JP2791448B2 - Light emitting diode - Google Patents
Light emitting diodeInfo
- Publication number
- JP2791448B2 JP2791448B2 JP11691291A JP11691291A JP2791448B2 JP 2791448 B2 JP2791448 B2 JP 2791448B2 JP 11691291 A JP11691291 A JP 11691291A JP 11691291 A JP11691291 A JP 11691291A JP 2791448 B2 JP2791448 B2 JP 2791448B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- emitting diode
- light emitting
- type
- doped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 claims description 15
- 229910002601 GaN Inorganic materials 0.000 claims description 11
- 150000001875 compounds Chemical class 0.000 claims description 11
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 10
- 125000005842 heteroatom Chemical group 0.000 claims description 2
- 244000309464 bull Species 0.000 claims 1
- 238000005253 cladding Methods 0.000 description 15
- 229910052594 sapphire Inorganic materials 0.000 description 4
- 239000010980 sapphire Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 239000002019 doping agent Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- -1 gallium nitride compound Chemical class 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Landscapes
- Recrystallisation Techniques (AREA)
- Led Devices (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は窒化ガリウム系化合物半
導体よりなる発光ダイオードに係り、特に発光効率が高
く、高輝度、かつ色純度の良い、発光ダイオードに関す
るものである。The present invention relates to a gallium nitride-based compound
Relates to a light emitting diode made of a conductor, particularly high emission efficiency, high brightness, and good color purity, the present invention relates to a light emitting diode.
【0002】[0002]
【従来の技術】現在、窒化ガリウム系化合物半導体を使
用した青色発光ダイオードは、図2に示すMIS構造の
ものがよく知られている。2. Description of the Related Art At present, a blue light emitting diode using a gallium nitride compound semiconductor has a well-known MIS structure shown in FIG.
【0003】一般にMIS構造の青色発光ダイオード
は、基本的に、サファイア基板1上に、AlNよりなる
バッファ層2、Siドープn型GaXAl1-XN層3、Z
nドープi型GaXAl1-XN層4が順に積層され、3お
よび4から電極が取り出された構造となっている。この
ようなMIS構造の窒化ガリウム系化合物半導体を有す
る青色発光ダイオードは、他のp-n接合を有する半導
体材料、例えばGaAlAs、GaP等よりなる赤色発
光ダイオード、緑色発光ダイオードに比較して発光効率
が低く、また輝度が低いために、実用化するには未だ不
十分であった。In general, a blue light emitting diode having an MIS structure basically includes a sapphire substrate 1, a buffer layer 2 made of AlN, a Si-doped n-type Ga x Al 1 -x N layer 3,
n-doped i-type Ga X Al 1-X N layer 4 are laminated in this order, the electrodes 3 and 4 has a retrieved structure. The blue light-emitting diode having such a MIS structure gallium nitride-based compound semiconductor has a higher luminous efficiency than other semiconductor materials having a pn junction, for example, a red light-emitting diode made of GaAlAs, GaP, or the like, or a green light-emitting diode. Because of the low brightness and low brightness, it was still insufficient for practical use.
【0004】[0004]
【発明が解決しようとする課題】なぜ、上記MIS構造
の青色発光ダイオードしか実用化できないかというと、
発光する活性層を得るため、p型ドーパントとしてのZ
nを窒化ガリウム系化合物半導体にドープしても、p型
にはならず、高抵抗のi型にしかならないからである。
なおここでいう高抵抗のi型とは抵抗率108Ω・cm以上
をいう。The reason why only the blue light emitting diode having the MIS structure can be put to practical use is as follows.
To obtain a light emitting active layer, Z as a p-type dopant
This is because even if n is doped into a gallium nitride-based compound semiconductor, the semiconductor does not become p-type and becomes only high-resistance i-type.
Note that the high-resistance i-type here means a resistivity of 10 8 Ω · cm or more.
【0005】またp型ドーパントとしてZnの代わり
に、Mgをドープしてp型層を得ようとする試みもあ
り、一応、Mgをドープすると低抵抗のp型層は得られ
る。しかしながら、そのp型層の発光波長は、青色より
短波長の紫色であるため、Mgが発光中心となる構造の
p-n接合では色純度の良い青色発光ダイオードを得る
ことは不可能であった。There is also an attempt to obtain a p-type layer by doping Mg instead of Zn as a p-type dopant, and a low-resistance p-type layer can be obtained by doping Mg. However, since the emission wavelength of the p-type layer is violet having a wavelength shorter than that of blue, it is impossible to obtain a blue light-emitting diode having good color purity by using a pn junction having a structure in which Mg is the emission center. .
