JPH04188848A - Semiconductor transport equipment - Google Patents
Semiconductor transport equipmentInfo
- Publication number
- JPH04188848A JPH04188848A JP2318910A JP31891090A JPH04188848A JP H04188848 A JPH04188848 A JP H04188848A JP 2318910 A JP2318910 A JP 2318910A JP 31891090 A JP31891090 A JP 31891090A JP H04188848 A JPH04188848 A JP H04188848A
- Authority
- JP
- Japan
- Prior art keywords
- adhesive tape
- semiconductor
- devices
- tape
- corners
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Dicing (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は各素子に分割された半導体素子を運ぶ搬送装
置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a transport device for transporting semiconductor elements divided into individual elements.
第3図〜第5図は従来のダイシングル搬送方法を示す断
面図であり、図において、(1)は半導体素子、(2)
は半導体素子(1)を固定する粘着テープ、(2a)は
粘着テープ(2)の粘着剤層、(2b)は粘着テープ(
2)のテープ基材、(3)は粘着テープ(2)を保持す
るフレームリング、(4)は半導体ウェハに切溝を入れ
るためのダイシング装置内のウェハチャックテーブル、
(5)は半導体ウェハに切溝を入れる回転刃(以下ブレ
ードと呼ぶ) 、 (6)はブレードによって形成され
た切溝、(7)はフレームリングを搬送するのに使われ
る吸着パッドである。FIGS. 3 to 5 are cross-sectional views showing the conventional die single conveyance method. In the figures, (1) is a semiconductor element, (2)
is an adhesive tape for fixing the semiconductor element (1), (2a) is an adhesive layer of the adhesive tape (2), and (2b) is an adhesive tape (
(2) is a tape base material; (3) is a frame ring that holds the adhesive tape (2); (4) is a wafer chuck table in a dicing device for making grooves in semiconductor wafers;
(5) is a rotary blade (hereinafter referred to as a blade) that cuts a groove in the semiconductor wafer, (6) is a groove formed by the blade, and (7) is a suction pad used to convey the frame ring.
次に動作について説明する。第3図に示すように、粘着
テープ(2)に固定された半導体ウェハはウェハチャッ
クテーブル(4)上に載せられ真空で吸着される。ブレ
ード(5)は粘着テープ(2)の粘着剤層(2a)まて
達する切込みで半導体素子(1)を完全切断(フルカッ
ト)する。Next, the operation will be explained. As shown in FIG. 3, the semiconductor wafer fixed to the adhesive tape (2) is placed on a wafer chuck table (4) and vacuum-adsorbed. The blade (5) completely cuts the semiconductor element (1) with a cut that reaches the adhesive layer (2a) of the adhesive tape (2).
第4図にフルカット完了した半導体素子部の断面拡大図
を示す。次にダイシングが完了した半導体素子(1)は
第5(a)図に示すようにフレームリング(3)を吸着
バッド(7)によって真空吸着し次工程に搬送される。FIG. 4 shows an enlarged cross-sectional view of the semiconductor element portion that has been fully cut. Next, as shown in FIG. 5(a), the dicing-completed semiconductor element (1) has a frame ring (3) vacuum-adsorbed by a suction pad (7) and is conveyed to the next process.
従来の搬送は以上のように行われているので、分割され
た半導体素子は粘着テープの張力のみで保持しなければ
ならず、半導体素子の重みて粘着テープかたわみ隣りの
素子表面のコーナーか接触し、Siグズの発生、チップ
パターンへのダメージの問題点かあった。Conventional transportation is carried out as described above, so the divided semiconductor elements must be held only by the tension of the adhesive tape, and the weight of the semiconductor elements causes the adhesive tape to flex, causing the corners of the surfaces of adjacent elements to touch each other. However, there were problems with the generation of Si particles and damage to the chip pattern.
この発明は上記のような問題点を解消するためになされ
たもので素子表面のコーナー欠けを防止できる半導体搬
送装置を得ることを目的とする。The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a semiconductor transfer device that can prevent corner chipping on the surface of an element.
この発明に係る半導体搬送装置は、粘着テープに固着さ
れた複数個の半導体素子の表面の隣合う間隔か、粘着テ
ープで固着された裏面の間隔より所定の値大きい間隔て
支持する支持部材を設けたものである。A semiconductor transport device according to the present invention includes a support member that supports a plurality of semiconductor elements fixed to an adhesive tape at a predetermined interval larger than the interval between adjacent surfaces of the semiconductor elements or the interval between the back sides fixed with the adhesive tape. It is something that
この発明における半導体搬送装置は、半導体素子の相互
間隔は粘着テープで固着された裏面の間隔よりも表面の
間隔か大きい状態に保持されて搬送される。In the semiconductor transport device according to the present invention, the semiconductor elements are transported while being maintained such that the distance between the semiconductor elements is larger than the distance between the back surfaces fixed with adhesive tape, which is the distance between the front surfaces.
