JPH0520991Y2 - - Google Patents
Info
- Publication number
- JPH0520991Y2 JPH0520991Y2 JP1987142165U JP14216587U JPH0520991Y2 JP H0520991 Y2 JPH0520991 Y2 JP H0520991Y2 JP 1987142165 U JP1987142165 U JP 1987142165U JP 14216587 U JP14216587 U JP 14216587U JP H0520991 Y2 JPH0520991 Y2 JP H0520991Y2
- Authority
- JP
- Japan
- Prior art keywords
- solar radiation
- radiation state
- semiconductor position
- circuit
- position detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
【考案の詳細な説明】
(産業上の利用分野)
本考案は、日射状態に応じて車両室内の空調を
調節するための日射状態検出装置に関する。[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to a solar radiation state detection device for adjusting air conditioning in a vehicle interior according to the solar radiation state.
(従来の技術)
従来、車両室内に入射する日射状態を検出する
ために、複数の受光素子および遮光部を1つの基
台に載置した日射検出器が実公昭58−37694に提
案されている。(Prior art) Conventionally, in order to detect the state of solar radiation entering a vehicle interior, a solar radiation detector in which a plurality of light receiving elements and a light shielding part are mounted on one base was proposed in Publication of Utility Model Publication No. 58-37694. .
(考案が解決しようとする問題点)
しかし、複数個の受光素子を使用することによ
り、受光素子の特性のバラツキのため日射状態を
精度よく検出することが困難で、また複数個の受
光素子を使用するため日射検出器を構成する部品
点数が多くなり、形状も大きくなるなどの問題点
がある。(Problem that the invention aims to solve) However, by using multiple light receiving elements, it is difficult to accurately detect the solar radiation state due to variations in the characteristics of the light receiving elements. There are problems such as the number of parts that make up the solar radiation detector increases and the size of the solar radiation detector increases.
(問題点を解決する為の手段)
本考案は、前記問題点を解決した日射状態検出
装置を提供する目的でなされ、そのために下記技
術手段を採用する。すなわち、車両のインストー
ルメントパネルに組付けられた日射状態検出器
と、該日射状態検出器で検出された信号を入力し
て日射状態を演算する演算手段とにより成る日射
状態検出装置において、前記日射状態検出器は少
なくとも頭部が減光材料で形成され、前記頭部の
内面に直径方向突壁を形成した円筒台状ケース
と、前記円筒台状ケース内側に嵌合可能な1つの
半導体位置検出素子を固着した基台とより構成し
たことを特徴とし、日射状態検出器に組込まれる
半導体位置検出素子は1つで日射量および日射方
向を同時に検出する。(Means for Solving the Problems) The present invention has been made for the purpose of providing a solar radiation state detection device that solves the above problems, and for this purpose, the following technical means are adopted. That is, in a solar radiation state detection device comprising a solar radiation state detector assembled to an installation panel of a vehicle and a calculation means for calculating a solar radiation state by inputting a signal detected by the solar radiation state detector, The state detector includes a cylindrical table-shaped case in which at least a head part is formed of a light-attenuating material, and a diametrically protruding wall is formed on the inner surface of the head part, and one semiconductor position detector that can be fitted inside the cylindrical table-shaped case. It is characterized by being composed of a base to which an element is fixed, and a single semiconductor position detection element incorporated in the solar radiation state detector simultaneously detects the amount of solar radiation and the direction of solar radiation.
(作用)
日射状態検出器を構成している突壁は1つの半
導体位置検出素子表面を複数に区分し日射状態に
より突壁は前記の複数に区分された半導体位置検
出素子表面に減光域あるいは遮光域を形成し、前
記複数に区分された半導体位置検出素子表面の日
射の照射表面の大きさに応じた光電流を発生し、
その光電流を増幅、演算し日射方向出力信号およ
び日射量出力信号として各々出力する。(Function) The protruding wall constituting the solar radiation state detector divides the surface of one semiconductor position detecting element into a plurality of parts, and depending on the solar radiation state, the protruding wall divides the surface of the semiconductor position detecting element divided into the plurality of parts into a dimming area or forming a light shielding area and generating a photocurrent according to the size of the solar radiation irradiation surface of the semiconductor position detection element surface divided into the plurality;
The photocurrent is amplified, calculated, and output as a solar radiation direction output signal and a solar radiation amount output signal, respectively.