【0006】以上述べたように、窒化ガリウム系化合物
半導体を使用してp-n接合の青色発光ダイオードを得
ることは非常に困難であるため、現在ではMIS構造の
青色発光ダイオードしかできていないのが実状である。As described above, it is very difficult to obtain a pn junction blue light-emitting diode using a gallium nitride-based compound semiconductor, so that only a MIS structure blue light-emitting diode is currently available. Is the actual situation.
【0007】周知のように、発光出力に代表される発光
特性、信頼性等を考慮するとMIS構造よりも、p-n
接合が有利であるのは常識であり、一刻も早く、p-n
接合青色発光ダイオードの実現が強く望まれている。As is well known, in consideration of light emission characteristics represented by light emission output, reliability, and the like, the pn structure is more pn-type than the MIS structure.
It is common sense that joining is advantageous, as soon as possible, pn
The realization of a junction blue light emitting diode is strongly desired.
【0008】従って、本発明は上記事情を鑑みて成され
たものであり、発光する活性層をp型層とn型層ではさ
む構造の発光ダイオードを実現することにより、高効率
で、高輝度かつ色純度等の発光特性に優れた発光ダイオ
ードを提供することを目的とする。Accordingly, the present invention has been made in view of the above circumstances, and realizes a light emitting diode having a structure in which a light emitting active layer is sandwiched between a p-type layer and an n-type layer, thereby achieving high efficiency and high luminance. An object of the present invention is to provide a light emitting diode having excellent light emitting characteristics such as color purity.
【0009】[0009]
【課題を解決するための手段】本発明は、窒化ガリウム
系化合物半導体よりなるダブルへテロ構造の発光ダイオ
ードであって、Ga X Al 1-X N(但しXは0<X≦1の範
囲にある。)よりなるバッファ層と、Siがドープされ
たn型のクラッド層と、Znがドープされた発光する活
性層と、さらに、Mgがドープされたp型のクラッド層
とを具備していることを特徴とする。 SUMMARY OF THE INVENTION The present invention provides gallium nitride.
Diodes with Double Heterostructures Made of Palladium-Based Compound Semiconductors
Ga X Al 1 -X N (where X is in the range of 0 <X ≦ 1).
In the box. ) And a Si-doped buffer layer
N-type cladding layer and Zn-doped light emitting
Layer and Mg-doped p-type cladding layer
And characterized in that:
【0010】[0010]
【実施例】本発明の一実施例に係る発光ダイオードの構
造を 図1にしめす。図1に示す本発明の発光ダイオード
は、サファイア基板1上に、GaXAl1-XN(0<X≦
1)よりなるバッファ層12、Siがドープされたn型
のクラッド層であるSiドープn型GaXAl1-XN層3
(以下n型クラッド層という。)、Znがドープされた
発光する活性層であるZnドープGaXAl1-XN層14
(以下活性層という。)、Mgがドープされたp型のク
ラッド層であるMgドープp型GaXAl1-XN層5(以
下p型クラッド層という。)が順に積層され、さらに、
3および5から電極が取り出された構造となっている。 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The structure of a light emitting diode according to one embodiment of the present invention.
The structure is shown in FIG. The light emitting diode of the present invention shown in FIG. 1 has a structure in which Ga X Al 1 -XN (0 <X ≦
1) buffer layer 12 composed of 1) Si-doped n-type Ga x Al 1 -x N layer 3 which is an n-type clad layer doped with Si
(Hereinafter referred to as an n-type cladding layer), a Zn-doped Ga x Al 1 -xN layer 14 which is a light emitting active layer doped with Zn.
(Hereinafter, referred to as an active layer), and a Mg-doped p-type Ga x Al 1-x N layer 5 (hereinafter, referred to as a p-type cladding layer) which is a p-type cladding layer doped with Mg.
Electrodes are taken out of 3 and 5.
