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JPH07106255A - Vertical heat treatment equipment - Google Patents

Vertical heat treatment equipment

Info

Publication number
JPH07106255A
JPH07106255A JP34778493A JP34778493A JPH07106255A JP H07106255 A JPH07106255 A JP H07106255A JP 34778493 A JP34778493 A JP 34778493A JP 34778493 A JP34778493 A JP 34778493A JP H07106255 A JPH07106255 A JP H07106255A
Authority
JP
Japan
Prior art keywords
quartz
pipe
cover
gas
manifold
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP34778493A
Other languages
Japanese (ja)
Other versions
JP3173697B2 (en
Inventor
Kenichi Yamaga
健一 山賀
Yuichi Mikata
裕一 見方
Akito Yamamoto
明人 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Tokyo Electron Ltd
Tokyo Electron Tohoku Ltd
Original Assignee
Toshiba Corp
Tokyo Electron Ltd
Tokyo Electron Tohoku Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Electron Ltd, Tokyo Electron Tohoku Ltd filed Critical Toshiba Corp
Priority to JP34778493A priority Critical patent/JP3173697B2/en
Priority to US08/269,039 priority patent/US5484484A/en
Priority to TW83106053A priority patent/TW250577B/en
Priority to KR1019940015836A priority patent/KR100330130B1/en
Publication of JPH07106255A publication Critical patent/JPH07106255A/en
Priority to US08/485,506 priority patent/US5750436A/en
Application granted granted Critical
Publication of JP3173697B2 publication Critical patent/JP3173697B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To enable increasing the freedom of heat treatment by preventing the corrosion of a manifold. CONSTITUTION:A cover composed of quartz is installed so as to cover the inner peripheral surface of a metal manifold on the lower side of a reaction tube, and N2 gas is supplied for purging from a gas introducing tube 40 into a gap S between the cover and the manifold. The inner edge portions of gas supplying tubes 5, 7 and discharging tubes 6, 8 are constituted of quartz tubes 52, 62, 72, 82, and through holes are formed in the cover. Quartz boards 54, 64 74, 84 are engaged with the through holes and welded, and the quartz tubes 52, 62, 72, 82 are inserted into the holes of the quartz boards 54, 64, 74, 84. Cylindrical members having flanges are engaged with the parts between the quartz tubes 52, 62, 72, 82 and the quartz boards 54, 64, 74, 84.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、縦型熱処理装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vertical heat treatment apparatus.

【0002】[0002]

【従来の技術】半導体ウエハの製造工程における熱処理
工程の一つに減圧CVD( Chemical vapor deposition)
と呼ばれる工程がある。この減圧CVDは減圧状態下で
半導体ウエハ(以下「ウエハ」という)の表面に処理ガ
ス中の成膜成分を気相反応により形成する方法であり、
その装置としては大気の巻き込みが少ない縦型熱処理装
置が主流になりつつある。
2. Description of the Related Art Low pressure CVD (Chemical vapor deposition) is one of the heat treatment processes in the manufacturing process of semiconductor wafers.
There is a process called. This low pressure CVD is a method of forming film forming components in a processing gas on the surface of a semiconductor wafer (hereinafter referred to as “wafer”) by a gas phase reaction under a reduced pressure.
A vertical heat treatment apparatus, which is less involved in the atmosphere, is becoming the mainstream of the apparatus.

【0003】従来の縦型の減圧CVD装置は、図5に示
すように石英製の内管1a、及び外管1bよりなる二重
管構造の反応管1と、この反応管1を取り囲むように設
けられたヒータ11と、反応管1の下部側に設けられた
ステンレス製のマニホールド12とを有してなり、マニ
ホールド12の周囲には複数種類の処理ガスを導入でき
るように複数のガス導入管13(図では1本のみ図示し
てある)と排気管14とが接続されている。そしてCV
Dを行うにあたっては、ウエハボート15に多数枚のウ
エハWを積層してボートエレベータ16を上昇させてウ
エハWをロードし、反応管1内を所定の温度に加熱する
と共に所定の真空度に維持しながら処理ガスを反応管1
内に導入してCVDによりウエハWの表面に薄膜を形成
するようにしている。
As shown in FIG. 5, a conventional vertical low pressure CVD apparatus has a double-tube structure reaction tube 1 composed of a quartz inner tube 1a and an outer tube 1b, and a reaction tube 1 surrounding the reaction tube 1. A heater 11 provided and a stainless steel manifold 12 provided on the lower side of the reaction tube 1 are provided, and a plurality of gas introduction pipes are provided around the manifold 12 so that a plurality of kinds of processing gases can be introduced. 13 (only one is shown in the figure) and the exhaust pipe 14 are connected. And CV
In carrying out D, a large number of wafers W are stacked on the wafer boat 15 and the boat elevator 16 is raised to load the wafers W to heat the inside of the reaction tube 1 to a predetermined temperature and maintain a predetermined vacuum degree. While processing gas into reaction tube 1
A thin film is formed on the surface of the wafer W by introducing it into the inside by CVD.

【0004】[0004]

【発明が解決しようとする課題】ところで減圧CVDを
行う場合、複数種類の処理に対応できるようにステンレ
ス製のマニホールド12が用いられているため耐食性は
あるが、処理温度がかなり高くなると、腐食性が大きい
ガスを用いた場合には腐食が促進されてしまう。このた
め高温下においては、使用されるガスの種類が制限され
てしまうという問題があった。
By the way, in the case of performing low pressure CVD, since the manifold 12 made of stainless steel is used so as to be compatible with a plurality of types of processing, it has corrosion resistance, but if the processing temperature becomes considerably high, it will corrode. Corrosion is accelerated when a large gas is used. For this reason, there is a problem that the type of gas used is limited at high temperatures.