(実施例の構成およびその作用)
図中同一構成要素には同一符号を付して、重複
する説明を省略する。第1図乃至第3図は本考案
に一次元半導体位置検出素子を適用した一実施例
を示すもので、車両室内のインストルーメントパ
ネル6には、日射状態検出器7aが組付けられて
おり日射状態検出器7aは頭部8aが減光材料で
形成され、頭部8aの内面には、直角方向に日射
を減光するための直径方向突壁9を形成した円筒
台状ケース10a内に、半導体位置検出素子1a
を上面に固着した円筒台状基台11aを組み込む
ように構成されている。半導体位置検出素子1a
よりのリード線12a,12b,12cがインス
トルーメントパネル6の内部方向に延伸されてい
る。(Configuration of the embodiment and its operation) Identical components in the drawings are denoted by the same reference numerals, and redundant explanation will be omitted. Figures 1 to 3 show an embodiment in which a one-dimensional semiconductor position detection element is applied to the present invention. The state detector 7a has a head 8a made of a light-attenuating material, and is housed in a cylindrical table-shaped case 10a in which a diametrically protruding wall 9 is formed on the inner surface of the head 8a to attenuate solar radiation in the right angle direction. Semiconductor position detection element 1a
It is configured to incorporate a cylindrical table-like base 11a having a cylindrical base 11a fixed to the upper surface. Semiconductor position detection element 1a
Stranded lead wires 12a, 12b, and 12c extend toward the inside of the instrument panel 6.
このように構成された日射状態検出器7aに、
第4図に示すように日射2があたる場合、頭部8
aの直角方向突壁9が減光作用を行い、基台11
aに固着されている半導体位置検出素子1aの上
面に減光域13を生じさせる。従つて頭部8aの
直角方向突壁9を中心として、半導体位置検出素
子1aの右方向の受光量が減少し、半導体位置検
出素子1aよりの出力信号として、リード線12
a,12bよりの光電流をそれぞれiA,iBととす
るとiA>iBとなる。尚、直径方向突壁9を遮光材
料で形成し、減光域のかわりに遮光域を生じさせ
てもよい。 In the solar radiation state detector 7a configured in this way,
When sunlight 2 hits the head as shown in Figure 4, the head 8
The orthogonal projecting wall 9 of a performs a light reduction effect, and the base 11
A light attenuation area 13 is produced on the upper surface of the semiconductor position detection element 1a fixed to the semiconductor position detection element 1a. Therefore, the amount of light received in the right direction of the semiconductor position detecting element 1a decreases, centering on the perpendicular projecting wall 9 of the head 8a, and the lead wire 12
Let i A and i B be the photocurrents from a and 12b, respectively, then i A > i B. Note that the diametrically protruding wall 9 may be formed of a light-blocking material to create a light-blocking area instead of the light-attenuating area.
第5図は本考案の日射状態検出装置の回路説明
図で日射状態検出器7aよりの信号電流iA,iBは
それぞれ増幅器14,15に入力され、それぞれ
の出力電流IA,IBは加算回路16に入力される。
同時に、増幅器14,15の出力電流IA,IBは減
算回路17に入力される。加算回路16よりの出
力は除算回路18および加算回路19に入力さ
れ、除算回路18には減算回路17からの出力も
入力されるようになつている。除算回路18にて
加算回路16と減算回路17の各々の出力の比に
定数k1を乗じ、日射方向出力信号として20より
出力され、加算回路19にて加算回路16の出力
に定数k2を乗じ、日射量出力信号として21より
出力される。 FIG. 5 is a circuit diagram of the solar radiation state detection device of the present invention. The signal currents i A and i B from the solar radiation state detector 7a are input to amplifiers 14 and 15, respectively, and the respective output currents I A and I B are It is input to the adder circuit 16.
