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JP2017508890A - Copper foil, electrical parts including the same, and battery - Google Patents

Copper foil, electrical parts including the same, and battery Download PDF

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JP2017508890A
JP2017508890A JP2016561983A JP2016561983A JP2017508890A JP 2017508890 A JP2017508890 A JP 2017508890A JP 2016561983 A JP2016561983 A JP 2016561983A JP 2016561983 A JP2016561983 A JP 2016561983A JP 2017508890 A JP2017508890 A JP 2017508890A
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copper foil
fine particles
particle layer
copper
fine particle
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チェー,ウン−シル
ボム,ウォン−ジン
ソン,キ−ドク
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Iljin Materials Co Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/04Wires; Strips; Foils
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02Electroplating of selected surface areas
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/58Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/48After-treatment of electroplated surfaces
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0358Resin coated copper [RCC]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0307Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Electrochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Cell Electrode Carriers And Collectors (AREA)
  • Laminated Bodies (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

照度が低いでありながらも接着強度が優秀な銅箔が提案される。提案された銅箔は、少なくとも一つの表面に凹凸が形成されて、表面に微細粒子層が形成された銅箔として、表面の平均高さによる平均線の上に位置する上部微細粒子が平均線の下に位置する下部微細粒子より多い。A copper foil having a low illuminance and excellent adhesive strength is proposed. The proposed copper foil is a copper foil in which irregularities are formed on at least one surface and a fine particle layer is formed on the surface, and the upper fine particles located above the average line according to the average height of the surface are average lines. More than the lower fine particles located below.

Description

本発明は、銅箔、銅箔を含む電気部品及び電池に関するものであり、より詳細には、照度が低いでありながらも接着強度が優秀な銅箔に関するものである。   The present invention relates to a copper foil, an electrical component including the copper foil, and a battery. More specifically, the present invention relates to a copper foil having excellent adhesive strength while having low illuminance.

電子産業で使用されるプリント配線板(printed circuit board)用積層板は、硝子織布(cloth)、クラフト紙、硝子繊維不織布などにフェノール性樹脂、エポキシ樹脂などの熱硬化性樹脂を含浸させて、前記樹脂を半硬化させてプリプレグを準備して、プリプレグの一面または両面に銅箔を積層させて製造される。また、多層プリント配線板は銅付着積層板(copper-clad laminate)の両面に回路を形成させて内層材料を形成して、プリプレグを媒介で銅箔を内層材両面に積層して製造される。   Printed circuit board laminates used in the electronics industry are made by impregnating glass cloth, craft paper, glass fiber nonwoven fabric, etc. with thermosetting resins such as phenolic resins and epoxy resins. The resin is semi-cured to prepare a prepreg, and a copper foil is laminated on one or both sides of the prepreg. The multilayer printed wiring board is manufactured by forming a circuit on both sides of a copper-clad laminate to form an inner layer material, and laminating copper foil on both sides of the inner layer material via a prepreg.

プリプレグの一面または両面に銅箔を積層させる時に材料間の相異さによって接着率が十分ではなくて後工程で銅箔がプリプレグから分離されて製品に不良が発生することがある。よって、銅箔にプリプレグのような樹脂との接着性を高めるための表面処理が遂行される。   When the copper foil is laminated on one side or both sides of the prepreg, the adhesion rate may not be sufficient due to the difference between the materials, and the copper foil may be separated from the prepreg in a later process, resulting in a defect in the product. Therefore, a surface treatment for enhancing the adhesion between the copper foil and a resin such as a prepreg is performed.

プリント配線板の製造に使用される銅箔は、一面に微細な銅粒子を付着させるなどによって凹凸を形成させる粗化処理が行われている。プリプレグなどの樹脂との接合を遂行する場合に、粗化処理された銅箔の凹凸形状が基材樹脂内に埋沒されてアンカー効果(anchoring effect)を提供することによって、銅箔と基材樹脂の密着性が向上する。   A copper foil used for manufacturing a printed wiring board is subjected to a roughening treatment for forming irregularities by attaching fine copper particles to one surface. When performing bonding with a resin such as a prepreg, the uneven shape of the roughened copper foil is embedded in the base resin to provide an anchoring effect. Improved adhesion.

最近にはプリント配線板を内蔵する電子装置の軽薄短小化、高機能化の影響によって、プリント配線板の配線密度に対する要求も毎年高くなっている。製品品質の向上が要求されて、エッチングによって形成される回路の形状も高度化されて、インピーダンスコントロールを完全に行うことができる水準の回路エッチングファクターが要求されるようになった。   Recently, the demand for the wiring density of the printed wiring board has been increasing year by year due to the effects of lighter, thinner and smaller electronic devices incorporating the printed wiring board. The improvement in product quality is required, and the shape of a circuit formed by etching has been improved, and a level of circuit etching factor that enables complete impedance control has been required.

前記のような銅箔の表面処理が遂行されれば、銅箔の表面粗度は高くなって、銅箔と基材樹脂との密着性は向上するが、微細回路に対するエッチング性が低くなることがある。よって、エッチング性を考慮して銅箔の表面粗度を維持しながらも密着性を進めることができる技術に対する開発が要請される。   If the copper foil surface treatment as described above is performed, the surface roughness of the copper foil is increased, and the adhesion between the copper foil and the base resin is improved, but the etching property to the fine circuit is lowered. There is. Therefore, there is a demand for development of a technique that can promote adhesion while maintaining the surface roughness of the copper foil in consideration of etching properties.

本発明は、前記のような問題点を解決するために案出されたものとして、本発明の目的は、照度が低いながらも接着強度が優秀な銅箔を提供することにある。   The present invention has been devised in order to solve the above-mentioned problems, and an object of the present invention is to provide a copper foil having excellent adhesive strength while having low illuminance.

以上のような目的を達成するための本発明の一側面による銅箔は、少なくとも一つの表面に凹凸が形成されて、表面に微細粒子層が形成された銅箔として、表面の平均高さによる平均線の上に位置する上部微細粒子が平均線の下に位置する下部微細粒子より多い。   The copper foil according to one aspect of the present invention for achieving the above object is a copper foil in which irregularities are formed on at least one surface and a fine particle layer is formed on the surface, depending on the average height of the surface. There are more upper fine particles located above the average line than lower fine particles located below the average line.

