JPH055688A - Cold heat shock test device - Google Patents

Abstract

(57) [Abstract] [Purpose] In the thermal shock test equipment, the heater (4) provided in the high temperature tank (2) and the cooler (6) provided in the low temperature tank (3) for heat storage or operation. To be done efficiently and efficiently. [Structure] The heating heater (4) is operated for heat storage after the termination of a required stop time including 0 preset by a combination of a high temperature exposure set temperature and a low temperature exposure set time after completion of high temperature exposure. Moreover, after the low temperature exposure of the cooler (6) is finished, the cooler (6) is stopped for a required stop time including 0 preset by a combination of the low temperature exposure set temperature and the high temperature exposure set time, and then is operated for storing cold.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal shock test apparatus, and more particularly, to a thermal shock test in which a heating heater provided in a high temperature tank and a cooler provided in a low temperature tank of the thermal shock test apparatus can be efficiently used. It relates to the device.

[0002]

2. Description of the Related Art As shown in FIG. 4, a thermal shock tester for testing the characteristics of electric and electronic parts against thermal shock is provided with a test chamber (1) and a high temperature located above the test chamber (1). Low temperature tank (3) located below tank (2) and test chamber (1)
It consists of Samples such as the electric and electronic parts are
After being stored in the test chamber (1) and exposed to the high temperature air sent from the high temperature tank (2) for a predetermined time, it was then exposed to the low temperature air sent from the low temperature tank (3) for a predetermined time. It is returned and tested for its resistance to thermal shock.

In the high temperature tank (2), therefore, a heater (4) for generating high temperature air and a stirring fan (5) rotatably driven by a motor (M) installed outside the tank (2).
On the other hand, in the low temperature tank (3), a cooler (6) for generating low temperature air, a stirring fan (7), and a regenerator (9) whose operation will be described later are respectively provided. is set up.

The high-temperature air and the low-temperature air are provided with air circulation holes (10), (11), (12), which are provided between the test chamber (1) and the tanks (2), (3). The dampers (14), (15), (16), and (17) of (13) can be distributed to the test chamber (1) by operating the stirring fans (5) and (7) by controlling the opening and closing of the dampers (14), (15), (16), and (17), respectively. (Fig. 5,
(See FIG. 6).

By the way, in a thermal shock test in which high-temperature exposure and low-temperature exposure are alternately repeated, a low temperature tank (3)
The regenerator (9) provided in the
As described in JP-B No. 24202 or JP-B No. 61-42447, when the test is switched from high temperature exposure to low temperature exposure, the test chamber (1) is allowed to reach the low temperature exposure set temperature in a short time. It is provided for.

That is, in FIG. 5, when exposed to high temperature,
Although not related to the test at that time in the low temperature tank (3), the cooler (6) and the stirring fan (7) are operated to circulate the low temperature air in the low temperature tank (3), The regenerator (9) is in the circulating air flow to store the cooling heat. After that, when the test is switched to the low temperature exposure shown in FIG. 6, the dampers (16) and (17) are opened and the cooling heat is released toward the test chamber (1) to cool the test chamber (1) at a stretch. To do. In addition, such a regenerator action is also performed on the high temperature tank (2) side, and since the heating power of the heater (4) is large here, the regenerator (9) cannot be provided. There are many
During the low temperature exposure, the heater (4) and the agitating fan (7) continue to operate as shown in FIG. 6, and high temperature air is circulated in the high temperature tank (2) for heat storage, and when the exposure is switched to the high temperature exposure. I am dealing with it.

As described above, the manner of each series of actions is clear from the graph of FIG. In the graph, the solid line indicates the temperature of the test chamber (1) when it is involved in the exposure test, the broken line indicates the temperature in the low temperature tank (3) during cold storage, and the dashed line indicates the high temperature tank (2) during heat storage. The temperature inside is shown. According to the graph, when the high temperature exposure is performed at 150 ° C., the temperature in the low temperature tank (3) is maintained at −75 ° C. Therefore, during the low temperature exposure, the low temperature tank (3) is cooled. It can be seen that the cooler (6) continues to generate cooling heat as low as −75 ° C. without stopping, and the cooler (9) stores this cooling heat. Then, when switching to the low temperature exposure, the cold storage heat of −75 ° C. is released to the test chamber (1), and at the same time thereafter, the low temperature exposure at the set temperature of −55 ° C. shown by the solid line starts in the test chamber (1).

On the other hand, from this time, high temperature heat storage of 180 ° C. starts in the high temperature tank (2). That is, even if the test is exposed to low temperature, the heater (4) continues to operate without stopping and generates heat of 180 ° C., and this heat is exposed to the high temperature tank (2) during the period of low temperature exposure. The heat is stored inside.

