JPH06109683A - Micro potential difference measuring device - Google Patents
Micro potential difference measuring deviceInfo
- Publication number
- JPH06109683A JPH06109683A JP25971892A JP25971892A JPH06109683A JP H06109683 A JPH06109683 A JP H06109683A JP 25971892 A JP25971892 A JP 25971892A JP 25971892 A JP25971892 A JP 25971892A JP H06109683 A JPH06109683 A JP H06109683A
- Authority
- JP
- Japan
- Prior art keywords
- measuring device
- potential difference
- contactor
- measuring
- main body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
(57)【要約】
【目的】 構造物表面の凹凸にかかわらず接触子を一定
の押付け力で構造物に圧接でき、電気接触抵抗を計測の
支障にならない小さな一定の値になるようにした微小電
位差計測を可能とすること。
【構成】 構造物1の表面に押付けて高周波電流を通電
する電極31a,31bと、その構造物表面方向にのみ
進退可能で、構造物の任意位置の表面欠陥部を挟んだ近
傍の測定点間に生じる微小電位差を計測する少なくとも
一対の接触子(16a1,16a2,…16b1,16b2,
…)と、その接触子に回路接続する柔軟性を有する材質
によって構成された回路基板17と、各接触子の先端を
均等な力で測定点に押付ける押圧機構27とを有する。
(57) [Abstract] [Purpose] The contactor can be pressed against the structure with a constant pressing force regardless of the unevenness of the structure surface, and the electrical contact resistance is set to a small constant value that does not hinder measurement. To be able to measure the potential difference. [Composition] Between the electrodes 31a and 31b which are pressed against the surface of the structure 1 to pass a high-frequency current, and which can move back and forth only in the structure surface direction, and between measurement points in the vicinity of a surface defect portion at an arbitrary position of the structure. At least a pair of contacts (16 a1 , 16 a2 , ... 16 b1 , 16 b2 ,
,), A circuit board 17 made of a flexible material for circuit connection to the contactor, and a pressing mechanism 27 for pressing the tip of each contactor to the measurement point with an even force.
Description
【0001】[0001]
【産業上の利用分野】本発明は、大形構造物に生じた亀
裂等の表面欠陥が破壊に発展する危険度を定量的に計測
する微小電位差計測装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a micro-potential difference measuring device for quantitatively measuring the risk that a surface defect such as a crack generated in a large structure develops into a fracture.
【0002】[0002]
【従来の技術】一般に、構造物はその表面に表面欠陥が
全く生じないように使用することは困難で、使用中に小
さな亀裂が生ずることがある。ところが、この亀裂はそ
の状態によっては破壊に発展する可能性があるものもあ
る。2. Description of the Related Art In general, it is difficult to use a structure so that no surface defects are generated on its surface, and small cracks may occur during use. However, depending on the condition, this crack may develop into destruction.
【0003】そこで、従来この破壊に発展することを事
前に防止するため、平均的な応力状態等をストレインゲ
ージやロードセル等によって監視することが行なわれて
いるが、亀裂そのものの局部的危険度の定量計測は困難
で、上記危険度の検出までは行なわれていなかった。Therefore, in order to prevent the development of this fracture in advance, an average stress state or the like has been conventionally monitored by a strain gauge, a load cell or the like. Quantitative measurement is difficult, and the detection of the above-mentioned risks has not been performed.
【0004】ところが、最近使用する電流量、電流の周
波数、電流入出力端子及び電位差計測端子位置、対象と
する部材の材質が同一であれば負荷の変化に伴う電位差
の変化量と応力拡大係数の変化量の間に或る比例関係が
あることが見出され、亀裂部分の応力拡大係数を計測す
る技術が提案されている(日本機械学会論文集56巻5
28号、論文No.89−0566A)。However, if the amount of current used recently, the frequency of current, the position of the current input / output terminal and the potential difference measurement terminal, and the material of the target member are the same, the variation of the potential difference and the stress intensity factor due to the change of the load are It was found that there is a certain proportional relationship between the amounts of change, and a technique for measuring the stress intensity factor of the crack portion has been proposed (Proceedings of the Japan Society of Mechanical Engineers, Vol. 56, Vol. 5).