J二ノ下、この発明の一実施例を図について説明する。 J. Ninoshita, an embodiment of the present invention will be described with reference to the drawings.
第1図において(1)は半導体製r、(2)は半導体素
子(1)を固定する粘着テープ、(3)は粘着テープ(
2)を保持するフレームリング、(6)はプレー1ぐに
よって形成された切溝、(ア)はフレームリング(3)
を運ぶのに使われる吸着バット、(8)は半導体ウェハ
を包含する吸着治具、(9)は粘着テープ(2)と吸着
治具(8)とからなる空間を真空引きしたり大気開放し
た1つするための管である。上記(7)〜(9)で支持
部材α0)を形成する。In Figure 1, (1) is a semiconductor r, (2) is an adhesive tape that fixes the semiconductor element (1), and (3) is an adhesive tape (
2) is the frame ring that holds it, (6) is the kerf formed by the play 1, (A) is the frame ring (3)
(8) is a suction jig used to transport semiconductor wafers, (9) is a suction jig used to carry semiconductor wafers, and (9) is a vacuum or open space consisting of adhesive tape (2) and suction jig (8). It is a tube for one purpose. The support member α0) is formed in steps (7) to (9) above.
次に動作について説明する。従来と同様、第3図に示す
ように、粘着テープ(2)に固定された半導体ウェハは
、ウェハチャックテーブル(4)上に載せられ真空で吸
着される。ブレード(5)は粘着テープ(2)の粘着剤
層(2a)まで達する切込みて半導体素子(1)を完全
切断(フルカット)する。Next, the operation will be explained. As in the prior art, as shown in FIG. 3, the semiconductor wafer fixed to the adhesive tape (2) is placed on the wafer chuck table (4) and vacuum-adsorbed. The blade (5) makes a cut that reaches the adhesive layer (2a) of the adhesive tape (2) to completely cut the semiconductor element (1).
第4図にフルカット完了した半導体素子部の断面拡大図
を示す。FIG. 4 shows an enlarged cross-sectional view of the semiconductor element portion that has been fully cut.
次にダイシングか、完了した半導体素子(11は第1図
に示すように、フレームリング(3)が吸着バット(7
)によって真空吸着支持され、前記吸着パッド(7)と
は別に、半導体ウェハ全体を包含する吸着治具(8)を
粘着テープ(2)と密着させた状態で、粘着テープ(2
)ど吸着治具(8)とからなる空間を管(9)を通して
、大気圧より負圧になるように真空引きする。Next, after dicing, the completed semiconductor device (11 is as shown in Figure 1), the frame ring (3) is
), and separate from the suction pad (7), a suction jig (8) containing the entire semiconductor wafer is brought into close contact with the adhesive tape (2).
) The space consisting of the suction jig (8) is evacuated through the tube (9) to a pressure lower than atmospheric pressure.
そして、粘着テープ(2)か上に反った状態で、吸着パ
ッド(ア)と吸着治具(8)を同時に動かして(図示せ
ず)次工程へと半導体素子を搬送する。Then, with the adhesive tape (2) bent upward, the suction pad (A) and the suction jig (8) are simultaneously moved (not shown) to transport the semiconductor element to the next process.
なお、上記実施例では吸着治具と粘着テープ間を負圧に
することにより粘着テープを上に反らせる方法を示した
のが、第2図に示すように上に凸の曲面板を支持部材側
として、曲面に粘着テープ(2)の裏面を載せても上記
実施例と同様の効果を奏する。In addition, in the above example, the method of warping the adhesive tape upward by creating a negative pressure between the suction jig and the adhesive tape was shown, but as shown in Fig. 2, the upwardly convex curved plate was placed on the support member side. Even if the back side of the adhesive tape (2) is placed on the curved surface, the same effect as in the above embodiment can be obtained.
以上のようにこの発明によれば粘着テープを上に反らせ
る状態で半導体素子を搬送するようにしたのて、隣りあ
う素子表面のコーナーは接触せず、コーナー欠けを防止
でき、歩留りを高める効果かある。As described above, according to the present invention, since the semiconductor elements are transported with the adhesive tape bent upward, the corners of the surfaces of adjacent elements do not come into contact with each other, preventing corner chipping and increasing the yield. be.
