JP2018200211A - Optical measuring system - Google Patents

Abstract

To provide an optical measuring system capable of properly picking up reflected light from an object to be measured.SOLUTION: An optical measuring system 1A comprises: a light source 10 for emitting light toward an object to be measured 2; an imaging part 20 for picking up reflected light Lr from the object to be measured 2; and a control unit 30 for controlling the light source 10. The light source 10 has multiple light-emitting elements 12 including one or more light-emitting elements 12 and being disposed in multiple areas. The multiple light-emitting elements 12 are disposed so that optical axes of irradiation light Lto Lemitted from the multiple light-emitting elements 12 are oriented to the object to be measured 2. The control unit 30 is configured to control the multiple light-emitting elements 12 for each of multiple areas.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an optical measuring device.

  For example, Patent Literature 1 discloses an optical measurement device including a light source that irradiates light to a measurement target and an imaging unit that captures reflected light from the measurement target. In this optical measurement apparatus, it is possible to reduce misjudgments in which a measurement object is determined to be the background by repeatedly performing measurement using a plurality of background materials having different optical characteristics.

Japanese Patent Laid-Open No. 2006-90476

  In the optical measuring device described in Patent Document 1, a point light source is used as a light source. For this reason, for example, depending on the shape of the measurement object, the measurement object cannot be sufficiently irradiated with light, and reflected light from the measurement object may not be appropriately imaged.

  The present invention has been made in view of the above, and an object of the present invention is to provide an optical measurement apparatus that can appropriately image reflected light from a measurement object.

  An optical measurement apparatus according to an aspect of the present invention includes a light source that irradiates light to a measurement target, an imaging unit that captures reflected light from the measurement target, and a control unit that controls the light source. The light source includes a plurality of light emitting elements arranged in a plurality of regions including one or more light emitting elements, and the plurality of light emitting elements has an optical axis of irradiation light emitted from the plurality of light emitting elements facing a measurement object. The control unit controls the plurality of light emitting elements for each of the plurality of regions.

  An optical measurement device according to one embodiment of the present invention includes a light source that irradiates light to a measurement object and an imaging unit that images reflected light from the measurement object, and the light sources are different from each other for each type. It has a plurality of types of light emitting elements that irradiate light in the wavelength band, and the plurality of types of light emitting elements are arranged so that the optical axis faces the measurement object.

  ADVANTAGE OF THE INVENTION According to this invention, the optical measuring device which can image appropriately the reflected light from a measuring object is provided.

It is a schematic block diagram of the optical measuring device which concerns on 1st Embodiment. It is the figure which looked at the light source shown by FIG. 1 from the measurement object side. It is the figure which looked at the light source of the optical measuring device concerning a 2nd embodiment from the measuring object side. It is the figure which looked at the light source of the optical measuring device concerning a 3rd embodiment from the measuring object side.

[Description of Embodiment of Present Invention]
First, embodiments of the present invention will be listed and described.

  An optical measurement apparatus according to an aspect of the present invention includes a light source that irradiates light to a measurement target, an imaging unit that captures reflected light from the measurement target, and a control unit that controls the light source. The light source includes a plurality of light emitting elements arranged in a plurality of regions including one or more light emitting elements, and the plurality of light emitting elements has an optical axis of irradiation light emitted from the plurality of light emitting elements facing a measurement object. The control unit controls the plurality of light emitting elements for each of the plurality of regions. Here, in the present application, “reflected light” includes “diffuse reflected light”.

  In this optical measurement apparatus, since the plurality of light emitting elements are controlled for each of the plurality of regions, for example, the measurement object can be sufficiently irradiated with light according to the shape of the measurement object. Thereby, the reflected light from a measurement object can be imaged appropriately.