[0009]

By the way, in the above-mentioned thermal shock test apparatus, the temperature and time of each exposure shown in the above-mentioned graph are not limited to those shown in the figure, but may be appropriately changed by the user. Can be set. For this reason, the exposure time may reach 180 minutes or more at one time, and in the conventional thermal shock test apparatus, naturally, even in such a case, the heat storage and the cool storage by the heating heater and the cooler are simultaneously performed. It was

However, the inventors of the present invention have found that, from the original purpose of smoothly switching the tests, heat storage or cold storage for such a long time is not necessary, which results in labor cost of electric power for the heater and the cooler. It was just. Moreover, the life of the heater and cooler was shortened by that amount.

The present invention copes with such an actual situation, and appropriately controls the operation of the heating heater or the cooler during heat storage or cold storage as necessary to save energy in the thermal shock testing apparatus. It is intended.

[0012]

Means for Solving the Problems That is, the feature of the present invention which meets the above object is that it comprises a test chamber, a high temperature tank and a low temperature tank, a heating heater is provided in the high temperature tank, and a cooler is provided in the low temperature tank. When installed, the heater is exposed to high temperature,
The cooler operates to generate high temperature air supplied to the test room and to store heat in the high temperature tank during low temperature exposure, while it operates to generate low temperature air supplied to the test room during low temperature exposure. In the thermal shock test device that operates for heat storage in a low temperature tank when exposed to high temperature,
The heating heater operates for heat storage after the termination of a required stop time including 0 preset by a combination of a high temperature exposure set temperature and a low temperature exposure set time after the high temperature exposure is completed, and the cooler is After the low-temperature exposure is finished, it is controlled to operate for cold storage after stopping for a required stop time including 0 preset by a combination of the low-temperature exposure set temperature and the high-temperature exposure set time.

[0013]

According to the present invention, the cooler, which has been operated for low temperature exposure, is stopped for a required time in the low temperature tank when high temperature exposure is started, and then operated for cold storage. On the other hand, when the heater for the high temperature ends, the heater stops for a required time and then operates for storing heat. Therefore, the electric power cost for the heater and the cooler can be saved and the life of the device can be expected to be extended.

[0014]

Embodiments of the present invention will be described below with reference to the drawings. 1 and 2 are operation explanatory views of the thermal shock test apparatus according to the present invention during high temperature exposure. FIG. 1 shows the initial state of high temperature exposure, and FIG. 2 shows the subsequent state. Is. Since the configuration of each part of the thermal shock test apparatus in both figures is the same as that described above with reference to FIG. 4, the same parts are designated by the same reference numerals and detailed description thereof will be omitted.

In these figures, on the high temperature tank (2) side, the heater (4) is energized, the stirring fan (5) is driven to rotate, and the damper (1)
4) and (15) are opened, high temperature air having a predetermined temperature is supplied to the test chamber (1), and the same high temperature exposure as in the conventional case is performed.

On the other hand, in the case of FIG. 1, the low temperature tank (3) side is in a state where the cooler (6) is deactivated and the stirring fan (7) is not rotating, which is a feature of the present invention. And Figure 2
Then, both the cooler (6) and the stirring fan (7) are in operation, and the cooling of the cooler (6) is performed in the low temperature tank (3) in which the dampers (16) and (17) are closed. The heat circulates, and the regenerator (9) is accumulating cold.

The present invention is characterized in that the state of FIG. 1 and FIG. 2 in the low temperature tank (3) is switched at a predetermined time after the start of high temperature exposure.
Further, although not shown in the figure, the heating heater (4) is activated for the first time also in the high temperature tank (2) at a predetermined time after the low temperature exposure is started. The state during that time will be described with reference to the graph of FIG. In FIG. 3, the temperature in the cryostat (3) is indicated by a broken line below the graph. Of these, the period from the high temperature exposure start point (A) to (B) is the cooler (6) stop period, which is the state shown in FIG. 1. During this time, the temperature gradually rises. Then, at the time point (B), when the cooler (6) is activated, the state shown in FIG. 2 is changed, and the temperature in the low temperature tank (3) starts to decrease, and after a while, it becomes constant. After this, the cool storage period is only until the time point (C) at which the test is switched to the low temperature exposure (ΔT _L ). Subsequently, after (C), the cooler (6) operates at a temperature slightly higher than that at the time of heat storage to maintain the low temperature exposure set temperature (t _L ) and operates in the same manner as in the conventional case. The temperature keeps a constant value as shown by the solid line.

On the other hand, the high temperature tank (2) is shown in the upper part of the graph, and the internal heater (4) is from when the high temperature exposure starts (A) to when it switches to the low temperature exposure (C). the test chamber (1), is working to hold the high-temperature exposure set temperature (T _H) as shown by the solid line. Then, at the time (C) when the exposure is switched to the low temperature exposure, the energization to the heater (4) is once cut off and the operation is stopped. Therefore, after the point (C), the temperature in the high temperature tank (2) gradually decreases as shown by the alternate long and short dash line, but at the time (D), the heater (4) is energized and the high temperature tank (2) is energized.
The temperature inside rises again. And it is held raised to a temperature slightly higher than the high temperature exposure set temperature (T _H), the heat storage state is maintained until the switch to the exposed hot hereinafter.

