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JP2023060560A - Method for joining highly crystalline carbon substrate and laminate - Google Patents

Method for joining highly crystalline carbon substrate and laminate Download PDF

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JP2023060560A
JP2023060560A JP2021170223A JP2021170223A JP2023060560A JP 2023060560 A JP2023060560 A JP 2023060560A JP 2021170223 A JP2021170223 A JP 2021170223A JP 2021170223 A JP2021170223 A JP 2021170223A JP 2023060560 A JP2023060560 A JP 2023060560A
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彰 平井
Akira Hirai
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Abstract

To provide a laminate joined body in which a multilayer film is formed of a graphene layer by a gentle bond by a van der Waals force in a thickness direction of a crystalline carbon substrate, is likely to be peeled and scattered by a comparatively small external force, and thermal conductivity is sacrificed by an organic adhesive in joining the substrates.SOLUTION: The present invention provides a crystalline carbon substrate with excellent flatness by covering a detailed part of a substrate with a metal atom by a vacuum film-formation process, forming an anchor effect, and further a carbide bond and an oxycarbide bond to form a strong bond, and with Sn, In or a low melting point metal film such as an alloy film is used as an uppermost layer, performing pressurization by a press surface mirror-finished at a temperature near a melting point or a temperature equal to or higher than the melting point, and a laminate in which thermal conductivity in a thickness direction is not impaired by joining the metals by atomic diffusion.SELECTED DRAWING: Figure 8

Description

本発明は,例えば半導体や電子機器,車載機器などの放熱・冷却機構用として用いられるグラファイトやグラフェン等の結晶性炭素基板材料に関し,表面に真空成膜により金属膜を形成することでハンドリング性を高めると同時に結晶性粒子の剥離飛散を防止し,さらには最表面層に低融点金属膜を形成し,当該金属同士を原子拡散接合することで,高い熱伝導率を維持した状態で厚さの厚い積層体を製造する方法および積層体を提供する。 The present invention relates to a crystalline carbon substrate material such as graphite or graphene, which is used as a heat dissipation/cooling mechanism for semiconductors, electronic devices, and in-vehicle devices. In addition, by forming a low melting point metal film on the outermost surface layer and atomic diffusion bonding between the metals, the thickness can be reduced while maintaining high thermal conductivity. Kind Code: A1 Methods and laminates for producing thick laminates are provided.

CPUをはじめとする回路の高速化や表示機器の高輝度化,車載機器の高密度電子化,自動車の電動化などにより当該機器は発熱しやすい状態となっている。当該機器の高温化,さらには高温部がスポット状態になることによる故障の誘発など信頼性の欠如となる可能性が高まっている。この対策の一つとして,発熱状態を素早く拡散して均質化し,さらには大気中など外部に放熱することが益々重要となっている。
手段としては,従来からアルミニウムや銅などの金属によるヒートシンクで放熱する構造や,熱導電性の良い金属や化合物の粒子を混錬したグリース状物質にしたり,シリコンポリマーなどに混ぜてシートにしたりすることで,発熱スポットの拡散均質化と放熱を行っている。
Due to the increasing speed of CPU circuits and other circuits, the increasing brightness of display devices, the high-density electronics of in-vehicle devices, and the electrification of automobiles, these devices tend to generate heat. There is an increasing possibility that the temperature of the equipment concerned will increase, and furthermore, failures will be induced due to the high temperature part becoming a spot state, resulting in a lack of reliability. As one of the countermeasures, it is becoming more and more important to quickly diffuse and homogenize the heat generation state, and furthermore, to dissipate the heat to the outside such as the atmosphere.
As a means, conventional heat sink structures made of metals such as aluminum and copper heat sinks, grease-like substances kneaded with particles of metals and compounds with good thermal conductivity, and sheets mixed with silicon polymers. As a result, the heat spot is diffused, homogenized and heat is dissipated.

熱の拡散機能として重要な指数の一つは熱伝導率(W/m・K)であり,例えば金属では銀が418,銅が398,アルミニウムが237で,ヒートシンクやヒートパイプとして銅やその合金が使用されることが多い。しかし,金属は比重が高く,例えば銅は8.96であり,少しでも軽くすることが要求される各種機器においては,高い熱伝導性粒子を混錬したポリマーシートを使用する。これは比重も小さくなり,形状も厚さも使用場所に則して比較的自由に対応することができる。課題は,熱伝導粒子と混錬する割合にもよるが,一般的にはグラファイト粒子などを混錬しても,10W/m・K程度の低い熱伝導率しか得られないことである。 One of the important indices for the heat diffusion function is the thermal conductivity (W/m・K). For example, silver is 418, copper is 398, aluminum is 237, and copper and its alloys are used as heat sinks and heat pipes. is often used. However, metals have a high specific gravity, for example copper has a specific gravity of 8.96, and in various devices that require even a slight reduction in weight, polymer sheets kneaded with highly thermally conductive particles are used. This also reduces the specific gravity, and the shape and thickness can be relatively freely adjusted according to the place of use. The problem is that, although it depends on the ratio of kneading with heat-conducting particles, in general, even if graphite particles are kneaded, only a low thermal conductivity of about 10 W/m·K can be obtained.

