JPH06101151B2 - Method for manufacturing optical information recording medium - Google Patents
Method for manufacturing optical information recording mediumInfo
- Publication number
- JPH06101151B2 JPH06101151B2 JP15772383A JP15772383A JPH06101151B2 JP H06101151 B2 JPH06101151 B2 JP H06101151B2 JP 15772383 A JP15772383 A JP 15772383A JP 15772383 A JP15772383 A JP 15772383A JP H06101151 B2 JPH06101151 B2 JP H06101151B2
- Authority
- JP
- Japan
- Prior art keywords
- hydrocarbon
- optical information
- recording medium
- recording film
- discharge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24302—Metals or metalloids
- G11B2007/24308—Metals or metalloids transition metal elements of group 11 (Cu, Ag, Au)
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24302—Metals or metalloids
- G11B2007/24314—Metals or metalloids group 15 elements (e.g. Sb, Bi)
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24302—Metals or metalloids
- G11B2007/24316—Metals or metalloids group 16 elements (i.e. chalcogenides, Se, Te)
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24318—Non-metallic elements
- G11B2007/24328—Carbon
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/252—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
- G11B7/253—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates
- G11B7/2531—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates comprising glass
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/252—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
- G11B7/253—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates
- G11B7/2533—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of substrates comprising resins
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing Optical Record Carriers (AREA)
Description
【発明の詳細な説明】 〔発明の属する技術分野〕 本発明はレーザビームの照射により光学的変化を生じさ
せて情報を記録する光学的情報記録用媒体の製造方法に
関するもである。Description: TECHNICAL FIELD The present invention relates to a method for producing an optical information recording medium in which information is recorded by causing an optical change by irradiation with a laser beam.
レーザビームによる情報記録は、記録密度が著しく高
く、実時間記録ができるなどの特徴があり、近年研究開
発が行なわれている。光情報記録用媒体は、従来、透明
樹脂基板上にTeなどのカルコゲナイド系薄膜、色素薄膜
などを形成したものが提案されている。しかしながらか
かる情報記録用媒体は保存中に空気中の酸素、水分、あ
るいは紫外線の影響により劣化し、情報の記録再生に支
障をきたすという重大な問題点がある。Information recording using a laser beam has features such as a remarkably high recording density and real-time recording, and research and development have been conducted in recent years. As an optical information recording medium, a medium in which a chalcogenide thin film such as Te or a dye thin film is formed on a transparent resin substrate has been conventionally proposed. However, such an information recording medium has a serious problem that it deteriorates due to the influence of oxygen, moisture, or ultraviolet rays in the air during storage, which hinders the recording and reproduction of information.
特開昭57−165292号公報には、かかる従来技術の欠点を
除去するためにTeにカーボンを混入させた媒体の提案で
ある。Teとカーボンとを含む記録膜の一つの製作方法
は、Teターゲットを炭化水素ガスのプラズマでスパッタ
リグする方法である。しかしながらスパッタリングは、
従来Arなどの希ガスのプラズマで金属ターゲットをスパ
ッタし、当該金属の薄膜を形成する方法として用いられ
てきた。ターゲットとプラズマガスとの反応の可能性の
高い組合せ、あるいは炭化水素など解離性のガスを用い
たスパッタリングは実用に供された例が極めて少なく、
従って工業レベルでかかるスパッタリングを実施する場
合、細部の膜形成条件は不明のことが多い。例えば解離
性のガスを用いる場合、ターゲットに印加する電力、膜
形成時の圧力、導入するガスの流量などにより解離過程
が変化し、形成される膜の特性は変化する。しかも、膜
形成時に設定すべき上記種々の条件値はスパッタ装置毎
に変化する。そこで、最適の膜形成条件は個々の装置毎
に多数の実験を行ない設定しなければならないと言う不
便さがあった。Japanese Unexamined Patent Publication (Kokai) No. 57-165292 proposes a medium in which Te is mixed with carbon in order to eliminate the drawbacks of the prior art. One method for producing a recording film containing Te and carbon is a method of sputtering a Te target with plasma of hydrocarbon gas. However, sputtering is
Conventionally, it has been used as a method for forming a thin film of the metal by sputtering a metal target with plasma of a rare gas such as Ar. There are very few examples in which the combination of the target and the plasma gas having a high possibility of reaction, or the sputtering using a dissociative gas such as hydrocarbon is practically used.
