JP2018107011A - 電気接触子及び電気部品用ソケット - Google Patents
電気接触子及び電気部品用ソケット Download PDFInfo
- Publication number
- JP2018107011A JP2018107011A JP2016254010A JP2016254010A JP2018107011A JP 2018107011 A JP2018107011 A JP 2018107011A JP 2016254010 A JP2016254010 A JP 2016254010A JP 2016254010 A JP2016254010 A JP 2016254010A JP 2018107011 A JP2018107011 A JP 2018107011A
- Authority
- JP
- Japan
- Prior art keywords
- contact
- electrical component
- socket
- electrical
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2428—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using meander springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/716—Coupling device provided on the PCB
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/04—Pins or blades for co-operation with sockets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/72—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures
- H01R12/73—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Abstract
Description
2 ICパッケージ(第2の電気部品)
10 ICソケット(電気部品用ソケット)
20 ソケット本体
40 フローティングプレート(収容部)
60 コンタクトピン(電気接触子)
70 第1部材
70A 導電材料
70B 板状部分
70C 波状部分
71 第1接触部
75 ばね部
80 第2部材
81 第2接触部
85 挿入部
L 軸
Claims (3)
- 第1の電気部品と第2の電気部品の間に配設されて、両者を電気的に接続する電気接触子であって、
前記第1の電気部品に接触する第1部材と、前記第2の電気部品に接触する第2部材とが、互いに伸縮自在となるように設けられており、
前記第1部材は、板状部分の一部に波状部分が形成された導電材料が筒状に形成され、前記第1の電気部品に接触する第1接触部と、前記波状部分で形成されたばね部とを有しており、
前記第2部材は、棒状部材で構成され、前記第2の電気部品に接触する第2接触部と、前記ばね部の内部に挿入される挿入部とを有しており、
前記第1部材と前記第2部材を前記ばね部の付勢力に抗して収縮させることにより、前記第1接触部と前記第2接触部が互いに離間する方向に付勢されるようになっていることを特徴とする電気接触子。 - 前記ばね部の内部に挿入された前記挿入部が、前記第1接触部と接触して、前記第1部材と前記第2部材とが導通していることを特徴とする請求項1に記載の電気接触子。
- 第2の電気部品上に配置され、第1の電気部品が収容される収容部を有するソケット本体と、
該ソケット本体に配設されて前記第1の電気部品に設けられた端子及び前記第2の電気部品に設けられた端子に接触する請求項1又は2に記載の電気接触子とを有することを特徴とする電気部品用ソケット。
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016254010A JP2018107011A (ja) | 2016-12-27 | 2016-12-27 | 電気接触子及び電気部品用ソケット |
| KR1020197016769A KR20190102186A (ko) | 2016-12-27 | 2017-12-22 | 전기 접촉자 및 전기 부품용 소켓 |
| CN201780080865.5A CN110121652A (zh) | 2016-12-27 | 2017-12-22 | 电触头和电气零件用插座 |
| PCT/JP2017/046158 WO2018123877A1 (ja) | 2016-12-27 | 2017-12-22 | 電気接触子及び電気部品用ソケット |
| US16/470,891 US10797423B2 (en) | 2016-12-27 | 2017-12-22 | Electric contact and socket for electric component |
| TW106145662A TW201830545A (zh) | 2016-12-27 | 2017-12-26 | 電氣接觸件以及電氣零件用插座 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016254010A JP2018107011A (ja) | 2016-12-27 | 2016-12-27 | 電気接触子及び電気部品用ソケット |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2018107011A true JP2018107011A (ja) | 2018-07-05 |
Family
ID=62707706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016254010A Ceased JP2018107011A (ja) | 2016-12-27 | 2016-12-27 | 電気接触子及び電気部品用ソケット |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10797423B2 (ja) |
| JP (1) | JP2018107011A (ja) |
| KR (1) | KR20190102186A (ja) |
| CN (1) | CN110121652A (ja) |
| TW (1) | TW201830545A (ja) |
| WO (1) | WO2018123877A1 (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024215351A1 (en) * | 2023-04-12 | 2024-10-17 | Microfabrica Inc. | Pin-type probes for contacting electronic circuits |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013053931A (ja) * | 2011-09-05 | 2013-03-21 | Nidec-Read Corp | 接続端子及び接続治具 |
