JP2018163072A - 光コネクタ端面検査装置とその合焦画像データ取得方法 - Google Patents
光コネクタ端面検査装置とその合焦画像データ取得方法 Download PDFInfo
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- JP2018163072A JP2018163072A JP2017060985A JP2017060985A JP2018163072A JP 2018163072 A JP2018163072 A JP 2018163072A JP 2017060985 A JP2017060985 A JP 2017060985A JP 2017060985 A JP2017060985 A JP 2017060985A JP 2018163072 A JP2018163072 A JP 2018163072A
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- face
- end surface
- image data
- optical connector
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/571—Depth or shape recovery from multiple images from focus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10148—Varying focus
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10152—Varying illumination
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
2 光学系
3 イメージセンサ
5 焦点検出部
21 レンズ
22 ハーフミラー
23 照明用LED(光源)
24 スリット板
24a スリット
25 光源調整モータ
26 光源軸補正素子
28 焦点調整モータ
Claims (5)
- 所定の位置に固定された部材の端面の像をイメージセンサ(3)の位置に結像させる光学系(2)と、前記イメージセンサの出力する画像データを取得し、前記画像データのピントが合っているか否かを判定する焦点検出部(5)と、を備える光コネクタ端面検査装置であって、
前記焦点検出部は、前記端面に照射される照明光の照射方向を変えて、前記端面の明るさに基づいて前記端面が傾斜しているか否かを検出し、前記端面が傾斜していることを検出した場合、前記光学系の焦点距離を所定距離ずつ変えて前記端面の一部に焦点の合った複数の前記画像データを取得し、当該複数の画像データを合成して合焦画像データを取得する光コネクタ端面検査装置。 - 前記光学系は、光源(23)からの照明光の一部のみを通過させるスリット(24a)が設けられたスリット板(24)と、前記スリットを通過した前記照明光の一部の進行する角度を変える光源軸補正素子(26)と、を備え、
前記焦点検出部は、前記スリット板により前記端面に照射される照明光の照射方向を変える請求項1に記載の光コネクタ端面検査装置。 - 前記焦点検出部は、前記端面が傾斜していることを検出した場合、前記端面の傾斜角と傾斜方向に基づいて前記複数の画像データから合成する画素を選択する請求項1または請求項2に記載の光コネクタ端面検査装置。
- 前記焦点検出部は、前記端面の明るさが最も明るいときの前記端面に照射される照明光の照射方向に基づいて前記端面の傾斜方向を検出する請求項3に記載の光コネクタ端面検査装置。
- 所定の位置に固定された部材の端面の像をイメージセンサ(3)の位置に結像させる光学系(2)を備える光コネクタ端面検査装置の合焦画像データ取得方法であって、
前記端面に照射される照明光の照射方向を変えて、前記端面の明るさに基づいて前記端面が傾斜しているか否かを検出するステップと、
前記端面が傾斜していることを検出した場合、前記光学系の焦点距離を所定距離ずつ変えて前記端面の一部に焦点の合った複数の画像データを取得するステップと、
当該複数の画像データを合成して合焦画像データを取得するステップと、を有する光コネクタ端面検査装置の合焦画像データ取得方法。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017060985A JP6530437B2 (ja) | 2017-03-27 | 2017-03-27 | 光コネクタ端面検査装置とその合焦画像データ取得方法 |
| US15/920,920 US10521922B2 (en) | 2017-03-27 | 2018-03-14 | End face inspection device and focused image data acquisition method therefor |
| CN201810217475.4A CN108663370B (zh) | 2017-03-27 | 2018-03-16 | 端面检查装置及其聚焦图像数据获取方法 |
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| JP2017060985A JP6530437B2 (ja) | 2017-03-27 | 2017-03-27 | 光コネクタ端面検査装置とその合焦画像データ取得方法 |
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| Publication Number | Publication Date |
|---|---|
| JP2018163072A true JP2018163072A (ja) | 2018-10-18 |
| JP6530437B2 JP6530437B2 (ja) | 2019-06-12 |
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| US (1) | US10521922B2 (ja) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP6530437B2 (ja) * | 2017-03-27 | 2019-06-12 | アンリツ株式会社 | 光コネクタ端面検査装置とその合焦画像データ取得方法 |
| US12135458B2 (en) | 2020-09-21 | 2024-11-05 | Panduit Corp. | Arrayed visual inspectors for fiber connectors and adapters |
| US12449328B2 (en) * | 2022-01-19 | 2025-10-21 | Panduit Corp. | Apparatus and system for visual inspection of fiber ends and image analysis tool for detecting contamination |
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- 2018-03-16 CN CN201810217475.4A patent/CN108663370B/zh active Active
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Also Published As
| Publication number | Publication date |
|---|---|
| US20180276836A1 (en) | 2018-09-27 |
| US10521922B2 (en) | 2019-12-31 |
| CN108663370B (zh) | 2021-01-29 |
| JP6530437B2 (ja) | 2019-06-12 |
| CN108663370A (zh) | 2018-10-16 |
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