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JPH05235382A - Semiconductor device - Google Patents

Semiconductor device

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Publication number
JPH05235382A
JPH05235382A JP4081348A JP8134892A JPH05235382A JP H05235382 A JPH05235382 A JP H05235382A JP 4081348 A JP4081348 A JP 4081348A JP 8134892 A JP8134892 A JP 8134892A JP H05235382 A JPH05235382 A JP H05235382A
Authority
JP
Japan
Prior art keywords
temperature
thin film
substrate
light
semiconductor thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4081348A
Other languages
Japanese (ja)
Inventor
Jun Takada
純 高田
Akihiko Nakajima
昭彦 中島
Yoshihisa Owada
善久 太和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanegafuchi Chemical Industry Co Ltd
Original Assignee
Kanegafuchi Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanegafuchi Chemical Industry Co Ltd filed Critical Kanegafuchi Chemical Industry Co Ltd
Priority to JP4081348A priority Critical patent/JPH05235382A/en
Publication of JPH05235382A publication Critical patent/JPH05235382A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To generate photoconduction for an electrical connection between a semiconductor thin film and an SrTiO3 substrate by irradiating a semiconductor device having a semiconductor thin film overlaying an SrTiO3 substrate with light having a specified range of energy at a temperature below a fixed temperature. CONSTITUTION:SrTiO3 is irradiated with a light having an energy of 3-5eV range at a low temperature below 150K to make its conductivity suddenly change and to make it have a photoconductive spectrum peculiar at a temperature if decided. Photoconductivity changes markedly in a vicinity of a temperature where SrTiO3 causes phase changes; therefore, using this SrTiO3 as a substrate to overlay it with a semiconductor thin film causes a change in the conductivity of a zone irradiated with 3-5eV ultraviolet rays to make an electrical connection with the semiconductor thin film layer in this zone, so that carriers can be injected into a semiconductor layer for example. This change can be fetched as a change in electrical characteristics of the semiconductor layer.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体装置に関し、詳し
くは紫外線に対して低温で光伝導を生じる基板を備えた
半導体装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device, and more particularly to a semiconductor device provided with a substrate that produces photoconductivity against ultraviolet rays at a low temperature.

【0002】[0002]

【従来の技術】MOSトランジスタを始め半導体の薄膜
表面を電気的に制御する技術は、電圧制御型の半導体と
して、また高周波対応型の半導体として有効であり、そ
のために例えば、CCD等に利用されている。
2. Description of the Related Art A technique for electrically controlling a thin film surface of a semiconductor such as a MOS transistor is effective as a voltage control type semiconductor and a high frequency compatible type semiconductor. There is.

【0003】[0003]

【発明が解決しようとする課題】例えば、かかるCCD
を利用したイメージセンサーでは、基板であるシリコン
等の半導体自体のエネルギーギャップが比較的小さいた
めに可視光や赤外光に対して高い感度を有している。従
って、波長の短い紫外線領域の光を赤外光等の波長の長
い光に区別して検出することはできなかった。
For example, such a CCD
In the image sensor using, the energy gap of the semiconductor itself such as silicon which is the substrate is relatively small, so that it has high sensitivity to visible light and infrared light. Therefore, it was not possible to detect the light in the ultraviolet region having a short wavelength by distinguishing it into the light having a long wavelength such as infrared light.

【0004】一方、従来、例えば光電管、光電池、蛍光
体、写真乾板を用いて紫外線が検出されていたが、薄膜
状の能動的な検出素子としての活用は例えば、MIS型
メモリ素子などに記憶されている情報を消去するために
使用する程度であった。そして、その紫外線の照射の有
無によって、半導体の表面準位等を電気的に制御できる
とは何ら想定すらされていなかった。さらに、MgO等
の従来の酸化物形成用基板として酸化物半導体薄膜を作
製する場合には、高い温度(例えば500°C)でデポ
ジションするので、界面に絶縁物が生じてしまい、基板
と薄膜との間の電気的接続ができなかった。
On the other hand, conventionally, ultraviolet rays have been detected by using, for example, a photocell, a photocell, a phosphor, and a photographic dry plate, but utilization as a thin film active detection element is stored in, for example, a MIS type memory element. It was only used to erase the existing information. It has not even been assumed that the surface level of the semiconductor can be electrically controlled depending on the presence or absence of the irradiation of the ultraviolet rays. Furthermore, when an oxide semiconductor thin film is prepared as a conventional substrate for forming an oxide of MgO or the like, deposition is performed at a high temperature (for example, 500 ° C.), so an insulator is generated at the interface, and the substrate and the thin film are formed. There was no electrical connection between.

