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JP2017146189A - Transmission wavefront measuring method, device and system - Google Patents

Transmission wavefront measuring method, device and system Download PDF

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JP2017146189A
JP2017146189A JP2016027836A JP2016027836A JP2017146189A JP 2017146189 A JP2017146189 A JP 2017146189A JP 2016027836 A JP2016027836 A JP 2016027836A JP 2016027836 A JP2016027836 A JP 2016027836A JP 2017146189 A JP2017146189 A JP 2017146189A
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JP6730659B2 (en
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丸亀 敦
Atsushi Marukame
敦 丸亀
民雄 中島
Tamio Nakajima
民雄 中島
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Abstract

PROBLEM TO BE SOLVED: To provide a transmission wavefront measuring method, a device and a system that can acquire images before and after defocusing to be used for wavefront estimation with compact constitution, and can perform wavefront estimation of desired precision.SOLUTION: A wavefront measuring method of measuring a transmission wavefront based upon at least a first image before defocusing and a second image after defocusing comprises: acquiring the images before and after defocusing as point image responses (PSF_r, PSFd_r) by picking up a point image; calculating point image responses (PSF, PSFd) corresponding to at least a first wavefront (WF) before defocusing and a second wavefront (WFd) after defocusing generated using the estimated wavefronts, respectively; and changing the estimated wavefront WF based upon errors between the calculated point image responses (PSF, PSFd) and the acquired point image responses (PSF_r, PSFd_r).SELECTED DRAWING: Figure 4

Description

本発明はコンパクトな構成で透過波面の歪を計測する技術に関する。   The present invention relates to a technique for measuring distortion of a transmitted wavefront with a compact configuration.

適応光学系には、大気の揺らぎ等の媒体の乱れに起因する透過波面の収差を計測する技術(波面センサ)が不可欠である。特に、衛星等の宇宙飛翔体に搭載される場合、波面センサを限られたスペース内に設置する必要があるために、できるだけコンパクトで設計自由度の高い構成が望ましい。   A technology (wavefront sensor) that measures aberrations of a transmitted wavefront caused by medium disturbance such as atmospheric fluctuations is indispensable for an adaptive optical system. In particular, when mounted on a space vehicle such as a satellite, it is necessary to install the wavefront sensor in a limited space. Therefore, a configuration that is as compact as possible and has a high degree of design freedom is desirable.

波面測定方法としては、Shack-Hartmann(シャックハルトマン)法とCurvature(湾曲)法が知られている。Shack-Hartmann法は、小さなレンズの2次元アレイと各レンズに対応したセンサの配置を必要とするために、ダイナミックレンジは広いが、装置構成が複雑になり、また波面収差を求めるために処理すべきデータ量および計算量も大きくなる。   As wavefront measurement methods, the Shack-Hartmann method and the Curvature method are known. The Shack-Hartmann method requires a two-dimensional array of small lenses and the arrangement of sensors corresponding to each lens, so the dynamic range is wide, but the device configuration is complicated, and processing is performed to determine wavefront aberration. The amount of data to be calculated and the amount of calculation are also increased.

これに対して、Curvature法では、次式(1)に示す2階の偏微分方程式であるITE(Intensity Transport Equation:強度輸送方程式)に境界条件を与えてアナログ的に波面を導出することが可能である。   In contrast, in the Curvature method, it is possible to derive a wavefront in an analog manner by giving a boundary condition to an ITE (Intensity Transport Equation) that is a second-order partial differential equation shown in the following equation (1). It is.

Figure 2017146189


ここで、I(r)は強度(画像の輝度値に反映)、φ(r)は波面のZ方向の位相、r=(x,y)、k=2π/λ、∇=(∂/∂x)+(∂/∂y)、右辺の第1項は法曲(Curvature)、第2項は傾斜(Slope)を表す。この方程式は適切な境界条件が与えられれば、解が一意に決まることが知られている。
Figure 2017146189


Here, I Z (r) is the intensity (reflected in the luminance value of the image), φ Z (r) is the phase of the wavefront in the Z direction, r = (x, y), k = 2π / λ, ∇ = (∂ / ∂x) + (∂ / ∂y), the first term on the right side represents the Curvature, and the second term represents the slope. It is known that the solution is uniquely determined if appropriate boundary conditions are given.

境界条件は、非特許文献1に記載されているように、Phase Diversity(位相ダイバーシティ)法により、光軸方向に異なる2か所で強度値を測定することにより取得される。たとえば、Phase Diversity法におけるビームスプリッタを用いた方式では、ビームスプリッタで波面を2つに分離し、一方を合焦する面で画像を取得し、もう一方を合焦する面から光軸方向(z軸相当方向)に既知の量だけずらした焦点はずし面で画像を取得することにより、光軸方向に異なる2か所の画像を取得することができる。また、光軸方向に位置がずれた2つの光学センサをスキャンする方式では、光学センサをスキャン方向に2つ並べ、そのうち一つを光軸方向に既知の量だけ「浮かせて」取り付け、これらの光学センサをスキャンすることにより光軸方向に異なる2か所の画像を取得することができる。   As described in Non-Patent Document 1, the boundary condition is acquired by measuring intensity values at two different points in the optical axis direction by the Phase Diversity method. For example, in the method using the beam splitter in the Phase Diversity method, the wavefront is separated into two by the beam splitter, an image is acquired on the surface that focuses one, and the optical axis direction (z By acquiring an image with a defocus plane shifted by a known amount in the direction corresponding to the axis), two different images in the optical axis direction can be acquired. In addition, in the method of scanning two optical sensors whose positions are shifted in the optical axis direction, two optical sensors are arranged in the scanning direction, and one of them is “float” attached by a known amount in the optical axis direction. By scanning the optical sensor, two different images in the optical axis direction can be acquired.

