JP2018132468A - Shape measuring system and shape measuring method - Google Patents
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Abstract
【課題】対象物の表面を撮像した撮像画像から部分領域を切り出し、その部分領域の画像に基づいて対象物の形状測定を行う場合に、正確な形状測定を行えるようにする。【解決手段】形状測定システムは、搬送される被測定材１の表面に帯状光を照射する照明装置２と、帯状光が撮像視野に含まれるように被測定材１の表面を撮像し、撮像画像から部分領域（ＲＯＩ）を切り出す撮像装置３と、撮像装置３から取得したＲＯＩ画像に基づいて光切断法により被測定材１の形状測定を行う形状測定装置４とを備える。撮像装置３は、ＲＯＩとする切り出し領域に関する情報を画素値で表わし、ＲＯＩ画像の所定の画素に埋め込む。【選択図】図１PROBLEM TO BE SOLVED: To enable accurate shape measurement when a partial region is cut out from an image captured by capturing an image of the surface of an object and the shape of the target is measured based on the image of the partial region. A shape measuring system takes an image of a lighting device 2 that irradiates a surface of a material to be measured 1 to be conveyed with a band of light, and an image of the surface of the material 1 to be measured so that the band of light is included in an imaging field. It includes an imaging device 3 that cuts out a partial region (ROI) from an image, and a shape measuring device 4 that measures the shape of the material 1 to be measured by an optical cutting method based on the ROI image acquired from the imaging device 3. The image pickup apparatus 3 expresses information regarding a cutout region as an ROI by pixel values, and embeds the information in a predetermined pixel of the ROI image. [Selection diagram] Fig. 1
Description
本発明は、被測定材の表面を撮像した撮像画像に基づいて被測定材の形状測定を行うのに好適な形状測定システム及び形状測定方法に関する。 The present invention relates to a shape measurement system and a shape measurement method suitable for measuring the shape of a material to be measured based on a captured image obtained by imaging the surface of the material to be measured.
被測定材の形状測定の方式として、非接触式の光学的検査が用いられている。その一つとして、被測定材の表面に帯状光を照射し、その帯状光を含む領域を撮像装置で撮像することで、対象物の形状測定を行う光切断法の技術が知られている。
例えば製鉄所において、スラブや厚板といった鋼材を製造するときに、製品品質を損なうおそれのある形状不良は製造段階で早期に発見する必要があることから、製造ラインで鋼材を搬送しながら、光切断法により鋼材の形状測定を行うことが実施されている。
As a method for measuring the shape of the material to be measured, non-contact optical inspection is used. As one of the techniques, there is known a technique of a light cutting method in which the shape of an object is measured by irradiating the surface of a material to be measured with band-shaped light and imaging an area including the band-shaped light with an imaging device.
For example, when manufacturing steel materials such as slabs and planks at steelworks, it is necessary to detect shape defects that may impair product quality early in the manufacturing stage. It is practiced to measure the shape of the steel material by a cutting method.
ここで、被測定材によっては（例えば搬送中の鋼材）ばたつきや振動が生じ、被測定材の表面に照射された帯状光がずれ動くことがあるので、帯状光の視野外れを防ぐ対策が必要となる。
被写体を追尾する技術として、例えば特許文献１にあるように、被写体を含む撮影範囲をズームアウトするように制御する技術が知られている。しかしながら、ズームアウトする場合、空間分解能が変化するため、形状測定に適用するのには適していない。また、例えば特許文献２にあるように、撮影対象に応じて、カメラ自体を動かす技術が知られている。しかしながら、ハードによる追従となるため追従速度が遅く、また、装置の大型化やコストアップという問題がある。
Here, depending on the material to be measured (for example, steel material being transported), fluttering and vibration may occur, and the strip light irradiated on the surface of the material to be measured may shift, so measures to prevent the strip light from being out of view are necessary. It becomes.
As a technique for tracking a subject, for example, as disclosed in Patent Document 1, a technique for controlling a shooting range including a subject to zoom out is known. However, when zooming out, since the spatial resolution changes, it is not suitable for application to shape measurement. For example, as disclosed in Patent Document 2, a technique for moving the camera itself in accordance with an object to be photographed is known. However, since the tracking is performed by hardware, the tracking speed is slow, and there is a problem that the apparatus is increased in size and cost.
そこで、想定される範囲内でばたつきや振動が生じたときにも、被測定材の表面に照射された帯状光が写り込むように撮像視野を広めに設定しておき、撮像画像から、測定対象として必要な部分（部分領域）の画像だけを観察用画像として切り出す方式がある。この方式であれば、帯状光がずれ動いたときには、観察用画像とする切り出し領域の位置を変更することにより、帯状光の視野外れを防ぐことができる。しかも、空間分解能が変化することなく、また、カメラ自体を動かすのではないので装置の大型化やコストアップを防ぐことができる。更に、撮像画像全体を用いて処理する場合に比べ、画像データ量を減らすことができるため、フレームレートを上げることができ、より高速な搬送が行われる製造ラインにおいても、形状測定が可能となる。
しかしながら、切り出し領域の位置を可変とする場合、以下に述べるような課題がある。例えば撮像画像から部分領域を切り出す撮像装置と、撮像装置から取得した部分領域の画像に基づいて被測定材の形状測定を行う形状測定装置とが通信を行う構成とした場合に、撮像装置において切り出し領域を変更したタイミングを形状測定装置側で正確に把握することが難しい。そのため、撮像装置における切り出し領域と、形状測定装置において認識している切り出し領域とにずれが生じるおそれがあり、その結果、正確な形状測定が行えなくなる。
Therefore, even when fluttering or vibration occurs within the expected range, the imaging field of view is set wide so that the band-shaped light irradiated on the surface of the material to be measured is reflected. There is a method of cutting out only an image of a necessary part (partial area) as an observation image. With this method, when the strip light moves and shifts, the position of the cut-out area as the observation image is changed, thereby preventing the strip light from being out of the field of view. In addition, since the spatial resolution does not change and the camera itself is not moved, the size and cost of the apparatus can be prevented from increasing. Furthermore, since the amount of image data can be reduced compared to processing using the entire captured image, the frame rate can be increased, and the shape can be measured even in a production line where higher-speed conveyance is performed. .
However, when the position of the cutout region is variable, there are problems as described below. For example, when an imaging device that cuts out a partial region from a captured image and a shape measuring device that measures the shape of the material to be measured based on the image of the partial region acquired from the imaging device are configured to cut out in the imaging device It is difficult for the shape measuring device to accurately grasp the timing of changing the area. For this reason, there is a risk that a cutout area in the imaging apparatus and a cutout area recognized by the shape measuring apparatus may be shifted, and as a result, accurate shape measurement cannot be performed.