【0005】[0005]

【課題を解決するための手段】本発明に係る請求項1記
載の半導体装置は、SrTiO基板上に半導体薄膜が
形成された半導体装置に3eVから5eVの範囲のエネ
ルギーを有する光を150Kよりも低温で照射し、光伝
導を生じさせ、半導体薄膜とSrTiO基板との間に
電気的接続を可能としたものである。
According to a first aspect of the present invention, a semiconductor device having a semiconductor thin film formed on a SrTiO 3 substrate is irradiated with light having energy in the range of 3 eV to 5 eV more than 150 K. Irradiation is performed at a low temperature to cause photoconduction, and electrical connection between the semiconductor thin film and the SrTiO 3 substrate is possible.

【0006】本発明に係る請求項2記載の半導体装置
は、請求項1における半導体薄膜を酸化物としたもので
ある。
According to a second aspect of the present invention, there is provided a semiconductor device in which the semiconductor thin film according to the first aspect is an oxide.

【0007】本発明に係る請求項3記載の半導体装置
は、酸化物半導体薄膜が少なくともCu,Ti,Zn,
Sn,Inのいずれか1つの金属を含んでいるものであ
り、例えばCuO,TiO,ZnO,SnO,In
O,SnInO等である。
According to a third aspect of the present invention, in the oxide semiconductor thin film, at least Cu, Ti, Zn,
It contains any one metal of Sn and In, for example, Cu 2 O, TiO 2 , ZnO, SnO, In
O, SnInO, etc.

【0008】[0008]

【作用】SrTiO基板上に半導体薄膜を形成した半
導体装置に、3eVから5eVの範囲のエネルギーを有
する光を150Kよりも低温で照射し、光伝導を生じさ
せ、半導体薄膜をSrTiO基板との間に電気的接続
を可能とする。
The semiconductor device having the semiconductor thin film formed on the SrTiO 3 substrate is irradiated with light having an energy in the range of 3 eV to 5 eV at a temperature lower than 150 K to cause photoconduction, and the semiconductor thin film is formed on the SrTiO 3 substrate. Allows electrical connection between.

【0009】[0009]

【実施例】以下、本発明の実施例について、図面を参照
して説明する。本発明に係る半導体装置の基板であるS
rTiOは、立方晶から正方晶へ構造相転移するペロ
ブスカイト構造を有する常誘電体である。この物質は約
105K以下の低温で正方晶、それ以上の温度で立方晶
となる。
Embodiments of the present invention will be described below with reference to the drawings. S which is the substrate of the semiconductor device according to the present invention
rTiO 3 is a paraelectric material having a perovskite structure that undergoes a structural phase transition from cubic to tetragonal. This material is tetragonal at low temperatures below about 105 K and cubic at higher temperatures.

【0010】まず、実験に使用する基板試料は、ベルヌ
ーイ法により作成したSrTiO単結晶(アースジュ
エリー社製)を(100)面が表面となるようにサイズ
幅2.5mm、厚み0.5mm、長さ10mmで切り出
したものを片面のみ鏡面仕上げし、電極として間隔1.
5mmで銅線(リード線)を銀ペーストで固着したもの
を試料として準備した。 このときのSrTiOの酸
素欠損濃度は、10原子%以下であることが特性上好ま
しい。
First, the substrate sample used in the experiment was SrTiO 3 single crystal (manufactured by Earth Jewelery Co., Ltd.) prepared by the Bernoulli method with a size width of 2.5 mm and a thickness of 0.5 mm so that the (100) face was the surface. A piece cut out with a length of 10 mm is mirror-finished on only one surface, and the electrodes are spaced at intervals of
A 5 mm thick copper wire (lead wire) fixed with a silver paste was prepared as a sample. At this time, the oxygen deficiency concentration of SrTiO 3 is preferably 10 atomic% or less in view of characteristics.