上部微細粒子の数及び下部微細粒子の数の割合は80:20乃至100:0であることがある。   The ratio of the number of upper fine particles and the number of lower fine particles may be 80:20 to 100: 0.

上部微細粒子は中心点を連結した形状が三角形を形成することができる。   The shape of the upper fine particles connecting the center points can form a triangle.

微細粒子の直径は1乃至3μmであることがある。   The diameter of the fine particles may be 1 to 3 μm.

微細粒子は銅(Cu)、鉄(Fe)、モリブデン(Mo)及びコバルト(Co)のうちで少なくとも一つの金属を含む金属粒子、または銅合金粒子であることができる。   The fine particles may be metal particles containing at least one of copper (Cu), iron (Fe), molybdenum (Mo), and cobalt (Co), or copper alloy particles.

銅箔の剥離強度は、1.28乃至1.33kgf/cmであることがあって、表面粗度Rzは5.2乃至6.5μmであることがあって、表面粗度Rmaxは6.5乃至7.7μmであることがある。   The peel strength of the copper foil may be 1.28 to 1.33 kgf / cm, the surface roughness Rz may be 5.2 to 6.5 μm, and the surface roughness Rmax is 6.5. To 7.7 μm.

本発明の他の側面によれば、絶縁性基材と、及び絶縁性基材の一表面に付着された前記のような銅箔と、を含む電気部品が提案される。   According to another aspect of the present invention, an electrical component is proposed that includes an insulating substrate and the copper foil as described above attached to one surface of the insulating substrate.

本発明のもう一つの側面によれば、前記のような銅箔を含む電池が提供される。   According to another aspect of the present invention, a battery including the copper foil as described above is provided.

本発明のもう一つの側面によれば、少なくとも一つの表面に凹凸が形成された銅箔を準備する段階と、及び凹凸が形成された表面に微細粒子層を形成するが、表面の平均高さによる平均線の上に位置する上部微細粒子が前記平均線の下に位置する下部微細粒子より多いように微細粒子層を形成する段階と、を含む銅箔の表面処理方法が提供される。   According to another aspect of the present invention, a step of preparing a copper foil having irregularities formed on at least one surface, and forming a fine particle layer on the surface having irregularities, the average height of the surface Forming a fine particle layer such that there are more upper fine particles located above the average line than the lower fine particles located below the average line.

微細粒子層を形成する段階は、銅箔を硫酸銅と、硫酸と、及び鉄(Fe)、モリブデン(Mo)及びコバルト(Co)を含む金属と、を含む表面処理液に浸漬して電解して凹凸が形成された表面に微細粒子層を形成して遂行される。   In the step of forming the fine particle layer, the copper foil is immersed in a surface treatment solution containing copper sulfate, sulfuric acid, and a metal containing iron (Fe), molybdenum (Mo), and cobalt (Co) and electrolyzed. This is carried out by forming a fine particle layer on the surface on which the irregularities are formed.

鉄の含量は10乃至30gであることがあって、モリブデンの含量は0.5乃至10gであることがあって、コバルトの含量は1乃至15gであることがある。微細粒子層を形成するための電解めっき工程は、20乃至60A/dmから1乃至5秒の間に遂行されることができる。 The iron content can be 10 to 30 g, the molybdenum content can be 0.5 to 10 g, and the cobalt content can be 1 to 15 g. The electroplating process for forming the fine particle layer can be performed between 20 to 60 A / dm 2 to 1 to 5 seconds.

本発明による銅箔は、照度が低いながらも接着強度が優秀である。よって、微細回路基板形成のためのエッチング性が保障されながらも接着強度が優秀で樹脂などとの密着性が向上して銅箔を利用した製品の製造時に製品信頼性が向上する効果がある。   The copper foil according to the present invention has excellent adhesive strength while having low illuminance. Therefore, while ensuring the etching property for forming the fine circuit board, the adhesive strength is excellent and the adhesiveness with the resin is improved, so that there is an effect of improving the product reliability when manufacturing the product using the copper foil.

本発明の一実施例による銅箔の表面を示した図面である。1 is a view showing a surface of a copper foil according to an embodiment of the present invention. 図1で微細粒子を除いた銅箔の表面を示した図面である。It is drawing which showed the surface of the copper foil except the fine particle in FIG. 図1で銅箔表面の一部を示した図面である。It is drawing which showed a part of copper foil surface in FIG. 実施例1で表面処理された銅箔の表面に対する走査電子顕微鏡(scanning electron microscopy、SEM)イメージである。2 is a scanning electron microscopy (SEM) image of the surface of the copper foil surface-treated in Example 1. FIG. 実施例2の銅箔の表面に対するSEMイメージである。3 is an SEM image of the surface of the copper foil of Example 2. 実施例3の銅箔の表面に対するSEMイメージである。4 is a SEM image of the surface of the copper foil of Example 3. 実施例4の銅箔の表面に対するSEMイメージである。4 is a SEM image of the surface of the copper foil of Example 4. 比較例1の銅箔の表面に対するSEMイメージである。3 is a SEM image for the surface of the copper foil of Comparative Example 1. 比較例2の銅箔の表面に対するSEMイメージである。3 is a SEM image for the surface of a copper foil of Comparative Example 2. 比較例3の銅箔の表面に対するSEMイメージである。4 is a SEM image for the surface of the copper foil of Comparative Example 3.

本発明の一側面による銅箔は、少なくとも一つの表面に凹凸が形成されて、表面に微細粒子層が形成された銅箔として、表面の平均高さによる平均線の上に位置する上部微細粒子が平均線の下に位置する下部微細粒子より多い。   The copper foil according to one aspect of the present invention is an upper fine particle located on an average line according to the average height of the surface, as a copper foil in which irregularities are formed on at least one surface and a fine particle layer is formed on the surface. Are more than the lower fine particles located below the average line.

以下では望ましい具現例らによる銅箔、銅箔を含む電気部品及び電池、及び銅箔の表面処理方法に関してさらに詳しく説明する。   Hereinafter, a copper foil, an electrical component and battery including the copper foil, and a surface treatment method for the copper foil according to preferred embodiments will be described in more detail.

