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JP2020051784A - Fine particle classification measurement device - Google Patents

Fine particle classification measurement device Download PDF

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JP2020051784A
JP2020051784A JP2018178818A JP2018178818A JP2020051784A JP 2020051784 A JP2020051784 A JP 2020051784A JP 2018178818 A JP2018178818 A JP 2018178818A JP 2018178818 A JP2018178818 A JP 2018178818A JP 2020051784 A JP2020051784 A JP 2020051784A
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electrode
classification
sample gas
fine particles
electric field
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奥田 浩史
Hiroshi Okuda
浩史 奥田
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Shimadzu Corp
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Abstract

【課題】分流領域からの漏れ電界による粒径分解能の低下を抑制することができる微粒子分級測定装置を提供する。
【解決手段】帯電器は、内部を流れる試料ガスが層流となり得る平行な流路10の入口側に配置され、試料ガス中の微粒子を帯電させる。捕集電極は、流路10の対向する一対の面の一方の面上に、帯電器よりも下流側に配置される。分級電極30は、一対の面の他方の面上に、捕集電極24と対向して配置され、捕集電極24との間に流路10を流れる試料ガス中の帯電微粒子を捕集電極24側に引き付ける捕集電界を発生させる。分級電極30と捕集電極24との間には試料ガス中の帯電微粒子を粒径に応じて分級するための分級領域が形成される。分級領域の上流側の境界において分級電極30と捕集電極24との間には、分級電極30の電位と捕集電極24の電位との中間電位を有する少なくとも1つの中間電極50が配置される。
【選択図】図7
An object of the present invention is to provide a fine particle classification measuring device capable of suppressing a reduction in particle size resolution due to a leakage electric field from a flow dividing region.
A charging device is disposed on an inlet side of a parallel flow path in which a sample gas flowing inside can become a laminar flow, and charges fine particles in the sample gas. The collection electrode is disposed on one of the pair of opposing surfaces of the flow channel 10 downstream of the charger. The classification electrode 30 is disposed on the other of the pair of surfaces so as to face the collection electrode 24, and collects the charged fine particles in the sample gas flowing through the flow path 10 between the collection electrode 24 and the collection electrode 24. A trapping electric field is generated that is attracted to the side. A classification region is formed between the classification electrode 30 and the collection electrode 24 for classifying charged fine particles in the sample gas according to the particle diameter. At least one intermediate electrode 50 having an intermediate potential between the potential of the classification electrode 30 and the potential of the collection electrode 24 is disposed between the classification electrode 30 and the collection electrode 24 at the upstream boundary of the classification region. .
[Selection diagram] FIG.

Description

この発明は、微粒子分級測定装置に関する。   The present invention relates to a particle classification measuring device.

国際公開第2013/183652号(特許文献1)には、ナノメートルオーダーの粒径の微粒子を、粒径に応じて分級して測定する微粒子分級測定装置が開示されている。この微粒子分級測定装置は、試料ガスが層流となり得る平行な流路の対向する一対の面に分級電極および捕集電極をそれぞれ配置し、分級電極に電圧を印加することによって、微粒子の流れ方向に対して垂直に捕集電界を発生させる。   WO 2013/183652 (Patent Document 1) discloses a fine particle classification measuring device that classifies and measures fine particles having a particle size on the order of nanometers according to the particle size. This fine particle classification measuring device is configured such that a classifying electrode and a collecting electrode are respectively arranged on a pair of opposing surfaces of a parallel flow path in which a sample gas can be a laminar flow, and a voltage is applied to the classifying electrode, so that the flow direction of the fine particles is A trapping electric field is generated perpendicular to.

上記構成において、流路の入口から導入された試料ガスは荷電された後、捕集電界が存在する分級領域まで試料ガスの流れ方向に沿って移動し、分級領域に到達すると、試料ガスの流れ方向に沿って移動しながら捕集電界によって捕集電極の方向に移動し始める。帯電微粒子が捕集電極の方向に移動する過程において粒径に依存した抵抗を流体から受けることで、粒径に応じて微粒子を分級することができる。   In the above configuration, after the sample gas introduced from the inlet of the flow path is charged, it moves along the flow direction of the sample gas to the classification region where the trapping electric field exists, and when it reaches the classification region, the flow of the sample gas flows. While moving along the direction, it starts to move in the direction of the collecting electrode by the collecting electric field. In the process in which the charged fine particles move in the direction of the collecting electrode, the fine particles can be classified according to the particle size by receiving a resistance depending on the particle size from the fluid.

国際公開第2013/183652号International Publication No. WO 2013/183652

しかしながら、上記微粒子分級測定装置においては、分級領域の上流側の先端に位置する境界付近において、分級電極と流路の一対の面との間の電位差によって分級領域の外部に電界が漏れる場合がある。この場合、試料ガス中の帯電微粒子は、分級領域よりも上流側において、この分級領域から漏れ出た電界(以下、漏れ電界とも称する)によって一対の面に引き付けられるため、分級領域に到達することが妨げられてしまう。その結果、微粒子を粒径に応じて分級する粒径分解能が低下することが懸念される。   However, in the above-described fine particle classification measuring apparatus, an electric field may leak to the outside of the classification region due to a potential difference between the classification electrode and the pair of surfaces of the flow path near the boundary located at the upstream end of the classification region. . In this case, the charged fine particles in the sample gas are attracted to a pair of surfaces by the electric field leaking from the classification region (hereinafter, also referred to as leakage electric field) upstream of the classification region, and thus reach the classification region. Will be hindered. As a result, there is a concern that the particle size resolution for classifying the fine particles according to the particle size is reduced.

この発明はこのような問題点を解決するためになされたものであって、その目的は、分流領域からの漏れ電界による粒径分解能の低下を抑制することができる微粒子分級測定装置を提供することである。   The present invention has been made to solve such a problem, and an object of the present invention is to provide a fine particle classification measuring apparatus capable of suppressing a decrease in particle size resolution due to a leaked electric field from a branch region. It is.

この発明のある局面によれば、微粒子分級測定装置は、入口および出口を有し、内部を流れる試料ガスが層流となり得る平行な流路と、流路の入口から試料ガスを吸入するとともに、吸入された試料ガスが流路内を層流となって流れる条件で駆動される送風機構と、流路の入口側に配置され、試料ガス中の微粒子を帯電させる帯電器と、流路の対向する一対の面の一方の面上に、帯電器よりも下流側に配置された捕集電極と、一対の面の他方の面上に、捕集電極と対向して配置され、捕集電極との間に流路を流れる試料ガス中の帯電微粒子を捕集電極側に引き付ける捕集電界を発生させる分級電極とを備える。分級電極と捕集電極との間には、試料ガス中の帯電微粒子を粒径に応じて分級するための分級領域が形成される。微粒子分級測定装置は、分級領域の上流側の境界において分級電極と捕集電極との間に配置され、分級電極の電位と捕集電極の電位との中間電位を有する、少なくとも1つの中間電極をさらに備える。   According to an aspect of the present invention, a fine particle classification measuring device has an inlet and an outlet, and a parallel flow path in which a sample gas flowing inside can be a laminar flow, and sucks the sample gas from the inlet of the flow path, A blower mechanism driven under conditions in which the sucked sample gas flows in a laminar flow in the flow path; a charging device arranged on the inlet side of the flow path to charge fine particles in the sample gas; On one of the pair of surfaces, a collecting electrode disposed downstream of the charger, and on the other of the pair of surfaces, the collecting electrode is disposed to face the collecting electrode. A classifying electrode for generating a collecting electric field that attracts the charged fine particles in the sample gas flowing through the flow path to the collecting electrode side. A classification region for classifying charged fine particles in the sample gas according to the particle size is formed between the classification electrode and the collection electrode. The fine particle classification measuring device is disposed between the classification electrode and the collection electrode at an upstream boundary of the classification region, and has at least one intermediate electrode having an intermediate potential between the potential of the classification electrode and the potential of the collection electrode. Further prepare.

上記微粒子分級測定装置によれば、分級領域の上流側の境界において、分級電極および捕集電極の間に配置された中間電極によって分級領域の外部への漏れ電界の発生を抑制することができる。これによると、流路を流れる試料ガス中の帯電微粒子は漏れ電界に妨げられることなく、分級領域に到達することができるため、分級領域において微粒子を均等に分布させることができる。その結果、微粒子を粒径に応じて分級する粒径分解能が低下することを抑制することができる。   According to the fine particle classification measuring apparatus, the generation of the leakage electric field to the outside of the classification region can be suppressed by the intermediate electrode disposed between the classification electrode and the collection electrode at the boundary on the upstream side of the classification region. According to this, the charged fine particles in the sample gas flowing through the flow path can reach the classification region without being hindered by the leakage electric field, so that the fine particles can be evenly distributed in the classification region. As a result, it is possible to suppress a decrease in the particle size resolution for classifying the fine particles according to the particle size.

好ましくは、少なくとも1つの中間電極は、分級電極との間および捕集電極との間に捕集電界の電界強度と等しい電界強度を有する電界を発生させる。   Preferably, the at least one intermediate electrode generates an electric field having an electric field strength equal to the electric field strength of the trapping electric field between the classifying electrode and the collecting electrode.

これによると、分級領域の境界付近で帯電微粒子が中間電極に捕捉されることを抑制することができるため、分級領域に到達した帯電微粒子を捕集電極の方向に移動させることができる。   According to this, since the charged fine particles can be prevented from being captured by the intermediate electrode near the boundary of the classification region, the charged fine particles that have reached the classification region can be moved in the direction of the collection electrode.

好ましくは、上記微粒子分級測定装置は、分級電極に電圧を印加するための分級電源と、分級電源の電圧を分圧して中間電位を生成するように構成された抵抗分圧回路とをさらに備える。   Preferably, the fine particle classification measuring device further includes a classification power supply for applying a voltage to the classification electrode, and a resistance voltage dividing circuit configured to divide the voltage of the classification power supply to generate an intermediate potential.

これによると、分級電源を利用して中間電極に電位を印加することができるため、中間電極を設けたことにより装置が大型化することを防止することができる。   According to this, since the potential can be applied to the intermediate electrode using the classification power supply, it is possible to prevent the device from being enlarged due to the provision of the intermediate electrode.

好ましくは、捕集電極は、流路の入口から流れ方向に沿って互いに異なる距離の位置に配置された複数の測定電極を含む。微粒子分級測定装置は、複数の測定電極にそれぞれ接続され、対応する測定電極に到達した帯電微粒子がもつ電荷量を検出する複数の検流回路をさらに備える。これによると、検流回路により検出された電荷量に基づいて、高い分解能で微粒子を分級することができる。   Preferably, the collection electrode includes a plurality of measurement electrodes arranged at different distances from the inlet of the flow path along the flow direction. The fine particle classification measuring device further includes a plurality of galvanic circuits connected to the plurality of measuring electrodes and detecting the amount of charge of the charged fine particles reaching the corresponding measuring electrodes. According to this, the fine particles can be classified with high resolution based on the charge amount detected by the galvanic circuit.