特許文献３には、観察視野範囲内の部分画像観察領域を予め複数設定登録し、複数の部分画像観察領域のうちいずれか１つを選択して、この選択された部分画像観察領域で観察する構成が開示されている。
しかしながら、予め設定登録できる部分画像観察領域の数は限られており、必ずしも任意の領域に対応することはできない。また、操業条件に変更が生じたときには、都度、部分画像観察領域の再設定登録が必要となる。また、部分画像観察領域を変更したタイミングを形状測定装置側で正確に把握できないという問題は依然存在する。
In Patent Document 3, a plurality of partial image observation regions within the observation visual field range are set and registered in advance, and any one of the plurality of partial image observation regions is selected and observed in the selected partial image observation region. A configuration is disclosed.
However, the number of partial image observation areas that can be set and registered in advance is limited, and cannot necessarily correspond to an arbitrary area. In addition, whenever a change occurs in the operation conditions, it is necessary to reset and register the partial image observation area. There is still a problem that the timing of changing the partial image observation area cannot be accurately grasped on the shape measuring apparatus side.
本発明は上記のような点に鑑みてなされたものであり、対象物の表面を撮像した撮像画像から部分領域を切り出し、その部分領域の画像に基づいて対象物の形状測定を行う場合に、正確な形状測定を行えるようにすることを目的とする。 The present invention has been made in view of the above points, and when a partial area is cut out from a captured image obtained by imaging the surface of the target object and shape measurement of the target object is performed based on the image of the partial area, The purpose is to enable accurate shape measurement.
上記の課題を解決するための本発明の要旨は、以下のとおりである。
［１］ 搬送される被測定材の形状を測定する形状測定システムにおいて、
前記被測定材に、前記被測定材の搬送方向とは直交する方向に延びる帯状光を照射する照明装置と、
前記帯状光が前記被測定材に反射したことに基づく像を撮像し、撮像した撮像画像から、前記撮像画像の一部である部分領域を切り出す撮像装置と、
前記部分領域の画像内の前記像に基づいて前記被測定材の形状測定を行う形状測定装置と、
前記形状測定装置からの指示を前記撮像装置に伝える通信手段と、
前記部分領域についての切り出し領域に関する情報を、前記部分領域の画像に埋め込む埋め込み手段と、
を備え、
前記形状測定装置は、前記像が前記部分領域の画像から外れそうな場合に、前記撮像装置に対して、前記部分領域の前記撮像画像内の位置を変更させる指示を出し、
前記埋め込み手段は、前記切り出し領域に関する情報を、画素値で表わし、前記部分領域の画像内の一又は複数の画素に埋め込むことを特徴とする形状測定システム。
［２］ 前記切り出し領域に関する情報は、
前記撮像画像中における、前記搬送方向に対応する方向の前記部分領域の始点の座標、及び、前記搬送方向に対応する方向の前記撮像画像の始点の座標から、前記搬送方向に対応する方向の前記部分領域の始点の座標までの距離、のうち少なくともいずれか一つに対応する情報を含むことを特徴とする［１］に記載の形状測定システム。
［３］ 前記切り出し領域に関する情報は、前記搬送方向に対応する方向の前記部分領域の始点の座標から、前記搬送方向に対応する方向の前記部分領域の終点の座標までの距離を更に含むことを特徴とする［２］に記載の形状測定システム。
［４］ 搬送される被測定材の形状を測定する形状測定方法において、
照明装置を用い、前記被測定材に、前記被測定材の搬送方向とは直交する方向に延びる帯状光を照射する照射ステップと、
撮像装置を用い、前記帯状光が前記被測定材に反射したことに基づく像を撮像し、撮像した撮像画像から、前記撮像画像の一部である部分領域を切り出す撮像ステップと、
形状測定装置を用い、前記部分領域の画像内の前記像に基づいて前記被測定材の形状測定を行う形状測定ステップと、
前記形状測定装置からの指示を前記撮像装置に伝える通信ステップと、
埋め込み手段を用いて、前記部分領域についての切り出し領域に関する情報を、前記部分領域の画像に埋め込む埋め込みステップと、
を有し、
前記形状測定ステップでは、前記像が前記部分領域の画像から外れそうな場合に、前記撮像装置に対して、前記部分領域の前記撮像画像内の位置を変更させる指示を出し、
前記埋め込みステップでは、前記切り出し領域に関する情報を、画素値で表わし、前記部分領域の画像内の一又は複数の画素に埋め込むことを特徴とする形状測定方法。
［５］ 前記切り出し領域に関する情報は、
前記撮像画像中における、前記搬送方向に対応する方向の前記部分領域の始点の座標、及び、前記搬送方向に対応する方向の前記撮像画像の始点の座標から、前記搬送方向に対応する方向の前記部分領域の始点の座標までの距離、のうち少なくともいずれか一つに対応する情報を含むことを特徴とする［４］に記載の形状測定方法。
［６］ 前記切り出し領域に関する情報は、前記搬送方向に対応する方向の前記部分領域の始点の座標から、前記搬送方向に対応する方向の前記部分領域の終点の座標までの距離を更に含むことを特徴とする［５］に記載の形状測定方法。
The gist of the present invention for solving the above problems is as follows.
[1] In a shape measuring system for measuring the shape of a material to be measured,
An illuminating device that irradiates the material to be measured with strip-shaped light extending in a direction orthogonal to the conveying direction of the material to be measured;
An imaging device that captures an image based on the reflection of the strip light on the material to be measured, and cuts out a partial region that is a part of the captured image from the captured image;
A shape measuring device for measuring the shape of the material to be measured based on the image in the image of the partial region;
Communication means for transmitting an instruction from the shape measuring device to the imaging device;
Embedding means for embedding information about the cutout area for the partial area in the image of the partial area;
With
The shape measuring device issues an instruction to change the position of the partial region in the captured image when the image is likely to deviate from the image of the partial region.
The shape measurement system characterized in that the embedding means expresses information related to the cutout region as a pixel value and embeds it in one or a plurality of pixels in the image of the partial region.
[2] Information about the cutout area is
In the captured image, from the coordinates of the start point of the partial area in the direction corresponding to the transport direction and the coordinates of the start point of the captured image in the direction corresponding to the transport direction, the direction in the direction corresponding to the transport direction The shape measurement system according to [1], including information corresponding to at least one of the distances to the coordinates of the start point of the partial region.
