JP7718597B2 - Ultrasonic flaw detection device and ultrasonic flaw detection method - Google Patents

Description

This disclosure relates to an ultrasonic flaw detection device and an ultrasonic flaw detection method. This application claims the benefit of priority to Japanese Patent Application No. 2023-66959, filed on April 17, 2023, the contents of which are incorporated herein by reference.

One ultrasonic flaw detection method using an ultrasonic flaw detector is the angle beam method, in which ultrasonic waves are incident on the test object at an angle. In the angle beam method, a delay line is placed between the probe and the test object, and the ultrasonic waves transmitted from the probe are refracted at the interface between the delay line and the test object, irradiating the ultrasonic waves at a target position inside the test object. Hereinafter, the target position inside the test object may be referred to as the "target position."

However, when the temperature of the test object changes, the propagation speed of the ultrasonic waves in the test object changes, and the refraction angle of the ultrasonic waves at the interface between the delay material and the test object changes. Therefore, when testing a test object whose temperature changes, depending on the temperature of the test object, there is a problem that ultrasonic waves may not be irradiated to the target position, making it impossible to test the target position.

Therefore, technology has been developed to mechanically change the installation angle of the probe relative to the object being inspected depending on the temperature of the object being inspected, thereby keeping the refraction angle of the ultrasound constant (for example, Patent Document 1).

Japanese Unexamined Patent Publication No. 1-203967

However, the technology described in Patent Document 1, which has a mechanism for changing the installation angle of the probe, has the problem that the device becomes large.

In view of these issues, the present disclosure aims to provide an ultrasonic flaw detection device and an ultrasonic flaw detection method that are capable of inspecting target positions with a simple configuration.

In order to solve the above problem, an ultrasonic flaw detection device according to one embodiment of the present disclosure includes a probe that transmits ultrasonic waves into the interior of the test object and receives the ultrasonic waves reflected inside the test object, a delay material that is arranged between the probe and the test object and is made of one or more materials selected from the group consisting of resin, glass, and metal , a temperature adjustment mechanism that adjusts the temperature of the delay material, a first temperature detection unit that detects the temperature of the test object, and a control unit that controls the temperature adjustment mechanism based on the temperature of the test object detected by the first temperature detection unit.

The control unit may also refer to test object sound velocity information indicating the relationship between the test object's sound velocity and temperature, and delay material sound velocity information indicating the relationship between the delay material's sound velocity and temperature, and control the temperature adjustment mechanism based on the test object's temperature detected by the first temperature detection unit.

The control unit may also refer to the test object sound speed information, calculate the test object sound speed from the temperature of the test object detected by the first temperature detection unit, calculate the delay line sound speed based on the test object sound speed, refer to the delay line sound speed information, calculate the delay line target temperature from the delay line sound speed, and control the temperature adjustment mechanism based on the target temperature.

The ultrasonic flaw detection device may also be provided with a memory unit that pre-stores test object sound velocity information and delay line sound velocity information.

The ultrasonic flaw detection device may also be provided with a second temperature detection unit that detects the temperature of the delay material, and the control unit may perform feedback control on the temperature adjustment mechanism based on the temperature of the delay material detected by the second temperature detection unit.

In order to solve the above problem, an ultrasonic flaw detection method according to one aspect of the present disclosure detects the temperature of an object to be inspected, transmits ultrasonic waves into the interior of the object to be inspected, and receives the ultrasonic waves reflected inside the object to be inspected. The temperature of a delay material disposed between the object to be inspected and the probe is adjusted based on the detected temperature of the object to be inspected, and the delay material is made of one or more materials selected from the group consisting of resin, glass, and metal .

This disclosure makes it possible to inspect target positions with a simple configuration.

FIG. 1 is a schematic diagram showing the general configuration of an ultrasonic flaw detection device according to this embodiment. FIG. 2 is a diagram illustrating the movement direction of the probe constituting the ultrasonic flaw detector according to this embodiment. FIG. 3 is a block diagram showing an example of the functional configuration of the ultrasonic flaw detection device according to this embodiment. FIG. 4 is a diagram illustrating an example of test object sound velocity information and delay line temperature information according to this embodiment. FIG. 5 is a flowchart showing the processing flow of the ultrasonic flaw detection method according to this embodiment.

Embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. Dimensions, materials, and other specific values shown in these embodiments are merely examples for ease of understanding and, unless otherwise specified, do not limit the present disclosure. Note that in this specification and drawings, elements that have substantially the same function and configuration are designated by the same reference numerals to avoid redundant explanation, and elements not directly related to the present disclosure are not shown.

[Ultrasonic flaw detection device 100]
FIG. 1 is a schematic diagram showing the overall configuration of an ultrasonic flaw detection device 100 according to this embodiment. FIG. 2 is a diagram illustrating the movement direction of a probe 110 constituting the ultrasonic flaw detection device 100 according to this embodiment. In FIGS. 1 and 2 of this embodiment, the X-axis, Y-axis, and Z-axis, which intersect perpendicularly, are defined as shown. In FIG. 1, the dashed line indicates ultrasonic waves transmitted from the ultrasonic flaw detection device 100. In FIG. 1, the dashed line indicates the normal (perpendicular line) to the interface IF between the delay material 130 and the object to be inspected T. In FIG. 2, the dashed line indicates the weld line WL of the welded portion WR.

As shown in FIG. 1, the ultrasonic flaw detection device 100 uses ultrasonic waves to inspect an object to be inspected T. In this embodiment, the object to be inspected T has regions with different temperatures. For example, the temperature of the object to be inspected T increases from the bottom to the top.

In this embodiment, the ultrasonic flaw detection device 100 inspects, for example, a welded portion WR provided on an inspection object T having regions of different temperatures. The welded portion WR extends, for example, in the Y-axis direction in Figures 1 and 2. The locus of the center of the welded portion WR in the X-axis direction in Figure 1, i.e., the imaginary line extending in the Y-axis direction in Figure 1 that passes through the center of the welded portion WR in the X-axis direction in Figure 1, is defined as the weld line WL of the welded portion WR.

As shown in FIG. 1, the ultrasonic flaw detection device 100 includes a probe 110 and a control device 210.

The probe 110 includes a probe 120, a delay material 130, a temperature adjustment mechanism 140, a first temperature detection unit 150, and a second temperature detection unit 152.

As shown in Figure 2, the probe 110 is moved along the weld line WL of the welded portion WR by a movement mechanism (not shown). That is, the probe 110 is moved in the Y-axis direction in Figures 1 and 2 by the movement mechanism. The probe 110 is also moved so that the shortest distance between the weld line WL of the welded portion WR and the probe 110 is maintained at a predetermined set distance SD. The set distance SD will be described later.

Returning to Figure 1, the probe 120 transmits ultrasonic waves into the interior of the test object T and receives ultrasonic waves reflected from the interior of the test object T. The probe 120 includes, for example, a transmitting unit 122 having a transducer that transmits ultrasonic waves, and a receiving unit 124 having a transducer that receives ultrasonic waves (see Figure 3).

The delay material 130 is arranged between the probe 120 and the test object T. The delay material 130 contacts the probe 120 and the test object T.

The delay material 130 holds (fixes) the probe 120 so that the incident angle θi of the ultrasound transmitted by the probe 120 at a reference temperature is a predetermined incident angle θI. The reference temperature is, for example, room temperature (25°C). The incident angle θi is the angle between the propagation direction of the ultrasound in the delay material 130 and the normal (perpendicular line) to the interface IF between the delay material 130 and the test object T. The incident angle θi changes depending on the temperature of the delay material 130.

The delay material 130 propagates the ultrasonic waves transmitted from the probe 120, causing them to enter the object to be inspected T. The speed of sound (propagation velocity) of the ultrasonic waves in the delay material 130 is different from the speed of sound (propagation velocity) of the ultrasonic waves in the object to be inspected T. Therefore, the ultrasonic waves transmitted from the probe 120 and propagating through the delay material 130 are refracted at a predetermined refraction angle θr at the interface IF between the delay material 130 and the object to be inspected T. The refraction angle θr is the angle between the normal (perpendicular line) to the interface IF between the delay material 130 and the object to be inspected T and the propagation direction of the ultrasonic waves in the object to be inspected T. The refraction angle θr changes depending on the temperature of the object to be inspected T.

