JPH0692947B2 - Thermal analyzer - Google Patents
Thermal analyzerInfo
- Publication number
- JPH0692947B2 JPH0692947B2 JP29100585A JP29100585A JPH0692947B2 JP H0692947 B2 JPH0692947 B2 JP H0692947B2 JP 29100585 A JP29100585 A JP 29100585A JP 29100585 A JP29100585 A JP 29100585A JP H0692947 B2 JPH0692947 B2 JP H0692947B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- sample
- temperature
- output
- characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、検出手段の検出出力の温度依存性を出力側に
て補正する装置を具備した熱分析装置に関する。Description: TECHNICAL FIELD The present invention relates to a thermal analysis device equipped with a device that corrects the temperature dependence of the detection output of a detection means on the output side.
(従来の技術) 例えば高分子物質の状態変化の解析には、試料を挿入し
た試料容器と基準物質を挿入した標準容器を加熱炉内に
配設した伝熱板上に載置し、これを一定の上昇速度で加
熱し、その過程において発生する試料の吸、発熱現象に
よる熱エネルギーの授受を電熱板を介して行ないなが
ら、検出手段を構成する2個の熱電対から検出した示差
熱量を測定する熱流束型示差熱量測定装置が多用されて
いる。(Prior Art) For example, in order to analyze the state change of a polymer substance, place a sample container containing a sample and a standard container containing a reference substance on a heat transfer plate arranged in a heating furnace. Measure the differential calorific value detected from the two thermocouples that make up the detection means while heating at a constant rising rate and absorbing and exchanging the heat energy due to the exothermic phenomenon of the sample generated in the process through the heating plate. A heat flux type differential calorimeter is frequently used.
(発明が解決しようとする問題点) この種の装置おいて、検出手段を構成する2個の熱電対
による試料の吸発熱量の検出出力は、熱エネルギーの授
受を行なう伝熱板の熱伝導率が温度上昇に伴なって変動
するとともに、周囲温度に対応した輻射、対流等の熱伝
達の影響を受け、加熱温度の上昇に応じて低下する特性
を示している。このため、試料の吸、発熱を示すピーク
波形の振幅が加熱温度の上昇に伴って減少してしまう。
そこで、加熱炉の上で、下面を光沢を有する均熱ブロッ
グにより覆って検出手段からの熱の逃げを防止する対策
が採られているが、加熱炉の加熱温度を一定速度で上昇
させながら測定を行なう以上、周囲温度の変化に無関係
とはなりえず、出力ピーク波形の振幅が温度に依存して
変動するという問題を依然として抱えている。(Problems to be Solved by the Invention) In this type of device, the detection output of the amount of heat absorbed and generated by the sample by the two thermocouples forming the detection means is the heat conduction of the heat transfer plate for exchanging heat energy. It shows that the rate fluctuates as the temperature rises, is affected by heat transfer such as radiation and convection corresponding to the ambient temperature, and decreases as the heating temperature rises. For this reason, the amplitude of the peak waveform indicating the absorption and heat generation of the sample decreases as the heating temperature increases.
Therefore, measures are taken to prevent the heat from escaping from the detection means by covering the lower surface with a glossy uniform heating blog on the heating furnace.Measurement is performed while raising the heating temperature of the heating furnace at a constant rate. As a result, the problem that the amplitude of the output peak waveform fluctuates depending on the temperature cannot be maintained regardless of the change in the ambient temperature.
本発明の目的とするところは、上記問題に鑑み、検出手
段の検出出力がその出力側にて周囲温度による影響を受
けないように補正する改良された熱分析装置を提供する
ことにある。In view of the above problems, it is an object of the present invention to provide an improved thermal analysis device that corrects the detection output of the detection means so that it is not affected by the ambient temperature on the output side.
(問題点を解決するための手段) すなわち本発明が特徴とするところは、基準物質と試料
との温度差、及び前記試料の温度を各別に出力するとと
もに、加熱炉の温度上昇にともなって熱量の検出出力が
低下する特性を備えた検出手段と、前記検出手段からの
試料の温度を示す電圧の増加に対応して変化する非線形
電圧を制御電圧として出力する折線関数電圧発生手段
と、前記検出手段から出力された基準物質と試料との温
度差を示す電圧を分圧する機能を有し、前記折線関数電
圧発生手段からの制御電圧が入力され、前記制御電圧の
振幅に対応して内部抵抗が前記検出手段の検出出力特性
と対称的な特性に変換される可変抵抗手段とを備えた点
にある。(Means for Solving the Problems) That is, the feature of the present invention is that the temperature difference between the reference substance and the sample and the temperature of the sample are separately output, and the amount of heat increases as the temperature of the heating furnace rises. Detecting means having a characteristic that the detection output of the detecting means decreases, and a polygonal function voltage generating means for outputting, as a control voltage, a non-linear voltage that changes in response to an increase in the voltage indicating the temperature of the sample from the detecting means, Having a function of dividing the voltage indicating the temperature difference between the reference substance and the sample output from the means, the control voltage from the polygonal function voltage generating means is input, and the internal resistance corresponding to the amplitude of the control voltage is It is provided with variable resistance means for converting the detection output characteristic of the detection means into a symmetrical characteristic.