| JP2013187165A (ja) * | 2012-03-12 | 2013-09-19 | Furukawa Electric Co Ltd:The | コネクタ端子用接触ばね及び雌端子、雄端子、コネクタ |
| JP2014169887A (ja) * | 2013-03-01 | 2014-09-18 | Yamaichi Electronics Co Ltd | 検査用プローブ、および、それを備えるicソケット |
| JP2015038455A (ja) * | 2013-08-19 | 2015-02-26 | 富士通コンポーネント株式会社 | プローブ及びプローブの製造方法 |
| JP2016507751A (ja) * | 2013-07-19 | 2016-03-10 | ハイコン カンパニー リミテッド | スプリングコンタクト |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3326095B2 (ja) * | 1996-12-27 | 2002-09-17 | 日本発条株式会社 | 導電性接触子 |
| EP1795906B1 (en) * | 2000-06-16 | 2009-10-28 | Nhk Spring Co.Ltd. | Microcontactor probe |
| JP4390983B2 (ja) | 2000-07-14 | 2009-12-24 | 山一電機株式会社 | コンタクトプローブ及びその製造方法 |
| JP4089976B2 (ja) * | 2004-05-17 | 2008-05-28 | リーノ アイエヌディー.インコーポレイテッド | 大電流用プローブ |
| US7535241B2 (en) * | 2006-10-30 | 2009-05-19 | Aries Electronics, Inc. | Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end |
| CN101669034A (zh) * | 2007-04-27 | 2010-03-10 | 日本发条株式会社 | 导电性接触器 |
| CN101911273B (zh) * | 2008-01-02 | 2012-06-13 | 中村敏幸 | 整体形成的探针及其制造方法 |
| JP2010025844A (ja) * | 2008-07-23 | 2010-02-04 | Unitechno Inc | コンタクトプローブおよび検査用ソケット |
| JP4900843B2 (ja) * | 2008-12-26 | 2012-03-21 | 山一電機株式会社 | 半導体装置用電気接続装置及びそれに使用されるコンタクト |
| TWI482973B (zh) * | 2009-04-03 | 2015-05-01 | Nhk Spring Co Ltd | 彈簧用線材、接觸探針及探針單元 |
| JP4998838B2 (ja) * | 2010-04-09 | 2012-08-15 | 山一電機株式会社 | プローブピン及びそれを備えるicソケット |
| EP2587267B1 (en) * | 2010-06-25 | 2016-12-07 | NHK Spring Co., Ltd. | Contact probe and probe unit |
| US9373900B2 (en) * | 2011-07-19 | 2016-06-21 | Nhk Spring Co., Ltd. | Contact structure unit |
| JP5836112B2 (ja) * | 2011-12-28 | 2015-12-24 | 株式会社エンプラス | 電気部品用ソケット |
| CN104364660B (zh) * | 2012-06-06 | 2018-09-21 | 恩普乐股份有限公司 | 电触头和电气部件用插座 |
| JP6011103B2 (ja) * | 2012-07-23 | 2016-10-19 | 山一電機株式会社 | コンタクトプローブ及びそれを備えた半導体素子用ソケット |
-
2016
- 2016-12-27 JP JP2016254010A patent/JP2018107011A/ja not_active Ceased
-
2017
- 2017-12-22 KR KR1020197016769A patent/KR20190102186A/ko not_active Withdrawn
- 2017-12-22 CN CN201780080865.5A patent/CN110121652A/zh active Pending
- 2017-12-22 US US16/470,891 patent/US10797423B2/en not_active Expired - Fee Related
- 2017-12-22 WO PCT/JP2017/046158 patent/WO2018123877A1/ja not_active Ceased
- 2017-12-26 TW TW106145662A patent/TW201830545A/zh unknown
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013053931A (ja) * | 2011-09-05 | 2013-03-21 | Nidec-Read Corp | 接続端子及び接続治具 |
| JP2013187165A (ja) * | 2012-03-12 | 2013-09-19 | Furukawa Electric Co Ltd:The | コネクタ端子用接触ばね及び雌端子、雄端子、コネクタ |
| JP2014169887A (ja) * | 2013-03-01 | 2014-09-18 | Yamaichi Electronics Co Ltd | 検査用プローブ、および、それを備えるicソケット |
| JP2016507751A (ja) * | 2013-07-19 | 2016-03-10 | ハイコン カンパニー リミテッド | スプリングコンタクト |
| JP2015038455A (ja) * | 2013-08-19 | 2015-02-26 | 富士通コンポーネント株式会社 | プローブ及びプローブの製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20200091644A1 (en) | 2020-03-19 |
| US10797423B2 (en) | 2020-10-06 |
| KR20190102186A (ko) | 2019-09-03 |
| TW201830545A (zh) | 2018-08-16 |
| WO2018123877A1 (ja) | 2018-07-05 |
| CN110121652A (zh) | 2019-08-13 |
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