JP6460111B2 - 圧電共振器の製造方法および圧電共振器 - Google Patents
圧電共振器の製造方法および圧電共振器 Download PDFInfo
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- JP6460111B2 JP6460111B2 JP2016539889A JP2016539889A JP6460111B2 JP 6460111 B2 JP6460111 B2 JP 6460111B2 JP 2016539889 A JP2016539889 A JP 2016539889A JP 2016539889 A JP2016539889 A JP 2016539889A JP 6460111 B2 JP6460111 B2 JP 6460111B2
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- Prior art keywords
- piezoelectric
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- support
- sacrificial layer
- piezoelectric resonator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000004519 manufacturing process Methods 0.000 title claims description 29
- 238000000034 method Methods 0.000 title claims description 23
- 239000010410 layer Substances 0.000 claims description 133
- 239000000758 substrate Substances 0.000 claims description 68
- 239000010409 thin film Substances 0.000 claims description 43
- 238000005498 polishing Methods 0.000 claims description 11
- 238000005530 etching Methods 0.000 claims description 6
- 239000012790 adhesive layer Substances 0.000 claims description 4
- 238000007790 scraping Methods 0.000 claims 1
- 239000000463 material Substances 0.000 description 9
- 239000000853 adhesive Substances 0.000 description 6
- 230000001070 adhesive effect Effects 0.000 description 6
- 239000012528 membrane Substances 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- ATPYWZKDGYKXIM-UHFFFAOYSA-N acetic acid phosphoric acid Chemical compound CC(O)=O.CC(O)=O.CC(O)=O.OP(O)(O)=O ATPYWZKDGYKXIM-UHFFFAOYSA-N 0.000 description 2
- 238000003776 cleavage reaction Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 230000007017 scission Effects 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
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- -1 hydrogen ions Chemical class 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02228—Guided bulk acoustic wave devices or Lamb wave devices having interdigital transducers situated in parallel planes on either side of a piezoelectric layer
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/173—Air-gaps
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/25—Constructional features of resonators using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H2003/021—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks the resonators or networks being of the air-gap type
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Description
20:圧電薄膜
21:表面電極
22:裏面電極
30,30A,300:支持層
31,41A:凹部
40:支持基板
50:接着材料
60:空間
600:犠牲層
Claims (4)
- 圧電基板の裏面に犠牲層を形成する工程と、
前記圧電基板の裏面に支持層を形成する工程と、
前記支持層および前記犠牲層を削って、前記支持層に対して前記犠牲層が凹む凹部を形成する工程と、
前記凹部が形成される側の前記支持層の面に、支持基板を接着する工程と、
前記犠牲層を除去する工程と、
を有する、圧電共振器の製造方法。 - 前記凹部を形成する工程は、
前記支持層および前記犠牲層の研磨によって前記凹部を形成する、
請求項1に記載の圧電共振器の製造方法。 - 前記凹部を形成する工程は、
前記支持層および前記犠牲層のエッチングによって前記凹部を形成する、
請求項1に記載の圧電共振器の製造方法。 - 圧電薄膜と、
該圧電薄膜の裏面側に配置された支持基板と、
前記圧電薄膜と前記支持基板との間に空間を設けるように、前記圧電薄膜を前記支持基板に固定する支持層と、
前記支持基板における前記圧電薄膜側の面に形成された接着層と、を備え、
前記接着層における前記支持基板と前記支持層とが接着する部分の一部の厚さは、前記接着層における前記支持基板が前記支持層に接着していない部分の厚さよりも薄い、
圧電共振器。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014159387 | 2014-08-05 | ||
| JP2014159387 | 2014-08-05 | ||
| PCT/JP2015/067410 WO2016021304A1 (ja) | 2014-08-05 | 2015-06-17 | 圧電共振器の製造方法および圧電共振器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2016021304A1 JPWO2016021304A1 (ja) | 2017-04-27 |
| JP6460111B2 true JP6460111B2 (ja) | 2019-01-30 |
Family
ID=55263582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016539889A Active JP6460111B2 (ja) | 2014-08-05 | 2015-06-17 | 圧電共振器の製造方法および圧電共振器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10560065B2 (ja) |
| JP (1) | JP6460111B2 (ja) |
| CN (1) | CN106489238B (ja) |
| WO (1) | WO2016021304A1 (ja) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016098526A1 (ja) * | 2014-12-18 | 2016-06-23 | 株式会社村田製作所 | 弾性波装置及びその製造方法 |
| US11832521B2 (en) | 2017-10-16 | 2023-11-28 | Akoustis, Inc. | Methods of forming group III-nitride single crystal piezoelectric thin films using ordered deposition and stress neutral template layers |
| US11070184B2 (en) * | 2016-03-11 | 2021-07-20 | Akoustis, Inc. | Piezoelectric acoustic resonator manufactured with piezoelectric thin film transfer process |
| US11411169B2 (en) | 2017-10-16 | 2022-08-09 | Akoustis, Inc. | Methods of forming group III piezoelectric thin films via removal of portions of first sputtered material |
| US11581866B2 (en) | 2016-03-11 | 2023-02-14 | Akoustis, Inc. | RF acoustic wave resonators integrated with high electron mobility transistors including a shared piezoelectric/buffer layer and methods of forming the same |