熱伝導材料としてカーボングラファイトで代表される高結晶性炭素化合物の基板を使用することで,結晶方向における熱伝導率は1,500W/m・Kを超える熱伝導率を得ることができる。高い熱伝導率のグラファイト基板を得るには,例えばポリイミドフィルムなどを3,000℃などの超高温度で炭化させる方法やCVD(化学気相成長法)によってグラフェン結晶体を長時間で成長させて製造する方法もある。 By using a substrate of a highly crystalline carbon compound typified by carbon graphite as a thermally conductive material, a thermal conductivity exceeding 1,500 W/m·K in the crystal direction can be obtained. In order to obtain a graphite substrate with high thermal conductivity, for example, a method of carbonizing a polyimide film at an ultra-high temperature of 3,000°C or a method of growing graphene crystals for a long time by CVD (chemical vapor deposition) is used. There is a way.

グラフェンは平面方向(x-y)には,炭素(C)同士が共有結合を形成して強固につながっているが,厚さ方向(z)はグラフェン層が積層された構造であり,層間の結合としては弱いvan der Waals力によるのみである。そのために層間もグラフェン単層内も外部からの衝撃などに対しては極めて弱く,容易に剥離して飛散することもある。 In the planar direction (x-y) of graphene, carbon (C) forms a covalent bond and is strongly connected, but in the thickness direction (z), the graphene layers are stacked, and the bonding between the layers is is only due to weak van der Waals forces. Therefore, both the interlayer and the graphene single layer are extremely weak against external impacts, and may easily peel off and scatter.

グラフェン層間の強度を高くするために,炭化するプロセスを工夫するなどして,積層グラフェン体を屈曲させた構造(図-1)などにすることでグラファイトシートとしてのバルク強度を確保しているが,ミクロ的な観点からは強度が向上したとは言い難い。また,このようなプロセスや構造のためにシート表面は凹凸が多く,表面粗さはRzで10μmを超える。
その一例としてレーザー顕微鏡による表面粗さの測定結果を表-1に示す。
表-1

Figure 2023060560000002
発熱体からの熱伝導を効率よく行うためには,発熱体との接触面積を増やさなければならないが,凹凸部分との接触が空気層となりやすいため,熱伝導量を低下させることになる。そのため,基板表面の平坦化は熱伝導量を向上させる有効な手段である。 In order to increase the strength between the graphene layers, the carbonization process is devised, and the bulk strength of the graphite sheet is ensured by bending the laminated graphene body (Fig. 1). , it is difficult to say that the strength has improved from a microscopic point of view. In addition, due to such processes and structures, the sheet surface has many irregularities, and the surface roughness exceeds 10 μm in terms of Rz.
As an example, Table 1 shows the results of surface roughness measurement using a laser microscope.
table 1
Figure 2023060560000002
In order to conduct heat efficiently from the heating element, the contact area with the heating element must be increased. Therefore, flattening the substrate surface is an effective means of improving the amount of heat conduction.

さらに前記したように結晶性グラファイトを製造するプロセスは,ポリイミドなどの有機高分子フィルムから超高温環境で脱水素反応をおこなってつくるため,グラファイトシートを構成するグラフェンの炭素原子は結合手の余った,いわゆるダングリングボンドとなっていることが多く,非常に反応性が高い。これは,電子スピン共鳴やトリアジン系化合物との吸着反応でC-S結合が発生していることなどから確認できた。
このようにグラフェン粒子は活性が非常に高いために,先行技術文献に記載されるように当該粒子が呼吸器系に与える影響についての注意喚起が行われている。
Furthermore, as mentioned above, the process of producing crystalline graphite involves the dehydrogenation of an organic polymer film such as polyimide in an ultra-high temperature environment. , so-called dangling bonds, which are highly reactive. This was confirmed by the electron spin resonance and the formation of CS bonds through adsorption reactions with triazine-based compounds.
Graphene particles are thus highly active, and as described in the prior art literature, attention has been drawn to the effects of such particles on the respiratory system.

結晶性グラファイトシート表面を金属で被覆する試みは,積層接合技術の検討の一つとして行われてきており,炭素と反応してカーバイド結合を形成するTi,Zr,Alなどの金属と触媒を使用して,高温下で反応させて積層接合する構造が特許文献1,あるいは特許文献2などに記載されている。しかし,いずれも800~1000℃程度の高い処理温度が必要とされている。 Attempts to coat the surface of crystalline graphite sheets with metal have been conducted as one of the studies of lamination bonding technology, using metals such as Ti, Zr, and Al that react with carbon to form carbide bonds, and catalysts. Patent Document 1, Patent Document 2, etc. describe a structure in which the layers are laminated and bonded by reacting them at a high temperature. However, all of them require a high treatment temperature of about 800 to 1000°C.