28, Paper No. 89-0566A).
【0005】[0005]
【発明が解決しようとする課題】ところが、この計測に
あたっては計測信号がμVと微少なため、ノイズ防止上
計測用電極を構造物表面に溶接する必要があり、任意の
位置に移動することができず、また亀裂などは幅0.5
mm以下、長さ数mmと微小なため、計測用電極を亀裂をは
さんで正確に位置決めすることができない等の問題があ
る。さらに構造物表面に凹凸がある場合、計測用の接触
子を一定の押付け力によって構造物表面に押付けること
ができないことがある等の問題がある。However, in this measurement, since the measurement signal is as small as μV, it is necessary to weld the measurement electrode to the surface of the structure for noise prevention, and the measurement electrode can be moved to any position. No cracks, width of 0.5
Since it is as small as less than mm and a few mm in length, there is a problem that the measurement electrode cannot be accurately positioned with a crack in between. Further, when the structure surface has irregularities, there is a problem that the measuring contact cannot be pressed against the structure surface by a constant pressing force.
【0006】本発明はこのような点に鑑み、構造物表面
の凹凸にかかわらず接触子を一定の押付け力で構造物に
圧接させることができ、電気接触抵抗を計測の支障にな
らない小さな一定の値になるようにし、亀裂等の測定部
を挟む微小電位差計測を可能とする計測装置を得ること
を目的とする。In view of the above points, the present invention makes it possible to press the contactor against the structure with a constant pressing force regardless of the unevenness of the surface of the structure, so that the electrical contact resistance does not interfere with the measurement and is small. An object of the present invention is to obtain a measuring device that allows measurement of a minute potential difference such that a measurement part such as a crack is sandwiched between the measuring devices.
【0007】[0007]
【課題を解決するための手段】本発明は、構造物表面に
押付けて高周波電流を通電する電極と、上記構造物表面
方向にのみ進退可能で、構造物の任意位置の表面欠陥部
を挟んだ近傍の測定点間に生じる微小電位差を計測する
少なくとも一対の接触子と、上記接触子に回路接続する
柔軟性を有する材質によって構成された回路基板と、各
接触子の先端を均等な力で測定点に押付ける押圧機構と
を有することを特徴とする。According to the present invention, an electrode which is pressed against a surface of a structure to pass a high-frequency current and which can advance and retreat only in the direction of the surface of the structure is sandwiched between a surface defect portion at an arbitrary position of the structure. At least a pair of contacts that measure a minute potential difference generated between nearby measurement points, a circuit board made of a flexible material that connects the contacts to the circuit, and measure the tip of each contact with equal force. And a pressing mechanism for pressing on a point.
【0008】[0008]
【作用】高周波電流を通電する電極及び接触子をそれぞ
れ構造物表面の欠陥部を挟む位置に配設し、それらを構
造物表面に押付け、上記電極に高周波電流を通電するこ
とによって、上記接触子間の微小電位差を測定すること
ができる。この場合、各接触子が柔軟性を有する回路基
板に接続され、押圧機構によって各接触子の先端が均等
な力で測定点に押付けられるので、構造物表面に凹凸が
あっても各接触子が測定点に十分な力で均等に押付けら
れ、電気接触抵抗を計測の障害にならない程度の小さな
一定値にすることができ、正確な微小電位差の計測が可
能となる。The electrode and the contactor for passing the high frequency current are arranged at positions sandwiching the defective portion on the surface of the structure, and they are pressed against the surface of the structure, and the high frequency current is passed through the electrode, whereby the contactor is provided. A minute potential difference between them can be measured. In this case, since each contact is connected to the flexible circuit board and the tip of each contact is pressed against the measurement point by the pressing mechanism with equal force, each contact will be It is evenly pressed against the measurement points with a sufficient force, and the electric contact resistance can be set to a small constant value that does not interfere with the measurement, and accurate minute potential difference measurement is possible.
