JPH06121178A - Cathode ray tube controller - Google Patents

Abstract

(57) [Summary] [Object] The present invention relates to a device for correcting a color television receiver, and provides a cathode ray tube control device capable of performing various corrections automatically, highly accurate correction and greatly shortening the adjustment time. The purpose is to provide. An index phosphor 6 is arranged at a predetermined position on the surface of the shadow mask and is oblique to the main scanning direction of the electron beam with respect to 2, and a radiation output is generated in response to the scanning of the electron beam. By detecting the two-dimensional position of the electron beam, a cathode ray tube coated with the index phosphor can be realized with a simple structure. Further, by applying a continuous diagonal line index phosphor, the structure can be further simplified and various convergence correction points can be dealt with.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for correcting a color television receiver, and more particularly to a cathode ray tube control device for automatically making various corrections.

[0002]

2. Description of the Related Art Generally, in a video projector for magnifying and projecting in a screen by using three projection tubes that emit three primary colors, an incident angle (hereinafter referred to as a "concentration angle") of the projection tube with respect to the screen is different from each projection Since the tubes are different, color shift, focus shift, deflection distortion, and brightness change occur on the screen. Each of these corrections uses a method in which an analog correction waveform is created in synchronism with the horizontal and vertical scanning periods, and the size and shape of this waveform are changed to make adjustments, but there is a problem in terms of correction accuracy. is there. Further, since various corrections are manually observed by visually observing deviations on the screen, there is a problem that adjustment time is required. Therefore, as a method with high convergence accuracy, a digital convergence device disclosed in Japanese Patent Publication No. 59-8114 and a method for automatically correcting deflection distortion are disclosed in Japanese Patent Laid-Open Nos. 58-25042 and 58-25042. The cathode ray tube control device (electron beam deflection control device) of Japanese Patent No. 24186 has been proposed.

FIG. 28 shows a block diagram of a conventional cathode ray tube control device capable of automatic correction, and FIG. 29 shows a screen view of an index plane. As shown in FIGS. 28 and 29, the cathode ray tube 4
The detector 60 detects the electron beam position from the index phosphor 6 coated on the 0 shadow mask 43 surface, and the processing device 66 generates signals for convergence correction and geometric distortion correction from this detection signal. There is. The signal from the processing device 66 is supplied to the waveform generator 52 to generate each scanning waveform for driving the convergence yoke 44 and the deflection yoke 46, and the convergence and geometric distortion can be automatically corrected. As described above, it is possible to automatically correct the position control of the electron beam such as convergence and geometric distortion.

[0004]

However, in the control device having the above-described structure, the shape of the index phosphor is such that two leg portions of a right triangle which are perpendicular and oblique to the main scanning direction are formed. Therefore, there is a problem that the index phosphor must be applied at right angles to the main scanning direction, and a highly accurate application technique is required. Further, when measuring the positions of the test signals 8 and 9 received by the index phosphor, the time measurement range between the two index phosphors becomes very wide, and the signal width due to the spot characteristics and aberration of the test signal. However, there is a problem in that the measurement accuracy and the correction accuracy decrease when the values are different. Further, since the number of convergence correction points is determined by the number of index phosphors applied to the cathode ray tube, there is a problem that various correction points cannot be dealt with.

In view of such a point, the present invention provides a shadow mask surface with two oblique index phosphors with respect to the main scanning direction, detects electron beam and light positions, and automatically corrects them. It is an object of the present invention to provide a cathode ray tube control device capable of greatly reducing accuracy correction and adjustment time.

[0006]

According to a first aspect of the invention, the shadow mask is arranged at a predetermined position on the surface of the shadow mask and has two oblique shapes in the main scanning direction of the electron beam. A detection element for generating a signal is provided, and a means for detecting a two-dimensional position of the electron beam and deflecting the electron beam according to an output signal of the detection element is provided.

According to a second aspect of the invention, a two-dimensional position of the electron beam is obtained from the detection signal obtained based on the feedback signal of the electron beam from the shadow mask surface and the distance between the shadow mask surface and the fluorescent surface, and the deflection means is provided. And processing means for controlling and correcting the deflection distortion of the electron beam.

According to a third aspect of the invention, the two-dimensional position of the electron beam is obtained from the detection signal obtained based on the feedback signal of the electron beam from the shadow mask surface and each signal width, and the deflection means is controlled to control the electron beam. And a processing means for correcting the deflection distortion.

According to a fourth aspect of the present invention, a projection means for sequentially projecting a detection test signal for progressive scanning on the detection means, a deflection means for deflecting the electron beam of the cathode ray tube, and a detection signal from the detection means. And a processing means for controlling the deflection means to correct the deflection distortion of the electron beam.

According to a fifth aspect of the present invention, there is provided a judgment means for judging that a detection signal corresponding to the position detecting element at a predetermined position is outputted from the detection means, and the electron beam is detected by the detection signal.
And a control means for controlling the deflection means according to the discrimination signal to control the deflection distortion of the electron beam.

A sixth aspect of the present invention is a control means for determining a two-dimensional position of an electron beam from a detection signal corresponding to a position detection element from the detection means, controlling deflection, and controlling a correcting operation of deflection distortion of the electron beam. And a calculating means for moving the test signal between the adjustment points to calculate the correction amount between the adjustment points.

[0012]

According to the first aspect of the present invention, the index phosphor is applied with a simple structure by generating a detection signal in response to the scanning of the electron beam and detecting the two-dimensional position of the electron beam. A cathode ray tube can be realized.

According to the second aspect of the present invention, it is possible to determine whether the electron beam is detected by the detection signal obtained based on the feedback signal of the electron beam from the shadow mask surface and the distance between the shadow mask surface and the fluorescent surface.
By obtaining the dimensional position and correcting the deflection distortion of the electron beam by controlling the deflection means, the error based on the positional deviation between the display surface and the detection surface on which the index phosphor is installed is corrected, and a high precision is obtained. Correction can be realized.

According to the third invention, the two-dimensional position of the electron beam is obtained from the detection signal obtained based on the feedback signal of the electron beam from the shadow mask surface and each signal width, and the deflection distortion of the electron beam is obtained by this signal. By correcting
By correcting the correction error due to the beam spot size and the aberration, it is possible to realize more accurate correction.

According to the fourth invention, a test signal for detection of progressive scanning is sequentially projected on the detecting means to obtain a two-dimensional position, and the deflecting means is controlled by this signal to correct the deflection distortion of the electron beam. By doing so, stable and highly accurate position measurement can be performed, so that highly accurate correction can be realized.

