JPH06186337A - Laser distance measuring equipment - Google Patents
Laser distance measuring equipmentInfo
- Publication number
- JPH06186337A JPH06186337A JP4340596A JP34059692A JPH06186337A JP H06186337 A JPH06186337 A JP H06186337A JP 4340596 A JP4340596 A JP 4340596A JP 34059692 A JP34059692 A JP 34059692A JP H06186337 A JPH06186337 A JP H06186337A
- Authority
- JP
- Japan
- Prior art keywords
- light
- distance
- laser
- distance measuring
- modulator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、レーザ光を用いて被測
距物体までの距離を計測するレーザ測距装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laser distance measuring device for measuring a distance to an object to be measured by using a laser beam.
【0002】[0002]
【従来の技術】従来のレーザ測距装置は、図4に示すよ
うに構成されている。2. Description of the Related Art A conventional laser distance measuring device is constructed as shown in FIG.
【0003】即ち、レーザ装置1より照射されたレーザ
光は、変調器2で強度変調された後、ビームスプリッタ
3で参照光4と測距光5に二分割される。上記参照光4
は直接光検出器6に入射し、上記測距光5は被測距物体
に取り付けられたコーナキューブ7及び反射ミラー8を
経て、光検出器9に入射する。That is, the laser light emitted from the laser device 1 is intensity-modulated by the modulator 2 and then split into two by the beam splitter 3 into a reference light 4 and a distance measuring light 5. Reference light 4 above
Directly enters the photodetector 6, and the distance measuring light 5 enters the photodetector 9 through the corner cube 7 and the reflection mirror 8 attached to the object to be measured.
【0004】上記参照光4及び測距光5は、それぞれ光
検出器6,9により電気信号に変換され、フィルタ1
0,11、アンプ12,13を通過した後、ミキサ1
4,15において、局所発振器16からの周波数が異な
る信号とミックスされ、低周波信号に変換された後、計
測器17へ送られる。この計測器17は、ミキサ14,
15を介して送られてくる低周波信号から被測距物体ま
での距離を計測する。The reference light 4 and the distance measuring light 5 are converted into electric signals by the photodetectors 6 and 9, respectively, and the filter 1
0, 11 and amplifiers 12, 13 and then mixer 1
At 4 and 15, the signals from the local oscillator 16 are mixed with signals having different frequencies, converted into low frequency signals, and then sent to the measuring instrument 17. This measuring instrument 17 includes a mixer 14,
The distance from the low-frequency signal sent via 15 to the object to be measured is measured.
【0005】[0005]
【発明が解決しようとする課題】上記のように従来のレ
ーザ測距装置では、測距信号の低周波化処理を、信号が
光から電気に変換された後に行なっている。しかし、こ
の測距信号の低周波化処理を行なう電子回路は、変動を
生じ易く、このため得られる測距情報に誤差が生じると
いう問題があった。As described above, in the conventional laser distance measuring apparatus, the frequency reduction processing of the distance measuring signal is performed after the signal is converted from light to electricity. However, there is a problem in that the electronic circuit that performs the frequency reduction processing of the distance measurement signal is likely to cause fluctuations, which causes an error in the obtained distance measurement information.
【0006】本発明は上記実情に鑑みてなされたもの
で、その目的は、測距情報に誤差を生じさせる低周波化
処理のための電子回路を省略でき、測距精度を向上し得
るレーザ測距装置を提供することである。The present invention has been made in view of the above circumstances, and an object thereof is to provide a laser measuring device capable of omitting an electronic circuit for frequency reduction processing which causes an error in distance measuring information and improving distance measuring accuracy. A distance device is provided.