【0011】この基板試料を冷凍機の銅の台に置きロー
タリーポンプにて10mTorrまで真空引きした。し
かるのち、試料は500WのXeランプをモノクロメー
タにより分光した。3.35eVの励起エネルギーを有
する光をサファイヤ窓を通して照射しながら、試料の温
度を低下させていった。この間、基板試料の温度を銀ペ
ーストで取り付けた熱電対でモニターした。
This substrate sample was placed on a copper base of a refrigerator and evacuated to 10 mTorr by a rotary pump. After that, the sample was spectrally separated by a 500 W Xe lamp with a monochromator. The temperature of the sample was lowered while irradiating light having an excitation energy of 3.35 eV through the sapphire window. During this time, the temperature of the substrate sample was monitored with a thermocouple attached with silver paste.

【0012】図1は3.35eVの励起光に対しての光
電流IPhの温度依存性を示しており、これによると1
20〜100K近くで低温に向かって光伝導が指数関数
的に急激に増加している。ここで、105KはSrTi
の構造相転移温度であり、それ以上では立方晶、そ
れ以下の温度では正方晶となることが知られているが、
ここに見られるような光伝導の急激な増加はこれまでに
報告例はなかったことである。なお、図1の特性は、温
度を漸次減少させて測定した場合と、漸次増加させて測
定した場合とでは同一の軌跡をとり、ヒステリシスは観
測されなかった。
FIG. 1 shows the temperature dependence of the photocurrent I Ph with respect to the excitation light of 3.35 eV.
The photoconductivity rapidly increases exponentially toward a low temperature near 20 to 100K. Here, 105K is SrTi
It is a structural phase transition temperature of O 3 , and it is known that a cubic crystal is formed at a temperature higher than that and a tetragonal crystal is formed at a temperature lower than that.
The rapid increase in photoconductivity seen here has never been reported before. In addition, the characteristic of FIG. 1 takes the same locus in the case where the temperature is gradually reduced and the temperature is gradually increased, and no hysteresis is observed.

【0013】このように、SrTiOが立方晶から正
方晶への構造相転移する温度近くでのIPhの急激な増
加がこの転移に関しているのであれば、このときに状態
密度の構造が変化すると考えられる。
Thus, if the sharp increase in I Ph near the temperature at which SrTiO 3 undergoes a structural phase transition from cubic to tetragonal is related to this transition, then the structure of the density of states changes at this time. Conceivable.

【0014】次に、図1に示した特性において、照射す
る光の強度による特性の変化について測定した。測定結
果を図2に示している。図2においては、グラフa,
b,cは照射する相対的な光の強度が夫々1.0,0.
1,0.01の場合である。同図からTC1,TC2
C3を、例えばIPh(T)曲線での遷移後の光電流
値の10%の温度であると定義すると、夫々115K,
111K,104Kとなる。なお、光の強度を強くする
ことはサンプルの温度を上昇させるかもしれないけれど
も、ここでのTの増加は熱的な効果だけとは考えられ
ない程度である。このように、光の強度を増加させると
転移温度は光の強度に伴って漸次増加する予想がされ
る。これは、光子の吸収によって、電子−ホール対がで
きることが、SrTiO相転移に影響を与えているも
のと考えられる。
Next, in the characteristics shown in FIG. 1, changes in the characteristics due to the intensity of the irradiation light were measured. The measurement result is shown in FIG. In FIG. 2, graph a,
In b and c, the relative intensity of light to be irradiated is 1.0, 0.
This is the case of 1,0.01. From the figure, T C1 , T C2 ,
If T C3 is defined as, for example, the temperature of 10% of the photocurrent value after the transition on the I Ph (T) curve, 115 K, respectively.
It becomes 111K and 104K. Although increasing the light intensity may raise the temperature of the sample, the increase in T C here is not considered to be a thermal effect. Thus, it is expected that when the light intensity is increased, the transition temperature gradually increases with the light intensity. It is considered that this is because the formation of electron-hole pairs by absorption of photons affects the SrTiO 3 phase transition.