The probe 120 and delay material 130 are installed on the object to be inspected T so that, when the temperature of the object to be inspected T is at a reference temperature, ultrasonic waves transmitted from the probe 120 propagate to a target position P inside the object to be inspected T. The target position P is, for example, a position on the weld line WL of the welded portion WR. In other words, when the temperature of the object to be inspected T is at a reference temperature, the distance between the probe 110 (probe 120 and delay material 130) and the welded portion WR at which ultrasonic waves transmitted from the probe 120 propagate to the target position P is the set distance SD. The set distance SD is determined based on the angle of incidence θI at the reference temperature, the angle of refraction θR at the reference temperature, and the target position P. The angle of incidence θI and the angle of refraction θR are set in advance through experiments, simulations, etc.

The material constituting the delay body 130 is determined appropriately depending on the material constituting the test object T. The sound velocity of the material constituting the delay body 130 needs to be different from the sound velocity of the material constituting the test object T. The delay body 130 is made of, for example, a resin such as acrylic or polystyrene, glass, or metal.

The temperature adjustment mechanism 140 adjusts the temperature of the delay material 130. In this embodiment, the temperature adjustment mechanism 140 adjusts the temperature of the delay material 130, for example, when the temperature of the test object T is not within the reference temperature range. The reference temperature range is a temperature range that includes the reference temperature. The reference temperature range is, for example, a range of the reference temperature ±25°C.

The temperature adjustment mechanism 140 has, for example, either one or both of a mechanism for heating the delay body 130 and a mechanism for cooling the delay body 130. The mechanism for heating the delay body 130 is, for example, an electric heater. The mechanism for cooling the delay body 130 is, for example, a Peltier element cooler. The temperature adjustment mechanism 140 is provided, for example, on the outer periphery of the delay body 130. The temperature adjustment mechanism 140 is provided on the delay body 130 so as not to block the ultrasonic waves transmitted by the probe 120 and the ultrasonic waves received by the probe 120.

The temperature adjustment mechanism 140 may also be, for example, a mechanism for circulating a heat medium through the delay material 130. In this case, a flow path for the heat medium is formed within the delay material 130, and the temperature adjustment mechanism 140 may adjust the temperature of the delay material 130 by flowing the heat medium through the flow path.

The first temperature detection unit 150 detects the temperature of the test object T. The first temperature detection unit 150 is, for example, a temperature sensor.

The second temperature detection unit 152 detects the temperature of the delay material 130. The second temperature detection unit 152 is, for example, a temperature sensor.

The control device 210 manages and controls the ultrasonic flaw detection device 100. Figure 3 is a block diagram showing an example of the functional configuration of the ultrasonic flaw detection device 100 according to this embodiment. In Figure 3, dashed arrows indicate the flow of signals. As shown in Figure 3, the control device 210 includes a control unit 212 and a memory unit 214.

The control unit 212 is composed of a semiconductor integrated circuit including a CPU (central processing unit). The control unit 212 reads programs and parameters for operating the CPU from ROM. The control unit 212 manages and controls the entire ultrasonic flaw detection device 100 in cooperation with RAM as a work area and other electronic circuits.

The control unit 212 controls the transmitter 122 of the probe 120 to transmit ultrasonic waves from the transmitter 122. The control unit 212 also analyzes the ultrasonic waves received by the receiver 124 to detect the presence or absence of defects at the target position P and in the vicinity of the target position P.

The control unit 212 also acquires the temperature of the test object T from the first temperature detection unit 150 and acquires the temperature of the delay material 130 from the second temperature detection unit 152. The control unit 212 controls the temperature adjustment mechanism 140 based on the acquired temperatures of the test object T and the delay material 130.

The memory unit 214 is composed of ROM, RAM, flash memory, HDD, etc. The memory unit 214 stores programs and various data used by the control unit 212. The memory unit 214 pre-stores, for example, test object sound velocity information and delay line sound velocity information. The test object sound velocity information is information that indicates the relationship between the test object's sound velocity and temperature. The delay line temperature information is information that indicates the relationship between the delay line 130's sound velocity and temperature.