【0007】[0007]
【課題を解決するための手段】本発明に係るレーザ測距
装置は、測距用レーザ光を発生するレーザ装置と、この
レーザ装置から放射されるレーザ光を二分割するビーム
スプリッタと、このビームスプリッタにより二分割され
たレーザ光を強度変調する変調周波数の異なる第1の変
調器及び第2の変調器と、前記第1の変調器で強度変調
されたレーザ光を反射ミラーを備えた被測距物体に出射
し、この被測距物体から戻ってきたレーザ光と前記第2
の変調器により強度変調されたレーザ光とを干渉させ
て、前記第1及び第2の変調器の変調周波数の差の周波
数を持つビート光を作成する手段と、この手段により作
成されたビート光を検出して電気信号に変換する光検出
器と、この光検出器の出力信号から被測距物体に対する
距離情報を得る計測手段とを具備したことを特徴とす
る。A laser range finder according to the present invention comprises a laser device for generating a laser beam for range finding, a beam splitter for splitting the laser beam emitted from the laser device into two, and a beam splitter for this beam. A first modulator and a second modulator having different modulation frequencies for intensity-modulating the laser beam split by the splitter, and a laser beam intensity-modulated by the first modulator, which is provided with a reflection mirror. The laser light emitted to the range object and returned from the range object and the second
Means for producing beat light having a frequency which is the difference between the modulation frequencies of the first and second modulators by interfering with the laser light intensity-modulated by the modulator, and the beat light produced by this means It is characterized by comprising a photodetector for detecting and converting it into an electric signal, and a measuring means for obtaining distance information to the object to be measured from the output signal of the photodetector.
【0008】[0008]
【作用】レーザ装置から放射されたレーザ光は、ビーム
スプリッタで二分割され、一方は第1の変調器で強度変
調され、他方は第2の変調器で強度変調される。第1の
変調器で強度変調されたレーザ光は測距光として、反射
ミラーを備えた被測距物体に対して出射される。そし
て、被測距物体より戻ってきたレーザ光は、第2の変調
器で強度変調されたレーザ光と干渉することにより、第
1と第2の変調器の差周波の周波数を持つ低周波のビー
ト光を生じる。この低周波のビート光が光検出器により
検出されて電気信号に変換され、その後、計測手段に送
られて被測距物体に対する距離情報が求められる。The laser beam emitted from the laser device is split into two by the beam splitter, one is intensity-modulated by the first modulator and the other is intensity-modulated by the second modulator. The laser light intensity-modulated by the first modulator is emitted as distance measuring light to a distance-measuring object provided with a reflecting mirror. Then, the laser light returned from the object to be measured interferes with the laser light intensity-modulated by the second modulator, so that the low-frequency laser light having the frequency of the difference frequency between the first and second modulators is interfered with. Produces beat light. This low-frequency beat light is detected by the photodetector and converted into an electric signal, and then sent to the measuring means to obtain distance information for the object to be measured.
【0009】上記光検出器により検出される信号は、す
でに低周波信号となっており、従って、電気信号の段階
における低周波化処理が不要となり、測距精度を向上す
ることができる。The signal detected by the photodetector is already a low-frequency signal, so that the frequency-reducing process at the stage of the electric signal is unnecessary, and the distance measuring accuracy can be improved.
【0010】[0010]
【実施例】以下、図面を参照して本発明の一実施例を説
明する。図1は本発明の一実施例に係るレーザ測距装置
の構成図である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a configuration diagram of a laser distance measuring apparatus according to an embodiment of the present invention.
【0011】図1において、21はレーザ装置で、この
レーザ装置21より発射されたレーザ光は、ビームスプ
リッタ22により二分割される。このビームスプリッタ
22により二分割されたレーザ光のうち、一方は変調周
波数f1 の変調器23により強度変調されて周波数f1
の強度変調光となり、他方のレーザ光は、反射ミラー2
4を経た後、変調周波数f2 の変調器25により強度変
調され、周波数f2 の強度変調光となる。In FIG. 1, reference numeral 21 denotes a laser device, and a laser beam emitted from the laser device 21 is split into two by a beam splitter 22. One of the two laser beams divided by the beam splitter 22 is intensity-modulated by a modulator 23 having a modulation frequency f1 to generate a frequency f1.
Intensity modulated light, and the other laser light is reflected by the reflection mirror 2
After passing 4, the intensity is modulated by the modulator 25 having the modulation frequency f2 and becomes intensity-modulated light of the frequency f2.