特開2015-532531(登録6529433)JP 2015-532531 (Registration 6529433) 特開2020-181926JP 2020-181926

産業技術総合研究所 剥離グラフェンの取り扱い(2017) National Institute of Advanced Industrial Science and Technology Handling of exfoliated graphene (2017)

超高温での脱水素反応によって熱伝導率の高い結晶性炭素基板を作るには,基板内部からの水素の抜けやすさの点から,完成した基板の厚さと熱伝導率はトレードオフの関係にあるため,薄い基板を作ってそれを有機系接着剤で複数枚積層する方法があるが,有機系接着剤の熱伝導率が低いため,厚さ方向の熱特性を大きく損なう。
ハンドリング性を高めるためにTiなどの金属と触媒を使用して,先行特許文献に記載されるようにカーバイド結合(例えばC-Ti)を作ることで金属板と接合させることができるが,800℃~1,000℃での高温処理が必要となる。
また,厚さ方向の結合はvan der Waals力によるため,外力に弱く比較的容易に基板から剥離飛散する。
In order to make a crystalline carbon substrate with high thermal conductivity by dehydrogenation reaction at an ultra-high temperature, there is a trade-off relationship between the thickness and thermal conductivity of the completed substrate, considering the ease with which hydrogen can escape from the inside of the substrate. Therefore, there is a method of making a thin substrate and laminating it with an organic adhesive, but the thermal conductivity of the organic adhesive is low, so the thermal properties in the thickness direction are greatly impaired.
Metals such as Ti and catalysts can be used to improve handleability and can be bonded to metal plates by creating carbide bonds (e.g., C-Ti) as described in prior patent documents, but at 800 ° C High temperature treatment at ~1,000°C is required.
In addition, since the bond in the thickness direction is based on the van der Waals force, it is weak against external forces and relatively easily peels off and scatters from the substrate.

本発明は,基板の表面を真空成膜プロセスにより圧倒的に低い基板温度,例えば室温程度で金属化することで,アンカー効果やカーバイド結合などを形成させてハンドリング性が向上した剥離飛散の無い結晶性炭素基板を提供する。
さらには,当該金属化基板の最表面を低融点金属とすることにより,複数枚の積層接合を,従来と比較して圧倒的に低い温度,例えば100℃~300℃程度で複数枚の基板を同時接合する方法および積層体を提供する。
In the present invention, the surface of the substrate is metallized at an extremely low substrate temperature, such as room temperature, by a vacuum deposition process, thereby forming an anchor effect and carbide bonds, etc., and handling is improved, and the crystal is free from peeling and scattering. provide a flexible carbon substrate.
Furthermore, by making the outermost surface of the metallized substrate a low-melting-point metal, it is possible to bond multiple substrates at an overwhelmingly lower temperature than before, such as around 100°C to 300°C. Methods and laminates for co-bonding are provided.

結晶性炭素基板は前記のように,多数層のグラフェン結晶体を基板シート内で屈曲させるなどしてバルクとしての強度を向上させている。その断面をFig.1に示す。また表面粗さは表-1に示すように,複数枚を接合するには平坦性に課題がある。Fig.2は, X線光電子分光分析(XPS分析)により炭素基板の深さ方向の組成を測定したものであるが,基板表面をArイオンビームでエッチングしたあとのスペクトルには,Ar2pスペクトルが観察され,炭素基板内にAr原子が補足されるほど微小な空間が存在していることが分かる。 As described above, the crystalline carbon substrate has multiple layers of graphene crystals bent within the substrate sheet to improve bulk strength. Its cross section is shown in Fig.1. As for the surface roughness, as shown in Table 1, there is a problem of flatness when joining multiple sheets. Figure 2 shows the composition in the depth direction of the carbon substrate measured by X-ray photoelectron spectroscopy (XPS analysis). The Ar2p spectrum was observed in the spectrum after the substrate surface was etched with an Ar ion beam. It can be seen that there is a space so small that Ar atoms can be trapped in the carbon substrate.

このような特徴を有する基板表面と金属板を高温で触媒により反応させても,炭素基板の微細な凹部の細部で反応することは難しい。しかし,本発明においては,真空成膜を利用すると,微細な部分まで金属原子が入り込むために,熱伝導率を低下させる空隙を減少させると同時に,アンカー効果が利用でき,基板と金属膜との密着性が向上する。さらには,成膜時に炭素原子と金属原子がプラズマによって活性化され,カーバイド結合やオキシカーバイド結合が形成されることがXPS分析で明らかにされ,従来は800℃以上の高温で触媒反応により形成された結合が,室温程度の温度で形成することができることを見いだした。 Even if the substrate surface having such characteristics and the metal plate are reacted with a catalyst at a high temperature, it is difficult to react in the details of the fine recesses of the carbon substrate. However, in the present invention, when vacuum film formation is used, the metal atoms enter even minute portions, so that the gaps that reduce the thermal conductivity can be reduced, and at the same time, the anchor effect can be used, and the substrate and the metal film can be separated. Adhesion is improved. Furthermore, XPS analysis revealed that carbon atoms and metal atoms are activated by plasma during deposition, forming carbide bonds and oxycarbide bonds. It was found that such bonds can be formed at temperatures around room temperature.

