JPH0555701A - Tunable semiconductor laser device - Google Patents
Tunable semiconductor laser deviceInfo
- Publication number
- JPH0555701A JPH0555701A JP23731291A JP23731291A JPH0555701A JP H0555701 A JPH0555701 A JP H0555701A JP 23731291 A JP23731291 A JP 23731291A JP 23731291 A JP23731291 A JP 23731291A JP H0555701 A JPH0555701 A JP H0555701A
- Authority
- JP
- Japan
- Prior art keywords
- active layer
- conductivity type
- semiconductor laser
- laser device
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Lasers (AREA)
Abstract
(57)【要約】
【目的】 注入キャリア濃度の変化量を大きくすること
を可能にして、その注入キャリア濃度の変化量に比例し
て、波長可変幅の大きい波長可変型半導体レーザ装置を
得る。
【構成】 活性層を量子井戸構造とし、共振器方向に電
極を前後に分離し、その分離された電極の間に存在する
第1導電型層に第2導電型領域を拡散して形成し、分割
された電極のいずれか一方から活性層に対して逆方向電
圧を印加する。
(57) [Summary] [Object] To obtain a wavelength tunable semiconductor laser device having a large wavelength tunable width in proportion to the amount of change in the injected carrier concentration by making it possible to increase the amount of change in the injected carrier concentration. A quantum well structure is used as an active layer, electrodes are separated into front and rear in a resonator direction, and a second conductivity type region is diffused and formed in a first conductivity type layer existing between the separated electrodes. A reverse voltage is applied to the active layer from one of the divided electrodes.
Description
【0001】[0001]
【産業上の利用分野】この発明は波長可変型半導体レー
ザ装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wavelength tunable semiconductor laser device.
【0002】[0002]
【従来の技術】図3は従来の波長可変型半導体レーザ装
置を示す断面図である。1はn側第1オーミック電極、
2はn側第2オーミック電極、3はn型クラッド層、4
は回折格子、6はp型クラッド層、7はp型オーミック
電極、9はn型コンタクト層、10は活性層である。2. Description of the Related Art FIG. 3 is a sectional view showing a conventional wavelength tunable semiconductor laser device. 1 is an n-side first ohmic electrode,
2 is an n-side second ohmic electrode, 3 is an n-type cladding layer, 4
Is a diffraction grating, 6 is a p-type cladding layer, 7 is a p-type ohmic electrode, 9 is an n-type contact layer, and 10 is an active layer.
【0003】次に動作について説明する。レーザ活性層
に電流を注入するためのオーミック電極は第1n側電極
1と第2n側電極2に分割されているために、レーザ共
振器の前面側と後面側に注入する電流を各々独立に制御
することができる。レーザ利得は共振器内の光子密度と
電流密度の乗算で表わされる。一般に共振器内の光子密
度は不均一に分布しているために、光子密度の高い領域
の電流密度を高くすれば効率的に高いレーザ利得が得ら
れるし、逆に光子密度の低い領域の電流密度を高くする
とレーザ利得は下がる。Next, the operation will be described. Since the ohmic electrode for injecting a current into the laser active layer is divided into the first n-side electrode 1 and the second n-side electrode 2, the currents injected into the front side and the rear side of the laser resonator are independently controlled. can do. Laser gain is represented by the multiplication of photon density and current density in the cavity. Generally, since the photon density in the resonator is non-uniformly distributed, a high laser gain can be obtained efficiently by increasing the current density in the high photon density region, and conversely, the current in the low photon density region can be increased. The higher the density, the lower the laser gain.
【0004】上述のことから、前,後面の注入電流の比
率を様々に変化させると、レーザ利得が変化し、その結
果、しきい値電流密度が変化する。波長可変量Δλと、
しきい値キャリア密度変化量ΔNの関係は次式で与えら
れる。 Δλ=(λ/n)Γ(dn/dN)ΔN ただし、nは屈折率、λは波長、dn/dNは屈折率の
キャリア密度に対する微分効率、Γはレーザ光の活性層
へ閉じ込められる割合を示す。上式よりΔNを変化させ
ると、これに応じてΔλが増大する。即ち、波長を変化
させることができる。From the above, when the ratio of the injection currents on the front surface and the rear surface is variously changed, the laser gain changes, and as a result, the threshold current density changes. Wavelength tunable amount Δλ,
The relationship of the threshold carrier density change amount ΔN is given by the following equation. Δλ = (λ / n) Γ (dn / dN) ΔN where n is the refractive index, λ is the wavelength, dn / dN is the differential efficiency of the refractive index with respect to the carrier density, and Γ is the ratio of laser light confined in the active layer. Show. When ΔN is changed from the above equation, Δλ increases accordingly. That is, the wavelength can be changed.