図1は、本発明の一実施例による銅箔の表面を示した図面であり、図2は図1で微細粒子を除いた銅箔の表面を示した図面であり、図3は図1で銅箔表面の一部を示した図面である。本実施例による銅箔は表面に凹凸が形成されて、表面に微細粒子層が形成された銅箔として、表面の平均高さによる平均線の上に位置する上部微細粒子が平均線の下に位置する下部微細粒子より多い。   FIG. 1 is a view showing the surface of a copper foil according to an embodiment of the present invention, FIG. 2 is a view showing the surface of the copper foil excluding fine particles in FIG. 1, and FIG. It is drawing which showed a part of copper foil surface. The copper foil according to the present example is formed with irregularities on the surface, and as the copper foil with the fine particle layer formed on the surface, the upper fine particles located above the average line due to the average height of the surface are below the average line. More than the lower fine particles located.

本発明による銅箔は表面に凹凸が形成されている。銅箔を製造する工程は一般的に製箔工程、すなわち銅箔自体を製造する工程と製造された銅箔の表面を処理する工程で分類される。製箔工程によって製造された銅箔は工程によって相異な値であるが、表面粗度を有する。すなわち、高い照度の場合表面に大きい凹凸を含んで、低い照度の場合表面に小さな凹凸を含む。   The copper foil according to the present invention has irregularities formed on the surface. The process of manufacturing a copper foil is generally classified into a foil manufacturing process, that is, a process of manufacturing the copper foil itself and a process of treating the surface of the manufactured copper foil. Although the copper foil manufactured by the foil making process has a different value depending on the process, it has surface roughness. That is, when the illuminance is high, the surface includes large unevenness, and when the illuminance is low, the surface includes small unevenness.

このような凹凸を含む表面を必要によって多くの表面処理工程を遂行して、以後工程で必要な特性を付与する。例えば、FPCBに使用される場合、または二次電池の陰極集電体で使用される場合、樹脂や活物質などとの密着性を高めるために表面を粗化処理して照度を高めることができるし、他の層への銅粒子の拡散を防止するためにバリア処理することができるし、表面酸化を防止するための防錆処理、または一番最外郭にシランカップリング剤を利用した表面処理で接着力を強化させる表面処理が遂行されることができる。   If necessary, the surface including such irregularities is subjected to a number of surface treatment steps, and necessary characteristics are imparted in the subsequent steps. For example, when used in an FPCB or in a cathode current collector of a secondary battery, the illuminance can be increased by roughening the surface in order to improve adhesion with a resin or an active material. In addition, it can be barrier-treated to prevent copper particles from diffusing into other layers, and it can be rust-prevented to prevent surface oxidation, or surface treatment using a silane coupling agent on the outermost surface. A surface treatment for strengthening the adhesive force can be performed.

このうち、銅箔と樹脂または活物質などとの密着性を高めるためには表面粗度を高めるための粗化処理が遂行されるが、粗化処理としては樹脂または活物質と接触される銅箔の表面に微細粒子層が形成されることができる。   Among these, in order to increase the adhesion between the copper foil and the resin or active material, a roughening treatment is performed to increase the surface roughness. A fine particle layer can be formed on the surface of the foil.

図1を参照すれば、銅箔100は銅箔層110の表面に凹凸120が形成されていて、凹凸120には微細粒子131が微細粒子層130を形成する。図2を共に参照すれば、銅箔210の凹凸220の平均高さによる平均線(m)を基準にして微細粒子を分類することができる。すなわち、平均線(m)上に位置する微細粒子を上部微細粒子であると言って、平均線(m)下に位置する微細粒子を下部微細粒子であると言える。   Referring to FIG. 1, the copper foil 100 has irregularities 120 formed on the surface of the copper foil layer 110, and fine particles 131 form the fine particle layer 130 on the irregularities 120. Referring to FIG. 2 together, fine particles can be classified based on the average line (m) based on the average height of the unevenness 220 of the copper foil 210. That is, it can be said that the fine particles located on the average line (m) are the upper fine particles, and the fine particles located below the average line (m) are the lower fine particles.

本発明による銅箔100は、上部微細粒子が下部微細粒子より多い。上部微細粒子は凹凸120の山部分に位置して、下部微細粒子は凹凸120の谷部分に位置する微細粒子である。本発明の銅箔100のように上部微細粒子が下部微細粒子より多いか、または下部微細粒子がない場合、凹凸120の谷部分に微細粒子が少ないかなくなる。よって、凹凸120の谷部分は空いた空間が生成されて、孔隙率が高くなる。このような空いた空間には、例えば銅箔100が樹脂や活物質と接触する場合、樹脂や活物質が空いた空間に満たされるようになって密着性が向上する。   The copper foil 100 according to the present invention has more upper fine particles than lower fine particles. The upper fine particles are located in the peak portions of the unevenness 120, and the lower fine particles are the fine particles located in the valley portions of the unevenness 120. When the upper fine particles are larger than the lower fine particles or there are no lower fine particles as in the copper foil 100 of the present invention, there are few or no fine particles in the valley portions of the unevenness 120. Therefore, a vacant space is generated in the valley portion of the unevenness 120, and the porosity increases. In such a vacant space, for example, when the copper foil 100 is in contact with a resin or an active material, the resin or the active material is filled with the vacant space, and the adhesion is improved.

銅箔の表面を粗化処理する理由としては、粗化処理によって凹凸現象がさらにひどくなった銅箔の表面が樹脂などに埋沒されてアンカー効果を提供して密着性を向上させるものである。しかし、本発明に他の銅箔の場合にはここに追加して凹凸の山と山との間の谷に微細粒子を少なく発生させて空いた空間を形成して、その上部には微細粒子を形成して、空いた空間に満たされた樹脂がアンカー効果を提供するようになって密着性を向上させるものである。   The reason for roughening the surface of the copper foil is that the surface of the copper foil in which the unevenness phenomenon is further aggravated by the roughening treatment is embedded in a resin or the like to provide an anchor effect to improve adhesion. However, in the case of another copper foil according to the present invention, in addition to this, a small space is generated by generating a small amount of fine particles in the valley between the uneven peaks, and the fine particles are formed on the upper portion thereof. The resin filled in the vacant space provides an anchor effect and improves the adhesion.