【0005】また本発明者は、酸化・拡散処理と減圧C
VDとを共通の炉で行うことのできる縦型熱処理装置を
検討しているが、酸化処理を行うにあたって、HCl
(塩化水素)を処理ガス中に混入させることがある。こ
のHClは不純物を外部に持ち去り、良質な膜を得られ
る利点があるが、H2 Oが存在すると極めて強い腐食性
を呈し、ステンレス製のマニホールド12の内周面が腐
食し、パーティクルや重金属の汚染源になってしまう。
なおマニホールドを石英により構成すれば腐食という問
題は解消できるが、製作が困難であって高価格になる
上、外部配管と吸排気ポートとの接合が困難である。
The present inventor has also found that the oxidation / diffusion treatment and the reduced pressure C
We are studying a vertical heat treatment apparatus that can perform VD in a common furnace.
(Hydrogen chloride) may be mixed in the process gas. This HCl has the advantage that impurities can be carried away to the outside and a good quality film can be obtained, but when H 2 O is present, it exhibits extremely strong corrosiveness and corrodes the inner peripheral surface of the stainless steel manifold 12, resulting in particles and heavy metals. Will become a source of pollution.
If the manifold is made of quartz, the problem of corrosion can be solved, but it is difficult to manufacture and the cost is high, and it is difficult to join the external pipe and the intake / exhaust port.

【0006】本発明は、このような事情のもとになされ
たものであり、その目的は、処理の自由度が大きい縦型
熱処理装置を提供することを目的とする。
The present invention has been made under such circumstances, and an object of the present invention is to provide a vertical heat treatment apparatus having a large degree of freedom in processing.

【0007】[0007]

【課題を解決するための手段】請求項1の発明は、縦型
の反応管の下部側に、ガス供給管及び排気管が接続され
た金属製のマニホールドが設けられ、多数の被処理体を
保持具に搭載してマニホールドの下端開口部より反応管
内に搬入する縦型熱処理装置において、前記マニホール
ドの内周面を覆うように設けられた耐熱材よりなるカバ
ーと、このカバーとマニホールドの内周面との間の間隙
に不活性ガスを導入するための不活性ガス導入手段とを
備えてなることを特徴とする。
According to a first aspect of the present invention, a metal manifold to which a gas supply pipe and an exhaust pipe are connected is provided on the lower side of a vertical reaction tube, and a large number of objects to be processed are provided. In a vertical heat treatment apparatus which is mounted on a holder and carried into a reaction tube through a lower end opening of a manifold, a cover made of a heat-resistant material is provided so as to cover an inner peripheral surface of the manifold, and an inner circumference of the cover and the manifold. It is characterized by comprising an inert gas introducing means for introducing an inert gas into the gap between the surfaces.

【0008】請求項2の発明は、請求項1の発明におい
て、カバーを石英により構成し、このカバーの側周面に
配管嵌合用穴を形成すると共に、配管嵌合用の穴の周囲
を平面とし、ガス供給管及び/または排気管の内端部分
を石英により構成して前記配管嵌合用の穴に嵌合させる
ことを特徴とする。
According to a second aspect of the present invention, in the first aspect of the present invention, the cover is made of quartz, and a pipe fitting hole is formed on a side peripheral surface of the cover, and the periphery of the pipe fitting hole is a flat surface. The inner end portion of the gas supply pipe and / or the exhaust pipe is made of quartz and fitted in the pipe fitting hole.

【0009】請求項3の発明は、請求項2の発明におい
て、鍔部を備えた石英よりなる筒状体を、当該鍔部が配
管嵌合用の穴の周囲の平面部の内面または外面に面接触
するように、配管嵌合用の穴に嵌合させると共に、前記
ガス供給管及び/または排気管の内端部分を前記筒状体
内に挿入したことを特徴とする。
According to a third aspect of the present invention, in the second aspect of the present invention, a cylindrical body made of quartz having a collar portion is provided on the inner surface or the outer surface of the flat portion around the pipe fitting hole. It is characterized in that it is fitted into a pipe fitting hole so as to be in contact, and the inner end portion of the gas supply pipe and / or the exhaust pipe is inserted into the tubular body.

【0010】請求項4の発明は、請求項2の発明におい
て、ガス供給管及び/または排気管の内端部分に石英よ
りなる鍔部を一体的に形成し、この鍔部が配管嵌合用の
穴の周囲の平面部の内面または外面に面接触するよう
に、前記内端部分を配管嵌合用の穴に挿入したことを特
徴とする。
According to a fourth aspect of the present invention, in the second aspect of the present invention, a flange portion made of quartz is integrally formed at an inner end portion of the gas supply pipe and / or the exhaust pipe, and the flange portion is used for pipe fitting. It is characterized in that the inner end portion is inserted into a hole for fitting a pipe so as to come into surface contact with an inner surface or an outer surface of a flat portion around the hole.

【0011】[0011]

【作用】請求項1の発明によれば、マニホールドの内周
面を覆うように耐熱材のカバーを設けてその間の間隙に
不活性ガスを供給しているため、この不活性ガスのパー
ジによりマニホールドの内周面が処理ガスと接触するこ
とが避けられ、マニホールドの腐食を防止することがで
きる。
According to the first aspect of the present invention, since the cover made of the heat-resistant material is provided so as to cover the inner peripheral surface of the manifold and the inert gas is supplied to the gap between them, the manifold is purged by the inert gas. It is possible to avoid contact of the inner peripheral surface with the processing gas and prevent corrosion of the manifold.

【0012】請求項2または請求項4の発明によれば、
石英よりなるカバーに貫通穴を形成し、その周囲を平面
としその平面にガス配管(ガス供給管及び排気管)の内
端側の石英管を嵌合させているので、ガス配管とカバー
との間隙を小さくすることができ、また製作が容易であ
る。そしてこの場合請求項3の発明のように筒状体の中
にガス配管を挿入し、筒状体の鍔部と平面部とを面接触
させれば石英管の径やカバーの貫通穴については、高い
位置精度が要求されない。
According to the invention of claim 2 or 4,
Since a through hole is formed in the cover made of quartz and the periphery is made a flat surface and the quartz pipe on the inner end side of the gas pipe (gas supply pipe and exhaust pipe) is fitted to the flat surface, the gas pipe and the cover are The gap can be made small and the manufacturing is easy. In this case, if the gas pipe is inserted into the cylindrical body and the flange portion and the flat surface portion of the cylindrical body are brought into surface contact with each other as in the invention of claim 3, the diameter of the quartz tube and the through hole of the cover can be determined. , High position accuracy is not required.

