JPH0456170A - Manufacture of thin-film solar cell - Google Patents
Manufacture of thin-film solar cellInfo
- Publication number
- JPH0456170A JPH0456170A JP2163261A JP16326190A JPH0456170A JP H0456170 A JPH0456170 A JP H0456170A JP 2163261 A JP2163261 A JP 2163261A JP 16326190 A JP16326190 A JP 16326190A JP H0456170 A JPH0456170 A JP H0456170A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- plasma
- thin
- solar cell
- doped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/545—Microcrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
Landscapes
- Photovoltaic Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、非晶質シリコン(以下a −5iと略す)を
主材料として構成される薄膜太陽電池の製造方法に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for manufacturing a thin film solar cell mainly composed of amorphous silicon (hereinafter abbreviated as a-5i).
微結晶シリコンは、光吸収が少なく、かつ導電率がa−
3iや、非晶質シリコンカーバイド (a −5ic)
に比べて極めて小さいため、a −3i太陽電池の光入
射側の窓層として注目されている。Microcrystalline silicon has low light absorption and conductivity of a-
3i, amorphous silicon carbide (a-5ic)
Because it is extremely small compared to , it is attracting attention as a window layer on the light incident side of a-3i solar cells.
こうした太陽電池は、第2図に示すようにガラス等の透
光性絶縁基板1の上にSnO□等の透明導電材料とその
上にプラズマ耐性を高めるために被覆したZnO等とに
より透明電極2を形成し、次いで、まずSihを主ガス
、hを希釈ガス、BIH&をドーピングガスとしてのプ
ラズマCVD法でp形微結晶シリコン層3を形成する。As shown in FIG. 2, such a solar cell is made of a transparent conductive material such as SnO□ on a transparent insulating substrate 1 such as glass, and a transparent electrode 2 coated with ZnO or the like to increase plasma resistance. Next, a p-type microcrystalline silicon layer 3 is formed by a plasma CVD method using Sih as a main gas, h as a diluent gas, and BIH& as a doping gas.
つづいて5ineを主ガス、H8を希釈ガスとして1l
ia−5i層5を形成し、さらにSiH*を主ガス、h
を希釈ガス、−Pusをドーピングガスとしてn@a−
3i層6を形成し、最後に金属の裏面電極7を形成する
ことにより作製される0図に示した構造では、2層3と
1層5の間にノンドープ、あるいは微量のほう素ドーピ
ングをしたa−3iCからなるインターフェース層4が
形成されており、これにより主に開放電圧の向上がはか
られる。Next, use 5ine as main gas and H8 as diluent gas for 1l.
ia-5i layer 5 is formed, and SiH* is the main gas, h
n@a- with dilution gas and -Pus as doping gas.
In the structure shown in Fig. 0, which is fabricated by forming a 3i layer 6 and finally a metal back electrode 7, non-doping or a trace amount of boron doping is performed between the second layer 3 and the first layer 5. An interface layer 4 made of a-3iC is formed, which mainly improves the open circuit voltage.
高水素希釈、高放電パワーのプラズマCVD法で得られ
る、通常の微結晶シリコンを第2図に示す太陽電池の窓
層に適用した場合、十分な拡散電位を得るためにはかな
り膜厚を厚くしなければならなかった0例えば第3図に
、1層5000人のシングルセルの微結晶9層膜厚依存
性を示すが、十分な開放電圧(Voc)を得るためには
300Å以上の膜厚が必要になる。これは、高水素希釈
、高放電パワーのプラズマCVD法を行う際に、透明電
極2から微結晶p層3にかなり不純物が拡散するので、
9層3を厚く成膜しないと、良質のp層が形成されない
ことに基づくと思われる。このため、微結晶シリコンを
窓層に用いたセルは通常のa −3iCを窓層に用いた
セルに比べて、曲線因子(FF)は高いが、短絡電流(
Jse)が低く、その結果、a−5iCをp層に用いた
セルを同等以下の変換効率しか得られなかった。When ordinary microcrystalline silicon obtained by plasma CVD method with high hydrogen dilution and high discharge power is applied to the window layer of the solar cell shown in Figure 2, the film thickness must be considerably thick to obtain a sufficient diffusion potential. For example, Figure 3 shows the film thickness dependence of 9 microcrystalline layers in a single cell with 5,000 people per layer. is required. This is because impurities are considerably diffused from the transparent electrode 2 into the microcrystalline p layer 3 when performing plasma CVD with high hydrogen dilution and high discharge power.