According to a fifth aspect of the present invention, it is determined that a detection signal corresponding to a position detection element at a predetermined position is output, and the deflection means is controlled by this signal to control the correction operation of the deflection distortion of the electron beam. This makes it possible to detect abnormal operation in the detection system caused by the signal from the position detection element and automatically detect malfunction, so that complete adjustment-free operation can be realized.

According to a sixth aspect of the present invention, by moving the test signal between the adjustment points to calculate the correction amount between the adjustment points, the correction accuracy between the adjustment points is improved and, in particular, the extrapolation existing outside the screen is performed. Since the correction amount of the points can be automatically calculated, highly accurate correction can be realized in the peripheral portion of the screen.

[0018]

Embodiments of the present invention will be described below with reference to the drawings. 1 to 8 are a block diagram and a screen view of a cathode ray tube control device according to the first embodiment of the present invention. FIG. 1 shows the structure of the cathode ray tube control device and FIG. 2 shows an index on the entire screen. The shape of the phosphor is shown.

In FIG. 1, 1, 2 and 3 are electron guns of respective RGB colors, 6 is an index phosphor, 4 is a shadow mask surface, 5 is a phosphor surface coated with RGB phosphors,
As shown in the shape of the index phosphors in FIG. 2, a plurality of index phosphors 6 in two oblique directions with respect to the main scanning direction of the electron beam are continuously applied to the shadow mask surface 4 on the shadow mask surface 4. ing. 2A shows the entire screen of the index phosphor 6 coated on the shadow mask surface of the cathode ray tube 40, and FIG. 2B shows the enlarged conceptual screen thereof. The test signal 8 is displayed on the index phosphor 7. The enlarged screen projected is shown.

The block diagram of FIG. 3 will be used to explain the operation of the cathode ray tube control apparatus of this embodiment having the above-described structure. A synchronizing signal is input to the input terminal 50, a correction current for raster scanning the screen is created by the deflection unit 14, and the correction current is supplied to the deflection yoke 46 and the convergence yoke 44 to control the scanning speed. . The video signal from the input terminal 48 is input to the signal processing unit 15, and the signal processing unit 15 performs various kinds of signal processing and amplification for driving the cathode electrode of the cathode ray tube (CRT) 40.

As shown in FIG. 2, the image projected on the screen of the cathode ray tube 40 is used as a two-dimensional position signal of the electron beam (light) on the shadow mask surface on which a plurality of index phosphors are arranged. Take it out. The feedback signal from the index phosphor is input to the detection unit 12, the detection unit 12 detects and measures the position, and the correction waveform creation unit 13 corrects the convergence and geometric distortion from the detection signal. Creating a waveform. The correction waveform from the correction waveform creating unit 13 is supplied to the deflection unit 14 for controlling scanning and is corrected.

As described above, the index phosphors having two oblique shapes with respect to the main scanning direction of the electron beam, which are arranged at predetermined positions on the surface of the shadow mask, radiate in accordance with the scanning of the electron beam. It is possible to generate an output, detect the two-dimensional position of the electron beam by the detection unit, and deflect the electron beam by the detection signal of the detection unit to automatically correct the convergence and geometric distortion.

Next, the control of this embodiment will be described in detail with reference to the block diagram of FIG. 4 and the waveform diagram of FIG. The detection unit 12 includes a photoelectric conversion element 21, a time-voltage converter 22, and a measurement circuit 23. An enlarged view of the two index phosphors is shown in FIG.

As shown in FIG. 5A, the index phosphor 6 has two oblique line shapes. When the test signals 24 and 25 are projected on the index phosphor 6, the photoelectric conversion signal of the test signal 25 has the waveform shown in FIG. 5B and the photoelectric conversion signal of the test signal 24 has the waveform shown in FIG. 5C. Become. The photoelectrically converted signal from the photoelectric conversion element 21 is supplied to the time-voltage converter 22, the two-dimensional position of the signal is extracted, and the signal is input to the measurement circuit 23. The measuring circuit 23 measures the timing of the signal 25 of the reference signal FIG. 5A and the signal 24 of the focused signal FIG. 5A.

First, in the case of performing position measurement such as vertical convergence in FIG. 5A, test signals 25 and 2 are used.
The reference signal (G signal) and the focusing signal (RB signal) of No. 4 are projected, and the positional deviation amounts t1 and t2 between the reference signal and the focusing signal are measured as shown in FIGS. The measurement method is shown in FIG.
Based on the timing pulses of (b) and (c), a gate signal as shown in FIG. 5 (d) and (e) is created, and from this signal, FIG.
The ramp signal shown in (g) is generated to convert the time axis into voltage information. Therefore, the DC voltage of V1 can be calculated as the correction amount of the reference signal in the vertical direction and V2 can be calculated as the correction amount of the focusing signal. The time-voltage converted signal from the time-voltage converter 22 is supplied to the measuring circuit 23 and the amount of deviation in each correction direction is measured. The shift amount corrects the test signal 24 so that it is at the same vertical position (V1 = V2) as the test signal 25.

Similarly, when the second horizontal position measurement such as convergence is performed, the reference signal (G signal) and the focusing signal (RB signal) of the test signals 25 and 24 are projected,
As shown in FIGS. 5B and 5C, the positional deviation amounts t3 and t4 between the reference signal and the focused signal are measured. The measurement method is shown in Fig. 5 (h).
Create a gate signal based on the timing pulse of (i),
A ramp signal shown in FIGS. 5 (j) and 5 (k) is generated from this signal to convert the time axis into voltage information. Therefore, the DC voltage of V3 can be calculated as the correction amount of the horizontal reference signal and V4 can be calculated as the correction amount of the focusing signal. Time-voltage converter 2
The time-voltage converted signal from 2 is supplied to the measuring circuit 23 and the amount of deviation in each correction direction is measured. The shift amount corrects the test signal 24 so that it is at the same horizontal position (V3 = V4) as the test signal 25.

The correction waveform creating unit 13 creates a correction waveform for controlling the convergence, the deflection distortion, the screen amplitude, etc., based on the positional deviation amount. This correction waveform can be created by the digital convergence method as described in the conventional example, and its basic block diagram is shown in FIG. The configuration is such that an address generation circuit 26 for creating various address signals from the synchronization signal, an arithmetic circuit 120 for calculating correction data from the positional deviation amount of each correction point from the positional deviation signal, and an arithmetic circuit 120 for each correction point. A memory 27 for storing data, an interpolation circuit 28 for interpolating data between correction points, a D / A converter 29 for converting the interpolated data into an analog amount, and an analog amount for smoothing. The LPF (low pass filter) 30 for The signal from which the positional deviation from the measurement circuit 23 is measured is supplied to the correction waveform creating unit 13 and various correction waveforms are created.