上述したITEを解くための境界条件を得る際に重要なことは、光軸方向に異なる2か所の画像の元となるオリジナル画像が全く同一であること、すなわち同時刻の画像であることである。簡単に説明すると、g(x)を取得画像、f(x)をオリジナル画像、s(x)を光学系の点像応答あるいは点拡がり関数(PSF:Point Spread Function)とすると、光学センサにより取得される画像g(x)は次式(2)により表される。
g(x)=f(x)*s(x) ・・・(2)
ここで演算*は畳み込みを示す。
What is important when obtaining the boundary conditions for solving the above-mentioned ITE is that the original images that are the basis of two different images in the optical axis direction are exactly the same, that is, the images at the same time. is there. Briefly, g (x) is the acquired image, f (x) is the original image, and s (x) is the point spread response or point spread function (PSF) of the optical system. The image g (x) to be displayed is expressed by the following equation (2).
g (x) = f (x) * s (x) (2)
Here, the operation * indicates convolution.

式(2)をフーリエ変換すると、畳み込みは対応成分同士の積となり、次式(3)を得る。
G(u)=F(u)S(u) ・・・(3)
ここで、S(u)は光学系の光学伝達関数(OTF:Optical Transfer Function)である。
When the equation (2) is Fourier transformed, the convolution is a product of the corresponding components, and the following equation (3) is obtained.
G (u) = F (u) S (u) (3)
Here, S (u) is an optical transfer function (OTF) of the optical system.

焦点面を所定距離だけはずした画像をgd(x)=f(x)*sd(x)とし、同様にフーリエ変換すると、次式(4)を得る。
Gd(u)=F(u)Sd(u) ・・・(4)
An image obtained by removing the focal plane by a predetermined distance is set as gd (x) = f (x) * sd (x), and when Fourier transform is performed in the same manner, the following expression (4) is obtained.
Gd (u) = F (u) Sd (u) (4)

結果的に、式(3)および式(4)の2つの式と、3つの未知数:S(u)、Sd(u)、F(u)となるが、S(u)とSd(u)とは焦点ずれ成分のみが異なる関係にあるので、式が1つ増えて3つとなる。したがって、光軸方向に異なる2か所の画像g(x)およびgd(x)の元となるオリジナル画像f(x)が全く同一であれば、上記式を解くことができる。なお、上述したビームスプリッタを用いた方式では、厳密に同時刻のオリジナル画像から合焦画像g(x)および焦点はずれ画像gd(x)を取得できるが、2つの光学センサをスキャンする方式では、各光学センサにより取得される画像は厳密な意味では同時刻ではないが、その差は極めて小さいため、実質的には同時刻の画像として扱うことができる。   As a result, two formulas of formula (3) and formula (4) and three unknowns: S (u), Sd (u), and F (u), but S (u) and Sd (u) Since there is a relationship that differs only in the defocus component, the number of expressions increases by one to three. Therefore, if the original images f (x) that are the basis of two images g (x) and gd (x) that are different in the optical axis direction are exactly the same, the above equation can be solved. In the method using the beam splitter described above, the focused image g (x) and the out-of-focus image gd (x) can be acquired from the original image at exactly the same time, but in the method of scanning two optical sensors, Although the images acquired by the respective optical sensors are not at the same time in a strict sense, the difference is extremely small, so that the images can be handled substantially as images at the same time.

このように、Curvature法は、光学センサにより直接取得される画像を利用するので、結像光学系の光センサを利用することができ、ダイナミックレンジは小さいが、Shack-Hartmann法のような新たな装置の追加が不要となって装置構成が単純となる。さらに、光学センサの取得画像を利用してITEを解くので、原理的には画角内の任意の場所の波面を計測でき、処理すべきデータ量および計算量が小さくなる、という利点もある。   In this way, the Curvature method uses an image directly acquired by an optical sensor, so that an optical sensor of an imaging optical system can be used, and the dynamic range is small, but a new one like the Shack-Hartmann method is used. It is not necessary to add a device, and the device configuration is simplified. Furthermore, since the ITE is solved using the image acquired by the optical sensor, in principle, the wavefront at an arbitrary position within the angle of view can be measured, and there is an advantage that the amount of data to be processed and the amount of calculation are reduced.

R. L. Kendrick, D. S. Acton and A.L. Duncan, “Phase-diversity wave-front sensor for imaging systems”, APPLIED OPTICS, Vol.33, No.27, Sept., 1994.R. L. Kendrick, D. S. Acton and A.L. Duncan, “Phase-diversity wave-front sensor for imaging systems”, APPLIED OPTICS, Vol. 33, No. 27, Sept., 1994.

しかしながら、上述したビームスプリッタを用いた方式では、同一のオリジナル画像から合焦画像および焦点はずし画像を取得できるが、結像面手前にビームスプリッタを配置する必要があるために、ビームスプリッタ(ガラス)による収差を無視できない。この収差を回避するために、実際には、通常撮像時はビームスプリッタを光束の外に出す機構が必要となり、さらに2つの光学センサを配置するスペースを確保する必要もあるために、コンパクト化が困難となり構成も複雑化する。   However, in the method using the beam splitter described above, a focused image and a defocused image can be acquired from the same original image. However, since it is necessary to arrange the beam splitter in front of the imaging surface, the beam splitter (glass) The aberration due to cannot be ignored. In order to avoid this aberration, in reality, it is necessary to provide a mechanism for bringing the beam splitter out of the light beam during normal imaging, and it is necessary to secure a space for arranging two optical sensors. It becomes difficult and the configuration becomes complicated.

また、上述した2つの光学センサをスキャンする方式では、厳密な意味で同じオリジナル画像に基づいておらず、また2つの光学センサをスキャン方向に併置するスペースを必要とするためにコンパクト化が困難である。さらに、2つの光学センサを併置する構成が実現困難な場合がある。たとえば、光検出面に必要な観測幅を確保するために光学センサをスタガ配列している場合、複数の波長を観測するために複数の光学センサをスキャン方向に配置している場合などである。   Further, the above-described method of scanning the two optical sensors is not based on the same original image in a strict sense, and requires a space for juxtaposing the two optical sensors in the scanning direction, so that it is difficult to reduce the size. is there. Furthermore, it may be difficult to realize a configuration in which two optical sensors are juxtaposed. For example, there are a case where optical sensors are staggered in order to secure a necessary observation width on the light detection surface, and a case where a plurality of optical sensors are arranged in the scanning direction in order to observe a plurality of wavelengths.

