JPH06307810A - Optical displacement meter - Google Patents
Optical displacement meterInfo
- Publication number
- JPH06307810A JPH06307810A JP10083793A JP10083793A JPH06307810A JP H06307810 A JPH06307810 A JP H06307810A JP 10083793 A JP10083793 A JP 10083793A JP 10083793 A JP10083793 A JP 10083793A JP H06307810 A JPH06307810 A JP H06307810A
- Authority
- JP
- Japan
- Prior art keywords
- displacement
- signal
- circuit
- detection
- cpu
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
(57)【要約】
【目的】 光量変化があっても被測定物の変位量を高精
度で測定すること。
【構成】 被測定物6の表面の変位に対応して移動する
被測定物6の表面からの反射光を受光し、光電変換する
位置検出素子3と、位置検出素子3からの信号I1 ,I
2 を前記変位を演算するために必要なレベルまで増幅す
る利得制御可能な増幅回路14,15と、増幅回路1
4,15からの出力信号レベルを間欠的に検出する検出
手段としてのA/D変換回路18,CPU13,信号I
1 ,I2 のレベルの検出値が得られる毎に、その検出値
に基づいて、信号I1 ,I2 レベルが測定可能範囲内に
収まるように増幅回路14,15の利得を更新する手段
としてのCPU13とを具える。
(57) [Summary] [Purpose] To measure the displacement of the measured object with high accuracy even if the light intensity changes. [Structure] A position detection element 3 for receiving and photoelectrically converting reflected light from the surface of the DUT 6 which moves in response to displacement of the surface of the DUT 6, and a signal I 1 from the position detection element 3, I
Gain controllable amplification circuits 14 and 15 for amplifying 2 to a level necessary for calculating the displacement, and amplification circuit 1
A / D conversion circuit 18, CPU 13, and signal I as detecting means for intermittently detecting the output signal levels from 4, 15
As means for updating the gains of the amplifier circuits 14 and 15 based on the detected values of the levels of 1 and I 2 so that the levels of the signals I 1 and I 2 are within the measurable range, based on the detected values. CPU 13 of.
Description
【0001】[0001]
【産業上の利用分野】この発明は光量変化があっても被
測定物の変位量を高精度で測定する光学式変位計に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical displacement meter for measuring the displacement amount of an object to be measured with high accuracy even if the light amount changes.
【0002】[0002]
【従来の技術】レーザ変位計は非接触に被測定物の距離
(変位量)を高精度に測定することができる。測定原理
は光学的に三角測量に基づいている。そのため測定精度
は被測定物の色等による影響は少ないとされている。し
かし、要求測定精度が50μmより高精度になると、被
測定物の表面状態(光沢の有無、汚れの有無など)によ
り、反射光量が大幅に変化する。すると、前記精度を維
持することは電気的信号が飽和することまたは逆にノイ
ズ比(S/N)が悪くなることによって困難となる。そ
こで、従来は測定開始前に外部または手動で、被測定物
により最適ゲイン設定を行い(ティーチング)測定を開
始していた。従来機器ではこの動作は通常作業開始直後
に1回行われるのみで、測定不能の警報が出力されるま
で更新されなかった。2. Description of the Related Art A laser displacement meter can measure a distance (displacement amount) of an object to be measured with high accuracy in a non-contact manner. The measuring principle is optically based on triangulation. Therefore, it is said that the measurement accuracy is less affected by the color of the measured object. However, when the required measurement accuracy is higher than 50 μm, the amount of reflected light changes significantly depending on the surface condition (presence or absence of gloss, presence or absence of dirt, etc.) of the measured object. Then, it is difficult to maintain the accuracy because the electric signal is saturated or the noise ratio (S / N) is deteriorated. Therefore, conventionally, the optimum gain setting (teaching) is started by the object to be measured externally or manually before starting the measurement. In the conventional device, this operation was performed only once immediately after the start of the normal work, and was not updated until the unmeasurable alarm was output.
