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JPH05198405A - Barium titanate based semiconductor porcelain composition - Google Patents

Barium titanate based semiconductor porcelain composition

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Publication number
JPH05198405A
JPH05198405A JP4031611A JP3161192A JPH05198405A JP H05198405 A JPH05198405 A JP H05198405A JP 4031611 A JP4031611 A JP 4031611A JP 3161192 A JP3161192 A JP 3161192A JP H05198405 A JPH05198405 A JP H05198405A
Authority
JP
Japan
Prior art keywords
temperature
barium titanate
based semiconductor
resistance
crystal structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4031611A
Other languages
Japanese (ja)
Other versions
JP3166787B2 (en
Inventor
Yasunori Namikawa
康訓 並河
Norimitsu Kito
範光 鬼頭
Yoshiaki Abe
吉晶 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP03161192A priority Critical patent/JP3166787B2/en
Publication of JPH05198405A publication Critical patent/JPH05198405A/en
Application granted granted Critical
Publication of JP3166787B2 publication Critical patent/JP3166787B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Thermistors And Varistors (AREA)

Abstract

PURPOSE:To facilitate the mathematical expression of resistance-temperature characteristics and facilitate logical, accurate and effective design of a circuit employing a positive temperature coefficient characteristics thermistor. CONSTITUTION:Flat or positive resistance-temperature characteristics are provided in a temperature range in which a crystal structure is of a tetragonal system. Further, positive resistance-temperature characteristics are provided in a temperature range in which a crystal structure is of a cubic system. The composition is expressed by a general formula: (Ba1-v-wSrvMEw)TiO3+yMn+ zSiO2, wherein Me denotes at least one element selected among rare-earth elements such as Y, La and Ce and a group of Nb, Bi, Sb, W, Th and Ta, (v), (w) and (z) are in ranges v=0.01-0.4, w=0.0003-0.003 and z=0.001-0.04 respectively and, further, the ratio of (y) to (w) is in a range of 0.3<=y/w<=4.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、半導体磁器組成物に
関し、詳しくは、正の抵抗温度特性を有するチタン酸バ
リウム(BaTiO3)系半導体磁器組成物に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor ceramic composition, and more particularly to a barium titanate (BaTiO 3 ) based semiconductor ceramic composition having a positive resistance temperature characteristic.

【0002】[0002]

【従来の技術】近年、大きな正の抵抗温度特性を有する
チタン酸バリウム(BaTiO3)系半導体磁器組成物
が開発されている。このチタン酸バリウム系半導体磁器
組成物は、キュリー温度を越えると抵抗値が急激に増大
して、通過する電流量を減少させることから、回路の過
電流保護用や、テレビ受像機のブラウン管枠の消磁用な
ど種々の用途に広く用いられている。
2. Description of the Related Art In recent years, barium titanate (BaTiO 3 ) based semiconductor porcelain compositions having a large positive resistance temperature characteristic have been developed. This barium titanate-based semiconductor porcelain composition has a resistance value that sharply increases when the Curie temperature is exceeded, and reduces the amount of current passing therethrough. Therefore, it is used for circuit overcurrent protection and for the CRT frame of a television receiver. Widely used for various purposes such as degaussing.

【0003】[0003]

【発明が解決しようとする課題】しかし、従来のチタン
酸バリウム系半導体磁器組成物は、結晶構造が立方晶系
である温度範囲においては正の抵抗温度特性を有してい
るが、それより低温側の、結晶構造が正方晶系である温
度範囲においては負の抵抗温度特性を有している。した
がって、正方晶系の温度範囲から立方晶系の温度範囲に
かけての全温度範囲にわたって抵抗温度特性を数式化す
ることが極めて困難であり、例えば、チタン酸バリウム
系半導体磁器組成物からなる正特性サーミスタを用いた
回路の設計を理論的に正確かつ効率よく行うことができ
ず、その用途が制約されるという問題点がある。
However, the conventional barium titanate-based semiconductor ceramic composition has a positive resistance temperature characteristic in the temperature range in which the crystal structure is cubic, but at a temperature lower than that. On the other hand, it has a negative resistance temperature characteristic in the temperature range where the crystal structure is tetragonal. Therefore, it is extremely difficult to formulate the resistance temperature characteristics over the entire temperature range from the tetragonal temperature range to the cubic temperature range, and for example, a positive temperature coefficient thermistor made of a barium titanate-based semiconductor ceramic composition is used. There is a problem in that a circuit design using is not theoretically accurate and efficient and its application is restricted.