Therefore, when carrying out such sputtering on an industrial level, detailed film forming conditions are often unknown. For example, when a dissociative gas is used, the dissociation process changes depending on the power applied to the target, the pressure at the time of forming the film, the flow rate of the gas to be introduced, and the characteristics of the formed film change. Moreover, the above-mentioned various condition values to be set at the time of film formation vary depending on the sputtering apparatus. Therefore, there is an inconvenience that the optimum film forming conditions must be set by conducting a large number of experiments for each individual apparatus.
本発明の目的は、かかる従来技術の欠点を除去し、解離
性である炭化水素を含むガスを用いたスパッタリングに
おいて、記録再生特性が良く制御された記録膜を形成し
た光情報記録用媒体の製造方法を提供することにある。An object of the present invention is to eliminate the above-mentioned drawbacks of the prior art, and to manufacture an optical information recording medium having a recording film with well-controlled recording and reproducing characteristics in sputtering using a gas containing a dissociative hydrocarbon. To provide a method.
本発明の光情報記録用媒体の製造方法においては、金属
ターゲットを炭化水素を含むガスのプラズマでスパッタ
リングして記録膜を形成する過程において発生する種々
の形成条件変動要因が、主として炭化水素の放電に伴な
う解離現象に起因するものであることを見出し、導入炭
化水素から解離現象で生成する第2の炭化水素の分圧
を、放電開始前の分圧に対し、2〜12の範囲に制御して
記録膜の形成を行なうことを特徴としている。In the method for producing an optical information recording medium of the present invention, various forming condition fluctuation factors that occur in the process of forming a recording film by sputtering a metal target with plasma of a gas containing hydrocarbon mainly discharge the hydrocarbon. It was found that it was caused by the dissociation phenomenon associated with, and the partial pressure of the second hydrocarbon generated by the dissociation phenomenon from the introduced hydrocarbon was set within the range of 2 to 12 with respect to the partial pressure before the start of discharge. It is characterized in that the recording film is formed under control.
本発明によれば、いかなるスパッタ装置においても、光
情報記録用媒体として秀れた記録再生特性を示し、かつ
記録膜の形成速度の大きいと云う工業上の必要性も満足
させる記録膜の膜形成条件を多数の実験をくり返すこと
なくあらかじめ設定できるという極めて大なる効果があ
る。According to the present invention, a film formation of a recording film which shows excellent recording / reproducing characteristics as an optical information recording medium in any sputtering apparatus and which satisfies the industrial need for a high recording film forming speed. There is an extremely great effect that the condition can be set in advance without repeating many experiments.
以下、本発明を実施例に基づき詳述する。 Hereinafter, the present invention will be described in detail based on examples.
第1図は本発明を実施するためのスパッタ装置の一例で
ある。図中、1は真空容器、2は真空ポンプ(図示して
いない)へ接続された排気口、3は解離性ガスを含むガ
ス導入口、4は金属ターゲット、5は電力印加用端子、
6は接地された対向電極で基板ホルダーを兼ねている。
7は分圧計である。FIG. 1 is an example of a sputtering apparatus for carrying out the present invention. In the figure, 1 is a vacuum container, 2 is an exhaust port connected to a vacuum pump (not shown), 3 is a gas inlet containing a dissociative gas, 4 is a metal target, 5 is a power application terminal,
A counter electrode 6 is grounded and also serves as a substrate holder.
7 is a partial pressure gauge.
光情報記録用媒体を製造する場合、透明有機樹脂あるい
はガラスからなる基板を基板ホルダー6に設置し、真空
容器1を10-6Torr程度に排気する。しかる後、ガス導入
口から解離性ガスを含むガスを導入し、真空容器1内が
所定の圧力になるようガス流量、および真空ポンプへの
排気量を調整するバルブ(図示していない)の開閉量を
制御する。真空容器の圧力は10-3Torrから10-2Torr台が
好ましい。10-4Torr台以下であると安定した放電が得ら
れにくい。また10-1Torrより高い場合安定なスパッタリ
ングが困難である。真空容器1が所定の圧力に到達した
後、電力端子5を介してターゲット4と対向電極6との
間に電力を印加し、放電を行なわせる。放電に伴ない生
成する炭化水素を含むプラズマによりターゲット3をス
パッタし基板上に記録膜を形成する。When manufacturing an optical information recording medium, a substrate made of a transparent organic resin or glass is placed on the substrate holder 6, and the vacuum container 1 is evacuated to about 10 −6 Torr. After that, a gas containing a dissociative gas is introduced from the gas inlet, and a valve (not shown) is opened and closed to adjust the gas flow rate and the exhaust amount to the vacuum pump so that the inside of the vacuum container 1 has a predetermined pressure. Control the amount. The pressure in the vacuum vessel is preferably in the range of 10 −3 Torr to 10 −2 Torr. If it is below 10 −4 Torr, it is difficult to obtain stable discharge. If it is higher than 10 -1 Torr, stable sputtering is difficult. After the vacuum container 1 reaches a predetermined pressure, electric power is applied between the target 4 and the counter electrode 6 via the power terminal 5 to cause discharge. The target 3 is sputtered by the plasma containing the hydrocarbon generated by the discharge, and the recording film is formed on the substrate.