At the same time, the output currents I A and I B of the amplifiers 14 and 15 are input to the subtraction circuit 17 . The output from the adder circuit 16 is input to a divider circuit 18 and an adder circuit 19, and the output from the subtracter circuit 17 is also input to the divider circuit 18. The division circuit 18 multiplies the ratio of the respective outputs of the addition circuit 16 and the subtraction circuit 17 by a constant k 1 , which is output from 20 as a solar radiation direction output signal, and the addition circuit 19 multiplies the output of the addition circuit 16 by a constant k 2 . The product is multiplied and outputted from 21 as a solar radiation output signal.
次に作用について説明する。 Next, the effect will be explained.
以上の構成において、例えば、第4図に示す如
く、1つの半導体位置検出素子1aにより構成さ
れている日射状態検出器に日射2が左方向より照
射した場合、直径方向突壁9を中心として左右に
2区分されている半導体位置検出素子1aの左側
表面には全ての表面に日射が照射され、右側表面
には直径方向突壁9により生ずる減光域13部分
を差し引いた表面にのみ日射が照射され、左側と
右側表面では左側の方が日射の照射表面は大きく
なり、従つて発生する光電流も右側よりも左側の
方が大きくなる。これらの光電流を第5図に示す
増幅器にて増幅し、演算回路にて加算して日射量
出力信号と、除算して日射方向出力信号を出力す
る。これら日射出力信号および日射方向出力信号
は図示していない空調制御部材に入力され日射状
態に応じた車室内空調を行う。 In the above configuration, for example, as shown in FIG. 4, when the solar radiation state detector composed of one semiconductor position detection element 1a is irradiated with solar radiation 2 from the left direction, The entire left side surface of the semiconductor position detection element 1a, which is divided into two sections, is irradiated with solar radiation, and the right side surface is irradiated with solar radiation only on the surface minus the attenuation area 13 caused by the diametrically protruding wall 9. Therefore, the surface irradiated by solar radiation is larger on the left side than on the right side, and the photocurrent generated is also larger on the left side than on the right side. These photocurrents are amplified by the amplifier shown in FIG. 5, added by an arithmetic circuit to output a solar radiation amount output signal, and divided to output a solar radiation direction output signal. These solar radiation output signals and solar radiation direction output signals are input to an air conditioning control member (not shown) to air condition the vehicle interior according to the solar radiation state.
第6図乃至第8図も同じく他の実施例で二次元
半導体位置検出素子を適用したもので、二次元半
導体位置検出器7bは、減光材料よりなる頭部8
bの内面に十字状突壁22を形成した円筒台状ケ
ース10b内に、1つの二次元半導体位置検出素
子1bを上面に固着した円筒台状基台11bが組
み込まれ、前記十字状突壁22により前記二次元
半導体位置検出素子1bの上表面面積が4等分さ
れるように構成され、二次元半導体位置検出素子
1bよりリード線23a,23b,23c,23
d,23eがインストルーメントパネル6の内部
方向に延伸されている。 6 to 8 also show other embodiments in which a two-dimensional semiconductor position detection element is applied, and the two-dimensional semiconductor position detector 7b has a head 8 made of a light-attenuating material.
A cylindrical platform base 11b having one two-dimensional semiconductor position detecting element 1b fixed to its upper surface is incorporated into a cylindrical platform case 10b having a cross-shaped projecting wall 22 formed on the inner surface of b. The upper surface area of the two-dimensional semiconductor position detecting element 1b is divided into four equal parts, and the lead wires 23a, 23b, 23c, 23 are connected to the two-dimensional semiconductor position detecting element 1b.
d and 23e extend toward the inside of the instrument panel 6.
