JP7595669B2 - 容量性処理ユニット - Google Patents
容量性処理ユニット Download PDFInfo
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- JP7595669B2 JP7595669B2 JP2022533316A JP2022533316A JP7595669B2 JP 7595669 B2 JP7595669 B2 JP 7595669B2 JP 2022533316 A JP2022533316 A JP 2022533316A JP 2022533316 A JP2022533316 A JP 2022533316A JP 7595669 B2 JP7595669 B2 JP 7595669B2
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
- G06N3/065—Analogue means
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/0464—Convolutional networks [CNN, ConvNet]
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/0499—Feedforward networks
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/10—Interfaces, programming languages or software development kits, e.g. for simulating neural networks
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/402—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration individual to each memory cell, i.e. internal refresh
- G11C11/4023—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration individual to each memory cell, i.e. internal refresh using field effect transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/403—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/54—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using elements simulating biological cells, e.g. neuron
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
- G11C14/0009—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a DRAM cell
- G11C14/0036—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a DRAM cell and the nonvolatile element is a magnetic RAM [MRAM] element or ferromagnetic cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/16—Storage of analogue signals in digital stores using an arrangement comprising analogue/digital [A/D] converters, digital memories and digital/analogue [D/A] converters
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/16—Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
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Description
Claims (9)
- メモリ・セルのアレイを含む構造であって、メモリ・セルが、
少なくとも1つの金属酸化物半導体(MOS)素子であって、前記少なくとも1つのMOS素子のソース端子が前記MOS素子のドレイン端子に接続され、前記ソース端子が前記ドレイン端子に接続されることにより、前記少なくとも1つのMOS素子が、電気エネルギーを保存するための容量性挙動を示す、前記MOS素子と、
前記少なくとも1つのMOS素子に接続された第1のトランジスタであって、前記第1のトランジスタの活性化により、前記メモリ・セルへの書込み動作を容易にする、前記第1のトランジスタと、
前記少なくとも1つのMOS素子に接続された第2のトランジスタであって、前記第2のトランジスタの活性化により、前記メモリ・セルからの読出し動作を容易にする、前記第2のトランジスタと
を含み、
前記少なくとも1つのMOS素子が、第1のpチャネル金属酸化物半導体(PMOS)トランジスタ、第2のPMOSトランジスタ、第1のnチャネル金属酸化物半導体(NMOS)トランジスタ、および第2のNMOSトランジスタを含み、
前記第1のPMOSトランジスタと前記第2のPMOSトランジスタとが並列に接続され、前記第1のNMOSトランジスタと前記第2のNMOSトランジスタとが並列に接続されている、
構造。 - 前記メモリ・セルの列に保存されている前記電気エネルギーが蓄積されて、人工ニューラル・ネットワークの重みを表す、請求項1に記載の構造。
- 前記第1のトランジスタが第1のNMOSトランジスタであり、
前記第2のトランジスタが第2のNMOSトランジスタであり、
前記第1のトランジスタの前記第1のNMOSトランジスタのドレイン端子が、真ビット線(BLT)ワイヤに接続され、
前記第1のトランジスタの前記第1のNMOSトランジスタのソース端子が、前記少なくとも1つのMOS素子に接続され、
前記第2のトランジスタの前記第2のNMOSトランジスタのドレイン端子が、前記少なくとも1つのMOS素子に接続され、
前記第2のトランジスタの前記第2のNMOSトランジスタのソース端子が、相補ビット線(BLC)ワイヤに接続されている、請求項1に記載の構造。 - 前記第1のトランジスタの前記第1のNMOSトランジスタのゲートが、第1のクロック信号によって制御され、
前記第2のトランジスタの前記第2のNMOSトランジスタのゲートが、第2のクロック信号によって制御され、
前記第1のクロック信号が前記第1のトランジスタの前記第1のNMOSトランジスタを活性化することに応答して、前記BLTワイヤからの入力が前記少なくとも1つのMOS素子に送信され、
前記第2のクロック信号が前記第2のトランジスタの前記第2のNMOSトランジスタを活性化することに応答して、前記BLTワイヤと前記BLCワイヤとの間の電圧差が出力される、請求項3に記載の構造。 - 前記少なくとも1つのMOS素子の容量をバイアスするように構成された少なくとも1つの回路をさらに含む、請求項1に記載の構造。
- メモリ・セルの前記アレイが不揮発性メモリと統合されている、請求項1に記載の構造。
- メモリ・セルの対応する列から出力された電気エネルギーを蓄積および保存するように構成された複数のアナログ回路をさらに含む、請求項1に記載の構造。
- メモリと、
前記メモリと通信するように構成されたプロセッサと、
前記メモリおよび前記プロセッサと通信するように構成された、請求項1ないし7のいずれか一項に記載の構造と
を含む、システム。 - データを保存するように構成された不揮発性メモリと、
前記不揮発性メモリに結合された、請求項1ないし7のいずれか一項に記載の構造と
を含む、メモリ・デバイス。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/707,838 US11120864B2 (en) | 2019-12-09 | 2019-12-09 | Capacitive processing unit |
| US16/707,838 | 2019-12-09 | ||
| PCT/IB2020/060964 WO2021116803A1 (en) | 2019-12-09 | 2020-11-20 | Capacitive processing unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2023505178A JP2023505178A (ja) | 2023-02-08 |
| JP7595669B2 true JP7595669B2 (ja) | 2024-12-06 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022533316A Active JP7595669B2 (ja) | 2019-12-09 | 2020-11-20 | 容量性処理ユニット |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US11120864B2 (ja) |