As described above, the correction waveform for controlling the convergence, the deflection distortion, the screen amplitude and the like is created from the data obtained by measuring the positional deviation amount.

In this embodiment, as shown in FIG. 5A, the correction means for only the representative points has been described. However, in order to correct the entire screen, each index phosphor 6 shown in FIG.
The dynamic correction waveform creation can be realized by sequentially detecting the information from the.

The deflection unit 14 is composed of a screen amplitude / deflection distortion correction circuit 19 and a convergence correction circuit 20.
In the deflecting unit 14, the deflection yoke 46 performs the deflection correction by the correction waveform of the deflection linearity and the correction data of the screen amplitude so that the display areas of the respective colors are uniformly positioned over the entire screen.
Driving the deflection coil. Convergence correction is performed by the correction waveform and data of the color misregistration so that the display areas of the respective colors are located at the same position over the entire screen, and the convergence yoke 44 is driven.

Next, the screen view of FIG. 7 is used to explain the detecting means in detail. FIG. 7 shows a screen view of the method of displaying the test signal. In the cathode ray tube in which the index phosphor is applied to the shadow mask surface as shown in FIG.
FIG. 7A shows a test signal for detecting a horizontal position shift, and FIG. 7B shows a test signal for detecting a vertical position shift. The test signals are from left to right in each detection direction. Are sequentially shifted to perform detection. At positions corresponding to the plurality of index phosphors 6 shown in FIG.
The position is set so that the test signal in each direction of (b) is displayed. In addition, as shown in FIG. 8 showing the spectral characteristics of the index phosphor and each color, the index phosphor 6
Is coated with a phosphor in the ultraviolet region (for example, P47) so as not to be affected by RGB light of each color, and a photomultiplier tube is used as a photoelectric conversion element for detection.

The angle of the oblique slit is preferably 45 degrees from the viewpoint of detecting both the horizontal and vertical directions.
Considering the horizontal and vertical correction amounts, it is advantageous to set the larger correction amount. Generally, in a CRT display device, since the correction amount in the horizontal direction is large, it is more advantageous to set the angle in the direction of lying (45 degrees or less) rather than 45 degrees.

As described above, according to this embodiment, the two obliquely arranged index phosphors arranged in a predetermined position on the surface of the shadow mask in the main scanning direction of the electron beam respond to the scanning of the electron beam. By generating a signal and detecting the two-dimensional position of the electron beam by the detector, a cathode ray tube coated with the index phosphor can be realized with a simple structure. Further, by applying an index phosphor of a continuous diagonal shape, the structure can be further simplified, and various convergence correction points can be realized. Further, by providing a plurality of adjustment points on the screen and interpolating data between the adjustment points to create a correction waveform, stable and highly accurate correction can be realized.

Next, a second embodiment of the present invention will be described. 9 to 17 show a second embodiment of the present invention. The difference from the configuration of the first embodiment is that the correction error based on the positional deviation between the shadow mask surface which is the detection surface of the cathode ray tube and the phosphor surface which is the display surface is corrected.

In FIG. 9, reference numeral 31 indicates the amount of positional deviation between the detection surface, which is the shadow mask surface 4 coated with the two oblique-shaped index phosphors 6, and the display surface, which is the phosphor surface 5.
Reference numeral 1 denotes a photoelectric conversion element for detecting an index area and performing photoelectric conversion, and the photoelectric conversion elements 21 are distributed in a shadow mask area corresponding to the entire display area of the cathode ray tube 40. Reference numeral 22 is a time-voltage converter for converting the time axis, which is the positional deviation of the index signal, into voltage information, 37 is a sample hold circuit for sample-holding the maximum value of the time-voltage converted conversion signal, and 32 is An A / D converter for converting the sample-held analog signal into a digital signal, 33 is a calculation circuit for calculating data comparison or the like and a correction error based on the digitally converted signal, and 34 is a calculation A memory for storing the correction data calculated by the circuit 33, 36 is a positional deviation correction circuit for correcting the positional deviation between the detection surface of each display position and the display surface, and 35 is a digital correction from the memory 34. This is a D / A converter for converting data into an analog signal, and the signal from the D / A converter 35 is supplied to the deflection unit 14. In FIG. 9, the same operations as those in the first embodiment are designated by the same reference numerals and the description thereof will be omitted.

In order to explain the cathode ray tube control device of this embodiment in detail, the configuration diagrams of FIGS. 10 and 11 and the screen diagram of FIG. 12 will be used. As shown in the relationship between the detection surface and the display surface in FIG. 10, there is generally a distance between the phosphor surface 5 and the shadow mask surface 4, and this distance is the distance between the detection and display surfaces 3
It is represented by 1 (q in CRT terminology). FIG. 11 shows a principle diagram of occurrence of misconvergence due to the detection-display surface distance (q) 31. The distances L2 and L3 between the main lenses of the electron gun are between RGB, and the distance L1 from the main lens to the shadow mask surface 4 and the distance q between the detection surface and the display surface described above exist. Then, misconvergence x will occur. Next, let's actually calculate the misconvergence by substituting the cathode ray tube specifications.

L1 = 532 mm, L2 = L3 = 7 mm, q
When x is calculated to be 14 mm, the misconvergence x is approximately 0.4 mm, which is a value that cannot be ignored in high-resolution display such as high-definition specifications. As shown in the screen diagram showing the misconvergence shift amount and direction in FIG. 12A, in the in-line type CRT, the R signal and the B signal exist at the target positions around the G signal. Therefore, the misregistration correction circuit 36 creates correction data for correcting the detection error of the detection-display surface distance 31. This correction data is supplied to the D / A converter 35, the correction data for focusing from the memory 34 is added to create final correction data, and the correction data is corrected by this correction data, as shown in FIG. As shown in (3), a state in which misconvergence does not occur can be realized. Since the correction data from the position shift correction circuit 36 is determined by the CRT specifications, the correction error amount based on the position shift between the display surface and the detection surface is RO.
Written to M. In addition, the distance between the detection and the display surface 31
In general, since the distance from (q) increases from the center of the screen to the periphery, data that increases toward the periphery is created.