炭化水素は放電により解離する。解離により生成する種
々の活性種は、スパッタに関与するもの、ターゲットと
反応するもの、基板上に堆積するものなどがある。従っ
て活性種の種類、数量、およびエネルギーなどは記録膜
の記録再生特性、基板への堆積速度に重大な影響を及ぼ
す。解離過程に影響を及ぼす最も重要な因子は解離性ガ
スの放電空間内における平均滞在時間と印加電力密度で
ある。平均滞在時間が長い程、印加電力密度が大きい程
解離反応は促進される。平均滞在時間は下式で定義され
る。Hydrocarbons dissociate by discharge. Various active species generated by dissociation include those involved in sputtering, those that react with a target, and those that deposit on a substrate. Therefore, the type, quantity, and energy of the active species have a significant influence on the recording / reproducing characteristics of the recording film and the deposition rate on the substrate. The most important factors affecting the dissociation process are the average residence time of the dissociative gas in the discharge space and the applied power density. The dissociation reaction is promoted as the average residence time is longer and the applied power density is higher. The average stay time is defined by the following formula.
即ち、ターゲット面積は通常スパッタ装置ごとに一定の
値をとるが、放電圧力や電極間距離及び印加電力装置を
固定しても、解離性ガスの流量が変化すれば解離性ガス
の平均滞在時間は変化し、従って解離反応の進行状況が
変化し、記録膜の形成過程が変化するのである。解離性
ガス流量を変化させても、真空ポンプの排気速度を変化
させれば真空容器内の圧力を一定に保つことは可能であ
る。この解離過程の変化が炭化水素を含むガスのスパッ
タリングによる記録膜の形成過程を複雑なものにする主
要原因である。 That is, the target area usually takes a constant value for each sputtering apparatus, but even if the discharge pressure, the distance between the electrodes, and the applied power device are fixed, the average residence time of the dissociative gas changes if the flow rate of the dissociative gas changes. Therefore, the progress of the dissociation reaction changes, and the formation process of the recording film changes. Even if the flow rate of the dissociative gas is changed, it is possible to keep the pressure in the vacuum container constant by changing the exhaust speed of the vacuum pump. This change in the dissociation process is the main cause of complicating the process of forming the recording film by sputtering the gas containing hydrocarbon.
以下この点についてさらに詳述すると、解離性ガスを用
いたスパッタリングでは、真空容器内の圧力、解離性ガ
スの流量、印加電力密度の適正値はスパッタリング装置
ごとに異なるうえ、これらがひとたび適正値に設定され
ても、膜形成時にその値が変動すれば良好な記録再生特
性を示す記録膜を大きな形成速度で形成することはでき
ない。然るに、従来解離性ガスを用いたスパッタリング
で記録膜を形成する場合、解離性ガスの解離現象に起因
する膜形成条件の変動については一切考慮されていなか
ったため、記録膜の記録再生特性、基板への堆積速度に
重大な影響を招いていた。そこで出願人らは、このよう
な膜形成条件の変動が膜形成に及ぼす影響についてさら
に研究を進め、特に問題となるのは真空容器内の圧力が
安定するまで解離性ガスを導入した後、放電開始時に電
力を投入した際に生じる真空容器内の圧力の変化である
という知見を得た。To further elaborate on this point, in sputtering using a dissociative gas, the pressure in the vacuum container, the flow rate of the dissociative gas, and the appropriate value of the applied power density differ depending on the sputtering apparatus, and once these values become appropriate. Even if it is set, if the value fluctuates during film formation, it is not possible to form a recording film exhibiting good recording / reproducing characteristics at a high forming speed. However, when forming a recording film by sputtering using a dissociative gas, the change in film forming conditions due to the dissociation phenomenon of the dissociative gas was not considered at all, so the recording / reproducing characteristics of the recording film and the substrate Had a significant effect on the deposition rate of P. Therefore, the applicants have further researched the influence of such fluctuations in the film forming conditions on the film formation, and the particular problem is that after introducing the dissociative gas until the pressure in the vacuum container becomes stable, the discharge We have found that it is the change in pressure inside the vacuum container that occurs when power is turned on at the start.