【0013】[0013]

【実施例】図1は本発明の実施例に係る縦型熱処理装置
を示す図、図2及び図3は、夫々図1の縦型熱処理装置
の要部を示す断面図及び分解斜視図である。反応管2
は、両端が開口すると共に鉛直方向に配設された耐熱材
料例えば石英からなる内管2aと、この内管2aを囲む
ように間隙を介して同心円状に配置された有底筒状の例
えば石英からなる外管2bとを備えた二重管構造として
構成されている。
1 is a view showing a vertical heat treatment apparatus according to an embodiment of the present invention, and FIGS. 2 and 3 are a sectional view and an exploded perspective view showing the main part of the vertical heat treatment apparatus of FIG. 1, respectively. . Reaction tube 2
Is an inner tube 2a made of a heat-resistant material such as quartz, which is open at both ends and is arranged in the vertical direction, and a cylindrical bottomed tube, for example, quartz, which is concentrically arranged so as to surround the inner tube 2a. It is configured as a double tube structure including an outer tube 2b made of.

【0014】前記反応管2の外側には、断熱体21の内
側に抵抗発熱線よりなるヒータ22を取り付けて構成し
た加熱炉23が反応管2を取囲むように配設されてい
る。前記反応管2は、ベースプレート30に固定された
マニホールド3に保持されており、このマニホールド3
は、例えばステンレスにより構成されている。このマニ
ホールド3の下端開口部には、例えばステンレスよりな
るキャップ部31が開閉自在に設けられており、閉じた
ときには図示しないOリングを介して開口部を気密封止
する。
On the outside of the reaction tube 2, a heating furnace 23, which is constructed by attaching a heater 22 made of a resistance heating wire to the inside of a heat insulator 21, is arranged so as to surround the reaction tube 2. The reaction tube 2 is held by a manifold 3 fixed to a base plate 30.
Is made of, for example, stainless steel. A cap portion 31 made of, for example, stainless steel is openably and closably provided in the lower end opening of the manifold 3, and when closed, the opening is hermetically sealed via an O-ring (not shown).

【0015】このキャップ部31は例えばボールネジに
より昇降されるボートエレベータ24上に配置されてお
り、キャップ部31の上には保温筒25を介して例えば
石英よりなるウエハボート26が載置されている。この
ウエハボート26は多数枚のウエハWを各々水平な状態
で上下に積層して保持するためのものである。ただし図
2の例では、ボートエレベータ24に回転軸27を備え
た回転機構28が取り付けられ、保温筒25は回転軸2
7により回転する回転台29上に載置されている。
The cap portion 31 is arranged on a boat elevator 24 which is raised and lowered by, for example, a ball screw, and a wafer boat 26 made of quartz, for example, is placed on the cap portion 31 via a heat retaining cylinder 25. . The wafer boat 26 is for holding and stacking a large number of wafers W in a horizontal state by vertically stacking them. However, in the example of FIG. 2, the boat elevator 24 is attached with the rotating mechanism 28 having the rotating shaft 27, and the heat insulating cylinder 25 is provided with the rotating shaft 2
It is mounted on a turntable 29 that rotates by 7.

【0016】前記マニホールド3の内側には、当該マニ
ホールド3の内周面を覆うように耐熱材例えば石英より
なるカバー4が設けられている。このカバー4は、上部
側の口径よりも下部側の口径が小さく作られており、そ
の途中の段差部がマニホールド3の内周面に形成された
環状突片32に当接すると共に、カバー4の上端外縁が
マニホールド3の上端内縁に係合している。
Inside the manifold 3, a cover 4 made of a heat resistant material such as quartz is provided so as to cover the inner peripheral surface of the manifold 3. The cover 4 is made smaller in diameter on the lower side than the diameter on the upper side. A step portion in the middle of the cover 4 abuts on an annular protrusion 32 formed on the inner peripheral surface of the manifold 3, and The outer edge of the upper end is engaged with the inner edge of the upper end of the manifold 3.

【0017】また前記キャップ部31の上面には、耐熱
材例えば石英よりなるリング部材33がキャップ部31
に対して同心円状に埋設されており、このリング部材3
3の外縁部及び内縁部は上方側に屈曲起立された起立片
34、35(図2参照)をなしている。そして前記カバ
ー4の下端部は、リング部材33の外縁側の起立片34
と一定の間隔(0.05〜0.7cm)を保った状態で
保持されている。また前記保温筒25の底部には環状に
脚部25aが形成されており、保温筒25は、この脚部
25aがリング部材33の内縁側の起立片35の外側と
一定の間隔(0.05〜0.7cm)を保った状態で保
持されている。
A ring member 33 made of a heat resistant material such as quartz is provided on the upper surface of the cap portion 31.
Is concentrically embedded with respect to the ring member 3
The outer edge portion and the inner edge portion of 3 are raised pieces 34 and 35 (see FIG. 2) which are bent and raised upward. The lower end of the cover 4 has a standing piece 34 on the outer edge side of the ring member 33.
And is held in a state of maintaining a constant interval (0.05 to 0.7 cm). Further, a leg portion 25a is formed in an annular shape at the bottom of the heat insulating cylinder 25, and the heat insulating cylinder 25 has a leg portion 25a at a constant distance (0.05) from the outer side of the standing piece 35 on the inner edge side of the ring member 33. (-0.7 cm) is maintained.