これのためには銅箔210の平均線(m)上部に微細粒子が位置して、下の部分には微細粒子が少なく位置して最大限孔隙率を確保することが望ましい。例えば、上部微細粒子の数及び下部微細粒子の数の割合は80:20乃至100:0であることがある。   For this purpose, it is desirable that fine particles are located above the average line (m) of the copper foil 210 and few fine particles are located in the lower part to ensure the maximum porosity. For example, the ratio of the number of upper fine particles and the number of lower fine particles may be 80:20 to 100: 0.

また、アンカー効果を極大化させるために、上部微細粒子は中心線を連結した形状が三角形を形成することができる。図3を参照すれば、凹凸320に3個の上部微細粒子331、332、333が位置しているが、これらの中心線(P、P、P)を連結した中心形状340は三角形である。 Further, in order to maximize the anchor effect, the upper fine particles can form a triangle having a shape in which center lines are connected. Referring to FIG. 3, three upper fine particles 331, 332, and 333 are located on the unevenness 320. A central shape 340 connecting these center lines (P 1 , P 2 , P 3 ) is a triangle. It is.

微細粒子の直径は、1乃至3μmであることがある。微細粒子の直径が小さすぎれば、凹凸の谷部分に侵透して下部微細粒子の割合が高くなることがあって、微細粒子の直径があまり大きくなれば、全体的な凹凸が大きくなって銅箔の表面粗度を高めるようになるのでエッチング性に不利になる。   The diameter of the fine particles may be 1 to 3 μm. If the diameter of the fine particles is too small, the proportion of the lower fine particles may infiltrate into the valleys of the irregularities, and if the diameter of the fine particles is too large, the overall irregularities will increase and the copper will increase. Since the surface roughness of the foil is increased, the etching property is disadvantageous.

微細粒子は銅(Cu)、鉄(Fe)、モリブデン(Mo)及びコバルト(Co)のうちで少なくとも一つの金属を含む金属粒子または銅合金粒子であることができる。   The fine particles may be metal particles or copper alloy particles containing at least one metal among copper (Cu), iron (Fe), molybdenum (Mo), and cobalt (Co).

銅箔の剥離強度は1.28乃至1.33kgf/cmであることがあって、表面粗度Rzは5.2乃至6.5μmであることがあって、表面粗度Rmaxは6.5乃至7.7μmであることがある。本発明による銅箔は、凹凸部分に形成された微細粒子が山部分に偏重されて位置して、表面粗度は低いながらも剥離強度が高くて密着性が向上する。   The peel strength of the copper foil may be 1.28 to 1.33 kgf / cm, the surface roughness Rz may be 5.2 to 6.5 μm, and the surface roughness Rmax is 6.5 to It may be 7.7 μm. In the copper foil according to the present invention, the fine particles formed in the uneven portions are positioned so as to be biased to the peak portions, and the peel strength is high and the adhesion is improved while the surface roughness is low.

本発明の他の側面によれば、絶縁性基材と、及び絶縁性基材の一表面に付着した銅箔と、を含む電気部品が提案される。電気部品に含まれる銅箔は銅箔をエッチングして形成された回路を含む。   According to another aspect of the present invention, an electrical component is proposed that includes an insulating base and a copper foil attached to one surface of the insulating base. The copper foil included in the electrical component includes a circuit formed by etching the copper foil.

このような電気部品では、例えば、TABテープ、プリント配線板(PCB)、軟性プリント配線板(FPC、Flexible PCB)などであるが、必ずこれらに限定されないし、銅箔を絶縁性基材上に付着させて使用するものとして当該技術分野で使用することができるものならすべて可能である。   Examples of such electrical components include TAB tape, printed wiring board (PCB), and flexible printed wiring board (FPC, Flexible PCB). However, the present invention is not limited to these, and a copper foil is formed on an insulating substrate. Anything that can be used in the art as attached and used is possible.

本発明のもう一つの側面によれば、前述した銅箔を含む電池が提供される。銅箔は電池の陰極集電体で使用されることができるが必ずこれらに限定されないし、電池に使用される他の構成要素でも使用されることができる。電池は特別に限定されないし1次電池、2次電池をすべて含んで、リチウムイオン電池、リチウムポリマー電池、リチウム空気電池など銅箔を集電体で使用する電池として当該技術分野で使用することができる電池ならすべて可能である。   According to another aspect of the present invention, a battery including the above-described copper foil is provided. The copper foil can be used in the cathode current collector of the battery, but is not necessarily limited thereto, and can be used in other components used in the battery. The battery is not particularly limited and includes all primary batteries and secondary batteries, and may be used in the art as a battery using a copper foil as a current collector, such as a lithium ion battery, a lithium polymer battery, or a lithium air battery. All possible batteries are possible.

本発明のもう一つの側面によれば、少なくとも一つの表面に凹凸が形成された銅箔を準備する段階と、及び凹凸が形成された表面に微細粒子層を形成するが、表面の平均高さによる平均線の上に位置する上部微細粒子が前記平均線の下に位置する下部微細粒子より多いように微細粒子層を形成する段階と、を含む銅箔の表面処理方法が提供される。   According to another aspect of the present invention, a step of preparing a copper foil having irregularities formed on at least one surface, and forming a fine particle layer on the surface having irregularities, the average height of the surface Forming a fine particle layer such that there are more upper fine particles located above the average line than the lower fine particles located below the average line.

本発明による銅箔の表面処理方法では、銅箔を硫酸銅と、硫酸と、及び鉄(Fe)、モリブデン(Mo)及びコバルト(Co)を含む金属を含む表面処理液に浸漬して電解して表面に凹凸が形成された銅箔の少なくとも一面に微細粒子層を形成する。   In the surface treatment method for copper foil according to the present invention, the copper foil is immersed in a surface treatment solution containing copper sulfate, sulfuric acid, and a metal containing iron (Fe), molybdenum (Mo), and cobalt (Co) for electrolysis. Then, a fine particle layer is formed on at least one surface of the copper foil having an uneven surface.