This seems to be based on the fact that a good quality p layer cannot be formed unless the 9 layer 3 is formed thickly. For this reason, a cell using microcrystalline silicon for the window layer has a higher fill factor (FF) than a cell using ordinary a-3iC for the window layer, but the short-circuit current (
Jse) was low, and as a result, the conversion efficiency was lower than that of a cell using a-5iC in the p layer.
本発明の目的は、上記の問題を解決し、薄い微結晶p層
により十分な開放電圧が得られ、短絡電流の太きくする
ことのできる薄膜太陽電池の製造方法を提供することに
ある。An object of the present invention is to solve the above-mentioned problems and provide a method for manufacturing a thin film solar cell in which a sufficient open circuit voltage can be obtained with a thin microcrystalline p-layer and a short circuit current can be increased.
(!l111を解決するための手段〕
上記の目的を達成するために、本発明は、p1nil遣
を有し、a−5iからなる1層とその光入射側に存在し
て微結晶シリコンからなるp層の間にa−3iCからな
り、ノンドープあるいは微量のアクセプタをドーピング
したインターフェース層が介在する薄膜太陽電池の製造
方法において、透光性絶縁基板上に透明電極を介して微
結晶99379層を形成し、次いでそのp層の表面から
アクセプタをプラズマドーピングしたのちにインターフ
ェース層を積層するものとする。(Means for solving !l111) In order to achieve the above object, the present invention has a p1nil layer, and has one layer made of a-5i and a layer made of microcrystalline silicon on the light incident side of the layer. In a method for manufacturing a thin film solar cell in which an interface layer made of a-3iC is interposed between p-layers and is undoped or doped with a small amount of acceptor, a microcrystalline 99379 layer is formed on a transparent insulating substrate via a transparent electrode. Then, an acceptor is plasma-doped from the surface of the p-layer, and then an interface layer is laminated.
微結晶Sip層の表面からアクセプタをプラズマドーピ
ングし、その上にa−5iCインタ一フエース層を積層
すると、インターフェース層形成過程にアクセプタがイ
ンターフェース層に拡散して不純物のない良質のp層が
形成されるので、微結晶99379層が薄くてもi層と
の間に十分な拡散電位が得られる。When acceptors are plasma-doped from the surface of the microcrystalline SIP layer and an a-5iC interface layer is laminated on top of it, the acceptors diffuse into the interface layer during the interface layer formation process, forming a high-quality p-layer free of impurities. Therefore, even if the microcrystalline 99379 layer is thin, a sufficient diffusion potential can be obtained between it and the i-layer.
(実施例〕
第1図は本発明の一実施例の薄膜太陽電池を示し、第2
図と共通の部分には同一の符号を付している。この太陽
電池は次のようにして製造される。(Example) Figure 1 shows a thin film solar cell according to an example of the present invention.
Parts common to those in the figures are given the same reference numerals. This solar cell is manufactured as follows.
まずガラス基板lの上に5IIO!およびプラズマ耐性
を高めるためのZnOを蒸着して透明電極2とし、その
上に5ideを主ガス、H2を希釈ガス、Bz[l*を
ドーピングガスとしてのプラズマCVD法により微結晶
99379層3を100人の厚さに形成する。First, 5IIO on the glass substrate l! Then, ZnO was evaporated to increase plasma resistance to form a transparent electrode 2, and a microcrystalline 99379 layer 3 was deposited on the transparent electrode 2 at 100% by plasma CVD using 5ide as a main gas, H2 as a diluent gas, and Bz[l* as a doping gas. Form to the thickness of a person.