  In the optical measurement device according to one embodiment of the present invention, the control unit controls the outputs of the plurality of light emitting elements for each of the plurality of regions, and the control unit includes the optical axis of the irradiation light and the measurement target among the plurality of regions. You may control the output of a several light emitting element so that the output from the light emitting element in the said area | region may become large, so that the area | region where the angle made with the optical axis of the reflected light which goes to an imaging part from a thing becomes large. The reflected light intensity varies depending on the angle formed by the optical axis of the irradiation light and the optical axis of the reflected light, and it tends to decrease as the angle increases. In this case, as the angle increases, the output of the light emitting element increases, so that a decrease in reflected light intensity due to this angle can be suppressed.

  In the optical measurement device according to one aspect of the present invention, the control unit causes the plurality of light emitting elements to blink at a higher speed than the frame rate of the imaging unit, and controls the blinking conditions of the plurality of light emitting elements for each of the plurality of regions. The control unit is configured such that, in a plurality of regions, the region where the angle formed by the optical axis of the irradiation light and the optical axis of the reflected light from the measurement object toward the imaging unit becomes larger per predetermined time of the light emitting element in the region. You may control the blinking conditions of several light emitting elements so that lighting time may become long. As described above, the reflected light intensity varies depending on the angle formed by the optical axis of the irradiation light and the optical axis of the reflected light, and it tends to decrease as the angle increases. In this case, the longer the angle, the longer the lighting time of the light emitting element, so that the reduction in reflected light intensity due to this angle can be suppressed.

  In the optical measurement device according to one embodiment of the present invention, the control unit may turn on the plurality of light emitting elements in order for each of the plurality of regions. In this case, the reflected light can be imaged by irradiating the measurement object with light from a plurality of incident angles without changing the position of the light source, so that the reflected light can be appropriately imaged. The incident angle is an angle formed by the optical axis of the irradiation light and the normal line of the reference plane.

  In the optical measurement device according to one embodiment of the present invention, the plurality of light emitting elements may be arranged on a curved surface. In this case, it is easy to arrange a plurality of light emitting elements so that the optical axis faces the measurement object.

  An optical measurement device according to one embodiment of the present invention includes a light source that irradiates light to a measurement object and an imaging unit that images reflected light from the measurement object, and the light sources are different from each other for each type. It has a plurality of types of light emitting elements that irradiate light in the wavelength band, and the plurality of types of light emitting elements are arranged so that the optical axis faces the measurement object.

  In this optical measurement apparatus, since a plurality of types of light emitting elements irradiate light of different wavelength bands for each type, for example, a wavelength band used for measurement can be selected according to the measurement object. Thereby, the reflected light from a measurement object can be imaged appropriately.

  In the optical measurement device according to one embodiment of the present invention, the plurality of types of light-emitting elements are arranged in different regions for each type, and the optical axis of the irradiation light emitted from the plurality of types of light-emitting elements and the measurement object are used for imaging. In a region where the angle formed by the optical axis of the reflected light toward the part is larger, a light emitting element of a type that emits light in a wavelength band in which the sensitivity of the imaging unit is higher is arranged. As described above, the reflected light intensity varies depending on the angle formed by the optical axis of the irradiation light and the optical axis of the reflected light, and it tends to decrease as the angle increases. In this case, since the light emitting element of a type that irradiates light in a wavelength band in which the sensitivity of the imaging unit is high is disposed in a region where the angle is large, it is possible to suppress the influence of a decrease in reflected light intensity due to this angle. .

  In the optical measurement device according to one embodiment of the present invention, a plurality of types of light-emitting elements may be mixed and arranged. In this case, the object to be measured can be irradiated with a mixture of light in a plurality of wavelength bands.

  The optical measurement apparatus according to one embodiment of the present invention may further include a control unit that turns on a plurality of types of light emitting elements in order for each type. In this case, an image corresponding to the spectral image can be easily obtained.

  In the optical measurement device according to one embodiment of the present invention, the plurality of types of light emitting elements may be arranged on a curved surface. In this case, it is easy to arrange a plurality of types of light emitting elements so that the optical axis faces the measurement object.

[Details of the embodiment of the present invention]
Specific examples of the optical measuring device according to the present invention will be described below with reference to the drawings. In addition, this invention is not limited to these illustrations, is shown by the claim, and intends that all the changes within the meaning and range equivalent to the claim are included.

