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JPH05267703A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH05267703A
JPH05267703A JP4061952A JP6195292A JPH05267703A JP H05267703 A JPH05267703 A JP H05267703A JP 4061952 A JP4061952 A JP 4061952A JP 6195292 A JP6195292 A JP 6195292A JP H05267703 A JPH05267703 A JP H05267703A
Authority
JP
Japan
Prior art keywords
layer
sunlight
energy gap
energy
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4061952A
Other languages
Japanese (ja)
Inventor
Koji Ebe
広治 江部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4061952A priority Critical patent/JPH05267703A/en
Publication of JPH05267703A publication Critical patent/JPH05267703A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Photovoltaic Devices (AREA)

Abstract

(57)【要約】 【目的】 半導体装置、特に太陽電池に関し、太陽光の
短波長より長波長の総ての波長領域の光を網羅して効率
良く吸収可能な太陽電池の提供を目的とする。 【構成】 基板21上にヘテロ構造の化合物半導体層を設
け、該化合物半導体層で太陽光を吸収し、該吸収した太
陽光を光電変換する装置に於いて、前記太陽光の短波長
の光エネルギーが吸収可能な広エネルギーギャップ超格
子層22、前記太陽光の長波長の光エネルギーが吸収可能
な狭エネルギーギャップ超格子層23を積層、或いは基板
21を挟んで設け、前記太陽光の全波長領域の光エネルギ
ーを吸収可能としたことで構成する。
(57) [Abstract] [Purpose] An object of the present invention is to provide a semiconductor device, in particular, a solar cell, which is capable of efficiently absorbing light in all wavelength regions of short wavelength to long wavelength of sunlight. .. In a device for providing a compound semiconductor layer having a hetero structure on a substrate 21, absorbing sunlight by the compound semiconductor layer, and photoelectrically converting the absorbed sunlight, light energy of the sunlight having a short wavelength is obtained. A wide-energy-gap superlattice layer 22 capable of absorbing light, a narrow-energy-gap superlattice layer 23 capable of absorbing long-wavelength light energy of the sunlight, or a substrate
It is formed by sandwiching 21 to allow absorption of light energy in the entire wavelength region of the sunlight.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体装置に係り、特に
太陽光の光エネルギーを高効率に吸収して光電変換可能
とした太陽電池に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device, and more particularly to a solar cell capable of absorbing light energy of sunlight with high efficiency and performing photoelectric conversion.

【0002】[0002]

【従来の技術】従来より太陽電池は種々提案されている
が、図5(a)、図5(b)に示すように、化合物半導体よりな
り、エネルギーギャップEg1 が大きいp型の硫化カドミ
ウム(CdS) 層1と、エネルギーギャップEg2 が小さいテ
ルル化カドミウム( CdTe) 層2をヘテロ構造に積層し、
前記CdS 層1上にストライプ状の金・ゲルマニウム合金
よりなる電極3Aを設け、前記CdTe層2上には全面に金・
ゲルマニウム合金よりなる電極3Bを設けたヘテロ接合型
の光起電力型の半導体装置よりなる太陽電池がある。こ
こで図5(b)の11は伝導帯の底のエネルギーレベルを示
し、12は価電子帯の上部のエネルギーレベルを示す。
2. Description of the Related Art Conventionally, various solar cells have been proposed, but as shown in FIGS. 5 (a) and 5 (b), a p-type cadmium sulfide (compound semiconductor having a large energy gap Eg 1 CdS) layer 1 and cadmium telluride (CdTe) layer 2 having a small energy gap Eg 2 are laminated in a hetero structure,
An electrode 3A made of a stripe-shaped gold-germanium alloy is provided on the CdS layer 1, and gold is formed on the entire surface on the CdTe layer 2.
There is a solar cell including a heterojunction photovoltaic semiconductor device provided with an electrode 3B made of a germanium alloy. Here, 11 in FIG. 5 (b) indicates the energy level at the bottom of the conduction band, and 12 indicates the energy level at the top of the valence band.

