JPH07104136B2 - Terminal tilt detection method - Google Patents
Terminal tilt detection methodInfo
- Publication number
- JPH07104136B2 JPH07104136B2 JP2077920A JP7792090A JPH07104136B2 JP H07104136 B2 JPH07104136 B2 JP H07104136B2 JP 2077920 A JP2077920 A JP 2077920A JP 7792090 A JP7792090 A JP 7792090A JP H07104136 B2 JPH07104136 B2 JP H07104136B2
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- image
- inspected
- terminals
- distance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 title description 6
- 238000000034 method Methods 0.000 claims description 26
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 12
- 230000002950 deficient Effects 0.000 description 6
- 238000005452 bending Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 238000007689 inspection Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はリレー等の電子部品の端子の傾きを検出する方
法に関するものである。TECHNICAL FIELD The present invention relates to a method for detecting a tilt of a terminal of an electronic component such as a relay.
従来、特開昭63−293403号公報のように、チップ部品の
端子(フリップチップの端子バンプ)を撮像し、重心位
置を求めることにより、チップ部品の位置ずれ及び傾き
を認識し、高精度なチップ部品の実装をする方法があっ
たが端子自体の傾きを検出するようなものではなかっ
た。Conventionally, as in Japanese Patent Laid-Open No. 63-293403, by imaging the terminals of chip parts (terminal bumps of flip chips) and determining the position of the center of gravity, the misalignment and tilt of the chip parts are recognized and highly accurate. There was a method of mounting a chip component, but it was not a method of detecting the inclination of the terminal itself.
また、端子に垂直な平行光を照射しカメラで撮像して各
端子のセンターを検出し、センター間の距離によって傾
きを検出する方法も提案されているが、端子の左右の方
向の傾きしか検出できず、端子が格子状に配置された場
合に対応できない等の問題がある。A method has also been proposed in which parallel light is emitted perpendicularly to the terminals, the image is taken by a camera to detect the center of each terminal, and the tilt is detected by the distance between the centers, but only the tilt in the left and right directions of the terminal is detected. This is not possible, and there is a problem that it is not possible to cope with the case where the terminals are arranged in a grid pattern.
端子の曲りを検査するものとしては特開昭54−150089号
公報が提案されている。この提案はICの端子の曲がりを
検査する装置、詳しくはDIP型プラスチックモールドIC
の外部端子の先端がプリント板等への自動挿入が可能な
範囲の曲がり以内に入っているか否かを検査する装置に
関するものである。この装置によるICの端子の曲がりの
検査は、ICを保持し半透明ガラス板に端子の先端を軽く
押し当て、半透明ガラス板を透して端子の先端像を走査
撮像して各端子の先端位置を抽出し、これを基準の端子
位置情報と比較演算して合否を判定するものである。Japanese Patent Application Laid-Open No. 54-150089 has been proposed as a method for inspecting the bending of terminals. This proposal is a device to inspect the bending of IC terminals, more specifically DIP type plastic mold IC
The present invention relates to a device for inspecting whether or not the tip of the external terminal is within a bend in a range where it can be automatically inserted into a printed board or the like. The inspection of the bending of the terminal of the IC by this device is to hold the IC and lightly press the tip of the terminal against the semitransparent glass plate, scan the image of the tip of the terminal through the semitransparent glass plate and take the tip of each terminal. The position is extracted, and the result is compared with the reference terminal position information to make a pass / fail judgment.
しかしながら、この従来例においては端子の先端を半透
明ガラス板に接触させることにより曲がりを検査するも
のであるから、細い端子を有する被検査部品では端子の
先端を半透明ガラス板に接触させることによる端子の変
形が問題となることがある。又、端子の半透明ガラス板
との接触位置は端子の曲がりによって変わってくるもの
である。従って、抽出された端子の先端位置は必ずしも
正確な端子位置とはならず、曲がりを高精度で検査する
ものには適用できない。更に、端子の長さにバラツキの
あるようなものでは検査できないという問題もある。However, in this conventional example, since the bending is inspected by bringing the tip of the terminal into contact with the semitransparent glass plate, it is necessary to bring the tip of the terminal into contact with the semitransparent glass plate in the inspected component having a thin terminal. Deformation of the terminals can be a problem. The contact position of the terminal with the semitransparent glass plate changes depending on the bending of the terminal. Therefore, the tip positions of the extracted terminals are not always accurate terminal positions, and cannot be applied to those that inspect bends with high accuracy. Further, there is a problem that the inspection cannot be performed with a terminal having a variation in length.