本発明における金属膜は,Ti,Si,Ni,Al,Fe,Cu,Sn,In,およびそれらの合金であって,TiやSiなどはカーバイド結合を形成して密着性を確保でき,カーバイド結合を形成しにくい金属であってもアンカー効果により十分な密着性を得ることができた。これによって,基板シートの強度を確保してハンドリング性を向上させ,さらには外力によって炭素基板が剥離して飛散することを防止することができ,安全性を大きく向上させることができる。 The metal film in the present invention is Ti, Si, Ni, Al, Fe, Cu, Sn, In, and alloys thereof, and Ti, Si, etc. can form carbide bonds to ensure adhesion. Sufficient adhesion could be obtained due to the anchor effect even with metals that are difficult to form. As a result, the strength of the substrate sheet can be ensured to improve handleability, and furthermore, the carbon substrate can be prevented from peeling off and scattering due to an external force, thereby greatly improving safety.

本発明においては,最表面の金属膜をSnやInなどの低融点金属あるいは合金とすることができ,用途に応じて下層にTiやSiなどの高融点金属を成膜した構造とすることも可能である。低融点金属の場合は,プレス装置によって平坦化することができ,プレス温度は融点近傍が好ましい。また,融点以上の温度でプレスし,融点以下の温度で圧力を開放することで,低いプレス圧で平坦化することが可能であり,この場合は融点よりも低い温度まで降温して圧力を開放することで,プレス面の平坦性を転写できる。この平坦性によって,発熱源やヒートシンクとの接触面積を増大することができ,それらが低融点金属と相互に原子拡散する場合は,熱伝導量を最大化できる。 In the present invention, the metal film on the outermost surface can be made of a low melting point metal such as Sn or In or an alloy, and depending on the application, it is also possible to have a structure in which a high melting point metal such as Ti or Si is deposited as a lower layer. It is possible. In the case of a low-melting-point metal, it can be flattened by a pressing device, and the pressing temperature is preferably near the melting point. In addition, by pressing at a temperature above the melting point and releasing the pressure at a temperature below the melting point, it is possible to flatten with a low pressing pressure.In this case, the temperature is lowered to a temperature lower than the melting point and the pressure is released. By doing so, the flatness of the press surface can be transferred. This flatness can increase the contact area with heat sources and heat sinks, and can maximize the amount of heat transfer when they interatomically diffuse with low-melting-point metals.

さらに本発明においては,結晶性炭素基板の最表面に成膜した低融点金属,例えばSn膜同士を接触させて原子を拡散させることにより接合することができる。これによって,複数枚の炭素基板同士を容易に積層接合させることができた。
一般的に,圧延などで製作したSn箔の表面酸化膜は比較的深くまで存在し,XPS分析では約20nm以上であり,箔同士を接合するには表面酸化膜を還元する必要があった。しかし,真空成膜したSn膜の表面酸化層は,成膜後相当の時間が経過しても1 nm以下であり,融点以上の温度で積層体をプレスすることで容易に接合することが分かった。
Furthermore, in the present invention, low-melting-point metal films, such as Sn films, deposited on the outermost surface of the crystalline carbon substrate can be brought into contact with each other and bonded by diffusing atoms. As a result, a plurality of carbon substrates could be easily laminated and bonded together.
In general, the surface oxide film of Sn foils produced by rolling or the like exists relatively deep, and the XPS analysis shows that it is approximately 20 nm or more, so it was necessary to reduce the surface oxide film in order to join the foils together. However, the oxidized layer on the surface of the vacuum-deposited Sn film is less than 1 nm even after a considerable amount of time has passed after the deposition, and it was found that the stack can be easily bonded by pressing the stack at a temperature above its melting point. rice field.

本発明は,真空成膜プロセスで炭素基板表面を金属化するが,あらかじめ基板に穴(ホール)加工をしてから真空成膜することでホールの内壁まで金属を成膜することができた。これにより表面からの金属膜によるアンカー効果だけでなく,ホールの内壁を金属膜で覆うことによって,van der Waals力だけの結合を大幅に強化できる。
ホールの径は50μm程度から500μm程度あるが,本発明はその径の大小で左右されるものではなく,ホール加工の密度も状況に応じて適宜決めることができる。ホール加工の方法は,レーザー加工でもドリルやパンチに具などの機械加工等でも良い。
In the present invention, the surface of a carbon substrate is metallized by a vacuum film-forming process. By performing vacuum film-forming after forming holes in the substrate in advance, metal can be formed on the inner walls of the holes. As a result, not only the anchoring effect of the metal film from the surface, but also the bonding by the van der Waals force can be significantly strengthened by covering the inner walls of the holes with the metal film.
Although the diameter of the holes ranges from about 50 μm to about 500 μm, the present invention is not influenced by the size of the diameter, and the density of hole processing can be determined appropriately according to the situation. The hole processing method may be laser processing or mechanical processing such as a drill or punch.