【0003】また、これとは別個に、図6(a)、図6(b)に
示すように、エネルギーギャップEg 1 が2.0eV で水素を
添加し、pn接合を設けたアモルファス窒化Si層(SiN:
H)4、エネルギーギャップEg2 が1.7eV で水素を添加
し、pn接合を設けたアモルファスSi層(Si:H)5、エネ
ルギーギャップEg3 が1.4eV で、水素を添加し、pn接
合を設けたアモルファスゲルマニウムSi層(SiGe:H)6
を、順次積層して電極3A,3B を設けたタンデム型の太陽
電池がある。ここで図6(b)の11は伝導帯の底のエネルギ
ーレベルを示し、12は価電子帯の上部のエネルギーレベ
ルを示す。
Separately from this, in FIGS. 6 (a) and 6 (b),
As shown, energy gap Eg 1Is 2.0 eV
Amorphous Si nitride layer (SiN:
H) 4, energy gap Eg2Adds hydrogen at 1.7 eV
, An amorphous Si layer (Si: H) 5 with a pn junction, energy
Lugie Gap Eg3Is 1.4eV, hydrogen is added, pn contact
Amorphous germanium Si layer (SiGe: H) 6
Tandem solar with electrodes 3A and 3B stacked in sequence.
There is a battery. Here, 11 in Fig. 6 (b) is the energy at the bottom of the conduction band.
Level, where 12 is the energy level above the valence band.
Indicates the

【0004】上記した従来構造の太陽電池は、エネルギ
ーギャップの広い材料と、エネルギーギャップの狭い材
料を組み合わせて、太陽光を出来るだけ効率良く吸収し
て光電変換しているが、前者のヘテロ接合型半導体装置
は、エネルギーギャップの異なる材料を2種類用いて形
成しており、後者のタンデム型半導体装置は、エネルギ
ーギャップの異なる材料を3種類用いているのに過ぎ
ず、いずれも太陽光の光エネルギーを電気エネルギーに
変換する変換効率は、20%前後で変換効率が低く、更に
一層の高変換効率を有する太陽電池が要望される。
The above-described conventional solar cell combines a material with a wide energy gap and a material with a narrow energy gap to absorb sunlight as efficiently as possible and perform photoelectric conversion. The semiconductor device is formed by using two kinds of materials having different energy gaps, and the latter tandem type semiconductor device uses only three kinds of materials having different energy gaps, and all of them are light energy of sunlight. The conversion efficiency of converting electricity into electric energy is around 20%, and the conversion efficiency is low, and a solar cell having even higher conversion efficiency is desired.

【0005】[0005]

【発明が解決しようとする課題】太陽光は波長が0.3 μ
m の短波長の太陽光より、波長が2.4 μm の長波長の光
迄、波長領域が広範囲に分布しており、これらの広範囲
の波長の光を効率良く吸収して、効率良く光電変換でき
る半導体装置が望まれる。
[Problems to be Solved by the Invention] The wavelength of sunlight is 0.3 μ.
The wavelength range is widely distributed from sunlight with a short wavelength of m to light with a long wavelength of 2.4 μm, and semiconductors that can efficiently absorb light in these wide wavelengths and can perform photoelectric conversion efficiently. A device is desired.

【0006】本発明は上記した事項に鑑みてなされたも
ので、広範囲の波長の太陽光を、すべて網羅して効率良
く吸収して、効率良く光電変換できる半導体装置の提供
を目的とする。
The present invention has been made in view of the above matters, and an object of the present invention is to provide a semiconductor device capable of efficiently absorbing all sunlight having a wide range of wavelengths and efficiently performing photoelectric conversion.