Figure 4 is a diagram illustrating an example of test object sound velocity information and delay line temperature information according to this embodiment. In Figure 4, the vertical axis represents the propagation velocity (sound velocity) [m/s]. In Figure 4, the horizontal axis represents the temperature [°C]. Here, test object sound velocity information when the test object T is steel is used as an example, and delay line temperature information when the delay line 130 is acrylic is used as an example.

As shown in Figure 4, referring to the test object sound velocity information, for example, the sound velocity of ultrasound in the test object T is 3265 m/s when the temperature of the test object T is -30°C, 3265 m/s when the temperature of the test object T is -20°C, 3256 m/s when the temperature of the test object T is -10°C, 3252 m/s when the temperature of the test object T is 0°C, 3252 m/s when the temperature of the test object T is 10°C, and 3230 m/s when the temperature of the test object T is 20°C.

Furthermore, as shown in Figure 4, referring to the delay material sound speed information, for example, the sound speed of ultrasound in the delay material 130 is 2833 m/s when the temperature of the delay material 130 is -30°C, 2810 m/s when the temperature of the delay material 130 is -20°C, 2788 m/s when the temperature of the delay material 130 is -10°C, 2762 m/s when the temperature of the delay material 130 is 0°C, 2733 m/s when the temperature of the delay material 130 is 10°C, and 2710 m/s when the temperature of the delay material 130 is 20°C.

As such, the speed of sound decreases as temperature increases, regardless of the material.

[Ultrasonic flaw detection method]
Next, an ultrasonic flaw detection method using the ultrasonic flaw detection device 100 will be described. Fig. 5 is a flowchart showing the process flow of the ultrasonic flaw detection method according to this embodiment. As shown in Fig. 5, the ultrasonic flaw detection method according to this embodiment includes a termination determination process S110, a temperature acquisition process S112, a temperature determination process S114, an inspection process S116, a movement process S118, an inspection object sound velocity calculation process S120, a delay line sound velocity calculation process S122, a delay line temperature calculation process S124, and a temperature adjustment process S126. Each process will be described below.

[End Determination Process S110]
The control unit 212 determines whether or not the inspection of the predetermined inspection range has been completed. As a result, if it is determined that the inspection of the inspection range has not been completed (NO in S110), the control unit 212 proceeds to the temperature acquisition process S112. On the other hand, if it is determined that the inspection of the inspection range has been completed (YES in S110), the control unit 212 ends the ultrasonic flaw detection method.

[Temperature acquisition process S112]
The control unit 212 acquires the temperature Tt of the test object T detected by the first temperature detection unit 150. Then, the control unit 212 moves the process to a temperature determination process S114.

[Temperature determination process S114]
The control unit 212 determines whether the temperature Tt of the test object T acquired in the temperature acquisition process S112 is within a reference temperature range. As a result, if it is determined that the temperature Tt is within the reference temperature range (YES in S114), the control unit 212 proceeds to the test process S116. On the other hand, if it is determined that the temperature Tt is not within the reference temperature range (NO in S114), the control unit 212 proceeds to the test object sound speed calculation process S120.

[Inspection process S116]
The control unit 212 controls the transmitting unit 122 of the probe 120 to transmit ultrasonic waves from the transmitting unit 122. The control unit 212 also analyzes the ultrasonic waves received by the receiving unit 124 to detect the presence or absence of defects at the target position P and in the vicinity of the target position P. The control unit 212 then shifts the process to a movement process S118.

[Movement process S118]
A movement mechanism (not shown) moves the probe 110 from the first position where the inspection process S116 was performed to a second position. The second position is different from the first position, and is a position where the shortest distance between the weld line WL of the welded portion WR and the probe 110 is the set distance SD. Then, the control unit 212 returns the process to the end determination process S110.