[3] The information regarding the cutout region further includes a distance from the coordinates of the start point of the partial area in the direction corresponding to the transport direction to the coordinates of the end point of the partial area in the direction corresponding to the transport direction. The shape measuring system according to [2], which is characterized.
[4] In a shape measuring method for measuring the shape of a material to be measured being conveyed,
Irradiation step using a lighting device to irradiate the material to be measured with strip-shaped light extending in a direction orthogonal to the conveyance direction of the material to be measured;
An imaging step of capturing an image based on the fact that the band-like light is reflected by the material to be measured using an imaging device, and cutting out a partial region that is a part of the captured image from the captured image;
Using a shape measuring device, a shape measuring step for measuring the shape of the material to be measured based on the image in the image of the partial region;
A communication step of transmitting an instruction from the shape measuring device to the imaging device;
An embedding step of embedding information about the cutout region for the partial region in the image of the partial region using an embedding unit;
Have
In the shape measurement step, when the image is likely to deviate from the image of the partial area, the imaging device is instructed to change the position of the partial area in the captured image,
In the embedding step, the information relating to the cutout region is represented by a pixel value and embedded in one or a plurality of pixels in the image of the partial region.
[5] Information about the cutout area is
In the captured image, from the coordinates of the start point of the partial area in the direction corresponding to the transport direction and the coordinates of the start point of the captured image in the direction corresponding to the transport direction, the direction in the direction corresponding to the transport direction The shape measuring method according to [4], including information corresponding to at least one of the distances to the coordinates of the start point of the partial region.
[6] The information regarding the cutout region further includes a distance from the coordinates of the start point of the partial area in the direction corresponding to the transport direction to the coordinates of the end point of the partial area in the direction corresponding to the transport direction. The shape measuring method according to [5], which is characterized.
本発明によれば、被測定材の表面を撮像した撮像画像から部分領域を切り出し、その部分領域の画像に基づいて被測定材の形状測定を行う場合に、切り出し領域を正しく認識できるので、正確な形状測定を行うことができる。 According to the present invention, when a partial region is cut out from a captured image obtained by imaging the surface of the material to be measured, and the shape of the material to be measured is measured based on the image of the partial region, the cut-out region can be correctly recognized. Shape measurement can be performed.
以下、添付図面を参照して、本発明の好適な実施形態について説明する。
図１に、実施形態に係る形状測定システムの構成を示す。本実施形態では、製造ラインで帯状体である被測定材（例えば、鉄鋼半製品であるスラブや厚板等の鋼材、アルミ等の非鉄金属材料、プラスチック材、木材、又は、布類等）１を搬送しながら、光切断法により被測定材１の形状測定を行う例を説明する。
形状測定システムは、照明装置２と、撮像装置３と、撮像装置３と相互に通信可能な形状測定装置４と、形状測定装置４の指示を撮像装置３に伝える通信手段５とを備える。
なお、以下では測定対象面が被測定材１の表面（図１における上側の面）である場合を説明するが、測定対象面は表面に限定されない。即ち、測定対象面は被測定材の裏面や任意の側面でもよく、本発明はいずれの場合でも同様に成立する。
Preferred embodiments of the present invention will be described below with reference to the accompanying drawings.
FIG. 1 shows a configuration of a shape measuring system according to the embodiment. In the present embodiment, a material to be measured that is a strip in the production line (for example, a steel material such as a slab or a thick plate that is a semi-finished steel product, a non-ferrous metal material such as aluminum, a plastic material, wood, or cloth) 1 An example will be described in which the shape of the material 1 to be measured is measured by the optical cutting method.
The shape measuring system includes an illumination device 2, an imaging device 3, a shape measuring device 4 that can communicate with the imaging device 3, and a communication unit 5 that transmits an instruction of the shape measuring device 4 to the imaging device 3.
In addition, although the case where a measurement object surface is the surface (upper surface in FIG. 1) of the to-be-measured material 1 is demonstrated below, a measurement object surface is not limited to a surface. That is, the measurement target surface may be the back surface of the material to be measured or an arbitrary side surface, and the present invention is similarly established in any case.
照明装置２は、例えば被測定材１の搬送路の上方に配置され、長手方向に搬送される被測定材１の表面に帯状光（スリット光）を照射する。帯状光は、被測定材１の幅方向（搬送方向とは直交する方向）に延びるように、被測定材１の幅ｈの全域にわたって照射される。
なお、照明装置２は、例えば、レーザ光源、ＬＥＤ光源等、公知の種々の光源を用いることができ、また、照明光源自体からの発光自体が帯状となっている光源であってもよく、帯状でない光源に対しスリット等を設けることで帯状光とする構成であってもよい。
The illuminating device 2 is disposed, for example, above the conveyance path of the material 1 to be measured, and irradiates the surface of the material 1 to be measured conveyed in the longitudinal direction with strip light (slit light). The strip-shaped light is irradiated over the entire width h of the material to be measured 1 so as to extend in the width direction of the material to be measured 1 (direction perpendicular to the transport direction).
Note that the illumination device 2 can use various known light sources such as a laser light source and an LED light source, and may be a light source in which light emission from the illumination light source itself is in a band shape. The light source may be a band-like light by providing a slit or the like.
撮像装置３は、被測定材１の搬送路の上方に配置され、照明装置２の照射方向と異なる角度に設定された視野方向から、長手方向に搬送される被測定材１の表面を連続的に撮像する。撮像装置３は、被測定材１の表面に照射された帯状光が撮像視野（換言すれば撮像装置３で得られる撮像画像）Ｒに含まれるように撮像する。これにより、撮像画像Ｒには、帯状光が被測定物１に反射し、帯状光の輝線（以下、光切断線と呼ぶ）１０１が像として写り込む。 The imaging device 3 is disposed above the conveyance path of the material 1 to be measured, and continuously covers the surface of the material 1 to be measured conveyed in the longitudinal direction from the viewing direction set at an angle different from the irradiation direction of the illumination device 2. Take an image. The imaging device 3 captures an image so that the band-shaped light irradiated on the surface of the material 1 to be measured is included in an imaging field of view (in other words, a captured image obtained by the imaging device 3) R. Thereby, in the picked-up image R, strip | belt-shaped light reflects on the to-be-measured object 1, and the bright line (henceforth a light cutting line) 101 of strip | belt-shaped light is reflected as an image.