【0015】さらに、温度を変化させたときの光伝導ス
ペクトルの変化について測定した。測定結果を図3に示
している。図3では、110K,113K,123K,
142Kの温度における3〜5eVの紫外領域での測定
を示している。前2者の温度での測定値は図2における
左軸で示す単位(μA)の値であり、後2者の温度での
測定値は右軸で示す単位(nA)での値である。
Further, the change in the photoconductivity spectrum when the temperature was changed was measured. The measurement result is shown in FIG. In FIG. 3, 110K, 113K, 123K,
It shows measurements in the UV region of 3-5 eV at a temperature of 142K. The measured values at the temperature of the former two are values in the unit (μA) shown on the left axis in FIG. 2, and the measured values at the temperature of the latter two are values in the unit (nA) shown on the right axis.

【0016】以上の図1ないし図3の測定結果から、3
〜5eVの範囲のエネルギーを有する光を150K以下
よりも低温でSrTiOへ照射することで、その伝導
性が急激に変化するとともに、温度を決めればその温度
での特有の光伝導スペクトルを有することもわかる。こ
のように150K以下での光伝導スペクトルの変化は、
SrTiOの立方晶から正方晶への構造相転移と関連
しているものと考えられる。よって、SrTiOの光
伝導スペクトルが立方晶状態と正方晶状態とで顕著に異
なるので、このSrTiOを半導体薄膜形成用の基板
とすると、2種の光伝導スペクトルを有することができ
る。
From the above measurement results of FIGS. 1 to 3, 3
By irradiating SrTiO 3 with light having an energy in the range of ˜5 eV at a temperature lower than 150 K or lower, its conductivity changes rapidly, and if the temperature is determined, it has a unique photoconductivity spectrum at that temperature. I also understand. Thus, the change in the photoconductivity spectrum below 150K is
It is considered to be related to the cubic to tetragonal structural phase transition of SrTiO 3 . Therefore, since the photoconductivity spectrum of SrTiO 3 is significantly different between the cubic crystal state and the tetragonal crystal state, when SrTiO 3 is used as a substrate for forming a semiconductor thin film, two types of photoconductivity spectra can be obtained.

【0017】このようなSrTiOを基板として半導
体薄膜を形成した半導体装置の実験例について説明す
る。試料としては、基板となる単結晶SrTiO(1
00)面上にCuO薄膜1000Åを酸素雰囲気3×
10−3Torr、基板温度400°CでCuを抵抗加
熱法で蒸発させる、いわゆる反応蒸着法により形成し
た。そして、3.4eVの励起エネルギーを有する光を
照射しながら、測定バイアスを10Vとして、Cu
薄膜上に取り付けた銅線(リード線)間に流れる光電流
Phの温度変化を測定した。測定結果を図4に示して
いる。なお、同図には、対照例としてガラス基板の上に
前記CuO薄膜を形成した場合についての測定結果も
示している。
An experimental example of a semiconductor device in which a semiconductor thin film is formed using such SrTiO 3 as a substrate will be described. As a sample, a single crystal SrTiO 3 (1
Cu 2 O thin film 1000Å on the (00) surface in an oxygen atmosphere 3 ×
It was formed by a so-called reactive evaporation method in which Cu was evaporated by a resistance heating method at 10 −3 Torr and a substrate temperature of 400 ° C. Then, while irradiating the light having the excitation energy of 3.4 eV, the measurement bias is set to 10 V and Cu 2 O is used.
The temperature change of the photocurrent I Ph flowing between the copper wires (lead wires) attached on the thin film was measured. The measurement result is shown in FIG. The figure also shows the measurement results in the case where the Cu 2 O thin film was formed on a glass substrate as a control example.