【0011】バッファ層12は、その上に積層する窒化
ガリウム系化合物半導体層の結晶性を向上させるために
必要なものであり、通常数nm〜数百nm以下の厚さで
形成する。またバッファ層12はサファイア基板の他
に、n型クラッド層3、活性層14の上に形成しても良
い。The buffer layer 12 is necessary to improve the crystallinity of the gallium nitride-based compound semiconductor layer laminated thereon, and is usually formed to a thickness of several nm to several hundred nm or less. The buffer layer 12 may be formed on the n-type cladding layer 3 and the active layer 14 in addition to the sapphire substrate.
【0012】活性層14は、Znを発光中心とし、発光
波長のピークはおよそ470〜480nmにある。The active layer 14 has Zn as an emission center, and has a peak emission wavelength at about 470 to 480 nm.
【0013】本発明の発光ダイオードにおいて、バッフ
ァ層12の作用は、本発明者が先に出願した特願平3−
32259号において詳しく述べている。簡単にいうと
バッファ層の材料を、従来のAlNとするよりも、Ga
XAl1-XN(0<X≦1)とする方が、その上に成長さ
せる窒化ガリウム系化合物半導体の結晶性が格段に向上
し、その上に成長させるMgドープのGaXAl1-XN層
が容易にp型化するということである。In the light-emitting diode of the present invention, the function of the buffer layer 12 is described in Japanese Patent Application No. Hei.
No. 32259 describes this in detail. Simply put, the material of the buffer layer is more Ga than the conventional AlN.
When XAl 1 -XN (0 <X ≦ 1) is satisfied, the crystallinity of the gallium nitride-based compound semiconductor grown thereon is remarkably improved, and Mg-doped Ga X Al 1- grown on the gallium nitride-based compound semiconductor is further improved. This means that the XN layer easily becomes p-type.
【0014】またバッファ層12の材料をGaXAl1-X
N(0<X≦1)とすることにより、活性層14におい
ても、AlNをバッファ層とした従来のi型GaXAl
1-XN層4に比べ、格段に結晶性が向上するため、抵抗
率も105Ω・cm以下となる。The material of the buffer layer 12 is Ga x Al 1 -x
By setting N (0 <X ≦ 1), also in the active layer 14, the conventional i-type Ga x Al
Since the crystallinity is remarkably improved as compared with the 1-X N layer 4, the resistivity becomes 10 5 Ω · cm or less.
【0015】従って、発光ダイオードを上記のような構
造とすると、p型クラッド層5が容易にp型となるた
め、p型クラッド層5を+(プラス)側にして、n型ク
ラッド層3を−(マイナス)側にして電流を流すと、p
型クラッド層5からは活性層4にホールが注入され、同
時にn型クラッド層3からは電子が注入され、発光層で
ある活性層4でホールと電子が再結合し、Znを発光中
心として色純度の良い青色の発光を示す。Therefore, when the light emitting diode has the above structure , the p- type cladding layer 5 easily becomes p-type.
When a current is caused to flow by setting the p- type cladding layer 5 to the + (plus) side and the n-type cladding layer 3 to the-(minus) side, p
Holes are injected into the active layer 4 from the mold cladding layer 5 and electrons are injected from the n-type cladding layer 3 at the same time. The holes and electrons are recombined in the active layer 4 which is the light emitting layer, and the color is emitted with Zn as the emission center. It emits blue light with good purity.
【0016】上記のように、このバッファ層12なしで
は、p型層が得られず、本発明の構造の発光ダイオード
を得ることは不可能である。As described above, without the buffer layer 12, a p-type layer cannot be obtained, and it is impossible to obtain a light emitting diode having the structure of the present invention.
【0017】[0017]
【発明の効果】以上述べたように、本発明の発光ダイオ
ードは、p型およびn型の窒化ガリウム系化合物半導体
層で発光する活性層をはさみ、電子とホールとを活性層
に注入して発光させる、例えばダブルへテロ構造の発光
ダイオードの発光メカニズムと同一であり、それはMI
S構造の発光ダイオードに比べ、高効率、かつ高輝度
で、色純度の良い発光ダイオードを実現することができ
る。しかも、本発明では、Ga X Al 1-X N(0<X≦
1)よりなるバッファ層と、Siをドープしたn型のク
ラッド層と、Znをドープした活性層と、Mgをドープ
したp型のクラッド層との組み合わせにより、高輝度な
窒化物半導体よりなる発光ダイオードを実現できる。 As described above, the light-emitting diode of the present invention sandwiches an active layer that emits light between p-type and n-type gallium nitride-based compound semiconductor layers and activates electrons and holes. The light emission mechanism is the same as that of a light emitting diode having a double hetero structure, for example, by injecting the light into the layer.