(First embodiment)
FIG. 1 is a schematic configuration diagram of an optical measurement apparatus according to the first embodiment. As shown in FIG. 1, the optical measurement device 1 </ b> A includes a light source 10, an imaging unit 20, and a control unit 30. The optical measurement device 1 </ b> A is a device that performs measurement related to the measurement object 2 by irradiating the measurement object 2 with light and detecting the reflected light with the imaging unit 20. The measuring object 2 is not particularly limited. Examples of the measurement object 2 include foods, medicines, industrial products, and biological tissues. The measurement object 2 is disposed on the stage 3, for example.

  FIG. 2 is a view of the light source shown in FIG. 1 as viewed from the measurement object side. The light source 10 shown in FIGS. 1 and 2 is electrically connected to the control unit 30. The light source 10 irradiates light to the measuring object 2 on the stage 3 based on an instruction signal from the control unit 30. The light source 10 includes a bending member 11 and a plurality of light emitting elements 12.

  The bending member 11 is a member obtained by, for example, bending a rectangular plate along its short side. That is, the bending member 11 has an arc shape along the extending direction of the short side when viewed from the long side direction. The bending member 11 may have an elliptical arc shape along the extending direction of the short side when viewed from the long side direction. The bending member 11 is not bent in the long side direction. Hereinafter, the long side direction of the bending member 11 is defined as the x direction, and the short side direction is defined as the y direction.

The bending member 11 has a curved surface 11 a and is disposed so that the curved surface 11 a faces the measurement object 2. Curved surface 11a (here, n) a plurality arranged along the y-direction and a region _R 1 to R _n of. Regions R _{1 to} R _n are band-like regions extending in the x direction. In the bending member 11, one end 11b in the y direction is arranged on the imaging unit 20 side, and the other end 11c is arranged on the stage 3 side. One end 11 b and the other end 11 c are parallel to the stage 3.

The light emitting element 12 is, for example, a point light source with high luminance and low coherence. The light emitting element 12 is, for example, an LED (light emitting diode), an LD (laser diode), or an SLD (super luminescent diode). Each of the plurality of light emitting elements 12 is disposed in any of a plurality of regions R _{1 to} R _n including one or more light emitting elements 12. In each region R _{1 to} R _n , a plurality of light emitting elements 12 are arranged in a line in the x direction. Here, the plurality of light emitting elements 12 are arranged in a matrix. The light emitting element 12 is disposed so that the optical axis of the irradiation light L emitted from the light emitting element 12 faces the measurement object 2 (specifically, the region on the stage 3 where the measurement object 2 is to be disposed). ing.

The optical axis of the irradiation light L _{1 to} L _n irradiated from the light emitting element 12 in the plurality of regions R _{1 to} R _n and the optical axis of the reflected light Lr from the measurement object 2 toward the imaging unit 20 are at an angle θ _1. and it forms a ~θ _n. Angle theta ₁ through? _N is greater from the angle theta ₁ in this order, a maximum at an angle theta _n.

The imaging unit 20 images the reflected light Lr from the measurement object 2. The imaging unit 20 is electrically connected to the control unit 30 and performs imaging based on an instruction signal from the control unit 30. The imaging unit 20 includes a lens 21 and a camera 22. Reflected light Lr obtained by reflecting the irradiation lights L _{1 to} L _n from the light emitting element 12 on the measurement object 2 is incident on the lens 21. The camera 22 receives the reflected light Lr incident on the lens 21. As a result, the imaging unit 20 images the measurement object 2.

  The camera 22 has, for example, a light receiving surface in which light receiving elements that convert light into current and output the light are arranged in a line or two-dimensionally. The camera 22 digitally converts charges generated on the light receiving surface by an A / D converter, and generates digital information indicating a light intensity distribution for each wavelength region. The generated digital information may be sent to an analysis unit (not shown) and output after performing desired arithmetic processing or the like.