本実施形態では、撮像装置３は、撮像画像Ｒから部分領域を切り出して、その部分領域の画像を形状測定装置４に伝送する。以下、撮像画像から切り出した部分領域をＲＯＩ（Region of Interest）と呼ぶ。
本実施形態では、図２に示すように、撮像画像Ｒは、被測定材１の搬送方向ｙがＹ方向となり、被測定材１の幅方向ｘがＸ方向となるような対応関係で変換される。
撮像画像Ｒは、被測定材１の長手方向（搬送方向）ｙに対応する縦方向Ｙの縦サイズＹRと、被測定材１の幅方向に対応する横方向Ｘの横サイズＸRとを有する。
本実施形態では、被測定材１の幅方向（ｘ方向）に長軸を持つ帯状光を用いた光切断法によって被測定材１の形状測定を行うため、撮像画像Ｒの縦方向Ｙには、被測定材１のｙ方向の位置情報と、被測定材１の表面形状に基づく帯状光の変位の情報、即ち、被測定材１の高さ方向（ｚ方向）の情報が含まれることになる。
ここで、搬送中の被測定材１にばたつきや振動が生じると、被測定材１の表面に照射された帯状光が被測定材１の高さ方向（ｚ方向）にずれ動くことがあるので、縦サイズＹRは、想定される範囲内でばたつきや振動が生じたときにも、帯状光が写り込むように設定されている。また、横サイズＸRは、被測定材１のｘ方向に沿った測定対象範囲を収めるように設定されている。なお、例えば鋼材のように、被測定材１が蛇行する場合には、予め想定される蛇行量を考慮して、横サイズＸRを広く設定することも可能である。
撮像装置３では、撮像画像Ｒから、縦サイズＹRよりも小さい所定の縦サイズＹROI及び横サイズＸRの矩形領域をＲＯＩとして切り出して、そのＲＯＩ画像を形状測定装置４に伝送する。その際、撮像画像ＲからＲＯＩを切り出す位置を縦サイズ方向で可変としている。
このように撮像画像ＲからＲＯＩを切り出す方式では、帯状光がずれ動いたときにはＲＯＩとする切り出し領域を変更することにより、帯状光の視野外れを防ぐとともに、撮像画像Ｒの全体ではなくＲＯＩ画像を伝送すればよいので通信量を抑えることができる。そのため、フレームレートを上げることができ、より高速な搬送が行われる製造ラインにおいても、形状測定が可能となる。しかも、空間分解能が変化することなく、また、カメラ自体を動かすのではないので装置の大型化やコストアップを防ぐことができる。
In the present embodiment, the imaging device 3 cuts out a partial region from the captured image R and transmits the image of the partial region to the shape measuring device 4. Hereinafter, the partial area cut out from the captured image is referred to as ROI (Region of Interest).
In the present embodiment, as shown in FIG. 2, the captured image R is converted in a correspondence relationship in which the conveyance direction y of the measurement target material 1 is the Y direction and the width direction x of the measurement target material 1 is the X direction. The
The captured image R includes a vertical size Y R in the vertical direction Y corresponding to the longitudinal direction (conveying direction) y of the material 1 to be measured and a horizontal size X R in the horizontal direction X corresponding to the width direction of the material 1 to be measured. Have.
In this embodiment, since the shape of the material to be measured 1 is measured by the optical cutting method using the strip light having the long axis in the width direction (x direction) of the material to be measured 1, the vertical direction Y of the captured image R is The position information in the y direction of the material to be measured 1 and the displacement information of the strip light based on the surface shape of the material to be measured 1, that is, the information in the height direction (z direction) of the material to be measured 1 are included. Become.
Here, when fluttering or vibration occurs in the workpiece 1 being conveyed, the band-shaped light irradiated on the surface of the workpiece 1 may shift in the height direction (z direction) of the workpiece 1. The vertical size Y R is set so that the band-like light is reflected even when fluttering or vibration occurs within an assumed range. Further, the lateral size X R is set so as to accommodate the measurement target range along the x direction of the material 1 to be measured. Incidentally, for example, as steel, when the measured material 1 meanders, taking into account the meandering amount of previously estimated, it is possible to widely set the horizontal size X R.
In the imaging device 3, a rectangular region having a predetermined vertical size Y ROI and a horizontal size X R smaller than the vertical size Y R is cut out from the captured image R as an ROI, and the ROI image is transmitted to the shape measuring device 4. At this time, the position where the ROI is cut out from the captured image R is variable in the vertical size direction.
As described above, in the method of cutting out the ROI from the captured image R, when the striped light shifts and moves, the ROI image is prevented from being out of the field of view by changing the cutout region to be the ROI, and the ROI image is not the entire captured image R. Since it is sufficient to transmit, the amount of communication can be suppressed. Therefore, the frame rate can be increased, and the shape can be measured even in a production line where higher speed conveyance is performed. In addition, since the spatial resolution does not change and the camera itself is not moved, the size and cost of the apparatus can be prevented from increasing.
形状測定装置４は、撮像装置３から取得したＲＯＩ画像に基づいて光切断法により被測定材１の形状測定を行う。
通信手段５は、公知の電気通信回線や周辺機器によって構成され、形状測定装置４と撮像装置３とを接続するものであり、後述するＲＯＩの変更指示等の電気信号を、形状測定装置４から撮像装置３へと伝達する手段である。なお、形状測定装置４と撮像装置３とで相互に信号のやり取りができるようにしてあってもよい。
The shape measuring device 4 measures the shape of the material 1 to be measured based on the ROI image acquired from the imaging device 3 by the light cutting method.
The communication means 5 is constituted by a known telecommunication line or peripheral device, and connects the shape measuring device 4 and the image pickup device 3. An electric signal such as an ROI change instruction to be described later is sent from the shape measuring device 4. It is means for transmitting to the imaging device 3. The shape measuring device 4 and the imaging device 3 may exchange signals with each other.
次に、図３で、実施形態に係る撮像装置３、形状測定装置４及び通信手段５の機能構成について説明する。
形状測定装置４において、４０１は指示部であり、搬送中の被測定材１のばたつきや振動により帯状光の輝線（光切断線１０１）がずれ動き、ＲＯＩから外れそうであると判断したときに、視野外れを防ぐために、通信手段５を介して、撮像装置３にＲＯＩの変更指示を出力する。ＲＯＩの変更指示には、ＲＯＩとする切り出し領域を、撮像画像Ｒの中のどの位置にするかについての指示を含む。
Next, with reference to FIG. 3, functional configurations of the imaging device 3, the shape measuring device 4, and the communication unit 5 according to the embodiment will be described.
In the shape measuring apparatus 4, 401 is an instruction unit, and when it is determined that the bright line (light cutting line 101) of the band-like light shifts due to fluttering or vibration of the workpiece 1 being conveyed and is likely to come off the ROI. In order to prevent out-of-view, an ROI change instruction is output to the imaging device 3 via the communication unit 5. The ROI change instruction includes an instruction as to which position in the captured image R the cutout area to be used as the ROI is.