【0018】前期マニホールド3の側面には、内管2a
の内側の領域に処理ガスを供給するための第1のガス供
給管5と、前記内管2a及び外管2bの間の間隙から処
理ガスを排気するための第1の排気管6とが接続されて
いる。これらガス供給管5及び排気管6は減圧CVDの
ために用いられる配管系であり、ガス供給管5及び排気
管6の外端側には夫々図示しないガス供給源及び真空ポ
ンプが接続されている。
An inner pipe 2a is provided on the side surface of the manifold 3 in the previous term.
A first gas supply pipe 5 for supplying the processing gas to the inner region of the chamber is connected to a first exhaust pipe 6 for exhausting the processing gas from the gap between the inner pipe 2a and the outer pipe 2b. Has been done. The gas supply pipe 5 and the exhaust pipe 6 are piping systems used for low pressure CVD, and a gas supply source and a vacuum pump (not shown) are connected to the outer ends of the gas supply pipe 5 and the exhaust pipe 6, respectively. .

【0019】更に前記マニホールド3の側面には、減圧
CVDのための配管系とは別に、前記内管2a及び外管
2bの間の間隙に処理ガスを供給するための第2のガス
供給管7と、内管2aの内側の領域から処理ガスを排気
するための第2の排気管7とが接続されている。これら
第2のガス供給管7及び排気管8には酸化処理のために
用いられる配管系であって、ガス供給管7及び排気管8
の外端側には夫々図示しないガス供給管及び排気ポンプ
が接続されている。
In addition to the piping system for low pressure CVD, a second gas supply pipe 7 for supplying a processing gas to the gap between the inner pipe 2a and the outer pipe 2b is provided on the side surface of the manifold 3. And a second exhaust pipe 7 for exhausting the processing gas from the area inside the inner pipe 2a. The second gas supply pipe 7 and the exhaust pipe 8 are piping systems used for the oxidation treatment, and are the gas supply pipe 7 and the exhaust pipe 8.
A gas supply pipe and an exhaust pump (not shown) are connected to the outer end sides of the respective.

【0020】ここでこれら配管系と前記カバー4との接
続構造について図2及び図3を参照しながら述べる。例
えば第1のガス供給管5において、吸気ポート51から
マニホールド3内に亘る内端部分は、石英管52により
構成されると共にこの石英管52の内端は上方側に屈曲
しており、吸気ポート51から外側はステンレス管53
により構成されている。
Here, the connection structure between these piping systems and the cover 4 will be described with reference to FIGS. For example, in the first gas supply pipe 5, an inner end portion extending from the intake port 51 to the inside of the manifold 3 is configured by a quartz pipe 52, and the inner end of the quartz pipe 52 is bent upward, 51 to the outside is a stainless tube 53
It is composed by.

【0021】一方前記カバー4の側周面には第1のガス
供給管5に対応する円形の貫通穴41(図3参照)が形
成されており、この貫通穴41内には、当該貫通穴41
に適合する形状であってかつ貫通穴41を塞ぐことので
きる十分な厚さをもった平面を形成する石英板(この例
では図3からもわかるようにリング状に構成されてい
る)54が嵌合されかつ溶着されている。石英板54に
は、配管嵌合用の穴55(図3参照)が形成されてお
り、内端側に鍔部56が形成されかつ内径が石英管52
の管径に適合する石英よりなる筒状体57が当該石英板
の穴55内に嵌合されると共に、鍔部56の内面が石英
板54の内面に面接触している。穴55は筒状体57の
外径より4mm程度大きくなっており、マンホールド3
とカバー4の軸ズレを吸収できる構造になっている。更
に前記筒状体57の中に石英管52が挿入されており、
こうしてこの例では、石英管52を筒状体57を介し
て、石英板54の配管嵌合用の穴55に嵌合している。
On the other hand, a circular through hole 41 (see FIG. 3) corresponding to the first gas supply pipe 5 is formed on the side peripheral surface of the cover 4, and the through hole 41 has the through hole 41 therein. 41
A quartz plate (which is formed in a ring shape in this example, as can be seen from FIG. 3) having a shape conforming to the above and forming a flat surface having a sufficient thickness capable of closing the through hole 41. Fitted and welded. The quartz plate 54 is formed with a hole 55 (see FIG. 3) for fitting a pipe, a flange portion 56 is formed on the inner end side, and the inner diameter of the quartz tube 52 is 52.
A cylindrical body 57 made of quartz that fits the tube diameter is fitted in the hole 55 of the quartz plate, and the inner surface of the flange 56 is in surface contact with the inner surface of the quartz plate 54. The hole 55 is about 4 mm larger than the outer diameter of the tubular body 57, and
The structure is such that the axial deviation of the cover 4 can be absorbed. Further, a quartz tube 52 is inserted in the cylindrical body 57,
Thus, in this example, the quartz tube 52 is fitted into the pipe fitting hole 55 of the quartz plate 54 via the tubular body 57.

【0022】そして第2のガス供給管7及び排気管8に
ついても同様にしてカバー4に接続されているが、この
例では第1の排気管6については筒状体を用いない点で
他の配管の接続構造と異なっている。即ち第1の排気管
6における石英管の内端部の管壁が外側から削り取られ
て縮径されており、その縮径部分6aが石英板64の貫
通穴65に嵌合すると共に管壁の段差部分6bが石英板
64の内周面に当接している。
The second gas supply pipe 7 and the exhaust pipe 8 are also connected to the cover 4 in the same manner. However, in this example, the first exhaust pipe 6 does not use a cylindrical body. It is different from the pipe connection structure. That is, the tube wall of the inner end portion of the quartz pipe in the first exhaust pipe 6 is cut off from the outside to reduce the diameter, and the reduced diameter portion 6a fits into the through hole 65 of the quartz plate 64 and the pipe wall The step portion 6b is in contact with the inner peripheral surface of the quartz plate 64.