表面処理液に鉄は10乃至30gで、モリブデンは0.5乃至10gで、コバルトは1乃至15gで含まれる。表面処理液に含まれる金属の含量が小さすぎれば銅合金が充分に形成されなくて上部微細粒子及び下部微細粒子の割合調節が難しくて、金属の含量がとても高ければ微細粒子があまりにも多く形成されて表面粗度が高くなってエッチング性面で不利なことがある。   The surface treatment liquid contains 10 to 30 g of iron, 0.5 to 10 g of molybdenum, and 1 to 15 g of cobalt. If the metal content in the surface treatment solution is too small, the copper alloy is not sufficiently formed, and it is difficult to adjust the ratio of the upper and lower fine particles, and if the metal content is very high, too many fine particles are formed. As a result, the surface roughness becomes high and the etching property may be disadvantageous.

微細粒子層を形成するための電解めっき工程は20乃至60A/dmから1乃至5秒の間に遂行されることができる。 The electroplating process for forming the fine particle layer can be performed between 20 to 60 A / dm 2 to 1 to 5 seconds.

本発明による銅箔は、追加的に表面処理されることができる。例えば、耐熱及び耐化学性処理、クロメイト処理、シランカップリング処理のうちでいずれか一つまたはこれらの組合などを挙げることができるし、どのような表面処理を実施するかは、以後工程によって適切に選択されることができる。   The copper foil according to the invention can additionally be surface treated. For example, any one of heat resistance and chemical resistance treatment, chromate treatment, silane coupling treatment or a combination thereof can be cited, and what kind of surface treatment is performed depends on the subsequent process. Can be selected.

耐熱及び耐化学性処理は、例えば、ニッケル、スズ、亜鉛、クロム、モリブデン及びコバルトなどの金属のうちでいずれか一つまたはこれらの合金をスパッタリングまたは電気メッキ、無電解メッキによって金属箔上に薄膜形成することで実施することができる。コスト面では電気メッキが望ましい。金属イオンの析出を易しくするためにシトラ酸塩(citrate)、酒石酸塩、スルファミン酸などの着火剤を必要量添加することができる。   For heat and chemical resistance treatment, for example, any one of metals such as nickel, tin, zinc, chromium, molybdenum and cobalt or an alloy thereof is sputtered, electroplated or electrolessly plated on a metal foil. It can be implemented by forming. In terms of cost, electroplating is desirable. In order to facilitate the precipitation of metal ions, an igniting agent such as citrate, tartrate or sulfamic acid can be added in a necessary amount.

クロメイト処理としては、6価乃至3価クロムイオンを含む水溶液を利用する。クロメイト処理は単純な浸漬処理であっても可能であるが、望ましくは陰極処理で行う。重クロム酸ナトリウム0.1乃至70g/L、pH1乃至13、浴温度15乃至60℃、電流密度0.1乃至5A/dm、電解時間0.1乃至100秒の条件で行うことが望ましい。重クロム酸ナトリウムの代りにクロム酸または重クロム酸カリウムを利用して行うこともできる。また、クロメイト処理は防錆処理上に実施することが望ましくて、これによって耐湿及び耐熱性をより向上させることができる。 As the chromate treatment, an aqueous solution containing hexavalent to trivalent chromium ions is used. The chromate treatment can be a simple immersion treatment, but is preferably performed by a cathode treatment. It is desirable to carry out under conditions of sodium dichromate 0.1 to 70 g / L, pH 1 to 13, bath temperature 15 to 60 ° C., current density 0.1 to 5 A / dm 2 , and electrolysis time 0.1 to 100 seconds. It can also carry out using chromic acid or potassium dichromate instead of sodium dichromate. Moreover, it is desirable that the chromate treatment is performed on the rust-proofing treatment, whereby the moisture resistance and heat resistance can be further improved.

シランカップリング処理に使用されるシランカップリング剤としては、例えば、3-グリシドキシプロピルトリメトキシシラン、2-(3、4-エポキシシクロヘキシル)エチルトリメトキシシランなどのエポキシ官能性シラン、3-アミノプロピルトリメトキシシラン、N-2-(アミノエチル)-3-アミノプロピルトリメトキシシラン、N-2-(アミノエチル)-3-アミノ−プロピルメチルジメトキシシランなどのアミノ官能性シラン、ビニルシラン、ビニルフェニルトリメトキシシラン、ビニルトリス(2-メトキシエトキシ)シランなどのオレフイン官能性シラン、3-アクリロキシプロピルトリメトキシシランなどのアクリル官能性シラン、3-メタクリロキシプロピルトリメトキシシランなどのメタクリル官能性シラン、3-メルカプトプロピルトリメトキシシランなどのメルカプト官能性シランなどが利用される。これらは単独で利用することもできて、複数混合して利用することもできる。   Examples of the silane coupling agent used for the silane coupling treatment include epoxy-functional silanes such as 3-glycidoxypropyltrimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 3- Amino-functional silanes such as aminopropyltrimethoxysilane, N-2- (aminoethyl) -3-aminopropyltrimethoxysilane, N-2- (aminoethyl) -3-amino-propylmethyldimethoxysilane, vinyl silane, vinyl Olefin functional silanes such as phenyltrimethoxysilane, vinyltris (2-methoxyethoxy) silane, acrylic functional silanes such as 3-acryloxypropyltrimethoxysilane, methacrylic functional silanes such as 3-methacryloxypropyltrimethoxysilane, 3-mercaptopropyltrimethoxy And mercapto-functional silanes such as silane are used. These can be used alone or in combination.

このようなカップリング剤は水などの溶媒に0.1乃至15g/Lの濃度で溶解させて室温乃至70℃の温度で金属箔に塗布するか、または電着吸着させる。これらシランカップリング剤は金属箔表面の防錆処理金属の水酸基と縮合結合することで被膜を形成する。シランカップリング処理後には加熱、紫外線の照査などによって安定的結合を形成する。加熱は100乃至200℃の温度で2乃至60秒乾燥させる。紫外線の照査は200乃至400nm、200乃至2500mJ/cmの範囲で行う。また、シランカップリング処理は銅箔の催外層に行うことが望ましくて、これによって耐湿及び絶縁樹脂組成物層と金属箔との密着性をより向上させることができる。 Such a coupling agent is dissolved in a solvent such as water at a concentration of 0.1 to 15 g / L and applied to a metal foil at a temperature of room temperature to 70 ° C. or electrodeposited. These silane coupling agents form a film by condensation bonding with the hydroxyl group of the rust-preventing metal on the surface of the metal foil. After the silane coupling treatment, a stable bond is formed by heating, ultraviolet light inspection or the like. The heating is performed at a temperature of 100 to 200 ° C. for 2 to 60 seconds. Ultraviolet rays are checked in the range of 200 to 400 nm and 200 to 2500 mJ / cm 2 . The silane coupling treatment is desirably performed on the outer layer of the copper foil, thereby improving the moisture resistance and the adhesion between the insulating resin composition layer and the metal foil.