【0003】[0003]
【発明が解決しようとする課題】従来装置では、例えば
シート状の連続しているものの厚みを測定する場合に、
被測定物の表面状態の変化に追従することができず、そ
のため知らないうちに測定精度が悪くなっており、不良
もしくは不良に極めて近い製品を多量に作ってしまった
り、もしくは頻繁に測定不能アラームを発生し人手をか
けて再設定しなければならないという不都合を生じてい
た。In the conventional apparatus, for example, when measuring the thickness of a continuous sheet-like object,
It is not possible to follow changes in the surface condition of the object to be measured, so the measurement accuracy has deteriorated without knowing it, and a large number of defective or extremely close to defective products have been made, or frequent unmeasurable alarms. However, there was an inconvenience that it was necessary to manually reconfigure.
【0004】そこで本発明の目的は以上のような問題を
解消した光学式変位計を提供することにある。Therefore, an object of the present invention is to provide an optical displacement meter which solves the above problems.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するため
本発明は被測定物表面の変位に対応して移動する当該被
測定物表面からの反射光を受光し、光電変換する位置検
出手段と、該位置検出手段からの信号を前記変位を演算
するために必要なレベルまで増幅する利得制御可能な増
幅手段と、該増幅手段からの出力信号レベルを間欠的に
検出する検出手段と、該検出手段により前記増幅手段か
らの出力信号レベルの検出値が得られる毎に、当該検出
値に基づいて、当該出力信号レベルが測定可能範囲内に
収まるように前記増幅手段の利得を更新する手段とを具
えたことを特徴とする。In order to achieve the above object, the present invention provides a position detecting means for receiving and photoelectrically converting the reflected light from the surface of the object to be measured which moves in response to the displacement of the surface of the object to be measured. A gain controllable amplification means for amplifying a signal from the position detection means to a level necessary for calculating the displacement, a detection means for intermittently detecting an output signal level from the amplification means, and the detection Each time the detection value of the output signal level from the amplification means is obtained by the means, means for updating the gain of the amplification means so that the output signal level falls within the measurable range based on the detection value. It is characterized by having
【0006】[0006]
【作用】本発明によれば、例えば増幅手段からの出力信
号レベルを周期的に検出し、その検出値が得られる毎に
当該出力信号レベルが測定可能範囲内に収まるように増
幅手段の利得を更新する。According to the present invention, for example, the output signal level from the amplifying means is periodically detected, and the gain of the amplifying means is adjusted so that the output signal level falls within the measurable range each time the detected value is obtained. Update.
【0007】[0007]
【実施例】以下、図面を参照して本発明の実施例を詳細
に説明する。Embodiments of the present invention will now be described in detail with reference to the drawings.
【0008】図1は本発明の実施例にかかるレーザ変位
計のシステム構成図である。1はセンサ部であって、半
導体レーザ(LD)2と位置検出素子3とを有し、半導
体レーザ2は詳細は後述する駆動信号に応答する駆動回
路4によって駆動されて発光する。半導体レーザ2から
の光はレンズ5によって集束して被測定物6に照射さ
れ、そこで反射し、レンズ7を通して位置検出素子3に
受光される。位置検出素子3からの位置I1 および位置
I2 における2つの検出信号は増幅回路8で増幅され、
出力される。9は温度センサである。FIG. 1 is a system configuration diagram of a laser displacement meter according to an embodiment of the present invention. Reference numeral 1 denotes a sensor unit, which has a semiconductor laser (LD) 2 and a position detection element 3, and the semiconductor laser 2 is driven by a drive circuit 4 which responds to a drive signal, which will be described later in detail, and emits light. The light from the semiconductor laser 2 is focused by the lens 5 and applied to the DUT 6, is reflected there, and is received by the position detection element 3 through the lens 7. The two detection signals at the position I 1 and the position I 2 from the position detecting element 3 are amplified by the amplifier circuit 8,
Is output. 9 is a temperature sensor.