この発明の別の局面によれば、微粒子分級測定装置は、入口および出口を有し、内部を流れる試料ガスが層流となり得る平行な流路と、流路の入口から試料ガスを吸入するとともに、吸入された試料ガスを流路内を層流となって流れる条件で駆動される送風機構と、流路の入口側に配置され、試料ガス中の微粒子を帯電させる帯電器と、流路の対向する一対の面の一方の面上に、帯電器よりも下流側に配置された捕集電極と、一対の面の他方の面上に、捕集電極と対向して配置され、捕集電極との間に流路を流れる試料ガス中の帯電微粒子を捕集電極側に引き付ける捕集電界を発生させる分級電極とを備える。分級電極と捕集電極との間には、試料ガス中の帯電微粒子を粒径に応じて分級するための分級領域が形成される。微粒子分級測定装置は、分級領域の上流側の境界において分級電極と捕集電極との間に配置され、分級電極の電位と捕集電極の電位との中間電位を有する、少なくとも1つの第1の中間電極と、分級領域の下流側の境界において分級電極と捕集電極との間に配置され、中間電位を有する、少なくとも1つの第2の中間電極とをさらに備える。   According to another aspect of the present invention, a fine particle classification measuring device has an inlet and an outlet, and a parallel flow path in which a sample gas flowing inside can be a laminar flow, and sucks a sample gas from an inlet of the flow path. A blower mechanism driven under the condition that the sucked sample gas flows in a laminar flow in the flow path, a charging device disposed on the inlet side of the flow path and charging fine particles in the sample gas, A collecting electrode disposed on one side of the pair of opposing surfaces on the downstream side of the charger; and a collecting electrode disposed on the other of the pair of surfaces opposite to the collecting electrode. And a classifying electrode for generating a collection electric field that attracts the charged fine particles in the sample gas flowing through the flow path to the collection electrode side. A classification region for classifying charged fine particles in the sample gas according to the particle size is formed between the classification electrode and the collection electrode. The fine particle classification measuring device is disposed between the classification electrode and the collection electrode at an upstream boundary of the classification area, and has at least one first potential having an intermediate potential between the classification electrode potential and the collection electrode potential. It further comprises an intermediate electrode and at least one second intermediate electrode disposed between the classification electrode and the collection electrode at a downstream boundary of the classification region and having an intermediate potential.

上記微粒子分級測定装置によれば、分級領域の上流側および下流側の境界において、分級電極および捕集電極の間に配置された中間電極によって分級領域の外部への漏れ電界の発生を抑制することができる。したがって、上記微粒子分級測定装置を、試料ガス中の帯電粒子を捕集電極側に引き付けてナノ粒子膜成膜基板に堆積させることによりナノ粒子膜を形成するように構成された成膜装置に適用した場合において、粒子濃度分布が一様なナノ粒子膜を形成することができる。   According to the fine particle classification measuring device, at the upstream and downstream boundaries of the classification region, the generation of a leakage electric field to the outside of the classification region is suppressed by the intermediate electrode disposed between the classification electrode and the collection electrode. Can be. Therefore, the above-described fine particle classification measuring apparatus is applied to a film forming apparatus configured to form a nanoparticle film by attracting charged particles in a sample gas to a collecting electrode side and depositing the particles on a nanoparticle film forming substrate. In this case, a nanoparticle film having a uniform particle concentration distribution can be formed.

この発明によれば、分流領域からの漏れ電界による粒径分解能の低下を抑制することができる微粒子分級測定装置を提供することができる。   According to the present invention, it is possible to provide a fine particle classification measuring device capable of suppressing a decrease in particle size resolution due to a leakage electric field from a branch region.

この発明の実施の形態に係る微粒子分級測定装置の構成を概略的に示す図である。It is a figure showing roughly composition of a fine particle classification measuring device concerning an embodiment of this invention. 微粒子分級測定装置の流路に沿った断面図である。It is sectional drawing along the flow path of the fine particle classification measuring device. 微粒子の粒径と電気移動度との関係を示す図である。FIG. 4 is a diagram showing a relationship between the particle size of fine particles and electric mobility. 分級領域における帯電微粒子の移動軌跡を概念的に示す図である。FIG. 4 is a diagram conceptually showing a moving trajectory of charged fine particles in a classification area. 漏れ電界を模式的に示す概略断面図である。It is a schematic sectional drawing which shows a leak electric field typically. 特定の粒径の微粒子の濃度分布を模式的に示す図である。It is a figure which shows typically the density distribution of the fine particle of a specific particle size. 本発明の実施の形態に係る微粒子分級測定装置における中間電極の構成例を説明するための図である。It is a figure for explaining the example of composition of the intermediate electrode in the fine particle classification measuring device concerning an embodiment of the invention. 図7に示した中間電極の第1構成例を示す図である。FIG. 8 is a diagram illustrating a first configuration example of the intermediate electrode illustrated in FIG. 7. 図7に示した中間電極の第2構成例を示す図である。FIG. 8 is a diagram illustrating a second configuration example of the intermediate electrode illustrated in FIG. 7. 本発明の実施の形態に係る微粒子分級測定装置における中間電極の他の構成例を説明するための図である。It is a figure for explaining other examples of composition of an intermediate electrode in a particulate classification measuring device concerning an embodiment of the invention. 本発明の実施の形態に係る微粒子分級測定装置における中間電極の他の構成例を説明するための図である。It is a figure for explaining other examples of composition of an intermediate electrode in a particulate classification measuring device concerning an embodiment of the invention.

以下に、本発明の実施の形態について図面を参照して詳細に説明する。なお、以下では同一または相当部分には同一符号を付してその説明は原則的に繰返さないものとする。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the following, the same or corresponding parts have the same reference characters allotted, and description thereof will not be repeated in principle.

図1は、この発明の実施の形態に係る微粒子分級測定装置の構成を概略的に示す図である。   FIG. 1 is a diagram schematically showing a configuration of a fine particle classification measuring apparatus according to an embodiment of the present invention.

図1を参照して、本実施の形態に係る微粒子分級装置は流路10を有する。流路10は、入口12および出口14に開口が形成されており、流れ方向および流路幅方向ともに断面が直方形の扁平な形状になっている。その流路10の寸法および形状は特に限定されるものではないが、例えば縦(高さ)が4mm、横(流路幅)が250mm、奥行き(流路長さ)が450mmの扁平な直方体である。   With reference to FIG. 1, the fine particle classification device according to the present embodiment has a flow path 10. The flow channel 10 has openings formed at the inlet 12 and the outlet 14, and has a flat shape with a rectangular cross section in both the flow direction and the flow channel width direction. The size and shape of the flow path 10 are not particularly limited. For example, the flow path 10 is a flat rectangular parallelepiped having a length (height) of 4 mm, a width (flow path width) of 250 mm, and a depth (flow path length) of 450 mm. is there.

流路10の出口側には試料吸引用の送風機構(図示せず)が配置されている。送風機構は駆動回路により駆動される。送風機構の試料ガス吸入側には流量調整弁が設けられており、流量調整弁を調節することにより、試料ガス流量を変化させることができるように構成されている。   An air blowing mechanism (not shown) for sucking the sample is arranged on the outlet side of the flow path 10. The blowing mechanism is driven by a drive circuit. A flow control valve is provided on the sample gas suction side of the blower mechanism, and the flow rate of the sample gas can be changed by adjusting the flow control valve.

送風機構は流路10の幅全体に亘って均一に吸引し、流路10の入口12から試料ガスを吸入する。送風機構は、吸入された試料ガスが流路10内を層流となって流れる条件で駆動される。層流となる条件はレイノルズが概ね2000以下となる条件である。   The blowing mechanism uniformly sucks the entire width of the flow channel 10 and sucks the sample gas from the inlet 12 of the flow channel 10. The blowing mechanism is driven under the condition that the sucked sample gas flows in the flow path 10 as a laminar flow. The condition for the laminar flow is a condition where the Reynolds is approximately 2000 or less.

流路10の入口12付近には試料ガス中の微粒子を帯電させる帯電器が配置されている。図1の例では、帯電器は単極荷電の様式をとるように構成されている。帯電器は流路10を挟んで一方の側に取り付けられたワイヤー状の放電電極20と、それらの放電電極20に対向して流路10の他方側に配置された対向電極22とから構成される。放電電極20と対向電極22との間で放電を起こさせるように、放電電極20には荷電電源21が接続されている。放電電極20の形状はワイヤー状のものに限らず、対向電極22に垂直に取り付けられた1または複数の針であってもよい。後述する図2の実施例で示されるような、流路10のガスの流れに垂直に設けられた、中心に開口をもつ対向電極22と、その対向電極22の開口の中心に針の先端が対向するように配置された放電電極20とから構成されるものであってもよい。帯電器は放電電極20と対向電極22との間で放電できるものであればその構造は限定されない。   A charger for charging fine particles in the sample gas is disposed near the inlet 12 of the flow channel 10. In the example of FIG. 1, the charger is configured to take the form of unipolar charging. The charger includes a wire-shaped discharge electrode 20 attached to one side of the flow path 10, and a counter electrode 22 disposed on the other side of the flow path 10 to face the discharge electrodes 20. You. A charging power supply 21 is connected to the discharge electrode 20 so as to cause a discharge between the discharge electrode 20 and the counter electrode 22. The shape of the discharge electrode 20 is not limited to a wire shape, and may be one or a plurality of needles vertically attached to the counter electrode 22. As shown in an embodiment of FIG. 2 to be described later, a counter electrode 22 which is provided perpendicular to the gas flow in the flow channel 10 and has an opening at the center, and a tip of the needle at the center of the opening of the counter electrode The discharge electrode 20 may be configured to include the discharge electrode 20 disposed to face the discharge electrode 20. The structure of the charger is not limited as long as it can discharge between the discharge electrode 20 and the counter electrode 22.

流路10の幅広の対向する一対の底面(図1の例では天井面40および下底面42)は互いに平行であり、かつ同じ広さをもっている。一対の底面の一方の底面である下底面42上には、流れ方向に沿って入口12から互いに異なる距離の位置に複数の捕集電極が配置されている。複数の捕集電極は、複数の測定電極24_1〜24_n(nは2以上の整数)を含む。測定電極24_1〜24_nは包括的に測定電極24と称されることもある。図1の例では、n=4としているが、nは2または3であってもよく5以上であってもよい。   A pair of wide opposed bottom surfaces (the ceiling surface 40 and the lower bottom surface 42 in the example of FIG. 1) of the flow path 10 are parallel to each other and have the same size. A plurality of collecting electrodes are arranged on the lower bottom surface 42 which is one of the pair of bottom surfaces, at different distances from the inlet 12 along the flow direction. The plurality of collection electrodes include a plurality of measurement electrodes 24_1 to 24_n (n is an integer of 2 or more). The measurement electrodes 24_1 to 24_n may be collectively referred to as the measurement electrodes 24. In the example of FIG. 1, n = 4, but n may be 2 or 3, or 5 or more.