従来の技術においては上記のように対象とする端子の径
の大きさ、端子長さの寸法バラツキに関係なく、その傾
きを全方向に渡って高精度で検出することができない。
従って、本発明においては、端子の径の大きさ、寸法バ
ラツキの影響が少なく、又その並びにも関係なく、あら
ゆる方向(X、Y方向)に端子が傾いていてもその傾き
を高精度で検出できる方法を提供することを目的とする
ものである。In the prior art, as described above, the inclination cannot be detected with high accuracy in all directions regardless of the size variation of the target terminal and the dimensional variation of the terminal length.
Therefore, in the present invention, the influence of the size and size of the terminal is small, and regardless of the order, even if the terminal is tilted in all directions (X, Y directions), the tilt can be detected with high accuracy. The purpose is to provide a possible method.
本発明は上記の目的を達するために次のような手段を有
するものである。The present invention has the following means to achieve the above object.
即ち、被検査部品の端子列毎に端子の先端だけに光を直
接照射して前記被検査部品の上からカメラにより撮像
し、画像としてとらえ、この画像から前記端子の各画像
の中心である図心を求め、前記図心間の距離及び図心間
の中点の座標を計測し、前記距離及び前記座標の差異が
基準範囲内にあるかどうかにより前記端子の傾きを検出
することを特徴とする端子の傾き検出方法とするもので
あり、 あるいは、被検査部品の端子列毎に端子の先端および定
まった位置にある基準体だけに光を直接照射して前記被
検査部品の上からカメラにより撮像し、画像としてとら
え、この画像から前記端子の各画像の中心である図心を
求め、前記基準体から前記図心までの距離および前記図
心間の距離を計測し、前記距離の差異が基準範囲内にあ
るかどうかにより前記端子の傾きを検出することを特徴
とする端子の傾き検出方法とするものである。That is, for each terminal row of the component to be inspected, only the tip of the terminal is directly irradiated with light, the image is captured by the camera from above the component to be inspected, and it is captured as an image. The center is obtained, the distance between the centroids and the coordinate of the midpoint between the centroids are measured, and the inclination of the terminal is detected depending on whether the difference between the distance and the coordinate is within a reference range. The method of detecting the inclination of the terminal is as follows. Alternatively, for each row of terminals of the inspected component, only the tip of the terminal and the reference body at a fixed position are directly irradiated with light and the camera is applied from above the inspected component. Capture and capture as an image, find the centroid that is the center of each image of the terminal from this image, measure the distance from the reference body to the centroid and the distance between the centroids, the difference in the distance Whether it is within the reference range According to another aspect of the present invention, there is provided a method for detecting the inclination of a terminal, wherein the inclination of the terminal is detected.
もしリレー等の電子部品の端子の傾きがあった場合、端
子の先端には端子間の距離の変化が現れる。この端子の
先端を検出するために被検査部品の端子列毎に端子の先
端にだけ光を直接照射して被検査部品の上からカメラに
より撮像し、画像としてとらえるものである。この端子
の各画像の中心である図心を求め、図心間の距離及び図
心間の中点の座標を計測することによって、端子の傾き
を検出することができる。しかしながら、全ての端子が
同じように傾いていた場合は端子間の距離の計測のみで
は傾きを検出することができない。このような場合のた
めに基準となる点を基準体に設け、この点と端子の図心
との位置関係を調べることにより、どんな場合に対して
も確実に端子の傾きを高精度で検出できるものである。If the terminals of electronic parts such as relays are tilted, the distance between the terminals changes at the tips of the terminals. In order to detect the tip of the terminal, light is directly applied only to the tip of the terminal for each terminal row of the component to be inspected, and the image is captured from above the component to be inspected by the camera and captured as an image. The inclination of the terminal can be detected by obtaining the centroid, which is the center of each image of the terminal, and measuring the distance between the centroids and the coordinates of the midpoint between the centroids. However, if all the terminals are tilted in the same way, the tilt cannot be detected only by measuring the distance between the terminals. In such a case, a reference point is provided on the reference body and the positional relationship between this point and the centroid of the terminal is examined, so that the terminal inclination can be detected with high accuracy in any case. It is a thing.