結晶性炭素基板の電子顕微鏡(SEM)断面写真(10,000倍)Electron microscope (SEM) cross-sectional photograph of a crystalline carbon substrate (10,000x) 結晶性炭素基板の電子顕微鏡(SEM)表面写真(300倍)Electron microscope (SEM) surface photograph of crystalline carbon substrate (300x) 結晶性炭素基板の表面のXPSスペクトルXPS spectrum of the surface of the crystalline carbon substrate 結晶性炭素基板上のTi膜の最上層と深さ約10nmのC1s スペクトルTop layer of Ti film on crystalline carbon substrate and C1s spectrum at a depth of about 10 nm 結晶性炭素基板上にSn膜(500 nm)を成膜したSEM写真(300倍)SEM photograph of a Sn film (500 nm) formed on a crystalline carbon substrate (300x magnification) 結晶性炭素基板表面にレーザー加工機でホール加工を施した光学顕微鏡写真Optical micrograph of the surface of a crystalline carbon substrate with holes processed by a laser processing machine 真空成膜によるホール加工部への金属原子の成膜状態分析Analysis of film formation state of metal atoms in hole processed parts by vacuum film formation 結晶性炭素基板の積層接合の模式図Schematic diagram of lamination bonding of crystalline carbon substrates Sn500nmを成膜した結晶性炭素基板上の酸化膜のXPS分析結果XPS analysis result of oxide film on crystalline carbon substrate with Sn500nm film 接合した炭素基板表面のSEM写真(100倍)SEM photograph of bonded carbon substrate surface (100x magnification)

図1は,代表的な結晶性炭素基板の断面のSEM写真(10,000倍)である。グラフェン層が折れ曲がった状態で積層されている。これによって,平坦性は失われるが,バルクとしての強度は確保される。 Figure 1 is a SEM photograph (10,000x magnification) of a cross section of a typical crystalline carbon substrate. The graphene layers are stacked in a bent state. As a result, flatness is lost, but strength as a bulk is ensured.

図2は,代表的な結晶性炭素基板表面のSEM写真(3,000倍)であり,凹凸や段差があることが分かる。また,段差の切れ目部分には一部剥離しかけた部分もあり,本発明による金属化ではこのようなものも固定化することができる。 Figure 2 is a SEM photograph (3,000x magnification) of a typical crystalline carbon substrate surface, showing unevenness and steps. In addition, there is a part that is about to peel off at the cut portion of the step, and such a part can be fixed by the metallization according to the present invention.

図3は,結晶性炭素基板の表面をArイオンビーム2kVで0.5分間エッチングしたもので,深さ約5nmのXPSスペクトルである。242eV近傍にAr2pのスペクトルが確認され,炭素基板内にAr原子が補足されており,非常に微細な空洞があることを示している。 FIG. 3 shows an XPS spectrum of a depth of about 5 nm obtained by etching the surface of a crystalline carbon substrate with an Ar ion beam of 2 kV for 0.5 minutes. An Ar2p spectrum is confirmed near 242 eV, indicating that Ar atoms are trapped in the carbon substrate and that there are very fine cavities.

Ti はグラファイトと非常に親和性が高い金属として知られているが,一般的には800℃以上の温度で触媒を使用して反応させ,Ti-Cのカーバイド結合を形成させ接合している。図4は,結晶性炭素基板にTi 膜を基板温度50℃で,200nmの厚さでスパッタリング成膜した基板の表面のXPS分析を行った例を示している。Ti膜最上層は,一般的な有機性の付着物に由来する284.8eV近傍にC1sスペクトルがあるが,これをXPS装置内でArイオンビーム(4kV)によりTi膜をエッチング除去すると,282eV近傍にピークを有するC-Tiカーバイド結合が形成され,これはTi膜が無くなる200nmの炭素基板との境界までC-Tiに起因する結合が観察される。 Ti is known to be a metal that has a very high affinity with graphite, but in general, it is reacted at a temperature of 800°C or higher using a catalyst to form a Ti-C carbide bond for bonding. Figure 4 shows an example of XPS analysis of the surface of a crystalline carbon substrate on which a Ti film was formed by sputtering at a substrate temperature of 50°C to a thickness of 200 nm. The top layer of the Ti film has a C1s spectrum near 284.8 eV, which is derived from general organic deposits. A C-Ti carbide bond with a peak is formed, and this bond due to C-Ti is observed up to the boundary with the 200 nm carbon substrate where the Ti film disappears.

