JP2018538544A - ピンホール又はホールの検出装置及び方法 - Google Patents
ピンホール又はホールの検出装置及び方法 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/894—Pinholes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21B—ROLLING OF METAL
- B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8812—Diffuse illumination, e.g. "sky"
- G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8841—Illumination and detection on two sides of object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
- G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
- G01N2021/8911—Setting scan-width signals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
- G01N2021/8918—Metal
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (20)
- 素材に存在するホール又はピンホールを検出する検出装置において、
素材の一側から光を照射する照明部と、
前記素材の他側において、前記素材に対する映像を取得して検出信号を出力する受光部と、
前記検出信号を用いて前記素材にホール又はピンホールが存在するか否かを判断する検出部と、
前記照明部を複数の領域に区分し、各領域別に互いに異なる照度を有する光が照射されるように前記照明部を制御する照明制御部と、を含む検出装置。 - 前記照明部は、複数のLEDを含む、請求項1に記載の検出装置。
- 前記受光部は、複数のカメラを含む、請求項1に記載の検出装置。
- 前記検出装置は、前記照明部と前記素材との間に配置される集光レンズをさらに含む、請求項1に記載の検出装置。
- 前記照明制御部は、前記受光部のカメラの位置と前記素材のエッジの位置に基づいて前記照明部の調整領域を設定する、請求項1に記載の検出装置。
- 前記照明制御部は、前記照明部において前記調整領域に含まれない領域を中央領域に設定し、前記調整領域のうち、前記素材のエッジの外側部分に対応する領域を外郭領域に設定し、前記外郭領域と前記中央領域の間をエッジ領域に設定する、請求項1に記載の検出装置。
- 前記照明制御部は、前記照明部の前記中央領域が第1照度を有する光を照射し、前記照明部の前記外郭領域が前記第1照度よりも低い第2照度を有する光を照射し、前記照明部の前記エッジ領域が前記第1照度と前記第2照度の間の照度を有する光を照射するように前記照明部を制御する、請求項6に記載の検出装置。
- 前記第1照度は、前記素材に存在するホール又はピンホールを検出することができる照度であり、前記第2照度は、前記受光部のカメラに基準光量が入射されるようにする照度である、請求項7に記載の検出装置。
- 前記基準光量は、前記受光部に含まれるカメラが最大の明るさ値を出力するための最小光量である、請求項8に記載の検出装置。
- 前記エッジ領域は、外郭から中央へ行くほど前記第2照度から前記第1照度に線形的に増加する照度の光を照射する、請求項7に記載の検出装置。
- 前記照明制御部は、前記素材における先行材と後行材が溶接された溶接部が前記検出装置を通過する場合に前記照明部の領域を設定する、請求項1に記載の検出装置。
- 前記照明制御部は、前記素材が蛇行する場合に前記照明部の領域を設定する、請求項1に記載の検出装置。
- 素材の下部に配置された照明部と前記素材の上部に配置された受光部を用いて前記素材に存在するホール又はピンホールを検出する検出方法において、
前記照明部を複数の領域に区分する段階と、
前記複数の領域別に異なる照度の光が照射されるように照明部を制御する段階と、を含む検出方法。 - 前記区分する段階は、前記受光部に含まれるカメラの位置と前記素材のエッジの位置に基づいて調整領域を設定する段階と、
前記調整領域に含まれない領域を中央領域に設定し、前記調整領域のうち、前記素材のエッジの外側部分に対応する領域を外郭領域に設定し、前記外郭領域と前記中央領域の間をエッジ領域に設定する段階と、を含む、請求項13に記載の検出方法。 - 前記照明部を制御する段階は、前記中央領域が第1照度を有する光を照射し、前記外郭領域が前記第1照度よりも低い第2照度を有する光を照射し、前記エッジ領域が前記第1照度と前記第2照度の間の照度を有する光を照射するように前記照明部を制御する、請求項14に記載の検出方法。
- 前記第1照度は、前記素材に存在するホール又はピンホールを検出することができる照度であり、前記第2照度は、前記受光部のカメラに基準光量が入射されるようにする照度である、請求項15に記載の検出方法。
- 前記基準光量は、前記受光部に含まれるカメラが最大の明るさ値を出力するための最小光量である、請求項16に記載の検出方法。
- 前記照明部を制御する段階は、前記エッジ領域が外郭から中央へ行くほど前記第2照度から前記第1照度に線形的に増加する照度の光を照射するように照明部を制御する、請求項15に記載の検出方法。
- 前記区分する段階は、前記素材における先行材と後行材が溶接された溶接部が前記照明部及び前記受光部を通過する場合に行われる、請求項13に記載の検出方法。
- 前記区分する段階は、前記素材が蛇行する場合に行われる、請求項13に記載の検出方法。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150185910A KR101767784B1 (ko) | 2015-12-24 | 2015-12-24 | 핀홀 또는 홀 검출 장치 및 방법 |
| KR10-2015-0185910 | 2015-12-24 | ||
| PCT/KR2016/014901 WO2017111414A1 (ko) | 2015-12-24 | 2016-12-19 | 핀홀 또는 홀 검출 장치 및 방법 |
