[go: up one dir, main page]

JPH06311022A - Semiconductor logic circuit device - Google Patents

Semiconductor logic circuit device

Info

Publication number
JPH06311022A
JPH06311022A JP5096358A JP9635893A JPH06311022A JP H06311022 A JPH06311022 A JP H06311022A JP 5096358 A JP5096358 A JP 5096358A JP 9635893 A JP9635893 A JP 9635893A JP H06311022 A JPH06311022 A JP H06311022A
Authority
JP
Japan
Prior art keywords
level
input signal
circuit
signal terminal
logic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5096358A
Other languages
Japanese (ja)
Other versions
JP2590681B2 (en
Inventor
Hisamitsu Kimoto
寿充 木本
Hiroyuki Takahashi
弘行 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP5096358A priority Critical patent/JP2590681B2/en
Publication of JPH06311022A publication Critical patent/JPH06311022A/en
Application granted granted Critical
Publication of JP2590681B2 publication Critical patent/JP2590681B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Logic Circuits (AREA)

Abstract

PURPOSE:To quicken the delay time of the circuit, to reduce the occupied area due to decrease in number of elements and to relieve the load when viewing from a pre-stage circuit by providing at least one MOS transistor(TR) whose source connects to a 1st input signal terminal and whose gate connects to a 2nd input signal terminal in a 2-input semiconductor logic circuit. CONSTITUTION:TRs P11, N12 are turned on and a TR N11 is turned off when a 1st input signal terminal A is at an H level and a 2nd input signal terminal B is at an L level, and when a size of a TR N12 is sufficiently smaller than a size of the TR P11, an output signal terminal OUT provides an H level output. In this case, an H level is outputted in the selection state of A=H, B=L with respect to four combinations of the 2 input signals A, B and an L level is outputted in other cases. That is, the logic operation equal to that of a conventional NOR circuit is realized with a fewer element number.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体論理回路装置に関
し、特にBiCMOSやCMOS技術を用いた半導体論
理回路装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor logic circuit device, and more particularly to a semiconductor logic circuit device using BiCMOS or CMOS technology.

【0002】[0002]

【従来の技術】従々来の半導体論理回路装置は、例え
ば、図6〜図9に示す様な回路構成となっている。
2. Description of the Related Art Conventional semiconductor logic circuit devices have, for example, circuit configurations as shown in FIGS.

【0003】図6はCMOS構成の、図7はBiCMO
S構成のNOR回路の1例であり、どちらも2つの入力
信号端子A,Bがともにロウ(以下L)レベルの時のみ
ハイ(以下H)レベルを出力し、それ以外の時はLレベ
ルを出力する。
FIG. 6 shows a CMOS structure, and FIG. 7 shows a BiCMO.
This is an example of a NOR circuit having an S configuration, and outputs high (hereinafter, H) level only when both of the two input signal terminals A and B are at low (hereinafter, L) level, and otherwise outputs L level. Output.

【0004】図8はCMOS構成の、図9はBiCMO
S構成のNAND回路の1例であり、どちらも2つの入
力信号端子A,BがともにHレベルの時のみLレベルを
出力し、それ以外の時はHレベルを出力する。
FIG. 8 shows a CMOS structure, and FIG. 9 shows a BiCMO.
This is an example of an S-configured NAND circuit, and outputs L level only when both of the two input signal terminals A and B are H level, and outputs H level otherwise.

【0005】また、面積を縮小する効果を目的とした最
新の従来技術としては、「特開平2−271714」で
示されている図10〜図13の様な半導体論理回路装置
がある。
As the latest prior art for the purpose of reducing the area, there is a semiconductor logic circuit device as shown in FIGS. 10 to 13 shown in Japanese Patent Laid-Open No. 2-27714.

【0006】図10はXOR回路であり、2つの入力信
号端子A,Bの論理値が相異なる時Hレベルを出力し、
一致する時Lレベルを出力する。
FIG. 10 shows an XOR circuit, which outputs H level when the logical values of the two input signal terminals A and B are different from each other.
When they match, L level is output.