そこで、本発明の目的は、波面推定に用いる焦点はずし前後の画像をコンパクトな構成で取得でき、所望精度の波面推定が可能な波面測定方法、装置およびシステムを提供することにある。   SUMMARY OF THE INVENTION An object of the present invention is to provide a wavefront measuring method, apparatus, and system that can acquire images before and after defocusing used for wavefront estimation with a compact configuration and that can perform wavefront estimation with desired accuracy.

本発明による波面測定方法は、少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定方法であって、a)点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得し、b)推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算し、c)前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する、ことを特徴とする。
本発明による波面測定装置は、少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定装置であって、点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得する点像応答取得手段と、推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算する計算手段と、前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する評価手段と、を有することを特徴とする。
本発明による波面測定システムは、少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定システムであって、結像光学系と、前記結像光学系の焦点調整手段と、前記結像光学系の焦点面に設けられた光学センサと、を有する光学装置と、前記焦点調整手段を制御することで前記焦点はずしを実行し、前記光学センサにより点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得する点像応答取得手段と、推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算する計算手段と、前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する評価手段と、を有することを特徴とする。
A wavefront measuring method according to the present invention is a wavefront measuring method for measuring a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing, and a) imaging a point image to First and second images are acquired as point image responses, respectively, and b) point images corresponding to at least the first wavefront before defocusing and the second wavefront after defocusing generated using the estimated wavefront, respectively. A response is calculated, and c) changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response.
A wavefront measuring apparatus according to the present invention is a wavefront measuring apparatus that measures a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing, and captures the first image by capturing a point image. And point image response acquisition means for acquiring the second image as a point image response, respectively, and at least the first wavefront before defocusing and the second wavefront after defocusing generated using the estimated wavefront, respectively. Computation means for calculating a point image response; and evaluation means for changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response. .
A wavefront measurement system according to the present invention is a wavefront measurement system that measures a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing, the imaging optical system, and the imaging optical An optical device having a focus adjusting unit of the system and an optical sensor provided on a focal plane of the imaging optical system, and performing the defocusing by controlling the focus adjusting unit. Point image response acquisition means for acquiring the first and second images as point image responses by capturing images, and at least the first wavefront before defocusing and after defocusing generated using the estimated wavefront Calculating means for calculating a point image response corresponding to each of the second wavefront, and evaluating means for changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response , Characterized by having a.

本発明によれば、波面推定に用いる焦点はずし前後の画像をコンパクトな構成で取得でき、所望精度の波面推定が可能となる。   According to the present invention, images before and after defocusing used for wavefront estimation can be acquired with a compact configuration, and wavefront estimation with desired accuracy can be performed.

図1は本発明の第1実施形態による波面測定システムの概略的構成を示すブロック図である。FIG. 1 is a block diagram showing a schematic configuration of a wavefront measuring system according to a first embodiment of the present invention. 図2は第1実施形態における2つの焦点面が異なる画像を取得する方法を説明するための模式的な光学系の構成図である。FIG. 2 is a schematic configuration diagram of an optical system for explaining a method for acquiring images having two different focal planes in the first embodiment. 図3は第1実施形態による波面測定装置の構成の一例を示すブロック図である。FIG. 3 is a block diagram showing an example of the configuration of the wavefront measuring apparatus according to the first embodiment. 図4は第1実施形態による波面測定方法の機能構成を示す図である。FIG. 4 is a diagram showing a functional configuration of the wavefront measuring method according to the first embodiment. 図5は第1実施形態による波面測定方法における実際の点像応答データ取得手順を示すフローチャートである。FIG. 5 is a flowchart showing an actual point image response data acquisition procedure in the wavefront measuring method according to the first embodiment. 図6は第1実施形態による波面測定方法における最適解の探索手順を示すフローチャートである。FIG. 6 is a flowchart showing a procedure for searching for an optimum solution in the wavefront measuring method according to the first embodiment. 図7は本発明の第2実施形態による波面測定システムの概略的構成を示すブロック図である。FIG. 7 is a block diagram showing a schematic configuration of a wavefront measuring system according to the second embodiment of the present invention. 図8は本発明の各実施形態による波面測定装置の第1適用例である結像光学系を示す構成図である。FIG. 8 is a configuration diagram showing an imaging optical system which is a first application example of the wavefront measuring apparatus according to each embodiment of the present invention. 図9は本発明の各実施形態による波面測定装置の第2適用例である光学式望遠鏡の一例を示す構成図である。FIG. 9 is a block diagram showing an example of an optical telescope which is a second application example of the wavefront measuring apparatus according to each embodiment of the present invention. 図10は本発明の各実施形態による波面測定装置の第3適用例である光学式望遠鏡の他の例を示す構成図である。FIG. 10 is a block diagram showing another example of an optical telescope as a third application example of the wavefront measuring apparatus according to each embodiment of the present invention. 図11は上記実施形態で使用される焦点調整機構の一構成例を示す側面断面図である。FIG. 11 is a side sectional view showing a configuration example of the focus adjustment mechanism used in the embodiment.

<実施形態の概要>
本発明の実施形態によれば、波面推定に用いる合焦画像および焦点はずし画像を点像応答として取得し、推定された点像応答と実測された点像応答とを比較することで推定波面を調整する。元画像は「点」であるから、画像取得時刻差にともなう画像の差異を無視することができる。また、結像光学系の焦点調整機構および光学センサを利用できるので、特別な装置を付加することなく、一つの光学センサを用いて合焦点像と焦点はずし点像とを取得でき、装置のコンパクト化が可能となる。
<Outline of Embodiment>
According to the embodiment of the present invention, a focused image and a defocused image used for wavefront estimation are acquired as point image responses, and the estimated wavefront is calculated by comparing the estimated point image response with the actually measured point image response. adjust. Since the original image is a “point”, it is possible to ignore the difference in image due to the difference in image acquisition time. In addition, since the focus adjustment mechanism and optical sensor of the imaging optical system can be used, it is possible to obtain a focused image and a defocused point image using a single optical sensor without adding a special device. Can be realized.