【0009】[0009]
【実施例】以下、添付図面を参照して本発明の実施例に
ついて説明する。Embodiments of the present invention will be described below with reference to the accompanying drawings.
【0010】図1において、符号1はその表面に亀裂2
が生じた被測定物であって、その被測定物1上の亀裂2
の近傍位置に微小電位差計測装置本体3が載置装着され
ており、その微小電位差計測装置本体3には操作ペンダ
ント4及び制御ボックス5が接続されている。In FIG. 1, reference numeral 1 is a crack 2 on the surface.
Which is the object to be measured, and the crack 2 on the object to be measured 1
A micropotential difference measuring device main body 3 is mounted and mounted in the vicinity of, and an operation pendant 4 and a control box 5 are connected to the micropotential difference measuring device main body 3.
【0011】上記微小電位差計測装置本体3は、上記被
測定物1上の所定位置に装着される支持機構6を有して
おり、その支持機構6には旋回機構7によって回動可能
な旋回板8が装着されており、その旋回板8の一端には
亀裂2の位置を計測するCCDカメラ9が装着されて、
さらに上記旋回板8の他端には、進退機構10によって
被測定物に対して接近或いは離間方向に移動可能とされ
た計測器本体11が装着されている。The minute potential difference measuring device body 3 has a support mechanism 6 mounted at a predetermined position on the object to be measured 1, and the support mechanism 6 has a swivel plate rotatable by a swivel mechanism 7. 8 is attached, and a CCD camera 9 for measuring the position of the crack 2 is attached to one end of the swivel plate 8,
Further, at the other end of the swivel plate 8, a measuring device main body 11 is attached which is movable by an advancing / retreating mechanism 10 toward or away from the object to be measured.
【0012】上記計測器本体11は、図2、図3、図4
に示すように、断面矩形状の框体12を有し、その框体
12の前面側にはシールド板13を介して前面板14が
固着されている。その前面板14には、複数の開口15
a1,15a2,…及び15b1,15b2,…が所定の間隔を
もって2列穿設されており、一方の列の開口15a1,1
5a2,…が他方の列の開口15b1,15b2,…とそれぞ
れ対をなすように構成されている。この各開口15a1,
15a2,…15b1,15b2,…には微小電位差を計測す
るための接触子16a1,16a2,…16b1,16b2,…
がそれぞれ軸線方向に摺動可能に貫挿されている。The measuring instrument body 11 is shown in FIG. 2, FIG. 3, and FIG.
As shown in FIG. 3, the frame 12 has a rectangular cross section, and a front plate 14 is fixed to the front side of the frame 12 via a shield plate 13. The front plate 14 has a plurality of openings 15
a1 and 15 a2 , ... And 15 b1 , 15 b2 , ... Are bored in two rows at a predetermined interval, and the openings 15 a1 , 1 in one row are provided.
5 a2 , ... Are paired with the openings 15 b1 , 15 b2 ,. Each of these openings 15 a1 ,
15 a2 , ... 15 b1 , 15 b2 , ... are contacts 16 a1 , 16 a2 , ... 16 b1 , 16 b2 ,.
Are respectively inserted so as to be slidable in the axial direction.
【0013】上記各接触子16a1,16b1,…はその頭
部が柔軟な材料で構成された回路基板17に電気的に結
合するよう装着されている。この回路基板17には図5
に示すように各接触子16a1,16b1,…に接続する回
路18が設けられており、その両側縁部が、前記框体1
2の互いに対向する内面に装着されたソケット19に装
着接続されている(図3,図6参照)。また、上記ソケ
ット19には、それぞれ信号ケーブル20の先端に設け
られたプラグ21が前記框体12に形成された開口12
aを通して嵌合せしめられている。The contacts 16 a1 , 16 b1 , ... Are mounted so that their heads are electrically coupled to the circuit board 17 made of a flexible material. This circuit board 17 is shown in FIG.