【0007】[0007]

【課題を解決するための手段】本発明の半導体装置は、
請求項1に示すように、基板上にヘテロ構造の化合物半
導体層を設け、該化合物半導体層で太陽光を吸収し、該
吸収した太陽光を光電変換する装置に於いて、太陽光の
短波長の光エネルギーが吸収可能な広エネルギーギャッ
プ超格子層、前記太陽光の長波長の光エネルギーが吸収
可能な狭エネルギーギャップ超格子層を積層、或いは基
板を挟んで設け、前記太陽光の全波長領域の光エネルギ
ーを吸収可能としたことを特徴とする。
The semiconductor device of the present invention comprises:
In a device for providing a compound semiconductor layer having a heterostructure on a substrate, absorbing sunlight by the compound semiconductor layer, and photoelectrically converting the absorbed sunlight, a short wavelength of sunlight is obtained. A wide energy gap superlattice layer capable of absorbing the light energy of, a narrow energy gap superlattice layer capable of absorbing the light energy of the long wavelength of the sunlight are laminated, or provided by sandwiching the substrate, and the whole wavelength range of the sunlight is provided. It is characterized in that it can absorb the light energy of.

【0008】また請求項2に示すように、前記広エネル
ギーギャップ超格子層、狭エネルギーギャップ超格子層
の障壁層および井戸層の厚さを段階的に、或いは連続的
に変化させることで、形成される超格子層のエネルギー
ギャップを変動させるようにしたことを特徴とするもの
である。
Further, as described in claim 2, it is formed by changing the thickness of the barrier layer and the well layer of the wide energy gap superlattice layer and the narrow energy gap superlattice layer stepwise or continuously. It is characterized in that the energy gap of the superlattice layer is varied.

【0009】[0009]

【作用】太陽光は波長が0.3 μm の短波長の光より、波
長が2.4 μm の長波長の光まで分布しており、この広い
波長域の光に対して光電変換可能な半導体材料を選択す
る必要がある。
[Operation] Sunlight is distributed from short-wavelength light with a wavelength of 0.3 μm to long-wavelength light with a wavelength of 2.4 μm. Select a semiconductor material that can photoelectrically convert light in this wide wavelength range. There is a need.

【0010】例えば図4(a)の(1) に示すように、エネル
ギーギャップが2.6eV のセレン化亜鉛(ZnSe)層を井戸層
とし、エネルギーギャップが3.6eV の硫化亜鉛(ZnS) 層
を障壁層として積層して超格子層を形成すると、その超
格子層のエネルギーギャップEg1 は井戸層、或いは障壁
層の厚さを変えることにより、3.1 〜2.6eV の範囲で変
えることができるので、この材料は波長が0.4 〜0.48μ
m の太陽光を吸収可能である。
For example, as shown in (1) of FIG. 4 (a), a zinc selenide (ZnSe) layer having an energy gap of 2.6 eV is used as a well layer, and a zinc sulfide (ZnS) layer having an energy gap of 3.6 eV is used as a barrier. When the superlattice layer is formed by stacking as a layer, the energy gap Eg 1 of the superlattice layer can be changed in the range of 3.1 to 2.6 eV by changing the thickness of the well layer or the barrier layer. The material has a wavelength of 0.4 to 0.48μ
It can absorb m sunlight.

【0011】また、例えば図4(a)の(2) に示すようにエ
ネルギーギャップが1.4eV のGaAs層を井戸層とし、エネ
ルギーギャップが2.5eV のアルミニウム・ガリウム・砒
素(Alx Ga1-x As)層を障壁層として積層して超格子層
を形成すると、その超格子層のエネルギーギャップEg2
は井戸層、或いは障壁層の厚みを変えることにより、1.
8 〜1.4eV の範囲で変えられるので、この材料は波長が
0.69μm 〜0.89μm の太陽光を効率良く吸収できる。
Further, for example, as shown in (2) of FIG. 4 (a), a GaAs layer having an energy gap of 1.4 eV is used as a well layer, and aluminum gallium arsenide (Al x Ga 1-x ) having an energy gap of 2.5 eV is used. As) layer is laminated as a barrier layer to form a superlattice layer, the energy gap Eg 2 of the superlattice layer is
By changing the thickness of the well layer or barrier layer, 1.
Since it can be varied from 8 to 1.4 eV, this material has
It can efficiently absorb sunlight of 0.69 μm to 0.89 μm.