【0012】変調周波数f1 のレーザ光は、ビームスプ
リッタ26により参照光27と測距光28とに二分割さ
れる。参照光27は、ビームスプリッタ29に入射し、
測距光は28は被測距物体(図示せず)に照射され、こ
の被測距物体に取り付けられたコーナキューブ30によ
り反射され、反射ミラー31を経てビームスプリッタ3
2に入射する。また、ビームスプリッタ29及びビーム
スプリッタ32には、上記変調器25から出力される変
調周波数f2 の変調光を入射する。The laser beam having the modulation frequency f1 is split into two beams, a reference beam 27 and a distance measuring beam 28, by the beam splitter 26. The reference light 27 is incident on the beam splitter 29,
The distance-measuring light 28 is applied to a distance-measuring object (not shown), is reflected by a corner cube 30 attached to the distance-measuring object, passes through a reflection mirror 31 and the beam splitter 3
Incident on 2. In addition, the beam splitter 29 and the beam splitter 32 enter the modulated light of the modulation frequency f2 output from the modulator 25.
【0013】上記ビームスプリッタ29及びビームスプ
リッタ32において、変調周波数f1 である参照光27
及び測距光28は、変調周波数f2 の強度変調光と干渉
することにより、周波数「f1 −f2 」のビート光3
3,34を生じる。この参照光27によるビート光33
は、光検出器35に入力され、測距光28によるビート
光34は光検出器36に入力される。In the beam splitter 29 and the beam splitter 32, the reference light 27 having the modulation frequency f1
And the distance measuring light 28 interferes with the intensity-modulated light of the modulation frequency f2 to generate the beat light 3 of the frequency "f1-f2".
Yields 3,34. Beat light 33 by this reference light 27
Is input to the photodetector 35, and the beat light 34 generated by the distance measuring light 28 is input to the photodetector 36.
【0014】参照光27及び測距光28によるビート光
33,34には位相情報が含まれているため、光検出器
35及び光検出器36において、ビート光33,34を
電気信号に変換し、その信号を計測器37において位相
計測することにより、被測距物体までの距離を求める。
次に、図2に基づいて、ビート光33,34から参照光
27及び測距光28の位相差を求める原理について説明
する。Since the beat light 33, 34 generated by the reference light 27 and the distance measuring light 28 contains phase information, the beat light 33, 34 is converted into an electric signal in the photodetector 35 and the photodetector 36. Then, the signal is phase-measured by the measuring instrument 37 to obtain the distance to the object to be measured.
Next, the principle of obtaining the phase difference between the reference light 27 and the distance measuring light 28 from the beat lights 33 and 34 will be described with reference to FIG.
【0015】図2(a)は変調周波数f1 の強度変調光
の波形を表したもので、図1における参照光27及び測
距光28にあたる。それぞれの位相をφs 、φr とする
と、参照光27及び測距光28は次式となる。 参照光:Er =Ar cos (2πf1 t+φr ) …(1) 測距光:Es =As cos (2πf1 t+φs ) …(2) 但し、Ar は参照光27の振幅、As は測距光28の振
幅である。図2(b)は、変調周波数f2 の強度変調光
の波形を示したもので、次式で表される。 E=A cos(2πf2 t+φ) …(3)FIG. 2A shows the waveform of the intensity-modulated light having the modulation frequency f1, which corresponds to the reference light 27 and the distance measuring light 28 in FIG. When the respective phases are φs and φr, the reference light 27 and the distance measuring light 28 have the following expressions. Reference light: Er = Ar cos (2πf1 t + φr) (1) Distance measuring light: Es = As cos (2πf1 t + φs) (2) where Ar is the amplitude of the reference light 27 and As is the amplitude of the distance measuring light 28. is there. FIG. 2B shows the waveform of the intensity-modulated light having the modulation frequency f2, which is expressed by the following equation. E = A cos (2πf2 t + φ) (3)
【0016】図2(a)の参照光27及び測距光28と
図2(b)の強度変調光を干渉させることにより、図2
(c)に示すようなビート光33,34が発生する。こ
のビート光33,34は光検出器35,36において電
気信号に変換される。光検出器35,36ではビート光
33,34の二乗検波が行なわれるため、図2(d)に
示すような電気信号が得られる。上記参照光27及び測
距光28より生じたビート光33,34から得られる電
気信号は、次式で表される。即ち、参照光27のビート
光33より得られる電気信号は、By interfering the reference light 27 and the distance measuring light 28 of FIG. 2A with the intensity-modulated light of FIG.