測定電極24_1〜24_nには、測定電極24に到達した微粒子がもつ電荷量を検出するために検流回路28_1〜28_nがそれぞれ接続されている。測定電極24_1〜24_nは互いに近接して配置することもできる。図1のように、隣接する測定電極24間に隙間をもって配置することもできる。検流回路28_1〜28_nは包括的に検流回路28と称されることもある。隣接する吸引電極24間には絶縁部材または空気層を介して電極間が互いに電気的に分離されている。なお、絶縁部材は吸引電極24間を電気的に分離すればよいので、厚くする必要はなく、例えば0.5mm程度でよい。絶縁部材の厚みは絶縁部材の体積抵抗率に依存する。   Current detection circuits 28_1 to 28_n are connected to the measurement electrodes 24_1 to 24_n, respectively, for detecting the amount of charge of the fine particles that have reached the measurement electrode 24. The measurement electrodes 24_1 to 24_n can be arranged close to each other. As shown in FIG. 1, it is also possible to dispose a gap between adjacent measurement electrodes 24. The current detection circuits 28_1 to 28_n may be collectively referred to as a current detection circuit 28. Between the adjacent suction electrodes 24, the electrodes are electrically separated from each other via an insulating member or an air layer. Note that the insulating member need only be electrically separated between the suction electrodes 24, and therefore does not need to be thick, and may be, for example, about 0.5 mm. The thickness of the insulating member depends on the volume resistivity of the insulating member.

流路10の幅広の対向する一対の底面の他方の底面である天井面40には、捕集電極に対向して分級電極30が配置されている。分級電極30は捕集電極との間に流路10を流れる試料ガス中の帯電微粒子を捕集電極側に引き付ける電界を発生させるものである。本願明細書では、この帯電微粒子を捕集電極側に引き付ける電界を「捕集電界」とも称する。   A classifying electrode 30 is disposed on a ceiling surface 40 which is the other bottom surface of the pair of wide opposed bottom surfaces of the flow channel 10 so as to face the collection electrode. The classifying electrode 30 generates an electric field that attracts charged fine particles in the sample gas flowing through the flow path 10 to the collecting electrode between the classifying electrode 30 and the collecting electrode. In the present specification, the electric field that attracts the charged fine particles to the collection electrode side is also referred to as “collection electric field”.

分級電極30と捕集電極とは、分級電極30の面積と捕集電極の合計面積とがほぼ等しくなり、かつ、分級電極30と捕集電極とが空間的に正面同士で対向していることが好ましい。このようにすると、流路10を流れる試料ガスの流れ方向に対して垂直またはほぼ垂直になるように、捕集電界を発生させることができる。そのため、複数の捕集電極は互いに電気的に分離されているが、隣接する捕集電極の隙間は少ない方が好ましい。   The classifying electrode 30 and the collecting electrode are such that the area of the classifying electrode 30 and the total area of the collecting electrode are substantially equal, and the classifying electrode 30 and the collecting electrode are spatially facing each other from the front. Is preferred. With this configuration, the trapping electric field can be generated so as to be perpendicular or substantially perpendicular to the flow direction of the sample gas flowing through the flow channel 10. Therefore, the plurality of collecting electrodes are electrically separated from each other, but it is preferable that the gap between the adjacent collecting electrodes is small.

なお、捕集電極は、図1の例のように、到達した帯電微粒子の電荷量が測定される測定電極24のみで構成してもよいが、帯電微粒子は到達するが測定電極としては使用されないトラップ電極(図示せず)を含んでいてもよい。トラップ電極を含んでいる場合には、流路10を流れる試料ガスの流れ方向に対して垂直方向またはほぼ垂直方向の捕集電界を作用させるためには、トラップ電極にも測定電極24と同じ電位が与えられる。トラップ電極および測定電極24の電位は接地電位を含む。トラップ電極は、測定電極24のうちの流路10の入口12に最も近い第1測定電極24_1よりも上流側に配置される。   Note that the collecting electrode may be constituted only by the measuring electrode 24 for measuring the amount of charge of the charged fine particles that have arrived as in the example of FIG. 1, but the charged fine particles reach but are not used as the measuring electrode. A trap electrode (not shown) may be included. When a trapping electrode is included, the same potential as the measuring electrode 24 is applied to the trapping electrode in order to apply a trapping electric field in a direction perpendicular or substantially perpendicular to the flow direction of the sample gas flowing through the flow path 10. Is given. The potentials of the trap electrode and the measurement electrode 24 include the ground potential. The trap electrode is arranged on the upstream side of the first measurement electrode 24_1 closest to the inlet 12 of the flow channel 10 among the measurement electrodes 24.

分級電極30および捕集電極に挟まれた空間は、試料ガス中の微粒子を粒径に応じて分級するための「分級領域」を構成する。第1測定電極24_1の上流側の先端位置と、分級電極30の上流側の先端位置とは、流れ方向において同じ位置になるように位置決めされており、その位置が分級領域の基点となっている。以後の説明において、測定電極24の位置および幅の特定は、分級領域の基点からの距離として表示される。流路10の入口12から分級領域の基点までの距離を「助走距離」と呼ぶ。助走距離では帯電微粒子は分級領域に達していないため、分級電界の影響を受けず、試料ガスの流れに乗って移動する。   The space between the classifying electrode 30 and the collecting electrode forms a "classifying region" for classifying fine particles in the sample gas according to the particle diameter. The upstream end position of the first measurement electrode 24_1 and the upstream end position of the classification electrode 30 are positioned so as to be at the same position in the flow direction, and that position is the base point of the classification region. . In the following description, the position and width of the measurement electrode 24 are specified as a distance from the base point of the classification area. The distance from the inlet 12 of the flow path 10 to the base point of the classification area is called the "running distance". Since the charged fine particles have not reached the classification region at the approach distance, they are moved by the flow of the sample gas without being affected by the classification electric field.

図1の例において、測定電極24_1〜24_4は同電位とされ、分級電極30との間に流路10を流れる試料ガスの流れに対して垂直方向またはほぼ垂直方向の捕集電界が形成される。分級電極30には分級電圧を印加するための分級電源32が接続されている。分級電源32からの電圧印加により、分級電極30と捕集電極との間に試料ガス中の帯電微粒子が捕集電極側に吸引される方向の電界(捕集電界)が形成される。   In the example of FIG. 1, the measurement electrodes 24_1 to 24_4 are set to the same potential, and a trapping electric field is formed between the measurement electrodes 24_1 to 24_4 in the direction perpendicular to or substantially perpendicular to the flow of the sample gas flowing through the flow path 10 with the classification electrode 30. . A classification power supply 32 for applying a classification voltage is connected to the classification electrode 30. By applying a voltage from the classification power supply 32, an electric field (collection electric field) is formed between the classification electrode 30 and the collection electrode in a direction in which the charged fine particles in the sample gas are attracted to the collection electrode side.

例えば、フィルタを設けて粒子成分を除去した後のガスイオンにより動作確認する場合、ガスイオンとして正の電荷をもったものにより動作確認したいときには分級電極30の電圧を正の電圧とし、捕集電極を接地電位とする。逆にガスイオンとして負の電荷をもったものにより動作確認したいときには分級電極30の電圧が負の電圧となるように、分級電源32から分級電極30に電圧を印加する。流路10の寸法にもよるが、測定時の分級電源32への印加電圧値は数kV、例えば1〜4kV、一般には絶縁破壊が起きない範囲の電圧を印加することができる。   For example, in the case where the operation is confirmed using gas ions after removing a particle component by providing a filter, when the operation is to be confirmed using a gas ion having a positive charge, the voltage of the classification electrode 30 is set to a positive voltage, and the collection electrode is used. Is the ground potential. Conversely, when it is desired to confirm the operation using a gas having a negative charge as a gas ion, a voltage is applied from the classification power supply 32 to the classification electrode 30 so that the voltage of the classification electrode 30 becomes a negative voltage. Depending on the dimensions of the flow path 10, the voltage applied to the classifying power supply 32 at the time of measurement can be several kV, for example, 1 to 4 kV, and a voltage in a range that generally does not cause dielectric breakdown can be applied.

測定時は分級電源32から分級電極30に対して一定電圧が連続して供給される。例えば、対向電極22を接地電位として放電電極20を正側にして単極放電を行なうと、試料ガス中の微粒子は正の単極荷電をもつので、測定電極24_1〜24_4を接地電位として分級電極30を正側にする。   At the time of measurement, a constant voltage is continuously supplied from the classification power supply 32 to the classification electrode 30. For example, when the unipolar discharge is performed with the counter electrode 22 at the ground potential and the discharge electrode 20 at the positive side, the fine particles in the sample gas have a positive unipolar charge. Therefore, the classification electrodes are set with the measurement electrodes 24_1 to 24_4 at the ground potential. Set 30 to the positive side.

図1の構成において、帯電器(放電電極20および対向電極22)を作動させ、かつ、捕集電界を作用させた状態で送風機構を作動させると、試料ガスが流路10の入口12から導入され、試料ガスは帯電器の放電によって荷電される。分級電極30と捕集電極との間の分級領域には捕集電界が生じているため、荷電された試料ガスは流れに沿って捕集電界中に送られる。帯電器で荷電された試料ガスは、捕集電界が存在する分級領域まで試料ガスの流れ方向に沿って移動し、分級領域に到達すると、試料ガスの流れ方向に沿って移動しながら捕集電界によって捕集電極の方向に移動し始める。   In the configuration of FIG. 1, when the charger (discharge electrode 20 and counter electrode 22) is operated and the air blowing mechanism is operated in a state where the trapping electric field is applied, the sample gas is introduced from the inlet 12 of the flow channel 10. The sample gas is charged by the discharge of the charger. Since a collection electric field is generated in the classification region between the classification electrode 30 and the collection electrode, the charged sample gas is sent along the flow into the collection electric field. The sample gas charged by the charger moves along the flow direction of the sample gas to the classification area where the collected electric field exists, and when it reaches the classification area, moves along the sample gas flow direction while moving along the sample gas flow direction. And starts to move in the direction of the collecting electrode.

荷電された微粒子は捕集電界中で、試料ガスの流れに沿って排気側に流されながら、捕集電極に向かって移動する。粒径の小さな微粒子は入口12に近い捕集電極により多く捕集される。しかし、捕集電極に近い位置、すなわち、流路10の下底面42側の位置で吸込まれた粒径の大きな微粒子も入口12に近い捕集電極に捕集される。測定電極24_1〜24_4に到達した微粒子の電荷が、測定電極24_1〜24_4にそれぞれ接続された検流回路28_1〜28_4によって検出される。   The charged fine particles move toward the collection electrode while flowing toward the exhaust side along the flow of the sample gas in the collection electric field. Fine particles having a small particle diameter are collected by the collecting electrode near the inlet 12. However, fine particles having a large particle diameter sucked at a position near the collecting electrode, that is, at a position on the lower bottom surface 42 side of the flow path 10 are also collected by the collecting electrode near the inlet 12. The electric charge of the fine particles that has reached the measurement electrodes 24_1 to 24_4 is detected by the galvanometer circuits 28_1 to 28_4 connected to the measurement electrodes 24_1 to 24_4, respectively.