【0018】しかして、ガラス基板上に形成したCu
O薄膜では、低温に向かって光電流IPhが低下する
が、SrTiOを基板としてCuO薄膜を形成した
試料では、150K以下の低温域において、基板である
SrTiOの光伝導が上昇するのに伴って(図1参
照)、その光電流IPhが上昇しているのが確認され
る。これは、かかる半導体装置におけるSrTiO
CuO間で電気的接続ができていることを特性上表し
ている。そして、この場合には、300〜150Kの温
度領域ではCuOで伝導し、その以下の温度領域では
SrTiOが伝導を支配していることになる。
Thus, Cu 2 formed on the glass substrate
The O thin film, the light current I Ph toward the low temperature is lowered, the sample to form a Cu 2 O thin film SrTiO 3 as the substrate, in the following low temperature range 150K, optical conduction SrTiO 3 as the substrate is raised As a result (see FIG. 1), it is confirmed that the photocurrent I Ph is increasing. This characteristically shows that electrical connection is established between SrTiO 3 and Cu 2 O in such a semiconductor device. In this case, Cu 2 O conducts in the temperature range of 300 to 150 K, and SrTiO 3 controls the conduction in the temperature range below that.

【0019】また、上記単結晶SrTiO(100)
面上にTiO薄膜1000Åを酸素雰囲気3×10
−3Torr、基板温度400°CでCuを抵抗加熱法
で蒸発させた場合でも、SrTiOの影響を受けて上
記した図1ないし図4と同様な結果となる。
The above single crystal SrTiO 3 (100)
TiO 2 thin film 1000 Å on the surface 3 × 10 in oxygen atmosphere
Even when Cu is evaporated by the resistance heating method at −3 Torr and the substrate temperature of 400 ° C., the same result as in FIGS. 1 to 4 is obtained due to the influence of SrTiO 3 .

【0020】しかして、図1に示す特性から、SrTi
の相転移が生じる温度T近傍のときに、光伝導度
が大きく変化するので、このSrTiOを基板として
その上に半導体薄膜を形成すると、図4に示すように、
3〜5eVの紫外線の照射した部分の伝導性が変化し、
その部分では半導体薄膜層との間で電気的な接続がなさ
れるので、例えば半導体層にキャリアを注入できる。そ
の変化を半導体層の電気的特性の変化として外に取り出
すことができる。よって、紫外線をトリガーとする光電
素子を作成することができることになる。
Therefore, from the characteristics shown in FIG. 1, SrTi
Since the photoconductivity changes greatly near the temperature T C at which the phase transition of O 3 occurs, when a semiconductor thin film is formed on this SrTiO 3 as a substrate, as shown in FIG.
The conductivity of the part irradiated with 3-5 eV ultraviolet rays changes,
At that portion, an electrical connection is made with the semiconductor thin film layer, so that carriers can be injected into the semiconductor layer, for example. The change can be taken out as a change in the electrical characteristics of the semiconductor layer. Therefore, it is possible to create a photoelectric element that uses ultraviolet rays as a trigger.

【0021】また、図2に示す特性から、照射する光の
強度によって前記温度Tの値がTC1,TC2,T
C3に変化するので、照射する光の強度を変化させるだ
けで、検出温度の異なる温度スイッチの基板部分にする
ことができる。さらに、例えばTC3よりも高い温度に
SrTiOを保持して、光照射すると伝導度の高い状
態(例えばグラフcの状態)に変わるので、光スイッチ
の基板部分として利用できる。また、温度一定にすると
照射する光の強度に対応して光電流値が変化するので、
光電流値の測定により光の強度の測定をすることができ
る。
From the characteristics shown in FIG. 2, the value of the temperature T C is T C1 , T C2 , T depending on the intensity of the irradiation light.
Since it changes to C3 , it is possible to form the substrate portion of the temperature switch having different detection temperatures simply by changing the intensity of the irradiation light. Further, for example, when SrTiO 3 is held at a temperature higher than T C3 and irradiated with light, the state changes to a state with high conductivity (for example, the state of graph c), so that it can be used as a substrate portion of an optical switch. When the temperature is kept constant, the photocurrent value changes according to the intensity of the applied light.
The intensity of light can be measured by measuring the photocurrent value.

【0022】さらに、図3に示す特性から、温度を変化
させると、3〜5eVの紫外線領域での光伝導スペクト
ルが変化し、温度を一定にすると光伝導スペクトルが決
まるので、温度を変化させることで受光特性の異なる光
スイッチ等の受光部に利用することができる。
Further, from the characteristics shown in FIG. 3, when the temperature is changed, the photoconductivity spectrum in the ultraviolet region of 3 to 5 eV changes, and when the temperature is kept constant, the photoconductivity spectrum is determined. Can be used for a light receiving portion such as an optical switch having different light receiving characteristics.