Beat lights 33 and 34 as shown in (c) are generated. The beat lights 33 and 34 are converted into electric signals by the photodetectors 35 and 36. Since the photodetectors 35 and 36 perform square-law detection of the beat lights 33 and 34, electric signals as shown in FIG. 2D are obtained. An electric signal obtained from the beat lights 33 and 34 generated by the reference light 27 and the distance measuring light 28 is expressed by the following equation. That is, the electric signal obtained from the beat light 33 of the reference light 27 is
【0017】[0017]
【数1】 で表され、測距光28のビート光34より得られる電気
信号は、[Equation 1] And the electric signal obtained from the beat light 34 of the distance measuring light 28 is
【0018】[0018]
【数2】 で表される。[Equation 2] It is represented by.
【0019】このように、ビート光33,34を光検出
器35,36で検波して得られる電気信号は、光電変換
が行なわれた時点で、既にf1 −f2 という低周波信号
に変換されており、また、元の参照光27と測距光28
の位相差は、ビート光から得られた電気信号の位相を計
測することにより次式で与えられる。参照光27と測距
光28の位相差をΔθとすると、 (φs −φ)−(φr −φ)=φs −φr =Δθ …(6) となる。次に、上記のようにして得られた位相から被測
距物体までの距離を求める原理を、図3に基づいて説明
する。As described above, the electric signals obtained by detecting the beat lights 33 and 34 by the photodetectors 35 and 36 have already been converted into low frequency signals f1 -f2 at the time of photoelectric conversion. And the original reference light 27 and distance measuring light 28
The phase difference of is calculated by measuring the phase of the electric signal obtained from the beat light by the following equation. When the phase difference between the reference light 27 and the distance measuring light 28 is Δθ, (φs−φ) − (φr−φ) = φs−φr = Δθ (6) Next, the principle of obtaining the distance to the object to be measured from the phase obtained as described above will be described with reference to FIG.
【0020】図3(a)に示すように、参照光27と測
距光28には、光路長に「L1 +2L2 +L3 」の差が
ある。ここで、測距光28の光路上において、光検出器
36及びビームスプリッタ32の光路の延長線と交わる
点をAとすると、L1 はビームスプリッタ26からA点
までの距離、L2 はA点及びビームスプリッタ32から
コーナキューブ30までの距離、L3 はコーナキューブ
30の光入射点と出射点間の距離で、L1 とL3 の値は
既知である。As shown in FIG. 3A, the reference light 27 and the distance measuring light 28 have an optical path length difference of "L1 + 2L2 + L3". Here, if the point on the optical path of the distance measuring light 28 that intersects the extension of the optical paths of the photodetector 36 and the beam splitter 32 is A, then L1 is the distance from the beam splitter 26 to point A, and L2 is the point A and The distance from the beam splitter 32 to the corner cube 30, L3 is the distance between the light incident point and the light exit point of the corner cube 30, and the values of L1 and L3 are known.
【0021】上記のように参照光27と測距光28に
は、光路長に差があるので、光検出器35で検出される
参照光27と、光検出器36で検出される測距光28に
は、図3(b)に示すように時間遅れΔTが生じる。レ
ーザ光の周期をTとすると、時間遅れΔTは次式に示す
ように位相差Δθとして求まる。 Δθ=(ΔT/T)×360 (degree) …(7) ここでレーザ光の波長をλとすると、参照光27と測距
光28の光路差は、Δθ=φs −φr より、 Δθ×λ=(φs −φr )×λ=L1 +2L2 +L3 …(8) となる。この場合、上記したようにL1 とL3 の値は既
知であるので、被測距物体までの距離L2 は、 L2 ={(φs −φr )×λ−L1 −L3 }/2 …(9) の式により求めることができる。As described above, since the reference light 27 and the distance measuring light 28 have different optical path lengths, the reference light 27 detected by the photodetector 35 and the distance measuring light detected by the photodetector 36. At 28, a time delay ΔT occurs as shown in FIG. When the period of the laser light is T, the time delay ΔT is obtained as a phase difference Δθ as shown in the following equation. Δθ = (ΔT / T) × 360 (degree) (7) Here, when the wavelength of the laser light is λ, the optical path difference between the reference light 27 and the distance measuring light 28 is Δθ = φs−φr, and Δθ × λ = (Φs-φr) × λ = L1 + 2L2 + L3 (8) In this case, since the values of L1 and L3 are known as described above, the distance L2 to the object to be measured is L2 = {(φs-φr) × λ-L1-L3} / 2 (9) It can be obtained by a formula.