  The imaging unit 20 is an image sensor that acquires an image, but may be a hyperspectral sensor. A hyperspectral image is an image in which one pixel is composed of N pieces of wavelength data, and includes spectral information including reflection intensity data corresponding to a plurality of wavelengths for each pixel. That is, a hyperspectral image has a three-dimensional configuration that combines two-dimensional elements as an image and elements as spectral data because of the feature that each pixel constituting the image has intensity data of multiple wavelengths. It is data. In the present embodiment, a hyperspectral image refers to an image composed of pixels having intensity data in at least three wavelength bands per pixel.

The control unit 30 is electrically connected to the light source 10 and the imaging unit 20 and controls the light source 10 and the imaging unit 20. The control unit 30 controls the outputs of the plurality of light emitting elements 12 for each of the regions R _{1 to} R _n . The control unit 30 controls the outputs of the plurality of light emitting elements 12 by controlling, for example, drive currents of the plurality of light emitting elements 12. The control unit 30 outputs the outputs of the plurality of light emitting elements 12 so that the outputs of the light emitting elements 12 in the regions increase as the angles θ _{1 to} θ _n increase among the regions R _{1 to} R _n. Control. As described above, the angle theta ₁ through? _N is greater from the angle theta ₁ in this order. Accordingly, the control unit 30, outputs of the plurality of light-emitting element 12 so as to increase toward the region R ₁ to the region R _n, controls the output of the plurality of light-emitting elements 12.

  The control unit 30 includes a central processing unit (CPU), a random access memory (RAM) and a read only memory (ROM) that are main storage devices, a communication module that performs communication between the light source 10 and the imaging unit 20, a hard disk, and the like. The computer is provided with hardware such as an auxiliary storage device. And the function as the control part 30 is exhibited when these components operate | move.

As described above, in the optical measurement apparatus 1A, since the plurality of light emitting elements 12 are controlled for each of the regions R _{1 to} R _n , sufficient light is applied to the measurement target 2 according to the shape of the measurement target 2, for example. Can be irradiated. Thereby, the reflected light Lr from the measuring object 2 can be appropriately imaged.

The reflected light from the measurement object 2 includes specular reflection light in which the irradiation light from the light source 10 is specularly reflected on the surface of the measurement object 2 and the irradiation light from the light source 10 is diffusely reflected on the surface of the measurement object 2. There is diffuse reflected light. According to the specularly reflected light, although the amount of light (intensity) is large, there is little information on the measurement object 2, so it is difficult to accurately detect information on the measurement object 2. In addition, if regular reflection light is mixed in the reflected light Lr toward the imaging unit 20, the sensor output of the camera 22 may be saturated. Therefore, the reflected light Lr toward the imaging unit 20 needs to be diffusely reflected light, and it is necessary to suppress the regular reflected light from being mixed into the reflected light Lr. In particular, among the plurality of regions R _{1 to} R _n , angles θ _{1 to} θ _n formed by the optical axis of the irradiation light L _{1 to} L _{n and} the optical axis of the reflected light Lr from the measurement object 2 toward the imaging unit 20. The smaller the region, the easier it is for the light emitting element 12 in the region to mix the specularly reflected light into the reflected light Lr. On the other hand, among the plurality of regions R _{1 to} R _n , the region _where the angle θ _{1 to} θ _n formed by the optical axis of the irradiation light L _{1 to} L _{n and} the optical axis of the reflected light Lr becomes larger, the light emission in the region. The intensity of the reflected light Lr from the element 12 tends to decrease. For this reason, the measurement result is easily buried in a dark level (dark noise).