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| Publication Number | Publication Date |
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| JP2018538544A true JP2018538544A (ja) | 2018-12-27 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018532688A Pending JP2018538544A (ja) | 2015-12-24 | 2016-12-19 | ピンホール又はホールの検出装置及び方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20190003986A1 (ja) |
| EP (1) | EP3396361A4 (ja) |
| JP (1) | JP2018538544A (ja) |
| KR (1) | KR101767784B1 (ja) |
| CN (1) | CN108474749A (ja) |
| WO (1) | WO2017111414A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2025026673A (ja) * | 2021-05-10 | 2025-02-21 | 東洋鋼鈑株式会社 | ピンホール検出装置 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102149280B1 (ko) * | 2018-11-28 | 2020-08-28 | 한화정밀기계 주식회사 | 기준 좌표 동기화 장치 |
| KR20200144851A (ko) | 2019-06-19 | 2020-12-30 | 현대트랜시스 주식회사 | 차량용 시트 펌핑 디바이스 |
| CN116801995B (zh) * | 2021-01-28 | 2025-09-30 | 杰富意钢铁株式会社 | 钢板的蛇行量测定装置、钢板的蛇行量测定方法、热轧钢带的热轧设备及热轧钢带的热轧方法 |
| CN113751921A (zh) * | 2021-09-28 | 2021-12-07 | 长春一汽宝友钢材加工配送有限公司 | 激光拼焊板气孔缺陷自动检测系统 |
| US11774368B2 (en) | 2022-01-03 | 2023-10-03 | Rick Ross | Light table apparatus and methods for inspecting heat exchanger plates for defects using light |
| KR102746425B1 (ko) * | 2022-02-03 | 2024-12-26 | 주식회사 러닝비전 | 결함 검사 장치 |
| CN114717832B (zh) * | 2022-04-18 | 2023-06-02 | 江苏天鸟高新技术股份有限公司 | 一种纺织用断针的快速检测方法 |
| CN114813759B (zh) * | 2022-06-24 | 2022-09-09 | 四川英创力电子科技股份有限公司 | 一种精密检测印制电路板上孔数的检孔装置及方法 |
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| JP2012173162A (ja) * | 2011-02-22 | 2012-09-10 | Ricoh Co Ltd | ピンホール検査装置 |
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- 2015-12-24 KR KR1020150185910A patent/KR101767784B1/ko active Active
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- 2016-12-19 EP EP16879281.0A patent/EP3396361A4/en not_active Withdrawn
- 2016-12-19 US US16/063,992 patent/US20190003986A1/en not_active Abandoned
- 2016-12-19 JP JP2018532688A patent/JP2018538544A/ja active Pending
- 2016-12-19 WO PCT/KR2016/014901 patent/WO2017111414A1/ko not_active Ceased
- 2016-12-19 CN CN201680076235.6A patent/CN108474749A/zh not_active Withdrawn
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| KR20030053843A (ko) * | 2001-12-24 | 2003-07-02 | 주식회사 포스코 | 에지필터를 이용한 핀홀 검출기 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2025026673A (ja) * | 2021-05-10 | 2025-02-21 | 東洋鋼鈑株式会社 | ピンホール検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20190003986A1 (en) | 2019-01-03 |
| EP3396361A1 (en) | 2018-10-31 |
| KR20170076863A (ko) | 2017-07-05 |
| KR101767784B1 (ko) | 2017-08-14 |
| CN108474749A (zh) | 2018-08-31 |
| EP3396361A4 (en) | 2019-01-30 |
| WO2017111414A1 (ko) | 2017-06-29 |
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