(作用) 加熱炉の加熱温度の増加に伴って熱量の検出感度が低下
する検出手段からの基準物質と試料の温度差電圧を可変
抵抗手段に入力するとともに、検出手段からの試料温度
電圧の増加に応じて電圧増加率の変化する非線形電圧を
可変抵抗手段の制御極に制御電圧として入力し、この制
御電圧により可変抵抗手段の内部抵抗を、検出手段の検
出出力特性と対称特性となるように制御し、検出手段の
熱量の検出出力に影響されないように補正した基準物質
と試料の温度差電圧を出力する。(Function) The temperature difference voltage between the reference substance and the sample from the detection means, whose detection sensitivity of the heat quantity decreases as the heating temperature of the heating furnace increases, is input to the variable resistance means, and the sample temperature voltage from the detection means increases. A non-linear voltage whose rate of increase in voltage changes according to the above is input as a control voltage to the control pole of the variable resistance means, and this control voltage causes the internal resistance of the variable resistance means to be symmetrical with the detection output characteristic of the detection means. The temperature difference voltage between the reference material and the sample, which is controlled and corrected so as not to be affected by the detection output of the amount of heat of the detection means, is output.
(実施例) 以下に本発明の詳細を図に示す実施例に基づいて説明す
る。(Example) Below, the detail of this invention is demonstrated based on the Example shown in a figure.
図はいずれも本発明の一実施例装置を示し、図中符号1
は試料を挿入した試料容器3と基準物質を挿入した標準
容器4を支持するとともに、試料温度及び標準物質温度
を検出して試料温度と基準物質と試料の温度差とを各別
に出力する熱電対5、5′を配設し、銅等により構成さ
れた伝熱板2を具備する加熱炉であって、その熱伝対
5、5′の吸発熱量検出感度は第2図(A)の特性曲線
aで示すように加熱温度の上昇に伴って低下する特性を
備えている。6及び7は熱電対5及び5′により検出し
た基準物質と試料の温度差電圧と、熱電対5′から検出
した試料温度電圧とを増幅する増幅器であって、増幅器
6は抵抗R0を介して、第2図(B)の特性曲線bで示す
ように線形に増加するゲート電圧O〜Vnに応じて内部抵
抗が急激に増加する特性を示すFET12のソース電極に接
続され、一方、増幅器7は折線関数電圧発生器8乃至10
と接続されている。折線関数電圧発生器8乃至10は、抵
抗R1乃至R3、R4乃至R6、R7乃至R9の各直列回路が並列接
続されるとともに、その帰還ループと出力側にそれぞれ
ダイオードD、Dを接続し、非反転入力を接地し反転入
力端子を備えるオペアンプOP1、OP2OP3が各抵抗R2、R5
及びR8に並設され、さらに両端に+15V、−15Vの電圧を
印加された4個の直列抵抗回路から大きさの異なるバイ
アス電圧をオペアンプOP1乃至OP3の反転入力端子に分岐
し印加するように構成されている。折線関数電圧発生器
8乃至10は増幅器7の出力電圧の増大に伴って、まず上
記した各直列回路を並列接続した抵抗回路に流れ、次い
でオペアンプOP1、OP2、OP3に接続したダイオードD、
Dを順次導通させ、第2図(C)に示すように対数圧縮
された折線関数電圧曲線Cを出力し、増幅器11を介して
FET12のゲートに入力する。Each of the drawings shows an apparatus according to an embodiment of the present invention, in which reference numeral 1
Is a thermocouple that supports the sample container 3 in which the sample is inserted and the standard container 4 in which the reference substance is inserted, and detects the sample temperature and the standard substance temperature and outputs the sample temperature and the temperature difference between the reference substance and the sample separately. A heating furnace provided with heat transfer plates 2 made of copper or the like, in which 5, 5'are arranged, and the sensitivity of detecting heat absorption and heat generation of the thermocouples 5, 5'is as shown in FIG. As shown by the characteristic curve a, it has a characteristic of decreasing with an increase in heating temperature. Reference numerals 6 and 7 denote amplifiers for amplifying the temperature difference voltage between the reference substance and the sample detected by the thermocouples 5 and 5 ', and the sample temperature voltage detected by the thermocouple 5', and the amplifier 6 is connected via the resistor R 0 . Then, as shown by the characteristic curve b in FIG. 2 (B), the FET 12 is connected to the source electrode of the FET 12 which shows the characteristic that the internal resistance rapidly increases in response to the linearly increasing gate voltages O to V n. 7 is a broken line function voltage generator 8 to 10
Connected with. In the polygonal line function voltage generators 8 to 10, the series circuits of the resistors R 1 to R 3 , R 4 to R 6 , and R 7 to R 9 are connected in parallel, and the feedback loop and the diode D are respectively provided on the output side. Op amps OP 1 and OP 2 OP 3 connected to D, grounding the non-inverting input and having an inverting input terminal are resistors R 2 and R 5 respectively.