【0007】図11はXNOR回路であり、2つの入力
信号端子A,Bの論理値が相異なる時Lレベルを出力
し、一致する時Hレベルを出力する。
FIG. 11 shows an XNOR circuit, which outputs an L level when the logical values of the two input signal terminals A and B are different from each other, and outputs an H level when they match.

【0008】図12はOR回路であり、2つの入力信号
端子A,BがともにLレベルの時のみLレベルを出力
し、それ以外の時はHレベルを出力する。
FIG. 12 shows an OR circuit which outputs the L level only when both of the two input signal terminals A and B are at the L level, and outputs the H level at other times.

【0009】図13はAND回路であり、2つの入力信
号端子A,BがともにHレベルの時のみHレベルを出力
し、それ以外の時はLレベルを出力する。
FIG. 13 shows an AND circuit which outputs the H level only when both of the two input signal terminals A and B are at the H level, and outputs the L level at other times.

【0010】[0010]

【発明が解決しようとする課題】上述した様な従々来技
術では、MOSトランジスタで論理演算を行う部分で2
入力信号がともにゲートに接続され、かつ、図6,7で
はP型MOSトランジスタが、図8,9ではN型MOS
トランジスタがそれぞれ2個直列に接続されているた
め、論理回路の遅延時間(tPD)が増加し、面積も増え
る。また、ゲート容量が大きなため、前段の回路の負荷
が大きくなってしまう、という問題点があった。
According to the conventional technique as described above, the MOS transistor is used for the logical operation.
The input signals are both connected to the gate, and the P-type MOS transistor is shown in FIGS. 6 and 7, and the N-type MOS transistor is shown in FIGS.
Since each two transistors are connected in series, the delay time (t PD ) of the logic circuit increases and the area also increases. Further, since the gate capacitance is large, there is a problem that the load of the circuit at the previous stage becomes large.

【0011】また、前記問題点のうち面積の縮小を目的
とした「特開平2−271714」に示された最新の従
来技術の回路構成ではNORやNAND回路は構成でき
ず、図12,13の前または後にインバータ回路を接続
したような構成をとらねばならず、面積縮小の効果が得
られない。しかも根本的な問題として、図10,12で
はB=L、図11,13ではB=Hの時、実際には出力
はフローティング状態で確定しないため、この回路では
「特開平2−271714」で期待されている論理動作
を行えない、という問題点があった。
Further, among the above-mentioned problems, NOR and NAND circuits cannot be constructed with the latest prior art circuit configuration shown in "Japanese Patent Laid-Open No. 2-2771414" for the purpose of reducing the area. A structure in which an inverter circuit is connected before or after must be taken, and the effect of area reduction cannot be obtained. Moreover, as a fundamental problem, when B = L in FIGS. 10 and 12 and B = H in FIGS. 11 and 13, the output is not actually fixed in the floating state. There was a problem that the expected logical operation could not be performed.

【0012】[0012]

【課題を解決するための手段】2つの入力信号から論理
出力信号を生成する半導体論理回路において、ソースが
第1の入力信号端子に接続され、ゲートが第2の入力信
号端子に接続されたMOS型トランジスタを少なくとも
1つ有すること。また前記手段において、第1の入力信
号端子が接続されたMOS型トランジスタのソース部
を、同一信号が入力される他のMOS型トランジスタの
ソース部とマスクパタン上共通にすること。
In a semiconductor logic circuit for generating a logic output signal from two input signals, a MOS having a source connected to a first input signal terminal and a gate connected to a second input signal terminal. Have at least one type transistor. Further, in the above means, the source portion of the MOS transistor connected to the first input signal terminal is commonly used as a mask pattern with the source portion of another MOS transistor to which the same signal is input.