４０２は読み取り部であり、撮像装置３から取得したＲＯＩ画像から、後述するようにＲＯＩとする切り出し領域に関する情報（以下、ＲＯＩ情報と呼ぶ）を読み取る。 Reference numeral 402 denotes a reading unit that reads information (hereinafter referred to as ROI information) relating to a cutout region to be ROI from the ROI image acquired from the imaging device 3 as described later.
４０３は画像処理部であり、撮像装置３から取得したＲＯＩ画像と、読み取り部４０２で読み取ったＲＯＩ情報とに基づいて、光切断法の画像処理により被測定材１の形状測定を行う。なお、光切断法の画像処理は公知の技術を適用すればよく、ここではその詳細な説明は省略する。 Reference numeral 403 denotes an image processing unit, which measures the shape of the material 1 to be measured by image processing using a light cutting method based on the ROI image acquired from the imaging device 3 and the ROI information read by the reading unit 402. Note that a known technique may be applied to the image processing of the light cutting method, and detailed description thereof is omitted here.
このようにした形状測定装置４は、例えばＣＰＵ、ＲＯＭ、ＲＡＭ等を備えたコンピュータ装置により構成され、ＣＰＵが所定のプログラムを実行することにより各部４０１〜４０３が実現される。 The shape measuring device 4 configured as described above is configured by a computer device including, for example, a CPU, a ROM, a RAM, and the like, and each unit 401 to 403 is realized by the CPU executing a predetermined program.
撮像装置３において、３０１は切り出し部であり、形状測定装置４からのＲＯＩの変更指示に従って、撮像画像ＲからＲＯＩを切り出す。 In the imaging device 3, reference numeral 301 denotes a cutout unit that cuts out the ROI from the captured image R in accordance with the ROI change instruction from the shape measuring device 4.
３０２は埋め込み部であり、ＲＯＩ情報をＲＯＩ画像に埋め込む。具体的には、ＲＯＩ情報が画素値で表わされて、本来の撮像画像Ｒの画素値の代わりとして、ＲＯＩ画像の所定の画素に新たな画素値として埋め込まれる。
ＲＯＩ情報としては、図２に示すように、ＲＯＩの始点となるｙ座標ｙROI、又は撮像画像Ｒの始点となるＹ座標Ｙ0からＹ座標Ｙ1までの距離ｌが必要となる。本実施形態では、ＲＯＩの縦サイズＹROIを一定としており、縦サイズＹROIの情報を撮像装置３及び形状測定装置４で共有しておけば、ＲＯＩの縦サイズＹROIをＲＯＩ情報として含まなくてもよい。撮像画像が例えば８ビット画像である場合、画素値として取りうる値は０〜２５５であり、Ｙ座標Ｙ1や距離ｌを０〜２５５の数値で表わして所定の画素に埋め込むことができる。
An embedding unit 302 embeds ROI information in the ROI image. Specifically, the ROI information is represented by pixel values and is embedded as new pixel values in predetermined pixels of the ROI image instead of the pixel values of the original captured image R.
As the ROI information, as shown in FIG. 2, the y coordinate y ROI that is the starting point of the ROI or the distance 1 from the Y coordinate Y 0 that is the starting point of the captured image R to the Y coordinate Y 1 is required. In the present embodiment, the ROI vertical size Y ROI is constant, and if the information on the vertical size Y ROI is shared by the imaging device 3 and the shape measuring device 4, the ROI vertical size Y ROI is not included as ROI information. May be. When the captured image is, for example, an 8-bit image, values that can be taken as pixel values are 0 to 255, and the Y coordinate Y 1 and the distance 1 can be represented by numerical values of 0 to 255 and embedded in predetermined pixels.
ここで、ＲＯＩ情報を埋め込む所定の画素は、一の画素であることに限られず、必要な情報量に応じて適宜複数の画素としてもよい。例えばＹ座標Ｙ1や距離ｌを画素値０〜２５５の範囲を超えて表現する必要がある場合は、複数の画素を用いてＹ座標Ｙ1や距離ｌの値を表現するようにしてもよい。 Here, the predetermined pixel in which the ROI information is embedded is not limited to a single pixel, and may be a plurality of pixels as appropriate according to the required information amount. For example, when it is necessary to express the Y coordinate Y 1 and the distance 1 beyond the range of the pixel values 0 to 255, the Y coordinate Y 1 and the value of the distance 1 may be expressed using a plurality of pixels. .
また、所定の画素は、形状測定に影響を与えないよう、図２に斜線で表わすように、被測定材１の幅方向ｘの測定範囲外領域の画素（例えば、想定される被測定材１の蛇行の範囲外の画素や、検査対象とすべき範囲が決まっている場合にはその外側の画素等）に設けるものとする。簡単な例でいえば、所定の画素は、ＲＯＩ画像のいずれかの隅の画素とすればよい。所定の画素の位置についての情報は、通信手段５を介して、撮像装置３及び形状測定装置４で共有されており、撮像装置３において所定の画素にＲＯＩ情報を埋め込み、形状測定装置４において所定の画素からＲＯＩ情報を読み取ることができる。 In addition, the predetermined pixel is a pixel in the region outside the measurement range in the width direction x of the measured material 1 (for example, the assumed measured material 1, as shown by hatching in FIG. 2) so as not to affect the shape measurement. The pixel is outside the meandering range, or when the range to be inspected is determined, the pixel is outside the pixel. In a simple example, the predetermined pixel may be a pixel at any corner of the ROI image. Information on the position of the predetermined pixel is shared by the imaging device 3 and the shape measuring device 4 via the communication unit 5, and the ROI information is embedded in the predetermined pixel in the imaging device 3, and the shape measuring device 4 has the predetermined information. ROI information can be read from these pixels.
また、所定の画素は、ＲＯＩ情報を埋め込むための専用の画素として用意するのが好ましい。また、所定の画素を専用の画素とせずに、例えば通常時は撮像画像を表わす画素値のままにしておき、ＲＯＩを変更した時のみＲＯＩ情報を埋め込むように切り替えることも考えられるが、その場合、例えばＲＯＩを変更したことを示す専用の画素を準備しておく等することで、形状測定装置４側で所定の画素の画素値がどちらを表わすのかを見分けられるようにする対策が必要となる。 The predetermined pixel is preferably prepared as a dedicated pixel for embedding ROI information. Further, it is conceivable that the predetermined pixel is not used as a dedicated pixel, and, for example, it is possible to leave the pixel value representing the captured image in the normal state and switch to embed the ROI information only when the ROI is changed. For example, by preparing a dedicated pixel indicating that the ROI has been changed, for example, it is necessary to take measures to enable the shape measuring device 4 to distinguish which pixel value of the predetermined pixel represents. .
