JP2019105462A - Temperature measurement system and method thereof - Google Patents

Abstract

To provide a temperature measurement system and method thereof capable of easily extracting the temperature of an ICT device from the measurement result obtained by measuring the temperature of the ICT device housed in a rack over a panel of the rack.SOLUTION: A thermography 110 focuses on a front panel 12 of a rack 10 (S401), and measures the temperatures of the front panel 12 and ICT devices 11-1 to 11-m from the front of the rack 10 with the front panel 12 closed (S402). A measurement result processing computer 120 extracts the temperature (distribution) of the ICT devices 11-1 to 11-m by excluding the temperature distribution of the front panel 12 from the measurement result transferred from the thermography. Specifically, the measurement result which is recorded by replacing the color for each pixel is converted into a temperature (S403), and is divided into a low temperature area and a high temperature area (S404). It is determined that the area where the temperature is low is the temperature of the front panel 12, and the area where the temperature is high is the temperature of the ICT devices 11-1 to 11-m (S405).SELECTED DRAWING: Figure 4

Description

  The present technology relates to a temperature measurement system and method thereof, and relates to a temperature measurement system and method for performing temperature measurement of each communication device / computer of many communication devices in a data center or communication machine room.

  Conventionally, a temperature sensor is often used to monitor the temperature of an apparatus for information communication technology (hereinafter simply referred to as "ICT apparatus") such as a communication apparatus in a data center or a communication machine room or a computer. Advances in IoT technology facilitate the use of small, power-saving (battery-powered) temperature sensors, temperature monitoring by networking sensors, practicalization of efficiency of air conditioning systems by cooperation with air conditioners, services Introduction is in progress (see Non-Patent Document 1).

  In data centers and communication equipment rooms, temperature management of ICT equipment for normal operation is important, but with the recent advancement of ICT equipment, the calorific value and calorific density tend to increase, and appropriate. Even when operating and managing air conditioning, local heat accumulation can easily occur. Because there is a proper operating temperature for ICT devices, it is necessary to quickly detect deviations from the proper operating temperature of the ICT device, such as heat pools.

  Since the temperature sensor measures the temperature in a narrow range near the sensor, for the purpose of grasping the local heat pool, it is necessary to monitor the temperature of each ICT device, that is, to install the temperature sensor. In the case of temperature monitoring and air conditioning efficiency improvement, it is necessary to significantly increase the number of installed temperature sensors.

However, as the number of installed temperature sensors increases, the cost of the system and the number of man-hours for system construction increase, as well as the installation and removal of ICT devices, reconstruction of the network of temperature sensors when moving, correspondence between sensors and measurement targets Management is complicated.

  Therefore, it has been difficult to realize precise temperature monitoring such as local heat accumulation in a large scale data center or communication machine room by a system using a temperature sensor.

  On the other hand, there is a method using thermography (infrared camera) as a comprehensive and efficient measurement method of the temperature state of a plurality of ICT devices. Normally, ICT devices in a data center and a communication machine room are housed in a communication rack (hereinafter simply referred to as a "rack"), but if thermography is used, the temperature distribution of a plurality of ICT devices in the rack is It is possible to capture comprehensively by measurement (shooting) (see Non-Patent Document 2).

  There is a panel (hereinafter referred to as "front panel") on the front of the rack, which is usually operated in a locked state, but on the front panel, cold air discharged from the air conditioners of the data center and the communication machine room In order to take in efficiently, a large number of intake holes are provided by punching or the like. Recently, there are many cases where the aperture ratio is so high that the ICT devices in the rack can be seen from outside the rack (approximately 60% or more, and in some cases recently more than 80% in some cases). In principle, thermography is to be performed without interference with the object to be measured, but in principle, it is also possible to measure the temperature of the ICT device in the rack from outside the rack through the air intake holes.

Ryuichi Nishida, 3 others, “A study on linked control of air conditioners and multi-temperature sensors for data centers,” Proceedings of the Annual Meeting of the Air Harmony and Sanitation Engineering Association, September 2010, pp. 2115-2118 Fumihito Ito, 2 others, "Discussion of the environmental temperature in the on-campus server room", Academic Information Processing No. 15, 2011, pp. 98-107

  However, in the measurement through the front panel of the rack using thermography, the measurement result (image) mixed with the temperature distribution of the front panel is encountered, and there are the following two problems.

  Usually, in thermography measurement, the ICT device to be measured is focused, but in such a case, the front panel is not in focus, so the image to be photographed is blurred due to the front panel Occurs. Since many small intake holes in the millimeter unit are accumulated in the front panel, the measurement results of the ICT equipment in the rack measured through the intake holes show the value where the temperature of the front panel is mixed over the entire intake holes. It becomes. Usually, since the temperature of the front panel is lower than the temperature of the ICT device, when the temperature of the ICT device and the temperature of the front panel are mixed and measured, the measurement result of the ICT device indicates a lower temperature than the actual temperature. There is a risk of missing an outbreak such as a heat pool.