【0013】[0013]

【実施例1】次に本発明について図面を参照して説明す
る。
Embodiment 1 Next, the present invention will be described with reference to the drawings.

【0014】図1は本発明の実施例1を示す回路図であ
る。この実施例はソース部が第1の信号入力端子Aに接
続され、ゲート部が第2の信号入力端子Bに接続され、
ドレイン部が出力信号端子OUTに接続されたP型の第
1のMOSトランジスタP11と、ソース部が低電位側の
電源供給端子GNDに接続され、ゲート部が第2の信号
入力端子Bに接続され、ドレイン部が出力信号端子OU
Tに接続されたN型の第2のMOSトランジスタN
11と、ソース部が低電位側の電源供給端子に接続され、
ゲート部が高電位側の電源供給端子VCCに接続され、
ドレイン部が出力信号端子OUTと接続されたN型の第
3のMOSトランジスタN12とを有する構成となってい
る。
FIG. 1 is a circuit diagram showing a first embodiment of the present invention. In this embodiment, the source part is connected to the first signal input terminal A and the gate part is connected to the second signal input terminal B.
The drain portion is connected to the output signal terminal OUT, the P-type first MOS transistor P 11 , the source portion is connected to the low-potential-side power supply terminal GND, and the gate portion is connected to the second signal input terminal B. And the drain is the output signal terminal OU
N-type second MOS transistor N connected to T
11 , the source part is connected to the power supply terminal on the low potential side,
The gate is connected to the power supply terminal VCC on the high potential side,
The drain portion has an N-type third MOS transistor N 12 connected to the output signal terminal OUT.

【0015】次にこの実施例の動作について説明する。Next, the operation of this embodiment will be described.

【0016】第1の入力信号端子AがLレベルすなわち
低電位側にあるときは、トランジスタP11は常にOFF
状態であり、第2の入力信号端子BがHレベルすなち高
電位側にある時はトランジスタN11はON状態となり、
出力信号端子OUTはLレベルとなる。また、第2の入
力信号端子BがLレベルの時はP11,N11ともOFF状
態となるが、ゲート部が高電位電源端子にあるため常に
ON状態であるトランジスタN12により、出力信号端子
OUTはフローティング状態にはならず、Lレベルを出
力する。
When the first input signal terminal A is at L level, that is, on the low potential side, the transistor P 11 is always off.
In this state, when the second input signal terminal B is at the H level, that is, on the high potential side, the transistor N 11 is in the ON state,
The output signal terminal OUT becomes L level. Further, when the second input signal terminal B is at L level, both P 11 and N 11 are in the OFF state, but since the gate portion is at the high potential power supply terminal, the transistor N 12 which is always in the ON state causes the output signal terminal OUT does not enter a floating state and outputs L level.

【0017】次に、第1の入力信号端子AがHレベルに
ある時は、第2の入力信号端子BがHレベルの時はトラ
ンジスタP11はOFF、N11,N12はONなので出力信
号端子OUTはLレベルとなる。第2の入力信号端子B
がLレベルの時はトランジスタP11,N12はON,N11
はOFFとなり、この時トランジスタN12のサイズがト
ランジスタP11のサイズに比べて充分に小さい、すなわ
ちON状態での抵抗成分が充分に大きいとすれば、出力
信号端子OUTはHレベルを出力する。
Next, when the first input signal terminal A is at the H level, when the second input signal terminal B is at the H level, the transistor P 11 is OFF and N 11 and N 12 are ON, so that the output signal is output. The terminal OUT becomes L level. Second input signal terminal B
Is at L level, the transistors P 11 and N 12 are ON and N 11
Is OFF, and at this time, if the size of the transistor N 12 is sufficiently smaller than the size of the transistor P 11 , that is, the resistance component in the ON state is sufficiently large, the output signal terminal OUT outputs the H level.