As shown in FIG. 3, a circuit 18 connected to each of the contacts 16 a1 , 16 b1 , ... Is provided, and both side edges of the circuit 18 are connected to the frame 1
The two sockets 19 are mounted and connected to the inner surfaces of the two facing each other (see FIGS. 3 and 6). In addition, in the socket 19, a plug 21 provided at the tip of the signal cable 20 is formed in the frame 12 and the opening 12 is formed in the frame 12.
It is fitted through a.
【0014】前記框体12の背面側には蓋体22が装着
してあり、その蓋体22の内面には、支持板23、間隔
板24、ベース板25及びクッション板26を介して空
気袋27が装着してあり、その空気袋27の前面側には
U字状に屈曲形成されたクッション板28が嵌合され
(図3,図7参照)、そのクッション板28に前記各接
触子16a1,16b1,…の頭部が接触支持せしめられて
いる。なお、図4、図7中符号29は空気袋27への空
気出し入れチューブである。A lid 22 is mounted on the back side of the frame 12, and an air bag is provided on the inner surface of the lid 22 via a support plate 23, a spacing plate 24, a base plate 25 and a cushion plate 26. The air bag 27 is fitted with a cushion plate 28 bent in a U shape on the front side of the air bag 27 (see FIGS. 3 and 7). The heads of a1 , 16 b1 , ... Are contact-supported. In addition, reference numeral 29 in FIGS. 4 and 7 denotes an air inlet / outlet tube for the air bag 27.
【0015】また、框体12の互いに対向する両側壁の
外面側には、それぞれ接触子の列の左右にそれと平行方
向に延びる端子支持板30a,30bが上記接触子16
a1,16b1,…の軸線と平行方向に移動可能に配設され
ており、その端子支持板30a,30bの中央部前面に
給電接触子31a,31bを絶縁支持する端子32a,
32bが装着されている。一方、上記框体12の四隅外
側部にはブラケット33,33,…が突設され、そのブ
ラケット33,33,…に取着されたエアシリンダ3
4,34,…のピストンロッド34a,34a,…の先
端が上記端子支持板30a,30bの両端部に連結さ
れ、そのエアシリンダ34の作動によって、上記端子支
持板30a,30bが接触子16a1,16b1,…の軸線
方向に移動し得るようにしてある。なお、図3中符号3
5a,35bは、給電接触子31a,31bにそれぞれ
給電するケーブルである。Further, on the outer surfaces of both side walls of the frame body 12 facing each other, terminal support plates 30a, 30b extending in parallel to the left and right of the row of contactors are provided respectively.
are arranged so as to be movable in a direction parallel to the axes of a1 , 16 b1 , ..., And terminals 32a for insulating and supporting the power feeding contacts 31a, 31b are provided on the front surfaces of the central portions of the terminal supporting plates 30a, 30b.
32b is attached. On the other hand, brackets 33, 33, ... Are projectingly provided on the outer sides of the four corners of the frame body 12, and the air cylinder 3 attached to the brackets 33, 33 ,.
The tips of piston rods 34a, 34a, ... Of 4, 34, ... Are connected to both ends of the terminal support plates 30a, 30b, and the operation of the air cylinder 34 causes the terminal support plates 30a, 30b to contact the contactors 16a1 ,. 16b1, ... Can be moved in the axial direction. Incidentally, reference numeral 3 in FIG.
Reference numerals 5a and 35b are cables for supplying power to the power supply contacts 31a and 31b, respectively.
【0016】制御ボックス5の内部構成は、図8に示す
ように、計測器本体11から出る信号ケーブルに接続さ
れた計測信号切替器40と、その計測信号切替器40で
選択された信号を取り込むロックインアンプ41と、微
小電位差計測装置3に対する計測用電流の給電電源装置
42と、微小電位差計測装置3の進退機構10、旋回機
構7、空気袋27を制御する空圧制御部43と、これら
を制御するコンピュータ44とから構成されている。As shown in FIG. 8, the internal configuration of the control box 5 takes in a measurement signal switch 40 connected to a signal cable from the measuring instrument main body 11 and a signal selected by the measurement signal switch 40. A lock-in amplifier 41, a power supply device 42 for supplying a measuring current to the minute potential difference measuring device 3, an advancing / retreating mechanism 10 of the minute potential difference measuring device 3, a swivel mechanism 7, and an air pressure control section 43 for controlling the air bag 27, and these. And a computer 44 for controlling the.