【0023】なお図2、図3中42〜44は貫通穴、6
1、81は排気ポート、71は吸気ポート、62、7
2、82は石英管、63、73、83はステンレス管、
64、74、84はカバー4に溶着された石英板、6
5、75、85は配管嵌合用の穴、76、86は鍔部、
77、87は石英よりなる筒状体である。
In FIGS. 2 and 3, 42 to 44 are through holes, 6
1, 81 are exhaust ports, 71 are intake ports, 62, 7
2, 82 are quartz tubes, 63, 73, 83 are stainless steel tubes,
64, 74, 84 are quartz plates welded to the cover 4, 6
5, 75 and 85 are holes for fitting pipes, 76 and 86 are flanges,
77 and 87 are cylindrical bodies made of quartz.

【0024】そして前記マニホールド3の上部側及び下
部側には、マニホールド3の内周面とカバー4との間の
間隙Sに不活性ガス例えばN2 ガスを導入して処理ガス
の侵入を阻止するための不活性ガス導入手段例えばガス
供給管40a、40bが夫々接続されている。
On the upper side and the lower side of the manifold 3, an inert gas such as N 2 gas is introduced into the gap S between the inner peripheral surface of the manifold 3 and the cover 4 to prevent the processing gas from entering. Inert gas introducing means for this purpose, for example, gas supply pipes 40a and 40b are respectively connected.

【0025】またキャップ部31には、キャップ部31
と保温筒25との間の間隙にN2 ガスを導入するための
ガス供給管40cが接続されている。
The cap portion 31 has a cap portion 31.
A gas supply pipe 40c for introducing N 2 gas is connected to a gap between the heat insulation cylinder 25 and the heat insulation cylinder 25.

【0026】次に上述実施例の作用について説明する。
先ずヒータ22により反応管2内を例えば780℃の均
熱状態に加熱し、被処理体であるウエハWを例えば50
枚棚状にウエハボート35に保持して、ボートエレベー
タ33により反応管2内にロードする。次いで図示しな
い真空ポンプにより第1の排気管6を介して反応管2内
を例えば10-3Torrのオーダの減圧状態まで真空排
気した後、第1のガス供給管5を通じて、処理ガス例え
ばアンモニア(NH3 )ガスとジクロルシラン(SiH
2 Cl2 )ガスとを夫々例えば毎分0.03リットル及
び0.03リットルの流量で流した混合ガスを内管2a
の内側の領域に供給する。
Next, the operation of the above embodiment will be described.
First, the inside of the reaction tube 2 is heated by the heater 22 to, for example, a uniform temperature of 780 ° C., and the wafer W to be processed is heated to, for example, 50
The wafer boat 35 is held in a shelf shape and loaded into the reaction tube 2 by the boat elevator 33. Then, the inside of the reaction tube 2 is evacuated by a vacuum pump (not shown) through the first exhaust pipe 6 to a depressurized state of the order of, for example, 10 −3 Torr, and then the processing gas such as ammonia ( NH 3 ) gas and dichlorosilane (SiH
2 Cl 2 ) gas at a flow rate of 0.03 liters per minute and 0.03 liters per minute, respectively, and a mixed gas is supplied to the inner pipe 2a.
Supply to the area inside.

【0027】そして反応管2内を例えば1Torrの減
圧状態に維持するように圧力制御しながら前記内管2a
及び外管2b間の間隙から排気管6を通じて排気し、ウ
エハWの表面にSi3 4 膜が形成される。このときガ
ス供給管40a〜40cによりカバー4とマニホールド
3との間隙S、及びキャップ部31と保温筒25との間
隙内にN2 ガスを供給して、処理ガスが間隙内に侵入す
るのを防止している。この実施例ではカバー4はマニホ
ールド3内に載置されており、保温筒25はキャップ部
31上に載置されているだけであるからこれらの間に隙
間があり、N2ガス(窒素ガス)の一部はその隙間から
カバー4よりも炉の内方側に流れ出すと共に、他の一部
は排気管6における排気ポート61と石英管62との隙
間からステンレス管63内に吸い込まれる。
The inner tube 2a is controlled while controlling the pressure so that the pressure inside the reaction tube 2 is maintained at a reduced pressure of, for example, 1 Torr.
The gas is exhausted from the gap between the outer tube 2b and the outer tube 2b through the exhaust tube 6, and a Si 3 N 4 film is formed on the surface of the wafer W. At this time, N 2 gas is supplied into the gap S between the cover 4 and the manifold 3 and the gap between the cap portion 31 and the heat insulating cylinder 25 by the gas supply pipes 40a to 40c to prevent the processing gas from entering the gap. To prevent. In this embodiment, the cover 4 is placed in the manifold 3, and the heat retaining cylinder 25 is only placed on the cap portion 31. Therefore, there is a gap between them and the N 2 gas (nitrogen gas) is present. Part of the gas flows out of the cover 4 toward the inner side of the furnace than the cover 4, and the other part of the gas is sucked into the stainless steel pipe 63 through the space between the exhaust port 61 and the quartz pipe 62 in the exhaust pipe 6.

【0028】しかる後反応管2内の雰囲気を例えばN2
ガスにより置換すると共に例えば50℃/minの昇温
スピードで反応管2内の温度を約1000℃付近まで昇
温する。N2 ガスによる置換は、例えば第1のガス供給
管4と同様にマニホールド3に設けられた図示しないガ
ス供給管からN2 ガスを内管2aの内側に供給しながら
第1の排気管6により真空排気を行うことによって行わ
れる。
Thereafter, the atmosphere in the reaction tube 2 is changed to N 2 for example.
The gas in the reaction tube 2 is replaced with a gas, and the temperature in the reaction tube 2 is raised to about 1000 ° C. at a heating rate of 50 ° C./min. The replacement with N 2 gas is performed by the first exhaust pipe 6 while supplying N 2 gas to the inside of the inner pipe 2a from a gas supply pipe (not shown) provided in the manifold 3 like the first gas supply pipe 4, for example. It is performed by evacuating.