| JP (1) | JP7595669B2 (ja) |
| KR (1) | KR102738472B1 (ja) |
| CN (1) | CN114761973A (ja) |
| AU (1) | AU2020399273B2 (ja) |
| DE (1) | DE112020005262T5 (ja) |
| GB (1) | GB2605097A (ja) |
| WO (1) | WO2021116803A1 (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20230084611A1 (en) * | 2021-09-10 | 2023-03-16 | Intel Corporation | Two transistor capacitorless memory cell with stacked thin-film transistors |
| WO2025181636A1 (ja) * | 2024-03-01 | 2025-09-04 | 株式会社半導体エネルギー研究所 | 半導体装置、演算装置及び電子機器 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008152876A (ja) | 2006-12-19 | 2008-07-03 | Nec Electronics Corp | 半導体装置 |
| JP2019033234A (ja) | 2017-08-10 | 2019-02-28 | 株式会社半導体エネルギー研究所 | 半導体装置、および電子機器 |
| WO2019087500A1 (ja) | 2017-11-02 | 2019-05-09 | Tdk株式会社 | ニューロモルフィック素子を含むアレイ装置およびニューラルネットワークシステム |
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| DE10103297A1 (de) * | 2001-01-25 | 2002-08-22 | Infineon Technologies Ag | MOS-Transistor |
| US6911964B2 (en) * | 2002-11-07 | 2005-06-28 | Duke University | Frame buffer pixel circuit for liquid crystal display |
| US6992927B1 (en) | 2004-07-08 | 2006-01-31 | National Semiconductor Corporation | Nonvolatile memory cell |
| US7106620B2 (en) * | 2004-12-30 | 2006-09-12 | International Business Machines Corporation | Memory cell having improved read stability |
| JP2006338729A (ja) * | 2005-05-31 | 2006-12-14 | Sony Corp | 半導体記憶装置 |
| US20080310237A1 (en) | 2007-06-18 | 2008-12-18 | Nantronics Semiconductor. Inc. | CMOS Compatible Single-Poly Non-Volatile Memory |
| US7515478B2 (en) | 2007-08-20 | 2009-04-07 | Nantronics Semiconductor, Inc. | CMOS logic compatible non-volatile memory cell structure, operation, and array configuration |
| US7957177B2 (en) * | 2008-06-05 | 2011-06-07 | Altera Corporation | Static random-access memory with boosted voltages |
| US9362882B1 (en) * | 2015-01-23 | 2016-06-07 | Tdk Corporation | Apparatus and methods for segmented variable capacitor arrays |
| KR101704933B1 (ko) * | 2015-11-20 | 2017-02-22 | 한양대학교 산학협력단 | 오프셋 전압 상쇄를 이용한 메모리 셀 읽기 회로 |
| US9734910B1 (en) * | 2016-01-22 | 2017-08-15 | SK Hynix Inc. | Nonvolatile memory cells having lateral coupling structures and nonvolatile memory cell arrays including the same |
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| CN107464583A (zh) * | 2016-06-03 | 2017-12-12 | 中芯国际集成电路制造(上海)有限公司 | 一种用于静态随机存取存储器的自定时电路及静态随机存取存储器 |
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| CN110245749B (zh) | 2018-03-08 | 2024-06-14 | 三星电子株式会社 | 用于执行同或运算的计算单元、神经网络及方法 |
| JP2019160371A (ja) * | 2018-03-14 | 2019-09-19 | 株式会社東芝 | メモリ回路および電子機器 |
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-
2019
- 2019-12-09 US US16/707,838 patent/US11120864B2/en not_active Expired - Fee Related
-
2020
- 2020-11-20 KR KR1020227015758A patent/KR102738472B1/ko active Active
- 2020-11-20 AU AU2020399273A patent/AU2020399273B2/en active Active
- 2020-11-20 JP JP2022533316A patent/JP7595669B2/ja active Active
- 2020-11-20 GB GB2208634.2A patent/GB2605097A/en active Pending
- 2020-11-20 WO PCT/IB2020/060964 patent/WO2021116803A1/en not_active Ceased
- 2020-11-20 DE DE112020005262.1T patent/DE112020005262T5/de active Pending
- 2020-11-20 CN CN202080084813.7A patent/CN114761973A/zh active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008152876A (ja) | 2006-12-19 | 2008-07-03 | Nec Electronics Corp | 半導体装置 |
| JP2019033234A (ja) | 2017-08-10 | 2019-02-28 | 株式会社半導体エネルギー研究所 | 半導体装置、および電子機器 |
| WO2019087500A1 (ja) | 2017-11-02 | 2019-05-09 | Tdk株式会社 | ニューロモルフィック素子を含むアレイ装置およびニューラルネットワークシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| GB2605097A (en) | 2022-09-21 |
| KR102738472B1 (ko) | 2024-12-05 |
| DE112020005262T5 (de) | 2022-07-28 |
| WO2021116803A1 (en) | 2021-06-17 |
| KR20220092524A (ko) | 2022-07-01 |
| US11120864B2 (en) | 2021-09-14 |
| CN114761973A (zh) | 2022-07-15 |
| US20210174858A1 (en) | 2021-06-10 |
| JP2023505178A (ja) | 2023-02-08 |
| AU2020399273B2 (en) | 2023-11-23 |
| AU2020399273A1 (en) | 2022-05-26 |
| GB202208634D0 (en) | 2022-07-27 |
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