Next, the waveform diagram of FIG. 13 will be used to explain the convergence operation of convergence in detail. A layout of the test signals 72, 73 projected by the index phosphor 6 is shown in FIG. 13A, and a case where the test signal 73 (focus signal) is focused on the test signal 72 (reference signal) will be described. The waveform of the test signal is shown in FIG. 13 (b), and each test signal received by the index phosphor 6 is shown in FIG. 13 (c).
The test signal 72 which is the reference and the test signal 7 which is focused
The photoelectric conversion element 21 outputs the waveform when 3 is received. The signal from the photoelectric conversion element 21 is supplied to the time-voltage converter 22 and the time axis is converted into voltage information.

First, the case of measuring the displacement in the vertical direction will be described. For the measurement of the positional deviation in the vertical direction, the test signal of FIG.
The time between two signals received by the index phosphor 6 is measured and measured. Therefore, the test signal 72 (reference signal) produces the measurement waveform of FIG. 13 (c), and the test signal 73 (focus signal) produces the measurement signal of FIG. 13 (d), and the time axis of this signal is converted into a voltage. ing. Time-voltage converter 22
Then, a ramp signal is generated based on the measurement signal, and the time axis is converted into voltage information by this voltage value. FIG.
In the case of the measurement signal of (c), the waveform of the maximum value voltage V5 shown by the solid line in FIG. 13 (e) is shown. In the case of the measurement signal of FIG. 13 (d), the maximum shown by the broken line in FIG. 13 (f) is shown. The waveform of the value voltage V6 is
It is output from the time-voltage converter 22 and corrected in the vertical direction.

Next, the case of measuring the positional deviation in the horizontal direction will be described. The position shift measurement in the horizontal direction is performed by projecting the vertical test signal of FIG. 13B on the index phosphor 6 and measuring the time from the rising of this test signal to the rising of FIG. 13G. Therefore, therefore, the measurement signal of FIG. 13 (g) is obtained with the test signal 72 (reference signal), and the measurement signal of FIG. 13 (h) is obtained with the test signal 73 (focus signal), and the time axis of this signal is converted into voltage. Converting. The time-voltage converter 22 generates a ramp signal based on the measurement signal, and the time axis is converted into voltage information by this voltage value. In the case of the measurement signal of FIG. 13 (g), the maximum voltage V7 waveform shown by the solid line in FIG.
In the case of the measurement signal of 3 (h), the waveform of the maximum value voltage V8 shown by the broken line in FIG. 13 (j) is output from the time-voltage converter 22 and the horizontal direction is corrected.

The signal obtained by converting the positional deviation amount in each direction into voltage information as described above is supplied to the sample hold circuit 37, and sampled and held at the timing of the maximum value voltage of each waveform. Therefore, the reference signal is in the vertical direction V5 and the horizontal direction V7, and the focus signal is in the vertical direction V6 and the horizontal direction V8.
Is obtained, and this voltage is converted into a digital signal by the A / D converter 32.

The arithmetic circuit 33 calculates a correction direction and a correction amount for matching the voltage V5 in the vertical direction serving as a reference signal and the voltage V7 in the horizontal direction, and the correction data is stored in the memory 34. The correction data for focusing the focus signal from the memory 34 on the reference signal and the correction data for correcting the detection error of the detection-display surface distance (q value) 31 from the positional deviation correction circuit 36 are D / A. The final correction data is created by adding the correction data for focusing and the correction data for correcting the detection error to the converter 35. The signal is converted into an analog signal by the D / A converter 35, and this signal is supplied to the deflection unit 14 for correcting convergence and geometric distortion and is corrected.

Next, in order to explain the shape of the index phosphor and its detection method, the screen diagrams and waveform diagrams of FIGS. 14 and 15 are used. FIG. 14 (a) shows a lambda shape in the conventional example, and FIG. 15 (a) shows an oblique shape used in the present embodiment. The position of the test signal received on the index phosphor is accurately detected. It has a shape to do. In the conventional method shown in FIG. 14, a horizontal bar signal on a lambda-shaped index phosphor is projected to detect an index signal, and each direction is detected by the timing of this detection signal. In the present embodiment shown in FIG. 15, the horizontal bar signals are sequentially projected on the two oblique index phosphors according to the correction direction to detect the index signal, and the detection signal and the correction mode are used to detect each direction. There is. First, the conventional method will be described in detail.

FIG. 14A shows a screen view of the index phosphor and the test signal on the screen, and FIG. 14B shows the index signal when the reference G test signal is received, as shown in FIG. The index signal when an R test signal to be focused on is received. First cross at right angles to the test signal
Correction amount in the horizontal direction is detected by the first index signal from the index phosphor, and the vertical direction is detected by the second index signal from the second index phosphor that obliquely intersects the first index signal and the test signal. The correction amount of is detected.

In the index signals shown in FIGS. 14B and 14C, the first half t1 and t2 are in the horizontal direction, and the second half t1.
3 and t4 correspond to the vertical direction, the horizontal convergence correction of R is such that t1 = t2 for focusing in the horizontal direction, and the convergence correction of R in the vertical direction for R is such that t3 = t4 for focusing in the vertical direction. The convergence correction is performed and then the convergence correction is performed. Therefore, the detection range from the rising edge of the test signal to the end of the second index phosphor is required.

Next, this embodiment will be described in detail. FIG. 15 (a) shows a screen view of the index phosphor and the test signal on the screen, and FIG. 15 (b) focuses the index signal when the reference G test signal is received on FIG. 15 (c). The index signal when the R test signal is received is shown. The correction amount in the vertical direction is detected from the first index signal from the first index phosphor and the second index signal from the second index phosphor that intersect the two diagonal lines, and the test signal intersects the diagonal line. The correction amount in the horizontal direction is detected by the first index signal from the first index phosphor.

In the index signals shown in FIGS. 14B and 14C, the first half t1 and t2 are in the horizontal direction and the second half t1.
3 and t4 correspond to the vertical direction, the horizontal convergence correction of R is such that t1 = t2 for focusing in the horizontal direction, and the convergence correction of R in the vertical direction for R is such that t3 = t4 for focusing in the vertical direction. The convergence correction is performed and then the convergence correction is performed. Therefore, the detection range within the oblique index phosphor region is required. Further, FIGS. 15 (d) and 15 (e) are diagrams showing the range of each detection area and the center of gravity position of each method. In the conventional method of FIG. On the other hand, in the present method of FIG. 15 (e), since the horizontal center of gravity position H2 and the vertical center of gravity position V2 are very close to each other, accurate correction can be performed.