[Test object sound speed calculation process S120]
The control unit 212 refers to the inspection object sound velocity information stored in the storage unit 214 and calculates the sound velocity Vt of the inspection object T when the temperature Tt of the inspection object T acquired in the temperature acquisition process S112 is the inspection object T. Then, the control unit 212 shifts the process to the delay material sound velocity calculation process S122.

[Delay material sound speed calculation process S122]
The control unit 212 calculates the sound velocity Vw of the delay material 130 using the following equation (1).
Vw = Vt × sinθI / sinθR…Formula (1)
In the above formula (1), Vw is the sound velocity of the delay material 130, and Vt is the sound velocity of the test object T. Also, in the above formula (1), θI is the incident angle θi at the reference temperature (see FIG. 1), and θR is the refraction angle θr at the reference temperature (see FIG. 1). The incident angle θI and the refraction angle θR are set in advance by experiment, simulation, etc.
Then, the control unit 212 proceeds to the delay line temperature calculation process S124.

[Delay material temperature calculation process S124]
The control unit 212 refers to the delay material sound velocity information stored in the memory unit 214 and calculates the target temperature Tw, which is the temperature of the delay material 130 when the sound velocity Vw of the delay material 130 is the speed calculated in the delay material sound velocity calculation process S122. Then, the control unit 212 proceeds to the temperature adjustment process S126.

[Temperature adjustment process S126]
The control unit 212 performs feedback control on the temperature adjustment mechanism 140 so that the temperature of the delay material 130 detected by the second temperature detection unit 152 becomes the target temperature Tw calculated by the delay material temperature calculation process S124. Then, when the temperature of the delay material 130 detected by the second temperature detection unit 152 becomes the target temperature Tw calculated by the delay material temperature calculation process S124, the control unit 212 shifts the process to the inspection process S116.

As described above, the ultrasonic flaw detection device 100 of this embodiment is equipped with a temperature adjustment mechanism 140 that adjusts the temperature of the delay material 130, and controls the temperature adjustment mechanism 140 based on the test object sound speed information, the delay material sound speed information, and the temperature Tt of the test object T.

When the temperature Tt of the test object T changes from the reference temperature, the sound velocity Vt of the ultrasound in the test object T changes from the sound velocity Vt at the reference temperature, and the refraction angle θr differs from the refraction angle θR at the reference temperature. As a result, even if an inspection is performed by placing the probe 110 at a set distance SD determined based on the refraction angle θR, the ultrasound will be irradiated at a position different from the target position P, making it impossible to inspect the target position P. Therefore, if the installation position of the probe 110 is changed from the set distance SD to match the refraction angle θr that has changed in response to temperature changes in the test object T, the ultrasound can be irradiated at the target position P, but the propagation distance of the ultrasound from the probe 120 to the target position P will change. This changes the degree of ultrasound attenuation, resulting in a problem of reduced inspection accuracy.

For this reason, conventionally, the probe mounting angle has been changed or multiple delay lines with different sound velocities have been used depending on the temperature Tt of the test object T. However, conventional technology that includes a mechanism for changing the probe mounting angle has the problem of making the equipment large. Furthermore, conventional technology that uses multiple delay lines has the problem of forcing the operator to perform the cumbersome task of replacing the delay lines.

Therefore, the ultrasonic flaw detection device 100 according to this embodiment controls the temperature adjustment mechanism 140 based on the temperature Tt of the test object T to adjust the temperature of the delay material 130, change the sound velocity Vw of the delay material 130, and change the incident angle θi, thereby propagating the ultrasonic waves transmitted by the probe 120 to the target position P. As a result, the ultrasonic flaw detection device 100 according to this embodiment can inspect the target position P while maintaining the installation position of the probe 110 at the set distance SD, even if the temperature of the test object T changes, with a simple configuration that simply changes the temperature of the delay material 130. Therefore, the ultrasonic flaw detection device 100 according to this embodiment can avoid changes in the degree of ultrasonic attenuation and prevent a decrease in inspection accuracy. Furthermore, because the ultrasonic flaw detection device 100 according to this embodiment can inspect the target position P simply by adjusting the temperature of the delay material 130, it is possible to eliminate the hassle of preparing multiple delay materials with different sound velocities and the need to replace the delay materials.