以下図面に基づいて本発明の実施例を詳細に説明する。 Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図は本発明の端子の傾き検出方法の構成の概要を示
した構成図である。本実施例の被検査部品11は端子12が
2列に配された部品である。第1図に示すように光源14
に近い側の端子12には光が照射されず、光源14より遠く
離れた側の端子12の先端だけに光が直接照射されるよう
に、端子列毎に光源14を設け、端子12との間には遮蔽板
13を設置する。光を照射して、被検査部品11の上からCC
Dカメラ15により撮像し、画像処理装置16によって得ら
れた各端子12の画像の中心である図心を求め、図心間の
距離を計測する。FIG. 1 is a configuration diagram showing an outline of the configuration of a terminal inclination detection method of the present invention. The inspected component 11 of this embodiment is a component in which the terminals 12 are arranged in two rows. As shown in FIG. 1, the light source 14
The terminal 12 on the side closer to is not irradiated with light, and the light source 14 is provided for each terminal row so that the light is directly irradiated only on the tip of the terminal 12 on the side farther from the light source 14. Shield plate between
Install 13. Irradiate light and CC from above the inspected part 11.
The centroid, which is the center of the image of each terminal 12 obtained by the image processing device 16 by the D camera 15 is obtained, and the distance between the centroids is measured.
第2図はこの撮像された画像を分かり易く図化して示し
たものである。この実施例における被検査部品11は端子
12が2列に並び、各列には5本の端子12が並んだ部品で
ある。又、第3図にこのような端子12が2列に配列され
た被検査部品11の端子の傾き検出の場合の良否判定のフ
ローチャートを示す。FIG. 2 is a diagram showing the captured image in an easily understandable manner. The inspected component 11 in this embodiment is a terminal
12 are arranged in two rows, and five terminals 12 are arranged in each row. Further, FIG. 3 shows a flow chart of the quality judgment in the case of detecting the inclination of the terminals of the inspected component 11 in which the terminals 12 are arranged in two rows.
第3図において、フローチャートに示すように、先ず、
撮像された画像から各端子の図心Tiを求め(処理31)、
続いてX方向ピッチPjおよびY方向ピッチWkを求める
(処理32)。第2図にその端子12のX方向(横方向)ピ
ッチPj(j=1,2……8)およびY方向(縦方向)ピッ
チWk(k=1,2……5)を示す。端子i(i=1,2……1
0)の図心Tiの座標を(xi,yi)とするとPj,Wkは次のよ
うに表される。In FIG. 3, first, as shown in the flow chart,
The centroid T i of each terminal is obtained from the captured image (process 31),
Then, the X-direction pitch P j and the Y-direction pitch W k are obtained (process 32). FIG. 2 shows an X-direction (horizontal direction) pitch P j (j = 1, 2 ... 8) and a Y-direction (longitudinal direction) pitch W k (k = 1, 2 ... 5) of the terminals 12. Terminal i (i = 1,2 …… 1
When the coordinates of the centroid T i of (0) are (x i , y i ), P j , W k are expressed as follows.
Pj=xj+1−xj(1≦j≦4) Pj=xj+2−xj+1(5≦j≦8) Wk=yk+5−yk(1≦k≦5) 上記のようにして求めたPj,Wkが予め定めた基準範囲内
にあるかどうかを判定し(処理33)、基準範囲内になけ
れば不良と判定する(処理39)。P j = x j + 1 −x j (1 ≦ j ≦ 4) P j = x j + 2 −x j + 1 (5 ≦ j ≦ 8) W k = y k + 5 −y k (1 ≦ k ≦ 5) It is determined whether or not P j , W k obtained as described above is within the predetermined reference range (process 33), and if not within the reference range, it is determined as defective (process 39).
しかしながら、この判定においては第4図に示すよう
に、1列の端子12aが5本とも等間隔でx方向に傾いて
いる場合も良品と判定してしまう。これを避けるため
に、各端子12a、12の図心Ti間のx方向の中点Am(m=
1,2……8)の座標を求め(処理34)、向かい合う中点
座標のx方向の差(第4図の例示はA1−A5)をとって、
その差が基準範囲内にあるかどうかを判定し(処理3
5)、基準範囲内になければ不良と判定する(処理3
9)。However, in this determination, as shown in FIG. 4, if all the terminals 12a in one row are inclined at equal intervals in the x direction, it is also determined as a good product. In order to avoid this, the midpoint A m (m = m) between the centroids T i of the terminals 12a, 12 in the x direction
1, 2 ... 8) coordinates are obtained (process 34), and the difference between the facing midpoint coordinates in the x direction (A1−A5 in FIG. 4) is calculated,
It is determined whether the difference is within the reference range (process 3
5) If it is not within the reference range, it is determined to be defective (Process 3
9).
