JP2018193289A - カーボンナノチューブ構造体 - Google Patents
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- JP2018193289A JP2018193289A JP2018000454A JP2018000454A JP2018193289A JP 2018193289 A JP2018193289 A JP 2018193289A JP 2018000454 A JP2018000454 A JP 2018000454A JP 2018000454 A JP2018000454 A JP 2018000454A JP 2018193289 A JP2018193289 A JP 2018193289A
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- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/158—Carbon nanotubes
- C01B32/159—Carbon nanotubes single-walled
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- B82—NANOTECHNOLOGY
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- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
- B82B3/0009—Forming specific nanostructures
- B82B3/0014—Array or network of similar nanostructural elements
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- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
- B82B3/0009—Forming specific nanostructures
- B82B3/0038—Manufacturing processes for forming specific nanostructures not provided for in groups B82B3/0014 - B82B3/0033
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- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
- H10D30/6739—Conductor-insulator-semiconductor electrodes
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/80—Constructional details
- H10K10/82—Electrodes
- H10K10/86—Schottky electrodes
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/221—Carbon nanotubes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B2202/00—Structure or properties of carbon nanotubes
- C01B2202/20—Nanotubes characterized by their properties
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/01—Particle morphology depicted by an image
- C01P2004/03—Particle morphology depicted by an image obtained by SEM
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/80—Constructional details
- H10K10/82—Electrodes
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/451—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising a metal-semiconductor-metal [m-s-m] structure
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- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Composite Materials (AREA)
- Thin Film Transistor (AREA)
- Carbon And Carbon Compounds (AREA)
- Electroluminescent Light Sources (AREA)
- Photovoltaic Devices (AREA)
- Light Receiving Elements (AREA)
Abstract
Description
S11、基板11を提供し、基板11の表面に触媒層12を堆積させる。
S12、基板11を反応炉13に設置し、反応炉を所定の温度に加熱し、反応炉13に炭素源ガス14及び保護ガス15を導入して、基板11にカーボンナノチューブアレイ16を成長させ、カーボンナノチューブアレイ16は複数のカーボンナノチューブセグメントを含む。
S13、カーボンナノチューブアレイ16に電界を印加して、電界向きは触媒層を正電荷に帯電させる方向であり、電界向きを反転させて、カーボンナノチューブセグメントから半導体性カーボンナノチューブセグメントを成長させる。
12 触媒層
13 反応炉
14 炭素源ガス
15 保護ガス
16、20 カーボンナノチューブアレイ
30、40 薄膜トランジスタ
31、41 絶縁基板
32、46 ゲート電極
33 ゲート絶縁層
34、42、51、64、74 カーボンナノチューブ構造体
35、43 ソース電極
36、44 ドレイン電極
341、342、421、422、641、642 金属性カーボンナノチューブセグメント
343、423、643 半導体性カーボンナノチューブセグメント
45 絶縁層
50 光検出器
52、65 第一電極
53、66 第二電極
54 電流検出装置
55 電源
60、70 光電変換装置
61、71 光電変換モジュール
62、72 カバー構造体
643a 第一領域
643b 第二領域
Claims (5)
- 複数のカーボンナノチューブを含むカーボンナノチューブ構造体であって、
複数の前記カーボンナノチューブはアレイで配列され、
各前記カーボンナノチューブは金属性カーボンナノチューブセグメント及び半導体性カーボンナノチューブセグメントを含み、
前記金属性カーボンナノチューブセグメントは前記半導体性カーボンナノチューブセグメントと接続されることを特徴とするカーボンナノチューブ構造体。 - 前記半導体性カーボンナノチューブセグメント及び前記金属性カーボンナノチューブセグメントはショットキー障壁によって接続されることを特徴とする請求項1に記載のカーボンナノチューブ構造体。
- 各前記カーボンナノチューブは複数の前記半導体性カーボンナノチューブセグメント及び複数の前記金属性カーボンナノチューブセグメントからなり、
複数の前記半導体性カーボンナノチューブセグメント及び複数の前記金属性カーボンナノチューブセグメントは交互に配列されることを特徴とする請求項1に記載のカーボンナノチューブ構造体。 - 各前記カーボンナノチューブは二つの前記金属性カーボンナノチューブセグメント及び一つの半導体性カーボンナノチューブセグメントからなり、
二つの前記金属性カーボンナノチューブセグメントは一つの前記半導体性カーボンナノチューブセグメントとそれぞれ接続されることを特徴とする請求項1に記載のカーボンナノチューブ構造体。 - 少なくとも一本のカーボンナノチューブを含むカーボンナノチューブ構造体であって、
少なくとも一本の前記カーボンナノチューブは複数の半導体性カーボンナノチューブセグメント及び複数の金属性カーボンナノチューブセグメントからなり、
複数の前記半導体性カーボンナノチューブセグメント及び複数の前記金属性カーボンナノチューブセグメントは交互に配列されることを特徴とするカーボンナノチューブ構造体。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710347893.0 | 2017-05-17 | ||
| CN201710347893.0A CN108946658B (zh) | 2017-05-17 | 2017-05-17 | 碳纳米管结构 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018193289A true JP2018193289A (ja) | 2018-12-06 |
| JP6837016B2 JP6837016B2 (ja) | 2021-03-03 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP2018000454A Active JP6837016B2 (ja) | 2017-05-17 | 2018-01-05 | カーボンナノチューブ構造体 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10418557B2 (ja) |
| JP (1) | JP6837016B2 (ja) |
| CN (1) | CN108946658B (ja) |
| TW (1) | TWI703085B (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11271163B2 (en) | 2019-04-18 | 2022-03-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of forming semiconductor device having carbon nanotube |
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2017
- 2017-05-17 CN CN201710347893.0A patent/CN108946658B/zh active Active
- 2017-06-08 TW TW106118974A patent/TWI703085B/zh active
-
2018
- 2018-01-05 JP JP2018000454A patent/JP6837016B2/ja active Active
- 2018-05-14 US US15/978,266 patent/US10418557B2/en active Active
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| JP2002329723A (ja) * | 2001-05-02 | 2002-11-15 | Fujitsu Ltd | 集積回路装置及び集積回路装置製造方法 |
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| JP2008105906A (ja) * | 2006-10-26 | 2008-05-08 | Sony Corp | 単層カーボンナノチューブヘテロ接合およびその製造方法ならびに半導体素子およびその製造方法 |
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| JP2011040756A (ja) * | 2009-08-14 | 2011-02-24 | Qinghua Univ | 薄膜トランジスタ |
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Also Published As
| Publication number | Publication date |
|---|---|
| US20180337338A1 (en) | 2018-11-22 |
| CN108946658B (zh) | 2020-03-17 |
| JP6837016B2 (ja) | 2021-03-03 |
| US10418557B2 (en) | 2019-09-17 |
| CN108946658A (zh) | 2018-12-07 |
| TW201900549A (zh) | 2019-01-01 |
| TWI703085B (zh) | 2020-09-01 |
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