The ultrasonic flaw detection device 100 according to this embodiment also includes a second temperature detection unit 152 that detects the temperature of the delay material 130, and the control unit 212 performs feedback control on the temperature adjustment mechanism 140 based on the temperature of the delay material 130 detected by the second temperature detection unit 152. This allows the ultrasonic flaw detection device 100 according to this embodiment to set the temperature of the delay material 130 to the target temperature Tw of the delay material 130 associated with the delay material sound speed information. Therefore, the ultrasonic flaw detection device 100 according to this embodiment is able to propagate ultrasonic waves transmitted by the probe 120 to the target position P with high accuracy.

Although the embodiments have been described above with reference to the accompanying drawings, it goes without saying that the present disclosure is not limited to the above-described embodiments. It is clear that a person skilled in the art could conceive of various modifications or alterations within the scope of the claims, and it is understood that these naturally fall within the technical scope of the present disclosure.

For example, in the above embodiment, the second temperature detection unit 152 of the ultrasonic flaw detection device 100 is a temperature sensor. However, the configuration of the second temperature detection unit 152 is not limited as long as it can detect the temperature of the delay material 130. For example, the second temperature detection unit 152 may be a probe different from the probe 120, having a transmitter with a transducer that transmits ultrasonic waves and a receiver with a transducer that receives ultrasonic waves. In this case, the second temperature detection unit 152 is preferably provided in the delay material 130, and the transmitter of the second temperature detection unit 152 transmits ultrasonic waves perpendicular to the interface IF between the delay material 130 and the test object T. Then, for example, the second temperature detection unit 152 calculates the speed of sound Vw of the delay material 130 based on the time between transmitting the ultrasonic waves and receiving the ultrasonic waves reflected at the interface IF and the thickness of the delay material 130 (the length in the Z-axis direction in FIG. 1 ), and calculates the temperature of the delay material 130 based on the speed of sound Vw.

Furthermore, in the temperature adjustment process S126 of the above embodiment, the control unit 212 performs feedback control on the temperature adjustment mechanism 140 so that the temperature of the delay material 130 detected by the second temperature detection unit 152 becomes the target temperature Tw calculated by the delay material temperature calculation process S124. However, in the temperature adjustment process S126, the control unit 212 may also control the temperature adjustment mechanism 140 so that the temperature of the delay material 130 becomes within a target temperature range that includes the target temperature Tw. The target temperature range is a temperature range that includes the target temperature Tw. The target temperature range is, for example, a range of the target temperature Tw ± 25°C.

Furthermore, in the above embodiment, an example was given in which the ultrasonic flaw detection device 100 includes the second temperature detection unit 152. However, the ultrasonic flaw detection device 100 does not need to include the second temperature detection unit 152. For example, the control unit 212 may refer to the test object sound velocity information and the delay line sound velocity information, and perform open control on the temperature adjustment mechanism 140 based on the temperature Tt of the test object T detected by the first temperature detection unit 150. In this case, the control unit 212 may, for example, start operation of the temperature adjustment mechanism 140 in the temperature adjustment process S126, adjust the temperature adjustment capacity of the temperature adjustment mechanism 140, and proceed to the inspection process S116 after a predetermined fixed time has elapsed. The fixed time is the time from when the temperature adjustment mechanism 140 starts operation until the target temperature Tw is reached, and is determined in advance. Alternatively, the control unit 212 may start the operation of the temperature adjustment mechanism 140 in the temperature adjustment process S126, and after a predetermined fluctuation time has elapsed, proceed to the inspection process S116 while maintaining the temperature adjustment capacity of the temperature adjustment mechanism 140 constant. The fluctuation time is determined in advance based on the time required for the temperature adjustment mechanism 140 to reach the target temperature Tw corresponding to the constant temperature adjustment capacity.

Furthermore, in the above embodiment, an example was given in which the memory unit 214 of the control device 210 pre-stores the test object sound velocity information and the delay line sound velocity information. However, the memory unit 214 of the control device 210 does not have to store the test object sound velocity information and the delay line sound velocity information. For example, the control device 210 may control the temperature adjustment mechanism 140 based on the target temperature Tw of the delay line 130 acquired in response to an operation input by an operator to an operation unit (not shown). In this case, the operator may calculate the target temperature Tw based on the temperature Tt of the test object T detected by the first temperature detection unit 150.