更に、向かい合う端子12が揃ってy方向に傾いている場
合も良品と判定してしまう、これを避けるために、第5
図に示すようにy方向に並んだ端子12の図心Tm間の中点
Bk座標を求め(処理36)、その5個の中点座標よりy方
向の最大値Bmaxと最小値Bminをカットし、残り3個の平
均値Baveを求める(処理37)。そうして求めた平均値と
最大値および最小値との差(第5図の例示はBmax−Bav
e)が基準範囲内にあるかどうかを判定し(処理38)、
基準範囲内になければ不良とする(処理39)。基準範囲
内にあったものが初めて良品として判定される(処理4
0)。Furthermore, if the terminals 12 facing each other are all aligned and tilted in the y direction, it will be determined as a non-defective product.
As shown in the figure, the midpoint between centroids T m of terminals 12 arranged in the y direction.
The B k coordinate is obtained (process 36), the maximum value Bmax and the minimum value Bmin in the y direction are cut from the 5 midpoint coordinates, and the remaining 3 average values Bave are obtained (process 37). The difference between the average value thus obtained and the maximum and minimum values (the example in Fig. 5 is Bmax-Bav
e) is within the reference range (process 38),
If it is not within the reference range, it is determined to be defective (process 39). Those that were within the reference range are judged as non-defective for the first time (Process 4
0).
第6図には複数の端子62が1列に配列された被検査部品
61の端子の傾きを検査する場合の検査方法の構成の概要
を示した構成図である。この被検査部品61およびプレー
ト状の基準体63を上方から撮像した画像を分かり易く図
化した説明図を第7図に示す。端子62の先端と、基準体
63だけに光源64により光を直接照射する。基準体63の基
準位置71からx方向の各端子62の図心Ki(i=1,2……
5)までの距離(第7図においてはX4を例示)を算出
し、基準範囲内でなければ不良とする。一方、y方向も
同様に基準体63の基準位置71から各端子の図心までのy
方向の距離(Yi、i=1,2……5を例示)で判定を行
う。FIG. 6 shows a part to be inspected in which a plurality of terminals 62 are arranged in one row.
It is a block diagram which showed the outline of the structure of the inspection method at the time of inspecting the inclination of the terminal of 61. FIG. 7 shows an explanatory diagram in which the images of the inspected component 61 and the plate-shaped reference body 63 are imaged from above in an easily understandable manner. Tip of terminal 62 and reference body
The light source 64 directly irradiates only 63. The centroid K i of each terminal 62 in the x direction from the reference position 71 of the reference body 63 (i = 1, 2 ...
The distance to 5) (X4 is illustrated in FIG. 7) is calculated, and if it is not within the reference range, it is determined to be defective. On the other hand, similarly in the y direction, y from the reference position 71 of the reference body 63 to the centroid of each terminal
The determination is performed based on the distance in the direction (Y i , i = 1, 2 ... 5 is illustrated).
同じく端子の傾き検出方法の異なった実施例を示したの
が第8図および第9図である。被検査部品11のx方向、
y方向のそれぞれの基準となる点を、撮像した画像上に
作り出すために、光ファイバー光源(図示せず)を被検
査部品11の一つのコーナー斜め下方より照射して部品エ
ッジ91を照らし出すものである。この場合、基準となる
点を有する基準体は被検査部品11そのものである。撮像
によりとらえられた被検査部品11のコーナーを仮想原点
Gとし、仮想原点Gから上の列の端子12,12bの図心T
i(i=1,2……5)までのy方向の距離DYi(i=1,2…
…5)と上下の列の一番仮想原点Gに近い端子12bの図
心(図の例ではT1とT6)までのx方向の距離(DXn(n
=1,2)を測定し、それが所定範囲内であるか否かを検
査する。その後は第2図、第4図および第5図の実施例
の手順に従い検査を行うことにより、全ての端子が同じ
方向に同じ量だけ傾いているような端子に対しても、確
実に端子の傾きを検出することができるものである。Similarly, FIGS. 8 and 9 show different embodiments of the terminal inclination detection method. X direction of the inspected part 11,
In order to create each reference point in the y direction on the captured image, an optical fiber light source (not shown) is illuminated from one corner diagonally below the inspected component 11 to illuminate the component edge 91. is there. In this case, the reference body having the reference point is the inspected component 11 itself. The corner of the inspected part 11 captured by the imaging is set as the virtual origin G, and the centroid T of the terminals 12 and 12b in the row above the virtual origin G is set.
