changes depending on the ambient temperature change. First
In the illustrated embodiment, when the wavelength of the light source 1 changes, the diffraction angles of the diffracted lights L and L'change. At this time, the diffracted light L
If a plane mirror such as 7 and 7'in FIG. 1 is used as the reflecting mirrors for L and L ', the reflecting mirror becomes a so-called tilted state, and a large number of interference fringes are generated on the front surface of the light receiving elements 12, 12'. The S / N ratio of the output signals of the light receiving elements 12 and 12 'may decrease. Therefore, as shown in FIG. 5, by using the corner cube reflecting mirrors 13 and 13 'as the reflecting mirrors, even if the diffraction angles of the diffracted lights L and L'diffracted by the radiation grating 8 change for the above reason, the corner cube The light beam reflected by the reflecting mirrors 13 and 13 'can be returned to the original optical path. By this, the light receiving element
A large number of interference fringes are prevented from being generated on the front surfaces of 12, 12 ', and the S / N ratio of the output signals of the light receiving elements 12, 12' is improved.

尚前述した各実施例ではm次の2つの回折光を用いた場
合を示したが±m次の回折光であっても又次数の異なっ
た2つの回折光を用いても良い。又本実施例において放
射格子の中心と被検回転物体の回転中心との偏差誤差が
無視出来、回転速度計として用いるならば放射格子への
照射点を1箇所とし、受光素子を1つ設ければ良い。
In each of the above-described embodiments, two m-th order diffracted lights are used, but ± m-th order diffracted lights or two diffracted lights of different orders may be used. Further, in this embodiment, the deviation error between the center of the radiation grating and the center of rotation of the rotating object to be inspected can be neglected, and if it is used as a tachometer, the irradiation point on the radiation grating should be one and one light receiving element should be provided. Good.

(本発明の効果) 本発明によれば被検体の負荷の小さい小型で高精度の光
学式エンコーダーを達成することができる。
(Effects of the Present Invention) According to the present invention, it is possible to achieve a compact and high-precision optical encoder with a small load on the subject.

特に本発明によれば、特に光源からの光束の直線偏光方
位に対して方位が45゜を成す偏光ビームスプリッターに
よって光源からの光束を2分割し、この分割光束をそれ
ぞれ光学系によって逆行光路中で2回回折させると共に
この光学系内で1/4波長板を2回通過させることによっ
て分離時と直線偏光方位を変化させて前述の偏光ビーム
スプリッターで合波する構成にして、2回回折発生のた
めの光束の分離合波において使用部材の少ない簡単な構
成で、回折を除いて理論上光量ロスが無く分離合波を実
行している。
In particular, according to the present invention, the light beam from the light source is split into two by a polarization beam splitter having an azimuth angle of 45 ° with respect to the linear polarization direction of the light beam from the light source. By making it diffract twice and changing the linear polarization azimuth at the time of separation by passing it through a quarter-wave plate twice in this optical system and combining by the above-mentioned polarization beam splitter, the diffraction of twice occurs. In order to separate and combine the light fluxes, there is a simple structure that uses few members, and theoretically, there is no light quantity loss except for diffraction, and the separation and combination is performed.

且つ、このようにして偏光ビームスプリッターで合波し
た2光束を更に1/4波長板を通すことで逆回りの円偏光
に変換し、この円偏光光同士の合波状態により得られる
直線偏光成分が回折格子の変位に伴って回転し、このと
きの偏光方位成分をハーフミラーと偏光板による違いだ
けで異なる位相差を有する複数信号を受光素子で得てい
る。
In addition, the two light fluxes thus combined by the polarization beam splitter are further converted to circularly polarized light of opposite directions by passing through a 1/4 wavelength plate, and the linearly polarized light component obtained by the combined state of the circularly polarized light beams. Rotates with the displacement of the diffraction grating, and the light receiving element obtains a plurality of signals having different phase difference in the polarization direction component at this time only by the difference between the half mirror and the polarizing plate.