| US10355659B2 (en) * | 2016-03-11 | 2019-07-16 | Akoustis, Inc. | Piezoelectric acoustic resonator manufactured with piezoelectric thin film transfer process |
| US11424728B2 (en) * | 2016-03-11 | 2022-08-23 | Akoustis, Inc. | Piezoelectric acoustic resonator manufactured with piezoelectric thin film transfer process |
| US11411168B2 (en) | 2017-10-16 | 2022-08-09 | Akoustis, Inc. | Methods of forming group III piezoelectric thin films via sputtering |
| US11895920B2 (en) | 2016-08-15 | 2024-02-06 | Akoustis, Inc. | Methods of forming group III piezoelectric thin films via removal of portions of first sputtered material |
| US11736088B2 (en) | 2016-11-15 | 2023-08-22 | Global Communication Semiconductors, Llc | Film bulk acoustic resonator with spurious resonance suppression |
| US11856858B2 (en) | 2017-10-16 | 2023-12-26 | Akoustis, Inc. | Methods of forming doped crystalline piezoelectric thin films via MOCVD and related doped crystalline piezoelectric thin films |
| US11764750B2 (en) | 2018-07-20 | 2023-09-19 | Global Communication Semiconductors, Llc | Support structure for bulk acoustic wave resonator |
| US12155368B2 (en) | 2018-07-20 | 2024-11-26 | Global Communication Semiconductors, Llc | Support structure for bulk acoustic wave resonator |
| FR3088109A1 (fr) * | 2018-11-07 | 2020-05-08 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de fabrication d'un circuit de refroidissement |
| US11817839B2 (en) * | 2019-03-28 | 2023-11-14 | Global Communication Semiconductors, Llc | Single-crystal bulk acoustic wave resonator and method of making thereof |
| WO2021042344A1 (zh) * | 2019-09-05 | 2021-03-11 | 刘宇浩 | 一种体声波谐振装置及一种体声波滤波器 |
| WO2021042345A1 (zh) * | 2019-09-05 | 2021-03-11 | 刘宇浩 | 一种体声波谐振装置的形成方法 |
| US11909373B2 (en) | 2019-10-15 | 2024-02-20 | Global Communication Semiconductors, Llc | Bulk acoustic resonator structures with improved edge frames |
| US11618968B2 (en) | 2020-02-07 | 2023-04-04 | Akoustis, Inc. | Apparatus including horizontal flow reactor with a central injector column having separate conduits for low-vapor pressure metalorganic precursors and other precursors for formation of piezoelectric layers on wafers |
| US12102010B2 (en) | 2020-03-05 | 2024-09-24 | Akoustis, Inc. | Methods of forming films including scandium at low temperatures using chemical vapor deposition to provide piezoelectric resonator devices and/or high electron mobility transistor devices |
| US12011715B2 (en) * | 2020-11-11 | 2024-06-18 | International Business Machines Corporation | Tailorable electrode capping for microfluidic devices |
| US12329035B2 (en) | 2021-06-29 | 2025-06-10 | Global Communication Semiconductors, Llc | Bulk acoustic wave resonator with improved structures |
| WO2023058769A1 (ja) * | 2021-10-08 | 2023-04-13 | 株式会社村田製作所 | 弾性波装置の製造方法 |
| WO2023058768A1 (ja) * | 2021-10-08 | 2023-04-13 | 株式会社村田製作所 | 弾性波装置の製造方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3298291B2 (ja) * | 1994-03-07 | 2002-07-02 | 富士電機株式会社 | 複合素子および貼り合わせ基板の製造方法 |
| US6914367B2 (en) * | 2000-07-06 | 2005-07-05 | Kabushiki Kaisha Toshiba | Surface acoustic wave device and method of manufacturing the device |
| KR100662865B1 (ko) * | 2003-10-08 | 2007-01-02 | 삼성전자주식회사 | 박막 벌크 음향 공진기 및 그 제조방법 |
| JP4534158B2 (ja) * | 2003-12-19 | 2010-09-01 | 宇部興産株式会社 | 圧電薄膜デバイスの製造方法 |
| CN100550619C (zh) * | 2006-02-16 | 2009-10-14 | 精工爱普生株式会社 | 拉姆波式高频设备、拉姆波式高频设备的制造方法 |
| JP4315174B2 (ja) * | 2006-02-16 | 2009-08-19 | セイコーエプソン株式会社 | ラム波型高周波デバイスの製造方法 |
| JP2008131356A (ja) * | 2006-11-21 | 2008-06-05 | Toshiba Corp | 薄膜圧電共振子およびその製造方法 |
| JP5111281B2 (ja) * | 2008-07-31 | 2013-01-09 | 京セラ株式会社 | 圧電共振器およびその製造方法 |
| JP5152410B2 (ja) * | 2009-06-09 | 2013-02-27 | 株式会社村田製作所 | 圧電デバイスの製造方法 |
| DE112010004178B4 (de) * | 2009-10-30 | 2018-08-23 | Murata Manufacturing Co., Ltd. | Piezoelektrisches Bauelement und Verfahren zur Herstellung eines piezoelektrischen Bauelements |
| JP2013214954A (ja) * | 2012-03-07 | 2013-10-17 | Taiyo Yuden Co Ltd | 共振子、周波数フィルタ、デュプレクサ、電子機器及び共振子の製造方法 |
-
2015
- 2015-06-17 WO PCT/JP2015/067410 patent/WO2016021304A1/ja not_active Ceased
- 2015-06-17 JP JP2016539889A patent/JP6460111B2/ja active Active
- 2015-06-17 CN CN201580036972.9A patent/CN106489238B/zh active Active
-
2017
- 2017-01-03 US US15/396,840 patent/US10560065B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20170149405A1 (en) | 2017-05-25 |
| US10560065B2 (en) | 2020-02-11 |
| JPWO2016021304A1 (ja) | 2017-04-27 |
| WO2016021304A1 (ja) | 2016-02-11 |
| CN106489238B (zh) | 2019-04-12 |
| CN106489238A (zh) | 2017-03-08 |
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