即ち解離性ガスを用いたスパッタリングでは通常、放電
開始時に電力を投入した際に真空容器内の解離性ガスの
圧力の急激な低下が生じる。このため従来は、上式で定
義される解離性ガスの放電空間内における平均滞在時間
が減少して解離性ガスの解離反応が抑制され、結果的に
解離性ガスを導入しときに設定された初期の膜形成条件
は膜形成時に失われて、記録膜の記録再生特性、基板へ
の堆積速度の制御が困難となっていた。これに対して本
発明においては、上述した通り記録膜の記録再生特性、
基板への堆積速度に対する重要な因子である解離性ガス
の放電空間内における平均滞在時間と印加電力密度を、
放電開始直後に適正な範囲に再設定することにより、膜
形成条件の変動に起因する問題を回避することが原理的
に可能となる。より具体的には、例えば再び解離性ガス
の圧力が変化することがないよう真空ポンプの排気速度
を調節しながら、解離性ガス流量を抑えて解離性ガスの
放電空間内におけるけ平均滞在時間の値を補正する方法
などによって、解離性ガスの解離反応を促進させれば良
い。That is, in sputtering using a dissociative gas, the pressure of the dissociative gas in the vacuum container is usually sharply reduced when power is applied at the start of discharge. For this reason, conventionally, the average residence time of the dissociative gas in the discharge space defined by the above equation is reduced, the dissociative reaction of the dissociative gas is suppressed, and as a result, it is set when the dissociative gas is introduced. The initial film formation conditions were lost during film formation, making it difficult to control the recording / reproducing characteristics of the recording film and the deposition rate on the substrate. On the other hand, in the present invention, as described above, the recording / reproducing characteristics of the recording film,
The average residence time of the dissociative gas in the discharge space and the applied power density, which are important factors for the deposition rate on the substrate,
By resetting to an appropriate range immediately after the start of discharge, it is possible in principle to avoid problems caused by fluctuations in film forming conditions. More specifically, for example, while controlling the exhaust rate of the vacuum pump so that the pressure of the dissociative gas does not change again, the flow rate of the dissociative gas is suppressed and the average residence time of the dissociative gas in the discharge space is reduced. The dissociation reaction of the dissociative gas may be promoted by a method of correcting the value.
ここで出願人らは種々の実験により、導入した炭化水素
の放電による解離で生成するのが主としてC2H2,C2H4と
いった第2の炭化水素であることを確め、上述したよう
な膜形成条件を放電開始直後に適宜調整し、記録膜形成
時のC2H2,C2H4分圧を放電開始以前の分圧に比べ所定の
範囲に制御すれば、スパッタリング装置によらず特性の
制御された記録膜の形成が可能なことを見出した。Here, the applicants confirmed by various experiments that the second hydrocarbon such as C 2 H 2 and C 2 H 4 is mainly produced by the dissociation of the introduced hydrocarbon by the discharge, and as described above. If the film forming conditions are appropriately adjusted immediately after the discharge is started and the partial pressure of C 2 H 2 and C 2 H 4 at the time of forming the recording film is controlled within a predetermined range compared to the partial pressure before the start of discharge, the sputtering device It was found that it is possible to form a recording film with controlled characteristics.
第2図は炭化水素を含むガスのスパッタリングによる記
録膜の形成を行なうためのダイアグラムである。図中、
11は放電による加熱により基板・記録膜が損傷しないた
めの印加電力密度の装置によらない上限である。値とし
ては通常2W/cm2程度である。12は安定な放電が持続する
ための印加電力密度の装置によらない下限である。値と
しては通常0.01W/cm2程度である。13は放電に必要な圧
力を維持するための炭化水素流量の下限である。通常の
装置の場合1〜10cm3/min程度の値である。14は放電に
必要な圧力を維持するための炭化水素流量の上限であ
る。通常の装置の場合、100〜500cm3/min程度である。FIG. 2 is a diagram for forming a recording film by sputtering a gas containing hydrocarbon. In the figure,
11 is the upper limit of the applied power density, which does not depend on the device, so that the substrate and the recording film are not damaged by the heating by the discharge. The value is usually about 2 W / cm 2 . 12 is the lower limit of the applied power density, which does not depend on the device, for maintaining stable discharge. The value is usually about 0.01 W / cm 2 . 13 is the lower limit of the hydrocarbon flow rate for maintaining the pressure required for discharge. In the case of an ordinary device, the value is about 1 to 10 cm 3 / min. 14 is the upper limit of the hydrocarbon flow rate for maintaining the pressure required for discharge. In the case of a normal device, it is about 100 to 500 cm 3 / min.