以下、本発明の実施形態について詳細に説明するが、下記の実施形態で用いられる波面の表現方法であるZernike(ゼルニケ)多項式による展開(以下、Zernike展開という。)について簡単に説明する。   In the following, embodiments of the present invention will be described in detail. However, a Zernike polynomial expansion (hereinafter referred to as Zernike expansion), which is a wavefront expression method used in the following embodiments, will be briefly described.

<Zernike展開>
上述した式(1)で表されるITEは2階の偏微分方程式であるため、単純に解析解を求めることができないために、近似解として波面を計算する方法がいくつか提案されている。その中でも、直交系であるZernike多項式によりITEの解を表現する手法が多く用いられている。その理由は、Zernike多項式における各次元の項が歪、焦点ずれ等の物理的特性を反映しているために応用上取扱いやすいからである。
<Zernike deployment>
Since the ITE represented by the above-described equation (1) is a second-order partial differential equation, an analytical solution cannot be simply obtained, and several methods for calculating a wavefront as an approximate solution have been proposed. Among them, a method of expressing an ITE solution by a Zernike polynomial that is an orthogonal system is often used. The reason is that the terms of each dimension in the Zernike polynomial reflect physical characteristics such as distortion and defocus, and are easy to handle in application.

光線が通過する座標(x, y)を極座標変換(x, y)=(ρcosθ, ρsinθ)により極座標(ρ, θ)に変換すると、光学系の波面収差W(ρ, θ)は、Zernike多項式により次式(5)で表される。   When the coordinates (x, y) through which the light beam passes are converted into polar coordinates (ρ, θ) by polar coordinate conversion (x, y) = (ρcosθ, ρsinθ), the wavefront aberration W (ρ, θ) of the optical system is expressed as a Zernike polynomial. Is expressed by the following equation (5).

Figure 2017146189
Figure 2017146189

ここで、ρは動径(0≦ρ≦1)、θは偏角、nは動径方向(radial direction)ρに関する次元で0以上の整数、mは方位方向(azimuthal direction)θに関する次元で0以上の整数(ただし、n≧m)、An,mはZernike係数、R (ρ)cos|m|θおよびR (ρ)sin|m|θはZernike基底関数である。R (ρ)はnとmの2次元表記であるが、これをNollの指標jに置き換え、(n, m)=(0, 0)をj=1、(n, m)=(1, 1)をj=2、(n, m)=(1, -1)をj=3、(n, m)=(2, 0)をj=4、・・・というように1次元表記にする。以下、簡単のため、Noll指標でZernike係数の指標を表すと、Zernike多項式の低次元の各項は次の物理的特性を反映する。 Here, ρ is a radial dimension (0 ≦ ρ ≦ 1), θ is a declination, n is a dimension related to radial direction ρ, and is an integer greater than or equal to 0, and m is a dimension related to azimuthal direction θ. An integer greater than or equal to 0 (where n ≧ m), A n, m is a Zernike coefficient, R m n (ρ) cos | m | θ and R m n (ρ) sin | m | θ are Zernike basis functions. R m n (ρ) is a two-dimensional notation of n and m, but this is replaced with a Noll index j, and (n, m) = (0, 0) is replaced by j = 1, (n, m) = ( 1, 1) is j = 2, (n, m) = (1, -1) is j = 3, (n, m) = (2, 0) is j = 4, etc. Use the notation. Hereinafter, for simplicity, when the index of the Zernike coefficient is represented by the Noll index, each low-dimensional term of the Zernike polynomial reflects the following physical characteristics.

j=1 定数項(piston)
j=2 x方向の傾き(x-tilt)
j=3 y方向の傾き(y-tilt)
j=4 フォーカスずれ(defocus)
j=5 ±45度方向の非点収差(oblique astigmatism)
j=6 90度方向の非点収差(vertical astigmatism)
j=7 y方向のコマ(vertical coma)
j=8 x方向のコマ(horizontal coma)
j = 1 Constant term (piston)
j = 2 x-tilt
j = 3 y-tilt
j = 4 Defocus
j = 5 astigmatism in ± 45 degrees direction (oblique astigmatism)
j = 6 90 degree astigmatism (vertical astigmatism)
j = 7 y-direction frame (vertical coma)
j = 8 x coma (horizontal coma)

後述するように、本発明の実施形態では、焦点ずれを表す第4項(j=4)を利用する。Phase Diversity法ではフォーカス以外はすべて同じ条件であることが前提であるから、合焦の波面収差と焦点ずれの波面収差のZernike多項式展開はj=4のZernike係数のみが異なることがわかる。つまり、式(3)のS(u)と式(4)のSd(u)との差は、Zernike係数の第4項の差になる。このように、波面をZernike多項式で表すと数式処理が単純化されるので、以下に述べる実施形態では、波面収差をNoll指標によるZernike多項式で表すものとする。   As will be described later, in the embodiment of the present invention, the fourth term (j = 4) representing defocus is used. In the Phase Diversity method, it is assumed that all conditions except for the focus are the same, and it can be seen that the Zernike polynomial expansion of the focused wavefront aberration and the defocused wavefront aberration differs only in the Zernike coefficient of j = 4. That is, the difference between S (u) in equation (3) and Sd (u) in equation (4) is the difference in the fourth term of the Zernike coefficient. As described above, when the wavefront is represented by a Zernike polynomial, mathematical processing is simplified. In the embodiment described below, the wavefront aberration is represented by a Zernike polynomial using a Noll index.