As described above, according to this embodiment, the detection range can be set extremely narrower than that of the conventional method, and the position of the center of gravity for detection is very close, so that highly accurate position detection can be realized.

Next, in order to explain that the detection and correction regions can be easily set by setting the shape of the index phosphor to be a continuous diagonal line, the screen view of FIG. 16 is used. FIG. 16 shows a screen view when the test signal is projected on the continuous index phosphor 7 applied to the shadow mask surface of the cathode ray tube 40. When the test signal 38, which is a fine hatch signal, is displayed in FIG.
There are a total of 25 correction points including 5 adjustment points and 5 detection points in the horizontal direction and 5 in the vertical direction. The detection and measurement methods are the same as those described above, and the description thereof will be omitted. Also in FIG.
When the test signal 39 is projected on the rough hatch in (b),
The adjustment points and detection points are a total of nine correction points, three in the horizontal direction and three in the vertical direction. As described above, the correction point can be easily changed only by changing the generation timing of the test signal. The test signal is described as a hatch signal in order to make the position of the correction point easy to understand, but it goes without saying that the actual focus test signal is a horizontal bar signal.

Next, as shown in FIG. 16B, in order to explain a method of creating a correction waveform based on detection signals from the center axis of the screen and the peripheral portion, the correction wave of FIG. 17 and its correction A diagram showing the relationship of changes on the screen is used. FIG. 17
For example, when a correction waveform such as (1) is a vertical sawtooth wave having a 1 V (vertical scanning) period, when this correction waveform is added to the vertical convergence coil, vertical amplitude correction is performed to make a horizontal convergence coil. When added to, vertical line orthogonal correction is performed. When the correction wave is a horizontal parabolic wave of 1H (horizontal scanning) period as in (4),
When this correction wave is applied to the vertical convergence coil, horizontal line bending is corrected, and when it is applied to the horizontal convergence coil, horizontal linearity correction is performed. As described above, the correction waveform can be basically classified into a parabola waveform and a sawtooth waveform as shown in FIG. Therefore, FIG.
A correction waveform for correcting the convergence and the geometric distortion by obtaining the shift amount and the direction from the detection signals from the central axis of the screen and the peripheral portion shown in FIG. 6B is created.

As described above, according to this embodiment, by correcting the correction error based on the positional deviation between the shadow mask surface, which is the detection surface of the cathode ray tube, and the phosphor surface, which is the display surface, a highly accurate convergence is achieved. And geometric distortion can be corrected.

Next, a third embodiment of the present invention will be described. 18 to 19 are views showing a third embodiment of the present invention. The difference from the configuration of the first embodiment is that the correction is performed based on the signal width of the detection signal from the shadow max surface of the CRT. In FIG. 18, reference numeral 83 denotes a center position detection circuit for detecting the center position of the signal width for detecting the signal width of the photoelectric conversion signal from the photoelectric conversion element 21. Similar to the second embodiment in FIG. The same numbers are used for the operations that perform the above operation, and the description thereof is omitted.

In order to explain the cathode ray tube control apparatus of this embodiment in detail, the screen of FIG. 19 and the diagram showing the waveform are used. FIG. 19
When test signals 85 and 86 having different test signal widths are displayed on the index phosphor 6 as shown in the screen view of (a), the photoelectric conversion signal from the photoelectric conversion element 21 is as shown in FIG.
As shown in (c), analog signals having different signal widths are output. When the signal is binarized at the rising edge of this signal, the digital signals shown in FIGS. 19D and 19E are obtained. This 2
When convergence focusing is performed based on the binarized signal, as shown in the screen view of FIG. 19F, the convergence of the rising period of the test signal is the same, but the misconvergence 84 occurs because the signal widths are different. It will be.

Therefore, in this embodiment, the index phosphor is always arranged obliquely to the test signal,
Since the signal width is detected by the vertical bar signal and the horizontal bar signal of the two types of test signals to detect the center position of the signal, even when the signal width due to the spot characteristics or aberration of the test signal is different, High precision measurement accuracy and correction accuracy can be realized. The photoelectric conversion signal from the photoelectric conversion element 21 shown in FIGS.
, And the center position of the signal width of the analog signal is detected, and the binarized digital signal of FIGS.

This digital signal is converted into a time-voltage converter 22.
19 (i) (j) to generate a gate signal for comparison with a reference signal, and a ramp signal is generated in the gate signal period as shown in FIG. 19 (k). .
The ramp signal from the time-voltage converter 22 is supplied to the sample hold circuit 37, and the maximum value is sampled and held. Therefore, the maximum value voltage V10 is output when the test signal 85 of FIG. 19A is projected, and the maximum value voltage V11 is output when the test signal 86 is projected. By performing the convergence correction of the test signal 86 so that the maximum value voltage becomes V10 = V11, it is possible to realize highly accurate correction even when the signal width is different as shown in the screen view of FIG. 19 (l). become.

As described above, the two-dimensional position of the electron beam is obtained from the feedback signal of the electron beam from the shadow mask surface and each signal width, and the deflection distortion of the electron beam is corrected by this signal to obtain the beam spot size. It is possible to realize a higher precision correction by correcting the correction error caused by the aberration. Further, by constructing the detecting means in a shape oblique to the main scanning direction of the electron beam, the structure of the cathode ray tube can be simplified, and various convergence correction points can be realized.

Next, a fourth embodiment of the present invention will be described. 20 and 21 show a fourth embodiment of the present invention. The difference from the configuration of the first embodiment is that the test signal for detection of progressive scanning is projected at the time of correction to obtain a two-dimensional position and the correction is performed. In FIG. 20,
Reference numeral 93 is a progressive scan test signal generating circuit for generating a progressive scan test signal, 92 is a signal switching circuit for switching between an external video signal from the input terminal 91 and a test signal from the progressive scan test signal generating circuit 93, 20 is a correction operation control circuit for controlling the convergence correction operation. In FIG. 20, components performing the same operation as in the second embodiment are designated by the same reference numerals and their description is omitted.

In order to describe the cathode ray tube control apparatus of this embodiment in detail, the screen and waveform diagram of FIG. 21 will be used. Figure 2
As shown in the screen view of 1 (a), when the interlaced scanning test signal is projected on the index phosphor 6 to calculate the amount of positional deviation in the vertical direction, the scanning line (solid line) of the first field and the
By scanning lines with different scanning lines (broken lines) in the field, the waveform obtained by binarizing the photoelectric conversion signal from the photoelectric conversion element has a signal with different timing between fields as shown in FIG. Is output. Therefore, highly accurate position measurement cannot be performed.