And they are arranged in parallel in R 8, further + 15V across branches by applying a voltage different bias voltages of four series-connected resistor circuit sizes applied to a -15V to the inverting input terminal of the operational amplifier OP 1 to OP 3 Is configured. As the output voltage of the amplifier 7 increases, the linear function voltage generators 8 to 10 first flow into the resistance circuit in which the above series circuits are connected in parallel, and then the diode D connected to the operational amplifiers OP 1 , OP 2 and OP 3. ,
D is sequentially turned on, and a logarithmically compressed polygonal function voltage curve C is output as shown in FIG.
Input to the gate of FET12.
上記折線関数発生器8乃至9は、検出部の検出出力特性
とFET12のゲート電圧対内部抵抗特性を考え、検出部の
検出出力が加熱温度に対して直線となるような折線関数
を発生するように構成しておく。すなわち、熱電対等の
温度検出手段の温度に対する出力の変化特性、つまり非
線形特性は既知であるから、この特性を補償する電圧を
折れ線で近似することは容易に実現することができる。The polygonal line function generators 8 to 9 consider the detection output characteristic of the detection unit and the gate voltage-internal resistance characteristic of the FET 12 and generate a polygonal line function such that the detection output of the detection unit becomes a straight line with respect to the heating temperature. It is configured in. That is, since the change characteristic of the output with respect to the temperature of the temperature detecting means such as a thermocouple, that is, the non-linear characteristic is known, it is easy to approximate the voltage compensating for this characteristic with a broken line.
13は増幅器6の出力電圧が抵抗R0とFET12により分圧さ
れ、FET12の分圧電圧を図示しないデータ処理装置に送
出する増幅器である。Reference numeral 13 is an amplifier which divides the output voltage of the amplifier 6 by the resistor R 0 and the FET 12 and sends the divided voltage of the FET 12 to a data processing device (not shown).
なお、図中符号14は接続されるFETの特性のばらつきを
補正するため、ゲートに入力されるバイアス電圧を調整
する調整回路である。Reference numeral 14 in the drawing is an adjustment circuit for adjusting the bias voltage input to the gate in order to correct the variation in the characteristics of the FETs connected to it.