1.第1実施形態
本発明の第1実施形態による波面測定装置は、光学装置を構成する結像光学系と光学センサとを利用し、光学センサにより取得された合焦状態と焦点はずし状態の点像データを用いて推定波面のZernike係数を調整することにより、コンパクトな構成で所望精度の波面測定が可能となる。
1. First Embodiment A wavefront measuring apparatus according to a first embodiment of the present invention uses an imaging optical system and an optical sensor that constitute an optical apparatus, and a point image in a focused state and a defocused state acquired by the optical sensor. By adjusting the Zernike coefficient of the estimated wavefront using the data, it is possible to perform wavefront measurement with desired accuracy with a compact configuration.

1.1)システム構成
図1に示すように、本実施形態によるシステムで利用される光学装置10は、結像光学系11と、光学センサ12と、結像光学系11の焦点調整機構13と、を有するものとする。焦点調整機構13は、光学センサ12の受光面を焦点面12aとして、所定の焦点はずし距離dfが得られるように結像光学系11を駆動する機構であればよく、駆動方法は問わない。焦点調整機構13は焦点制御系20および制御部30により制御される。
1.1) System Configuration As shown in FIG. 1, the optical apparatus 10 used in the system according to the present embodiment includes an imaging optical system 11, an optical sensor 12, and a focus adjustment mechanism 13 of the imaging optical system 11. . The focus adjusting mechanism 13 may be any mechanism that drives the imaging optical system 11 so that a predetermined defocusing distance df is obtained with the light receiving surface of the optical sensor 12 as the focal plane 12a, and the driving method is not limited. The focus adjustment mechanism 13 is controlled by the focus control system 20 and the control unit 30.

波面測定部100は、光学センサ12から撮像データを取得し、取得データに基づいて後述する波面測定のための焦点はずし動作および波面計算を実行する。波面測定部100は制御部30および焦点制御系20を通して焦点調整機構13を制御してもよいが、波面測定の焦点はずし動作のために、焦点制御系20を通して焦点調整機構13を直接制御してもよい。   The wavefront measuring unit 100 acquires imaging data from the optical sensor 12, and executes a defocusing operation and wavefront calculation for wavefront measurement described later based on the acquired data. The wavefront measurement unit 100 may control the focus adjustment mechanism 13 through the control unit 30 and the focus control system 20, but directly controls the focus adjustment mechanism 13 through the focus control system 20 for defocusing operation of the wavefront measurement. Also good.

本実施形態において、結像光学系11により焦点面12a上に形成される画像は点像であり、波面測定部100は点像データを用いて波面測定を行う。点像は、星、夜間都市等を被写体にしたり、凸面鏡からの反射光を利用したりすることで容易に取得できる。ただし、上述したように、大気の揺らぎ等の媒体の乱れに起因して透過波面に歪が生じている。本実施形態による波面測定部100は、上述したPhase Diversity法に従って、光学センサ12により取得された合焦状態と焦点はずし状態の点像データを用いて、計算により推定した透過波面を検証し、推定点像応答と実測点像応答との誤差を縮小するように係数を調整する。焦点はずし点像を形成する方法の一例を図2に示す。   In the present embodiment, the image formed on the focal plane 12a by the imaging optical system 11 is a point image, and the wavefront measuring unit 100 performs wavefront measurement using the point image data. A point image can be easily obtained by using a star, a night city, or the like as a subject, or using reflected light from a convex mirror. However, as described above, the transmitted wavefront is distorted due to the disturbance of the medium such as atmospheric fluctuation. The wavefront measuring unit 100 according to the present embodiment verifies the transmission wavefront estimated by calculation using the point image data of the in-focus state and the defocused state acquired by the optical sensor 12 according to the above-described Phase Diversity method. The coefficient is adjusted so as to reduce the error between the point image response and the measured point image response. An example of a method for forming a defocus point image is shown in FIG.

図2において、結像光学系11内の反射鏡11bが初期位置にある場合、透過波面14は反射鏡11bで反射して光学センサ12の焦点面12aに合焦点像12fを形成する。この合焦点像12fを光学センサ12により撮像する。続いて、反射鏡11bを光軸に沿ったZ方向に移動させると、透過波面14は移動後の反射鏡11bで反射して光学センサ12の焦点面12aに焦点はずれ点像12dfを形成する。この焦点はずれ点像12dfを光学センサ12により撮像する。こうして、波面を推定するための合焦点像12fと焦点はずし点像12dfとを取得することができる。   In FIG. 2, when the reflecting mirror 11 b in the imaging optical system 11 is at the initial position, the transmitted wavefront 14 is reflected by the reflecting mirror 11 b to form a focused image 12 f on the focal plane 12 a of the optical sensor 12. The focused image 12f is picked up by the optical sensor 12. Subsequently, when the reflecting mirror 11b is moved in the Z direction along the optical axis, the transmitted wavefront 14 is reflected by the moving reflecting mirror 11b and forms a defocus point image 12df on the focal plane 12a of the optical sensor 12. This defocus point image 12 df is picked up by the optical sensor 12. Thus, the focused image 12f and the defocused point image 12df for estimating the wavefront can be acquired.

図3に示すように、波面測定部100は、計算により波面を推定する推定部と、合焦点像および焦点はずし点像を取得する実測部とを含み、推定部は透過波面計算部101、点像応答解析部102、誤差評価部103およびZernike係数更正部104からなり、実測部は光学センサ点像データメモリ105および点像応答生成部106からなる。   As shown in FIG. 3, the wavefront measuring unit 100 includes an estimating unit that estimates a wavefront by calculation, and an actual measuring unit that acquires a focused image and a defocused point image. The estimating unit includes a transmitted wavefront calculating unit 101, a point The image response analysis unit 102, the error evaluation unit 103, and the Zernike coefficient correction unit 104 are included. The actual measurement unit includes an optical sensor point image data memory 105 and a point image response generation unit 106.