第2図において、直線11,13と曲線15とで囲まれる斜線
を施した領域Iは炭化水素の放電空間における平均滞在
時間が長く、印加電力密度が大きいため、解離反応が過
大に進行する領域である。領域Iで記録膜の形成を行な
うと解離により生成した活性種と基板との作用が激しす
ぎ、記録膜は形成されず、活性種の重合物である粉末が
堆積したり、あるいは記録膜は形成されても著しく表面
平坦性が損われたものになってしまう。In FIG. 2, the hatched region I surrounded by the straight lines 11 and 13 and the curve 15 is a region where the dissociation reaction proceeds excessively because the average residence time of hydrocarbons in the discharge space is long and the applied power density is large. Is. When the recording film is formed in the region I, the action of the active species generated by dissociation and the substrate is too intense, the recording film is not formed, and the powder of the active species is deposited or the recording film is not formed. Even if formed, the surface flatness is remarkably impaired.
第2図において直線12,14と曲線16とで囲まれた斜線を
施した領域IIIは、炭化水素の平均滞在時間が短く、印
加電力密度が小さいため解離反応が充分進行しない領域
である。従って、記録膜の堆積速度は著しく遅くなって
しまう。工業レベルで記録膜形成を行なうには不適当な
領域である。In FIG. 2, the hatched region III surrounded by the straight lines 12 and 14 and the curve 16 is a region in which the average residence time of hydrocarbons is short and the applied power density is small, so that the dissociation reaction does not proceed sufficiently. Therefore, the deposition rate of the recording film becomes extremely slow. This is an area unsuitable for forming a recording film on an industrial level.
以上により直線11,12,13,14と曲線15,16で囲まれた領域
II内で記録膜の形成を行なえば、記録再生特性の秀れた
媒体を製造することができ、かつ同時に膜形成速度が大
きいと云う工業上の利点も保有することができる。Due to the above, the area surrounded by straight lines 11, 12, 13, 14 and curves 15, 16
If the recording film is formed in II, a medium having excellent recording / reproducing characteristics can be manufactured, and at the same time, an industrial advantage that the film forming speed is high can be held.
実施例−1 直径20cmの円形Teターゲットを具備したRF2極型スパッ
タ装置において、電極間距離を7cmとし、炭化水素とし
てCH4を2×10-2Torrになるよう導入した。導入するCH4
流量を一定にして、印加電力密度を様々に変化させてス
パッタを行ない、記録膜を形成した。CH4を導入するが
放電を行なわない状態におけるC2H2の分圧P2及び記録膜
形成時のC2H2分圧P1を分圧計で測定した。分圧計として
は四重極型質量分析計を使用した。P1/P2の値と、記録
膜堆積速度との関係を、第3図に示す。図中aは、CH4
流量を10cm3/min,bは20cm3/min一定としたときの曲線で
ある。放電の開始に伴ないただちにC2H2が生成しP1/P2
の値は増加し、2を越える附近より大きな堆積速度が認
められた。印加電力の増加に伴ない、P1/P2の値はさら
に増加し、同時に堆積速度も増加した。Example 1 In an RF bipolar electrode sputtering apparatus equipped with a circular Te target having a diameter of 20 cm, the distance between electrodes was set to 7 cm, and CH 4 was introduced as a hydrocarbon to 2 × 10 −2 Torr. Introduce CH 4
While keeping the flow rate constant, the applied power density was variously changed to perform sputtering to form a recording film. Introducing CH 4 was measured C 2 H 2 partial pressure P 1 at the time of partial pressure P 2 and the recording layer formed of C 2 H 2 in the state of not performing discharge potentiometer. A quadrupole mass spectrometer was used as the partial pressure meter. The relationship between the value of P 1 / P 2 and the recording film deposition rate is shown in FIG. In the figure, a is CH 4
The flow rate is 10 cm 3 / min and b is a curve when the flow rate is constant at 20 cm 3 / min. C 2 H 2 is generated immediately with the start of discharge and P 1 / P 2
The value of was increased, and a deposition rate greater than 2 was observed. As the applied power increased, the value of P 1 / P 2 further increased, and at the same time, the deposition rate also increased.