【0018】従って、この実施例は2入力信号A,Bの
4通りの組み合わせに対し、A=H,B=Lの選択状態
の時のみHレベルを出力し、それ以外の時はLレベルを
出力するという図6,7で示したNOR回路と同等の論
理動作を行う。
Therefore, in this embodiment, for four combinations of two input signals A and B, the H level is output only when A = H and B = L are selected, and otherwise the L level is output. The same logical operation as the NOR circuit shown in FIGS. 6 and 7 of outputting is performed.

【0019】このとき図1と図6を比較して明らかなよ
うに本実施例の方が素子数が少なくて済み面積縮小の効
果が得られる。また本実施例では図6のトランジスタP
61,P62の様な直列接続が存在しないのでtPDの高速化
がはかれる。
At this time, as is clear from comparison between FIG. 1 and FIG. 6, the number of elements is smaller in this embodiment and the effect of area reduction can be obtained. Further, in this embodiment, the transistor P of FIG.
Since there is no series connection like 61 and P 62 , t PD can be speeded up.

【0020】実際、図6の回路のトランジスタP61,P
62のサイズが30μm、N61,N62のサイズが15μ
m、負荷容量が0.1pFの場合と比較して、図1の回
路はトランジスタP11のサイズが20μm、N11のサイ
ズが10μm、N12のサイズが2μmでtPDが0.25
nsから0.2nsへと20%改善する。かつ、この数
値例からわかるように従来の回路以上の性能を得るため
に素子数が少なくてすむだけでなく素子サイズ自身も小
さくてすみ、さらなる面積縮小の効果が得られる。
In fact, the transistors P 61 , P of the circuit of FIG.
The size of 62 is 30 μm, and the size of N 61 and N 62 is 15 μm
1 and the load capacitance is 0.1 pF, the circuit of FIG. 1 has a transistor P 11 size of 20 μm, N 11 size of 10 μm, N 12 size of 2 μm and t PD of 0.25.
20% improvement from ns to 0.2 ns. Further, as can be seen from this numerical example, not only the number of elements is small in order to obtain the performance higher than that of the conventional circuit, but also the element size itself is small, and the effect of further area reduction can be obtained.

【0021】また、従来例MOSトランジスタのゲート
容量とソース・ドレイン部の拡散容量では拡散容量の方
が大きかったが、近年の微細化技術によるゲート酸化膜
の薄膜化によるゲート容量の増大および拡散層の面積の
縮小や深さ方向の薄層化による底面・側面容量の低下に
より、ゲート容量と拡散容量がほぼ同等となってきてい
る。このため、本実施例の回路を従来例と置き換えて使
用する分には何ら問題ないだけでなく、本実施例の回路
が図2の様に、入力信号端子Aが複数の回路で共通に接
続されている場合、図3の様にソース部をマスクデータ
上共通にすることにより前段の回路(入力信号Aを発生
させる回路)からみた負荷を半減させることができる。
Further, although the diffusion capacitance is larger in the gate capacitance and the diffusion capacitance of the source / drain portion of the conventional MOS transistor, the gate capacitance is increased and the diffusion layer is increased by thinning the gate oxide film by the recent miniaturization technique. The gate capacitance and the diffusion capacitance are becoming almost equal due to the reduction of the bottom and side capacitances due to the reduction of the area and thinning in the depth direction. Therefore, there is no problem in using the circuit of the present embodiment in place of the conventional example, and the circuit of the present embodiment has the input signal terminal A commonly connected to a plurality of circuits as shown in FIG. In this case, by making the source part common to the mask data as shown in FIG. 3, it is possible to reduce the load seen from the circuit in the previous stage (the circuit which generates the input signal A) by half.