Therefore, the control unit 30 forms an angle between the optical axis of the irradiation light L _{1 to} L _{n and} the optical axis of the reflected light Lr from the measurement object 2 toward the imaging unit 20 among the plurality of regions R _{1 to} R _n. The outputs of the plurality of light emitting elements 12 are controlled so that the output of the light emitting elements 12 in the region increases as the regions θ _{1 to} θ _n increase. Thus, among the plurality of regions R ₁ to R _n, in an easy region mixed in the positive reflected light reflected light Lr by the light emitting element 12, the output of the light emitting element 12 is decreased, the specularly reflected light is reflected light Lr It becomes possible to suppress mixing. On the other hand, among the plurality of regions R _{1 to} R _{n, in} the region where the intensity of the reflected light Lr due to the light emitting element 12 tends to decrease, the output of the light emitting element 12 becomes large, so that the intensity of the reflected light Lr is prevented from decreasing. It becomes possible.

In the optical measuring device 1A, a plurality of light emitting elements 12 are arranged on the curved surface 11a. For this reason, it is easy to arrange the plurality of light emitting elements 12 so that the optical axes of the irradiation lights L _{1 to} L _n face the measurement object 2. Further, since the curved surface 11a is not curved in the x direction, the light sources 10 arranged along the x direction with respect to the measurement object 2 can irradiate light in the same direction. Therefore, when the camera 22 is a line camera, it is possible to irradiate the visual field region of the camera 22 with a uniform amount of light.

In the optical measuring apparatus 1A, instead of the control unit 30 controlling the outputs of the plurality of light emitting elements 12 for each of the regions R _{1 to} R _n , the plurality of light emitting elements 12 blink, and the blinking conditions of the plurality of light emitting elements 12 are set. it may be controlled for each area _R 1 to R _n. In this case, specifically, the control unit 30 blinks the plurality of light emitting elements 12 at a higher speed than the frame rate of the imaging unit 20. The control unit 30 further includes a plurality of regions R _{1 to} R _n such that a region in which the angles θ _{1 to} θ _n are larger increases a lighting time per predetermined time of the light emitting element 12 in the region. The blinking condition of the light emitting element 12 is controlled.

That is, the control unit 30, the lighting time per predetermined time of a plurality of light-emitting element 12 so as to increase toward the region R ₁ to the region R _n, controls the flashing condition of the plurality of light emitting elements 12. A plurality of light emitting elements 12, since the blink faster than the frame rate of the imaging unit 20, the control of such a lighting time, effective intensity of the irradiation light L ₁ ~L _n (quantity of light) is controlled. Therefore, the same effect as that obtained when the output of the light emitting element 12 is controlled can be obtained. When the lighting time per single light emitting element 12 is a constant value, the control unit 30 controls the frequency of the flashing, it is possible to control the effective intensity of the irradiation light L ₁ ~L _n. As described above, in the optical measuring apparatus 1A, since an LED, LD, SLD, or the like is used as the light emitting element 12, dimming by such high-speed blinking is possible. For example, in a light source using a halogen lamp, the amount of light can be adjusted by changing the voltage, but it takes time (for example, several minutes or more) until the amount of light is adjusted after changing the voltage.

In the optical measurement apparatus 1A, in place of the control unit 30 controls the output of the plurality of light emitting elements 12 in each region _R 1 to R _n, lighting a plurality of light emitting elements 12 in order for each of the regions _R 1 to R _n (emission ). The control unit 30 turns off the light emitting element 12 (stops light emission) outside the region where the light emitting element 12 is turned on. Thus, with respect to the object 2, the irradiation light _L 1 ~L _n from the light emitting element 12 in a plurality of regions _R 1 to R _n is irradiated sequentially. The control unit 30 switches the area to be lit in synchronization with the frame rate of the imaging unit 20. Therefore, in the imaging unit 20, the reflected light Lr by the irradiation light _L 1 ~L _n are imaged sequentially.

According to this configuration, it is possible to irradiate sequentially irradiated light L ₁ ~L _n in the object 2. That is, it is possible to sequentially irradiate the measurement object 2 from the light source 10 from a plurality of incident angles without changing the position of the light source 10. The incident angle is an angle formed by the optical axis of the irradiation light L _{1 to} L _n and the normal line of the upper surface of the stage 3. The incident angle of the irradiation light _L 1 ~L _n is equal when theta ₁ through? _N of the imaging unit 20 is disposed immediately above the measuring object 2.