【0009】10はコントローラであって、以下のよう
な構成を有する。11は利得制御判定回路であって、半
導体レーザ2に近接して設けられたフォトダイオードか
らの半導体レーザ2の発光光量検出信号と、増幅回路8
からの位置I1 の検出信号および位置I2 の検出信号を
加算した加算回路12からの加算信号とを入力し、そこ
で発光光量検出信号と加算信号との比を求めて高速動作
するCPU13に入力する。増幅回路8からの位置I1
およびI2 の検出信号はCPU13からの制御信号によ
るゲイン可変の増幅回路14および15によって増幅さ
れ、これらを加算する加算回路16および減算する減算
回路17に入力される。加算回路16,減算回路17お
よび温度センサ9の各出力信号はA/D変換回路18に
よってデジタルデータに変換され、CPU13に入力さ
れる。CPU13は加算回路16の出力および減算回路
17の出力に基づいて周知の手法により被測定物6の表
面の変位量(A−B)を演算し、結果を外部にデジタル
出力し、D/A変換回路19を介してアナログ出力し、
さらに、表示器20上に表示する。また、CPU13は
温度センサ9によって半導体レーザ2の温度を監視す
る。21は光量制御回路であって、本レーザ変位計の動
作開始時は基準値22に基づいた駆動信号を発生して駆
動回路4に入力し(これによって、半導体レーザ2は所
定発光量で発光する)、以後は基準値22と加算回路1
6からの信号値との差に基づいて半導体レーザ2に所定
発光量が得られるように駆動信号を発生する。23はタ
イマであって、設定時間毎にカウントアップして割込み
信号をCPU13に入力する。設定時間、すなわち割込
み時間間隔は、被測定物の長さとか、搬送速度等によっ
て求め、キーボード,ディップスイッチ等の設定器によ
って設定し、CPU13を介してタイマ23にセットす
る。A controller 10 has the following structure. Reference numeral 11 denotes a gain control determination circuit, which detects a light emission amount detection signal of the semiconductor laser 2 from a photodiode provided close to the semiconductor laser 2 and an amplifier circuit 8.
The detection signal of the position I 1 and the detection signal of the position I 2 are added, and the addition signal from the addition circuit 12 is input, and the ratio between the emission light amount detection signal and the addition signal is calculated there To do. Position I 1 from amplifier circuit 8
The detection signals of I 2 and I 2 are amplified by the gain variable amplification circuits 14 and 15 according to the control signal from the CPU 13, and are input to the addition circuit 16 for adding these and the subtraction circuit 17 for subtracting them. The output signals of the adder circuit 16, the subtractor circuit 17 and the temperature sensor 9 are converted into digital data by the A / D conversion circuit 18 and input to the CPU 13. The CPU 13 calculates the displacement amount (AB) of the surface of the DUT 6 by a well-known method based on the output of the addition circuit 16 and the output of the subtraction circuit 17, and digitally outputs the result to D / A conversion. Analog output via circuit 19,
Furthermore, it displays on the display 20. Further, the CPU 13 monitors the temperature of the semiconductor laser 2 with the temperature sensor 9. Reference numeral 21 denotes a light amount control circuit, which generates a drive signal based on a reference value 22 and inputs it to the drive circuit 4 when the operation of the laser displacement meter is started (the semiconductor laser 2 emits light with a predetermined light emission amount). ), And thereafter the reference value 22 and the addition circuit 1
Based on the difference from the signal value from 6, a drive signal is generated so that the semiconductor laser 2 can obtain a predetermined amount of light emission. A timer 23 counts up every set time and inputs an interrupt signal to the CPU 13. The set time, that is, the interrupt time interval, is obtained from the length of the object to be measured, the transport speed, etc., is set by a setter such as a keyboard or dip switch, and is set in the timer 23 via the CPU 13.