透過波面計算部101は、初期値あるいは変更されたZernike係数に従ってZernike展開を実行する。初期値は、たとえば地上で測定した透過波面などを用いて、軌道上での推定透過波面である。透過波面計算部101では、焦点はずし前(合焦状態)の推定波面WFと焦点はずし後の推定波面WFdとを計算するが、焦点はずしは、上述したようにZernike多項式の第4項(j=4;焦点ずれを表すZernike係数)のみを所定値だけ変更することにより計算上実現することができる。この第4項係数の変更量は、図1および図2に示す焦点ずらし距離dfに対応する。点像応答解析部102は、推定波面WFおよび焦点はずし後の推定波面WFdにそれぞれ対応する合焦位置の点像応答および焦点ずらし点像応答を誤差評価部103へ出力する。   The transmitted wavefront calculation unit 101 executes Zernike expansion according to the initial value or the changed Zernike coefficient. The initial value is an estimated transmitted wavefront on the orbit using, for example, a transmitted wavefront measured on the ground. The transmitted wavefront calculation unit 101 calculates an estimated wavefront WF before defocusing (in-focus state) and an estimated wavefront WFd after defocusing. The defocusing is performed by using the fourth term (j = j = Zernike polynomial) as described above. 4; Zernike coefficient representing defocus can be changed by a predetermined value and can be realized by calculation. The change amount of the fourth term coefficient corresponds to the defocus distance df shown in FIGS. The point image response analysis unit 102 outputs the point image response and the defocused point image response at the in-focus position respectively corresponding to the estimated wavefront WF and the defocused estimated wavefront WFd to the error evaluation unit 103.

光学センサ点像データメモリ105には、図1および図2で説明したように、合焦点像12fおよび焦点はずし点像12dfにそれぞれ対応する点像データが格納され、点像応答生成部106は、各点像データをリサンプリングすることで、実測された合焦点像応答および焦点はずし点像応答を誤差評価部103へ出力する。   As described with reference to FIGS. 1 and 2, the optical sensor point image data memory 105 stores point image data corresponding to the focused image 12f and the defocused point image 12df, respectively. By re-sampling each point image data, the measured focused image response and defocused point image response are output to the error evaluation unit 103.

誤差評価部103は、推定された合焦および焦点ずらし点像応答と実測された合焦および焦点ずらし点像応答との誤差を評価し、その評価結果をZernike係数更正部104へ出力する。Zernike係数更正部104は、評価結果に従って、誤差が小さくなるように透過波面計算部101に対してZernike係数の変更を指示する。このZernike係数の変更とその評価を繰り返すことで評価結果が所定の精度に到達すると、そのときの透過波面計算部101のZernike展開の結果(Zernike係数)が最終的な透過波面として出力される。   The error evaluation unit 103 evaluates an error between the estimated focus and defocus point image response and the actually measured focus and defocus point image response, and outputs the evaluation result to the Zernike coefficient correction unit 104. The Zernike coefficient correction unit 104 instructs the transmitted wavefront calculation unit 101 to change the Zernike coefficient so that the error is reduced according to the evaluation result. When the evaluation result reaches a predetermined accuracy by repeating the change of the Zernike coefficient and its evaluation, the result of the Zernike expansion (Zernike coefficient) of the transmitted wavefront calculation unit 101 at that time is output as the final transmitted wavefront.

1.2)波面推定動作
以下、波面測定部100の動作を図4〜図6を参照しながら説明する。なお、波面測定部100には、地上での測定透過波面などを用いた軌道上の想定透過波面が初期値として予め記憶されているものとする。
1.2) Wavefront Estimation Operation Hereinafter, the operation of the wavefront measurement unit 100 will be described with reference to FIGS. It is assumed that the wavefront measuring unit 100 stores in advance an assumed transmitted wavefront on an orbit using a measured transmitted wavefront on the ground as an initial value.

図4において、透過波面計算部101は、最初は初期値を用いて、以降は直前の推定波面を用いて、Zernike展開による焦点はずし前(合焦位置)の波面WF(Zernike係数セット)を計算する(動作S201)。さらに、透過波面計算部101は、推定波面WFのZernike係数セットのうち第4項(焦点シフト項)のみを所定量変更して焦点はずし後の波面WFdを計算する(動作S202、S203)。点像応答解析部102は、焦点はずし後の推定波面WFdをフーリエ変換し、その振幅成分の二乗を取り出すことで点像応答解析を実行し、焦点はずし後の点像応答PSFdを生成する(動作S204)。同様に、点像応答解析部102は、焦点はずし前の推定波面WFをフーリエ変換し、その振幅成分の二乗を取り出すことで点像応答解析を実行し、焦点はずし前の点像応答PSFを生成する(動作S205)。   In FIG. 4, the transmitted wavefront calculation unit 101 first uses the initial value, and thereafter uses the previous estimated wavefront to calculate the wavefront WF (Zernike coefficient set) before defocusing (focus position) by Zernike expansion. (Operation S201). Further, the transmitted wavefront calculation unit 101 calculates a wavefront WFd after defocusing by changing only a fourth term (focus shift term) in the Zernike coefficient set of the estimated wavefront WF by a predetermined amount (operations S202 and S203). The point image response analysis unit 102 performs a point image response analysis by Fourier-transforming the defocused estimated wavefront WFd and taking out the square of its amplitude component, and generates a defocused point image response PSFd (operation) S204). Similarly, the point image response analysis unit 102 performs a point image response analysis by Fourier-transforming the estimated wavefront WF before defocusing and taking out the square of its amplitude component, and generates a point image response PSF before defocusing (Operation S205).