  For example, when the measurement object 2 is a three-dimensional object, or when the measurement object 2 is uneven, a reflected light directed toward the imaging unit 20 is used for a light source that irradiates light to the measurement object 2 from a specific incident angle. There is a possibility that specular reflection light is mixed into Lr and the sensor output is saturated, or conversely, the intensity of the reflected light Lr is insufficient, so that proper imaging cannot be performed. In order to change the incident angle, a configuration in which the light source itself is mechanically moved or rotated may be considered, but it is not desirable from the viewpoint of time, cost, and maintenance.

On the other hand, in the optical measurement apparatus 1A, since a plurality of images can be acquired using the irradiation lights L _{1 to} L _n , for example, the acquired plurality of images are analyzed, and an image having an appropriate light intensity is analyzed. Can be selected (pick up) as a measurement result. Therefore, in the optical measurement apparatus 1A, it is possible to perform appropriate imaging regardless of the shape of the measurement object 2. Such image analysis processing may be performed by, for example, an analysis unit (not shown), or may be performed by the control unit 30 or an external device. Further, an image having an appropriate light intensity may be selected in units of pixels and reconstructed as a measurement image.

(Second Embodiment)
Next, an optical measurement apparatus 1B according to the second embodiment will be described with reference to FIGS. FIG. 3 is a diagram of the light source of the optical measurement device according to the second embodiment as viewed from the measurement object side. The optical measuring device 1B is different from the optical measuring device 1A mainly in terms of the light source 10. Hereinafter, the optical measurement apparatus 1B will be described focusing on differences from the optical measurement apparatus 1A.

The light source 10 of the optical measuring device 1B has a plurality of types of light emitting elements 12 _{1 to} 12 _n that irradiate light of different wavelength bands λ _{1 to} λ _n for each type. The light emitting elements 12 _{1 to} 12 _n are arranged in different regions R _{1 to} R _n for each type, and irradiate the irradiation lights L _{1 to} L _n in the wavelength bands λ _{1 to} λ _n . The light emitting elements 12 _{1 to} 12 _n are curved so that the optical axes of the irradiation lights L _{1 to} L _n face the measurement object 2 (specifically, the region on the stage 3 where the measurement object 2 is to be disposed). It is arranged on the surface 11a. Sensitivity of the imaging unit 20 is higher in the order of the wavelength band lambda ₁ to [lambda] _n, the lowest in the wavelength band lambda _1, the highest in the wavelength band lambda _n. That is, in the optical measurement apparatus 1B, the optical axis of the irradiation light L _{1 to} L _n irradiated from the plurality of types of light emitting elements 12 _{1 to} 12 _n and the optical axis of the reflected light Lr from the measurement object 2 toward the imaging unit 20 It can be said that the region where the angles θ _{1 to} θ _n formed by are large, the light emitting elements of a type that emits light in a wavelength band in which the sensitivity of the imaging unit 20 is high are arranged.

As described above, the intensity of the reflected light Lr tends to decrease as the angles θ _{1 to} θ _n increase. On the other hand, in the optical measurement apparatus 1B, since the light emitting element of a type that emits light in a wavelength band in which the sensitivity of the imaging unit 20 is high is arranged in a region where the angles θ _{1 to} θ _n are large, the angle θ ₁ it is possible to suppress the influence of decrease in reflected light intensity due to through? _n.

In the optical measuring device 1B, a plurality of types of light emitting elements 12 _{1 to} 12 _n are arranged on the curved surface 11a. For this reason, it is easy to arrange a plurality of types of light emitting elements 12 _{1 to} 12 _n so that the optical axes of the irradiation lights L _{1 to} L _n face the measurement object 2.