【0010】ついで、図2に基づいてタイマ割込み時の
CPUの動作について説明する。Next, the operation of the CPU at the time of timer interruption will be described with reference to FIG.
【0011】タイマ割込みが発生すると、まず、そのと
きの増幅器14および15のゲインがどのレベルに設定
されているかを読み込む(S1)。ついで本レーザ変位
計のセンサ部1が被測定物6に対して測定範囲内の位置
にあるか否か(すなわち、遠すぎるか近すぎる場合は測
定範囲外)をA/D変換回路18を介して得られた位置
検出素子3の受光信号に基づく2つの増幅回路14,1
5からの信号の加算レベルに基づいて判断し(S2)、
測定範囲内であれば、2つの増幅回路14,15からの
信号の加算レベルおよび減算レベルに基づいて測定可能
であるための受光量が得られていないか、すなわち、受
光量不足か否かを、または受光量過多か否かを判断し
(S3,S4)、受光量不足のときは、そのときの増幅
回路14,15のゲインが最大か否かを判断し(S
5)、最大でなければ1ランクゲインをアップする信号
を増幅回路14,15に出力し(S6)、ついで受光量
不足が解消したか否かを判断し(S7)、解消するまで
S5〜S7を繰返す。一方、S4で受光量過多のとき
は、そのときの増幅回路14,15のゲインが最小か否
かを判断し(S8)、最小でなければ1ランクゲインを
ダウンする信号を増幅回路14,15に出力し(S
9)、ついで受光量過多が解消したか否かを判断し(S
10)、解消するまでS8〜S10を繰返す。増幅回路
14,15のゲインが最大で受光量不足のとき(S5)
および増幅回路14,15のゲインが最小で受光量過多
のとき(S8)は、測定対象外となる。When a timer interrupt occurs, first, the level at which the gains of the amplifiers 14 and 15 at that time are set is read (S1). Then, whether or not the sensor unit 1 of the laser displacement meter is in a position within the measurement range with respect to the DUT 6 (that is, outside the measurement range when it is too far or too close) is determined via the A / D conversion circuit 18. Two amplifier circuits 14 and 1 based on the received light signal of the position detection element 3 obtained by
Judgment is made based on the addition level of the signal from 5 (S2),
If it is within the measurement range, it is determined whether or not the received light amount for measuring can be obtained based on the addition level and the subtraction level of the signals from the two amplifier circuits 14 and 15, that is, whether or not the received light amount is insufficient. , Or whether the amount of received light is excessive (S3, S4), and when the amount of received light is insufficient, it is determined whether the gains of the amplifier circuits 14 and 15 at that time are maximum (S3).
5) If not maximum, a signal for increasing the rank gain by 1 is output to the amplifier circuits 14 and 15 (S6), and then it is determined whether or not the insufficient received light amount has been resolved (S7). Repeat. On the other hand, when the amount of received light is excessive in S4, it is determined whether or not the gains of the amplifier circuits 14 and 15 at that time are minimum (S8). Output to (S
9) Then, it is judged whether or not the excessive amount of received light has been resolved (S
10), S8 to S10 are repeated until the problem is resolved. When the gains of the amplifier circuits 14 and 15 are maximum and the amount of received light is insufficient (S5)
Also, when the gains of the amplifier circuits 14 and 15 are minimum and the amount of received light is excessive (S8), it is not measured.
【0012】なお増幅回路14,15のゲイン切換え
は、ごく一般的な方法であり、例えばオペアンプの帰還
抵抗をアナログスイッチで切換えるものである。その切
換え信号はCPU13から供給する。別の手法としては
増幅回路にゲイン切換え機能を内蔵したオペアンプを使
用してもよい。The gain switching of the amplifier circuits 14 and 15 is a very general method, for example, the feedback resistance of an operational amplifier is switched by an analog switch. The switching signal is supplied from the CPU 13. As another method, an operational amplifier having a gain switching function built into an amplifier circuit may be used.