【0017】計測信号切替器40には、計測器本体11
の互いに対をなす接触子(16a1と16b1,16a2と1
6b2,…)の各々に対応して主コンピュータ44で切替
制御される切替スイッチ45a,45b,…が内蔵され
ている。また操作ペンダント4は、空気袋27の空気袋
圧力計46、CCDカメラ9のモニタTV47、及び空
圧制御部43の操作スイッチ48から構成されている。The measurement signal switching device 40 includes a measurement device main body 11
Pairs of contacts (16 a1 and 16 b1 , 16 a2 and 1
6 b2 , ...) Incorporating changeover switches 45 a, 45 b, ... The operation pendant 4 is composed of an air bag pressure gauge 46 of the air bag 27, a monitor TV 47 of the CCD camera 9, and an operation switch 48 of the pneumatic control unit 43.
【0018】上記モニタTV47には、図9に示すよう
に、その画面上に水平基準線50aと垂直基準線50
b、各接触子(16a1,16a2,…16b1,16b2,
…)のマーク51a,51bが描かれている。As shown in FIG. 9, the monitor TV 47 has a horizontal reference line 50a and a vertical reference line 50 on its screen.
b, each contact (16 a1 , 16 a2 , ... 16 b1 , 16 b2 ,
...) marks 51a and 51b are drawn.
【0019】しかして、構造物表面に発生した亀裂部に
おける微小電位差を計測する場合には、上記亀裂2が幅
0.5mm以下、長さ数mmと小さいので、まずCCDカメ
ラ9によって撮像し、モニタTV47の画面に映し、マ
ーク51a,51bの間に上記亀裂2が位置するように
し、その位置を検出する。その後、上記検出値にもとず
いて、旋回機構7を作動させ、上記CCDカメラ9の位
置に計測器本体11を移動させ、進退機構10によって
その計測器本体11を亀裂2が発生している構造物表面
上に押付ける。However, when measuring a minute potential difference in a crack portion generated on the surface of a structure, the crack 2 is as small as 0.5 mm or less in width and several mm in length. The crack 2 is displayed on the screen of the monitor TV 47 so that the crack 2 is located between the marks 51a and 51b, and the position is detected. Then, based on the detected value, the turning mechanism 7 is operated to move the measuring instrument main body 11 to the position of the CCD camera 9, and the advancing / retreating mechanism 10 causes a crack 2 in the measuring instrument main body 11. Press on the structure surface.
【0020】その後、更に空気袋27内に空気が供給さ
れその空気袋27が膨張させられると、その膨張力によ
って各接触子16a1,16a2,…,16b1,16b2,…
が、図8に示すように、亀裂2を挟み、被測定物である
構造物表面に押付けられる。この場合、各接触子1
6a1,16a2,…,16b1,16b2,…がそれぞれ空気
袋27によって押圧されるので、上記構造物表面に凹凸
がある場合でも各接触子の先端が確実に且つ均等な圧力
で構造物表面に押圧される。After that, when air is further supplied into the air bag 27 and the air bag 27 is inflated, the expansion force causes the respective contacts 16 a1 , 16 a2 , ..., 16 b1 , 16 b2 ,.
However, as shown in FIG. 8, the crack 2 is sandwiched and pressed against the surface of the structure which is the object to be measured. In this case, each contact 1
Since 6 a1 , 16 a2 , ..., 16 b1 , 16 b2 , ... Are pressed by the air bag 27, even if the structure surface has irregularities, the tips of the respective contact elements are reliably and evenly structured. It is pressed against the surface of the object.