次に、図2を参照して、図1に示した微粒子分級測定装置の具体的な構成例を説明する。図2は、微粒子分級測定装置の流路10に沿った断面図である。   Next, a specific configuration example of the particle classification measuring device shown in FIG. 1 will be described with reference to FIG. FIG. 2 is a cross-sectional view along the flow path 10 of the particle classification measuring device.

図2を参照して、流路10は扁平な直方体の形状を有しており、その入口および出口にはそれぞれ試料ガスの流れを平行流にするために整流抵抗11a,11bが配置されている。整流抵抗11a,11bは試料が流路幅方向に均一に分散するような流路抵抗になるように設定されている。流路10につながる試料導入口13aと排出口13bとは流れの断面積が流路10よりも小さくなっているが、整流抵抗11a,11bによって流路10での試料ガスの流れは流路幅に亘って均一な平行流となる。   Referring to FIG. 2, channel 10 has a flat rectangular parallelepiped shape, and rectifier resistors 11a and 11b are arranged at its inlet and outlet, respectively, to make the flow of the sample gas parallel. . The rectifier resistors 11a and 11b are set so as to have a flow path resistance such that the sample is uniformly dispersed in the flow path width direction. Although the cross-sectional area of the flow of the sample introduction port 13a and the discharge port 13b connected to the flow path 10 is smaller than that of the flow path 10, the flow of the sample gas in the flow path 10 is reduced by the rectifying resistors 11a and 11b. And a uniform parallel flow is obtained.

流路10の出口につながる排出口13bには送風機構としてブロア44が接続され、ブロア44の上流に風量センサ46が配置されている。流量調整弁18は、風量センサ46とブロア44との間に配置されている。流量調整弁18は、風量センサ46による検出風量が試料ガスを層流にするように予め定められた一定量になるように調整される。流量調整弁18は、手動で調整することもでき、風量センサ46の信号に基づいてフィードバック制御するように構成することもできる。   A blower 44 is connected as a blower to the discharge port 13 b connected to the outlet of the flow path 10, and an airflow sensor 46 is arranged upstream of the blower 44. The flow control valve 18 is arranged between the air flow sensor 46 and the blower 44. The flow control valve 18 is adjusted so that the air flow detected by the air flow sensor 46 becomes a predetermined constant amount so as to make the sample gas a laminar flow. The flow control valve 18 can be manually adjusted, and can be configured to perform feedback control based on a signal from the air flow sensor 46.

試料導入口13aに試料ガスを導入するために試料吸込み口12aがある。試料吸込み口12aと試料導入口13aとの間にはインパクタ13および帯電器が配置されている。インパクタ13は、流路10を遮る板の中央にノズルが開けられ、そのノズルの下流にノズルに対向して捕集板が配置された構造を有している。ノズルから噴出するエアロゾルの慣性衝突を利用してエアロゾル中の大きい側の微粒子を捕集板に採集して除去し、小さい側の微粒子を通過させる装置である。   There is a sample inlet 12a for introducing a sample gas into the sample inlet 13a. An impactor 13 and a charger are arranged between the sample inlet 12a and the sample inlet 13a. The impactor 13 has a structure in which a nozzle is opened at the center of a plate that blocks the flow path 10, and a collecting plate is disposed downstream of the nozzle so as to face the nozzle. This is a device that uses an inertial collision of aerosol ejected from a nozzle to collect and remove large particles in the aerosol by a collecting plate and pass small particles in the aerosol.

帯電器は放電電極20と対向電極22とからなり、インパクタ13と試料導入口13aとの間に配置されている。放電電極20は針状の形状をもつ。対向電極22は流路10を遮る電極板からなり、その中央に開口が形成されている。放電電極20の先端は対向電極22の開口の中央に向けて配置されている。対向電極22は接地されている。放電電極20に荷電電源21からの荷電用の電圧が印加される。放電電極20に正電圧が印加されると、荷電部は試料ガス中の微粒子を正に帯電させる。一方、放電電極20に負電圧が印加されると、荷電部は試料ガス中の微粒子を負に帯電させる。放電電極20および対向電極22の構造はこれに限定されるものではない。   The charger includes a discharge electrode 20 and a counter electrode 22, and is disposed between the impactor 13 and the sample introduction port 13a. The discharge electrode 20 has a needle shape. The counter electrode 22 is formed of an electrode plate that blocks the flow path 10, and has an opening formed in the center thereof. The tip of the discharge electrode 20 is arranged toward the center of the opening of the counter electrode 22. The counter electrode 22 is grounded. A charging voltage from a charging power supply 21 is applied to the discharge electrode 20. When a positive voltage is applied to the discharge electrode 20, the charging unit positively charges the fine particles in the sample gas. On the other hand, when a negative voltage is applied to the discharge electrode 20, the charging unit negatively charges the fine particles in the sample gas. The structures of the discharge electrode 20 and the counter electrode 22 are not limited to this.

所望のイオン濃度および荷電の極性などに応じて放電電極20に印加する電圧を調整するため、荷電電源21には荷電電圧調整器(図示せず)が接続されている。   A charging voltage regulator (not shown) is connected to the charging power supply 21 in order to adjust a voltage applied to the discharge electrode 20 according to a desired ion concentration, a charging polarity, and the like.

流路10の下底面42上には、流れ方向に沿って入口から互いに異なる距離の位置に上流側から順に4個の測定電極24_1〜24_4が配置されている。測定電極24_1〜24_4は互いに近接して配置され、隣接する測定電極24間に隙間をもって配置されている。測定電極24_1〜24_4は検流回路28_1〜28_4にそれぞれ接続されている。図2の例では、検流回路28は全ての測定電極24_1〜24_4に設けられているが、電流値を検出しようとする測定電極24のみに接続してもよい。下底面42は接地されている。測定電極24_1〜24_4に対向して、流路10の天井面40には1つの分級電極30が配置されている。第1測定電極24_1の上流側の先端位置と分級電極30の上流側の先端位置とが一致しており、第4測定電極24_4の下流側の先端位置と分級電極30の下流側の先端位置とが一致している。   On the lower bottom surface 42 of the flow channel 10, four measurement electrodes 24_1 to 24_4 are arranged in order from the upstream side at different distances from the inlet in the flow direction. The measurement electrodes 24_1 to 24_4 are arranged close to each other, and are arranged with a gap between the adjacent measurement electrodes 24. The measurement electrodes 24_1 to 24_4 are connected to current detection circuits 28_1 to 28_4, respectively. In the example of FIG. 2, the galvanometer circuit 28 is provided in all the measurement electrodes 24_1 to 24_4, but may be connected only to the measurement electrode 24 whose current value is to be detected. The lower bottom surface 42 is grounded. One classification electrode 30 is arranged on the ceiling surface 40 of the flow channel 10 so as to face the measurement electrodes 24_1 to 24_4. The upstream end position of the first measurement electrode 24_1 matches the upstream end position of the classification electrode 30, and the downstream end position of the fourth measurement electrode 24_4 and the downstream end position of the classification electrode 30 are different from each other. Matches.

検流回路28_1〜28_4は分級のための計算を行なうためのコンピュータ(図示せず)に接続されている。測定時において、検流回路28_1〜28_4の検出信号は、流路10を流れる試料ガス中の帯電粒子が分級されて測定電極24_1〜24_4に吸引された結果を反映しているので、それらの検出信号に基づいて分級測定を行なうことができる。   The current detection circuits 28_1 to 28_4 are connected to a computer (not shown) for performing calculations for classification. At the time of measurement, the detection signals of the galvanometer circuits 28_1 to 28_4 reflect the result of the classification of the charged particles in the sample gas flowing through the flow path 10 and the attraction to the measurement electrodes 24_1 to 24_4. Classification measurements can be made based on the signal.

ここで、帯電微粒子の粒径と捕集電界中での移動速度との関係を説明する。
図3に、微粒子の粒径と電界中での動き易さ(電気移動度)との関係を示す。図3のデータは、文献値を基にしたシミュレーションで補完した実測値である。拡散荷電を主とする帯電条件を設定した場合、微粒子の電荷量は概ねその粒径に比例する。電界中に荷電された微粒子を置いたとき、粒径が小さい微粒子は、電荷量が小さいが空気から受ける抵抗も小さいために素早く静電気力に吸引されて電界中を移動する。一方、粒径が大きくなると、空気からの抵抗がより支配的となるため、電界中の移動速度が低下する。しかし、粒径がさらに大きくなると、空気から受ける抵抗が増大するが、電荷量も大きくなることによる静電気力の効果が大きくなるため、ある粒径以上の微粒子の電界中での移動速度が変化しなくなる。
Here, the relationship between the particle size of the charged fine particles and the moving speed in the trapping electric field will be described.
FIG. 3 shows the relationship between the particle size of the fine particles and the ease of movement (electric mobility) in an electric field. The data in FIG. 3 are actual measurement values supplemented by a simulation based on literature values. When charging conditions mainly based on diffusion charging are set, the charge amount of the fine particles is approximately proportional to the particle size. When charged microparticles are placed in an electric field, the microparticles having a small particle diameter are quickly attracted to the electrostatic force and move in the electric field because of their small charge amount and small resistance received from air. On the other hand, as the particle size increases, the resistance from air becomes more dominant, and the moving speed in the electric field decreases. However, as the particle size further increases, the resistance received from air increases, but the effect of the electrostatic force due to the increase in the amount of charge increases, so that the moving speed of the fine particles having a certain particle size or more in the electric field changes. Disappears.

荷電された微粒子は分級領域の捕集電界中で、試料ガスの流れに沿って排気側に流されながら、捕集電極に向かって移動する。粒径の小さな微粒子は入口に近い捕集電極により多く捕捉される。しかし、捕集電極に近い位置、すなわち流路10の下底面42側の位置で吸込まれた、粒径の大きな微粒子も入口に近い捕集電極に捕捉される。捕集電極のうち、測定電極24_1〜24_4に到達した微粒子の電荷が測定電極24_1〜24_4にそれぞれ接続された検流回路28_1〜28_4によって検出される。ただし、測定電極24に到達した帯電微粒子の検出は、検流回路28_1〜28_4による検出に限定されるものではなく、例えば水晶振動子による重量測定等、他の検出方法でもよい。   The charged fine particles move toward the collection electrode while flowing toward the exhaust side along the flow of the sample gas in the collection electric field in the classification region. Fine particles having a small particle diameter are captured by the collecting electrode near the entrance. However, fine particles having a large particle diameter sucked in at a position near the collecting electrode, that is, at a position on the lower bottom surface 42 side of the flow channel 10 are also captured by the collecting electrode near the entrance. Of the collection electrodes, the charges of the fine particles that have reached the measurement electrodes 24_1 to 24_4 are detected by galvanic circuits 28_1 to 28_4 connected to the measurement electrodes 24_1 to 24_4, respectively. However, the detection of the charged fine particles that have reached the measurement electrode 24 is not limited to the detection by the galvanometer circuits 28_1 to 28_4, but may be another detection method such as weight measurement using a quartz oscillator.