【0013】以上のように、例えば連続して流れるシー
ト材のようなものの厚さ,段差等を測定する際には被測
定物の表面状態が変化すると、従来は測定誤差を生じて
いた。しかし、前述したように本発明によれば、例えば
一定周期毎に反射光量をチェックし、その時に常に増幅
回路の利得が最適になるように制御することにより、測
定誤差を生ぜず、高精度の測定が行える。よって従来方
法では警報等が頻繁に発生し、一々人手によってゲイン
の修正を行っていたのが本発明では不用となり、生産効
率が向上する。さらには生産物の品質も高精度に維持す
ることが可能となる。As described above, when measuring the thickness, step, etc. of a continuously flowing sheet material, for example, if the surface condition of the object to be measured changes, a measurement error has conventionally occurred. However, as described above, according to the present invention, for example, the amount of reflected light is checked at regular intervals, and by controlling the gain of the amplifier circuit to be always optimum at that time, a measurement error does not occur and a high accuracy is obtained. Can measure. Therefore, in the conventional method, an alarm or the like is frequently generated, and the gain is manually corrected one by one, but it is unnecessary in the present invention, and the production efficiency is improved. Furthermore, the quality of the product can be maintained with high accuracy.
【0014】[0014]
【発明の効果】以上説明したように本発明によれば、光
量変化があっても被測定物の変位量を高精度で測定する
ことができる。As described above, according to the present invention, the displacement amount of the object to be measured can be measured with high accuracy even if the light amount changes.
【図1】本発明の実施例のブロック図である。FIG. 1 is a block diagram of an embodiment of the present invention.
【図2】同実施例の動作を示すフローチャートである。FIG. 2 is a flow chart showing the operation of the embodiment.
2 半導体レーザ 3 位置検出素子 13 CPU 14,15 増幅回路 16 加算回路 18 A/D変換回路 2 semiconductor laser 3 position detection element 13 CPU 14, 15 amplification circuit 16 addition circuit 18 A / D conversion circuit
Claims (1)
当該被測定物表面からの反射光を受光し、光電変換する
位置検出手段と、該位置検出手段からの信号を前記変位
を演算するために必要なレベルまで増幅する利得制御可
能な増幅手段と、該増幅手段からの出力信号レベルを間
欠的に検出する検出手段と、該検出手段により前記増幅
手段からの出力信号レベルの検出値が得られる毎に、当
該検出値に基づいて、当該出力信号レベルが測定可能範
囲内に収まるように前記増幅手段の利得を更新する手段
とを具えたことを特徴とする光学式変位計。1. A position detecting means for receiving and photoelectrically converting reflected light from the surface of the object to be measured which moves in response to the displacement of the surface of the object to be measured, and a signal from the position detecting means for calculating the displacement. A gain controllable amplification means for amplifying to a level necessary for the detection, a detection means for intermittently detecting the output signal level from the amplification means, and a detection value of the output signal level from the amplification means by the detection means. The optical displacement meter is characterized in that it comprises means for updating the gain of the amplifying means so that the output signal level falls within a measurable range based on the detected value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10083793A JPH06307810A (en) | 1993-04-27 | 1993-04-27 | Optical displacement meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10083793A JPH06307810A (en) | 1993-04-27 | 1993-04-27 | Optical displacement meter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06307810A true JPH06307810A (en) | 1994-11-04 |
Family
ID=14284434
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10083793A Pending JPH06307810A (en) | 1993-04-27 | 1993-04-27 | Optical displacement meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06307810A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006030095A (en) * | 2004-07-20 | 2006-02-02 | Keyence Corp | Optical displacement meter |
-
1993
- 1993-04-27 JP JP10083793A patent/JPH06307810A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006030095A (en) * | 2004-07-20 | 2006-02-02 | Keyence Corp | Optical displacement meter |
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