【0005】[0005]
【発明が解決しようとする課題】上記のような構成の波
長可変型半導体レーザ装置での波長可変量Δλはしきい
値キャリア濃度の変化量ΔNと、光閉じ込め係数Γの大
きさでほぼ決定される。しかし、これらの値は構造に依
存し、あまり大きくすることができないためにΔλも比
較的小さいという問題があった。The wavelength tunable amount Δλ in the wavelength tunable semiconductor laser device having the above-mentioned configuration is substantially determined by the threshold carrier concentration change amount ΔN and the optical confinement coefficient Γ. It However, since these values depend on the structure and cannot be made too large, there is a problem that Δλ is also relatively small.
【0006】この発明は上記のような問題点を解消する
ためになされたもので、波長可変量Δλが大きな波長可
変型半導体レーザ装置を得ることを目的としている。The present invention has been made to solve the above problems, and an object thereof is to obtain a wavelength tunable semiconductor laser device having a large wavelength tunable amount Δλ.
【0007】[0007]
【課題を解決するための手段】この発明に係る波長可変
型半導体レーザ装置は、活性層と、その活性層を挟む第
1導電型クラッド層および第2導電型クラッド層からな
り、第1導電側電極および第2導電側電極を備えた半導
体レーザ装置において、上記活性層は量子井戸構造に構
成されるとともに、上記第1導電側電極は共振器方向に
対して前後に分割、隔離して形成され、その隔離された
電極の間に存在する第1導電型層に対して第2導電型領
域が活性層に達するまで拡散して形成され、上記分割さ
れた電極のいずれか一方の電極から上記活性層に対して
逆方向に電圧を印加するものである。A wavelength tunable semiconductor laser device according to the present invention comprises an active layer, a first conductivity type cladding layer and a second conductivity type cladding layer sandwiching the active layer, and a first conductivity side. In a semiconductor laser device including an electrode and a second conductive side electrode, the active layer has a quantum well structure, and the first conductive side electrode is formed by dividing the active layer in the front-rear direction in a front-rear direction. , The second conductivity type region is diffused and formed to reach the active layer with respect to the first conductivity type layer existing between the isolated electrodes, and the active region is formed from one of the divided electrodes. The voltage is applied in the opposite direction to the layer.
【0008】[0008]
【作用】この発明においては、活性層は量子井戸構造に
構成されるとともに、上記第1導電側電極は共振器方向
に対して前後に分割、隔離して形成され、その隔離され
た電極の間に存在する第1導電型層に対して第2導電型
領域が活性層に達するまで拡散して形成され、上記分割
された電極のいずれか一方の電極から上記活性層に対し
て逆方向に電圧を印加するものであり、量子井戸活性層
は電圧に比例して吸収係数が増大する。従って、共振器
内の損失が増大するため、これを補うため、注入キャリ
ア量を増やさなければならない。この結果、ΔNの変化
量が大きくなるため、波長可変量Δλが増大する。According to the present invention, the active layer has a quantum well structure, and the first conductive side electrode is divided into front and rear portions with respect to the resonator direction, and is formed separately. A first conductivity type layer existing in the first conductivity type layer is diffused until it reaches the active layer, and a voltage is applied from one of the divided electrodes in the opposite direction to the active layer. The absorption coefficient of the quantum well active layer increases in proportion to the voltage. Therefore, the loss in the resonator increases, and in order to compensate for this, the amount of injected carriers must be increased. As a result, the amount of change in ΔN increases, and the amount of wavelength variation Δλ increases.
【0009】[0009]
【実施例】図1はこの発明の一実施例による波長可変型
半導体レーザ装置を示す断面図である。図において、図
3と同一符号は同一または相当部分を示し、5は量子井
戸活性層、8はp型拡散領域である。1 is a sectional view showing a wavelength tunable semiconductor laser device according to an embodiment of the present invention. In the figure, the same reference numerals as those in FIG. 3 denote the same or corresponding portions, 5 is a quantum well active layer, and 8 is a p-type diffusion region.