ここで、帯電微粒子の粒径ごとの測定電極24に到達する割合(捕捉率)の計算方法を示す。その計算モデルは次の如くである。   Here, a calculation method of the ratio (capture rate) of reaching the measurement electrode 24 for each particle diameter of the charged fine particles will be described. The calculation model is as follows.

流路10での試料ガスは、分級電極30と捕集電極との間の分級領域において層流となる条件で流す。このときの速度分布を式(1)により表わす。

Figure 2020051784
The sample gas in the flow path 10 flows under a condition that causes a laminar flow in a classification region between the classification electrode 30 and the collection electrode. The velocity distribution at this time is represented by equation (1).
Figure 2020051784

ここで、vは試料ガス流速、xは流路10の下底面42を基準にしたときの電極間方向の距離である。 Here, v is the sample gas flow velocity, and x is the distance between the electrodes with respect to the lower bottom surface 42 of the flow channel 10.

流路10に沿って分級領域が始まる点(すなわち、捕集電界が作用し始める点)を基点として流路10の出口14に向かう方向をy方向とすると、図4に示されるように、この層流の中になる微粒子はy方向に対して速度vで移動し、捕集電界により捕集電極側に速度vで移動する。速度vは電気移動度Zpおよび捕集電界の電界強度Eの積として式(2)で表すことができる。

Figure 2020051784
Assuming that the direction toward the outlet 14 of the flow path 10 from the point at which the classification region starts along the flow path 10 (that is, the point at which the trapping electric field starts to act) is the y direction, as shown in FIG. microparticles consisting in a laminar flow moves at a speed v relative to the y direction, and moves at a speed v x in the collecting electrode side by collecting field. The velocity v x can be expressed by the formula (2) as a product of the electric mobility Zp and the electric field intensity E of the trapping electric field.
Figure 2020051784

電界強度Eは分級電極30と捕集電極との間に印加される分級電圧Vと電極間距離dとにより、式(3)となる。

Figure 2020051784
The electric field intensity E is given by the following equation (3), based on the classification voltage V applied between the classification electrode 30 and the collection electrode and the distance d between the electrodes.
Figure 2020051784

ここで、分級領域の基点(y=0)においてx方向の任意の位置x0にある電気移動度Zpをもつ帯電微粒子が捕集電極に到達するまでの時間tx0は式(4)により表わされる。

Figure 2020051784
Here, a time t x0 until the charged fine particles having the electric mobility Zp at an arbitrary position x 0 in the x direction at the base point (y = 0) of the classification area reaches the collection electrode is represented by Expression (4). .
Figure 2020051784

その帯電微粒子が捕集電極に到達したときのy方向の移動距離L0は式(5)のように表すことができる。

Figure 2020051784
The moving distance L0 in the y direction when the charged fine particles reach the collection electrode can be expressed as in equation (5).
Figure 2020051784

ここで、電気移動度Zpは

Figure 2020051784
Here, the electric mobility Zp is
Figure 2020051784

Nは電荷数、eは電気素量、Ccはカニンガム補正係数、πは円流率、μは粘性係数、Dpは粒子径である。 N is the number of charges, e is the elementary charge, Cc is the Cunningham correction coefficient, π is the circular flow rate, μ is the viscosity coefficient, and Dp is the particle diameter.

式(6)に示すように、電気移動度Zpは帯電微粒子の粒径Dpの関数であるため、分級領域の基点(y=0)においてx方向の任意の位置x0にあった種々の粒径の帯電微粒子が捕集電極に到達したときのy方向の移動距離L0を求めることができる。   As shown in the equation (6), since the electric mobility Zp is a function of the particle diameter Dp of the charged fine particles, various particle diameters at an arbitrary position x0 in the x direction at the base point (y = 0) of the classification area. The moving distance L0 in the y direction when the charged fine particles reach the collection electrode can be obtained.

ある粒径Dpの粒子の分級領域入口での濃度分布は無視できるとして、捕集電極に最も近い位置であるx=0から吸込まれた微粒子の移動距離Lは式(7)で与えられる。

Figure 2020051784
Assuming that the concentration distribution of particles having a certain particle diameter Dp at the entrance of the classification region can be ignored, the moving distance L of the sucked fine particles from x = 0, which is the position closest to the collection electrode, is given by Expression (7).
Figure 2020051784

一方、捕集電極から最も遠い位置であるx=d(dは電極間距離)から吸込まれた微粒子の移動距離Lは式(8)で与えられる。

Figure 2020051784
On the other hand, the moving distance L of the sucked fine particles from x = d (d is the distance between the electrodes), which is the farthest position from the collecting electrode, is given by equation (8).
Figure 2020051784

ここで、試料ガス流量をQとし、流路10の入口12の開口幅をWとすると、式(9)の関係が成り立つことから、Lmaxは式(10)で与えられる。

Figure 2020051784
Here, assuming that the sample gas flow rate is Q and the opening width of the inlet 12 of the flow channel 10 is W, Lmax is given by Expression (10) since the relationship of Expression (9) holds.
Figure 2020051784

Figure 2020051784
Figure 2020051784

LminからL0までの間の捕集電極に捉えられる単位時間および単位面積当たりの粒子濃度をq(個/m/sec)とすると、qは次式(11)となる。

Figure 2020051784
Assuming that the particle concentration per unit time and per unit area captured by the collecting electrode from Lmin to L0 is q (particles / m 2 / sec), q is represented by the following equation (11).
Figure 2020051784

これに式(5)および式(12)に基づいて整理すると、式(12)となる。

Figure 2020051784
By rearranging this based on Equations (5) and (12), Equation (12) is obtained.
Figure 2020051784

式(12)から分かるように、微粒子は、電極間方向xの位置x0に関係なく、0<x0<dの間、すなわち微粒子の移動距離LminからLmaxの間で均等に分布する。ここで、Cは装置に吸込まれる電気移動度Zpの粒子濃度(個/m)である。式(12)が成立することにより、捕集電極の流れ方向の長さがLのとき、計測される電流値は式(13)となる。

Figure 2020051784
As can be seen from Equation (12), the particles are uniformly distributed between 0 <x0 <d, that is, between the moving distance Lmin and Lmax of the particles, regardless of the position x0 in the inter-electrode direction x. Here, C is the particle concentration (particles / m 3 ) of the electric mobility Zp sucked into the device. By equation (12) is satisfied, the length of the flow direction of the collecting electrode when L 1, the current value measured is the formula (13).
Figure 2020051784

LminからLmaxの間に同じ流さの測定電極24を置くと、粒径Dpに関しては同じ量の測定信号を得ることができる、また、信号量は電極の長さに比例することから、その比をもって電極長さの不均一の影響も排除できる。   When the measurement electrodes 24 having the same flow rate are placed between Lmin and Lmax, the same amount of measurement signal can be obtained with respect to the particle diameter Dp. Further, since the signal amount is proportional to the length of the electrodes, the ratio is determined by the ratio. The effect of non-uniform electrode length can also be eliminated.

これによると、図2の構成において、第1測定電極24_1により捕捉される割合(捕捉率)と第2測定電極24_2により捕捉される捕捉率との差分信号をとることで、特定の粒径範囲の信号のみを取り出すことができる。差分により得られる粒径分布が持つ意味は次のとおりである。差分前は各電極には大粒径の粒子が際限なく入っているが、差分をとることで、ある決まった粒径範囲の粒子のみをカウントすることができる。さらに、差分をとることで、振動、温度、輻射等のノイズをキャンセルでき、結果的に高いS/N比の測定信号を得ることができる。   According to this, in the configuration of FIG. 2, by taking a difference signal between a ratio (capture rate) captured by the first measurement electrode 24_1 and a capture rate captured by the second measurement electrode 24_2, a specific particle size range is obtained. Can be extracted. The meaning of the particle size distribution obtained from the difference is as follows. Before the difference, each electrode contains particles having a large particle size infinitely, but by taking the difference, only particles within a certain particle size range can be counted. Further, by taking the difference, noise such as vibration, temperature, and radiation can be canceled, and as a result, a measurement signal with a high S / N ratio can be obtained.

図2の構成例では、検流回路28_1〜28_4は図示しない差分回路を経て演算部に接続され、帯電微粒子の持つ電荷量から所定の演算処理がなされる。演算部は、微粒子分級測定装置の動作を制御するための専用のコンピュータ、または外部の汎用のコンピュータ(例えば、パーソナルコンピュータ)により実現することができる。演算部は、測定電極24に到達した帯電微粒子の分級された微粒子の量として微粒子数、総表面積、総重量またはそれらの濃度値を算出する。演算部における演算処理の詳細は特許文献1に示されている。   In the configuration example of FIG. 2, the galvanometer circuits 28_1 to 28_4 are connected to a calculation unit via a difference circuit (not shown), and a predetermined calculation process is performed based on the charge amount of the charged fine particles. The calculation unit can be realized by a dedicated computer for controlling the operation of the particle classification measuring device, or an external general-purpose computer (for example, a personal computer). The calculation unit calculates the number of fine particles, the total surface area, the total weight, or their concentration as the amount of the classified fine particles of the charged fine particles that have reached the measurement electrode 24. The details of the arithmetic processing in the arithmetic unit are disclosed in Patent Document 1.

(微粒子分級測定装置における課題)
以上説明したように、微粒子分級測定装置では、分級領域において、流路10を流れる試料ガスの流れ方向に対して垂直またはほぼ垂直になるように捕集電界を発生させることにより、帯電微粒子は粒径ごとに移動距離LimからLmaxの間に均等に分布する。これにより、隣接する測定電極24の捕捉率の差分をとることで、特定粒径範囲の信号を取り出すことができる。
(Issues in fine particle classification measuring equipment)
As described above, in the fine particle classification measuring device, the charged fine particles are generated by generating the trapping electric field in the classification region so as to be perpendicular or substantially perpendicular to the flow direction of the sample gas flowing through the flow path 10. It is distributed evenly between the movement distance Lim and Lmax for each diameter. Thus, a signal in a specific particle size range can be extracted by taking the difference between the capture rates of the adjacent measurement electrodes 24.