第9図は模式的に図示した二次元半導体位置検
出器7bよりの信号電流iA,iB,iC,iDが各々増幅
器24,25,26,27により増幅され各々
IA,IB,IC,IDとして出力され、増幅器24,2
5よりの出力IA,IBは加算回路28および減算回
路30に入力される。増幅器26,27よりの出
力IC,IDは加算回路29および減算回路31に入
力される。加算回路28および減算回路30の出
力は除算回路32に入力され、両者の比に定数
K1を乗じ日射の左右方向出力信号として、35
より出力される。同様に加算回路29および減算
回路31の出力が除算回路33に入力され両者の
比に定数K2を乗じ日射の上下方向出力信号とし
て36より出力される。加算回路28および29
の出力は加算回路34に入力され定数K3を乗じ、
日射量出力信号として37より出力される。 FIG. 9 schematically shows signal currents i A , i B , i C , i D from the two-dimensional semiconductor position detector 7b each amplified by amplifiers 24 , 25 , 26 , and 27 .
It is output as I A , I B , I C , and I D , and the amplifiers 24 and 2
The outputs I A and I B from 5 are input to an adder circuit 28 and a subtracter circuit 30 . The outputs I C and ID from the amplifiers 26 and 27 are input to an addition circuit 29 and a subtraction circuit 31 . The outputs of the adder circuit 28 and the subtracter circuit 30 are input to the divider circuit 32, and the ratio between them is set as a constant.
Multiplied by K 1 and used as the horizontal output signal of solar radiation, 35
It is output from Similarly, the outputs of the adder circuit 29 and the subtracter circuit 31 are input to the divider circuit 33, the ratio of the two is multiplied by a constant K2 , and the resultant signal is output from 36 as an output signal in the vertical direction of solar radiation. Adder circuits 28 and 29
The output of is input to the adder circuit 34 and multiplied by a constant K3 ,
It is output from 37 as a solar radiation output signal.
本実施例の作用については、第5図の実施に同
様の除算回路を1つ加えたのみであるので、説明
を省略する。 Regarding the operation of this embodiment, since only one division circuit similar to the embodiment shown in FIG. 5 is added, a description thereof will be omitted.
(考案の効果)
以上説明したように、本考案に係る日射状態検
出装置は1つの半導体位置検出素子で構成してい
るため、半導体位置検出素子の製造上のバラツキ
に関係なく精度よく日射状態を検出することがで
き、部品点数が少ないため構造が簡単で、小型化
され、製造コストの低減にも貢献することができ
る。(Effect of the invention) As explained above, since the solar radiation state detection device according to the present invention is composed of one semiconductor position detection element, it can accurately detect the solar radiation state regardless of manufacturing variations in the semiconductor position detection element. Since the number of parts is small, the structure is simple and compact, and it can also contribute to reducing manufacturing costs.
第1図は本考案に一次元半導体位置検出素子を
適用した平面図、第2図は同じく縦断面図、第3
図は日射状態検出器の頭部8aの斜視図、第4図
は、第1図乃至第3図に示す、日射状態検出器に
おける減光あるいは遮光作用の説明図、第5図は
本考案に一次元半導体位置検出素子を適用した日
射状態検出装置の回路説明図、第6図は本考案に
二次元半導体位置検出素子を適用した日射状態検
出器の縦断面図、第7図は同じく平面図、第8図
は日射状態検出器の頭部8bの斜視図、第9図は
本考案に二次元半導体位置検出素子を適用した日
射状態検出装置の回路説明図。
1a……一次元半導体位置検出素子、1b……
二次元半導体位置検出素子、6……インストルー
メントパネル、7a,7b……日射状態検出器、
8a,8b……頭部、9……直径方向突壁、10
a,10b……円筒台状ケース、11a,11b
……基台、14,15,24,25,26,27
……増幅器、16,19,28,29,34……
加算回路、17,30,31……減算回路、1
8,32,33……除算回路、22……十字状突
壁。
Figure 1 is a plan view of a one-dimensional semiconductor position detection element applied to the present invention, Figure 2 is a longitudinal sectional view, and Figure 3 is a vertical cross-sectional view.