このようにした撮像装置３は、例えばＣＰＵ、ＲＯＭ、ＲＡＭ等を備えたコンピュータ装置を含んで構成され、ＣＰＵが所定のプログラムを実行することにより各部３０１、３０２が実現される。なお、本実施形態では撮像装置３が切り出し部３０１及び埋め込み部３０２を備える画像処理装置として機能する例としたが、撮像装置３に別体の画像処理装置を接続し、この画像処理装置が切り出し部３０１及び埋め込み部３０２を備える構成にしてもよい。 The imaging device 3 configured as described above includes a computer device including, for example, a CPU, a ROM, a RAM, and the like, and the units 301 and 302 are realized by the CPU executing a predetermined program. In this embodiment, the imaging apparatus 3 functions as an image processing apparatus including the cutout unit 301 and the embedding unit 302. However, a separate image processing apparatus is connected to the imaging apparatus 3, and the image processing apparatus cuts out. The unit 301 and the embedding unit 302 may be provided.
以下、図４を参照して、ＲＯＩを変更するときの従来の課題、及びそれを解決できることについてあらためて述べる。なお、以下の説明では、従来の課題を説明する上でも、理解しやすくするために実施形態に係る形状測定システムと同じ符号を付して説明する。
形状測定装置４がＲＯＩの変更指示を行ってから、撮像装置３でＲＯＩの変更が完了するまでにかかる時間は、通信状況や撮像装置３の動作状況等により変動するため、不確定要素といえる。形状測定装置４と撮像装置３との通信を行う通信手段５では、ＵＳＢやシリアル通信、イーサネット（登録商標）等の汎用方式が用いられることから、撮像手段３でＲＯＩの変更が完了するタイミングを、形状測定装置４側で予め又は同時進行的に把握することは、原理的に不可能である。
Hereinafter, with reference to FIG. 4, the conventional problem when changing the ROI and the ability to solve it will be described again. In the following description, the same reference numerals as those of the shape measurement system according to the embodiment are attached for the sake of easy understanding even in explaining the conventional problems.
The time taken from when the shape measuring device 4 gives an instruction to change the ROI to when the imaging device 3 completes the change of the ROI varies depending on the communication status, the operating status of the imaging device 3, and the like, and thus can be said to be an uncertain factor. . The communication means 5 that communicates between the shape measuring device 4 and the imaging device 3 uses a general-purpose method such as USB, serial communication, Ethernet (registered trademark), etc., and therefore the timing when the ROI change is completed by the imaging means 3 is completed. In principle, it is impossible to grasp in advance or simultaneously on the shape measuring device 4 side.
図４に示すように、形状測定装置４は、撮像装置３から伝送されるＲＯＩ画像を取得する（ステップＳ１）。
形状測定装置４は、光切断線１０１がＲＯＩから外れそうになったときに、視野外れを防ぐために、撮像装置３にＲＯＩの変更指示を出力する（ステップＳ２）。
撮像装置３は、形状測定装置４からのＲＯＩの変更指示に従って、ＲＯＩの変更を実施するが、タイミング等によっては、ＲＯＩの変更が完了する（ステップＳ４）までの間に、変更前のＲＯＩ画像を形状測定装置４に伝送することがある（ステップＳ３）。
As shown in FIG. 4, the shape measuring device 4 acquires the ROI image transmitted from the imaging device 3 (step S1).
The shape measuring device 4 outputs an instruction to change the ROI to the imaging device 3 in order to prevent the view from being lost when the light section line 101 is likely to be detached from the ROI (step S2).
The imaging device 3 changes the ROI in accordance with the ROI change instruction from the shape measuring device 4, but the ROI image before the change until the change of the ROI is completed (step S4) depending on the timing or the like. May be transmitted to the shape measuring apparatus 4 (step S3).
この場合に、従来は、形状測定装置４には（ｂ）に示す変更前のＲＯＩ画像が届いているにもかかわらず、（ａ）に示す変更後のＲＯＩ画像が届いていると認識して画像処理を進めるおそれがあった。その結果、撮像装置３における切り出し領域と、形状測定装置４において認識している切り出し領域とにずれが生じる。光切断法では、ＲＯＩ内の光切断線１０１のＹ座標に基づいて形状測定を行うため、画像の誤認識によって正確な形状測定を行えなくなる。図４の例であれば、光切断線１０１がまっすぐで、その位置も本来変わっておらず、平坦な形状と測定されるべきところを、光切断線１０１の位置が被測定材１の高さ方向（ｚ方向）にずれていると誤認識して、凹形状として測定してしまうおそれがある。 In this case, conventionally, the shape measuring apparatus 4 recognizes that the changed ROI image shown in (a) has arrived even though the changed ROI image shown in (b) has arrived. There was a risk of proceeding with image processing. As a result, a shift occurs between the cutout area in the imaging device 3 and the cutout area recognized by the shape measuring apparatus 4. In the light cutting method, since shape measurement is performed based on the Y coordinate of the light cutting line 101 in the ROI, accurate shape measurement cannot be performed due to erroneous recognition of an image. In the example of FIG. 4, the light cutting line 101 is straight and its position is not originally changed, and the position of the light cutting line 101 is the height of the material 1 to be measured. There is a possibility that it is misrecognized as being displaced in the direction (z direction) and measured as a concave shape.
それに対して、本発明を適用することにより、形状測定装置４は、撮像装置３から取得したＲＯＩ画像の所定の画素を参照して、ＲＯＩ情報を読み取ることができる。これにより、ＲＯＩ情報が自身で指示した切り出し領域と整合していなければ、撮像装置３においてＲＯＩの変更が完了していないと判定することができ、また、ＲＯＩ情報が自身で指示した切り出し領域と整合していれば、撮像装置３においてＲＯＩの変更が完了していると判定することができる。つまり、所定の画素に埋め込まれたＲＯＩ情報を参照することで、撮像画像Ｒの始点Ｙ座標Ｙ0基準での光切断線１０１のＹ座標を各撮影時刻において正確に把握することが可能となる。したがって、形状測定装置４がＲＯＩの変更指示を行ってから（ステップＳ２）、撮像装置３でＲＯＩの変更を完了する（ステップＳ４）までの間に、変更前のＲＯＩが形状測定装置４に伝送された場合（ステップＳ３）でも、（ｂ）に示す変更前のＲＯＩ画像であると正しく認識して、正確な形状測定を行うことができる。 On the other hand, by applying the present invention, the shape measuring device 4 can read ROI information with reference to predetermined pixels of the ROI image acquired from the imaging device 3. Thus, if the ROI information does not match the cutout area designated by itself, it can be determined that the change of the ROI has not been completed in the imaging apparatus 3, and the ROI information can be determined as the cutout area designated by itself. If they match, it can be determined that the change of the ROI is completed in the imaging device 3. That is, by referring to the ROI information embedded in a predetermined pixel, it becomes possible to accurately grasp the Y coordinate of the light section line 101 based on the start point Y coordinate Y 0 of the captured image R at each photographing time. . Accordingly, the ROI before the change is transmitted to the shape measuring device 4 after the shape measuring device 4 issues the ROI change instruction (step S2) until the imaging device 3 completes the change of the ROI (step S4). Even in the case (step S3), it is possible to correctly recognize the ROI image before the change shown in (b) and perform accurate shape measurement.