しかしながら、実際の装置においては、分級領域の上流側の先端位置および下流側の先端位置である、分級領域の境界において、捕集電界が分級領域の外部に漏れる場合がある。以降の説明では、この分級領域から漏れ出た電界を「漏れ電界」とも称する。   However, in an actual apparatus, the trapping electric field may leak out of the classification area at the boundary of the classification area, which is the upstream end position and the downstream end position of the classification area. In the following description, the electric field leaking from the classification region is also referred to as “leakage electric field”.

図5は、漏れ電界を模式的に示す概略断面図である。図5において、第1測定電極24_1の上流側の先端位置は、分級領域の基点(y=0)であり、流路10の入口から分級領域の基点までの距離は助走距離である。   FIG. 5 is a schematic sectional view schematically showing a leakage electric field. In FIG. 5, the upstream end position of the first measurement electrode 24_1 is the base point (y = 0) of the classification area, and the distance from the entrance of the flow path 10 to the base point of the classification area is the approach distance.

この助走距離において、流路10の天井面40および下底面42の各々には捕集電極と同じ電位(接地電位)が与えられている。そのため、分級電極30と天井面40との間、および分級電極30と下底面42との間にも、分級電極30および捕集電極間と同等の電位差が生じている。その結果、図中に矢印で示すように、分級電極30と天井面40および下底面42との間に漏れ電界が発生する。   At this approach distance, the same potential (ground potential) as that of the collection electrode is applied to each of the ceiling surface 40 and the lower bottom surface 42 of the flow path 10. Therefore, a potential difference equal to that between the classification electrode 30 and the collecting electrode is generated between the classification electrode 30 and the ceiling surface 40 and between the classification electrode 30 and the lower bottom surface 42. As a result, as shown by arrows in the figure, a leakage electric field is generated between the classification electrode 30 and the ceiling surface 40 and the lower bottom surface 42.

漏れ電界が発生すると、流路10を流れる試料ガス中の帯電微粒子は、助走距離において天井面40または下底面42に引き付けられてしまい、分級領域に到達することが妨げられることになる。図6を用いて、漏れ電界の影響を説明する。図6は、特定の粒径の微粒子の濃度分布を模式的に示す図である。図6の横軸は流路10の出口に向かう方向(y方向)における位置を示し、図6の縦軸は粒子濃度を示す。図中のy=0は分級領域の基点に相当する。   When the leakage electric field is generated, the charged fine particles in the sample gas flowing through the flow channel 10 are attracted to the ceiling surface 40 or the lower bottom surface 42 at the approach distance, and are prevented from reaching the classification region. The effect of the leakage electric field will be described with reference to FIG. FIG. 6 is a diagram schematically showing a concentration distribution of fine particles having a specific particle size. The horizontal axis in FIG. 6 shows the position in the direction (y direction) toward the outlet of the flow channel 10, and the vertical axis in FIG. 6 shows the particle concentration. Y = 0 in the figure corresponds to the base point of the classification area.

図6において、波形k1は漏れ電界が発生していないときの微粒子の濃度分布を示し、波形k2は漏れ電界が発生しているときの微粒子の濃度分布を示す。漏れ電界が発生していない場合には、微粒子の移動距離LminからLmaxの間で粒子濃度は均等に分布する。図6の例では、測定電極24_1,24_2に亘って粒子濃度が均等に分布しており、波形k1はほぼ矩形状となっている。   In FIG. 6, a waveform k1 shows the concentration distribution of the fine particles when no leakage electric field is generated, and a waveform k2 shows the concentration distribution of the fine particles when the leakage electric field is generated. When no leakage electric field is generated, the particle concentration is evenly distributed between the moving distances Lmin and Lmax of the fine particles. In the example of FIG. 6, the particle concentration is evenly distributed over the measurement electrodes 24_1 and 24_2, and the waveform k1 has a substantially rectangular shape.

これに対して、図中に矢印で示すような漏れ電界が発生している場合には、分級領域の基点(y=0)よりも上流側に発生した漏れ電界によって、天井面40および下底面42に微粒子が捕捉されてしまう。そのため、濃度分布は、波形k2に示すように、分級領域の上流側の境界付近における粒子濃度が低下するとともに、下流側の粒子濃度が低下する。特に、粒径の小さな微粒子は入口側の捕集電極により多く捕捉されるため、粒径の大きな微粒子に比べて、漏れ電界の影響を受けやすい傾向がある。   On the other hand, when a leakage electric field as indicated by an arrow in the drawing is generated, the ceiling surface 40 and the lower bottom surface are caused by the leakage electric field generated upstream from the base point (y = 0) of the classification area. The fine particles are trapped by 42. Therefore, in the concentration distribution, as shown by the waveform k2, the particle concentration near the boundary on the upstream side of the classification area decreases and the particle concentration on the downstream side decreases. In particular, fine particles having a small particle diameter are more frequently captured by the collecting electrode on the entrance side, and thus tend to be more susceptible to the leakage electric field than fine particles having a large particle diameter.

波形k2における上流側の粒子濃度の低下は、下底面42に捕捉された微粒子の影響によるものであり、下流側の粒子濃度の低下は、天井面40に捕捉された微粒子の影響によるものである。その結果、波形k2は、波形k1の矩形状から台形状に変化している。   The decrease in the particle concentration on the upstream side in the waveform k2 is due to the influence of the fine particles captured on the lower bottom surface 42, and the decrease in the particle concentration on the downstream side is due to the influence of the fine particles captured on the ceiling surface 40. . As a result, the waveform k2 changes from the rectangular shape of the waveform k1 to a trapezoidal shape.

このように漏れ電界が発生すると、粒径ごとの粒子濃度の分布が不均等になってしまう。そのため、隣接する測定電極24の捕捉率の差分をとっても、特定粒径範囲の信号を正確に取り出すことが困難となる。その結果、微粒子を粒径に応じて分級する粒径分解能が低下することが懸念される。   When the leakage electric field is generated as described above, the distribution of the particle concentration for each particle size becomes uneven. Therefore, it is difficult to accurately extract a signal in a specific particle size range even if the difference between the capture rates of the adjacent measurement electrodes 24 is calculated. As a result, there is a concern that the particle size resolution for classifying the fine particles according to the particle size is reduced.

そこで、本実施の形態に係る微粒子分級測定装置においては、分級領域の上流側の境界において、分級電極30と捕集電極との間に少なくとも1つの電極を配置し、この少なくとも1つの電極に対して、分級電極30の電位と捕集電極の電位との間の中間電位を与える構成とする。本願明細書では、分級電極30と捕集電極との間に配置される電極を「中間電極」とも称する。   Therefore, in the fine particle classification measuring device according to the present embodiment, at least one electrode is arranged between the classification electrode 30 and the collection electrode at the boundary on the upstream side of the classification region. Thus, an intermediate potential between the potential of the classification electrode 30 and the potential of the collection electrode is provided. In the present specification, an electrode arranged between the classification electrode 30 and the collection electrode is also referred to as an “intermediate electrode”.

図7は、本実施の形態に係る微粒子分級測定装置における中間電極の構成例を説明するための図である。   FIG. 7 is a diagram for explaining a configuration example of the intermediate electrode in the particle classification measuring device according to the present embodiment.

図7を参照して、分級領域の上流側の境界には、3つの中間電極50_1〜50_3が配置される。中間電極50_1〜50_3は、分級電極30の上流側の先端位置と捕集電極の上流側の先端位置との間に、電極間方向(x方向)に沿って等間隔に配置される。中間電極50_1〜50_3は包括的に中間電極50と称されることもある。   Referring to FIG. 7, three intermediate electrodes 50_1 to 50_3 are arranged on the upstream boundary of the classification area. The intermediate electrodes 50_1 to 50_3 are arranged at regular intervals along the inter-electrode direction (x direction) between the upstream end position of the classification electrode 30 and the upstream end position of the collection electrode. The intermediate electrodes 50_1 to 50_3 may be collectively referred to as an intermediate electrode 50.

図1および図2に示したように、捕集電極を、トラップ電極を含まず、測定電極24のみで構成した場合には、分級電極30の上流側の先端位置と第1測定電極24_1の上流側の先端位置との間に少なくとも1つの中間電極50が配置される。一方、図示は省略するが、捕集電極がトラップ電極を含む場合には、分級電極30の上流側の先端位置とトラップ電極の上流側の先端位置との間に少なくとも1つの中間電極50が配置される。   As shown in FIGS. 1 and 2, when the collecting electrode does not include the trapping electrode and includes only the measuring electrode 24, the tip position on the upstream side of the classification electrode 30 and the upstream side of the first measuring electrode 24 </ b> _ <b> 1. At least one intermediate electrode 50 is disposed between the first and second side electrodes. On the other hand, although not shown, when the collection electrode includes a trap electrode, at least one intermediate electrode 50 is disposed between the upstream end position of the classification electrode 30 and the upstream end position of the trap electrode. Is done.

図7では、分級電極30と第1測定電極24_1との間隔をdとし、分級電極30と第1中間電極50_1との間隔をd1、第1中間電極50_1と第2中間電極50_2との間隔をd2、第2中間電極50_2と第3中間電極50_3との間隔をd3、第3中間電極50_3と第1測定電極24_1との間隔をd4としている。dとd1〜d4との間には、d1=d2=d3=d4=d/4の関係が成り立っている。   In FIG. 7, the distance between the classification electrode 30 and the first measurement electrode 24_1 is d, the distance between the classification electrode 30 and the first intermediate electrode 50_1 is d1, and the distance between the first intermediate electrode 50_1 and the second intermediate electrode 50_2 is d. d2, the distance between the second intermediate electrode 50_2 and the third intermediate electrode 50_3 is d3, and the distance between the third intermediate electrode 50_3 and the first measurement electrode 24_1 is d4. The relationship d1 = d2 = d3 = d4 = d / 4 holds between d and d1 to d4.

図7の構成例において、分級電極30の電位がプラスの電位V(V>0)となるように分級電源32から分級電極30に電圧を印加し、測定電極24に接地電位(ゼロ電位)を与えるものとする。帯電器を作動させて試料ガス中の微粒子にプラスの電荷をもたせると、荷電された微粒子は捕集電界によって測定電極24の方向に引き付けられる。   In the configuration example of FIG. 7, a voltage is applied from the classification power supply 32 to the classification electrode 30 so that the potential of the classification electrode 30 becomes a positive potential V (V> 0), and a ground potential (zero potential) is applied to the measurement electrode 24. Shall be given. When the charger is activated to give the fine particles in the sample gas a positive charge, the charged fine particles are attracted in the direction of the measuring electrode 24 by the trapping electric field.