以下、望ましい実施例を挙げて本発明をさらに詳しく説明するが、本発明がこれに限定されるものではない。   Hereinafter, the present invention will be described in more detail with reference to preferred examples, but the present invention is not limited thereto.

(銅箔の製造)
電解による銅箔を製造するために20L/minで循環可能な3L容量の電解槽システムを利用したし、銅電解液の温度は45℃で一定に維持した。正極は厚さが5mmであって、大きさが10X10cmのDSE(Dimentionally Stable Electrode)極板を使ったし、陰極は正極と同一な大きさ及び厚さを有したチタン極板を使った。
(Manufacture of copper foil)
In order to produce a copper foil by electrolysis, a 3 L capacity electrolytic cell system capable of circulating at 20 L / min was used, and the temperature of the copper electrolyte was kept constant at 45 ° C. The positive electrode used was a DSE (Dimentionally Stable Electrode) electrode plate having a thickness of 5 mm and a size of 10 × 10 cm 2 , and the cathode used was a titanium electrode plate having the same size and thickness as the positive electrode.

Cu+イオンの移動を円滑にさせるために電流密度は、35A/dmでメッキを実施したし、18μm厚さの銅箔を製造した。 Current density in order to facilitate movement of Cu 2 + ions, the plating to was performed at 35A / dm 2, to produce a copper foil of 18μm thickness.

*銅電解液の基本組成は次のようである:
CuSO・5HO:250〜400g/L
SO:80〜150g/L
銅電解液塩素イオン及び添加剤が加えられた。
* The basic composition of copper electrolyte is as follows:
CuSO 4 · 5H 2 O: 250~400g / L
H 2 SO 4 : 80 to 150 g / L
Copper electrolyte chloride ions and additives were added.

(実施例1)
製造された銅箔に次のような銅電解液を利用して電流密度35A/dmで1乃至5秒の間に電解して微細粒子層を形成した。実施例1によって微細粒子層が形成された銅箔の表面に対する走査電子顕微鏡(scanning electron microscopy、SEM)イメージが図4に現われている。
(Example 1)
The manufactured copper foil was electrolyzed at a current density of 35 A / dm 2 for 1 to 5 seconds using the following copper electrolyte to form a fine particle layer. The scanning electron microscopy (SEM) image with respect to the surface of the copper foil in which the fine particle layer was formed by Example 1 appears in FIG.

CuSO・5HO:85g/L
SO:125g/L
Fe:19g/L
Mo:1.1g/L
Co:8g/L
(実施例2)
以下の内容を除いては実施例1と同一に銅箔の表面に電解めっきを遂行して微細粒子層を形成した。微細粒子層が形成された銅箔の表面に対するSEMイメージが図5に現われている。
CuSO 4 · 5H 2 O: 85g / L
H 2 SO 4 : 125 g / L
Fe: 19g / L
Mo: 1.1 g / L
Co: 8g / L
(Example 2)
Except for the following contents, the fine particle layer was formed by performing electrolytic plating on the surface of the copper foil as in Example 1. The SEM image with respect to the surface of the copper foil in which the fine particle layer was formed appears in FIG.

CuSO・5HO:85g/L
SO:125g/L
Fe:25g/L
Mo:1.1g/L
Co:8g/L
(実施例3)
以下の内容を除いては実施例1と同一に銅箔の表面に電解めっきを遂行して微細粒子層を形成した。微細粒子層が形成された銅箔の表面に対するSEMイメージが図6に現われている。
CuSO 4 · 5H 2 O: 85g / L
H 2 SO 4 : 125 g / L
Fe: 25g / L
Mo: 1.1 g / L
Co: 8g / L
Example 3
Except for the following contents, the fine particle layer was formed by performing electrolytic plating on the surface of the copper foil as in Example 1. The SEM image with respect to the surface of the copper foil in which the fine particle layer was formed appears in FIG.

CuSO・5HO:85g/L
SO:125g/L
Fe:19g/L
Mo:0.7g/L
Co:8g/L
(実施例4)
*以下の内容を除いては実施例1と同一に銅箔の表面に電解めっきを遂行して微細粒子層を形成した。微細粒子層が形成された銅箔の表面に対するSEMイメージが図7に現われている。
CuSO 4 · 5H 2 O: 85g / L
H 2 SO 4 : 125 g / L
Fe: 19g / L
Mo: 0.7g / L
Co: 8g / L
Example 4
* Except for the following, a fine particle layer was formed by performing electrolytic plating on the surface of the copper foil in the same manner as in Example 1. The SEM image with respect to the surface of the copper foil in which the fine particle layer was formed appears in FIG.

CuSO・5HO:85g/L
SO:125g/L
Fe:19g/L
Mo:1.1g/L
Co:10g/L
(比較例1)
以下の内容を除いては実施例1と同一に銅箔の表面に電解めっきを遂行して微細粒子層を形成した。微細粒子層が形成された銅箔の表面に対するSEMイメージが図8に現われている。
CuSO 4 · 5H 2 O: 85g / L
H 2 SO 4 : 125 g / L
Fe: 19g / L
Mo: 1.1 g / L
Co: 10g / L
(Comparative Example 1)
Except for the following contents, the fine particle layer was formed by performing electrolytic plating on the surface of the copper foil as in Example 1. An SEM image of the surface of the copper foil on which the fine particle layer is formed appears in FIG.