【0023】[0023]

【発明の効果】以上述べたように、本発明によれば、S
rTiO基板上に半導体薄膜が形成された半導体装置
に3eVから5eVの範囲のエネルギーを有する光を1
50Kよりも低温で照射することで、光伝導を生じさ
せ、半導体薄膜とSrTiO基板との間の電気的接続
が可能となる。しかも、この基板はエピタキシー成長で
きるとともに酸化物であるので、その融点は高く、各種
酸化物半導体薄膜が形成可能である。
As described above, according to the present invention, S
A semiconductor device having a semiconductor thin film formed on an rTiO 3 substrate is irradiated with light having an energy in the range of 3 eV to 5 eV.
By irradiating at a temperature lower than 50 K, photoconduction is caused, and the electrical connection between the semiconductor thin film and the SrTiO 3 substrate becomes possible. Moreover, since this substrate can be grown epitaxially and is an oxide, its melting point is high and various oxide semiconductor thin films can be formed.

【図面の簡単な説明】[Brief description of drawings]

【図1】SrTiOについて、光電流と温度の関係を
示すグラフである。
FIG. 1 is a graph showing the relationship between photocurrent and temperature for SrTiO 3 .

【図2】SrTiOについて、照射する光の強度によ
る光電流と温度の関係を示すグラフである。
FIG. 2 is a graph showing the relationship between the photocurrent and the temperature of SrTiO 3 depending on the intensity of the irradiation light.

【図3】SrTiOについて、温度を変化させたとき
の光伝導スペクトルの変化を示すグラフである。
FIG. 3 is a graph showing changes in photoconductivity spectrum of SrTiO 3 when temperature is changed.

【図4】本発明に係る半導体装置を示す実施例につい
て、光電流と温度の関係を示すグラフである。
FIG. 4 is a graph showing a relationship between photocurrent and temperature in an example showing a semiconductor device according to the present invention.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 SrTiO基板上に半導体薄膜が形成
された系に3eVから5eVの範囲のエネルギーを有す
る光を150Kよりも低温で照射し、光伝導を生じさ
せ、半導体薄膜とSrTiO基板との間に電気的接続
を可能としたことを特徴とする半導体装置。
1. A system in which a semiconductor thin film is formed on a SrTiO 3 substrate is irradiated with light having an energy in the range of 3 eV to 5 eV at a temperature lower than 150 K to cause photoconduction, and the semiconductor thin film and the SrTiO 3 substrate are formed. A semiconductor device characterized in that an electrical connection between the two is possible.
【請求項2】 半導体薄膜が酸化物である請求項1記載
の半導体装置。
2. The semiconductor device according to claim 1, wherein the semiconductor thin film is an oxide.
【請求項3】 酸化物半導体薄膜が少なくともCu,T
i,Zn,Sn,Inのいずれか1つの金属を含んでい
る請求項2記載の半導体装置。
3. The oxide semiconductor thin film is at least Cu, T
3. The semiconductor device according to claim 2, containing any one metal of i, Zn, Sn, and In.
JP4081348A 1992-02-18 1992-02-18 Semiconductor device Pending JPH05235382A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4081348A JPH05235382A (en) 1992-02-18 1992-02-18 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4081348A JPH05235382A (en) 1992-02-18 1992-02-18 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH05235382A true JPH05235382A (en) 1993-09-10

Family

ID=13743867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4081348A Pending JPH05235382A (en) 1992-02-18 1992-02-18 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH05235382A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110828609A (en) * 2019-11-01 2020-02-21 苏州科技大学 A kind of self-excited storable photoconductive device and preparation method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110828609A (en) * 2019-11-01 2020-02-21 苏州科技大学 A kind of self-excited storable photoconductive device and preparation method thereof
CN110828609B (en) * 2019-11-01 2021-08-27 苏州科技大学 Self-excitation storable photoconductive device and preparation method thereof

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