JP5069191B2 - 光学読み取り装置 - Google Patents
光学読み取り装置 Download PDFInfo
- Publication number
- JP5069191B2 JP5069191B2 JP2008213833A JP2008213833A JP5069191B2 JP 5069191 B2 JP5069191 B2 JP 5069191B2 JP 2008213833 A JP2008213833 A JP 2008213833A JP 2008213833 A JP2008213833 A JP 2008213833A JP 5069191 B2 JP5069191 B2 JP 5069191B2
- Authority
- JP
- Japan
- Prior art keywords
- angle
- illumination light
- light source
- illumination
- dark field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/141—Control of illumination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Multimedia (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
- Studio Devices (AREA)
- Structure And Mechanism Of Cameras (AREA)
- Image Input (AREA)
- Facsimile Scanning Arrangements (AREA)
Description
200 光学読み取り装置
203 ハウジング
211 撮像素子
212 後群レンズ
213 前群レンズ
214 全反射ミラー
215 ハーフミラー
221 LED
222 コンデンサレンズ
231 LED
241a、241a 透孔
242、242 ナット
243、243 長孔
244、244 アーム
245 支持部
250 支持部材
Claims (2)
- 被写体の画像を読み取る撮影光学系および撮像素子を有する光学読み取り装置において、
前記撮影光学系の光軸に不一致な照明角度で前記被写体を照明する暗視野照明光源と、
前記暗視野照明光源の照明光を前記被写体方向に反射させる反射手段と、
前記暗視野照明光源の照明光により直接被写体を照明する第1の照明角度、または、前記暗視野照明光源の照明光の前記反射手段を介した反射によって前記被写体を照明する第2の照明角度のいずれかを得られるように前記暗視野照明光源の角度および位置を調節する調節手段を有し、
前記反射手段が、前記撮影光学系の近傍に配置された、前記暗視野照明光源とは異なる明視野照明光源および低角度暗視野照明光源を用いた照明光学系に含まれ、
前記低角度暗視野照明光源が光軸との入射角度が1°乃至3°の第1低角度暗視野照明光源と、光軸との入射角度が3°乃至5°の第2低角度暗視野照明光源からなることを特徴とする光学読み取り装置。 - 請求項1に記載の光学読み取り装置において、前記反射手段の反射角度を調節する手段を有することを特徴とする光学読み取り装置。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008213833A JP5069191B2 (ja) | 2008-08-22 | 2008-08-22 | 光学読み取り装置 |
| US12/461,782 US8243134B2 (en) | 2008-08-22 | 2009-08-21 | Optical reader capable of changing the incident angle of dark field illumination |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008213833A JP5069191B2 (ja) | 2008-08-22 | 2008-08-22 | 光学読み取り装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010049528A JP2010049528A (ja) | 2010-03-04 |
| JP5069191B2 true JP5069191B2 (ja) | 2012-11-07 |
Family
ID=41696000
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008213833A Expired - Fee Related JP5069191B2 (ja) | 2008-08-22 | 2008-08-22 | 光学読み取り装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8243134B2 (ja) |
| JP (1) | JP5069191B2 (ja) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9575008B2 (en) * | 2014-02-12 | 2017-02-21 | ASA Corporation | Apparatus and method for photographing glass in multiple layers |
| US9298647B2 (en) | 2014-08-25 | 2016-03-29 | HGST Netherlands B.V. | Method and apparatus to generate zero content over garbage data when encryption parameters are changed |
| AU2016232975C1 (en) | 2015-03-13 | 2021-11-25 | Genea Ip Holdings Pty Limited | Method and apparatus for microscopy |
| US10302598B2 (en) | 2016-10-24 | 2019-05-28 | General Electric Company | Corrosion and crack detection for fastener nuts |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05223532A (ja) * | 1991-07-10 | 1993-08-31 | Raytheon Co | 自動視覚検査システム |
| US5737122A (en) * | 1992-05-01 | 1998-04-07 | Electro Scientific Industries, Inc. | Illumination system for OCR of indicia on a substrate |
| JP3386269B2 (ja) * | 1995-01-25 | 2003-03-17 | 株式会社ニュークリエイション | 光学検査装置 |
| JP3980722B2 (ja) * | 1997-04-03 | 2007-09-26 | 株式会社モリテックス | Ccdマイクロスコープ |
| US5933521A (en) * | 1997-06-23 | 1999-08-03 | Pasic Engineering, Inc. | Wafer reader including a mirror assembly for reading wafer scribes without displacing wafers |
| US6667762B1 (en) * | 1998-05-29 | 2003-12-23 | Robotic Vision Systems, Inc. | Miniature inspection system |
| US6870949B2 (en) * | 2003-02-26 | 2005-03-22 | Electro Scientific Industries | Coaxial narrow angle dark field lighting |
| US7823783B2 (en) * | 2003-10-24 | 2010-11-02 | Cognex Technology And Investment Corporation | Light pipe illumination system and method |
| JP4825426B2 (ja) * | 2005-01-31 | 2011-11-30 | 財団法人 東京都医学総合研究所 | 生物顕微鏡に用いる暗視野照明装置 |
| US20070153084A1 (en) * | 2005-12-30 | 2007-07-05 | George Deveau | Semiconductor wafer reader and illumination system |
| JP3142994U (ja) * | 2008-04-22 | 2008-07-03 | 株式会社渋谷光学 | 暗視野照明装置 |
-
2008
- 2008-08-22 JP JP2008213833A patent/JP5069191B2/ja not_active Expired - Fee Related
-
2009
- 2009-08-21 US US12/461,782 patent/US8243134B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US8243134B2 (en) | 2012-08-14 |
| US20100045807A1 (en) | 2010-02-25 |
| JP2010049528A (ja) | 2010-03-04 |
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