  Also, even if the measurement result of the temperature of the ICT device is not influenced by the front panel, it is necessary to extract only the temperature of the ICT device from the measurement result (image). If the correspondence between each pixel of the measurement result (image) and the ICT device / front panel is clear in advance, it is possible in principle to extract only the measurement result of the ICT device, but It is not easy to measure.

  If the front panel of the rack is opened and measurement is performed, the above problem does not occur, but in a data center or communication machine room where there are several hundred or more racks, only opening and closing of the normally locked front panel But it is a lot of work, and such a method is practically difficult to realize.

  The present invention has been made in view of such problems, and an object of the present invention is to measure the temperature of the ICT apparatus from the measurement result of measuring the temperature of the ICT apparatus housed in the rack over the panel of the rack. It is an object of the present invention to provide an easily extractable temperature measurement system and its method.

  In order to solve the above problems, the temperature measurement system according to one aspect of the present invention is characterized in that the infrared ray radiated from the intake side panel provided with a large number of openings provided in the rack that accommodates the ICT device is the intake side panel An infrared measuring unit for measuring with focus on the infrared light, and converting the infrared image measured by the infrared measuring unit into temperature distribution data, and performing binarization processing for separating the temperature distribution data into a high temperature region and a low temperature region A binarization processing unit and an ICT apparatus temperature extraction unit for outputting a high temperature area of the temperature distribution data separated by the binarization processing as a temperature distribution of the ICT apparatus.

  In another aspect of the present invention, the infrared measurement unit further has a resolution capable of determining an opening of the intake side panel.

  In another aspect of the present invention, the binarization process is a discriminant analysis process in which a threshold value is determined so as to maximize the interclass variance of the two areas to the sum of the intraclass variance of the two areas. It is characterized by

  In the temperature measurement method according to one aspect of the present invention, the infrared ray emitted from the intake side panel provided with a large number of openings provided in the rack containing the ICT device is measured by the infrared camera focused on the intake side panel Separating, converting the infrared image measured by the infrared camera into temperature distribution data, and separating the temperature distribution data into a high temperature region and a low temperature region; Outputting the high temperature region of the temperature distribution data obtained as the temperature distribution of the ICT device.

  According to another aspect of the present invention, the infrared camera is characterized by having a resolution capable of determining the opening of the intake side panel.

  In another aspect of the present invention, the binarization process is a discriminant analysis process in which a threshold value is determined so as to maximize the interclass variance of the two areas to the sum of the intraclass variance of the two areas. It is characterized by

  By applying the technology of the present invention, it becomes possible to efficiently carry out grasping of the temperature condition of the communication device and computer in the data center and the communication machine room efficiently, and in turn, it is possible to implement the heat countermeasure quickly. As a result, there are effects such as prevention of failure due to heat accumulation and power cost reduction by the operation of an effective air conditioning system.

It is a figure showing an example of composition of a temperature measurement system concerning one embodiment of the present invention. It is a figure which shows the example of a functional block of the computer for measurement result processing of the temperature measurement system which concerns on one Embodiment of this invention. It is a figure which shows the constructional example of the front panel of a general rack. It is a figure which shows the process procedure example of the temperature measurement method which concerns on one Embodiment of this invention. It is a figure which shows the example of a measurement result which made the front panel focus and measured by thermography. It is a figure which shows the binarization processing image of the measurement result by thermography. (A) is a figure which distinguishes and shows temperature distribution of front panel 12 and ICT apparatus 11-1-11-m, respectively, (b) is front panel 12 and ICT apparatus 11-1-11-m, It is a figure collectively showing the temperature distribution of.

  In recent years, racks having a front panel with a high aperture ratio (generally 60% or more, and often 80% or more often) have been increasing to improve the cooling efficiency of the ICT devices in the rack. It is measured by thermography over the front panel with the front panel closed, assuming that the ICT apparatus is housed in a rack having a front panel with a high aperture ratio. Since the measurement result by thermography is a result of mixing the temperature of the device in the rack and the temperature of the front panel for measurement through the front panel, it is required to separate the both.

  The first separation means is to focus on the front panel which is not a direct measurement object at the time of thermography measurement. Usually the focus is on the measurement object, ie the ICT equipment in the rack, but in the present invention the focus is on the front panel of the rack. By focusing on the front panel, it is possible to measure the temperature of the front panel with high accuracy and to separate it from the temperature of the other part (ICT device inside the rack viewed through the panel).