【0004】この発明は、上記問題点を解決するもので
あり、結晶構造が正方晶系の温度範囲においてもフラッ
トまたは正の抵抗温度特性を有するチタン酸バリウム系
半導体磁器組成物を提供することを目的とする。
The present invention solves the above problems and provides a barium titanate-based semiconductor ceramic composition having a flat or positive resistance temperature characteristic even in a tetragonal temperature range. To aim.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
に、この発明のチタン酸バリウム系半導体磁器組成物
は、結晶構造が正方晶系である温度範囲においてはフラ
ットまたは正の抵抗温度特性を有し、かつ、結晶構造が
立方晶系である温度範囲においては正の抵抗温度特性を
有することを特徴とする。
In order to achieve the above object, the barium titanate-based semiconductor ceramic composition of the present invention has a flat or positive resistance temperature characteristic in a temperature range in which the crystal structure is tetragonal. And has a positive resistance temperature characteristic in the temperature range in which the crystal structure is a cubic system.

【0006】また、この発明のチタン酸バリウム系半導
体磁器組成物は、一般式: (Ba1-V-WSrVMeW)TiO3+yMn+zSiO2 (但し、MeはY,La,Ceなどの希土類元素、N
b、Bi、Sb、W、Th及びTaからなる群から選ば
れる少なくとも1種)で表され、v,w,zがそれぞ
れ、 v=0.01〜0.4 w=0.0003〜0.003 z=0.001〜0.04 の範囲にあり、かつ、wに対するyの比が 0.3 ≦ y/w ≦ 4 の範囲にあることを特徴とする。
The barium titanate-based semiconductor ceramic composition of the present invention has the general formula: (Ba 1 -VW Sr V Me W ) TiO 3 + yMn + zSiO 2 (where Me is a rare earth element such as Y, La or Ce, N
b, Bi, Sb, W, Th, and at least one selected from the group consisting of Ta), and v, w, and z are respectively v = 0.01 to 0.4 w = 0.0003 to 0. 003 z is in the range of 0.001 to 0.04, and the ratio of y to w is in the range of 0.3 ≤ y / w ≤ 4.

【0007】[0007]

【実施例】以下に、この発明の実施例を比較例とともに
示して発明の特徴をさらに詳細に説明する。
EXAMPLES The features of the present invention will be described in more detail below by showing Examples of the present invention together with Comparative Examples.

【0008】(実施例1) 一般式:(Ba0.88-WSr0.12MeW)TiO3+0.001Mn+0.02SiO2 で表されるチタン酸バリウム系半導体磁器組成物を製造
し、その抵抗温度特性を調べた。
Example 1 A barium titanate-based semiconductor porcelain composition represented by the general formula: (Ba 0.88-W Sr 0.12 Me W ) TiO 3 + 0.001Mn + 0.02SiO 2 was prepared, and its resistance temperature characteristic was measured. Examined.

【0009】ここで、MeはLa、Ce、Pr、Nd、
Sm、Cd、Ho、Dy、Y、Erの少なくとも1種で
ある。
Here, Me is La, Ce, Pr, Nd,
It is at least one of Sm, Cd, Ho, Dy, Y, and Er.

【0010】上記のチタン酸バリウム系半導体磁器組成
物を製造するにあたっては、まず、原料のBaCO3
SrCO3、La23、Ce23、Pr23、Nd
23、Sm 2O3、Cd23、HoO、Dy23、Y
23、Er23、TiO2、MnCO3、SiO2を、表
1の組成になるように所定の割合で配合する。
The above barium titanate-based semiconductor ceramic composition
When manufacturing a product, first, the raw material BaCO3,
SrCO3, La2O3, Ce2O3, Pr2O3, Nd
2O3, Sm 2 O3, Cd2O3, HoO, Dy2O3, Y
2O3, Er2O3, TiO2, MnCO3, SiO2The table
It is mixed at a predetermined ratio so that the composition becomes 1.