一方、上述したように、たとえば軌道上で実際に取得した焦点はずし前後の点像データがメモリ105に格納されると、点像応答生成部106は、焦点はずし前の点像データからリサンプリングして光学センサ点像応答PSF_rを生成し(動作S206)、同様に焦点はずし後の点像データからリサンプリングして光学センサ点像応答PSFd_rを生成する(動作S207)。なお、リサンプリングとは、一般に、取得画像を一定間隔(サンプリング間隔、二次元ではサンプリング位置と呼ばれる。)でサンプリングした後、さらにサンプリング間隔を変えてサンプリングすることであるが、本実施形態におけるリサンプリングでは次の2つの意味がある。一つは、通常、取得された複数の点像は重心がずれているので、重心を一致させることで、複数の点像から補間により画素サイズより小さいサンプリング間隔の点像応答を取得することであり、もう一つは、焦点調整前後での点像応答の比較のために、重心位置を基準として間隔でサンプリングし直すことである。   On the other hand, as described above, for example, when the point image data before and after defocusing actually acquired on the orbit is stored in the memory 105, the point image response generation unit 106 resamples from the point image data before defocusing. Then, the optical sensor point image response PSF_r is generated (operation S206), and similarly, the optical sensor point image response PSFd_r is generated by resampling from the defocused point image data (operation S207). Note that resampling is generally performed by sampling an acquired image at a constant interval (sampling interval, which is called a sampling position in two dimensions), and then changing the sampling interval. Sampling has the following two meanings. One is that since the centroids of a plurality of acquired point images are usually shifted, the centroids are matched to obtain a point image response with a sampling interval smaller than the pixel size by interpolation from the plurality of point images. Another is to resample at intervals with the center of gravity as a reference for comparison of point image responses before and after focus adjustment.

誤差評価部103は、焦点はずし前の点像応答PSFを点像応答解析部102から、焦点はずし前の実測された点像応答PSF_rを光学センサ点像応答生成部106から、それぞれ入力し、その最小二乗誤差e1を計算する(動作S208)。同様に、誤差評価部103は、焦点はずし後の点像応答PSFdを点像応答解析部102から、焦点はずし後の実測された点像応答PSFd_rを光学センサ点像応答生成部106から、それぞれ入力し、その最小二乗誤差e2を計算する(動作S209)。続いて、誤差評価部103は、最小二乗誤差e1およびe2のうち大きい方が所定の閾値Eを下回るか否かを判定する(動作S210)。   The error evaluation unit 103 inputs the point image response PSF before defocusing from the point image response analysis unit 102, and the measured point image response PSF_r before defocusing from the optical sensor point image response generation unit 106, respectively. The least square error e1 is calculated (operation S208). Similarly, the error evaluation unit 103 inputs the point image response PSFd after defocusing from the point image response analysis unit 102, and the measured point image response PSFd_r after defocusing from the optical sensor point image response generation unit 106, respectively. Then, the least square error e2 is calculated (operation S209). Subsequently, the error evaluation unit 103 determines whether the larger one of the least square errors e1 and e2 is less than a predetermined threshold E (operation S210).

最小二乗誤差e1およびe2のうち大きい方が所定の閾値Eより小さければ(動作S210のYES)、今回のZernike展開(動作S201で推定された波面WF)が実際の波面を適切に表現しているとみなして処理を終了する。逆に、最小二乗誤差e1およびe2のうち大きい方が所定の閾値E以上であれば(動作S210のNO)、今回のZernike展開(動作S201で推定された波面WF)が実際の波面を適切に表現していないとみなし、適切なZernike係数の探索ルーチンを実行する(動作S211)。たとえば、最急勾配法などにより上記最小二乗誤差e1およびe2のうち大きい方が小さくなる方向に少なくとも1つのZernike係数を変更し、変更したZernike係数で再度Zernike展開による光学部透過波面を計算する(動作S201)。以上の推定動作S201〜S205およびS208〜S211を繰り返して、閾値E以下となるZernike係数(すなわち推定波面WF)を取得することができる。   If the larger one of the least square errors e1 and e2 is smaller than the predetermined threshold E (YES in operation S210), the current Zernike expansion (the wavefront WF estimated in operation S201) appropriately represents the actual wavefront. The process is terminated. Conversely, if the larger one of the least square errors e1 and e2 is equal to or greater than the predetermined threshold E (NO in operation S210), the current Zernike expansion (the wavefront WF estimated in operation S201) appropriately sets the actual wavefront. A search routine for an appropriate Zernike coefficient is executed (operation S211). For example, at least one Zernike coefficient is changed in a direction in which the larger one of the least square errors e1 and e2 becomes smaller by the steepest gradient method or the like, and the optical part transmitted wavefront by Zernike expansion is calculated again with the changed Zernike coefficient ( Operation S201). By repeating the above estimation operations S201 to S205 and S208 to S211, a Zernike coefficient (that is, an estimated wavefront WF) that is equal to or less than the threshold value E can be acquired.

上述した波面計算方法は、反復により、あるパラメータ群を用いて計算される評価関数が最小となるパラメータセットを導出する最適化問題に帰着する。局所的最小解(極小解)に陥らないように全体の最小値(最適値)にたどり着くか否かは初期値に依存するが、初期値が最適解の近傍であること、初期値依存度を小さくする様々な数値計算方法が存在していることから、本手法によって最適値を導出することは可能である。なお、この方法で合焦位置と焦点はずれ位置の2か所でZernike係数の推定を行わなければならない理由は、Zernike展開は式(1)を満たす必要があり、式(1)の左辺はz方向の微分なので光軸方向で最低2か所の測定を必要とするからである。   The wavefront calculation method described above results in an optimization problem that derives a parameter set that minimizes the evaluation function calculated using a certain parameter group by iteration. Whether or not to reach the overall minimum value (optimum value) so as not to fall into the local minimum solution (minimal solution) depends on the initial value, but the initial value is in the vicinity of the optimal solution, and the initial value dependency Since there are various numerical calculation methods to reduce, it is possible to derive the optimum value by this method. The reason why the Zernike coefficient must be estimated at two positions of the in-focus position and the out-of-focus position by this method is that the Zernike expansion needs to satisfy Expression (1), and the left side of Expression (1) is z This is because it is a differential of the direction, and at least two measurements in the optical axis direction are required.