(Third embodiment)
Then, with reference to FIG.1 and FIG.4, 1 C of optical measuring apparatuses which concern on 3rd Embodiment are demonstrated. FIG. 4 is a diagram of the light source of the optical measurement device according to the third embodiment as viewed from the measurement object side. The optical measuring device 1C is different from the optical measuring device 1A mainly in terms of the light source 10. Hereinafter, the optical measurement apparatus 1C will be described focusing on differences from the optical measurement apparatus 1A.

The light source 10 of the optical measurement apparatus 1C includes a plurality of types of light emitting elements 12 _{1 to} 12 _n that irradiate light having different wavelength bands λ _{1 to} λ _n for each type. The light emitting elements 12 _{1 to} 12 _n are mixed and arranged in a matrix. Here, for example, three types of light emitting elements 12 _{1 to} 12 ₃ are repeatedly arranged in this order in the x direction, and are also repeatedly arranged in this order in the y direction. The light emitting elements 12 _{1 to} 12 _n irradiate the irradiation lights L _{1 to} L _n in the wavelength band λ _{1 to} λ _n . The light emitting elements 12 _{1 to} 12 _n are curved so that the optical axes of the irradiation lights L _{1 to} L _n face the measurement object 2 (specifically, the region on the stage 3 where the measurement object 2 is to be disposed). It is arranged on the surface 11a. Note that the light emitting elements 12 _{1 to} 12 _n may be arranged completely at random.

As described above, the optical measurement apparatus 1C includes a plurality of types of light emitting elements 12 _{1 to} 12 _n that irradiate light of different wavelength bands λ _{1 to} λ _n for each type, and the light emitting elements 12 _{1 to} 12 _n are mixed together. Are arranged. For this reason, it is possible to irradiate the measurement object 2 by mixing the irradiation lights L _{1 to} L _n of the light emitting elements 12 _{1 to} 12 _n . That is, according to the optical measuring device 1C, for example, compared to the case of using one type of light emitting element that irradiates light in the same wavelength band, it is possible to irradiate the measurement object 2 with broadband light. Thereby, the light source 10 can also be made into an effective white light source. Incidentally, the light-emitting elements ₁₂ 1 to 12 _n of the wavelength band width (output wavelength range), for example, about 100 nm.

In the optical measuring device 1C, a plurality of types of light emitting elements 12 _{1 to} 12 _n are arranged on the curved surface 11a. For this reason, it is easy to arrange a plurality of types of light emitting elements 12 _{1 to} 12 _n so that the optical axes of the irradiation lights L _{1 to} L _n face the measurement object 2.

  The present invention is not limited to the above-described embodiment, and various modifications can be made.

For example, in the optical measurement apparatus 1A, a plurality of light emitting elements 12 may be arranged on one or a plurality of planes instead of the curved surface 11a. In the optical measuring devices 1B and 1C, a plurality of types of light emitting elements 12 _{1 to} 12 _n may be arranged on one or a plurality of planes instead of the curved surface 11a. Thus, even in the case of a plane, the plurality of light emitting elements 12 and the plurality of types of light emitting elements 12 _{1 to} 12 _n are arranged so that the optical axes of the irradiation lights L _{1 to} L _n face the measurement object 2.

In the optical measurement apparatus 1A, a plurality of light emitting elements 12 may be arranged in two or more rows in the x direction in each of the regions R _{1 to} R _n . Further, it is only necessary that one or more light emitting elements 12 are arranged in each of the regions R _{1 to} R _n . When one light emitting element 12 is disposed in each of the regions R _{1 to} R _n , the control unit 30 individually controls the plurality of light emitting elements 12.

In the optical measuring device 1B, a plurality of types of light emitting elements 12 _{1 to} 12 _n may be arranged in the x direction in two or more rows in each of the regions R _{1 to} R _n . In addition, it is sufficient that one or more light emitting elements 12 _{1 to} 12 _n are arranged in each of the regions R _{1 to} R _n . When one light emitting element 12 _{1 to} 12 _n is disposed in each of the regions R _{1 to} R _n , the control unit 30 individually controls the light emitting elements 12 _{1 to} 12 _n .