【0022】例えば、100KHz の信号を、位相分解
能1degreeで計測する装置で、1mmの測距分解能を得
ようとすれば、測距光28には100MHz 程度の高周
波で強度変調を行なう必要がある。For example, if an apparatus for measuring a signal of 100 KHz with a phase resolution of 1 degree is used to obtain a distance measurement resolution of 1 mm, it is necessary to modulate the intensity of the distance measurement light 28 with a high frequency of about 100 MHz.
【0023】従来の方法では、この高周波の信号を直接
電気信号に変換した後、100KHzに変換するため、
高周波対応のフィルタ、アンプ、ミキサ及び100.1
KHz の局所発振器が必要となる。しかし、本発明で
は、100.1MHz の強度変調光と100MHz の参
照光27及び測距光28を干渉させることにより、差周
波 100.1MHz −100MHz =0.1MHz =10
0KHz のビート光を作り出し、電気信号に変換するため、直接
100KHz の電気信号が得られる。上記のようにして
本発明では、光の段階で低周波化が行なわれ、この結
果、電気信号段階での低周波化処理が不要となる。In the conventional method, since this high frequency signal is directly converted into an electric signal and then converted into 100 KHz,
High frequency compatible filter, amplifier, mixer and 100.1
A local oscillator of KHz is required. However, in the present invention, the difference frequency 100.1 MHz-100 MHz = 0.1 MHz = 10 is obtained by causing the intensity modulated light of 100.1 MHz and the reference light 27 and the distance measuring light 28 of 100 MHz to interfere with each other.
Since the beat light of 0 KHz is produced and converted into an electric signal, an electric signal of 100 KHz is directly obtained. As described above, in the present invention, the frequency reduction is performed at the light stage, and as a result, the frequency reduction process at the electric signal stage is not necessary.
【0024】[0024]
【発明の効果】以上詳記したように本発明によれば、光
の段階で低周波化を行なうことができ、電気信号の段階
における低周波化の処理回路を省略でき、信号処理回路
より生じていた測定値の変動を除去して測距精度を向上
できると共に、回路構成を簡易化することができる。ま
た、本発明は、測距精度の向上により、従来変動対策と
して必要とされていた補正・平均化処理が不要となり、
測距の高速化を図ることができる。As described above in detail, according to the present invention, it is possible to reduce the frequency at the stage of light, omit the processing circuit for reducing the frequency at the stage of electric signals, and generate by the signal processing circuit. It is possible to improve the distance measurement accuracy by eliminating the fluctuation of the measured value, and to simplify the circuit configuration. Further, the present invention, by improving the distance measurement accuracy, eliminates the need for the correction / averaging process that was conventionally required as a measure against fluctuations.
It is possible to speed up the distance measurement.
【図1】本発明の一実施例に係るレーザ測距装置の構成
図。FIG. 1 is a configuration diagram of a laser distance measuring apparatus according to an embodiment of the present invention.
【図2】同実施例におけるビート光の発生及び検波の原
理を示す図。FIG. 2 is a diagram showing the principle of beat light generation and detection in the embodiment.
【図3】同実施例における測距の原理を示す図。FIG. 3 is a diagram showing a principle of distance measurement in the embodiment.
【図4】従来のレーザ測距装置の構成図。FIG. 4 is a configuration diagram of a conventional laser distance measuring device.