微結晶シリコン成膜時の水素希釈度(H] / (Si
H#〕は100〜200倍程度になっており、RFパワ
ーは通常のa−5t層形成の5〜10倍の大きさになっ
ている0次に、BJiをドーピングガス、hを希釈ガス
としてRF放電により、30秒〜10分のプラズマドー
ピングを行う、これによりプラズマドーピング層8が生
ずる。つづいて、高い■。。を得るために、SiHオ、
CLを主ガス、H2を希釈ガスとしてa〜SiCのイン
ターフェース層4を100人の厚さに形成する。さらに
、Sin+を主ガス、H2を希釈ガスとして1層5を5
000人、Sinオを主ガス、H2を希釈ガス、PH1
をドーピングガスとして0層6を150人の厚さにそれ
ぞれ形成し、最後にAgの裏面電極7を蒸着により形成
することにより太陽電池が作製される。Hydrogen dilution degree (H) / (Si
H#] is about 100 to 200 times higher, and the RF power is 5 to 10 times higher than that of normal a-5t layer formation. Plasma doping is performed by RF discharge for 30 seconds to 10 minutes, resulting in a plasma doped layer 8. Next, it's expensive ■. . In order to obtain
An interface layer 4 of a to SiC is formed to a thickness of 100 layers using CL as a main gas and H2 as a diluent gas. Furthermore, one layer 5 is 5
000 people, Sino as main gas, H2 as diluent gas, PH1
A solar cell is produced by forming the 0 layer 6 to a thickness of 150 mm using doping gas, and finally forming the back electrode 7 of Ag by vapor deposition.
この太陽電池のセル特性のプラズマドーピング時間依存
性を第4図に示す、この図から、微結晶シリコン膜3の
厚さが100人でも、30秒以上のプラズマドーピング
を行うことにより、十分高いVOCが得られ、それ以上
長時間のプラズマドープを行っても、特性が飽和してい
ることがわかっており、悪化することがない、このため
プラズマドーピング時間をある程度長くすることで、き
わめて均一な特性のセルを作ることが可能である。そこ
で、次にプラズマドープ時間を5分間として、微結晶9
9379層3の膜厚依存性を調べた。第5図に示す結果
から、微結晶シリコン膜厚5oÅ以上で十分なp層が形
成されていることがわかる。The plasma doping time dependence of the cell characteristics of this solar cell is shown in FIG. It is known that even if plasma doping is performed for a longer period of time, the characteristics are saturated and will not deteriorate. Therefore, by increasing the plasma doping time to a certain extent, extremely uniform characteristics can be obtained. It is possible to create cells of Therefore, next time, the plasma doping time was set to 5 minutes, and the microcrystal 9
The film thickness dependence of 9379 layer 3 was investigated. From the results shown in FIG. 5, it can be seen that a sufficient p layer is formed with a microcrystalline silicon film thickness of 50 Å or more.
微結晶シリコン膜厚を100Å以下にできるため、19
mA/−以上の高い短絡電流が得られ、かつ微結晶シリ
コンが低抵抗なため、曲線因子が0.76以上と大きい
、その結果、微結晶シリコン膜厚を50人および75人
としたときに、13%の変換効率が得られた。Since the microcrystalline silicon film thickness can be reduced to 100 Å or less,
A high short circuit current of mA/- or more can be obtained, and microcrystalline silicon has a low resistance, so the fill factor is as large as 0.76 or more.As a result, when the microcrystalline silicon film thickness is 50 and 75 people, , a conversion efficiency of 13% was obtained.
第6図のwA61に本発明の他の実施例によるセルのl
−V特性を示す。これは、第1図のp形微結晶シリコン
膜3の部分に70人の厚さの微結晶シリコンカーバイド
膜を適用したものである。微結晶シリコンカーバイドは
、StH*、Cutを主ガス、H2を希釈ガス、BAH
,をドーピングガスとして水素希釈度(H) / (S
iH*) = 200倍として形成した。この微結晶シ
リコンカーバイドは、光学吸収が微結晶シリコンの約1
72となっており、このため、19.7mAという高い
J!cを達成し、変換効率13.3%(Vac−0,8
9V、 J sc”’19.7−^/aJ、
FF=0.76)が得られた。なお、!i62に示すプ
ラズマドーピングを行わなかった場合のセルの効率は9
.0%(vo。In wA61 of FIG. 6, a cell l according to another embodiment of the present invention is shown.