【0022】図4は本実施例のNAND回路(BiCM
OS構成)の1例である。この場合は入力信号端子Aが
Hレベル、入力信号端子BがLレベルの時のみ出力信号
端子OUTがLレベルとなり、それ以外の時はHレベル
を出力するという図8,9で示したNAND回路と同等
の回路動作を行う。
FIG. 4 shows the NAND circuit (BiCM) of this embodiment.
This is an example of the OS configuration). In this case, the output signal terminal OUT is at the L level only when the input signal terminal A is at the H level and the input signal terminal B is at the L level, and the H level is output otherwise, the NAND circuit shown in FIGS. Performs circuit operation equivalent to.

【0023】[0023]

【実施例2】図5は本発明の実施例2を示す回路図であ
る。
Second Embodiment FIG. 5 is a circuit diagram showing a second embodiment of the present invention.

【0024】図1に示す実施例1では、入力信号端子A
がHレベル、BがLレベルの時トランジスタP11とN12
が共にON状態となるため、入力信号端子Aから低電位
側電源端子に電流が流れ、回路数が多ければパワーの増
加につながる可能性がある。また、この電流と入力信号
A自身の配線抵抗とトランジスタP11のON状態での抵
抗成分で出力信号端子OUTのHレベルが多少電位ドロ
ップしてしまう。
In the first embodiment shown in FIG. 1, the input signal terminal A is
Is H level and B is L level, transistors P 11 and N 12
Are both turned on, a current flows from the input signal terminal A to the low-potential-side power supply terminal, which may lead to an increase in power if the number of circuits is large. Further, the H level of the output signal terminal OUT drops to some extent due to the current, the wiring resistance of the input signal A itself, and the resistance component of the transistor P 11 in the ON state.

【0025】実施例2はこういった問題を解消すべく発
明されたものであり、図1では高電位側の電源端子に接
続されていたトランジスタN12のゲート部を、入力信号
AをCMOSインバータ回路INV1で反転させた信号
に接続した構成となっている。
The second embodiment was invented to solve such a problem. In FIG. 1, the gate portion of the transistor N 12 connected to the power supply terminal on the high potential side is supplied to the CMOS inverter of the input signal A. The circuit is connected to the signal inverted by the circuit INV1.

【0026】これにより、トランジスタN12は入力信号
AがLレベルの時のみON状態となり上記電流は0とな
る。実際には実施例1に比べINV1分だけ面積の増加
が生じるが、このインバータは小さなサイズでよく、ま
た図2の様な複数の回路に共通に入力信号Aが接続され
ている場合にもこのインバータは1個でよいので、この
面積の増加はほとんど問題にならない。
As a result, the transistor N 12 is turned on only when the input signal A is at L level, and the current becomes zero. Actually, the area is increased by INV1 as compared with the first embodiment, but this inverter may have a small size, and also when the input signal A is commonly connected to a plurality of circuits as shown in FIG. Since only one inverter is required, this increase in area is not a problem.

【0027】[0027]

【発明の効果】以上述べてきたように、本発明は2入力
の半導体論理回路装置において入力信号の一方をMOS
トランジスタのソース部に接続することで、論理回路の
遅延時間の高速化および素子数減による占有面積の縮小
という効果を得ることができる。また、マスクデータ上
工夫することにより前段の回路からみた負荷を従来の半
分に減少させる効果も得られる。
As described above, according to the present invention, in a 2-input semiconductor logic circuit device, one of the input signals is MOS.
By connecting to the source portion of the transistor, it is possible to obtain the effect of shortening the delay time of the logic circuit and reducing the occupied area by reducing the number of elements. Further, by devising the mask data, it is possible to obtain the effect of reducing the load seen from the circuit in the previous stage to half that of the conventional one.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1を示す回路図、FIG. 1 is a circuit diagram showing a first embodiment of the present invention,

【図2】本発明の実施例1の使用例を示す回路図、FIG. 2 is a circuit diagram showing a usage example of the first embodiment of the present invention,

【図3】図2の回路図のマスクパタンを示す図、3 is a diagram showing a mask pattern of the circuit diagram of FIG. 2;

【図4】本発明の実施例1の応用例を示す回路図、FIG. 4 is a circuit diagram showing an application example of the first embodiment of the present invention,