【0029】そして真空排気を停止した後、第2のガス
供給管6により内管2aと外管2bとの間に例えばH2
OとHClとを夫々流量毎分10リットル及び1リット
ルで流した混合ガスを供給すると共に内管2aの内側か
ら第2の排気管8を通じて排気し、反応管2内を常圧状
態にする。こうしてSi3 4 膜の表面が酸化されてS
iO2 膜が形成される。この酸化処理中においてもガス
供給管40よりN2 ガスを前記間隙Sにパージする。
After the evacuation is stopped, the second gas supply pipe 6 is used to connect, for example, H 2 between the inner pipe 2a and the outer pipe 2b.
A mixed gas in which O and HCl were caused to flow at a rate of 10 liters per minute and a rate of 1 liter per minute, respectively, was supplied, and the inside of the inner tube 2a was exhausted through the second exhaust tube 8 to bring the inside of the reaction tube 2 to a normal pressure state. In this way, the surface of the Si 3 N 4 film is oxidized and S
An iO 2 film is formed. Even during this oxidation process, N 2 gas is purged into the gap S from the gas supply pipe 40.

【0030】上述実施例によればマニホールドの内周面
を石英よりなるカバー4で覆い、カバー4とマニホール
ド3との間の間隙SにN2 ガスを供給してパージしてい
るため、このN2 ガスによりマニホールド3と処理ガス
雰囲気とが遮断され、高温下で腐食性の強いガスを使用
してもマニホールド3の腐食が防止される。従って例え
ばHClガスを含む酸化処理用のガスを用いて1000
℃以上もの高温で酸化処理を行ってもマニホールド3の
腐食が進行しないので、CVDと酸化処理とを共用でき
る装置として使用できる。
According to the above-described embodiment, the inner peripheral surface of the manifold is covered with the cover 4 made of quartz, and N 2 gas is supplied to the gap S between the cover 4 and the manifold 3 for purging. The manifold 3 and the processing gas atmosphere are shut off by the two gases, and the manifold 3 is prevented from being corroded even if a highly corrosive gas is used at a high temperature. Therefore, for example, by using an oxidizing gas containing HCl gas,
Corrosion of the manifold 3 does not proceed even if the oxidation treatment is performed at a temperature as high as 0 ° C. or more, so that it can be used as an apparatus that can be used for both CVD and oxidation treatment.

【0031】そしてカバー4の側周面に貫通穴41〜4
4を形成して、この中に石英板54、64、74、84
を嵌合し、上述のようなガス配管(5〜8)の接続構造
を採用すれば、ガス配管(5〜8)とカバー4との間の
隙間を極力小さくできると共に、貫通穴41〜44の位
置精度が低くてよいので製作が容易である。即ち石英管
52、62、72、82をカバー4に一体化する場合に
は、マニホールド3の吸気ポートや排気ポートの各々の
高さ位置及び周方向位置が異なるので、これらに対応し
て石英管52、62、72、82を取り付けることは極
めて困難であるが、上述のように例えば筒状体57を用
いてこの中に石英管52を若干の余裕をもって挿入すれ
ば鍔部56と石英板74との擦り合わせにより吸気ポー
トまたは排気ポートと貫通穴との位置ずれ分が吸収され
ると共に鍔部56と石英板74とが面接触するので隙間
を小さくできる。
Then, through holes 41 to 4 are formed in the side peripheral surface of the cover 4.
4 into the quartz plates 54, 64, 74, 84.
And the gas pipe (5-8) connection structure described above is adopted, the gap between the gas pipe (5-8) and the cover 4 can be minimized and the through holes 41-44 can be formed. It is easy to manufacture because it requires only a low position accuracy. That is, when the quartz tubes 52, 62, 72, and 82 are integrated with the cover 4, since the height position and the circumferential position of each of the intake port and the exhaust port of the manifold 3 are different, the quartz tubes are correspondingly provided. It is extremely difficult to attach 52, 62, 72, and 82, but if the quartz tube 52 is inserted into this with a slight margin as described above, for example, by using the tubular body 57, the collar portion 56 and the quartz plate 74 are provided. The gap between the intake port or the exhaust port and the through hole is absorbed by the rubbing against each other and the flange portion 56 and the quartz plate 74 are in surface contact with each other, so that the gap can be reduced.

【0032】また第1の排気管6の場合のように石英管
62の内端に段差部6bを形成して石英板64内に若干
の余裕をもって挿入した場合にも段差部6bと石英板6
4との擦り合わせにより同様に位置ずれ分が吸収でき
る。この場合各石英管52、62、72、82を吸気ポ
ート(あるいは排気ポート)の径よりも若干小さくして
おくことにより、上述の位置ずれ分を十分吸収すること
ができる。そしてまたキャップ部31についても、石英
のリング部材33により保温筒25とカバー4との間を
覆っているため処理ガスによる腐食が抑えられる。
Further, when the step portion 6b is formed at the inner end of the quartz tube 62 and is inserted into the quartz plate 64 with a slight margin as in the case of the first exhaust pipe 6, the step portion 6b and the quartz plate 6 are also provided.
The amount of misalignment can be similarly absorbed by rubbing with No. 4. In this case, the quartz pipes 52, 62, 72, 82 are made slightly smaller than the diameter of the intake port (or the exhaust port), whereby the above-mentioned misalignment can be sufficiently absorbed. Further, also in the cap portion 31, since the space between the heat insulating cylinder 25 and the cover 4 is covered with the quartz ring member 33, corrosion due to the processing gas is suppressed.

【0033】更に成膜処理及び酸化処理を共通の反応管
2を用いて行っているため、従来のように別々の装置で
処理した場合に比べ、スループットが格段に向上すると
共に装置の占有スペースを狭くすることができ、更にウ
エハWの移載に伴うウエハWの破損のおそれもないし、
またSi3 4 膜を形成した後ウエハWを反応管2から
搬出することなく続けてSiO2 膜を形成しているた
め、これらの薄膜の間に不要な酸化膜が形成されること
もないし、水分などの不純物が混入することもない。
Further, since the film forming process and the oxidization process are carried out by using the common reaction tube 2, the throughput is remarkably improved and the space occupied by the device is increased as compared with the case where the conventional process is carried out by separate devices. It can be made narrower, and there is no risk of the wafer W being damaged when the wafer W is transferred.
Further, since the SiO 2 film is continuously formed without carrying out the wafer W from the reaction tube 2 after forming the Si 3 N 4 film, an unnecessary oxide film is not formed between these thin films. Also, impurities such as water will not be mixed.