このように構成した装置において、加熱炉1の加熱温度
を上昇させて行くと、これに応じて熱電対5、5′によ
り検出された基準物質と試料の温度差電圧が増幅器6を
介してFET12のソース電極に入力される。一方、熱電対
5から検出した増加する試料温度電圧を増幅器7を介し
て折線関数電圧発生器8乃至10に入力する。これにより
第2図(C)の特性曲線Cで示すように、増幅器7の出
力電圧がV1に至る迄、抵抗R1乃至R3、R4乃至R6、R7乃至
R9の並列回路に電流が分流して線形電圧が出力され、そ
の電圧がV1からV2の間はオペアンプOP1のダイオード
D、Dが導通して抵抗R2と並列回路を形成し、このため
合成抵抗が減少し、電圧増加率の低下して電圧を出力す
る。次いで電圧V2からV3の間はオペアンプOP2のダイオ
ードD、Dが導通して抵抗R5と並列回路を形成し、合成
抵抗の一層の減少によりさらに電圧増加率の低下した電
圧を出力し、最後に電圧V3からV4の間はオペアンプOP3
のダイオードD、Dが導通して8抵抗Rと並列回路を形
成し、電圧増加率の減少した電圧を出力する。このよう
にして、折線関数電圧発生器8乃至10は増幅器11を介し
てFET12のゲートに電圧振幅を0〜V4の電圧に対数圧縮
して入力するから、FETT12のゲート入力電圧は第2図
(B)の特性曲線C′で示すように、線形なゲート電圧
0〜Vnを入力する場合と比較してその電圧領域幅が0〜
V4に縮小されるとともに、その領域幅に位置する内部抵
抗の増加率は上記特性曲線C′で示される対数圧縮され
た電圧により制御され、検出出力特性曲線aと対称的な
第2図(A)に示す特性曲線b′に補正される。In the apparatus thus configured, when the heating temperature of the heating furnace 1 is increased, the temperature difference voltage between the reference substance and the sample detected by the thermocouples 5 and 5'correspondingly increases the FET 12 via the amplifier 6. Is input to the source electrode of. On the other hand, the increasing sample temperature voltage detected from the thermocouple 5 is input to the linear function voltage generators 8 to 10 via the amplifier 7. As a result, as shown by the characteristic curve C in FIG. 2 (C), until the output voltage of the amplifier 7 reaches V 1 , the resistances R 1 to R 3 , R 4 to R 6 , R 7 to
A current is shunted to the parallel circuit of R 9 and a linear voltage is output, and while the voltage is between V 1 and V 2 , the diodes D and D of the operational amplifier OP 1 are conducted to form a parallel circuit with the resistor R 2 , As a result, the combined resistance decreases, the voltage increase rate decreases, and the voltage is output. Next, between the voltages V 2 and V 3 , the diodes D, D of the operational amplifier OP 2 are turned on to form a parallel circuit with the resistor R 5, and the voltage whose rate of voltage increase is further reduced is output by further reduction of the combined resistance. , And finally the operational amplifier OP 3 between voltage V 3 and V 4
The diodes D 1 and D 2 are turned on to form a parallel circuit with the 8 resistor R, and a voltage with a reduced voltage increase rate is output. In this way, the polygonal function voltage generators 8 to 10 logarithmically compress the voltage amplitude of 0 to V 4 and input it to the gate of the FET 12 via the amplifier 11, so that the gate input voltage of the FET T12 is shown in FIG. As shown by the characteristic curve C ′ in (B), the voltage region width is 0 to 0 as compared with the case where a linear gate voltage 0 to V n is input.
The reduction rate of V 4 is controlled by the logarithmically compressed voltage indicated by the characteristic curve C ′ while being reduced to V 4 and the increase rate of the internal resistance located in the area width is symmetrical with the detection output characteristic curve a (FIG. 2). The characteristic curve b'shown in A) is corrected.
このため、増幅器6から出力される試料の吸、発熱に伴
うピーク出力がFET12に入力されると、そのピーク電流
と補正された内部抵抗との積の分圧電圧が増幅器13に出
力されるが、この分圧電圧は加熱温度の上昇と共に増加
するから、加熱温度の上昇と共に減少するピーク出力が
補正される。Therefore, when the peak output due to the absorption and heat generation of the sample output from the amplifier 6 is input to the FET 12, the divided voltage of the product of the peak current and the corrected internal resistance is output to the amplifier 13. Since the divided voltage increases as the heating temperature rises, the peak output that decreases as the heating temperature rises is corrected.
なお、本実施例において検出部の検出出力特性補正装置
を示差走査熱量測定装置に適用した場合について説明し
たが、この補正装置は示差熱分析装置にも適用可能であ
り、また折線関数電圧発生装置の個数は折線電圧の所望
の傾斜度合の精、粗に応じて適宜増減すればよい。ま
た、本実施例では折線関数発生器の電圧増加率が対数圧
縮されて減少するように組まれているが、ダイオードの
接続方向により電圧増加率を増すことも可能である。In the present embodiment, the case where the detection output characteristic correction device of the detection unit is applied to the differential scanning calorimeter is described, but this correction device is also applicable to the differential thermal analysis device, and the polygonal function voltage generator is also applicable. The number may be appropriately increased or decreased according to the desired degree of inclination of the broken line voltage and the degree of roughness. Further, in this embodiment, the voltage increase rate of the polygonal line function generator is logarithmically compressed so as to decrease, but it is also possible to increase the voltage increase rate by the connecting direction of the diodes.