以上、本発明を実施形態と共に説明したが、上記実施形態は本発明を実施するにあたっての具体化の例を示したものに過ぎず、これらによって本発明の技術的範囲が限定的に解釈されてはならないものである。即ち、本発明はその技術思想、又はその主要な特徴から逸脱することなく、様々な形で実施することができる。
本実施形態ではＲＯＩの縦サイズＹROIを一定とする例を説明したが、縦サイズＹROIも可変とし、所定の画素のうち一部の画素に縦サイズＹROIの情報を埋め込むようにしてもよい。
また、本実施形態では撮像画像Ｒの横サイズＸRをそのままＲＯＩの横サイズとする例を説明したが、ＲＯＩの縦サイズに加えて又は替えて、ＲＯＩの横サイズを可変とするようにしてもよい。ＲＯＩの縦サイズ及び横サイズの両方を可変とする場合、ＲＯＩ情報としては、例えばＲＯＩの四隅のうち対角線上の２点の座標（始点座標及び終点座標）が分かればよい。そこで、４つの所定の画素を用意し、始点座標のｘ座標及びｙ座標、終点座標のｘ座標及びｙ座標をそれぞれ画素値で表わして、各画素に埋め込めばよい。
Although the present invention has been described together with the embodiments, the above-described embodiments are merely examples of implementation in carrying out the present invention, and the technical scope of the present invention is interpreted in a limited manner by these. It must not be. That is, the present invention can be implemented in various forms without departing from the technical idea or the main features thereof.
In this embodiment, an example in which the vertical size Y ROI of ROI is constant has been described. However, the vertical size Y ROI is also variable, and information on the vertical size Y ROI may be embedded in some of the predetermined pixels. Good.
Further, in the present embodiment has been described an example in which the horizontal size of the intact ROI lateral size X R of the captured image R, in place of or in addition to the vertical size of the ROI, and the horizontal size of the ROI as a variable Also good. When both the vertical size and the horizontal size of the ROI are variable, as the ROI information, for example, coordinates of two points on the diagonal line (start point coordinates and end point coordinates) of the four corners of the ROI may be known. Therefore, four predetermined pixels are prepared, and the x coordinate and y coordinate of the start point coordinate and the x coordinate and y coordinate of the end point coordinate are each expressed by a pixel value and embedded in each pixel.
なお、本実施形態では、光切断法を説明したが、それに限られるものではなく、例えば特許文献４に開示されているような、いわゆる光てこ法を利用する場合にも本発明は適用可能である。光てこ法は、帯状体表面に帯状体を横切る帯状光を照射して帯状体面に光帯を形成し、光帯の反射像をスクリーンに投影し、スクリーン上の反射像を２次元撮像装置で撮像する方式であり、撮像装置で撮像される反射像をスクリーン上で取得し、取得したＲＯＩ画像にＲＯＩ情報を埋め込むことで、本発明を適用することができる。 In the present embodiment, the optical cutting method has been described. However, the present invention is not limited to this, and the present invention can also be applied to the case where a so-called optical lever method as disclosed in Patent Document 4, for example, is used. is there. The optical lever method irradiates the surface of the band with the band-shaped light that crosses the band, forms an optical band on the surface of the band, projects the reflected image of the optical band on the screen, and then reflects the reflected image on the screen with a two-dimensional imaging device. This is an imaging method, and the present invention can be applied by acquiring a reflection image captured by an imaging device on a screen and embedding ROI information in the acquired ROI image.
また、本発明は、ソフトウェア（プログラム）をネットワーク又は各種記憶媒体を介してシステム或いは装置に供給し、そのシステム或いは装置のコンピュータがプログラムを読み出して実行することによっても実現可能である。 The present invention can also be realized by supplying software (program) to a system or apparatus via a network or various storage media, and a computer of the system or apparatus reading and executing the program.
１：被測定材
２：照明装置
３：撮像装置
４：形状測定装置
５：通信手段
３０１：切り出し部
３０２：埋め込み部
４０１：指示部
４０２：読み取り部
４０３：画像処理部
1: Material to be measured 2: Illumination device 3: Imaging device 4: Shape measurement device 5: Communication means 301: Cutout unit 302: Embedding unit 401: Instruction unit 402: Reading unit 403: Image processing unit
Claims (6)
前記被測定材に、前記被測定材の搬送方向とは直交する方向に延びる帯状光を照射する照明装置と、
前記帯状光が前記被測定材に反射したことに基づく像を撮像し、撮像した撮像画像から、前記撮像画像の一部である部分領域を切り出す撮像装置と、
前記部分領域の画像内の前記像に基づいて前記被測定材の形状測定を行う形状測定装置と、
前記形状測定装置からの指示を前記撮像装置に伝える通信手段と、
前記部分領域についての切り出し領域に関する情報を、前記部分領域の画像に埋め込む埋め込み手段と、
を備え、
前記形状測定装置は、前記像が前記部分領域の画像から外れそうな場合に、前記撮像装置に対して、前記部分領域の前記撮像画像内の位置を変更させる指示を出し、
前記埋め込み手段は、前記切り出し領域に関する情報を、画素値で表わし、前記部分領域の画像内の一又は複数の画素に埋め込むことを特徴とする形状測定システム。 In the shape measurement system that measures the shape of the material to be measured,
An illuminating device that irradiates the material to be measured with strip-shaped light extending in a direction orthogonal to the conveying direction of the material to be measured;
An imaging device that captures an image based on the reflection of the strip light on the material to be measured, and cuts out a partial region that is a part of the captured image from the captured image;
A shape measuring device for measuring the shape of the material to be measured based on the image in the image of the partial region;
Communication means for transmitting an instruction from the shape measuring device to the imaging device;
Embedding means for embedding information about the cutout area for the partial area in the image of the partial area;
With
The shape measuring device issues an instruction to change the position of the partial region in the captured image when the image is likely to deviate from the image of the partial region.