【0011】次いで、この配合原料をポットミルで5時
間湿式混合し、脱水、乾燥した後1150℃で2時間仮
焼する。それから、得られた仮焼原料を粉砕し、バイン
ダである酢酸ビニルと混合し、造粒後、乾式プレスで長
辺12mm、短辺7mm、厚さ4mmの角板に成型して試料を
作成した。そして、この試料を空気雰囲気中において1
300〜1370℃の温度条件下に焼成して半導体磁器
(チタン酸バリウム系半導体磁器)を得た。
Next, the mixed raw materials are wet mixed in a pot mill for 5 hours, dehydrated and dried, and then calcined at 1150 ° C. for 2 hours. Then, the obtained calcined raw material was pulverized, mixed with vinyl acetate as a binder, granulated, and then molded with a dry press into a square plate having a long side of 12 mm, a short side of 7 mm and a thickness of 4 mm to prepare a sample. .. Then, this sample is subjected to 1 in an air atmosphere.
A semiconductor porcelain (barium titanate-based semiconductor porcelain) was obtained by firing under a temperature condition of 300 to 1370 ° C.

【0012】それから、得られた半導体磁器の両面にI
n−Ga合金を塗布して電極を形成し、常温における比
抵抗(ρ)、抵抗温度係数を測定した。その結果を表1
に示す。
Then, on both sides of the obtained semiconductor porcelain, I
An n-Ga alloy was applied to form an electrode, and the specific resistance (ρ) and the temperature coefficient of resistance at room temperature were measured. The results are shown in Table 1.
Shown in.

【0013】[0013]

【表1】 [Table 1]

【0014】なお、表1の抵抗温度係数は、以下に説明
する方法により求めた。
The temperature coefficient of resistance in Table 1 was determined by the method described below.

【0015】図1は、この発明の実施例にかかるチタン
酸バリウム系半導体磁器(組成物)の抵抗温度特性の一
例を示す線図である。このような特性を有するチタン酸
バリウム系半導体磁器において、図1のa領域(結晶構
造が正方晶系の温度範囲)の抵抗温度係数をA(%/
℃)、b領域(結晶構造が立方晶系の温度範囲)の抵抗
温度係数をB(%/℃)とし、このA,Bを、次の式 A,B={(2.303×logR2/R1)/(T2−T1)}×100 (%/℃) (但し、T1<T2) T1:a領域内の任意の温度 T2:b領域内の任意の温度 R1:T1における抵抗値 R2:T2における抵抗値 により求めた。
FIG. 1 is a diagram showing an example of resistance temperature characteristics of a barium titanate-based semiconductor ceramic (composition) according to an embodiment of the present invention. In the barium titanate-based semiconductor ceramic having such characteristics, the temperature coefficient of resistance in the region a (the temperature range of the tetragonal crystal structure) of FIG. 1 is A (% /
° C.), b region (crystal structure is a resistance temperature coefficient of the temperature range) of cubic and B (% / ° C.), the A, a B, the following formula A, B = {(2.303 × logR 2 / R 1 ) / (T 2 −T 1 )} × 100 (% / ° C.) (where T 1 <T 2 ) T 1 : arbitrary temperature in a region T 2 : arbitrary temperature in b region R 1 : Resistance value at T 1 R 2 : Resistance value at T 2

【0016】ここで、A,Bの値が、 A,B>0のとき、抵抗温度特性が正特性 A,B=0のとき、抵抗温度特性がフラットな特性 A,B<0のとき、抵抗温度特性が負特性 であることを示す。Here, when the values of A and B are A and B> 0, the resistance temperature characteristic is a positive characteristic, and when A and B = 0, the resistance temperature characteristic is a flat characteristic. When A and B <0, It shows that the resistance temperature characteristic is a negative characteristic.

【0017】なお、表1において、試料番号に*を付し
たものは、この発明の範囲外の組成の比較例であり、そ
の他はこの発明の範囲内の実施例である。
In Table 1, the sample numbers marked with * are comparative examples of compositions outside the scope of the present invention, and the others are examples within the scope of the present invention.

【0018】表1に示すように、この発明の範囲外の比
較例では、A<0となっており、抵抗温度特性が負特性
であるのに対して、この発明の実施例にかかるチタン酸
バリウム系半導体磁器では、Meの全種類についてA≧
0となっており、結晶構造が正方晶系の温度範囲におい
て、フラットまたは正の抵抗温度特性を有するチタン酸
バリウム系半導体磁器が得られていることがわかる。
As shown in Table 1, in the comparative examples outside the range of the present invention, A <0 and the resistance temperature characteristic is a negative characteristic, whereas the titanic acid according to the example of the present invention is In barium-based semiconductor porcelain, A ≧ A for all types of Me.
It is 0, which means that a barium titanate-based semiconductor ceramic having a flat or positive resistance-temperature characteristic is obtained in a tetragonal temperature range.