図5は,結晶性炭素基板上に直接Sn金属を基板温度50℃で,厚さ約500nmを真空成膜したSEM写真である。図2と比較すると微小な平坦性が大きく改善されており,表面のグラファイト粒子の脱離防止,わずかな外力で基板が剥離飛散することを防止できることが分かる。
さらに平坦性を向上させるために,本発明においては,Snの融点近傍でのプレス,あるいは融点を少し超える温度,例えば235℃程度でプレスして温度を融点以下に降温してプレス圧を開放するとプレス盤の鏡面をSn膜面に転写することができる。
Figure 5 is an SEM image of a vacuum film of approximately 500 nm thick Sn metal deposited directly on a crystalline carbon substrate at a substrate temperature of 50°C. Compared with FIG. 2, the fine flatness is greatly improved, and it can be seen that the detachment of the graphite particles on the surface can be prevented, and the substrate can be prevented from peeling off and scattering due to a slight external force.
In order to further improve the flatness, in the present invention, pressing near the melting point of Sn, or at a temperature slightly above the melting point, for example, about 235 ° C, and then lowering the temperature below the melting point and releasing the press pressure. The specular surface of the press platen can be transferred to the Sn film surface.

図6は,波長532nmのピコ秒レーザーで加工したもので,ホール径が200μmの光学顕微鏡写真である。この基板に例としてAlを400nmスパッタリング成膜し,その断面の成分分析をSEM-EDSの結果である。図7に示すように,深さ25μmくらいまでは50 at%以上のAlの原子濃度が確認され,壁面の大半がAl金属で被覆されている。したがって,真空成膜を両面から行うことによって壁面全体を金属することができ,van der Waals力の弱い結合力で構成されているグラフェン層を深さ方向でも強化することができる。 FIG. 6 is an optical microscope photograph of a hole diameter of 200 μm processed by a picosecond laser with a wavelength of 532 nm. As an example, a 400 nm film of Al was sputtered on this substrate, and the composition analysis of its cross section is the result of SEM-EDS. As shown in FIG. 7, an Al atomic concentration of 50 at % or more is confirmed up to a depth of about 25 μm, and most of the wall surface is covered with Al metal. Therefore, by performing vacuum deposition from both sides, the entire wall surface can be metalized, and the graphene layer, which is composed of a weak van der Waals force, can be strengthened even in the depth direction.

本発明におけるホールは,Snなどの低融点金属を融点近傍や融点以上の温度でプレスした際に,プレス圧によっては余剰量となる当該金属をホールで吸収することができ,さらなる基板の強化となる。 The holes in the present invention are capable of absorbing the excess amount of the metal, such as Sn, which is in excess of the pressing pressure when the low melting point metal such as Sn is pressed at a temperature close to or above the melting point, thereby further strengthening the substrate. Become.

一般的に結晶性炭素基板の厚さ方向の熱伝導率は,5W/m/K程度であるが,本発明で使用する金属の熱伝導率(表-2)は当該基板の10~50倍以上であり,ホールへの充填率を上げることによって,ホールによる厚さ方向の熱伝導率の低下を防ぐだけでなく増加させることも可能である。
ホール面積S1,当該基板の熱伝導率η1で失われる伝導量S1×η1を,熱伝導率η2の材料で面積S2を充填したと考える。η1=5(W/m/K),S1=100とした場合,充填材料の熱伝導率η2=100W/m/Kと仮定すると,S2=5で等価となる。すなわち,この場合,充填面積5%以上であれば当該基板の厚さ方向の熱伝導率5W/m・Kを向上させることが可能となる。
表-2

Figure 2023060560000003
Generally, the thermal conductivity in the thickness direction of a crystalline carbon substrate is about 5 W/m/K, but the thermal conductivity of the metal used in the present invention (Table 2) is 10 to 50 times that of the substrate. As described above, by increasing the filling rate of the holes, it is possible not only to prevent the decrease in thermal conductivity in the thickness direction due to the holes, but also to increase it.
It is assumed that the hole area S1 and the conduction amount S1×η1 lost due to the thermal conductivity η1 of the substrate are filled in the area S2 with the material having the thermal conductivity η2. When η1 = 5 (W/m/K) and S1 = 100, assuming that the thermal conductivity of the filling material η2 = 100 W/m/K, S2 = 5 is equivalent. That is, in this case, if the filling area is 5% or more, it is possible to improve the thermal conductivity 5 W/m·K in the thickness direction of the substrate.
Table-2
Figure 2023060560000003

一般的に結晶性炭素基板の表面は活性に富んだダングリングボンドが存在するが,当該基板の面同士を直接接合することは難しく,厚みの厚い基板を作るには熱伝導性を犠牲にするか,もしくは化学気相成長法(CVD)プロセスによって,長時間反応させて作る方法などがある。
本発明は,結晶炭素基板表面を金属化,特に最上層に低融点金属等を真空成膜プロセスで成膜し,当該金属面を融点近傍,もしくは融点以上の温度でプレスして当該金属同士を相互に拡散せしめたのち,融点以下の温度で圧力を開放することで,厚みの厚い結晶性炭素基板の接合体を作ることができる。
In general, the surface of a crystalline carbon substrate has highly active dangling bonds, but it is difficult to directly bond the surfaces of the substrate, and the production of a thick substrate sacrifices thermal conductivity. Alternatively, the chemical vapor deposition (CVD) process can be used to react for a long period of time.
In the present invention, the surface of a crystalline carbon substrate is metallized, in particular, a low melting point metal or the like is formed on the uppermost layer by a vacuum film formation process, and the metal surface is pressed at a temperature near or above the melting point to bond the metals together. After mutually diffusing, the pressure is released at a temperature below the melting point, whereby a thick bonded body of crystalline carbon substrates can be produced.