The figure is a perspective view of the head 8a of the solar radiation condition detector, FIG. 4 is an explanatory diagram of the light reduction or shading effect in the solar radiation condition detector shown in FIGS. 1 to 3, and FIG. 5 is a diagram according to the present invention. A circuit explanatory diagram of a solar radiation state detection device using a one-dimensional semiconductor position detection element, FIG. 6 is a vertical cross-sectional view of a solar radiation state detector using a two-dimensional semiconductor position detection element according to the present invention, and FIG. 7 is a plan view thereof. , FIG. 8 is a perspective view of the head 8b of the solar radiation state detector, and FIG. 9 is a circuit explanatory diagram of the solar radiation state detection device to which the two-dimensional semiconductor position detecting element is applied to the present invention. 1a...One-dimensional semiconductor position detection element, 1b...
Two-dimensional semiconductor position detection element, 6...Instrument panel, 7a, 7b...Solar radiation state detector,
8a, 8b... Head, 9... Diametrically projecting wall, 10
a, 10b... Cylindrical platform case, 11a, 11b
... Base, 14, 15, 24, 25, 26, 27
...Amplifier, 16, 19, 28, 29, 34...
Addition circuit, 17, 30, 31...Subtraction circuit, 1
8, 32, 33...Division circuit, 22...Cross-shaped projecting wall.
Claims (1)
た日射状態検出器と、該日射状態検出器で検出さ
れた信号を入力して日射状態を演算する演算手段
とにより成る日射状態検出装置において、前記日
射状態検出器は少なくとも頭部が減光材料で形成
され、前記頭部の内面に直径方向突壁を形成した
円筒台状ケースと、前記円筒台状ケース内側に嵌
合可能な1つの半導体位置検出素子を固着した基
台とより構成したことを特徴とする日射状態検出
装置。 In a solar radiation state detection device comprising a solar radiation state detector assembled to an installation panel of a vehicle and a calculation means for calculating a solar radiation state by inputting a signal detected by the solar radiation state detector, the solar radiation state detection The device includes a cylindrical table-like case in which at least a head part is formed of a light-attenuating material and a diametrically protruding wall is formed on the inner surface of the head part, and one semiconductor position detection element that can be fitted inside the cylindrical table-like case. A solar radiation state detection device characterized by comprising a fixed base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987142165U JPH0520991Y2 (en) | 1987-09-17 | 1987-09-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987142165U JPH0520991Y2 (en) | 1987-09-17 | 1987-09-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6446722U JPS6446722U (en) | 1989-03-22 |
| JPH0520991Y2 true JPH0520991Y2 (en) | 1993-05-31 |
Family
ID=31407882
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987142165U Expired - Lifetime JPH0520991Y2 (en) | 1987-09-17 | 1987-09-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0520991Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5491131B2 (en) * | 2008-11-12 | 2014-05-14 | 株式会社半導体エネルギー研究所 | Photoelectric conversion device |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4309605A (en) * | 1979-10-02 | 1982-01-05 | New Japan Radio Co., Ltd. | Photo-reflective sensor |
| JPS5837694U (en) * | 1981-09-07 | 1983-03-11 | 東芝セラミツクス株式会社 | graphite heater |
| JPS6169170A (en) * | 1984-09-12 | 1986-04-09 | Sharp Corp | semiconductor equipment |
| FR2586792B1 (en) * | 1985-09-03 | 1989-06-16 | Snecma | CONNECTION DEVICE BETWEEN A BURNER RING OR FLAME HANGER OF COMPOSITE MATERIAL AND A POST-COMBUSTION CHAMBER CHANNEL OF A TURBOREACTOR |
| JPS6273108A (en) * | 1985-09-27 | 1987-04-03 | Nissan Motor Co Ltd | Sunshine-state detector for vehicle |
| JPS62202566A (en) * | 1986-02-28 | 1987-09-07 | Canon Inc | Semiconductor photo detecting device |
-
1987
- 1987-09-17 JP JP1987142165U patent/JPH0520991Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6446722U (en) | 1989-03-22 |
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