CuSO・5HO:70g/L
SO:165g/L
Mo:0.57g/L
W:10g/L
(比較例2)
以下の内容を除いては実施例1と同一に銅箔の表面に電解めっきを遂行して微細粒子層を形成した。微細粒子層が形成された銅箔の表面に対するSEMイメージが図9に現われている。
CuSO 4 · 5H 2 O: 70g / L
H 2 SO 4 : 165 g / L
Mo: 0.57g / L
W: 10g / L
(Comparative Example 2)
Except for the following contents, the fine particle layer was formed by performing electrolytic plating on the surface of the copper foil as in Example 1. An SEM image of the surface of the copper foil on which the fine particle layer is formed appears in FIG.

CuSO・5HO:70g/L
SO:165g/L
Mn:1g/L
(比較例3)
以下の内容を除いては実施例1と同一に銅箔の表面に電解めっきを遂行して微細粒子層を形成した。微細粒子層が形成された銅箔の表面に対するSEMイメージが図10に現われている。
CuSO 4 · 5H 2 O: 70g / L
H 2 SO 4 : 165 g / L
Mn: 1g / L
(Comparative Example 3)
Except for the following contents, the fine particle layer was formed by performing electrolytic plating on the surface of the copper foil as in Example 1. The SEM image with respect to the surface of the copper foil in which the fine particle layer was formed appears in FIG.

CuSO・5HO:70g/L
SO:165g/L
Ga:1g/L
実施例1乃至実施例4及び比較例1乃至比較例3の銅箔で表面処理された面の表面粗度(Rz、Rmax)及び剥離強度を測定して表1に示した。表面粗度Rz及びRmaxはJISB0601-1994規格によって測定したし、剥離強度はハロゲンフリープリプレグに用意した試片を10X100mmサイズで付着して210℃で30分間熱間圧着加工を実施して剥離強度測定試片を準備して、用意した試片をU.T.M装備に分当50mmの速度にして測定した。表面粗度は値が低いほど凹凸が小さいことを意味する。
CuSO 4 · 5H 2 O: 70g / L
H 2 SO 4 : 165 g / L
Ga: 1 g / L
The surface roughness (Rz, Rmax) and peel strength of the surface treated with the copper foils of Examples 1 to 4 and Comparative Examples 1 to 3 were measured and shown in Table 1. Surface roughness Rz and Rmax were measured in accordance with JIS B0601-1994 standard, and peel strength was measured by attaching a test piece prepared on a halogen-free prepreg in a size of 10 × 100 mm and performing hot press bonding at 210 ° C. for 30 minutes. Prepare a test piece and replace the prepared test piece with U.S. T.A. The measurement was carried out at a speed of 50 mm for the M equipment. The lower the surface roughness, the smaller the roughness.

Figure 2017508890
図4乃至図7は、本発明による実施例1乃至実施例4の銅箔の表面イメージである。図4を参照すれば、微細粒子が銅箔表面の凹凸の山部分に集中されていることを確認することができる。図5乃至図7も図1と類似に微細粒子が銅箔表面の凹凸山部分に稠密に位置して、谷部分には山部分よりさらに少なく位置することが分かる。
Figure 2017508890
4 to 7 are surface images of the copper foils of Examples 1 to 4 according to the present invention. Referring to FIG. 4, it can be confirmed that the fine particles are concentrated on the uneven peaks of the copper foil surface. 5 to 7 also show that fine particles are densely located in the uneven peak portion on the surface of the copper foil, and are located in the valley portion less than the peak portion, similarly to FIG.

これと比べて比較例1乃至比較例3の銅箔の表面イメージである図8乃至図10では微細粒子が凹凸の山だけでなく、谷部分にもめいめいに位置していることを分かる。比較例1乃至比較例3の銅箔では微細粒子が銅箔の表面全体を覆っているものである。   In comparison, in FIGS. 8 to 10 which are the surface images of the copper foils of Comparative Examples 1 to 3, it can be seen that the fine particles are not only located in the uneven peaks but also in the valleys. In the copper foils of Comparative Examples 1 to 3, fine particles cover the entire surface of the copper foil.

本発明による実施例1乃至実施例4の銅箔表面では凹凸の平均線の上に位置する上部微細粒子が下部微細粒子よりさらにたくさん存在して、下部微細粒子が少なく存在して樹脂や活物質などが谷部分に侵透する可能性が高くて密着性が高いことが予測される。   In the copper foil surfaces of Examples 1 to 4 according to the present invention, there are more upper fine particles located above the average line of unevenness than the lower fine particles, and there are fewer lower fine particles, and the resin or active material Are highly likely to penetrate into the valleys and are expected to have high adhesion.

これによって、表1で分かるように、実施例1の銅箔の表面粗度は比較例1の表面粗度より低いが、剥離強度はさらに高くて以後工程で接触する樹脂や活物質などのような他の物質との密着性が高いことを分かる。特に、同一な表面粗度でもないさらに低い表面粗度を有する実施例1の銅箔が剥離強度が比較例1よりさらに高いという評価結果は実施例1の微細粒子の位置が偏重されて現われた結果で推論することができる。実施例2乃至実施例4の銅箔も表面粗度値の偏差はあるが、比較例1乃至比較例3の表面粗度値より小さいか、または類似であるが、剥離強度はそれぞれ1.30kgf/cm以上で比較例1乃至比較例3の剥離強度より高い値を示している。   Thus, as can be seen in Table 1, the surface roughness of the copper foil of Example 1 is lower than the surface roughness of Comparative Example 1, but the peel strength is even higher, such as a resin or active material that is contacted in the subsequent process. It can be seen that the adhesion to other substances is high. In particular, the evaluation result that the peel strength of the copper foil of Example 1 having a lower surface roughness that is not the same surface roughness is higher than that of Comparative Example 1 appears with the fine particle positions of Example 1 biased. Can be inferred from the results. The copper foils of Examples 2 to 4 also have a deviation in surface roughness values, but are smaller than or similar to the surface roughness values of Comparative Examples 1 to 3, but the peel strength is 1.30 kgf. It is higher than the peel strength of Comparative Examples 1 to 3 at / cm or more.