図8はその装置の模式図であり,低融点合金膜2を最上層に成膜した結晶性炭素基板1を複数枚重ねてチャンバー4の加熱加圧できるステージ3の間にセットし,所定の温度プロファイルにしたがって加圧する。
一般的に圧延などで製作した金属箔,例えばSn箔は表面が約200nm程度までは酸化膜が存在することが分かっている。しかし,本発明によって真空成膜したSn膜は,図9に示すように表面の1~2nm程度しか参加されておらず,融点近傍あるいは融点以上の温度で機械的に圧力を印加すると容易に酸化膜が破壊され,Sn原子が相互に拡散し接合される。これにより,還元処理や還元雰囲気中で処理をしなくても接合されることが分かったが,還元処理や雰囲気を否定するものではない。
FIG. 8 is a schematic diagram of the apparatus. A plurality of crystalline carbon substrates 1 with a low-melting-point alloy film 2 formed on the uppermost layer are stacked and set between a stage 3 that can be heated and pressurized in a chamber 4. Apply pressure according to the temperature profile.
It is generally known that metal foils produced by rolling, such as Sn foils, have an oxide film on the surface up to about 200 nm. However, as shown in Fig. 9, the Sn film formed in a vacuum according to the present invention has only a thickness of about 1 to 2 nm on the surface, and is easily oxidized when mechanical pressure is applied at a temperature near or above the melting point. The film is destroyed, and Sn atoms are mutually diffused and bonded. As a result, it was found that the bonding can be achieved without reduction treatment or treatment in a reducing atmosphere, but this does not deny the reduction treatment or the atmosphere.

なお,本発明は平坦化や接合には最上層に低融点合金を使用するが,SnやInのみでなく,他の低融点金属を使用することができる。表3にJIS Z3282(2017)で規定されているSn系金属の一部を示す。
表-3

Figure 2023060560000004









Although the present invention uses a low-melting-point alloy for the uppermost layer for planarization and bonding, other low-melting-point metals can be used in addition to Sn and In. Table 3 shows some of the Sn-based metals specified in JIS Z3282 (2017).
Table-3
Figure 2023060560000004









以下のような材料や製法で本発明について説明するが,これらによって本発明が限定されるものではない。 Although the present invention will be explained with the following materials and manufacturing methods, the present invention is not limited by these.

結晶性炭素基板としてグラファイトシートGD-040フィルム(t=40μm)(Gurdnec社)を40mm×60mmにカットし,イソプロパノール中で5分間超音波洗浄を行い乾燥した。次に当該フィルムをスパッタリング成膜装置(MPS-3000:ULVAC)にセットし, Snターゲット(株式会社豊島製作所)を使用し,Ar雰囲気中で基板温度50℃,膜厚500nmのSn膜を形成した。 As a crystalline carbon substrate, a graphite sheet GD-040 film (t=40 μm) (Gurdnec) was cut into 40 mm×60 mm, ultrasonically cleaned in isopropanol for 5 minutes, and dried. Next, the film was set in a sputtering deposition system (MPS-3000: ULVAC), and a Sn target (Toshima Seisakusho Co., Ltd.) was used to form a Sn film with a thickness of 500 nm at a substrate temperature of 50°C in an Ar atmosphere. .

成膜した基板から20mm×20mmを切り出して,鏡面加工した石英ガラス基板(50mm×50mm×2mm)の間に挟んで,(株)ミックラボ社製温度調節器付き加熱加圧プレス機でプレスした。温度235℃で5MPa,5分間プレスし,220℃まで降温して圧力を開放して取り出した。 A 20 mm × 20 mm piece was cut from the film-formed substrate, sandwiched between mirror-finished quartz glass substrates (50 mm × 50 mm × 2 mm), and pressed with a heating and pressure press equipped with a temperature controller manufactured by Miclab Co., Ltd. It was pressed at a temperature of 235°C at 5 MPa for 5 minutes, cooled to 220°C, released the pressure, and taken out.

当該基板の表面粗さをLasertec社,OPTELICS Hybrid+で測定し,Ra<1μm,Rz≒1μmであり,表-1に示した結晶性炭素基板の表面粗さを大幅に改善したことを確認した。また,当該基板の金属面を折り曲げても,炭素粉の発現しないことを光学顕微鏡で確認した。 The surface roughness of the substrate was measured by Lasertec's OPTELICS Hybrid+, and Ra < 1 μm, Rz ≒ 1 μm, and it was confirmed that the surface roughness of the crystalline carbon substrate shown in Table 1 was greatly improved. Further, it was confirmed with an optical microscope that carbon powder did not occur even when the metal surface of the substrate was bent.