The stop times of the cooler (6) and the heater (4) corresponding to (A) to (B) or (C) to (D) in the graph described above depend on the test setting conditions. It is set in advance by a known control means so as to be appropriately changed according to this, and at that time, the stop time to be set is, for example, as shown in Tables 1 and 2, a cooler (6) for cold storage. operation time ([Delta] T _L) (Table 1), it is determinable from the tables of the heater (6) working time for heat storage ([Delta] T _H) (Table 2). Margin below

[0020]

[Table 1]

[0021]

[Table 2]

Tables 1 and 2 show the required operating time (ΔT _L ) for cold storage of the cooler (6) corresponding to the low temperature exposure set temperature (t _L ) and the high temperature exposure setting based on the Newton cooling curve. Heater (4) corresponding to temperature (t _H )
The required operating time (ΔT _H ) for heat storage is calculated, and in the case of the former, they are set at each high temperature exposure setting time (T _H ),
In the latter case, each low temperature exposure set time ( _TL )
Each of them is represented.

From these tables, first, the operation time required for storing or storing heat in the cooler (6) or the heater (4) corresponding to each exposure set temperature (t _L ) and (t _H ) of the user. _{(ΔT L), (ΔT H} ) look, then each exposed setting time of the time (T _H), the (T _L), subtract the required operation time (T _H -.DELTA.T _L or T _L -.DELTA.T _H By doing so, the stop time can be easily determined.

Then, each stop time is set to a set temperature (t _L ),
(T _H ) and set times (T _H ) and (T _L ) are set in a well-known control device capable of on / off control for the heater (4) and the cooler (6), so that the test status Accordingly, the heater (4) and the cooler (6) can be stopped appropriately as described above. As a result, in the thermal shock tester of the present invention, the higher the low temperature exposure set temperature (t _L ) is, the shorter the operation time (ΔT _L ) for the cool storage of the cooler (6) is, and the higher temperature exposure set temperature (t _H ) is set. ) Is lower, the operating time for storing heat of the heater (4) (Δ
T _H ) is reduced, so that wasteful consumption of electric power is prevented while the cold storage and the heat storage are sufficiently performed without excess or deficiency.

[0025]

As described above, according to the present invention, in the thermal shock test apparatus, after the heating heater is exposed to the high temperature, the required stop including 0 which is preset by the combination of the high temperature exposure set temperature and the low temperature exposure set time. After stopping for a period of time, it is operated for heat storage, and after stopping the low temperature exposure of the cooler, after stopping for the required stop time including 0 preset by the combination of the low temperature exposure setting temperature and the high temperature exposure setting time. Since it is designed to operate for cold storage, it is possible to prevent wasteful power consumption for heat storage and cold storage. Along with this, the life extension of the heater and the cooler is achieved.

[Brief description of drawings]

FIG. 1 is an operation explanatory view of a thermal shock test apparatus according to the present invention.

FIG. 2 is an explanatory diagram of the operation of the thermal shock testing apparatus according to the present invention.

FIG. 3 is a graph showing the action of the thermal shock test apparatus according to the present invention with time.

FIG. 4 is a schematic explanatory view of a conventional thermal shock test device.

FIG. 5 is an operation explanatory view of a conventional thermal shock test device.

FIG. 6 is an operation explanatory view of a conventional thermal shock test device.

FIG. 7 is a graph showing the action of the conventional thermal shock test device with time.

[Explanation of symbols]

 (1) Test room (2) High temperature tank (3) Low temperature tank (4) Heater (6) Cooler

Claims (1)

Claims: 1. A test chamber (1), a high temperature tank (2) and a low temperature tank (3), wherein the high temperature tank (2) is provided with a heater (4), The cooler (6) is installed in 3), and the heater (4) operates to generate high temperature air supplied to the test chamber (1) during high temperature exposure and high temperature during low temperature exposure. While operating for heat storage in the tank (2), the cooler (6) operates to generate low temperature air to be supplied to the test chamber (1) when exposed to a low temperature, and when exposed to a high temperature, a low temperature tank ( 3) In the thermal shock test device that operates for heat storage in the inside, the heater (4) is
After completion of the high temperature exposure, after stopping for a required stop time including 0 preset by a combination of the high temperature exposure set temperature and the low temperature exposure set time, the cooler (6) is operated for heat storage, and the cooler (6) is exposed to the low temperature exposure. After completion, the thermal shock test device is controlled to operate for cold storage after stopping for a required stop time including 0 preset by a combination of a low temperature exposure setting temperature and a high temperature exposure setting time. ..