即ち本発明によれば、異なる位相を有する複数信号をよ
り簡単な構成で得るために回折格子の変位に伴って回転
する直線偏光の合波回折光から偏光方位成分の選択を行
なうに際して、偏光ビームスプリッターと1/4波長板の
このような配置によって各光束の偏光状態を進行中に適
切に変換して、最終的に少ない部材で光量ロス無しに回
折格子の変位に伴って回転する直線偏光2回回折光を得
ており、これにより高精度に被検回転物体の回転情報を
求めることができる光学式エンコーダーを達成してい
る。
That is, according to the present invention, when the polarization azimuth component is selected from the combined diffracted light of linearly polarized light that rotates with the displacement of the diffraction grating in order to obtain a plurality of signals having different phases with a simpler configuration, the polarized beam By such arrangement of the splitter and the quarter-wave plate, the polarization state of each light beam is appropriately converted while it is traveling, and finally, the linearly polarized light 2 which rotates with the displacement of the diffraction grating with no loss of light quantity with a small number of members 2 By obtaining the diffracted light, an optical encoder that can obtain the rotation information of the rotating object under test with high accuracy is achieved.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例の概略図、第2図は本発明に
係る放射格子への入射光束と反射回折光のベクトル表示
の説明図、第3図は本発明の放射格子の中心と回転中心
との偏心を表わす説明図、第4図、第5図は各々本発明
の他の実施例の一部分の説明図、第6図は第1図の一部
分の説明図である。図中1は光源、2はコリメーターレ
ンズ、3は偏光ビームスプリッター、41,42,43は1/4波
長板、5,7,7′は反射鏡、61,62,62′はシリンドリカル
レンズ、8は放射格子、9は被検回転物体の回転軸、10
はビームスプリッター、11,11′は偏光板、12,12′は受
光素子、13,13′はコーナーキューブ反射鏡である。
FIG. 1 is a schematic view of an embodiment of the present invention, FIG. 2 is an explanatory view of vector display of incident light flux and reflected diffracted light on the radiation grating according to the invention, and FIG. 3 is a center of the radiation grating of the invention. 4 and 5 are partial explanatory views of another embodiment of the present invention, and FIG. 6 is a partial explanatory view of FIG. 1. In the figure, 1 is a light source, 2 is a collimator lens, 3 is a polarization beam splitter, 4 1 , 4 2 and 4 3 are quarter-wave plates, 5, 7 and 7'are reflecting mirrors, and 6 1 , 6 2 and 6 2 'cylindrical lens, the radiation grid 8, the rotation axis of the test rotation object 9, 10
Is a beam splitter, 11 and 11 'are polarizing plates, 12 and 12' are light receiving elements, and 13 and 13 'are corner cube reflecting mirrors.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】変位検出方向に沿って回折格子が形成され
たスケールと、可干渉性の直線偏光光束を生成する光源
と、前記光源からの光束の直線偏光方向に対して方位が
45゜を成し前記光源からの光束を2分割するための偏光
ビームスプリッターと、前記偏光ビームスプリッターで
分割生成された2つの光束を、それぞれ前記スケールの
回折格子上の2つの位置M1,M2に入射させ、前記位置M1
で発生する+m次の回折光を光路を略逆行させて再度前
記スケールの回折格子上の略前記位置M1に入射させて+
m次の2回回折光を発生させると共に、前記位置M2で発
生する−m次の回折光を光路を略逆行させて再度前記ス
ケールの回折格子の略前記位置M2に入射させて−m次の
2回回折光を発生させる光学系と、前記光学系内に前記
2つの光束それぞれに対応して設けられ且つ前記光学系
を進行する光束が往復で2回通過するように配置された
第1及び第2の1/4波長板と、前記光学系により発生し
た±m次の2回回折光同士を前記偏光ビームスプリッタ
ーで合成して得られた回折光が通過する位置に設けられ
た第3の1/4波長板と、該第3の1/4波長板を通過した前
記回折光から互いに異なる複数の偏光方位成分を選択し
てそれぞれ複数の受光素子で検出するように配置された
受光手段とを有することを特徴とする光学式エンコーダ
ー。
1. A scale on which a diffraction grating is formed along a displacement detection direction, a light source for generating a coherent linearly polarized light beam, and an azimuth with respect to the linearly polarized direction of the light beam from the light source.
A polarization beam splitter for dividing the light beam from the light source, which forms 45 °, into two and two light beams split and generated by the polarization beam splitter are respectively divided into two positions M 1 and M on the diffraction grating of the scale. 2 and the position M 1
The + m-th order diffracted light generated in step (3) is made to travel substantially backward in the optical path and is made incident on the position M 1 on the diffraction grating of the scale again.
The m-th order diffracted light is generated at the same time, and the -m-th order diffracted light generated at the position M 2 is made to substantially go backward in the optical path and is again incident on the position M 2 of the diffraction grating of the scale. An optical system for generating the next two-time diffracted light, and a first optical system provided in the optical system corresponding to each of the two light fluxes and arranged so that the light flux traveling through the optical system passes twice in a reciprocating manner. The first and second quarter-wave plates and the ± m-order two-times diffracted light generated by the optical system are combined by the polarization beam splitter, and the diffracted light is provided at a position where the diffracted light passes. 3 1/4 wavelength plate, and a plurality of light receiving elements arranged to select a plurality of different polarization azimuth components from the diffracted light that has passed through the third 1/4 wavelength plate and detect them with a plurality of light receiving elements. An optical encoder having means.
【請求項2】前記複数の受光素子は、前記第3の1/4波
長板を通過した回折光が分岐されて互いに偏光方位をず
らされた複数の偏光板をそれぞれ通過した位置に各々配
置されていることを特徴とする特許請求の範囲第1項記
載の光学式エンコーダー。
2. The plurality of light receiving elements are respectively arranged at positions where the diffracted light passing through the third quarter-wave plate is branched and passed through a plurality of polarizing plates whose polarization directions are shifted from each other. The optical encoder according to claim 1, wherein:
JP60054017A 1985-03-18 1985-03-18 Optical encoder Expired - Lifetime JPH07117426B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60054017A JPH07117426B2 (en) 1985-03-18 1985-03-18 Optical encoder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60054017A JPH07117426B2 (en) 1985-03-18 1985-03-18 Optical encoder

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP27298496A Division JP2650645B2 (en) 1996-09-24 1996-09-24 Optical device

Publications (2)

Publication Number Publication Date
JPS61212728A JPS61212728A (en) 1986-09-20
JPH07117426B2 true JPH07117426B2 (en) 1995-12-18

Family

ID=12958812

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60054017A Expired - Lifetime JPH07117426B2 (en) 1985-03-18 1985-03-18 Optical encoder

Country Status (1)

Country Link
JP (1) JPH07117426B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH073344B2 (en) * 1987-06-15 1995-01-18 キヤノン株式会社 Encoder
JP2586121B2 (en) * 1988-09-30 1997-02-26 キヤノン株式会社 Rotary encoder origin detection system
TW256914B (en) * 1994-05-27 1995-09-11 Ibm Servo-writing system for use in a data recording disk drive
US5442172A (en) * 1994-05-27 1995-08-15 International Business Machines Corporation Wavefront reconstruction optics for use in a disk drive position measurement system
CN104406545A (en) * 2014-12-01 2015-03-11 上海理工大学 Device for measuring and calculating rotating angle based on incremental rotary optical encoder

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5327958B2 (en) * 1971-09-01 1978-08-11

Also Published As

Publication number Publication date
JPS61212728A (en) 1986-09-20

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