実施例1で作成した基板から20mm×20mmを切り出し,基板同士を対向させて100×100mmのSUS基板で挟んで,(株)ミックラボ社製温度調節器付き加熱加圧プレス機でプレスした。温度235℃で5MPa,2分間プレスし,220℃まで降温して圧力を開放して取り出した。 A piece of 20 mm×20 mm was cut out from the substrate prepared in Example 1, sandwiched between 100×100 mm SUS substrates facing each other, and pressed with a heating press with a temperature controller manufactured by Miclab Co., Ltd. It was pressed at 5 MPa for 2 minutes at a temperature of 235°C, cooled to 220°C, released the pressure, and taken out.

接合したサンプルをX線CT(島津製作所 SMX-90CT)で接合面に空隙(Void)が無いことを確認し,接合部分の断面をSEMで観察して接合を確認した。さらにピンセットで基板間を剥離し,その面を観察した。そのSEM写真を図10に示す。白い部分がSn箔で,黒い部分が炭素基板であり,Sn-炭素間で剥離していることが分かる。
本実験は大気圧中で実施したが,真空中で加熱プレスすることによって,微小なVoidの発生も抑制されることが期待できる。
An X-ray CT (Shimadzu SMX-90CT) was used to confirm that there were no voids on the bonded surface of the bonded sample. Furthermore, the substrates were peeled off with tweezers and the surface was observed. Its SEM photograph is shown in FIG. The white part is the Sn foil, and the black part is the carbon substrate.
Although this experiment was carried out at atmospheric pressure, it is expected that the generation of minute voids can be suppressed by heating and pressing in a vacuum.

本発明は,表面金属化によってより安全性とハンドリング性を高め,さらには厚さ方向の熱伝導率を維持,さらには向上させ,高い平面導方向の熱電率を維持したまま厚さの厚い結晶性炭素基板を提供する。 The present invention improves safety and handling by surface metallization, maintains and further improves the thermal conductivity in the thickness direction, and achieves a thick crystal while maintaining a high thermal conductivity in the planar conduction direction. provide a flexible carbon substrate.

1 結晶性炭素基板 2 低融点金属薄膜 3 温度調節可能な加圧ステージ 4 真空チャンバー REFERENCE SIGNS LIST 1 crystalline carbon substrate 2 low-melting-point metal thin film 3 temperature-adjustable pressure stage 4 vacuum chamber

Claims (4)

基板表面に真空成膜プロセスによって厚さ100 nm以上の単層もしくは複数層の金属膜を形成し,当該金属膜の融点近傍において全面を加熱プレスすることで表面を平坦化した結晶性炭素基板,および当該金属面同士を積層接合した積層体 A crystalline carbon substrate in which a single-layer or multiple-layer metal film with a thickness of 100 nm or more is formed on the substrate surface by a vacuum deposition process, and the surface is flattened by heating and pressing the entire surface near the melting point of the metal film. and a laminate obtained by laminating and joining the metal surfaces 金属が,Ti,Si,Ni,Al,Fe,Cu,Sn,Inの少なくとも一つの金属もしくは合金であって,且つ最上層金属の融点が300℃以下であることを特徴とする請求項1に記載する結晶性炭素基板および積層体 The metal is at least one metal or alloy of Ti, Si, Ni, Al, Fe, Cu, Sn, and In, and the melting point of the top layer metal is 300 ° C. or less. Crystalline carbon substrates and laminates described 基板に直径20μm以上の複数個の貫通孔を形成したのち,真空成膜プロセスによって金属膜を成膜し,前記金属を基板表面と同時に貫通孔の内壁に成膜し,さらに平坦化のための加熱プレスによって,当該金属もしくはそれらの合金材料を貫通孔に侵入させたことを特徴とする請求項1および請求項2に記載する結晶性炭素基板および積層体 After forming a plurality of through-holes with a diameter of 20 μm or more in the substrate, a metal film is formed by a vacuum film-forming process, and the metal is formed on the inner wall of the through-holes at the same time as the substrate surface. 3. The crystalline carbon substrate and laminate according to claim 1 and claim 2, wherein the metal or alloy material thereof is made to penetrate into the through-holes by hot pressing. 最上層金属の融点以上の温度で加熱プレスし,融点以下に降温したのちに圧力を開放することを特徴とする請求項1から3に記載する結晶性炭素基板表面の平坦化および積層接合したことを特徴とする請求項1項から3項に記載する結晶性炭素基板および積層体 The flattening of the crystalline carbon substrate surface and lamination bonding according to any one of claims 1 to 3, characterized in that the heat pressing is performed at a temperature above the melting point of the uppermost layer metal, and the pressure is released after the temperature is lowered below the melting point. The crystalline carbon substrate and laminate according to claims 1 to 3, characterized by
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