【0034】以上においてガス配管(5〜8)とカバー
4との接続構造は上述実施例以外の構造であってもよ
く、例えば図4に示すようにガス供給管9における石英
よりなる内端部分に石英よりなる鍔部91を一体的に形
成する一方、マニホールド4の配管嵌合用の穴45の周
囲を平面部46とし、前記鍔部91が前記平面部46の
内面または外面に面接触するように、前記内端部分を穴
45に挿入する構造としてもよい。なおこのような構造
は、排気管をマニホールドに取り付ける場合に適用して
もよい。カバー4の材質としては石英に限られるもので
はなく、またカバー4とマニホールド3との間の間隙S
に供給する不活性ガスとしてはN2 ガス以外のガスであ
ってもよい。
In the above, the connection structure between the gas pipes (5 to 8) and the cover 4 may be a structure other than that of the above-mentioned embodiment. For example, as shown in FIG. 4, the inner end portion made of quartz in the gas supply pipe 9 is used. The flange portion 91 made of quartz is integrally formed on the inner surface of the manifold 4, and the periphery of the pipe fitting hole 45 of the manifold 4 is formed as a flat surface portion 46 so that the flange portion 91 is in surface contact with the inner surface or the outer surface of the flat surface portion 46. In addition, the inner end portion may be inserted into the hole 45. Such a structure may be applied when the exhaust pipe is attached to the manifold. The material of the cover 4 is not limited to quartz, and the gap S between the cover 4 and the manifold 3 is not limited to quartz.
The inert gas to be supplied to the gas may be a gas other than N 2 gas.

【0035】更に本発明は、上述のように酸化・拡散炉
とCVD炉とを合体した構成とする代りに、CVD炉専
用の構造であってもよい。
Further, the present invention may have a structure dedicated to a CVD furnace, instead of the combination of the oxidation / diffusion furnace and the CVD furnace as described above.

【0036】[0036]

【発明の効果】請求項1の発明によれば、マニホールド
の内周面を覆うように耐熱材のカバーを設けてその間の
間隙に不活性ガスを供給しているためマニホールドの腐
食を防止することができ、処理ガスの種類や処理温度の
制限を緩和することができる。
According to the first aspect of the present invention, since a cover made of a heat-resistant material is provided so as to cover the inner peripheral surface of the manifold and an inert gas is supplied to the gap between them, corrosion of the manifold is prevented. It is possible to relax the restrictions on the type of processing gas and the processing temperature.

【0037】請求項2及び請求項4の発明によれば、石
英よりなるカバーに配管嵌合用穴を形成し、その周囲に
平面を形成してその平面部にガス配管(ガス供給管及び
排気管)の内端側の石英管を嵌合させているので、ガス
配管とカバーとの間隙を小さくすることができ、また製
作が容易である。そしてこの場合請求項3の発明のよう
に筒状体の中にガス配管を挿入し、筒状体の鍔部と石英
板とを面接触させれば石英管の径やカバーの配管嵌合用
穴の位置精度がそれ程高くなくてよいので製作が容易で
ある。
According to the second and fourth aspects of the present invention, a pipe fitting hole is formed in the cover made of quartz, a flat surface is formed around the hole, and a gas pipe (gas supply pipe and exhaust pipe) is formed in the flat portion. Since the quartz tube on the inner end side of () is fitted, the gap between the gas pipe and the cover can be made small, and the production is easy. In this case, if the gas pipe is inserted into the cylindrical body and the flange portion of the cylindrical body and the quartz plate are brought into surface contact with each other as in the invention of claim 3, the diameter of the quartz pipe and the pipe fitting hole of the cover. It is easy to manufacture because it does not need to be so precise.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.

【図2】本発明の実施例の要部を示す断面図である。FIG. 2 is a sectional view showing a main part of an embodiment of the present invention.

【図3】本発明の実施例の要部を示す分解斜視図であ
る。
FIG. 3 is an exploded perspective view showing a main part of the embodiment of the present invention.

【図4】本発明の他の実施例の一部を示す分解斜視図で
ある。
FIG. 4 is an exploded perspective view showing a part of another embodiment of the present invention.

【図5】従来の縦型熱処理装置を示す断面図である。FIG. 5 is a sectional view showing a conventional vertical heat treatment apparatus.

【符号の説明】[Explanation of symbols]

2 反応管 26 ウエハボート 3 マニホールド 31 キャップ部 4 カバー 5、7 ガス供給管 6、8 排気管 51、61、71、81 石英管 54、64、74、84 石英板 57、67、87 鍔部 40 ガス(N2 ガス)導入管 S 間隙2 Reaction Tube 26 Wafer Boat 3 Manifold 31 Cap Part 4 Cover 5, 7 Gas Supply Pipe 6, 8 Exhaust Pipe 51, 61, 71, 81 Quartz Pipe 54, 64, 74, 84 Quartz Plate 57, 67, 87 Collar 40 Gas (N 2 gas) inlet pipe S gap

───────────────────────────────────────────────────── フロントページの続き (72)発明者 山賀 健一 神奈川県津久井郡城山町町屋1丁目2番41 号 東京エレクトロン東北株式会社相模事 業所内 (72)発明者 見方 裕一 神奈川県川崎市幸区小向東芝町1 株式会 社東芝研究開発センター内 (72)発明者 山本 明人 神奈川県川崎市幸区小向東芝町1 株式会 社東芝研究開発センター内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Kenichi Yamaga 1-24-1 Machiya, Shiroyama-cho, Tsukui-gun, Kanagawa Prefecture Inside the Sagami Business Office, Tokyo Electron Tohoku Co., Ltd. Muko Toshiba-cho 1 Co., Ltd. Toshiba R & D Center (72) Inventor Akito Yamamoto 1 Komukai-Toshiba-cho 1, Kawasaki-shi, Kanagawa 1 Toshiba Corporation R & D Center