21…レーザ装置、 22…ビームスプリッタ、2
3…変調器、 24…反射ミラー、25…変調
器、 26…ビームスプリッタ、27…参照
光、 28…測距光、29…ビームスプリッ
タ、30…コーナキューブ、31…反射ミラー、
32…ビームスプリッタ、33,34…ビート光、 3
5,36…光検出器、37…計測器。21 ... Laser device, 22 ... Beam splitter, 2
3 ... Modulator, 24 ... Reflecting mirror, 25 ... Modulator, 26 ... Beam splitter, 27 ... Reference light, 28 ... Distance measuring light, 29 ... Beam splitter, 30 ... Corner cube, 31 ... Reflecting mirror,
32 ... Beam splitter, 33, 34 ... Beat light, 3
5, 36 ... Photodetector, 37 ... Measuring instrument.
Claims (1)
と、このレーザ装置から放射されるレーザ光を二分割す
るビームスプリッタと、このビームスプリッタにより二
分割されたレーザ光を強度変調する変調周波数の異なる
第1の変調器及び第2の変調器と、前記第1の変調器で
強度変調されたレーザ光を反射ミラーを備えた被測距物
体に出射し、この被測距物体から戻ってきたレーザ光と
前記第2の変調器により強度変調されたレーザ光とを干
渉させて、前記第1及び第2の変調器の変調周波数の差
の周波数を持つビート光を作成する手段と、この手段に
より作成されたビート光を検出して電気信号に変換する
光検出器と、この光検出器の出力信号から被測距物体に
対する距離情報を得る計測手段とを具備したことを特徴
とするレーザ測距装置。1. A laser device for generating a laser beam for distance measurement, a beam splitter for dividing the laser beam emitted from the laser device into two, and a modulation frequency for intensity-modulating the laser beam divided by the beam splitter. Of the first modulator and the second modulator different from each other, and the laser light intensity-modulated by the first modulator is emitted to a distance-measuring object equipped with a reflection mirror, and returns from the distance-measuring object. Means for making beat light having a frequency of a difference between the modulation frequencies of the first and second modulators by causing the laser light and the laser light intensity-modulated by the second modulator to interfere with each other; A laser comprising: a photodetector for detecting the beat light created by the means and converting it into an electric signal; and a measuring means for obtaining distance information with respect to the object to be measured from the output signal of the photodetector. Ranging device .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4340596A JPH06186337A (en) | 1992-12-21 | 1992-12-21 | Laser distance measuring equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4340596A JPH06186337A (en) | 1992-12-21 | 1992-12-21 | Laser distance measuring equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06186337A true JPH06186337A (en) | 1994-07-08 |
Family
ID=18338502
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4340596A Withdrawn JPH06186337A (en) | 1992-12-21 | 1992-12-21 | Laser distance measuring equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06186337A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001255369A (en) * | 2000-02-14 | 2001-09-21 | Hilti Ag | Method for optoelectronic distance measurement and device based on the method |
| CN102506721A (en) * | 2011-11-07 | 2012-06-20 | 中南大学 | Laser-based deformation displacement measurement method |
| JP2013195246A (en) * | 2012-03-19 | 2013-09-30 | Fujitsu Ltd | Range finder and input device |
| CN103983962A (en) * | 2014-06-06 | 2014-08-13 | 杜鑫 | Calibration method and device for phase measurement and measuring device |
| WO2014135097A1 (en) * | 2013-03-08 | 2014-09-12 | 江苏徕兹光电科技有限公司 | Calibration method based on dual-transmitting dual-receiving phase measurement and distance-measuring device thereof |
| WO2019186776A1 (en) * | 2018-03-28 | 2019-10-03 | 日本電気株式会社 | Distance measurement device and control method |
| WO2020189275A1 (en) * | 2019-03-18 | 2020-09-24 | 日本電信電話株式会社 | Range finder and range finding method |
| CN114964352A (en) * | 2021-02-26 | 2022-08-30 | 精工爱普生株式会社 | Laser interferometer |
-
1992
- 1992-12-21 JP JP4340596A patent/JPH06186337A/en not_active Withdrawn
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001255369A (en) * | 2000-02-14 | 2001-09-21 | Hilti Ag | Method for optoelectronic distance measurement and device based on the method |