【0012】また、例えば図4(a)の(3) に示すように、
エネルギーギャップが0.6 eV のHg 1-x Cdx Te(x=0.5)
層を井戸層とし、エネルギーギャップが1.5eV のCdTe層
を障壁層として積層して超格子層を形成すると、その超
格子層のエネルギーギャップEg3 は井戸層、或いは障壁
層の厚みを変えることにより、1.1 〜0.6eV の範囲で変
えることが可能となり、この材料は波長が1.1 〜2.1 μ
m の太陽光を吸収可能と成る。
Further, for example, as shown in (3) of FIG. 4 (a),
Hg with energy gap of 0.6 eV 1-xCdxTe (x = 0.5)
Layer is a well layer and the energy gap is 1.5eV CdTe layer
Is formed as a barrier layer to form a superlattice layer,
Energy gap Eg of the lattice layer3Is a well layer or barrier
By changing the layer thickness, the range is from 1.1 to 0.6 eV.
This material has a wavelength of 1.1 to 2.1 μ.
It can absorb m m of sunlight.

【0013】上記した図4(a)に於いて、11は各々の超格
子層の伝導帯の底のエネルギーレベルを示し、12は各々
の超格子層の価電子帯の上部のエネルギーレベルを示
す。そしてLw は井戸層の厚さを示し、LB は障壁層の
厚さを示す。
In FIG. 4 (a), 11 indicates the energy level at the bottom of the conduction band of each superlattice layer, and 12 indicates the energy level at the top of the valence band of each superlattice layer. .. L w represents the thickness of the well layer, and L B represents the thickness of the barrier layer.

【0014】このような3種類の超格子層同士を、更に
積層して半導体装置を形成すると、そのエネルギーバン
ド図は図4(b)に示すようになる。図の11はこれらの3種
類の超格子層を順次積層した場合の伝導帯の底のエネル
ギーレベルを示し、12はこれらの3種類の超格子層を順
次積層した場合の価電子帯の上部のエネルギーレベルを
示す。
When these three kinds of superlattice layers are further laminated to form a semiconductor device, the energy band diagram thereof is as shown in FIG. 4 (b). 11 in the figure shows the energy level at the bottom of the conduction band when these three types of superlattice layers are sequentially stacked, and 12 is at the top of the valence band when these three types of superlattice layers are sequentially stacked. Indicates energy level.

【0015】このようにすると、エネルギーギャップが
Eg1 よりEg3 まで連続的に変化し、そのため、0.4 μm
〜2.1 μm 迄の波長の太陽光が吸収可能となり、太陽光
の殆どの波長の光を吸収できるので、太陽光の吸収効率
が上がり、そのため、光電変換効率も向上して変換効率
の良い太陽電池を得ることができる。
In this way, the energy gap is
It continuously changes from Eg 1 to Eg 3 and is therefore 0.4 μm
Since solar light with wavelengths up to 2.1 μm can be absorbed, and light with almost all wavelengths of sunlight can be absorbed, the absorption efficiency of solar light is improved, and therefore the photoelectric conversion efficiency is also improved and solar cells with good conversion efficiency. Can be obtained.

【0016】[0016]

【実施例】以下、図面を用いて本発明の実施例につき詳
細に説明する。図1(a)は本発明の半導体装置の第1実施
例の平面図、図1(b)は断面図である。
Embodiments of the present invention will be described in detail below with reference to the drawings. 1 (a) is a plan view of a first embodiment of a semiconductor device of the present invention, and FIG. 1 (b) is a sectional view.