-V characteristics. In this case, a microcrystalline silicon carbide film having a thickness of 70 mm is applied to the p-type microcrystalline silicon film 3 shown in FIG. Microcrystalline silicon carbide uses StH*, Cut as main gas, H2 as diluent gas, and BAH.
, as the doping gas and hydrogen dilution (H) / (S
iH*) = 200 times. The optical absorption of this microcrystalline silicon carbide is about 1 that of microcrystalline silicon.
72, which results in a high J! of 19.7mA. c and conversion efficiency of 13.3% (Vac-0,8
9V, J sc"'19.7-^/aJ,
FF=0.76) was obtained. In addition,! The efficiency of the cell without plasma doping shown in i62 is 9
.. 0% (vo.
”0.75V、 Jsc=18.4mA/d、 FF−
0,65)であった。"0.75V, Jsc=18.4mA/d, FF-
0.65).
本発明によれば、pin構造の窓層としてa−SiCの
インターフェース層をはさんで存在する微結晶2937
9層の形成後、アクセプタのプラズマドーピングを行い
、その上に積層されるインターフェース層に良質のp層
が形成されるようにすることにより、微結晶シリコン層
を厚くしなくても透明電極からの不純物の影響を避ける
ことができた。この結果、開放電圧の十分な値が得られ
、微結晶29379層が薄いことにより短絡電流が高く
なり、曲線因子が高いこととあわせて、高い変換効率か
えられる。しかも、プラズマドーピングの時間は長くで
きるので均一な特性のセルを作ることも容易である。従
って、電力用途の大面積a−5t太陽電池の製造方法と
してきわめて有効である。According to the present invention, microcrystals 2937 exist as a window layer of a pin structure with an a-SiC interface layer sandwiched therebetween.
After the formation of the 9 layers, acceptor plasma doping is performed to form a high-quality p-layer in the interface layer stacked on top of the acceptor. The influence of impurities could be avoided. As a result, a sufficient open circuit voltage is obtained, and the short circuit current is increased due to the thinness of the microcrystalline 29379 layer, and together with the high fill factor, a high conversion efficiency is achieved. Furthermore, since the plasma doping time can be extended, it is easy to produce cells with uniform characteristics. Therefore, it is extremely effective as a method for manufacturing large area A-5T solar cells for power use.
第1図は本発明の一実施例による薄膜太陽電池の断面図
、第2図:は従来法による薄膜太陽電池の断面図、第3
図は従来法による薄膜太陽電池の特性と微結晶シリコン
層膜厚との関係線図、第4図。
第5図はそれぞれ本発明の一実施例による薄膜太陽電池
の特性とプラズマドープ時間および微結晶シリコン層膜
厚との関係線図、第6図は本発明の他の実施例および従
来法による薄膜太陽電池の電流・電圧特性線図である。
1ニガラス基板、2:透明電極、3二微結晶シリコンp
層、4:インターフェース層、5:1a−5i層、5
: n −a−3i層、7:裏面電極、8:プラズマド
ーピング層。
代遁人弁理士 山 口 星
第2図
う敦I品シリュンp4!10(人)
η般壕台晶シリコンPJ葵S(入り
第5図
1′ラス、7I−
)′8身間(分)
第6図FIG. 1 is a cross-sectional view of a thin-film solar cell according to an embodiment of the present invention, FIG. 2 is a cross-sectional view of a thin-film solar cell according to a conventional method, and FIG.