【0010】量子井戸層に逆方向電圧を印加すると量子
シュタルク効果により長波長側の吸収係数が増大する。
図2に吸収スペクトルの印加電圧依存性の実験値を示
す。例えば波長1.55μmに注目すると、印加電圧が
大きいほど、吸収係数は増大している。ここで、レーザ
発振条件を考えてみると、利得と損失の関係は下式で表
わされる。 G(N)=αi +αM When a reverse voltage is applied to the quantum well layer, the absorption coefficient on the long wavelength side increases due to the quantum Stark effect.
FIG. 2 shows experimental values of the applied voltage dependence of the absorption spectrum. For example, focusing on the wavelength of 1.55 μm, the absorption coefficient increases as the applied voltage increases. Here, considering the laser oscillation conditions, the relationship between the gain and the loss is expressed by the following equation. G (N) = α i + α M
【0011】左辺はキャリア濃度Nの関数である利得G
(N)、右辺は内部吸収損失αi 及び共振器損失αM の
和で、各々表わされる。逆印加電圧による吸収損失の増
大効果は構造上、αM の増大となって表われると考えら
れる。従って、レーザ発振条件を満たすためには、G
(N)を増加させなければならず、そのためには注入キ
ャリア濃度Nを変化させなければならない。この結果、
注入キャリア濃度の変化量ΔNを大きくすることができ
るため、ΔNに比例する波長可変幅Δλも増大する。The left side is a gain G which is a function of the carrier concentration N.
(N), the right side is represented by the sum of the internal absorption loss α i and the resonator loss α M. It is considered that the effect of increasing the absorption loss due to the reverse application voltage is structurally manifested as an increase in α M. Therefore, in order to satisfy the laser oscillation condition, G
(N) must be increased, and for that purpose the injected carrier concentration N must be changed. As a result,
Since the change amount ΔN of the injected carrier concentration can be increased, the wavelength variable width Δλ proportional to ΔN also increases.
【0012】このような本実施例の半導体装置では、活
性層を量子井戸構造とするとともに電極を前後に分離
し、その前後の電極間に存在する第1導電型層に第2導
電型不純物を活性層に達するまで拡散し第2導電型領域
を形成し、上記電極のいずれか一方に活性層に対して逆
方向電圧を印加するようにしたので、この電圧印加によ
り注入キャリア濃度の変化量を大きくすることができ、
その注入キャリア濃度の変化量に比例して波長可変幅を
増大させることができる。In such a semiconductor device of this embodiment, the active layer has a quantum well structure, the electrodes are separated into front and rear, and the second conductivity type impurities are present in the first conductivity type layer existing between the electrodes before and after the electrode. Since the second conductivity type region is formed by diffusion until reaching the active layer, and a reverse voltage is applied to either one of the electrodes with respect to the active layer, the amount of change in injected carrier concentration can be changed by applying this voltage. Can be bigger,
The wavelength tunable width can be increased in proportion to the amount of change in the injected carrier concentration.
【0013】[0013]
【発明の効果】以上のように、この発明によれば、活性
層を量子井戸構造とするとともに電極を前後に分離し、
その前後の電極間に存在する第1導電型層に第2導電型
不純物を活性層に達するまで拡散して第2導電型領域を
形成し、上記電極のいずれか一方に活性層に対して逆方
向電圧を印加するようにしたので、この電圧印加により
注入キャリア濃度の変化量を大きくすることができ、そ
の注入キャリア濃度の変化量に比例して波長可変幅を増
大させることができる効果がある。As described above, according to the present invention, the active layer has the quantum well structure, and the electrodes are separated into the front and rear,
A second conductivity type impurity is diffused into the first conductivity type layer existing between the electrodes before and after the electrode until it reaches the active layer to form a second conductivity type region, and one of the electrodes is opposite to the active layer. Since the directional voltage is applied, it is possible to increase the amount of change in the injected carrier concentration by applying this voltage, and to increase the wavelength tunable width in proportion to the amount of change in the injected carrier concentration. ..
