JP2018128301A - 治具 - Google Patents
治具 Download PDFInfo
- Publication number
- JP2018128301A JP2018128301A JP2017020260A JP2017020260A JP2018128301A JP 2018128301 A JP2018128301 A JP 2018128301A JP 2017020260 A JP2017020260 A JP 2017020260A JP 2017020260 A JP2017020260 A JP 2017020260A JP 2018128301 A JP2018128301 A JP 2018128301A
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- JP
- Japan
- Prior art keywords
- probe
- plate
- probe head
- jig
- barrel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/16—Magnets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
22 配線基板
26 止めねじ
28 プローブヘッド
34、34a、34b、34c プローブ及びその上端部、下端部、中間部
36 支持体
38、38a 上板及びその穴
40、40a 下板及びその穴
50 治具
52 プレート
54 磁石
56 穴
Claims (4)
- 被検査体と、前記被検査体の検査装置とを電気的に接続する配線基板と、前記配線基板の前記被検査体に対向する面に複数の止めねじで固定されたプローブヘッドとを備え、
前記プローブヘッドは、上端部、下端部、及び前記上端部と前記下端部の間の中間部を有する磁性体からなる複数のプローブと、前記複数のプローブを支持する支持体とを有し、
前記支持体は、互いに平行な上板及び下板を有し、前記上板が各プローブの下端部、中間部及び上端部が順次に通された穴を有し、前記下板が、各プローブの下端部が通され且つ各プローブの中間部がその通過を阻止された穴を有する電気的接続装置に適用される治具であって、
プレートと、前記プレートに取り付けられた磁石とを備え、
前記プレートは前記支持体に設けられた複数のねじ穴に対応する複数の穴を有し、これらの複数の穴を通して前記ねじ穴にねじ込まれる複数のねじを介して前記プローブヘッドに対し脱着自在に取り付け可能であり、
前記磁石は前記プローブの下端部に対向する、治具。 - 前記プレートは、前記複数の止めねじにそれぞれ対応する複数の穴を有する、請求項1に記載の治具。
- 前記磁石は永久磁石又は電磁石からなる、請求項1又は2に記載の治具。
- 前記プローブは、バレルであってその軸線方向に伸縮可能であるばね部を有するバレルと、該バレル内に配置されかつ前記バレルに固定された本体及び前記バレル外に突出する先端部からなるプランジャとを備え、
前記バレルが前記プローブの上端部及び中間部を構成し、前記プランジャの先端部が前記プローブの下端部を構成する、請求項1乃至3の何れか1項に記載の治具。
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017020260A JP6961351B2 (ja) | 2017-02-07 | 2017-02-07 | 治具 |
| PCT/JP2018/003892 WO2018147246A1 (ja) | 2017-02-07 | 2018-02-06 | 治具 |
| CN201880010748.6A CN110268274B (zh) | 2017-02-07 | 2018-02-06 | 治具和电连接装置 |
| KR1020197024184A KR102157780B1 (ko) | 2017-02-07 | 2018-02-06 | 지그 |
| EP18750975.7A EP3581944A4 (en) | 2017-02-07 | 2018-02-06 | Jig |
| US16/483,869 US10962568B2 (en) | 2017-02-07 | 2018-02-06 | Jig |
| TW107104153A TWI644105B (zh) | 2017-02-07 | 2018-02-06 | 治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017020260A JP6961351B2 (ja) | 2017-02-07 | 2017-02-07 | 治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018128301A true JP2018128301A (ja) | 2018-08-16 |
| JP6961351B2 JP6961351B2 (ja) | 2021-11-05 |
Family
ID=63108301
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017020260A Active JP6961351B2 (ja) | 2017-02-07 | 2017-02-07 | 治具 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10962568B2 (ja) |
| EP (1) | EP3581944A4 (ja) |
| JP (1) | JP6961351B2 (ja) |
| KR (1) | KR102157780B1 (ja) |
| CN (1) | CN110268274B (ja) |
| TW (1) | TWI644105B (ja) |
| WO (1) | WO2018147246A1 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102037657B1 (ko) * | 2018-09-05 | 2019-10-29 | 주식회사 아이에스시 | 전기적 검사용 프로브 카드 및 프로브 카드의 프로브 헤드 |