In the present embodiment, only when the correction operation is performed based on the control signal from the correction operation control circuit 94, the test signal from the sequential scan test signal generation circuit 93 is switched by the signal switching circuit 92, and FIG. The progressive scan test signal as shown in) is displayed on the screen. Therefore, the waveform obtained by binarizing the photoelectric conversion signal from the photoelectric conversion element is as shown in FIG.
As shown in (d), signals with the same timing are output between the fields.

As described above, the test signal for progressive scanning detection is sequentially projected on the detecting means to obtain the two-dimensional position, and the deflecting means is controlled by this signal to correct the deflection distortion of the electron beam. Since stable and highly accurate position measurement is possible, highly accurate correction can be realized. Next, a fifth embodiment of the present invention will be described. 22 and 23 show a fifth embodiment of the present invention. The difference from the configuration of the first embodiment is that it determines that a detection signal at a predetermined position is output from the index phosphor, and this signal controls the initial setting for detecting abnormal operation or performing normal operation. That is the point. In FIG. 22, 95 is a binarization circuit for converting an analog photoelectric conversion signal from the photoelectric conversion element 21 into a binary digital signal, and 96 is an index signal at a predetermined position by the signal from the binarization circuit 95. 22 is a discriminating circuit for discriminating whether or not is detected, and 97 is an arithmetic circuit for controlling the correction operation based on the signal from the discriminating circuit 96, which performs the same operation as that of the second embodiment in FIG. Are denoted by the same numbers, and description thereof is omitted.

In order to describe the cathode ray tube control device of this embodiment in detail, the screen of FIG. 23, the diagram showing the waveform, and the luminance distribution diagram of FIG. 24 are used. FIG. 23 (a) shows a screen in which a horizontal bar signal is projected on the five index phosphors at the left end of the cathode ray tube 40, and when the horizontal bar signal on the left side is projected, an operation for correcting the vertical and horizontal directions is performed. Mode. As shown in the left side of FIG. 23A, for example, when correcting the vertical direction, the binarized signal obtained by binarizing the photoelectric conversion signal from the photoelectric conversion element 31 by the binarization circuit 95 is as shown in FIG. As shown in FIG. 23 (b)
5 pulse signals are generated in synchronization with the horizontal synchronizing signal. Similarly, when the horizontal direction is corrected as shown on the right side of FIG. 23A, the binarized signal obtained by binarizing the photoelectric conversion signal from the photoelectric conversion element 31 by the binarization circuit 95 is as shown in FIG. As shown in FIG. 23D, there are five pulse signals in synchronization with the horizontal synchronizing signal of FIG.

The binarized signal from the binarizing circuit 95 is supplied to the discriminating circuit 96 to discriminate whether or not five pulse signals are always output in synchronization with the vertical synchronizing signal.
The discriminating circuit 96 is composed of, for example, a flip-flop circuit, and the discriminating method is such that the constant frequency division result is always constant as shown in FIGS. 23 (d) (e) (f). . The discrimination signal from the discrimination circuit 96 is a binarization circuit 95.
Is fed back to the control circuit to control the reference potential, and the arithmetic circuit 9
7 and the correction operation is controlled. Generally, in the luminance distribution of the cathode ray tube, as shown in FIG. 24, the peripheral luminance is lowered due to the geomagnetism and the deflection angle. Therefore, binarization is not normally performed due to the detection position and the brightness drift of the cathode ray tube. Therefore, when the regular index signal is not output based on the determination signal from the determination circuit 96, the operation of the correction waveform creating unit 13 is stopped. Further, the reference potential of the binarization circuit 95 composed of a comparator is controlled so that a normal index signal is output.

As described above, it is determined that the detection signal corresponding to the position detecting element at the predetermined position is output, and the deflection means is controlled by this signal to control the correction operation of the deflection distortion of the electron beam. Since it is possible to automatically detect an abnormal operation of the detection system caused by the index signal and an erroneous operation, complete adjustment-free can be realized.

Next, a sixth embodiment of the present invention will be described. 25 to 27 show a sixth embodiment of the present invention. The difference from the configuration of the first embodiment is that the test signal is moved between the adjustment points and the correction amount between the adjustment points is calculated. In FIG. 25, 101 is a time-voltage converter for converting the time axis, which is the positional deviation of the index signal, into voltage information, and 102 is a sample for holding the maximum value of the time-voltage converted conversion signal. A hold circuit, 103 is an inter-adjustment-point arithmetic circuit for calculating correction data between adjustments, and 104 is a test signal generating circuit for generating a test signal on the screen. Those performing the same operation are denoted by the same reference numeral and the description thereof will be omitted.

In order to explain the cathode ray tube control apparatus of this embodiment in detail, the screen and waveforms of FIG. 26 and the index shape diagram of FIG. 27 are used. As the calculation between the adjustment points, the calculation within the screen can be performed relatively easily, and therefore the case of performing the extrapolation calculation outside the screen will be described here. In order to make the description easy to understand, the description will be given with respect to the case where the diagonal lines are formed. FIG. 26A shows a screen in which the test signal 105 is projected on the oblique index phosphor 7 of the cathode ray tube 40, and FIG. 26B shows an enlarged view of the left end of the screen. FIG. 26
An extrapolation point 110, which is an adjustment point outside the screen shown in (a), is obtained by calculation from the correction data of the adjustment points 109, 111, and 112 inside the screen. 26 (c) and 26 (d) show correction data diagrams for the screen position. As shown in FIGS. 26 (c) and 26 (d),
The correction data of the extrapolation point 110 is obtained by extrapolation calculation such as linear approximation in the horizontal and vertical directions.

The test signal generation circuit 104 of FIG. 25 generates test signals 106, 107, 108 between the adjustment points as shown by the broken line in FIG. Converter 101 and sample hold circuit 1
It is measured at 02. The amount of deviation detected between the adjustment points in each direction is shown by the broken line in FIGS.
Through the converter 32 and the operation circuit 97, the adjustment point operation circuit 1
It is supplied to 03. The adjustment point calculation circuit 103 detects the deviation amount between the adjustment points shown in FIGS. 26 (c) and 26 (d) and calculates the optimum correction data of the extrapolation point 110. Therefore, in the extrapolation calculation by the linear approximation in the horizontal direction shown in FIG. 26C, the correction data D1 is calculated by detecting the information between the adjustment points with respect to the correction data D2.