したがって、本発明による実施例1乃至実施例4の銅箔を使えば、樹脂や活物質などのように製品製造時に他物質との密着性が高くて工程で不良率が低く収率が高くなって、表面粗度が低くてエッチング性が優秀で微細回路パターン形成も可能で製品信頼性が高くなるようになる。
本発明は、前述した実施形態及び添付された図面によって限定されるものではなく、添付された請求範囲によって解釈されなければならない。また、本発明に対して請求範囲に記載した本発明の技術的思想を脱しない範囲内で多様な形態の置き換え、変形及び変更が可能であるということは当該技術分野の通常の知識を有した者に自明であろう。
Therefore, if the copper foils of Examples 1 to 4 according to the present invention are used, the adhesiveness with other substances such as resins and active materials is high at the time of product manufacture, and the defect rate is low and the yield is high in the process. Therefore, the surface roughness is low, the etching property is excellent, the fine circuit pattern can be formed, and the product reliability is increased.
The present invention is not limited by the above-described embodiments and the accompanying drawings, but should be interpreted by the appended claims. In addition, the present invention has ordinary knowledge in the technical field that various forms can be replaced, modified and changed without departing from the technical idea of the present invention described in the claims. It will be obvious to the person.

以上説明したように、本発明による銅箔は、照度が低いながらも接着強度が優秀である。よって、微細回路基板形成のためのエッチング性が保障されながらも接着強度が優秀で樹脂などとの密着性が向上して銅箔を利用した製品の製造時に製品信頼性が向上する効果がある。   As described above, the copper foil according to the present invention has excellent adhesive strength even though the illuminance is low. Therefore, while ensuring the etching property for forming the fine circuit board, the adhesive strength is excellent and the adhesiveness with the resin is improved, so that there is an effect of improving the product reliability when manufacturing the product using the copper foil.

Claims (16)

少なくとも一つの表面に凹凸が形成されて、前記表面に微細粒子層が形成された銅箔として、表面の平均高さによる平均線の上に位置する上部微細粒子が前記平均線の下に位置する下部微細粒子より多い銅箔。   As a copper foil in which irregularities are formed on at least one surface and a fine particle layer is formed on the surface, upper fine particles located above the average line according to the average height of the surface are located below the average line More copper foil than lower fine particles. 前記上部微細粒子の数及び前記下部微細粒子の数の割合は80:20乃至100:0である請求項1に記載の銅箔。   The copper foil according to claim 1, wherein a ratio of the number of the upper fine particles and the number of the lower fine particles is 80:20 to 100: 0. 前記上部微細粒子は中心線を連結した形状が三角形である請求項1に記載の銅箔。   The copper foil according to claim 1, wherein the upper fine particles have a triangular shape in which center lines are connected. 前記微細粒子の直径は1乃至3μmである請求項1に記載の銅箔。   The copper foil according to claim 1, wherein the fine particles have a diameter of 1 to 3 μm. 前記微細粒子は銅(Cu)、鉄(Fe)、モリブデン(Mo)及びコバルト(Co)のうち少なくとも一つの金属を含む金属粒子である請求項1に記載の銅箔。   2. The copper foil according to claim 1, wherein the fine particles are metal particles containing at least one metal of copper (Cu), iron (Fe), molybdenum (Mo), and cobalt (Co). 剥離強度が1.28乃至1.33kgf/cmである請求項1に記載の銅箔。   The copper foil according to claim 1, having a peel strength of 1.28 to 1.33 kgf / cm. 表面粗度Rzは5.2乃至6.5μmである請求項1に記載の銅箔。   2. The copper foil according to claim 1, wherein the surface roughness Rz is 5.2 to 6.5 μm. 表面粗度Rmaxは6.5乃至7.7μmである請求項1に記載の銅箔。   The copper foil according to claim 1, wherein the surface roughness Rmax is 6.5 to 7.7 µm. 絶縁性基材と、
前記絶縁性基材の一表面に付着された前記請求項1乃至請求項8のうちいずれか一つによる銅箔と、を含む電気部品。
An insulating substrate;
An electrical component comprising: a copper foil according to any one of claims 1 to 8 attached to one surface of the insulating substrate.
前記請求項1乃至請求項8のうちいずれか一つによる銅箔を含む電池。   A battery comprising a copper foil according to any one of claims 1 to 8. 少なくとも一つの表面に凹凸が形成された銅箔を準備する段階と、及び
前記凹凸が形成された表面に微細粒子層を形成するが、表面の平均高さによる平均線の上に位置する上部微細粒子が前記平均線の下に位置する下部微細粒子より多いように微細粒子層を形成する段階と、を含む銅箔の表面処理方法。
Preparing a copper foil having at least one surface with irregularities; and forming a fine particle layer on the surface having the irregularities; Forming a fine particle layer so that there are more particles than the lower fine particles located below the average line.
前記微細粒子層を形成する段階は、前記銅箔を硫酸銅と、硫酸と、及び鉄(Fe)、モリブデン(Mo)及びコバルト(Co)を含む金属と、を含む表面処理液に浸漬して電解して前記凹凸が形成された表面に微細粒子層を形成する段階である請求項11に記載の銅箔の表面処理方法。   In the step of forming the fine particle layer, the copper foil is immersed in a surface treatment solution containing copper sulfate, sulfuric acid, and a metal containing iron (Fe), molybdenum (Mo), and cobalt (Co). The copper foil surface treatment method according to claim 11, which is a step of forming a fine particle layer on the surface on which the irregularities are formed by electrolysis. 前記鉄の含量は10乃至30gである請求項12に記載の銅箔の表面処理方法。   The copper foil surface treatment method according to claim 12, wherein the iron content is 10 to 30 g. 前記モリブデンの含量は0.5乃至10gである請求項12に記載の銅箔の表面処理方法。   The copper foil surface treatment method according to claim 12, wherein the molybdenum content is 0.5 to 10 g. 前記コバルトの含量は1乃至15gである請求項12に記載の銅箔の表面処理方法。   The copper foil surface treatment method according to claim 12, wherein the cobalt content is 1 to 15 g. 前記電解は20乃至60A/dmで1乃至5秒の間に遂行されるものである請求項12に記載の銅箔の表面処理方法。 The copper foil surface treatment method according to claim 12, wherein the electrolysis is performed at 20 to 60 A / dm 2 for 1 to 5 seconds.
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