(発明の効果) 以上述べたように本発明によれば、加熱温度の上昇につ
れて検出出力が低下する検出手段からの示差熱温度電圧
を可変抵抗手段に入力するとともに、上記検出手段から
の試料温度電圧を折線関数電圧発生手段に入力し、試料
温度電圧の増加につれて電圧増加率の減少する対数圧縮
された非線形電圧を制御電圧として、可変抵抗手段の制
御極に入力するようにしてあるため、可変抵抗手段の制
御極に入力される制御電圧領域幅が縮小され、この領域
幅内に位置する可変抵抗手段の内部抵抗を上記検出手段
の検出出力特性と対称的な特性を示すように形成するこ
とが可能となり、このため試料の吸、発熱を示すピーク
出力は検出手段の温度依存性による影響を受けることな
く補正され、したがって正確な熱分析を行なうことがで
きる。(Effect of the Invention) As described above, according to the present invention, the differential thermal temperature voltage from the detection means whose detection output decreases as the heating temperature rises is input to the variable resistance means, and the sample temperature from the detection means is input. The voltage is input to the linear function voltage generating means, and the logarithmically compressed nonlinear voltage whose voltage increase rate decreases as the sample temperature voltage increases is input as the control voltage to the control pole of the variable resistance means. The width of the control voltage area input to the control pole of the resistance means is reduced, and the internal resistance of the variable resistance means located within this area width is formed so as to exhibit a characteristic symmetrical with the detection output characteristic of the detection means. Therefore, the peak output indicating the absorption and heat generation of the sample can be corrected without being affected by the temperature dependence of the detection means, and therefore accurate thermal analysis can be performed. It
第1図は本発明の一実施例装置を示す構成図、第2図
(A)は熱電対の吸発熱量検出出力特性曲線とFETの補
正された内部抵抗特性曲線とを、同図(B)はFETの補
正されない内部抵抗特性曲線と折線関数電圧発生器から
の出力電圧波形と、同図(C)は折線関数電圧発生器の
出力電圧波形を示す図である。 1……加熱炉、5、5……熱電対、8、7、9……折線
関数電圧発生器、12……FETFIG. 1 is a block diagram showing an apparatus according to an embodiment of the present invention, and FIG. 2 (A) is a diagram showing an output characteristic curve of detection of heat absorption and generation of thermocouple and a corrected internal resistance characteristic curve of FET. 6C is an uncorrected internal resistance characteristic curve of the FET and an output voltage waveform from the linear function voltage generator, and FIG. 6C is a diagram showing an output voltage waveform of the linear function voltage generator. 1 ... Heating furnace, 5, 5 ... Thermocouple, 8, 7, 9 ... Line function voltage generator, 12 ... FET
Claims (1)
の温度を各別に出力するとともに、加熱炉の温度上昇に
ともなって熱量の検出出力が低下する特性を備えた検出
手段と、前記検出手段からの試料の温度を示す電圧の増
加に対応して変化する非線形電圧を制御電圧として出力
する折線関数電圧発生手段と、前記検出手段から出力さ
れた基準物質と試料との温度差を示す電圧を分圧する機
能を有し、前記折線関数電圧発生手段からの制御電圧が
入力され、前記制御電圧の振幅に対応して内部抵抗が前
記検出手段の検出出力特性と対称的な特性に変換される
可変抵抗手段とを備えた熱分析装置。1. A detection means having a characteristic that the temperature difference between the reference substance and the sample and the temperature of the sample are output separately, and the detection output of the amount of heat decreases as the temperature of the heating furnace increases, A linear function voltage generating means for outputting as a control voltage a non-linear voltage that changes in response to an increase in the voltage indicating the temperature of the sample from the detecting means, and a temperature difference between the reference substance and the sample output from the detecting means. It has a function of dividing the voltage, receives the control voltage from the polygonal line function voltage generating means, and converts the internal resistance into a characteristic symmetrical with the detection output characteristic of the detecting means corresponding to the amplitude of the control voltage. And a variable resistance means.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29100585A JPH0692947B2 (en) | 1985-12-23 | 1985-12-23 | Thermal analyzer |
| CN 86108245 CN1012845B (en) | 1985-12-23 | 1986-12-22 | thermal analysis device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29100585A JPH0692947B2 (en) | 1985-12-23 | 1985-12-23 | Thermal analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62167455A JPS62167455A (en) | 1987-07-23 |
| JPH0692947B2 true JPH0692947B2 (en) | 1994-11-16 |
Family
ID=17763225
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29100585A Expired - Lifetime JPH0692947B2 (en) | 1985-12-23 | 1985-12-23 | Thermal analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0692947B2 (en) |
-
1985
- 1985-12-23 JP JP29100585A patent/JPH0692947B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62167455A (en) | 1987-07-23 |
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