Similarly, in the extrapolation operation by the linear approximation in the vertical direction shown in FIG. 26 (d), the correction data D4 is calculated by detecting the information between the adjustment points with respect to the correction data D3, and the highly accurate external data is obtained. Insertion operation becomes possible. As the procedure of the calculation method between the adjustment points, first obtain the correction data on the adjustment points, capture the deviation amount by sequentially moving the test signal for detection between the adjustment points, and use this captured data to correct the correction between the adjustment points. Ask for data. The reason why the detection and calculation between the adjustment points are possible in this embodiment is that the continuous oblique index phosphor 112 is applied and detected as shown in FIG.

As described above, by moving the test signal between the adjustment points and calculating the correction amount between the adjustment points, the correction accuracy between the adjustment points is improved, and the extrapolation points existing outside the screen are particularly used. Since the correction amount of can be calculated automatically, highly accurate correction can be realized in the peripheral portion of the screen.

In the first to fifth embodiments, the display device using the CRT has been described for easy understanding, but it goes without saying that other display devices are also effective. Further, in the first to fifth embodiments, the case where the index fluorescent material is applied to the shadow mask surface as the location of the beam shielding portion has been described, but the beam shielding portion other than that may be used. Although the correction waveform creating method has been described as being performed digitally, it may be performed by analog processing.

In addition, in the first embodiment, the two oblique index phosphors are formed in a V shape, but other oblique shapes may be used. In the second embodiment, the case where the ROM is written in advance as the data for correcting the positional deviation amount between the detection surface and the display surface has been described.
The distance between the shadow mask surface and the fluorescent screen may be calculated from the amount of displacement on the fluorescent screen, which is the display surface, and the correction may be performed automatically.

Further, in the third embodiment, the case where the center position is detected as the position detecting means has been described, but it may be performed by detecting the average value of the signal or the position of the center of gravity. Also,
In the fourth embodiment, the case where the test signal generation is controlled as the means for generating the test signal for the sequential scanning is described, but the scanning of the deflection system may be controlled to perform the sequential scanning.

Further, in the fifth embodiment, the case where the correction operation is controlled by the discrimination signal is described, but the level of the signal system and the condition setting of the time measurement may be set. Further, in the sixth embodiment, the calculation between the adjustment points is performed by the linear approximation, but other calculations such as curve approximation may be performed.

[0073]

As described above, according to the first aspect of the invention, the shadow masks are arranged at predetermined positions on the surface of the shadow mask and have two oblique shapes in the main scanning direction of the electron beam. By detecting the two-dimensional position of the electron beam based on the output signal of the detection element, a cathode ray tube coated with the index phosphor can be realized with a simple structure. Also,
By applying the oblique line index phosphors in which the shapes of the detection elements are continuous, the structure can be further simplified and various convergence correction points can be realized. Further, since the detection region is narrow and the barycentric positions at the respective detection positions are close to each other, it is possible to detect the position with high accuracy, so that highly accurate correction can be realized.

According to the second invention, the two-dimensional position of the electron beam is obtained from the detection signal of the electron beam from the shadow mask surface and the distance between the shadow mask surface and the fluorescent surface, and the deflection means is controlled. By correcting the deflection distortion of the electron beam, it is possible to correct an error based on the positional deviation between the display surface and the detection surface on which the index phosphor is installed, and realize highly accurate correction. Further, by making the detecting means into two oblique shapes in the main scanning direction of the electron beam, the structure of the cathode ray tube can be simplified, and various convergence correction points can be realized. Further, the calculation means calculates the distance between the shadow mask surface and the phosphor screen from the amount of displacement on the phosphor screen at the two-dimensional position, whereby complete adjustment can be realized.

According to the third invention, the two-dimensional center position of the electron beam is obtained from the detection signal of the electron beam from the shadow mask surface and each signal width, and the deflection distortion of the electron beam is corrected by this signal. As a result, the correction error due to the beam spot size and the aberration can be corrected, and more accurate correction can be realized. Further, by making the detecting means oblique to the main scanning direction of the electron beam, the structure of the cathode ray tube can be simplified and various convergence correction points can be dealt with.

According to the fourth invention, the test signal for detection of progressive scanning is sequentially projected on the detecting means to obtain the two-dimensional position, and the deflecting means is controlled by this signal to deflect the electron beam deflection distortion. By performing the correction, stable and highly accurate position measurement can be performed, so that the highly accurate correction can be realized.

According to the fifth invention, it is judged that the detection signal corresponding to the position detecting element at the predetermined position is outputted, and the deflection means is controlled by this signal to correct the deflection distortion of the electron beam. By controlling, it becomes possible to detect abnormal operation of the detection system due to the index signal and automatically detect erroneous operation, so that complete adjustment-free can be realized.

According to the sixth aspect of the invention, the test signal is moved between the adjustment points to calculate the correction amount between the adjustment points, whereby the correction accuracy between the adjustment points is improved, and particularly, it exists outside the screen. Since the correction amount of the extrapolation point can be automatically calculated, highly accurate correction can be realized in the peripheral portion of the screen, and its practical effect is great.

[Brief description of drawings]

FIG. 1 is a structural diagram of a cathode ray tube control device according to an embodiment of the present invention.

FIG. 2 is a screen diagram for explaining the operation of the embodiment.

FIG. 3 is a block diagram for explaining the operation of the embodiment.

FIG. 4 is a block diagram for explaining the operation of the embodiment.

FIG. 5 is a diagram showing a relationship between screens and waveforms for explaining the operation of the embodiment.

FIG. 6 is a block diagram of a correction waveform creation unit for explaining the configuration of the embodiment.

FIG. 7 is a screen diagram for explaining the operation of the convergence correction of the embodiment.

FIG. 8 is a spectral characteristic diagram of the index phosphor of the same example.

FIG. 9 is a block diagram of a cathode ray tube controller according to a second embodiment of the present invention.

FIG. 10 is a structural diagram of a cathode ray tube for explaining the operation of the embodiment.

FIG. 11 is a CRT configuration diagram for explaining the principle of occurrence of misconvergence in the embodiment.

FIG. 12 is a screen diagram for explaining the operation of the embodiment.

FIG. 13 is a diagram showing a relationship between screens and waveforms for explaining the operation of the embodiment.

FIG. 14 is a diagram showing a relationship between a screen and a waveform for explaining the operation of the conventional example.

FIG. 15 is a diagram showing a relationship between screens and waveforms for explaining the operation of the embodiment.

FIG. 16 is a screen diagram for explaining the operation of the embodiment.