第3図中cで示した曲線は、本実施例で製作した情報記
録用媒体の反射率と記録膜形成時のP1/P2の値との関係
を示している。The curve indicated by c in FIG. 3 shows the relationship between the reflectance of the information recording medium manufactured in this example and the value of P 1 / P 2 when the recording film is formed.
反射率の値は記録膜の屈折率などによって変化するが、
通常40%程度以上が好ましい。The reflectance value changes depending on the refractive index of the recording film,
Usually, about 40% or more is preferable.
基板は厚さ1.5mmのアクリル板、記録膜の厚さは600Åで
ある。反射率は半導体レーザ(波長8300Å)を用いて測
定した。反射率の値はP1/P2の値が12を越えると記録膜
表面の平坦性がそこなわれるため急速に低下した。The substrate is an acrylic plate with a thickness of 1.5 mm, and the thickness of the recording film is 600Å. The reflectance was measured using a semiconductor laser (wavelength 8300Å). When the value of P 1 / P 2 exceeds 12, the reflectance value is rapidly lowered because the flatness of the recording film surface is impaired.
P1/P2の値が2より大きく、12より小さい範囲で製作し
た媒体は半導体レーザビーム5mW×200nsecの照射により
信号が記録され、再生信号の変調度は60%を示すという
秀れた記録再生特性を示した。Excellent recording that the medium manufactured in the range of P 1 / P 2 is larger than 2 and smaller than 12 has a signal recorded by irradiation with a semiconductor laser beam of 5 mW × 200 nsec, and the modulation of the reproduced signal shows 60%. Reproduction characteristics are shown.
実施例−2 実施例−1と同様にTeターゲットをCH4のプラズマでス
パッタして記録膜の形成を行なった。放電圧力は2×10
-2Torrとした。CH4を導入するが放電を行なわない状態
におけるC2H4の分圧P4、及び記録膜形成時のC2H4分圧を
測定した。P3/P4の値と堆積速度との関係を第4図a,b,
cに示す。aはCH4流量が30cm3/min,bは50cm3/min、cは
70cm3/minの場合である。放電の開始に伴ない、ただち
にC2H4が生成しP3/P4の値は増加し、2を越えると100
Å/min以上の大きな堆積速度が得られた。印加電力の増
加に伴ない、P3/P4の値はさらに増加し、同時に堆積速
度も増加した。P3/P4の値が2より大きい膜形成条件に
おいては、同時に測定したC2H2の分圧比P1/P2の値は同
様に2より大きい値を示した。同じくP3/P4が12より小
さい場合、P1/P2も12以下であつた。The Te target in the same manner as in Example -2 Example -1 was performed to form the recording layer by sputtering in a plasma of CH 4. Discharge pressure is 2 × 10
-2 Torr. Introducing CH 4 was measured partial pressure P 4, and C 2 H 4 partial pressure at the time of recording film of C 2 H 4 in a state of not performing discharge. The relationship between the value of P 3 / P 4 and the deposition rate is shown in Fig. 4 a, b,
Shown in c. a is CH 4 flow rate 30cm 3 / min, b is 50cm 3 / min, c is
The case is 70 cm 3 / min. With the start of discharge, C 2 H 4 is immediately generated and the value of P 3 / P 4 increases, and when it exceeds 2, it becomes 100.
A large deposition rate of Å / min or more was obtained. The value of P 3 / P 4 further increased with the increase of the applied power, and at the same time, the deposition rate also increased. Under the film forming conditions in which the value of P 3 / P 4 was larger than 2 , the value of the partial pressure ratio P 1 / P 2 of C 2 H 2 which was measured at the same time was similarly larger than 2. Similarly, when P 3 / P 4 was smaller than 12, P 1 / P 2 was also 12 or less.
第4図中曲線dは、本実施例で製作した媒体の反射率と
P3/P4の値との関係を示している。基板は1.5mmのアク
リル板、記録膜の厚さは、600Åである。反射率は半導
体レーザ(波長8300Å)を用いて測定した。反射率の値
はP2/P4の値が12を越えると急速に低下した。記録膜表
面の平坦性は著しくそこなわれていた。The curve d in FIG. 4 represents the reflectance of the medium manufactured in this example.