【図5】本発明の実施例2を示す回路図、FIG. 5 is a circuit diagram showing a second embodiment of the present invention,

【図6】従来例を示す回路図、FIG. 6 is a circuit diagram showing a conventional example,

【図7】従来例を示す回路図、FIG. 7 is a circuit diagram showing a conventional example,

【図8】従来例を示す回路図、FIG. 8 is a circuit diagram showing a conventional example,

【図9】従来例を示す回路図、FIG. 9 is a circuit diagram showing a conventional example,

【図10】従来例を示す回路図、FIG. 10 is a circuit diagram showing a conventional example,

【図11】従来例を示す回路図、FIG. 11 is a circuit diagram showing a conventional example,

【図12】従来例を示す回路図、FIG. 12 is a circuit diagram showing a conventional example,

【図13】従来例を示す回路図。FIG. 13 is a circuit diagram showing a conventional example.

【符号の説明】 A,B,B1,B2 入力信号端子 OUT,OUT1,OUT2 出力信号端子 P11,P61,P62 P型MOSトランジスタ N11,N12,N61,N62 N型MOSトランジスタ INV1 インバータ回路[Description of reference signs] A, B, B1, B2 input signal terminals OUT, OUT1, OUT2 output signal terminals P 11 , P 61 , P 62 P-type MOS transistors N 11 , N 12 , N 61 , N 62 N-type MOS transistors INV1 inverter circuit

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 2つの入力信号から論理出力信号を生成
する半導体論理回路において、ソースが第1の入力信号
端子に接続され、ゲートが第2の入力信号端子に接続さ
れたMOS型トランジスタを少なくとも1つ有すること
を特徴とする半導体論理回路装置。
1. A semiconductor logic circuit for generating a logic output signal from two input signals, comprising at least a MOS type transistor having a source connected to a first input signal terminal and a gate connected to a second input signal terminal. A semiconductor logic circuit device having one.
【請求項2】 請求項1で記した半導体論理回路装置に
おいて、第1の入力信号端子が接続されたMOS型トラ
ンジスタのソース部を、同一信号が入力される他のMO
S型トランジスタのソース部とマスクパタン上共通にし
たことを特徴とする半導体論理回路装置。
2. The semiconductor logic circuit device according to claim 1, wherein the source portion of the MOS transistor to which the first input signal terminal is connected is connected to another MO to which the same signal is input.
A semiconductor logic circuit device characterized in that the source portion of an S-type transistor and a mask pattern are commonly used.
【請求項3】 請求項1で記した半導体論理回路装置に
おいて、第1の入力信号と第2の入力信号の論理の組み
合わせによりMOSトランジスタがOFF状態になった
時、出力信号を確定させるために、出力端子と電源間に
常ON状態の第2のMOSトランジスタを有することを
特徴とする半導体論理回路装置。
3. The semiconductor logic circuit device according to claim 1, wherein when the MOS transistor is turned off by the combination of the logics of the first input signal and the second input signal, the output signal is determined. , A semiconductor logic circuit device having a normally-on second MOS transistor between the output terminal and the power supply.
【請求項4】 請求項3で記した第2のMOSトランジ
スタのゲート部に該第1の入力信号の逆相信号を入力す
ることを特徴とする半導体論理回路装置。
4. A semiconductor logic circuit device, wherein a reverse phase signal of the first input signal is input to the gate portion of the second MOS transistor described in claim 3.
JP5096358A 1993-04-23 1993-04-23 Semiconductor logic circuit device Expired - Fee Related JP2590681B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5096358A JP2590681B2 (en) 1993-04-23 1993-04-23 Semiconductor logic circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5096358A JP2590681B2 (en) 1993-04-23 1993-04-23 Semiconductor logic circuit device

Publications (2)