FIG. 17 is a diagram showing a relationship between a correction wave and a correction change for explaining the operation of the embodiment.

FIG. 18 is a block diagram of an image correction apparatus according to a third embodiment of the present invention.

FIG. 19 is a diagram showing the relationship between screens and waveforms for explaining the operation of the embodiment.

FIG. 20 is a block diagram of an image correction apparatus according to a fourth embodiment of the present invention.

FIG. 21 is a diagram showing a relationship between screens and waveforms for explaining the operation of the embodiment.

FIG. 22 is a block diagram of an image correction apparatus according to a fifth embodiment of the present invention.

FIG. 23 is a diagram showing the relationship between screens and waveforms for explaining the operation of the embodiment.

FIG. 24 is a characteristic diagram for explaining the operation of the embodiment.

FIG. 25 is a block diagram of an image correction apparatus according to a sixth embodiment of the present invention.

FIG. 26 is a diagram showing a relationship between a screen and correction data for explaining the operation of the embodiment.

FIG. 27 is an index shape diagram for explaining the operation of the embodiment.

FIG. 28 is a block diagram of a conventional cathode ray tube control device.

FIG. 29 is a screen diagram for explaining the operation of the conventional example.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Electron gun 2 Electron gun 3 Electron gun 4 Shadow mask surface 5 Fluorescent screen 6 Index fluorescent substance 7 Continuous index fluorescent substance 12 Detection part 13 Correction waveform creation part 14 Deflection part 15 Signal processing part 19 Screen amplitude / deflection distortion correction circuit 20 Convergence correction circuit 21 Photoelectric conversion element 22 Time-voltage converter 23 Measurement circuit 26 Address generation circuit 27 Memory 28 Interpolation circuit 29 D / A converter 32 A / D converter 33 Arithmetic circuit 34 Memory 35 D / A converter 36 Position Deviation correction circuit 37 Sample-and-hold circuit 38 Time-voltage converter 40 Cathode ray tube 57 Test signal generation circuit 77 Position deviation correction circuit 83 Center position detection circuit 92 Signal switching circuit 93 Sequential scanning test signal generation circuit 94 Correction operation control circuit 95 2 values Conversion circuit 96 Discrimination circuit 97 Operation circuit 101 hours Voltage converter 102 sample and hold circuit 103 between adjustment points arithmetic circuit 104 the test signal generating circuit

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hiroshi Taniguchi 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.

Claims (11)

[Claims] 1. A display screen made of a phosphor, an electron gun for generating an electron beam toward the display screen, a beam shield disposed between the electron gun and the display screen, and a surface of the beam shield. Arranged in place,
The electron beam has a shape in which two oblique linear bodies are formed in the main scanning direction of the electron beam, and includes a detection element that generates a signal in response to the scanning of the electron beam, and the electron beam is based on the output signal of the detection element. A cathode ray tube control device, characterized in that the electron beam is deflected by detecting a two-dimensional position thereof. 2. The cathode ray tube control device according to claim 1, wherein the shape of the detection element is formed by continuous diagonal lines. 3. A color cathode ray tube having an electron gun for generating an electron beam, a position detecting element arranged on the surface of the shadow mask on the side of the electron gun, and having a position detecting element responsive to the electron beam from the electron gun, and the color cathode ray tube. Detecting means provided near or inside the pipe for detecting the response of the position detecting element,
The position detecting means further comprises a processing means for obtaining a two-dimensional position of the electron beam based on the detection signal of the detecting means and the distance between the shadow mask surface and the fluorescent surface and controlling the deflection to correct the deflection distortion of the electron beam. A device for controlling a cathode ray tube, wherein the elements are distributed in a shadow mask region corresponding to the entire display region of the cathode ray tube. 4. The cathode ray tube controller according to claim 3, wherein the position detecting element has two oblique shapes in the main scanning direction of the electron beam. 5. An electron gun for generating an electron beam, a color cathode ray tube having a position detecting element arranged on the surface of the shadow mask on the electron gun side and responsive to the electron beam from the electron gun, and the color cathode ray tube. Detecting means provided near or inside the pipe for detecting the response of the position detecting element,
And a processing means for determining a two-dimensional center position of the electron beam on the basis of the position and signal width of the detection signal of the detection means and controlling the deflection to correct the deflection distortion of the electron beam. A cathode ray tube control device characterized by being distributed in a region of a shadow mask corresponding to the entire display region of the tube. 6. The cathode ray tube controller according to claim 5, wherein the position detecting element has two oblique shapes in the main scanning direction of the electron beam. 7. An electron gun for generating an electron beam, a color cathode ray tube having a position detecting element arranged on the surface of the shadow mask on the electron gun side and responsive to the electron beam from the electron gun, and the cathode ray tube. Provided near or inside
Detecting means for detecting the response of the position detecting element; projecting means for sequentially projecting a test signal for detection of progressive scanning on the detecting means; and obtaining a two-dimensional position by the detecting signal,
A cathode ray tube characterized in that the position detecting element is distributed in a shadow mask region corresponding to the entire display region of the cathode ray tube. Control device. 8. A color cathode ray tube having an electron gun for generating an electron beam, a position detecting element arranged on the surface of the shadow mask on the side of the electron gun, and having a position detecting element responsive to the electron beam from the electron gun, and the color cathode ray tube. Detecting means provided near or inside the pipe for detecting the response of the position detecting element,
Judgment means for judging that a detection signal corresponding to a position detection element at a predetermined position is outputted from the detection means, and a two-dimensional position of the electron beam is obtained from the detection signal, and deflection is controlled by the judgment signal. And a control means for controlling the correction operation of the deflection distortion of the electron beam. 9. A color cathode ray tube having an electron gun for generating an electron beam, a position detecting element arranged on the surface of the shadow mask on the side of the electron gun, and having a position detecting element responsive to the electron beam from the electron gun, and the color cathode ray tube. A plurality of detecting means are provided near or inside the tube and project a detecting test signal on the position detecting element to detect a response, and a two-dimensional position of the electron beam is obtained from the detecting signal to control deflection. And a control means for controlling the deflection distortion correction operation of the electron beam, and a calculating means for moving the test signal between the adjustment points to calculate the correction amount between the adjustment points. apparatus. 10. The cathode ray tube control apparatus according to claim 9, wherein the calculating means calculates a correction amount of an extrapolation point existing outside the screen. 11. The cathode ray tube controller according to claim 9, wherein the position detecting element has two oblique shapes in the main scanning direction of the electron beam.