  However, since the temperature of the ICT apparatus inside the rack is not focused on the thermography, the measured value is leveled with the peripheral area other than the front panel. However, this means that 1) the temperature of the ICT device is not mixed with the temperature of the focused front panel, and 2) the object of the present invention is the recognition of the generation of heat pool in the ICT device unit, and the ICT device Since this is not a measurement of the internal temperature distribution, it does not pose a problem that hinders the achievement of the object of the present invention.

  The second dividing means represents the measurement result by thermography as a temperature distribution (histogram), and divides it into a low temperature region and a high temperature region using a binarization method such as discriminant analysis (binarization of Otsu) It is to be. The front panel is exposed to cold air as the cold air inlet of the air conditioner, and it exhibits lower temperature distribution (at least equal temperature distribution) than the ICT device in the rack, so the area of low temperature distribution is the front panel part, high The region of the temperature distribution can be regarded as the temperature of the internal ICT device, and the temperature of the front panel and the ICT device can be separated. Thereby, even if the correspondence between the front panel / ICT device for each pixel is unknown in the measurement result (image) of the thermography, the temperature information of the ICT device inside the rack can be easily by excluding the temperature information of the front panel It becomes possible to extract. As the binarization method, it is possible to use a method other than the discriminant analysis method such as a clustering method such as the k-means method.

  Hereinafter, embodiments of the present invention will be described in detail.

  FIG. 1 shows an exemplary configuration of a temperature measurement system according to an embodiment of the present invention. FIG. 1 is a typical system configuration in the case of performing temperature measurement of an ICT apparatus installed in a communication rack in a data center or the like. The temperature measurement system is a thermography (infrared camera) 110 that measures the temperature of the ICT devices 11-1 to 11-m through the front panel 12 of the communication rack 10 (hereinafter simply referred to as "rack") and a computer for processing measurement results ( PC etc.) 120 is comprised.

  The thermography 110 has a function of adjusting the focus, has a resolution capable of determining the opening of the front panel 12, and measures the temperature of the entire rack 10 or a part thereof. The measurement result is converted into color information corresponding to temperature one to one and recorded as an image. The measurement result is transferred from the thermography 110 to the measurement result processing computer 120. The measurement result may be recorded on the recording medium of the thermography 110 and transferred from the recording medium to the measurement result processing computer 120.

  FIG. 2 shows an example of a functional block of a computer for processing measurement results of the temperature measurement system according to an embodiment of the present invention. The result processing computer 120 reads the measurement result transferred from the thermography 110. The data conversion unit 122 converts the measurement result replaced by the color information into temperature. Temperature distribution of the ICT devices 11-1 to 11-m from the temperature distribution of the region where the temperature is high and the binarization processing unit 123 that divides the region into a low temperature region and a high temperature region using a binarization method such as And an ICT apparatus temperature extraction unit 124 for estimating the Finally, the result processing computer 120 outputs the temperature distribution of the ICT devices 11-1 to 11-m in the rack.

  The ICT devices 11-1 to 11-m to be subjected to temperature measurement are stored in the rack 10. In data centers, etc., racks often use what is commonly referred to as 19-inch racks of the Electronic Industries Alliance (EIA) standard for this rack 10, and a structure capable of mounting about 40 thin servers called rack mount type is adopted. There is. A typical size (outer shape) of the rack 10 is about 600 mm wide, 1900 mm high, and 1000 mm deep. The dimensions of the ICT devices 11-1 to 11-m are as follows: chassis width is 482.6 mm (19 inches) and height is 44.45 mm (1.75 inches = 1 U) multiples and integrated in the rack・ It is stored.

  FIG. 3 shows an example of the structure of the front panel of a general rack. A large number of intake holes 13 are provided in the front panel 12 of the rack 10 for cooling the ICT devices 11-1 to 11-m in the rack 10. Recently, the ICT devices 11-1 in the rack from the outside are provided. There are many cases where the aperture ratio is high (approximately 60% or more, and in some cases recently more than 80% in some cases) so that ~ 1 1-m can be seen. Although the shape (pattern) of the intake holes 13 is various, the one having a high aperture ratio often has a honeycomb structure. As shown in FIG. 3, when the distance between opposite sides of the intake hole 13 is 6 mm and the width of each side is 1 mm, the aperture ratio is about 73%.

  FIG. 4 shows an example of the processing procedure of the temperature measurement method according to the embodiment of the present invention. The thermography 110 focuses on the front panel 12 of the rack 10 (S401) and measures the temperatures of the front panel 12 and the ICT devices 11-1 to 11-m from the front of the rack 10 with the front panel 12 closed. (S402). The measurement results measured by the thermography 110 are transferred to the measurement result processing computer 120 by converting the temperatures into one-to-one corresponding colors to form an image.