| CN102506721A (en) * | 2011-11-07 | 2012-06-20 | 中南大学 | Laser-based deformation displacement measurement method |
| JP2013195246A (en) * | 2012-03-19 | 2013-09-30 | Fujitsu Ltd | Range finder and input device |
| WO2014135097A1 (en) * | 2013-03-08 | 2014-09-12 | 江苏徕兹光电科技有限公司 | Calibration method based on dual-transmitting dual-receiving phase measurement and distance-measuring device thereof |
| US9945937B2 (en) | 2013-03-08 | 2018-04-17 | Jiangsu Laitz Optoelectronics Technology Co., Ltd. | Calibration method based on dual-transmitting dual-receiving phase measurement and distance-measuring device thereof |
| CN103983962A (en) * | 2014-06-06 | 2014-08-13 | 杜鑫 | Calibration method and device for phase measurement and measuring device |
| WO2019186776A1 (en) * | 2018-03-28 | 2019-10-03 | 日本電気株式会社 | Distance measurement device and control method |
| JPWO2019186776A1 (en) * | 2018-03-28 | 2021-02-12 | 日本電気株式会社 | Distance measuring device and control method |
| EP3779511A4 (en) * | 2018-03-28 | 2021-03-31 | NEC Corporation | DISTANCE MEASURING DEVICE AND ASSOCIATED CONTROL PROCESS |
| US11435477B2 (en) | 2018-03-28 | 2022-09-06 | Nec Corporation | Distance measurement based on difference of two beat signals generated from same reference light |
| WO2020189275A1 (en) * | 2019-03-18 | 2020-09-24 | 日本電信電話株式会社 | Range finder and range finding method |
| JP2020153671A (en) * | 2019-03-18 | 2020-09-24 | 日本電信電話株式会社 | Distance measuring device and distance measuring method |
| CN114964352A (en) * | 2021-02-26 | 2022-08-30 | 精工爱普生株式会社 | Laser interferometer |
| CN114964352B (en) * | 2021-02-26 | 2024-01-16 | 精工爱普生株式会社 | laser interferometer |
| US12313469B2 (en) | 2021-02-26 | 2025-05-27 | Seiko Epson Corporation | Laser interferometer |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6876441B2 (en) | Optical sensor for distance measurement | |
| US6373871B1 (en) | Ellipsometer with two lasers | |
| JP2002082045A (en) | Optical measurement system | |
| JPH07311182A (en) | Evaluation of sample by measurement of thermo-optical displacement | |
| EP0549614B1 (en) | Optical apparatus | |
| JPH06186337A (en) | Laser distance measuring equipment | |
| US6141138A (en) | Apparatus and method for measuring characteristics of light | |
| JPS6319822B2 (en) | ||
| JPH0915334A (en) | Laser equipment for measuring distance | |
| JPS5948668A (en) | Optical fiber speedometer | |
| JP3236941B2 (en) | Distance measurement method for lightwave distance meter | |
| JP3089376B2 (en) | Distance measuring device | |
| US5450195A (en) | Phase-modulated interferometer for evaluating phase displacement resulting from charges in path length | |
| JPH0749922B2 (en) | Optical measuring device | |
| JP2923779B1 (en) | Optical interference device for ultrasonic detection | |
| JP2929387B2 (en) | Lightwave rangefinder | |
| JPS6371675A (en) | Laser distance measuring instrument | |
| JPS5866881A (en) | Surveying equipment by light wave | |
| JPH0271187A (en) | Distance measuring equipment | |
| JPS6275363A (en) | Laser distance measuring apparatus | |
| JPS60306A (en) | Range finding method using composite wavelength method | |
| JPS5852891A (en) | Stabilizer for frequency of laser | |
| RU2028626C1 (en) | Device for measuring frequency of harmonic electric oscillations | |
| JPH06109422A (en) | Displacement amount measuring device | |
| JPH06167304A (en) | Displacement gauge |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Application deemed to be withdrawn because no request for examination was validly filed |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20000307 |