Distance DY i (i = 1,2 ... 5) to i (i = 1,2 ... 5)
5) and the centroid (T1 and T6 in the illustrated example) of the terminal 12b closest to the virtual origin G in the upper and lower rows in the x direction (DX n (n
= 1, 2) is measured and it is inspected whether it is within a predetermined range. After that, the inspection is performed in accordance with the procedure of the embodiment shown in FIGS. 2, 4, and 5, so that even if all the terminals are inclined by the same amount in the same direction, The tilt can be detected.
以上述べたように本発明は、被検査部品の端子列毎に端
子の先端だけに光を直接照射して前記被検査部品の上か
らカメラにより撮像し、画像としてとらえ、この画像か
ら前記端子の各画像の中心である図心を求め、前記図心
間の距離及び図心間の中点の座標を計測し、前記距離及
び座標の差異が基準範囲内にあるかどうかにより前記端
子の傾きを検出することを特徴とする端子の傾き検出方
法としたことにより、 あるいは、被検査部品の端子列毎に端子の先端および定
まった位置にある基準体だけに光を直接照射して前記被
検査部品の上からカメラにより撮像し、画像としてとら
え、この画像から前記端子の各画像の中心である図心を
求め、前記基準体から前記図心までの距離および前記図
心間の距離を計測し、前記距離の差異が基準範囲内にあ
るかどうかにより前記端子の傾きを検出することを特徴
とする端子の傾き検出方法としたことによって、 端子の径の大きさ、寸法バラツキの影響が少なく、又そ
の並びにも関係なく、あらゆる方向(X、Y方向)に端
子が傾いていてもその傾きを高精度で検出できる方法を
提供するものである。As described above, according to the present invention, for each terminal row of the inspected component, only the tip of the terminal is directly irradiated with light, the image is captured by the camera from above the inspected component, and is captured as an image. Obtain the centroid that is the center of each image, measure the distance between the centroids and the coordinates of the midpoint between the centroids, and determine the inclination of the terminal by checking whether the difference in the distance and the coordinate is within the reference range. According to the method for detecting the inclination of the terminal, which is characterized by detecting, the light is directly radiated only to the tip of the terminal and the reference body at a fixed position for each terminal row of the object to be inspected. The image is taken by a camera from above, and captured as an image, the centroid that is the center of each image of the terminal is obtained from this image, and the distance from the reference body to the centroid and the distance between the centroids are measured, The distance difference is within the reference range According to the terminal inclination detection method characterized by detecting the inclination of the terminal depending on whether or not there is little influence of terminal diameter size and dimensional variation, and regardless of that It is intended to provide a method capable of detecting the inclination with high accuracy even if the terminals are inclined in the (X, Y directions).
第1図は本発明の端子の傾き検出方法の実施例の構成の
概要を示した構成図、第2図はその実施例におけるCCD
カメラでの撮像画を図化した説明図、第3図は端子が2
列に配置された被検査部品の場合の本発明の端子の傾き
検出方法の良否判定のフローチャート、第4図は異なっ
た端子の傾きの場合の実施例を示す撮像画を図化した説
明図、第5図は更に異なった端子の傾きの場合の実施例
を示す撮像画を図化した説明図、第6図は端子が一列の
場合の実施例の概要を示す構成図、第7図はその撮像画
を図化した説明図、第8図は異なった実施例を示す撮像
画を図化した説明図、第9図はその撮像画を示した図で
ある。 11、61……被検査部品、12、12a、12b、62……端子、1
4、64……光源、15、65……CCDカメラ、16、66……画像
処理装置、Ti……図心、G……仮想原点、Am……X方向
に隣合う端子の図心間のX方向の中点、Bk……Y方向に
隣合う端子の図心間のY方向の中点FIG. 1 is a configuration diagram showing an outline of the configuration of an embodiment of a terminal inclination detection method of the present invention, and FIG. 2 is a CCD in that embodiment.
Fig. 3 is an explanatory diagram showing the image captured by the camera.