【0021】一方、これと同時にエアシリンダ34が作
動され、端子支持板30a,30bを介して給電接触子
31a,31bが被測定面に押付けられる。On the other hand, at the same time, the air cylinder 34 is actuated, and the feeding contacts 31a, 31b are pressed against the surface to be measured via the terminal supporting plates 30a, 30b.
【0022】そこで、給電接触子31a,31bに給電
するとともに、計測信号切替器40によって計測用の接
触子(16a1,16a2,…,16b1,16b2,…)の任
意の対を選択することによって、亀裂2を挟む両接触子
間の微小電位差を計測でき、亀裂部分の応力拡大係数を
求めることができる。Therefore, while supplying power to the power feeding contacts 31a and 31b, the measurement signal switch 40 selects any pair of measuring contacts (16 a1 , 16 a2 , ..., 16 b1 , 16 b2 , ...). By doing so, it is possible to measure a minute electric potential difference between both the contacts sandwiching the crack 2 and obtain the stress intensity factor of the crack portion.
【0023】すなわち、計測用の接触子の位置をCCD
カメラ9で正確に位置決めできるので、各対の接触子間
の距離を最小にすることができ、この距離に比例する被
測定物の内部抵抗を最小にすることができる。さらに、
接触子の押付力による接触抵抗も一定にできるので、全
体として亀裂の正確な微小電位差を計測できる。しか
も、各接触子及び給電接触子の被測定物表面との距離を
空気袋或いはエアシリンダにより調整できるので、凹凸
のある被測定物に対してもその計測を正確に行うことが
できる。That is, the position of the contact for measurement is set to the CCD.
Since the camera 9 can be accurately positioned, the distance between each pair of contacts can be minimized, and the internal resistance of the DUT proportional to this distance can be minimized. further,
Since the contact resistance due to the pressing force of the contact can also be made constant, the accurate minute potential difference of the crack as a whole can be measured. Moreover, since the distance between each contactor and the power feeding contactor and the surface of the object to be measured can be adjusted by the air bag or the air cylinder, the measurement can be accurately performed even on the object to be measured having irregularities.
【0024】図10及び図11は本発明の他の実施例を
示す図であり、図中符号60は計測器本体11を嵌合す
ることができる計測器本体位置決め用枠体である。この
枠体60には、その枠体60の開口部を開閉し得る透明
板61が軸62を中心に揺動自在に装着されている。こ
の透明板61には、前記モニタTV47の画面に描かれ
た水平基準線50a、垂直基準線50b、及びマーク5
1a,51bと全く同様に水平基準線63a、垂直基準
線63b及びマーク64a,64bが描かれている。10 and 11 are views showing another embodiment of the present invention, in which reference numeral 60 designates a measuring instrument body positioning frame into which the measuring instrument body 11 can be fitted. A transparent plate 61 capable of opening and closing the opening of the frame body 60 is swingably attached to the frame body 60 about a shaft 62. On the transparent plate 61, the horizontal reference line 50a, the vertical reference line 50b, and the mark 5 drawn on the screen of the monitor TV 47 are displayed.
Horizontal reference lines 63a, vertical reference lines 63b, and marks 64a, 64b are drawn in exactly the same way as 1a, 51b.
【0025】しかして、上記枠体60を被測定物1上に
載置し、亀裂2が上記マーク64a,64b間に位置す
るように位置合せを行ない一時的に固定する。その後図
11に示すように透明板61を開き、上記枠体60内に
計測器本体11を挿入すれば、上記計測器本体11の位
置決めが確実に行われ、各接触子が亀裂を挟んだ所定位
置に設定される。したがって、第1実施例と同様に亀裂
を挟む各接触子間の微小電位差を計測することができ
る。Then, the frame 60 is placed on the object 1 to be measured, and the crack 2 is aligned so that the crack 2 is located between the marks 64a and 64b and is temporarily fixed. Then, as shown in FIG. 11, if the transparent plate 61 is opened and the measuring instrument main body 11 is inserted into the frame body 60, the measuring instrument main body 11 is reliably positioned, and each contact has a predetermined crack. Set to position. Therefore, as in the first embodiment, it is possible to measure the minute electric potential difference between the contacts that sandwich the crack.