【0017】図1(a)、図1(b)に図示するように、p型、
或いはn型のGaAs基板21上に、分子線エピタキシャル成
長法、或いは有機金属気相成長方法により、p型でエネ
ルギーギャップが2.5eV のAlx Ga1-x As層(x=0.7)を20
Åの障壁層として、またp型でエネルギーギャップが1.
4ev のGaAs層を井戸層として、その厚みを10Åから100
Åへ除々に変化させながら、順次多層に積層して、エネ
ルギーギャップが1.8より1.4eV に除々に変化する広エ
ネルギーギャップ超格子層22が形成されている。
As shown in FIGS. 1 (a) and 1 (b), p-type,
Alternatively, a p-type Al x Ga 1-x As layer (x = 0.7) having an energy gap of 2.5 eV is formed on the n-type GaAs substrate 21 by the molecular beam epitaxial growth method or the metal organic chemical vapor deposition method.
As a Å barrier layer, it is p-type and has an energy gap of 1.
The 4ev GaAs layer is used as a well layer and its thickness is from 10Å to 100
A wide energy gap superlattice layer 22 in which the energy gap gradually changes from 1.8 to 1.4 eV is formed by sequentially laminating in multiple layers while gradually changing to Å.

【0018】この広エネルギーギャップ超格子層22の構
造を表1に示す。
Table 1 shows the structure of the wide energy gap superlattice layer 22.

【0019】[0019]

【表1】 [Table 1]

【0020】またこの基板21の裏面側には、n型でエネ
ルギーギャップが1.5eV のCdTe層を20Åの厚さの障壁層
として、またn型でエネルギーギャップが0.6eV のHg
1-x Cd x Te層(x=0.5)を井戸層として、その厚みを10Å
より100 Åに除々に変化させながら順次多層に積層し
て、エネルギーギャップが1.1eV より0.6eV に除々に変
化する狭エネルギーギャップ超格子層23が形成されてい
る。
On the back side of the substrate 21, an n-type energy source is used.
A 20Å thick barrier layer with a CdTe layer with a luge gap of 1.5 eV
And Hg with n-type and energy gap of 0.6 eV
1-xCd xThe Te layer (x = 0.5) is used as a well layer and its thickness is 10Å
Layered in multiple layers while gradually changing to 100 Å
The energy gap gradually changed from 1.1eV to 0.6eV.
The narrow energy gap superlattice layer 23 is formed.
It

【0021】この狭エネルギーギャップ超格子層23の構
造を表2に示す。
Table 2 shows the structure of the narrow energy gap superlattice layer 23.

【0022】[0022]

【表2】 [Table 2]

【0023】そしてこの広エネルギーギャップ超格子層
22の表面には入射光を遮らないようにストライプ状の金
−ゲルマニウム合金の電極24が蒸着により形成されてい
る。また狭エネルギーギャップ超格子層23の全面にイン
ジウムの電極25が蒸着により形成されている。このよう
に形成した素子を、ガラス等の支持板に接着剤により固
定して半導体装置とする。
And this wide energy gap superlattice layer
Striped gold-germanium alloy electrodes 24 are formed by vapor deposition on the surface of 22 so as not to block incident light. Further, an indium electrode 25 is formed on the entire surface of the narrow energy gap superlattice layer 23 by vapor deposition. The element thus formed is fixed to a supporting plate such as glass with an adhesive to obtain a semiconductor device.

【0024】このようにして形成された半導体装置は、
エネルギーギャップが0.6 〜1.1eVの狭エネルギーギャ
ップ超格子層23は、波長が1.1 〜2.1 μm の太陽光を効
率良く吸収し、またエネルギーギャップが1.4 〜1.8eV
の広エネルギーギャップ超格子層22は、波長が0.69〜0.
89μm の太陽光を効率良く吸収するので、0.69μm 〜2.
1 μm までの波長の範囲の太陽光を効率良く吸収する。
The semiconductor device thus formed is
The narrow energy gap superlattice layer 23 with an energy gap of 0.6 to 1.1 eV efficiently absorbs sunlight with a wavelength of 1.1 to 2.1 μm and has an energy gap of 1.4 to 1.8 eV.
The wide energy gap superlattice layer 22 has a wavelength of 0.69 to 0.
It efficiently absorbs 89 μm sunlight, so it is 0.69 μm to 2.
Efficiently absorbs sunlight in the wavelength range up to 1 μm.