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 縦型の反応管の下部側に、ガス供給管及
び排気管が接続された金属製のマニホールドが設けら
れ、多数の被処理体を保持具に搭載してマニホールドの
下端開口部より反応管内に搬入する縦型熱処理装置にお
いて、 前記マニホールドの内周面を覆うように設けられた耐熱
材よりなるカバーと、 このカバーとマニホールドの内周面との間の間隙に不活
性ガスを導入するための不活性ガス導入手段と、 を備えてなることを特徴とする縦型熱処理装置。
1. A metal-made manifold, to which a gas supply pipe and an exhaust pipe are connected, is provided on the lower side of a vertical reaction tube, and a large number of objects to be processed are mounted on a holder to open the lower end of the manifold. In a vertical heat treatment apparatus for further loading into a reaction tube, a cover made of a heat-resistant material provided so as to cover the inner peripheral surface of the manifold, and an inert gas in a gap between the cover and the inner peripheral surface of the manifold. A vertical heat treatment apparatus comprising: an inert gas introduction unit for introducing the gas.
【請求項2】 カバーを石英により構成し、このカバー
の側周面に配管嵌合用穴を形成すると共に、配管嵌合用
の穴の周囲を平面部とし、ガス供給管及び/または排気
管の内端部分を石英により構成して前記配管嵌合用の穴
に嵌合させることを特徴とする請求項1記載の縦型熱処
理装置。
2. The cover is made of quartz, and a pipe fitting hole is formed on a side peripheral surface of the cover, and a periphery of the pipe fitting hole is a flat portion, and the inside of the gas supply pipe and / or the exhaust pipe is 2. The vertical heat treatment apparatus according to claim 1, wherein the end portion is made of quartz and is fitted in the pipe fitting hole.
【請求項3】 鍔部を備えた石英よりなる筒状体を、当
該鍔部が配管嵌合用の穴の周囲の平面部の内面または外
面に面接触するように、配管嵌合用の穴に嵌合させると
共に、前記ガス供給管及び/または排気管の内端部分を
前記筒状体内に挿入したことを特徴とする請求項2記載
の縦型熱処理装置。
3. A tubular body made of quartz having a flange is fitted into a pipe fitting hole so that the flange comes into surface contact with an inner surface or an outer surface of a flat portion around the hole for fitting the pipe. The vertical heat treatment apparatus according to claim 2, wherein the inner end portions of the gas supply pipe and / or the exhaust pipe are inserted into the cylindrical body while being combined.
【請求項4】 ガス供給管及び/または排気管の内端部
分に石英よりなる鍔部を一体的に形成し、この鍔部が配
管嵌合用の穴の周囲の平面部の内面または外面に面接触
するように、前記内端部分を配管嵌合用の穴に挿入した
ことを特徴とする請求項2記載の縦型熱処理装置。
4. A flange part made of quartz is integrally formed on an inner end portion of the gas supply pipe and / or the exhaust pipe, and the flange part is formed on an inner surface or an outer surface of a flat surface portion around a pipe fitting hole. The vertical heat treatment apparatus according to claim 2, wherein the inner end portion is inserted into a pipe fitting hole so as to be in contact with each other.
JP34778493A 1993-07-03 1993-12-24 Vertical heat treatment equipment Expired - Fee Related JP3173697B2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP34778493A JP3173697B2 (en) 1993-07-08 1993-12-24 Vertical heat treatment equipment
US08/269,039 US5484484A (en) 1993-07-03 1994-06-30 Thermal processing method and apparatus therefor
TW83106053A TW250577B (en) 1993-07-03 1994-07-02 A heat treatment process and its device
KR1019940015836A KR100330130B1 (en) 1993-07-03 1994-07-02 Heat treatment method and device
US08/485,506 US5750436A (en) 1993-07-03 1995-06-07 Thermal processing method and apparatus therefor

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP5-194256 1993-07-08
JP19425693 1993-07-08
JP34778493A JP3173697B2 (en) 1993-07-08 1993-12-24 Vertical heat treatment equipment

Publications (2)

Publication Number Publication Date
JPH07106255A true JPH07106255A (en) 1995-04-21
JP3173697B2 JP3173697B2 (en) 2001-06-04

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US6187102B1 (en) 1998-11-26 2001-02-13 Tokyo Electron Limited Thermal treatment apparatus
JP2002299334A (en) * 2001-03-29 2002-10-11 Tokyo Electron Ltd Vertical heat treatment equipment
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6187102B1 (en) 1998-11-26 2001-02-13 Tokyo Electron Limited Thermal treatment apparatus
JP2002299334A (en) * 2001-03-29 2002-10-11 Tokyo Electron Ltd Vertical heat treatment equipment
KR100966519B1 (en) * 2002-03-15 2010-06-29 에이에스엠 인터내셔널 엔.브이. Process tube support sleeve with multiple circumferential channels
JP2006290718A (en) * 2005-03-17 2006-10-26 Dainippon Printing Co Ltd Hydrogen production apparatus and production method thereof
JP2006347844A (en) * 2005-06-20 2006-12-28 Dainippon Printing Co Ltd Hydrogen production equipment
KR101347721B1 (en) * 2012-04-18 2014-01-03 (주)제니스월드 Collector manufacturing apparatus
JP2019145822A (en) * 2019-04-11 2019-08-29 光洋サーモシステム株式会社 Heat treatment equipment
CN110977355A (en) * 2019-12-21 2020-04-10 张忠恕 A chemical vapor deposition CVD outer tube and its processing technology
WO2024042621A1 (en) * 2022-08-23 2024-02-29 株式会社Kokusai Electric Substrate processing device, semiconductor device production method, and program

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