【0019】(実施例2) 一般式:(Ba0.88-WSr0.12MeW)TiO3+yMn+0.02SiO2 で表されるチタン酸バリウム系半導体磁器組成物を、上
記実施例1の場合と同様の条件で製造し、MeとMnの
含有比率などの影響を調べた。
Example 2 A barium titanate-based semiconductor ceramic composition represented by the general formula: (Ba 0.88-W Sr 0.12 Me W ) TiO 3 + yMn + 0.02SiO 2 was used in the same manner as in Example 1 above. It was manufactured under the conditions, and the influence of the content ratio of Me and Mn was examined.

【0020】表2に、この実施例の半導体磁器について
調べたMe、Mnの含有比率、常温における比抵抗
(ρ)、抵抗温度係数の関係を示す。
Table 2 shows the relationships among the content ratios of Me and Mn, the specific resistance (ρ) at room temperature, and the temperature coefficient of resistance investigated for the semiconductor ceramics of this example.

【0021】[0021]

【表2】 [Table 2]

【0022】なお、表2において、試料番号に*を付し
たものは、この発明の範囲外の組成の比較例であり、そ
の他はこの発明の範囲内の実施例である。表2に示すよ
うに、この発明の範囲外の比較例では、A<0となって
おり、抵抗温度特性が負特性であるのに対して、この発
明の実施例にかかるチタン酸バリウム系半導体磁器にお
いては、表2に示すようなMeとMnの含有比率におい
てA≧0となっており、結晶構造が正方晶系の温度範囲
においてフラットまたは正の抵抗温度特性を有している
ことがわかる。
In Table 2, the sample numbers with * are comparative examples of compositions outside the scope of the present invention, and the others are examples within the scope of the present invention. As shown in Table 2, in the comparative examples outside the scope of the present invention, A <0, and the resistance temperature characteristic is a negative characteristic, whereas the barium titanate-based semiconductor according to the embodiment of the present invention. In the porcelain, the content ratio of Me and Mn as shown in Table 2 is A ≧ 0, and it is found that the crystal structure has a flat or positive resistance temperature characteristic in the tetragonal temperature range. ..

【0023】また、Sr、SiO2の含有量に関して
は、本願発明の範囲内で適宜含有率を調節することによ
り、抵抗温度特性をある程度制御することが可能であ
る。なお、図2は、Srの含有比率を変化させキュリー
点をシフトさせた2種類のチタン酸バリウム系半導体磁
器の抵抗温度特性を示しており、いずれも、結晶構造が
正方晶系の温度範囲で正の抵抗温度特性を有しているこ
とがわかる。
Regarding the contents of Sr and SiO 2 , it is possible to control the resistance temperature characteristic to some extent by appropriately adjusting the contents within the scope of the present invention. Note that FIG. 2 shows resistance-temperature characteristics of two types of barium titanate-based semiconductor ceramics in which the Sr content ratio is changed and the Curie point is shifted. In both cases, the crystal structure is in a tetragonal temperature range. It can be seen that it has a positive resistance temperature characteristic.

【0024】[0024]

【発明の効果】上述のように、この発明のチタン酸バリ
ウム系半導体磁器組成物は、結晶構造が正方晶系である
温度範囲においてフラットまたは正の抵抗温度特性を持
たせ、かつ、結晶構造が立方晶系である温度範囲におい
て正の抵抗温度特性を持たせるようにしているので、正
方晶系の温度範囲から立方晶系の温度範囲にかけての全
温度範囲にわたって抵抗温度特性を容易かつ正確に数式
化することが可能になり、正特性サーミスタなどを用い
た回路の設計を理論的に、正確かつ効率よく行うことが
できる。
As described above, the barium titanate-based semiconductor ceramic composition of the present invention has flat or positive resistance temperature characteristics in the temperature range in which the crystal structure is tetragonal, and the crystal structure is Since it has a positive resistance temperature characteristic in the cubic temperature range, the resistance temperature characteristic can be easily and accurately calculated over the entire temperature range from the tetragonal temperature range to the cubic temperature range. Therefore, it is possible to theoretically, accurately and efficiently design a circuit using a positive temperature coefficient thermistor or the like.