【0025】また本発明の第2実施例として、図2に示
すように、前記したGaAsとAlx Ga1- x Asの広エネルギー
ギャップ超格子層22に隣接して、p型でエネルギーギャ
ップが2.6eV のセレン化亜鉛(ZnSe)を井戸層として10〜
100 Åの厚さに形成し、またp型でエネルギーギャップ
が3.6eV の硫化亜鉛(ZnS) を障壁層として20Åの厚さに
形成する。
As a second embodiment of the present invention, as shown in FIG. 2, adjacent to the wide energy gap superlattice layer 22 of GaAs and Al x Ga 1- x As, a p-type energy gap is provided. 2.6 eV zinc selenide (ZnSe) as a well layer
It is formed to a thickness of 100 Å, and p-type zinc sulfide (ZnS) having an energy gap of 3.6 eV is formed to a thickness of 20 Å as a barrier layer.

【0026】そしてこれらの井戸層の厚みを100 Åより
10Åに除々に変化させ、障壁層の厚みを20Åとして順次
多層に積層してエネルギーギャップが2.6eV より3.1eV
に除々に変化した広エネルギーギャップ超格子層22A を
形成すると、このZnS とZnSeの広エネルギーギャップ超
格子層22A は、エネルギーギャップが2.6 〜3.1eV であ
るので、0.4 〜0.48μm の太陽光を吸収するようにな
り、更に太陽光の吸収波長の範囲が拡大した半導体装置
が得られる。
And, the thickness of these well layers is from 100 Å
Gradually change to 10 Å, the barrier layer thickness is 20 Å, and the energy gap is 3.1 eV from 2.6 eV by sequentially stacking multiple layers.
When a wide-energy-gap superlattice layer 22A that gradually changes is formed, the wide-energy-gap superlattice layer 22A of ZnS and ZnSe has an energy gap of 2.6 to 3.1 eV, and therefore absorbs 0.4 to 0.48 μm of sunlight. As a result, a semiconductor device having a wider range of absorption wavelength of sunlight can be obtained.

【0027】また本発明の第3実施例として、図3(a)、
図3(b)に示すように、前記したp型のGaAs層とAlx Ga
1-x As(x=0.7)層の広エネルギーギャップ超格子層22上
に、n型のCdTe層とHg1-x Cdx Te(x=0.5)層の狭エネル
ギーギャップ超格子層23を積層し、広エネルギーギャッ
プ超格子層22にストライプ状の電極24を形成し、狭エネ
ルギーギャップ超格子層23の全面に電極25を設けても良
い。
As a third embodiment of the present invention, as shown in FIG.
As shown in FIG. 3 (b), the p-type GaAs layer and Al x Ga
N-type CdTe layer and Hg 1-x Cd x Te (x = 0.5) layer narrow energy gap superlattice layer 23 are stacked on the wide energy gap superlattice layer 22 of 1-x As (x = 0.7) layer Then, the stripe-shaped electrode 24 may be formed on the wide energy gap superlattice layer 22, and the electrode 25 may be provided on the entire surface of the narrow energy gap superlattice layer 23.