Compared to the light emitting diodes of the S structure, high efficiency, and high brightness, it is possible to realize a color purity with good light-emitting diodes. Moreover, in the present invention, Ga X Al 1 -X N (0 <X ≦
1) and an n-type silicon doped with Si.
Lad layer, active layer doped with Zn, and doped with Mg
Combination with the p-type cladding layer
A light emitting diode made of a nitride semiconductor can be realized.
【0018】さらに本発明の発光ダイオードはバッファ
層にGaXAl1-XN(0<X≦1)を有しているため、
サファイア基板上に積層した化合物半導体の結晶性が非
常に良くなる。そのため、AlNバッファ層の上に積層
したp型クラッド層と、本発明の構成要件であるGaX
Al1-XN(0<X≦1)バッファ層の上に形成したp型
クラッド層とでは、その結晶性が格段に異なるのであ
る。従って優れた結晶性を有する本発明の発光ダイオー
ドが当然輝度が高くなる。Further, since the light emitting diode of the present invention has Ga x Al 1 -x N (0 <x ≦ 1) in the buffer layer,
The crystallinity of the compound semiconductor laminated on the sapphire substrate is significantly improved. Therefore, the p-type clad layer laminated on the AlN buffer layer and the Ga x
The crystallinity of the p-type cladding layer formed on the Al 1-x N (0 <x ≦ 1) buffer layer is significantly different. Therefore, the light emitting diode of the present invention having excellent crystallinity naturally has high luminance.
【図1】 本発明の発光ダイオードの構造を示す断面
図。FIG. 1 is a cross-sectional view illustrating a structure of a light emitting diode of the present invention.
【図2】 従来の発光ダイオードの構造を示す断面図。FIG. 2 is a cross-sectional view illustrating a structure of a conventional light emitting diode.
1・・・サファイア基板 2・・・AlNバッファ層 3・・・n型クラッド層 4・・・i型GaXAl1-XN層 5・・・p型クラッド層 12・・・GaXAl1-XN(0<X≦1)バッファ層 14・・・活性層1 ... sapphire substrate 2 ... AlN buffer layer 3 ... n-type cladding layer 4 ... i-type Ga X Al 1-X N layer 5 ... p-type cladding layer 12 ... Ga X Al 1-X N (0 <X ≦ 1) buffer layer 14 ... active layer
Claims (1)
ブルへテロ構造の発光ダイオードであって、GaXAl
1-XN(但しXは0<X≦1の範囲にある。)よりなるバ
ッファ層と、Siがドープされたn型のクラッド層と、
Znがドープされた発光する活性層と、さらに、Mgが
ドープされたp型のクラッド層とを具備していることを
特徴とする発光ダイオード。 1. A semiconductor comprising a gallium nitride-based compound semiconductor.
A light emitting diode having a bull hetero structure, wherein Ga X Al
A buffer layer made of 1-X N (where X is in the range of 0 <X ≦ 1); an n-type clad layer doped with Si;
A light-emitting diode comprising: a light-emitting active layer doped with Zn; and a p-type clad layer doped with Mg .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11691291A JP2791448B2 (en) | 1991-04-19 | 1991-04-19 | Light emitting diode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11691291A JP2791448B2 (en) | 1991-04-19 | 1991-04-19 | Light emitting diode |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04321280A JPH04321280A (en) | 1992-11-11 |
JP2791448B2 true JP2791448B2 (en) | 1998-08-27 |
Family
ID=14698732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11691291A Expired - Fee Related JP2791448B2 (en) | 1991-04-19 | 1991-04-19 | Light emitting diode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2791448B2 (en) |
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JPS59228776A (en) * | 1983-06-10 | 1984-12-22 | Nippon Telegr & Teleph Corp <Ntt> | semiconductor heterojunction device |
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JPH0614564B2 (en) * | 1987-07-13 | 1994-02-23 | 日本電信電話株式会社 | Semiconductor light emitting element |
JP2795885B2 (en) * | 1989-03-30 | 1998-09-10 | 株式会社東芝 | Semiconductor light emitting diode |
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