【図1】この発明の一実施例による波長可変型半導体レ
ーザ装置を示す断面図である。FIG. 1 is a sectional view showing a wavelength tunable semiconductor laser device according to an embodiment of the present invention.
【図2】上記実施例装置の吸収スペクトルの印加電圧依
存性を示す図である。FIG. 2 is a diagram showing the applied voltage dependence of the absorption spectrum of the device of the above-mentioned embodiment.
【図3】従来の波長可変型半導体レーザ装置の断面図で
ある。FIG. 3 is a sectional view of a conventional wavelength tunable semiconductor laser device.
1 n側第1オーミック電極 2 n側第2オーミック電極 3 n型クラッド層 4 回折格子 5 量子井戸型活性層 6 p型クラッド層 7 p型オーミック電極 8 p型拡散領域 9 n型コンタクト層 10 活性層 1 n-side first ohmic electrode 2 n-side second ohmic electrode 3 n-type clad layer 4 diffraction grating 5 quantum well type active layer 6 p-type clad layer 7 p-type ohmic electrode 8 p-type diffusion region 9 n-type contact layer 10 active layer
Claims (1)
クラッド層および第2導電型クラッド層と、第1導電側
電極および第2導電側電極とを備えた半導体レーザ装置
において、 上記活性層は量子井戸構造に構成されるとともに、上記
第1導電側電極は共振器方向に対して前後に分割、隔離
して形成され、その隔離された電極の間に存在する第1
導電型層に対して第2導電型領域が活性層に達するまで
拡散して形成され、 上記分割された電極のいずれか一方の電極から上記活性
層に対して逆方向に電圧を印加することを特徴とする波
長可変型半導体レーザ装置。1. A semiconductor laser device comprising an active layer, a first conductivity type clad layer and a second conductivity type clad layer sandwiching the active layer, a first conductivity side electrode and a second conductivity side electrode, wherein: The active layer has a quantum well structure, and the first conductive-side electrode is divided into front and rear portions with respect to the resonator direction and is formed so as to be separated from each other.
The second conductivity type region is diffused and formed to reach the active layer with respect to the conductivity type layer, and a voltage may be applied to the active layer in the opposite direction from one of the divided electrodes. Characteristic tunable semiconductor laser device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23731291A JPH0555701A (en) | 1991-08-22 | 1991-08-22 | Tunable semiconductor laser device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23731291A JPH0555701A (en) | 1991-08-22 | 1991-08-22 | Tunable semiconductor laser device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0555701A true JPH0555701A (en) | 1993-03-05 |
Family
ID=17013503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23731291A Pending JPH0555701A (en) | 1991-08-22 | 1991-08-22 | Tunable semiconductor laser device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0555701A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5768549A (en) * | 1995-06-29 | 1998-06-16 | Yazaki Corporation | Input interface using multiplex type input circuit |
| US5845221A (en) * | 1995-06-30 | 1998-12-01 | Yazaki Corporation | Load control system for vehicle |
| US5859845A (en) * | 1995-07-19 | 1999-01-12 | Yazaki Corporation | Vehicle load control system |
| US5978352A (en) * | 1995-06-29 | 1999-11-02 | Yazaki Corporation | Multiplex transmission system |
| US6052400A (en) * | 1997-04-17 | 2000-04-18 | Nec Corporation | Variable wavelength semiconductor laser |
| US6522935B1 (en) | 1995-06-29 | 2003-02-18 | Yazaki Corporation | Control-specification design management system used for load control devices |
-
1991
- 1991-08-22 JP JP23731291A patent/JPH0555701A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5768549A (en) * | 1995-06-29 | 1998-06-16 | Yazaki Corporation | Input interface using multiplex type input circuit |
| US5978352A (en) * | 1995-06-29 | 1999-11-02 | Yazaki Corporation | Multiplex transmission system |
| US6522935B1 (en) | 1995-06-29 | 2003-02-18 | Yazaki Corporation | Control-specification design management system used for load control devices |
| US5845221A (en) * | 1995-06-30 | 1998-12-01 | Yazaki Corporation | Load control system for vehicle |
| US5859845A (en) * | 1995-07-19 | 1999-01-12 | Yazaki Corporation | Vehicle load control system |
| US6052400A (en) * | 1997-04-17 | 2000-04-18 | Nec Corporation | Variable wavelength semiconductor laser |
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