The shape measurement system characterized in that the embedding means expresses information related to the cutout region as a pixel value and embeds it in one or a plurality of pixels in the image of the partial region.
前記撮像画像中における、前記搬送方向に対応する方向の前記部分領域の始点の座標、及び、前記搬送方向に対応する方向の前記撮像画像の始点の座標から、前記搬送方向に対応する方向の前記部分領域の始点の座標までの距離、のうち少なくともいずれか一つに対応する情報を含むことを特徴とする請求項１に記載の形状測定システム。 Information about the cutout area is
In the captured image, from the coordinates of the start point of the partial area in the direction corresponding to the transport direction and the coordinates of the start point of the captured image in the direction corresponding to the transport direction, the direction in the direction corresponding to the transport direction The shape measurement system according to claim 1, comprising information corresponding to at least one of the distances to the coordinates of the start point of the partial area.
照明装置を用い、前記被測定材に、前記被測定材の搬送方向とは直交する方向に延びる帯状光を照射する照射ステップと、
撮像装置を用い、前記帯状光が前記被測定材に反射したことに基づく像を撮像し、撮像した撮像画像から、前記撮像画像の一部である部分領域を切り出す撮像ステップと、
形状測定装置を用い、前記部分領域の画像内の前記像に基づいて前記被測定材の形状測定を行う形状測定ステップと、
前記形状測定装置からの指示を前記撮像装置に伝える通信ステップと、
埋め込み手段を用いて、前記部分領域についての切り出し領域に関する情報を、前記部分領域の画像に埋め込む埋め込みステップと、
を有し、
前記形状測定ステップでは、前記像が前記部分領域の画像から外れそうな場合に、前記撮像装置に対して、前記部分領域の前記撮像画像内の位置を変更させる指示を出し、
前記埋め込みステップでは、前記切り出し領域に関する情報を、画素値で表わし、前記部分領域の画像内の一又は複数の画素に埋め込むことを特徴とする形状測定方法。 In the shape measuring method for measuring the shape of the material to be measured,
Irradiation step using a lighting device to irradiate the material to be measured with strip-shaped light extending in a direction orthogonal to the conveyance direction of the material to be measured;
An imaging step of capturing an image based on the fact that the band-like light is reflected by the material to be measured using an imaging device, and cutting out a partial region that is a part of the captured image from the captured image;
Using a shape measuring device, a shape measuring step for measuring the shape of the material to be measured based on the image in the image of the partial region;
A communication step of transmitting an instruction from the shape measuring device to the imaging device;
An embedding step of embedding information about the cutout region for the partial region in the image of the partial region using an embedding unit;
Have
In the shape measurement step, when the image is likely to deviate from the image of the partial area, the imaging device is instructed to change the position of the partial area in the captured image,
In the embedding step, the information relating to the cutout region is represented by a pixel value and embedded in one or a plurality of pixels in the image of the partial region.
前記撮像画像中における、前記搬送方向に対応する方向の前記部分領域の始点の座標、及び、前記搬送方向に対応する方向の前記撮像画像の始点の座標から、前記搬送方向に対応する方向の前記部分領域の始点の座標までの距離、のうち少なくともいずれか一つに対応する情報を含むことを特徴とする請求項４に記載の形状測定方法。 Information about the cutout area is
In the captured image, from the coordinates of the start point of the partial area in the direction corresponding to the transport direction and the coordinates of the start point of the captured image in the direction corresponding to the transport direction, the direction in the direction corresponding to the transport direction The shape measuring method according to claim 4, comprising information corresponding to at least one of the distances to the coordinates of the start point of the partial area.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111368833A (en) * | 2020-03-06 | 2020-07-03 | 北京科技大学 | A fully automatic steel loading method for slab number detection based on machine vision |
| WO2025088784A1 (en) * | 2023-10-27 | 2025-05-01 | ヤマハ発動機株式会社 | Workpiece measurement device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06148098A (en) * | 1992-09-18 | 1994-05-27 | Kawasaki Steel Corp | Surface defect inspection apparatus |
| JPH11312230A (en) * | 1998-04-28 | 1999-11-09 | Asahi Chem Ind Co Ltd | Image data processing method, its device, storage medium for storing picture data with processing program stored therein and processing data, and image segmenting device |
| WO2007049449A1 (en) * | 2005-10-26 | 2007-05-03 | Matsushita Electric Industrial Co., Ltd. | Video reproducing device, video recorder, video reproducing method, video recording method, and semiconductor integrated circuit |
| JP2009014388A (en) * | 2007-07-02 | 2009-01-22 | Kobe Steel Ltd | Shape detection method and shape detection apparatus |
| US20150116727A1 (en) * | 2012-04-04 | 2015-04-30 | Siemens Vai Metals Technologies Gmbh | Method and device for measuring the flatness of a metal product |
| JP2017177197A (en) * | 2016-03-31 | 2017-10-05 | Ｊｆｅスチール株式会社 | Steel material undrafted part width detecting device and method thereof |
-
2017
- 2017-02-17 JP JP2017027526A patent/JP6780533B2/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06148098A (en) * | 1992-09-18 | 1994-05-27 | Kawasaki Steel Corp | Surface defect inspection apparatus |
| JPH11312230A (en) * | 1998-04-28 | 1999-11-09 | Asahi Chem Ind Co Ltd | Image data processing method, its device, storage medium for storing picture data with processing program stored therein and processing data, and image segmenting device |
| WO2007049449A1 (en) * | 2005-10-26 | 2007-05-03 | Matsushita Electric Industrial Co., Ltd. | Video reproducing device, video recorder, video reproducing method, video recording method, and semiconductor integrated circuit |
| JP2009014388A (en) * | 2007-07-02 | 2009-01-22 | Kobe Steel Ltd | Shape detection method and shape detection apparatus |
| US20150116727A1 (en) * | 2012-04-04 | 2015-04-30 | Siemens Vai Metals Technologies Gmbh | Method and device for measuring the flatness of a metal product |
| JP2017177197A (en) * | 2016-03-31 | 2017-10-05 | Ｊｆｅスチール株式会社 | Steel material undrafted part width detecting device and method thereof |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111368833A (en) * | 2020-03-06 | 2020-07-03 | 北京科技大学 | A fully automatic steel loading method for slab number detection based on machine vision |
| WO2025088784A1 (en) * | 2023-10-27 | 2025-05-01 | ヤマハ発動機株式会社 | Workpiece measurement device |
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