| KR102136689B1 (ko) * | 2020-03-03 | 2020-07-22 | 장용철 | 탈부착이 가능한 프로브 베이스를 구비하는 플라잉 프로브 테스터 |
| WO2024219075A1 (ja) * | 2023-04-19 | 2024-10-24 | 株式会社日本マイクロニクス | 電気的接続装置の製造治具および電気的接続装置の製造方法 |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6892277B2 (ja) * | 2017-02-10 | 2021-06-23 | 株式会社日本マイクロニクス | プローブ及び電気的接続装置 |
| CN109239415B (zh) * | 2018-11-09 | 2024-05-31 | 广东电网有限责任公司 | 一种超导带材测试装置 |
| CN110531126A (zh) * | 2019-10-09 | 2019-12-03 | 严日东 | 一种紧固组装式垂直探针卡 |
| KR102261798B1 (ko) * | 2020-04-03 | 2021-06-07 | (주)화이컴 | 프로브 카드 제조용 지그, 이를 포함하는 프로브 정렬 시스템 및 이를 이용하여 제조된 프로브 카드 |
| TWI743730B (zh) | 2020-04-06 | 2021-10-21 | 旺矽科技股份有限公司 | 探針卡 |
| TWI778541B (zh) * | 2020-04-06 | 2022-09-21 | 旺矽科技股份有限公司 | 探針模組 |
| CN114325296A (zh) * | 2020-09-30 | 2022-04-12 | 揖斐电株式会社 | 导通检查用治具和印刷布线板的检查方法 |
| KR20220170298A (ko) | 2021-06-22 | 2022-12-29 | 현대자동차주식회사 | 차량용 글래스 세팅장치 |
| TWI793040B (zh) * | 2022-07-05 | 2023-02-11 | 中華精測科技股份有限公司 | 可拆式測試裝置及其固持座 |
| TWI894906B (zh) * | 2024-04-09 | 2025-08-21 | 旺矽科技股份有限公司 | 具有支撐結構的探針座、探針頭、探針卡及探針系統 |
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2017
- 2017-02-07 JP JP2017020260A patent/JP6961351B2/ja active Active
-
2018
- 2018-02-06 CN CN201880010748.6A patent/CN110268274B/zh active Active
- 2018-02-06 US US16/483,869 patent/US10962568B2/en active Active
- 2018-02-06 EP EP18750975.7A patent/EP3581944A4/en not_active Withdrawn
- 2018-02-06 KR KR1020197024184A patent/KR102157780B1/ko active Active
- 2018-02-06 TW TW107104153A patent/TWI644105B/zh active
- 2018-02-06 WO PCT/JP2018/003892 patent/WO2018147246A1/ja not_active Ceased
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| JPH07146316A (ja) * | 1993-11-22 | 1995-06-06 | Fujitsu Ltd | 電圧・変位検出プローブ及びこれを用いた電圧・変位測定装置 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102037657B1 (ko) * | 2018-09-05 | 2019-10-29 | 주식회사 아이에스시 | 전기적 검사용 프로브 카드 및 프로브 카드의 프로브 헤드 |
| WO2020050645A1 (ko) * | 2018-09-05 | 2020-03-12 | 주식회사 아이에스시 | 전기적 검사용 프로브 카드 및 프로브 카드의 프로브 헤드 |
| TWI714245B (zh) * | 2018-09-05 | 2020-12-21 | 韓商Isc 股份有限公司 | 電性檢查用探針卡及探針卡之探針頭 |
| KR102136689B1 (ko) * | 2020-03-03 | 2020-07-22 | 장용철 | 탈부착이 가능한 프로브 베이스를 구비하는 플라잉 프로브 테스터 |
| WO2024219075A1 (ja) * | 2023-04-19 | 2024-10-24 | 株式会社日本マイクロニクス | 電気的接続装置の製造治具および電気的接続装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20190103427A (ko) | 2019-09-04 |
| TW201835578A (zh) | 2018-10-01 |
| WO2018147246A1 (ja) | 2018-08-16 |
| JP6961351B2 (ja) | 2021-11-05 |
| TWI644105B (zh) | 2018-12-11 |
| CN110268274A (zh) | 2019-09-20 |
| EP3581944A4 (en) | 2020-12-09 |
| US10962568B2 (en) | 2021-03-30 |
| EP3581944A1 (en) | 2019-12-18 |
| US20200025800A1 (en) | 2020-01-23 |
| KR102157780B1 (ko) | 2020-09-18 |
| CN110268274B (zh) | 2021-08-24 |
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