第1中間電極50_1に電位V1を与え、第2中間電極50_2に電位V2を与え、第3中間電極50_3に電位V3を与えることとすると、電位V1〜V3は式(14)〜(16)でそれぞれ表わされる。

Figure 2020051784
Assuming that the potential V1 is applied to the first intermediate electrode 50_1, the potential V2 is applied to the second intermediate electrode 50_2, and the potential V3 is applied to the third intermediate electrode 50_3, the potentials V1 to V3 are expressed by the equations (14) to (16). Respectively represented.
Figure 2020051784

このようにすると、分級電極30および第1中間電極50_1間の電界強度、第1中間電極50_1および第2中間電極50_2間の電界強度、第2中間電極50_2および第3中間電極50_3間の電界強度、第3中間電極50_3および第1測定電極24_1間の電界強度は、いずれもE=V/dとなり、分級領域内で発生する捕集電界の電界強度(式(3)参照)と等しくすることができる。   By doing so, the electric field intensity between the classification electrode 30 and the first intermediate electrode 50_1, the electric field intensity between the first intermediate electrode 50_1 and the second intermediate electrode 50_2, and the electric field intensity between the second intermediate electrode 50_2 and the third intermediate electrode 50_3 , The electric field intensity between the third intermediate electrode 50_3 and the first measurement electrode 24_1 is E = V / d, and is equal to the electric field intensity of the trapping electric field generated in the classification region (see the equation (3)). Can be.

分級電極30と第1測定電極24との間に中間電極50を配置したことにより、図7に矢印で示すように、分級領域の境界付近では、分級電極30と中間電極50との間、および隣接する中間電極50との間に電界が発生する。発生した電界は第1測定電極24_1に集束されることから、図5に示したような漏れ電界の発生が抑制されている。これによると、試料ガス中の帯電微粒子が分級領域よりも上流の助走距離において天井面40および下底面42に捕捉されることを抑制することができる。   By arranging the intermediate electrode 50 between the classification electrode 30 and the first measurement electrode 24, as shown by arrows in FIG. 7, near the boundary of the classification region, between the classification electrode 30 and the intermediate electrode 50, and An electric field is generated between adjacent intermediate electrodes 50. Since the generated electric field is focused on the first measurement electrode 24_1, the generation of the leakage electric field as shown in FIG. 5 is suppressed. According to this, it is possible to prevent the charged fine particles in the sample gas from being captured by the ceiling surface 40 and the lower bottom surface 42 at the approach distance upstream of the classification region.

なお、上述したように、分級領域の境界付近においても、捕集電界と同じ電界強度の電界が発生するように中間電極50を配置することで、境界付近で帯電微粒子が中間電極50に捕捉されることを抑制することができる。これにより、分級領域に到達した帯電微粒子を捕集電極の方向に移動させることができ、結果的に微粒子の濃度分布を図6の波形k1に近付けることができる。   As described above, by arranging the intermediate electrode 50 so as to generate an electric field having the same electric field strength as the trapping electric field also near the boundary of the classification region, the charged fine particles are captured by the intermediate electrode 50 near the boundary. Can be suppressed. As a result, the charged fine particles that have reached the classification region can be moved in the direction of the collecting electrode, and as a result, the concentration distribution of the fine particles can be made closer to the waveform k1 in FIG.

図8は、図7に示した中間電極50の第1構成例を示す図である。
図8を参照して、中間電極50はワイヤー状の形状を有する。中間電極50は分級電源32および捕集電極(接地電位)の間に電気的に接続される。具体的には、第1中間電極50_1の一方端は抵抗素子r1を介して分級電源32に電気的に接続され、第1中間電極50_1の他方端は抵抗素子r4,r5,r6を介して接地電位に電気的に接続される。第2中間電極50_2の一方端は抵抗素子r1,r2を介して分級電源32に電気的に接続され、第2中間電極50_2の他方端は抵抗素子r5,r6を介して接地電位に電気的に接続される。第3中間電極50_3の一方端は抵抗素子r1,r2,r3を介して分級電源32に電気的に接続され、第3中間電極50_3の他方端は抵抗素子r6を介して接地電位に電気的に接続される。抵抗素子r1〜r6は「抵抗分圧回路」の一実施例に対応する。
FIG. 8 is a diagram showing a first configuration example of the intermediate electrode 50 shown in FIG.
Referring to FIG. 8, intermediate electrode 50 has a wire-like shape. The intermediate electrode 50 is electrically connected between the classification power supply 32 and the collecting electrode (ground potential). Specifically, one end of the first intermediate electrode 50_1 is electrically connected to the classification power supply 32 via the resistance element r1, and the other end of the first intermediate electrode 50_1 is grounded via the resistance elements r4, r5, r6. It is electrically connected to a potential. One end of the second intermediate electrode 50_2 is electrically connected to the classification power supply 32 through the resistance elements r1 and r2, and the other end of the second intermediate electrode 50_2 is electrically connected to the ground potential through the resistance elements r5 and r6. Connected. One end of the third intermediate electrode 50_3 is electrically connected to the classification power supply 32 through the resistance elements r1, r2, and r3, and the other end of the third intermediate electrode 50_3 is electrically connected to the ground potential through the resistance element r6. Connected. The resistance elements r1 to r6 correspond to an embodiment of a “resistance voltage dividing circuit”.

図8の構成例において、抵抗素子r1〜r6は互いに等しい電気抵抗値rを有している。第1中間電極50_1の電位V1は分級電源32の印加電圧Vを抵抗素子r1,r4,r5,r6で分圧され、式(14)に示す電位となる。第2中間電極50_2の電位V2は分級電源32の印加電圧Vを抵抗素子r1,r2,r5,r6で分圧され、式(15)に示す電位となる。第3中間電極50_3の電位V3は分級電源32の印加電圧Vを抵抗素子r1,r2,r3,r6で分圧され、式(16)に示す電位となる。   In the configuration example of FIG. 8, the resistance elements r1 to r6 have the same electric resistance value r. The potential V1 of the first intermediate electrode 50_1 is obtained by dividing the applied voltage V of the classifying power supply 32 by the resistance elements r1, r4, r5, and r6, and becomes the potential shown in Expression (14). The potential V2 of the second intermediate electrode 50_2 is obtained by dividing the applied voltage V of the classifying power supply 32 by the resistance elements r1, r2, r5, and r6, and becomes the potential shown in Expression (15). The potential V3 of the third intermediate electrode 50_3 is obtained by dividing the applied voltage V of the classifying power supply 32 by the resistance elements r1, r2, r3, and r6, and becomes the potential shown in Expression (16).

図9は、図7に示した中間電極50の第2構成例を示す図である。
図9を参照して、第2構成例では、図8の第1構成例と比較して、中間電極50の形状が板状である点が異なる。第2構成例においても、分級電源32から印加される電圧Vを抵抗分圧することにより、中間電極50_1,50_2,50_3に電位V1,V2,V3をそれぞれ与えることができる。
FIG. 9 is a diagram showing a second configuration example of the intermediate electrode 50 shown in FIG.
Referring to FIG. 9, the second configuration example is different from the first configuration example of FIG. 8 in that intermediate electrode 50 has a plate shape. Also in the second configuration example, the potentials V1, V2, and V3 can be respectively applied to the intermediate electrodes 50_1, 50_2, and 50_3 by dividing the voltage V applied from the classification power supply 32 by resistance.

なお、図8および図9では、分級電源32の電圧を利用して中間電極50に印加する電圧を生成する構成例について説明したが、分級電源32とは別の電源を用いて中間電極50に印加する電圧を生成する構成としてもよい。   8 and 9, the configuration example in which the voltage to be applied to the intermediate electrode 50 is generated using the voltage of the classification power supply 32 has been described. A configuration for generating a voltage to be applied may be adopted.

また、分級電極30と捕集電極との間に配置する中間電極50の数は少なくとも1つあればよい。さらに、分級電極30と中間電極50との間隔、隣接する中間電極50の間隔、および中間電極50と捕集電極との間隔は、隣接する電極間に発生する電界強度が互いに等しければ、互いに等しい間隔でなくてもよい。   In addition, the number of intermediate electrodes 50 disposed between the classification electrode 30 and the collection electrode may be at least one. Further, the distance between the classifying electrode 30 and the intermediate electrode 50, the distance between the adjacent intermediate electrodes 50, and the distance between the intermediate electrode 50 and the collecting electrode are equal to each other if the electric field strength generated between the adjacent electrodes is equal to each other. It does not have to be an interval.

したがって、図10に示すように、分級電極30と捕集電極との間に、2つの中間電極50_1,50_2を不等間隔に配置する構成としてもよい。図10の例では、分級電極30および第1中間電極50_1の間隔d1、第1中間電極50_1および第2中間電極50_2の間隔d2、第2中間電極50_2および捕集電極の間隔d3を、d1:d2:d3=1:2:2としている。   Therefore, as shown in FIG. 10, a configuration in which the two intermediate electrodes 50_1 and 50_2 are arranged at irregular intervals between the classification electrode 30 and the collection electrode may be adopted. In the example of FIG. 10, the distance d1 between the classifying electrode 30 and the first intermediate electrode 50_1, the distance d2 between the first intermediate electrode 50_1 and the second intermediate electrode 50_2, and the distance d3 between the second intermediate electrode 50_2 and the collecting electrode are d1: d2: d3 = 1: 2: 2.

第1中間電極50_1に電位V1=V×4/5を与え、第2中間電極50_2に電位V2=V×2/5を与える。このようにすると、分級電極30および第1中間電極50_1間の電界強度、第1中間電極50_1および第2中間電極50_2間の電界強度、第2中間電極50_2および捕集電極間の電界強度は、いずれもE=V/dとなり、分級領域内で発生する捕集電界の電界強度と等しくすることができる。   The potential V1 = V × 4/5 is applied to the first intermediate electrode 50_1, and the potential V2 = V × 2/5 is applied to the second intermediate electrode 50_2. In this case, the electric field strength between the classification electrode 30 and the first intermediate electrode 50_1, the electric field strength between the first intermediate electrode 50_1 and the second intermediate electrode 50_2, and the electric field strength between the second intermediate electrode 50_2 and the collecting electrode are: In each case, E = V / d, which can be made equal to the electric field intensity of the trapping electric field generated in the classification region.

このように本実施の形態に係る微粒子分級測定装置によれば、分級領域の上流側の境界において、分級電極30および捕集電極の間に少なくとも1つの中間電極50を配置することにより、分級領域の外部への漏れ電界の発生を抑制することができる。これによると、流路を流れる試料ガス中の帯電微粒子は漏れ電界に妨げられることなく、分級領域に到達することができるため、分級領域において微粒子を均等に分布させることができる。その結果、微粒子を粒径に応じて分級する分解能が低下することを抑制することができる。   As described above, according to the fine particle classification measuring apparatus according to the present embodiment, by disposing at least one intermediate electrode 50 between the classification electrode 30 and the collecting electrode at the upstream boundary of the classification region, Can be suppressed from being generated outside. According to this, the charged fine particles in the sample gas flowing through the flow path can reach the classification region without being hindered by the leakage electric field, so that the fine particles can be evenly distributed in the classification region. As a result, it is possible to suppress a decrease in resolution for classifying the fine particles according to the particle diameter.