  FIG. 5 shows an example of measurement results obtained by focusing on the front panel by thermography. The image shown in FIG. 5 is an example of the measurement result, but since the front panel 12 is focused, the measurement result with clear structure and contour of the front panel 12 is obtained.

  The measurement result processing computer 120 extracts the temperature (distribution) of the ICT devices 11-1 to 11-m by excluding the temperature distribution of the front panel 12 from the measurement result transferred from the thermography. Specifically, the measurement result which is recorded by replacing the color for each pixel is converted into a temperature (S403), and the temperature is divided into a low area and a high area (S404). There are various methods for dividing two regions, for example, a discriminant analysis method (Otsu's 2) that determines the threshold value so as to maximize the interclass dispersion of the two regions to the sum of the intraclass variance of the two regions. Quantification) is small in calculation cost and easy to implement.

  FIG. 6 shows a binarized processing image of the measurement result by thermography. The temperature distribution of the front panel 12 directly exposed to the cold air of the air conditioner in the data center and the communication machine room is lower than the temperature distribution of the ICT devices 11-1 to 11-m, so the area where the temperature is low is the front panel 12, the temperature Is determined as the temperature of the ICT devices 11-1 to 11-m stored in the rack 10 (S405).

  When the ICT devices 11-1 to 11-m are not in operation or the heat in the rack 10 is strongly transmitted to the front panel 12, the front panel 12 and the ICT devices 11-1 to 11-m There may be overlap in temperature distribution. FIGS. 7A and 7B show binarization processing images in the case where there is an overlap in the temperature distribution of the front panel 12 and the ICT devices 11-1 to 11-m. Fig. 7 (a) shows the temperature distribution of the front panel 12 and the ICT devices 11-1 to 11-m separately, and Fig. 7 (b) shows the front panel 12 and the ICT device 11-1. It is what put together and showed temperature distribution with-1 1-m.

  In such a case, accurate separation of the temperature distribution between the front panel 12 and the ICT devices 11-1 to 11-m by binarization is difficult, and binarization is applied as shown in FIG. 7 (b). Assuming that the high temperature side is the temperature of the ICT devices 11-1 to 11-m housed in the rack 10 as shown in FIG. 7, the temperature distribution on the low temperature side is lower than the actual temperature distribution shown in FIG. It is the evaluation result of the temperature distribution which is missing and biased to the high temperature side. However, considering that the purpose of the present invention is to understand the heat pool of the ICT devices 11-1 to 11-m, the temperature distribution of the front panel 12 and the ICT devices 11-1 to 11-m overlap. Even in some cases, the temperature is not measured lower than the actual temperature as in the prior art, and a high temperature region which is a risk of heat accumulation can be accurately grasped, thus causing no practical problem.

Reference Signs List 10 rack 11-1 to 11-m ICT apparatus 12 front panel 13 air intake hole 110 thermography 120 computer for processing measurement results

Claims (6)

An infrared measurement unit that measures infrared radiation emitted from an intake side panel provided with a large number of openings provided in a rack that accommodates an ICT device, focusing on the intake side panel;
A binarization processing unit that converts the infrared image measured by the infrared measurement unit into temperature distribution data, and performs binarization processing to separate the temperature distribution data into a high temperature region and a low temperature region;
An ICT device temperature extraction unit that outputs the high temperature region of the temperature distribution data separated by the binarization processing as the temperature distribution of the ICT device;
The temperature measurement system characterized by having.   The temperature measurement system according to claim 1, wherein the infrared measurement unit has a resolution capable of determining an opening of the intake side panel.   The binarization process is a process according to a discriminant analysis method in which a threshold value is determined so as to maximize the interclass variance of the two areas with respect to the sum of the intraclass variance of the two areas. The temperature measurement system according to 2. Measuring infrared radiation emitted from an intake side panel provided with a large number of openings provided in a rack accommodating an ICT device, with an infrared camera focused on the intake side panel;
Performing a binarization process of converting the infrared image measured by the infrared camera into temperature distribution data and separating the temperature distribution data into a high temperature region and a low temperature region;
Outputting the high temperature region of the temperature distribution data separated by the binarization process as the temperature distribution of the ICT device;
A temperature measurement method characterized by having:   The temperature measuring method according to claim 4, wherein the infrared camera has a resolution capable of determining an opening of the intake side panel.   5. The process according to claim 4, wherein the binarization process is a process by discriminant analysis in which a threshold is determined so as to maximize the interclass variance of the two areas with respect to the sum of the intraclass variance of the two areas. The temperature measurement method as described in 5.