Furthermore, in the above embodiment, an example was given in which the control unit 212 references the test object sound velocity information and delay line sound velocity information and controls the temperature adjustment mechanism 140 based on the temperature of the test object T detected by the first temperature detection unit 150. However, the control unit 212 may also control the temperature adjustment mechanism 140 based on the temperature of the test object T detected by the first temperature detection unit 150 without reference to the test object sound velocity information and delay line sound velocity information. For example, the control unit 212 may operate the temperature adjustment mechanism 140 when the temperature of the test object T detected by the first temperature detection unit 150 is different from the reference temperature.

The probe 120 may also be located inside the delay material 130.

The probe 120 may also be an array probe including a transmitting section with multiple transducers and a receiving section with multiple transducers. This allows the target position P to be suitably inspected even when the temperature of the object T changes significantly.

In addition, in the above embodiment, an example was given in which the ultrasonic flaw detection device 100 controls the temperature adjustment mechanism 140 so that ultrasonic waves are transmitted to the target position P. However, the ultrasonic flaw detection device 100 may also control the temperature adjustment mechanism 140 to change the ultrasonic transmission position. This allows the ultrasonic flaw detection device 100 to inspect various locations simply by controlling the temperature adjustment mechanism 140 without changing its installation position. For example, the ultrasonic flaw detection device 100 can scan and inspect the weld line WL of the welded portion WR simply by controlling the temperature adjustment mechanism 140 without changing its installation position.

This disclosure can contribute, for example, to Goal 12 of the Sustainable Development Goals (SDGs), "Ensure sustainable consumption and production patterns."

100: Ultrasonic flaw detection device 120: Probe 130: Delay material 140: Temperature adjustment mechanism 150: First temperature detection unit 152: Second temperature detection unit 212: Control unit 214: Memory unit

Claims (6)

a probe that transmits ultrasonic waves into the interior of the object to be inspected and receives ultrasonic waves reflected from the interior of the object to be inspected;
a delay line disposed between the probe and the test object and made of one or more materials selected from the group consisting of resin, glass, and metal ;
a temperature adjusting mechanism for adjusting the temperature of the delay material;
a first temperature detection unit that detects the temperature of the test object;
a control unit that controls the temperature adjustment mechanism based on the temperature of the test object detected by the first temperature detection unit;
An ultrasonic flaw detection device equipped with: The ultrasonic flaw detection device of claim 1, wherein the control unit references inspection object sound velocity information indicating the relationship between the inspection object's sound velocity and temperature, and delay line sound velocity information indicating the relationship between the delay line's sound velocity and temperature, and controls the temperature adjustment mechanism based on the inspection object's temperature detected by the first temperature detection unit. The control unit
calculating a sound velocity of the inspection object from the temperature of the inspection object detected by the first temperature detection unit by referring to the sound velocity information of the inspection object;
Calculating the sound velocity of the delay material based on the sound velocity of the test object;
calculating a target temperature of the delay line from the sound velocity of the delay line by referring to the sound velocity information of the delay line;
The ultrasonic flaw detection device according to claim 2 , wherein the temperature adjustment mechanism is controlled based on the target temperature. The ultrasonic flaw detection device of claim 2 or 3, further comprising a storage unit that pre-stores the inspection object sound velocity information and the delay line sound velocity information. a second temperature detector for detecting the temperature of the delay body;
The ultrasonic flaw detection device according to claim 1 or 2, wherein the control unit performs feedback control on the temperature adjustment mechanism based on the temperature of the delay material detected by the second temperature detection unit. Detects the temperature of the test object,
a delay material disposed between the test object and a probe that transmits ultrasonic waves into the test object and receives the ultrasonic waves reflected from the test object, and the temperature of the delay material is adjusted based on the detected temperature of the test object ;
The ultrasonic flaw detection method , wherein the delay material is made of one or more materials selected from the group consisting of resin, glass, and metal .