It shows the relationship with the values of P 3 / P 4 . The substrate is a 1.5 mm acrylic plate, and the thickness of the recording film is 600Å. The reflectance was measured using a semiconductor laser (wavelength 8300Å). The reflectance was decreased rapidly when the value of P 2 / P 4 exceeds 12. The flatness of the recording film surface was significantly impaired.
実施例−3 直径15cmの円形Agターゲットを具備したRFプレーナマグ
ネトロンスパッタ装置において、CH4とArとの混合ガス
を5×10-3Torrになるよう導入した。CH4とArとの分圧
比は3/1とした。混合ガスの流量を10cm3/min一定として
電力密度を0.01〜0.5W/cm2の間で変化させて記録膜の形
成を行なった。併行してP1,P2を測定した。C2H2の分圧
比P1/P2の値が2の時の堆積速度は150Å/minであり、P
1/P2=1.8の時の値20Å/minより7倍程大きかった。Example 3 In a RF planar magnetron sputtering apparatus equipped with a circular Ag target having a diameter of 15 cm, a mixed gas of CH 4 and Ar was introduced so as to have a concentration of 5 × 10 −3 Torr. The partial pressure ratio between CH 4 and Ar was 3/1. The recording film was formed by changing the power density from 0.01 to 0.5 W / cm 2 while keeping the mixed gas flow rate constant at 10 cm 3 / min. In parallel, P 1 and P 2 were measured. When the partial pressure ratio P 1 / P 2 of C 2 H 2 is 2, the deposition rate is 150Å / min.
It was about 7 times larger than the value of 20Å / min when 1 / P 2 = 1.8.
実施例−4 直径12cmの円形Sbターゲットを具備したDCプレーナマグ
ネトロンスパッタ装置において、C2H6を5×10-3Torrに
なるよう導入した。Example 4 In a DC planar magnetron sputtering apparatus equipped with a circular Sb target having a diameter of 12 cm, C 2 H 6 was introduced at 5 × 10 −3 Torr.
C2H6流量を5cm3/min一定として電力密度0.5〜1W/cm2の
間で変化させて記録膜の形成を行なった。併行してC2H4
の分圧P3,P4の測定を行なった。P3/P4の値が12により
小さい範囲で形成した記録膜表面は平坦で、5mW×250ns
ecの記録感度、変調度50%と云う良好な記録再生特性を
示した。一方し、P3/P4の値が15の場合、記録膜は形成
されず、基板上に黒色の粉末状重合物が堆積した。P3/
P4の値が12より小さい範囲においてはC2H2の分圧比P1/
P2の値も12以下であった。Was performed in the formation of the recording film by the C 2 H 6 flow rate varied between power density 0.5~1W / cm 2 as 5 cm 3 / min constant. Concurrent with C 2 H 4
The partial pressures P 3 and P 4 were measured. The surface of the recording film formed in the range where the P 3 / P 4 value is smaller than 12 is flat and is 5 mW × 250 ns.
It showed good recording and reproducing characteristics with a recording sensitivity of ec and a modulation of 50%. On the other hand, when the value of P 3 / P 4 was 15, the recording film was not formed and the black powdery polymer was deposited on the substrate. P 3 /
When the value of P 4 is less than 12, the partial pressure ratio of C 2 H 2 P 1 /
The value of P 2 was 12 or less.
第1図は本発明の製造方法を実施するための装置の一例
を示す模式図、第2図は本発明の製造方法に関する説明
図、第3図及び第4図は本発明により製造した記録媒体
記録膜の堆積速度及び媒体反射率と記録膜形成時の炭化
水素分圧比との関係との関係を示す図である。 1……真空容器、2……排気口、3……ガス導入口、4
……ターゲット、5……電力印加端子、6……基板ホル
ダー、7……分圧計。FIG. 1 is a schematic diagram showing an example of an apparatus for carrying out the manufacturing method of the present invention, FIG. 2 is an explanatory diagram relating to the manufacturing method of the present invention, and FIGS. 3 and 4 are recording media manufactured by the present invention. FIG. 3 is a diagram showing a relationship between a deposition rate of a recording film, a medium reflectance, and a hydrocarbon partial pressure ratio at the time of forming the recording film. 1 ... vacuum container, 2 ... exhaust port, 3 ... gas inlet port, 4
...... Target, 5 ...... Power application terminal, 6 ...... Substrate holder, 7 ...... Voltage meter.