【0028】このような装置を形成するには図3(c)に示
すように、GaAs基板21上にp型のGaAs層とAlx Ga1-x As
(x=0.7)層の広エネルギーギャップ超格子層22を形成
し、その上にn型のCdTe層とHg1-x Cdx Te(x=0.5)の狭
エネルギーギャップ超格子層23を積層し、GaAs基板21を
研磨して除去した後、広エネルギーギャップ超格子層22
にストライプ状の電極24を形成し、狭エネルギーギャッ
プ超格子層23の全面に電極25を設けると良い。
To form such a device, as shown in FIG. 3C, a p-type GaAs layer and Al x Ga 1-x As are formed on a GaAs substrate 21.
A wide energy gap superlattice layer 22 of (x = 0.7) layer is formed, and an n-type CdTe layer and a narrow energy gap superlattice layer 23 of Hg 1-x Cd x Te (x = 0.5) are stacked on it. After removing the GaAs substrate 21 by polishing, the wide energy gap superlattice layer 22 is removed.
It is advisable to form a striped electrode 24 on the surface of the narrow energy gap superlattice layer 23 and to form an electrode 25 on the entire surface.

【0029】以上、本実施例ではAlx Ga1-x As層(x=0.
7)とGaAs層、CdTe層とHg1-x Cdx Te層(x=0.5)、ZnS 層
とZnSe層を組み合わせた超格子層を用いたが、その他、
ZnSe( エネルギーギャップ=2.6eV)を障壁層、GaAs( エ
ネルギーギャップ=1.4eV)を井戸層としたエネルギーギ
ャップが1.8 〜1.4eV の広エネルギーギャップ超格子
層、ZnSe( エネルギーギャップ=2.6eV)を障壁層、CdTe
( エネルギーギャップ=1.5eV)を井戸層としたエネルギ
ーギャップが1.8 〜1.5eV の広エネルギーギャップ超格
子層、エネルギーギャップが0.5eV のInAsを井戸層、エ
ネルギーギャップが1.4eV のGaAsを障壁層としたエネル
ギーギャップが1.4 〜0.5eV の狭エネルギーギャップ超
格子層を適宜組み合わせて用いても良い。
As described above, in this embodiment, the Al x Ga 1-x As layer (x = 0.
7) and GaAs layer, CdTe layer and Hg 1-x Cd x Te layer (x = 0.5), and superlattice layer combining ZnS layer and ZnSe layer were used.
Wide energy gap superlattice layer with an energy gap of 1.8 to 1.4 eV using ZnSe (energy gap = 2.6 eV) as a barrier layer and GaAs (energy gap = 1.4 eV) as a well layer, and ZnSe (energy gap = 2.6 eV) as a barrier layer Layer, CdTe
Wide energy gap superlattice layer with an energy gap of 1.8 to 1.5eV with (energy gap = 1.5eV) as a well layer, InAs with an energy gap of 0.5eV as a well layer, and GaAs with an energy gap of 1.4eV as a barrier layer A narrow energy gap superlattice layer having an energy gap of 1.4 to 0.5 eV may be appropriately combined and used.

【0030】以上述べたように、本発明のエネルギーギ
ャップの異なる多種類の超格子層を組み合わせてpn接合
を設けた半導体装置によると、短波長より長波長の太陽
光の光を効率良く吸収できるので、高効率の太陽電池が
得られる効果がある。
As described above, according to the semiconductor device of the present invention in which a pn junction is formed by combining various types of superlattice layers having different energy gaps, it is possible to efficiently absorb the light of sunlight having a wavelength longer than the short wavelength. Therefore, there is an effect that a highly efficient solar cell can be obtained.

【0031】[0031]

【発明の効果】以上述べたように、本発明の半導体装置
によると太陽光の短波長領域より長波長領域の総ての波
長領域の光を効率良く吸収可能な超格子層を組み合わせ
て半導体装置を形成しているので、高効率な太陽電池が
得られる効果がある。
As described above, according to the semiconductor device of the present invention, the semiconductor device is formed by combining the superlattice layers capable of efficiently absorbing the light in all wavelength regions of the solar light longer than the short wavelength region. Therefore, there is an effect that a highly efficient solar cell can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の第1実施例の平面図と断面図であ
る。
FIG. 1 is a plan view and a sectional view of a first embodiment of the present invention.

【図2】 本発明の第2実施例の断面図である。FIG. 2 is a sectional view of a second embodiment of the present invention.