なお、上述した実施の形態では、分級領域の上流側の境界において中間電極50を配置する構成について説明したが、図5に示すように、分級領域の下流側の境界においても漏れ電界が発生している。したがって、図11に示すように、分級領域の下流側の境界においても中間電極50を配置することで、分級領域の下流側における漏れ電界の発生を抑制することができる。   In the above-described embodiment, the configuration in which the intermediate electrode 50 is arranged at the boundary on the upstream side of the classification area has been described. However, as shown in FIG. ing. Therefore, as shown in FIG. 11, by arranging the intermediate electrode 50 also at the boundary on the downstream side of the classification area, it is possible to suppress the generation of the leakage electric field on the downstream side of the classification area.

図11の構成例は、例えば、試料ガス中の帯電粒子を捕集電極側に引き付けてナノ粒子膜成膜基板に堆積させることによりナノ粒子膜を形成するように構成された成膜装置に好適に利用することができる。分流領域の下流側に到達した帯電微粒子は、分級領域から漏れ出ることなく、ナノ粒子膜成膜基板に捕集されることになり、粒子濃度分布が一様なナノ粒子膜を形成することができる。   The configuration example of FIG. 11 is suitable for, for example, a film forming apparatus configured to form a nanoparticle film by attracting charged particles in a sample gas to a collecting electrode side and depositing the particles on a nanoparticle film deposition substrate. Can be used for The charged fine particles reaching the downstream side of the branching region are collected on the nanoparticle film deposition substrate without leaking from the classification region, and a nanoparticle film having a uniform particle concentration distribution can be formed. it can.

また、上述した実施の形態では、流路を、流れ方向に対して垂直方向の断面形状が横方向に扁平な形状としたが、流路の断面形状を実施例のものから90度回転させた縦方向に扁平な形状としてもよい。また、流路は、実施例に示したような断面が方形のものに限らず、円形のものや、分級電極と捕集電極とを二重円筒状に互いに対向するように配置した構造としてもよい。一対の電極間に分級電圧を印加し、それにより発生する捕集電界によって帯電微粒子を粒径に応じて分級する原理を利用した分級装置であれば、本発明を適用することができる。   In the above-described embodiment, the flow path has a cross-sectional shape in a direction perpendicular to the flow direction that is flat in the horizontal direction. However, the cross-sectional shape of the flow path is rotated by 90 degrees from that in the example. The shape may be flat in the vertical direction. Further, the flow path is not limited to a rectangular cross section as shown in the embodiment, but may be a circular one or a structure in which a classifying electrode and a collecting electrode are arranged so as to face each other in a double cylindrical shape. Good. The present invention can be applied to any classifier using a principle of applying a classification voltage between a pair of electrodes and classifying the charged fine particles according to the particle diameter by a trapping electric field generated by the classification voltage.

今回開示された実施の形態はすべての点で例示であって制限的なものではないと考えられるべきである。本発明の範囲は上記した説明ではなくて特許請求の範囲によって示され、特許請求の範囲と均等の意味および範囲内でのすべての変更が含まれることが意図される。   The embodiments disclosed this time are to be considered in all respects as illustrative and not restrictive. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

本発明は、自動車排ガス中のナノ微粒子濃度のモニタリング、ビル衛星管理および労働安全衛生などで使用するのに適する微粒子測定装置、特に、微粒子を粒径に応じて分級して測定する微粒子分級測定装置、粒子濃度分布が一様なサンプル作成装置、ナノ粒子膜成膜装置および触媒散布装置に好適に利用することができる。   The present invention relates to a fine particle measuring device suitable for use in monitoring the concentration of nanoparticles in automobile exhaust gas, building satellite management and occupational safety and health, and more particularly, a fine particle classifying device for classifying and measuring fine particles according to particle diameter. The present invention can be suitably used for a sample preparation device having a uniform particle concentration distribution, a nanoparticle film formation device, and a catalyst dispersion device.

10 流路、12 入口、13 インパクタ、13a 試料導入口、13b 排出口、14 出口、18 流量調整弁、20 放電電極、21 荷電電源、22 対向電極、24,24_1〜24_4 測定電極、28,28_1〜28_4 検流回路、30 分級電極、32 分級電源、40 天井面、42 下底面、44 ブロア、46 風量センサ、48 流量モニタ、50,50_1〜50_3 中間電極。   Reference Signs List 10 flow path, 12 inlet, 13 impactor, 13a sample inlet, 13b outlet, 14 outlet, 18 flow control valve, 20 discharge electrode, 21 charging power source, 22 counter electrode, 24, 24_1 to 24_4 measuring electrode, 28, 28_1 -28_4 Current detection circuit, 30-class electrode, 32-class power supply, 40 ceiling surface, 42 bottom surface, 44 blower, 46 air flow sensor, 48 flow monitor, 50, 50_1 to 50_3 intermediate electrode.

Claims (5)

入口および出口を有し、内部を流れる試料ガスが層流となり得る平行な流路と、
前記流路の前記入口から前記試料ガスを吸入するとともに、吸入された前記試料ガスが前記流路内を層流となって流れる条件で駆動される送風機構と、
前記流路の前記入口側に配置され、前記試料ガス中の微粒子を帯電させる帯電器と、
前記流路の対向する一対の面の一方の面上に、前記帯電器よりも下流側に配置された捕集電極と、
前記一対の面の他方の面上に、前記捕集電極と対向して配置され、前記捕集電極との間に前記流路を流れる前記試料ガス中の帯電微粒子を前記捕集電極側に引き付ける捕集電界を発生させる分級電極とを備え、
前記分級電極と前記捕集電極との間には、前記試料ガス中の前記帯電微粒子を粒径に応じて分級するための分級領域が形成され、
前記分級領域の上流側の境界において前記分級電極と前記捕集電極との間に配置され、前記分級電極の電位と前記捕集電極の電位との中間電位を有する、少なくとも1つの中間電極をさらに備える、微粒子分級測定装置。
A parallel flow path having an inlet and an outlet, wherein the sample gas flowing therethrough can be laminar;
An air blowing mechanism driven under conditions in which the sample gas is sucked from the inlet of the flow channel and the sucked sample gas flows as a laminar flow in the flow channel.
A charger that is disposed on the inlet side of the flow path and charges fine particles in the sample gas,
On one of the pair of opposing surfaces of the flow path, a collecting electrode disposed downstream of the charger.
On the other of the pair of surfaces, the charged fine particles in the sample gas, which are disposed to face the collection electrode and flow through the flow path between the collection electrode and the collection electrode, are attracted to the collection electrode. A classification electrode for generating a trapping electric field,
A classification region for classifying the charged fine particles in the sample gas according to a particle size is formed between the classification electrode and the collection electrode,
At least one intermediate electrode, which is disposed between the classification electrode and the collection electrode at an upstream boundary of the classification region and has an intermediate potential between the potential of the classification electrode and the potential of the collection electrode, Equipped with a particle classification measuring device.
前記少なくとも1つの中間電極は、前記分級電極との間および前記捕集電極との間に前記捕集電界の電界強度と等しい電界強度を有する電界を発生させる、請求項1に記載の微粒子分級測定装置。   The particle classification measurement according to claim 1, wherein the at least one intermediate electrode generates an electric field having an electric field intensity equal to an electric field intensity of the trapping electric field between the classification electrode and the collection electrode. apparatus. 前記分級電極に電圧を印加するための分級電源と、
前記分級電源の電圧を分圧して前記中間電位を生成するように構成された抵抗分圧回路とをさらに備える、請求項1または2に記載の微粒子分級測定装置。
A classification power supply for applying a voltage to the classification electrode,
The particle classification measuring device according to claim 1, further comprising: a resistance voltage dividing circuit configured to divide a voltage of the classification power supply to generate the intermediate potential.
前記捕集電極は、前記流路の前記入口から互いに異なる距離の位置に配置された複数の測定電極を含み、
前記複数の測定電極にそれぞれ接続され、対応する測定電極に到達した前記帯電微粒子がもつ電荷量を検出する複数の検流回路をさらに備える、請求項1から3のいずれか1項に記載の微粒子分級測定装置。
The collection electrode includes a plurality of measurement electrodes arranged at positions different from each other from the inlet of the flow path,
The microparticle according to any one of claims 1 to 3, further comprising a plurality of galvanic circuits respectively connected to the plurality of measurement electrodes and detecting a charge amount of the charged microparticle reaching the corresponding measurement electrode. Classification measuring device.
入口および出口を有し、内部を流れる試料ガスが層流となり得る平行な流路と、
前記流路の前記入口から前記試料ガスを吸入するとともに、吸入された前記試料ガスを前記流路内を層流となって流れる条件で駆動される送風機構と、
前記流路の前記入口側に配置され、前記試料ガス中の微粒子を帯電させる帯電器と、
前記流路の対向する一対の面の一方の面上に、前記帯電器よりも下流側に配置された捕集電極と、
前記一対の面の他方の面上に、前記捕集電極と対向して配置され、前記捕集電極との間に前記流路を流れる前記試料ガス中の帯電微粒子を前記捕集電極側に引き付ける捕集電界を発生させる分級電極とを備え、
前記分級電極と前記捕集電極との間には、前記試料ガス中の前記帯電微粒子を粒径に応じて分級するための分級領域が形成され、
前記分級領域の上流側の境界において前記分級電極と前記捕集電極との間に配置され、前記分級電極の電位と前記捕集電極の電位との中間電位を有する、少なくとも1つの第1の中間電極と、
前記分級領域の下流側の境界において前記分級電極と前記捕集電極との間に配置され、前記中間電位を有する、少なくとも1つの第2の中間電極とをさらに備える、微粒子分級測定装置。
A parallel flow path having an inlet and an outlet, wherein the sample gas flowing therethrough can be laminar;
A blower mechanism driven under the condition that the sample gas is sucked from the inlet of the flow channel and the sucked sample gas flows as a laminar flow in the flow channel,
A charger that is disposed on the inlet side of the flow path and charges fine particles in the sample gas,
On one of the pair of opposing surfaces of the flow path, a collecting electrode disposed downstream of the charger.
On the other of the pair of surfaces, the charged fine particles in the sample gas that are disposed to face the collection electrode and flow through the flow path between the collection electrode and the collection electrode are attracted to the collection electrode side. A classification electrode for generating a trapping electric field,
A classification region for classifying the charged fine particles in the sample gas according to a particle size is formed between the classification electrode and the collection electrode,
At least one first intermediate disposed between the classification electrode and the collection electrode at an upstream boundary of the classification region and having an intermediate potential between the potential of the classification electrode and the potential of the collection electrode; Electrodes and
A fine particle classification measuring device, further comprising: at least one second intermediate electrode having the intermediate potential and disposed between the classification electrode and the collection electrode at a downstream boundary of the classification region.
JP2018178818A 2018-09-25 2018-09-25 Fine particle classification measurement device Pending JP2020051784A (en)

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