Claims (7)
ラズマでスパッタリングして、少なくとも金属、炭素、
水素が含まれている記録膜を形成する方法において、記
録膜の形成過程で放電により導入した炭化水素から生成
された導入炭化水素とは異なる第2の炭化水素の分圧を
P1とし、炭化水素は導入するが放電を行なわない時の第
2の炭化水素分圧をP2とし、P1/P2の値を2〜12の範囲
にして放電を行なうようにしたことを特徴とする光情報
記録用媒体の製造方法。1. A metal target is sputtered with a plasma of a gas containing hydrocarbon to obtain at least metal, carbon,
In the method of forming a recording film containing hydrogen, the partial pressure of the second hydrocarbon different from the introduced hydrocarbon generated from the hydrocarbon introduced by discharge in the process of forming the recording film is set.
Let P 1 be the second hydrocarbon partial pressure when the hydrocarbon is introduced but the discharge is not performed be P 2, and the value of P 1 / P 2 should be in the range of 2 to 12 so that the discharge is performed. And a method for manufacturing an optical information recording medium.
であることを特徴とする特許請求の範囲第1項記載の光
情報記録用媒体の製造方法。2. The hydrocarbon introduced for forming a recording film is CH 4
The method for manufacturing an optical information recording medium according to claim 1, wherein
る第2の炭化水素がC2H2であることを特徴とする特許請
求の範囲第1項記載の光情報記録用媒体の製造方法。3. The method for producing an optical information recording medium according to claim 1, wherein the second hydrocarbon produced from the introduced hydrocarbon when forming the recording film is C 2 H 2. .
る第2の炭化水素がC2H4であることを特徴とする特許請
求の範囲第1項記載の光情報記録用媒体の製造方法。4. The method for producing an optical information recording medium according to claim 1, wherein the second hydrocarbon produced from the introduced hydrocarbon at the time of forming the recording film is C 2 H 4. .
入炭化水素流量、放電圧力、印加電力密度を制御する特
許請求の範囲第1項記載の光情報記録用媒体の製造方
法。5. The optical information recording medium according to claim 1, wherein the introduced hydrocarbon flow rate, discharge pressure, and applied power density are controlled so that the value of P 1 / P 2 falls within the range of 2 to 12. Manufacturing method.
であり、導入炭化水素の分圧は導入時に希ガス分圧より
大きいことを特徴とする特許請求の範囲第1項記載の光
情報記録用媒体の製造方法。6. The optical information according to claim 1, wherein the plasma is a mixed gas of hydrocarbon and a rare gas, and the partial pressure of the introduced hydrocarbon is higher than the partial pressure of the rare gas at the time of introduction. Recording medium manufacturing method.
一つを含んでいることを特徴とする特許請求の範囲第1
項記載の光情報記録用媒体の製造方法。7. A metal target containing at least one of Te, Sb, and Ag, as set forth in claim 1.
A method for manufacturing the optical information recording medium according to the item 1.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15772383A JPH06101151B2 (en) | 1983-08-31 | 1983-08-31 | Method for manufacturing optical information recording medium |
| EP84305898A EP0137697B1 (en) | 1983-08-31 | 1984-08-29 | Method of producing an optical information recording medium |
| DE8484305898T DE3467825D1 (en) | 1983-08-31 | 1984-08-29 | Method of producing an optical information recording medium |
| US06/885,738 US4663008A (en) | 1983-08-31 | 1986-07-21 | Method of producing an optical information recording medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15772383A JPH06101151B2 (en) | 1983-08-31 | 1983-08-31 | Method for manufacturing optical information recording medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6050643A JPS6050643A (en) | 1985-03-20 |
| JPH06101151B2 true JPH06101151B2 (en) | 1994-12-12 |
Family
ID=15655957
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15772383A Expired - Lifetime JPH06101151B2 (en) | 1983-08-31 | 1983-08-31 | Method for manufacturing optical information recording medium |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06101151B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011088709A (en) * | 2009-10-22 | 2011-05-06 | Hakuryu Kikaisho Kofun Yugenkoshi | Winding mechanism of web cutting device |
-
1983
- 1983-08-31 JP JP15772383A patent/JPH06101151B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6050643A (en) | 1985-03-20 |
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