【0026】なお、第1実施例においては、CCDカメ
ラと計測器本体は垂直な軸回りに入れ替えるようにした
が、この入れ替えのための旋回軸は水平軸等如何なる方
向の軸であってもよい。In the first embodiment, the CCD camera and the measuring instrument main body are exchanged around a vertical axis, but the turning axis for this exchange may be an axis in any direction such as a horizontal axis. .
【0027】[0027]
【発明の効果】以上説明したように、本発明は、構造物
の任意位置の表面欠陥部を挟んだ近傍の測定点間に生じ
る微小電位差を計測する接触子に回路接続する回路基板
を柔軟性を有する材質によって構成するとともに、各接
触子の先端を均等な力で測定点に押付ける押圧機構を設
けたので、構造物表面の凹凸にかかわらず計測器の接触
子を常に一定の押付力で上記構造物表面に押付けること
ができ、電気接触抵抗を計測の支障にならない一定の小
さな値に保持し、微小電位差の正確な計測を行うことが
できる。As described above, the present invention provides a flexible circuit board for circuit connection to a contactor for measuring a minute potential difference between measurement points in the vicinity of a surface defect portion at an arbitrary position of a structure. In addition to being composed of a material that has a contact point, a pressing mechanism that presses the tip of each contact to the measurement point with an even force is provided, so the contact of the measuring instrument can always be applied with a constant pressing force regardless of the unevenness of the structure surface. It can be pressed against the surface of the structure, the electric contact resistance can be maintained at a constant small value that does not hinder the measurement, and the minute potential difference can be accurately measured.
【0028】また、所望測定点を撮像するカメラで位置
計測された測定点に計測器本体を移動させる計測器本体
移動装置を設けたり、或いは接触子位置決め装置を設け
た場合には、任意位置の小さな亀裂に対しても計測用の
接触子を正確に且つ容易に位置決めすることができる。Further, when a measuring device main body moving device for moving the measuring device main body to a measuring point whose position is measured by a camera for picking up an image of a desired measuring point is provided or a contactor positioning device is provided, an arbitrary position is measured. The contact for measurement can be accurately and easily positioned even for a small crack.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の微小電位差計測装置の一実施例を示す
概略構成図。FIG. 1 is a schematic configuration diagram showing an embodiment of a minute potential difference measuring device of the present invention.
【図2】計測器本体の斜視図。FIG. 2 is a perspective view of a measuring device main body.
【図3】図2のIII −III 線に沿う断面図。FIG. 3 is a sectional view taken along the line III-III in FIG.
【図4】図2のIV−IV線に沿う断面図。FIG. 4 is a sectional view taken along line IV-IV in FIG.
【図5】回路基板の平面図。FIG. 5 is a plan view of a circuit board.
【図6】計測用接触子部の部分図。FIG. 6 is a partial view of a measuring contact portion.
【図7】空気袋装着部の分解斜視図。FIG. 7 is an exploded perspective view of an air bag mounting portion.
【図8】計測システムの構成説明図。FIG. 8 is an explanatory diagram of a configuration of a measurement system.
【図9】モニタTV画面の説明図。FIG. 9 is an explanatory diagram of a monitor TV screen.
【図10】計測器本体位置決め用枠体の斜視図。FIG. 10 is a perspective view of a measuring device main body positioning frame.
【図11】計測器本体位置決め用枠体の透明板を開いた
状態を示す図。FIG. 11 is a diagram showing a state in which a transparent plate of the measuring device main body positioning frame is opened.