【0025】また、一般式:(Ba1-V-WSrVMeW
TiO3+yMn+zSiO2で表されるような組成にな
るように各成分を配合することにより、結晶構造が正方
晶系である温度範囲においてもフラットまたは正の抵抗
温度特性を有するチタン酸バリウム系半導体磁器組成物
を確実に得ることができる。
The general formula: (Ba 1-VW Sr V Me W )
A barium titanate-based semiconductor porcelain having flat or positive resistance temperature characteristics even in a temperature range in which the crystal structure is a tetragonal system by blending the respective components so as to have a composition represented by TiO 3 + yMn + zSiO 2. The composition can be reliably obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施例のチタン酸バリウム系半導体
磁器組成物の抵抗温度特性を示す線図である。
FIG. 1 is a diagram showing a resistance temperature characteristic of a barium titanate-based semiconductor ceramic composition according to an example of the present invention.

【図2】この発明の他の実施例のチタン酸バリウム系半
導体磁器組成物の抵抗温度特性を示す線図である。
FIG. 2 is a diagram showing a resistance temperature characteristic of a barium titanate-based semiconductor ceramic composition according to another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

a 結晶構造が正方晶系の温度範囲 b 結晶構造が立方晶系の温度範囲 a Temperature range of tetragonal crystal structure b Temperature range of cubic crystal structure

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 結晶構造が正方晶系である温度範囲にお
いてはフラットまたは正の抵抗温度特性を有し、かつ、
結晶構造が立方晶系である温度範囲においては正の抵抗
温度特性を有することを特徴とするチタン酸バリウム系
半導体磁器組成物。
1. A flat or positive resistance temperature characteristic in a temperature range in which a crystal structure is a tetragonal system, and
A barium titanate-based semiconductor porcelain composition having a positive resistance temperature characteristic in a temperature range in which a crystal structure is cubic.
【請求項2】 一般式: (Ba1-V-WSrVMeW)TiO3+yMn+zSiO2 (但し、MeはY,La,Ceなどの希土類元素、N
b、Bi、Sb、W、Th及びTaからなる群から選ば
れる少なくとも1種)で表され、 v,w,zがそれぞれ、 v=0.01〜0.4 w=0.0003〜0.003 z=0.001〜0.04 の範囲にあり、かつ、wに対するyの比が 0.3 ≦ y/w ≦ 4 の範囲にあることを特徴とする請求項1記載のチタン酸
バリウム系半導体磁器組成物。
2. A general formula: (Ba 1 -VW Sr V Me W ) TiO 3 + yMn + zSiO 2 (where Me is a rare earth element such as Y, La, or Ce, N
b, Bi, Sb, W, Th, and at least one selected from the group consisting of Ta), and v, w, and z are respectively v = 0.01 to 0.4 w = 0.0003 to 0. The barium titanate system according to claim 1, wherein z is in the range of 0.001 to 0.04, and the ratio of y to w is in the range of 0.3 ≤ y / w ≤ 4. Semiconductor porcelain composition.
JP03161192A 1992-01-21 1992-01-21 Barium titanate-based semiconductor porcelain composition Expired - Fee Related JP3166787B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03161192A JP3166787B2 (en) 1992-01-21 1992-01-21 Barium titanate-based semiconductor porcelain composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03161192A JP3166787B2 (en) 1992-01-21 1992-01-21 Barium titanate-based semiconductor porcelain composition

Publications (2)

Publication Number Publication Date
JPH05198405A true JPH05198405A (en) 1993-08-06
JP3166787B2 JP3166787B2 (en) 2001-05-14

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Country Status (1)

Country Link
JP (1) JP3166787B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
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JP2008193042A (en) * 2006-07-28 2008-08-21 Tdk Corp Multilayer thermistor and manufacturing method thereof
JP2010254536A (en) * 2009-04-28 2010-11-11 Nichicon Corp Positive thermistor porcelain composition

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6061463B2 (en) * 2011-08-08 2017-01-18 日東電工株式会社 Adhesive tape or sheet

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008193042A (en) * 2006-07-28 2008-08-21 Tdk Corp Multilayer thermistor and manufacturing method thereof
JP2010254536A (en) * 2009-04-28 2010-11-11 Nichicon Corp Positive thermistor porcelain composition

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