【図3】 本発明の第3実施例の平面図と断面図であ
る。
FIG. 3 is a plan view and a sectional view of a third embodiment of the present invention.

【図4】 本発明の装置の原理の説明図である。FIG. 4 is an explanatory diagram of the principle of the device of the present invention.

【図5】 従来の装置とエネルギーバンドの説明図であ
る。
FIG. 5 is an explanatory diagram of a conventional device and an energy band.

【図6】 従来の装置とエネルギーバンドの説明図であ
る。
FIG. 6 is an explanatory diagram of a conventional device and an energy band.

【符号の説明】[Explanation of symbols]

11 伝導帯の底のエネルギーレベル 12 価電子帯の上部のエネルギーレベル 21 GaAs基板 22,22A 広エネルギーギャップ超格子層 23 狭エネルギーギャップ超格子層 24,25 電極 11 Energy level at the bottom of the conduction band 12 Energy level at the top of the valence band 21 GaAs substrate 22, 22A Wide energy gap superlattice layer 23 Narrow energy gap superlattice layer 24, 25 Electrode

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 基板(21)上にヘテロ構造の化合物半導体
層を設け、該化合物半導体層で太陽光を吸収し、該吸収
した太陽光を光電変換する装置に於いて、 前記太陽光の短波長の光エネルギーが吸収可能な広エネ
ルギーギャップ超格子層(22)、前記太陽光の長波長の光
エネルギーが吸収可能な狭エネルギーギャップ超格子層
(23)を積層、或いは基板(21)を挟んで設け、前記太陽光
の全波長領域の光エネルギーを吸収可能としたことを特
徴とする半導体装置。
1. An apparatus for providing a compound semiconductor layer having a heterostructure on a substrate (21), absorbing sunlight by the compound semiconductor layer, and photoelectrically converting the absorbed sunlight. Wide energy gap superlattice layer capable of absorbing wavelength light energy (22), narrow energy gap superlattice layer capable of absorbing long wavelength light energy of the sunlight
A semiconductor device characterized in that (23) is laminated or provided with a substrate (21) sandwiched therebetween so as to be able to absorb the light energy in the entire wavelength region of the sunlight.
【請求項2】 請求項1記載の広エネルギーギャップ超
格子層(22)、狭エネルギーギャップ超格子層(23)の障壁
層、および井戸層の厚さを段階的に、或いは連続的に変
化させて形成することで、形成される超格子層(22,23)
のエネルギーギャップを連続的に変化させ、前記太陽光
の多種の波長の光エネルギーを吸収可能としたことを特
徴とする半導体装置。
2. The thickness of the wide energy gap superlattice layer (22), the barrier layer of the narrow energy gap superlattice layer (23), and the well layer according to claim 1, are changed stepwise or continuously. Superlattice layer (22,23)
The semiconductor device is characterized in that it is possible to continuously change the energy gap of the solar cell and absorb the light energy of various wavelengths of the sunlight.
JP4061952A 1992-03-18 1992-03-18 Semiconductor device Pending JPH05267703A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4061952A JPH05267703A (en) 1992-03-18 1992-03-18 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4061952A JPH05267703A (en) 1992-03-18 1992-03-18 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH05267703A true JPH05267703A (en) 1993-10-15

Family

ID=13186044

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4061952A Pending JPH05267703A (en) 1992-03-18 1992-03-18 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH05267703A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012094588A (en) * 2010-10-25 2012-05-17 Sharp Corp Solar cell
KR101538817B1 (en) * 2007-09-25 2015-07-22 퍼스트 솔라, 인코포레이티드 Photovoltaic devices including heterojunctions

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101538817B1 (en) * 2007-09-25 2015-07-22 퍼스트 솔라, 인코포레이티드 Photovoltaic devices including heterojunctions
JP2012094588A (en) * 2010-10-25 2012-05-17 Sharp Corp Solar cell

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