In the optical measuring devices 1B and 1C, the control unit 30 may be configured to turn on or turn off a plurality of types of light emitting elements 12 _{1 to} 12 _n all at once, but is not limited thereto, and for example, a plurality of types of light emitting elements 12 _1. it may be configured to be turned on sequentially to 12 _n for each type. In this case, for example, even if the imaging unit 20 does not have a spectral function, an image corresponding to a spectral image (pseudo spectral image) can be easily obtained. In particular, in the optical measurement apparatus 1C, since the plurality of types of light emitting elements 12 _{1 to} 12 _n are arranged in a mixed manner, the wavelength dependency of the irradiation light due to the deviation in the arrangement of the plurality of types of light emitting elements 12 _{1 to} 12 _n . An image corresponding to a spectroscopic image can be obtained while suppressing the above (suppressing the influence of irradiation unevenness). Moreover, in the optical measuring devices 1B and 1C, the light source 10 may include a switch for turning on or off the light emitting elements 12 _{1 to} 12 _n all at once.

1A-1C ... optical measuring device, 2 ... measurement object 10 ... light source, 11a ... curved surface, 12, 12 ₁ to 12 n _... light emitting element, 20 ... imaging unit, 30 ... control _unit, L 1 ~L _n ... irradiating light, Lr ... reflected _{light, R} 1 _~R n _... area, θ ₁ ~θ _n ... angle, λ ₁ ~λ _n ... wavelength band.

Claims (10)

A light source for irradiating the measurement object with light;
An imaging unit for imaging reflected light from the measurement object;
A control unit for controlling the light source,
The light source has a plurality of light emitting elements arranged in a plurality of regions including one or more light emitting elements,
The plurality of light emitting elements are arranged such that an optical axis of irradiation light emitted from the plurality of light emitting elements faces the measurement object,
The control unit controls the plurality of light emitting elements for each of the plurality of regions. The control unit controls the outputs of the plurality of light emitting elements for each of the plurality of regions,
In the plurality of regions, the controller emits light in the region as an angle between an optical axis of the irradiation light and an optical axis of reflected light from the measurement object toward the imaging unit increases. The optical measurement apparatus according to claim 1, wherein the outputs of the plurality of light emitting elements are controlled so that the outputs of the elements are increased. The control unit causes the plurality of light emitting elements to blink at a speed higher than a frame rate of the imaging unit, and controls a blinking condition of the plurality of light emitting elements for each of the plurality of regions.
In the plurality of regions, the controller emits light in the region as an angle between an optical axis of the irradiation light and an optical axis of reflected light from the measurement object toward the imaging unit increases. The optical measurement apparatus according to claim 1, wherein a blinking condition of the plurality of light emitting elements is controlled so that a lighting time per predetermined time of the elements becomes long.   The optical measurement apparatus according to claim 1, wherein the control unit turns on the plurality of light emitting elements in order for each of the plurality of regions.   The optical measurement apparatus according to claim 1, wherein the plurality of light emitting elements are arranged on a curved surface. A light source for irradiating the measurement object with light;
An imaging unit that images reflected light from the measurement object,
The light source has a plurality of types of light emitting elements that irradiate light of different wavelength bands for each type,
The plurality of types of light emitting elements are optical measuring devices arranged such that an optical axis faces the measurement object. The plurality of types of light emitting elements are arranged in different regions for each type,
A wavelength band in which the sensitivity of the imaging unit is higher in a region where the angle between the optical axis of irradiation light emitted from the plurality of types of light emitting elements and the optical axis of reflected light from the measurement object toward the imaging unit is larger. The optical measuring device according to claim 6, wherein a light emitting element of a kind that irradiates the light is arranged.   The optical measurement apparatus according to claim 6, wherein the plurality of types of light emitting elements are arranged in a mixed manner.   The optical measurement apparatus according to claim 8, further comprising a control unit that sequentially turns on the plurality of types of light emitting elements for each type.   The optical measurement apparatus according to claim 6, wherein the plurality of types of light emitting elements are arranged on a curved surface.

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