1 被測定物 2 亀裂 3 微小電位差計測装置本体 6 支持機構 7 旋回機構 8 旋回板 9 CCDカメラ 10 進退機構 11 計測器本体 12 框体 14 前面板 16a1,16a2,…接触子 16b1,16b2,…接触子 17 回路基板 19 ソケット 20 信号ケーブル 21 プラグ 27 空気袋 28 クッション板 30a,30b 端子支持板 31a 31b 給電接触子 34 エアシリンダ 47 CCDカメラのモニタTV 50a 水平基準線 50b 垂直基準線 51a,51b マーク 60 計測器本体位置決め用枠体DESCRIPTION OF SYMBOLS 1 Object to be measured 2 Crack 3 Micropotential difference measuring device main body 6 Support mechanism 7 Swivel mechanism 8 Swivel plate 9 CCD camera 10 Advance / retract mechanism 11 Measuring device main body 12 Frame 14 Front plate 16 a1 , 16 a2 , ... Contactor 16 b1 , 16 b2 , ... Contact 17 Circuit board 19 Socket 20 Signal cable 21 Plug 27 Air bag 28 Cushion board 30a, 30b Terminal support plate 31a 31b Feed contact 34 Air cylinder 47 CCD camera monitor TV 50a Horizontal reference line 50b Vertical reference line 51a , 51b Mark 60 Measuring device main body positioning frame
Claims (4)
る電極と、上記構造物表面方向にのみ進退可能で、構造
物の任意位置の表面欠陥部を挟んだ近傍の測定点間に生
じる微小電位差を計測する少なくとも一対の接触子と、
上記接触子に回路接続する柔軟性を有する材質によって
構成された回路基板と、各接触子の先端を均等な力で測
定点に押付ける押圧機構とを有することを特徴とする、
微小電位差計測装置。1. An electrode which is pressed against a surface of a structure to pass a high-frequency current, and which can advance and retreat only in the direction of the surface of the structure, and which is generated between minute measuring points in the vicinity of a surface defect portion at an arbitrary position of the structure. At least a pair of contacts for measuring the potential difference,
A circuit board made of a flexible material for circuit connection to the contact, and a pressing mechanism for pressing the tip of each contact to the measurement point with an even force,
Micro potential difference measuring device.
頭部を押圧する空気袋であることを特徴とする、請求項
1記載の微小電位差計測装置。2. The micro-potential difference measuring device according to claim 1, wherein the pressing mechanism is an air bag that presses the heads of the contacts from above the circuit board.
と、そのカメラで位置計測された測定点に接触子が位置
するように計測器本体を移動させる計測器本体移動装置
とを有することを特徴とする、請求項1または2記載の
微小電位差計測装置。3. A camera having an image of a desired measuring point on the surface of a structure, and a measuring device main body moving device for moving the measuring device main body so that the contactor is located at the measuring point measured by the camera. The minute potential difference measuring device according to claim 1 or 2, characterized in that.
して接触子の押付け位置を合わせる目印が設けられ、そ
の両目印が一致する点で構造物表面に一時的に固定され
る枠体からなり、その枠体内に計測器本体を嵌合させる
ことにより接触子の位置決めを行うようにした接触子位
置決め装置を有することを特徴とする、請求項1または
2記載の微小電位差計測装置。4. A frame body provided with a mark for matching the pressing positions of the contacts corresponding to the mark created on the monitor TV screen, and temporarily fixed to the surface of the structure at the point where the two marks coincide. 3. The minute potential difference measuring device according to claim 1 or 2, further comprising a contactor positioning device configured to position the contactor by fitting the measuring device main body in the frame body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25971892A JPH06109683A (en) | 1992-09-29 | 1992-09-29 | Micro potential difference measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25971892A JPH06109683A (en) | 1992-09-29 | 1992-09-29 | Micro potential difference measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06109683A true JPH06109683A (en) | 1994-04-22 |
Family
ID=17337981
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25971892A Pending JPH06109683A (en) | 1992-09-29 | 1992-09-29 | Micro potential difference measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06109683A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09152412A (en) * | 1995-11-30 | 1997-06-10 | Toshiba Corp | Micro potential difference measuring device |
-
1992
- 1992-09-29 JP JP25971892A patent/JPH06109683A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09152412A (en) * | 1995-11-30 | 1997-06-10 | Toshiba Corp | Micro potential difference measuring device |
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