第1図はこの発明の一実施例による半導体搬送装置を示
す断面図、第2図はこの発明の他の実施例を示す搬送装
置を示す断面図、第3図はダイシノグ方法の断面図、第
4図は第3図の切断部分の拡大図、第5(a)図は従来
の搬送装置の断面図、第5(b)図は従来の搬送装置の
拡大図である。図において、(1)は半導体素子、(2
)は粘着テープ、(2a)は粘着剤層、(2b)はテー
プ基材(3)はフレームリング、(4)はウェハチャッ
クテーブル、(5)はブレード、(6)は切溝、(7)
は吸着パッド、(8)は吸着治具、(9)は管、aαは
支持部材である。
なお、図中、同一符号は同一、又は相当部分を示す。
代 理 人 大 岩 増 雄!@2図
に
Q
1 半導体素子
2・ 粘着テープ
3 りL−ムリンク
6 、 1刀 嘴
7:OFL看バット
δ 叶し看うぢ兵
9 ° 着
lo、支持部材FIG. 1 is a sectional view showing a semiconductor transfer device according to an embodiment of the present invention, FIG. 2 is a sectional view showing a transfer device according to another embodiment of the invention, and FIG. 3 is a sectional view of a dicing method. 4 is an enlarged view of the cut portion of FIG. 3, FIG. 5(a) is a sectional view of a conventional conveying device, and FIG. 5(b) is an enlarged view of the conventional conveying device. In the figure, (1) is a semiconductor element, (2
) is an adhesive tape, (2a) is an adhesive layer, (2b) is a tape base material (3) is a frame ring, (4) is a wafer chuck table, (5) is a blade, (6) is a kerf, (7 )
is a suction pad, (8) is a suction jig, (9) is a pipe, and aα is a support member. In addition, in the figures, the same reference numerals indicate the same or equivalent parts. Agent Masuo Oiwa! @2 diagram Q 1 Semiconductor element 2 / Adhesive tape 3 Rim link 6, 1 sword Beak 7: OFL guard bat δ Grant guard guard 9 ° Arrival LO, support member
Claims (1)
プの長さ方向とほぼ直角方向で複数個の半導体素子にし
て搬送するものにおいて、隣りあう素子間の表面側の距
離が上記粘着テープで固定された裏面側の距離よりも拡
がった状態で支持することを特徴とする半導体搬送装置
。In an apparatus in which a semiconductor wafer fixed to an adhesive tape is transported as a plurality of semiconductor elements in a direction substantially perpendicular to the length direction of the adhesive tape, the distance between adjacent elements on the surface side is fixed by the adhesive tape. A semiconductor transfer device characterized by supporting the semiconductor in a state where the distance is wider than the distance on the back side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2318910A JPH04188848A (en) | 1990-11-22 | 1990-11-22 | Semiconductor transport equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2318910A JPH04188848A (en) | 1990-11-22 | 1990-11-22 | Semiconductor transport equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04188848A true JPH04188848A (en) | 1992-07-07 |
Family
ID=18104339
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2318910A Pending JPH04188848A (en) | 1990-11-22 | 1990-11-22 | Semiconductor transport equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04188848A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003069660A1 (en) * | 2002-02-15 | 2003-08-21 | Disco Corporation | Plate-like object carrying mechanism and dicing device with carrying mechanism |
| WO2012093690A1 (en) * | 2011-01-07 | 2012-07-12 | 株式会社村田製作所 | Manufacturing method for electronic component module, and electronic component module |
| JP2021136254A (en) * | 2020-02-25 | 2021-09-13 | 三菱電機株式会社 | Manufacturing method of semiconductor devices |
-
1990
- 1990-11-22 JP JP2318910A patent/JPH04188848A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003069660A1 (en) * | 2002-02-15 | 2003-08-21 | Disco Corporation | Plate-like object carrying mechanism and dicing device with carrying mechanism |
| WO2012093690A1 (en) * | 2011-01-07 | 2012-07-12 | 株式会社村田製作所 | Manufacturing method for electronic component module, and electronic component module |
| CN103299408A (en) * | 2011-01-07 | 2013-09-11 | 株式会社村田制作所 | Manufacturing method of electronic component module and electronic component module |
| JPWO2012093690A1 (en) * | 2011-01-07 | 2014-06-09 | 株式会社村田製作所 | Electronic component module manufacturing method and electronic component module |
| US9408311B2 (en) | 2011-01-07 | 2016-08-02 | Murata Manufacturing Co., Ltd. | Method of manufacturing electronic component module and electronic component module |
| JP2021136254A (en) * | 2020-02-25 | 2021-09-13 | 三菱電機株式会社 | Manufacturing method of semiconductor devices |
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