JPH04111332A - Ic testing jig - Google Patents

Abstract

PURPOSE:To make self-cleaning of the leading end of a contact and, at the same time, to prevent imperfect contact between the contact and an outer lead and minimize the occurrence of scratches by sliding the outer lead placed on the leading end of the contact. CONSTITUTION:This jig for testing ICs is provided with an insulating substrate 2 provided with rails 1 on both side sections facing each other, contact pins 3 passed through the substrate 2, and an insulating positioning substrate 5 with a separating plate 4 which separates the adjacent contact pins from each other and an IC 6 to be tested is mounted on the jig, with the outer leads 7 of the IC 6 being put on and electrically connected with the pins 3 separated from each other by means of the plate 4. When the substrate 5 is slid after the IC 6 is mounted in such a way, the leads 7 slide on the leading ends of the pins 3 and clean the leading ends of the pins 3. Therefore, imperfect contact can be prevented and the occurrence of scratches can be minimized.

Description

[Detailed description of the invention] [Industrial application field] The present invention relates to an IC testing jig.

[Conventional technology]

Conventional IC test jigs make electrical connections with the external leads of the IC under test by using an IC socket, or by connecting the contacts of a jig with contacts such as leaf springs or pogo pins to the external leads. It was electrically connected.

[Problem to be solved by the invention]

The above-mentioned conventional IC testing jigs have a tendency to damage the contact surface due to repeated use when the contact element is fixed to a part of the external lead, such as a pogo pin or a leaf spring. Foreign matter such as solder chips may adhere to the external lead, resulting in poor contact.If the external lead is brought into contact with a contact piece such as an IC socket while rubbing, it may cause scratches on the external lead or generate solder chips. There were drawbacks such as causing poor appearance due to adhesion to the surface of the surface.

[Means to solve the problem]

The IC test jig of the present invention includes an insulating substrate having rails provided on opposing sides, a contact provided penetrating the insulating substrate, and a contactor that fits into the rail and slides on the insulating substrate. and a positioning board having a separating plate that isolates the adjacent contacts from each other.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a partially cutaway plan view showing one embodiment of the present invention, and FIG.
The figure is a schematic cross-sectional view of FIG. 1.

As shown in FIGS. 1 and 2, there is an insulating substrate 2 with rails 1 provided on opposing sides, a contact pin 3 provided through the insulating substrate 2, and an insulating substrate 2 fitted into the rail 1.
An insulating positioning board 5 is provided with a separator plate 4 that slides over the contact bins 3 and isolates adjacent contact bins 3 from each other. It is mounted on the partitioned contact bin 3, and the external lead 7 and the contact bin 3 are brought into contact and electrically connected.

Here, by sliding the positioning board 5, the external lead 7 slides over the tip of the contact bin 3,
Self-cleaning of the tip of the contact bottle 3 is performed to prevent contact failure and to minimize the occurrence of scratches.

〔Effect of the invention〕

As explained above, the present invention self-cleans the tip of the contact by sliding the external lead placed on the tip of the contact, prevents poor contact between the contact and the external lead, and minimizes the occurrence of scratches. This has the effect of minimizing the

[Brief explanation of the drawing]

FIG. 1 is a partially cutaway plan view showing one embodiment of the present invention, and FIG.
The figure is a schematic cross-sectional view of FIG. 1. DESCRIPTION OF SYMBOLS 1...Rail, 2...Insulating board, 3...Contact bin, 4...Separating plate, 5...Positioning board, 6...
...IC17...External lead.

Claims (1)

[Claims] an insulated substrate having rails provided on opposite sides; a contact provided through the insulated substrate; and a contact that fits into the rail and slides on the insulated substrate and isolates adjacent contacts from each other. 1. A jig for IC testing, comprising: a positioning board having a separator plate.