Publication Number Publication Date
JPH06311022A true JPH06311022A (en) 1994-11-04
JP2590681B2 JP2590681B2 (en) 1997-03-12

Family

ID=14162776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5096358A Expired - Fee Related JP2590681B2 (en) 1993-04-23 1993-04-23 Semiconductor logic circuit device

Country Status (1)

Country Link
JP (1) JP2590681B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0495102B1 (en) * 1990-08-07 1996-01-31 Mitsubishi Materials Corporation Surge-absorbing element for protection against overvoltage and overcurrent
JP2003526983A (en) * 2000-03-07 2003-09-09 ハネウェル・インターナショナル・インコーポレーテッド High-speed logic family
JP2011234157A (en) * 2010-04-28 2011-11-17 Elpida Memory Inc Semiconductor device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4562515B2 (en) 2004-12-22 2010-10-13 ルネサスエレクトロニクス株式会社 Logic circuit and word driver circuit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6362412A (en) * 1986-09-02 1988-03-18 Mitsubishi Electric Corp Logical gate circuit
JPH01144724A (en) * 1987-11-30 1989-06-07 Nec Corp Logical operating circuit
JPH02271714A (en) * 1989-04-12 1990-11-06 Nec Corp Logic circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6362412A (en) * 1986-09-02 1988-03-18 Mitsubishi Electric Corp Logical gate circuit
JPH01144724A (en) * 1987-11-30 1989-06-07 Nec Corp Logical operating circuit
JPH02271714A (en) * 1989-04-12 1990-11-06 Nec Corp Logic circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0495102B1 (en) * 1990-08-07 1996-01-31 Mitsubishi Materials Corporation Surge-absorbing element for protection against overvoltage and overcurrent
JP2003526983A (en) * 2000-03-07 2003-09-09 ハネウェル・インターナショナル・インコーポレーテッド High-speed logic family
JP2011234157A (en) * 2010-04-28 2011-11-17 Elpida Memory Inc Semiconductor device

Also Published As

Publication number Publication date
JP2590681B2 (en) 1997-03-12

Similar Documents

Publication Publication Date Title
EP0180776A2 (en) Chip-on-chip semiconductor device
JP3705880B2 (en) Level converter and semiconductor device
US6661274B1 (en) Level converter circuit
EP0651511B1 (en) Semiconductor device having a combination of CMOS circuit and bipolar circuits
JPH0567963A (en) Logic integrated circuit
US5327022A (en) Multiplexer circuit less liable to malfunction
JPH06311022A (en) Semiconductor logic circuit device
US6363505B1 (en) Programmable control circuit for grounding unused outputs
JPH09214324A (en) CMOS logic circuit
JP2830244B2 (en) Tri-state buffer circuit
JPH09161486A (en) Semiconductor integrated circuit device
JPH05300007A (en) Two-input or circuit
JPH04145720A (en) Logic circuit
JPH0834427B2 (en) Logic circuit
JPH05300006A (en) Two-input and circuit
US6946875B2 (en) Universal logic module and ASIC using the same
JP2845665B2 (en) Output buffer circuit
JP2599396B2 (en) Exclusive logic circuit
US20020089354A1 (en) Apparatus and method of providing a four input logic function
US7205795B2 (en) Semiconductor device having universal logic cell
JP2527199Y2 (en) IC test mode setting circuit
KR100234411B1 (en) Rs latch circuit
JPH03159313A (en) Output circuit and semiconductor integrated circuit device
JPH05198751A (en) Semiconductor integrated circuit device
JPH07297290A (en) Semiconductor integrated circuit device

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19961022

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071219

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081219

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091219

Year of fee payment: 13

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091219

Year of fee payment: 13

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101219

Year of fee payment: 14

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101219

Year of fee payment: 14

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101219

Year of fee payment: 14

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111219

Year of fee payment: 15

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111219

Year of fee payment: 15

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121219

Year of fee payment: 16

LAPS Cancellation because of no payment of annual fees