FIG. 4 is a flow chart of the quality judgment of the terminal inclination detection method of the present invention in the case of parts to be inspected arranged in rows, FIG. 4 is an explanatory diagram illustrating an imaged image showing an embodiment in the case of different terminal inclinations, FIG. 5 is an explanatory diagram illustrating an imaged image showing an embodiment in which the terminals are tilted differently, FIG. 6 is a configuration diagram showing an outline of the embodiment in the case where the terminals are in a line, and FIG. FIG. 8 is an explanatory diagram showing a captured image, FIG. 8 is an explanatory diagram showing a captured image showing a different embodiment, and FIG. 9 is a diagram showing the captured image. 11, 61 …… Inspected part, 12, 12a, 12b, 62 …… Terminal, 1
4, 64 …… Light source, 15, 65 …… CCD camera, 16, 66 …… Image processing device, T i …… Centroid, G …… Virtual origin, Am …… Between centroids of adjacent terminals in the X direction X direction middle point, Bk …… Y direction middle point between centroids of adjacent terminals in Y direction
Claims (2)
光を直接照射して前記被検査部品の上からカメラにより
撮像し、画像としてとらえ、この画像から前記端子の各
画像の中心である図心を求め、前記図心間の距離及び図
心間の中点の座標を計測し、前記距離及び前記座標の差
異が基準範囲内にあるかどうかにより前記端子の傾きを
検出することを特徴とする端子の傾き検出方法。1. A light for direct irradiating only the tips of the terminals for each terminal row of the component to be inspected, imaged by a camera from above the component to be inspected, captured as an image, and from this image, the center of each image of the terminal Is obtained, the distance between the centroids and the coordinates of the midpoint between the centroids are measured, and the inclination of the terminal is detected depending on whether the difference between the distance and the coordinate is within a reference range. A method for detecting the inclination of a terminal, characterized by
定まった位置にある基準体だけに光を直接照射して前記
被検査部品の上からカメラにより撮像し、画像としてと
らえ、この画像から前記端子の各画像の中心である図心
を求め、前記基準体から前記図心までの距離および前記
図心間の距離を計測し、前記距離の差異が基準範囲内に
あるかどうかにより前記端子の傾きを検出することを特
徴とする端子の傾き検出方法。2. For each terminal row of the component to be inspected, only the tip of the terminal and the reference body at a fixed position are directly irradiated with light, and the image is captured by the camera from above the component to be inspected, and captured as an image. The centroid, which is the center of each image of the terminal, is obtained, the distance from the reference body to the centroid and the distance between the centroids are measured, and it is determined whether the difference in the distance is within the reference range. A method for detecting the inclination of a terminal, which comprises detecting the inclination of the terminal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2077920A JPH07104136B2 (en) | 1990-03-27 | 1990-03-27 | Terminal tilt detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2077920A JPH07104136B2 (en) | 1990-03-27 | 1990-03-27 | Terminal tilt detection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03276007A JPH03276007A (en) | 1991-12-06 |
| JPH07104136B2 true JPH07104136B2 (en) | 1995-11-13 |
Family
ID=13647516
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2077920A Expired - Fee Related JPH07104136B2 (en) | 1990-03-27 | 1990-03-27 | Terminal tilt detection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07104136B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013195174A (en) * | 2012-03-19 | 2013-09-30 | Fujitsu Ltd | Inspection apparatus and inspection method |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6674483B2 (en) | 2018-01-16 | 2020-04-01 | 本田技研工業株式会社 | Wire position inspection method and apparatus |
| CN112184677B (en) * | 2020-09-30 | 2022-10-04 | 青岛思锐自动化工程有限公司 | Terminal connecting piece detection method based on industrial vision |
| JP7731639B2 (en) * | 2022-03-04 | 2025-09-01 | ヤマハ発動機株式会社 | Component inspection method, inspection device, and component mounting device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6042885B2 (en) * | 1978-05-18 | 1985-09-25 | 日本電気株式会社 | IC lead bending inspection device |
| JPS6332358A (en) * | 1986-07-25 | 1988-02-12 | Toshiba Corp | Image pickup device |
-
1990
- 1990-03-27 JP JP2077920A patent/JPH07104136B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013195174A (en) * | 2012-03-19 | 2013-09-30 | Fujitsu Ltd | Inspection apparatus and inspection method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03276007A (en) | 1991-12-06 |
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