Figure 4 is a diagram showing the relationship between the characteristics of a thin-film solar cell and the thickness of a microcrystalline silicon layer according to a conventional method. FIG. 5 is a diagram showing the relationship between the characteristics of a thin film solar cell according to an embodiment of the present invention, plasma doping time, and the thickness of a microcrystalline silicon layer, and FIG. It is a current/voltage characteristic diagram of a solar cell. 1: glass substrate, 2: transparent electrode, 3: two microcrystalline silicon p
Layer, 4: Interface layer, 5: 1a-5i layer, 5
: n-a-3i layer, 7: Back electrode, 8: Plasma doped layer. Daiton Patent Attorney Yamaguchi Hoshi 2nd figure Atsushi I product Shiryun p4! 10 (persons) Figure 6
Claims (1)
光入射側に存在して微結晶シリコンからなるp層の間に
非晶質シリコンカーバイドからなり、ノンドープあるい
は微量のアクセプタをドーピングしたインターフェース
層が介在する薄膜太陽電池の製造方法において、透光性
絶縁基板上に透明電極を介して微結晶シリコンp層を形
成し、次いでそのp層の表面からアクセプタをドーピン
グしたのちにインターフェース層を積層することを特徴
とする薄膜太陽電池の製造方法。1) It has a pin structure and is made of amorphous silicon carbide and is non-doped or doped with a trace amount of acceptor, existing on the light incident side of the i-layer made of amorphous silicon and between the p-layer made of microcrystalline silicon. In a method for manufacturing a thin film solar cell with an intervening interface layer, a microcrystalline silicon p layer is formed on a transparent insulating substrate via a transparent electrode, an acceptor is doped from the surface of the p layer, and then an interface layer is formed. A method for manufacturing a thin film solar cell characterized by stacking layers.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2163261A JP2744680B2 (en) | 1990-06-21 | 1990-06-21 | Manufacturing method of thin film solar cell |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2163261A JP2744680B2 (en) | 1990-06-21 | 1990-06-21 | Manufacturing method of thin film solar cell |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0456170A true JPH0456170A (en) | 1992-02-24 |
| JP2744680B2 JP2744680B2 (en) | 1998-04-28 |
Family
ID=15770445
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2163261A Expired - Lifetime JP2744680B2 (en) | 1990-06-21 | 1990-06-21 | Manufacturing method of thin film solar cell |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2744680B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009001647A1 (en) * | 2007-06-25 | 2008-12-31 | Sharp Kabushiki Kaisha | Photoelectric converter, integrated photoelectric converter, and method for manufacturing photoelectric converter |
| WO2009037815A1 (en) * | 2007-09-21 | 2009-03-26 | Nissin Electric Co., Ltd. | Photovoltaic device and method for manufacturing the same |
| CN113451431A (en) * | 2021-07-06 | 2021-09-28 | 安徽华晟新能源科技有限公司 | Heterojunction solar cell and preparation method thereof |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589321A (en) * | 1981-07-08 | 1983-01-19 | Agency Of Ind Science & Technol | Manufacture of silicon thin-film |
| JPS62165374A (en) * | 1986-01-16 | 1987-07-21 | Sumitomo Electric Ind Ltd | Amorphous photovoltaic device |
| JPH01290267A (en) * | 1988-05-18 | 1989-11-22 | Fuji Electric Co Ltd | Manufacture of photoelectric conversion element |
| JPH02106076A (en) * | 1988-10-14 | 1990-04-18 | Fuji Electric Co Ltd | Thin film solar cell |
-
1990
- 1990-06-21 JP JP2163261A patent/JP2744680B2/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589321A (en) * | 1981-07-08 | 1983-01-19 | Agency Of Ind Science & Technol | Manufacture of silicon thin-film |
| JPS62165374A (en) * | 1986-01-16 | 1987-07-21 | Sumitomo Electric Ind Ltd | Amorphous photovoltaic device |
| JPH01290267A (en) * | 1988-05-18 | 1989-11-22 | Fuji Electric Co Ltd | Manufacture of photoelectric conversion element |
| JPH02106076A (en) * | 1988-10-14 | 1990-04-18 | Fuji Electric Co Ltd | Thin film solar cell |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009001647A1 (en) * | 2007-06-25 | 2008-12-31 | Sharp Kabushiki Kaisha | Photoelectric converter, integrated photoelectric converter, and method for manufacturing photoelectric converter |
| WO2009037815A1 (en) * | 2007-09-21 | 2009-03-26 | Nissin Electric Co., Ltd. | Photovoltaic device and method for manufacturing the same |
| CN113451431A (en) * | 2021-07-06 | 2021-09-28 | 安徽华晟新能源科技有限公司 | Heterojunction solar cell and preparation method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2744680B2 (en) | 1998-04-28 |
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