1.3)制御動作
上述した波面測定部100および焦点制御系20は、図示しないメモリに格納されたソフトウエアを実行することにより、同様の機能を実現することができる。以下、コンピュータとしての制御部30が波面測定プログラムを実行する場合を説明する。ただし、上述した波面推定動作と同様の動作については説明を簡略化する。
1.3) Control Operation The wavefront measurement unit 100 and the focus control system 20 described above can realize the same function by executing software stored in a memory (not shown). Hereinafter, a case where the control unit 30 as a computer executes a wavefront measurement program will be described. However, description of operations similar to the wavefront estimation operation described above will be simplified.

図5において、制御部30は、焦点調整機構13をデフォルト状態(合焦状態)にして光学センサ12から合焦点像12fの画像データを取得しメモリ105に格納する(動作S301)。続いて、制御部30は、焦点調整機構13を制御して所定の距離だけ焦点をずらし(動作S302)、焦点はずし状態で光学センサ12から焦点はずし点像12dfの画像データを取得してメモリ105に格納する(動作S303)。制御部30は、こうして得られた合焦点像データおよび焦点はずし点像データをそれぞれリサンプリングして点像応答PSF_rおよびPSFd_rをそれぞれ生成し格納する(動作S304)。   In FIG. 5, the control unit 30 sets the focus adjustment mechanism 13 to a default state (in-focus state), acquires the image data of the focused image 12f from the optical sensor 12, and stores it in the memory 105 (operation S301). Subsequently, the control unit 30 controls the focus adjustment mechanism 13 to shift the focus by a predetermined distance (operation S302), acquires image data of the defocus point image 12df from the optical sensor 12 in the defocus state, and stores the memory 105. (Operation S303). The control unit 30 resamples the focused image data and defocused point image data obtained in this way, respectively, and generates and stores point image responses PSF_r and PSFd_r, respectively (operation S304).

続いて、図6において、制御部30は、地上での測定透過波面などを用いて推定されたた軌道上の透過波面である初期値を読み出し(動作S305)、初期波面(推定波面)のZernike展開からフーリエ変換により光学系点像応答PSFを計算する(動作S306)。続いて、制御部30は、推定波面WFのZernike係数第4項(焦点シフト項)のみを所定の焦点ずらし距離dfに対応する量だけ変更する(動作S307)。続いて、制御部30は、焦点はずし後の推定波面のZernike展開からフーリエ変換により光学系点像応答PSFdを計算する(動作S308)。   Subsequently, in FIG. 6, the control unit 30 reads the initial value, which is the transmitted wavefront on the orbit estimated using the measured transmitted wavefront on the ground (Operation S <b> 305), and Zernike of the initial wavefront (estimated wavefront). An optical system point image response PSF is calculated from the expansion by Fourier transform (operation S306). Subsequently, the control unit 30 changes only the fourth Zernike coefficient term (focus shift term) of the estimated wavefront WF by an amount corresponding to the predetermined defocus distance df (operation S307). Subsequently, the control unit 30 calculates the optical system point image response PSFd by Fourier transform from the Zernike expansion of the estimated wavefront after defocusing (operation S308).

続いて、制御部30は、実測データから得られた点像応答PSF_rおよびPSFd_rをメモリ105から読み出し(動作S309)、焦点はずし前の計算された点像応答PSFと実測された点像応答PSF_rとから最小二乗誤差e1を計算し、焦点はずし後の計算された点像応答PSFdと実測された点像応答PSFd_rとから最小二乗誤差e2を計算する(動作S310)。続いて、制御部30は、最小二乗誤差e1およびe2のうち大きい方が所定の閾値Eを下回るか否かを判定し(動作S311)、最小二乗誤差e1およびe2のうち大きい方が所定の閾値Eより小さければ(動作S311のYES)、処理を終了し、逆に、所定の閾値E以上であれば(動作S311のNO)、最急勾配法などにより最小二乗誤差e1およびe2のうち大きい方が閾値Eより小さくなる方向にZernike係数を変更し、変更したZernike係数で動作S306を実行する。以上の推定動作S306〜S312を繰り返して、動作S311において閾値E以下となった時のZernike係数(すなわち推定波面WF)を最終的な推定波面として決定する。   Subsequently, the control unit 30 reads the point image responses PSF_r and PSFd_r obtained from the measured data from the memory 105 (operation S309), and calculates the calculated point image response PSF before defocusing and the measured point image response PSF_r. The least square error e1 is calculated from the calculated point image response PSFd after defocusing and the actually measured point image response PSFd_r (operation S310). Subsequently, the control unit 30 determines whether or not the larger one of the least square errors e1 and e2 is below a predetermined threshold E (operation S311), and the larger one of the least square errors e1 and e2 is a predetermined threshold. If it is smaller than E (YES in operation S311), the process is terminated. Conversely, if it is equal to or greater than a predetermined threshold E (NO in operation S311), the larger one of the least square errors e1 and e2 by the steepest gradient method or the like. The Zernike coefficient is changed in the direction in which becomes smaller than the threshold value E, and the operation S306 is executed with the changed Zernike coefficient. The above estimation operations S306 to S312 are repeated, and the Zernike coefficient (that is, the estimated wavefront WF) when the threshold value E is equal to or less than the threshold E in operation S311 is determined as the final estimated wavefront.

1.4)効果
本発明の第1実施形態によれば、光学センサにより取得された合焦状態と焦点はずし状態の点像データを用いて推定波面のZernike係数を調整することにより、コンパクトな構成で所望精度の波面測定が可能となる。また、光学式望遠鏡等の光学装置に設けられた結像光学系と光学センサとを利用することで、装置構成のコンパクト化が可能となり、衛星に搭載された場合に、衛星内の配置スペースの節約が可能となる。さらに、光学系の焦点調整機構を利用することで、簡単な光学系で波面計測が可能となる。
1.4) Effect According to the first embodiment of the present invention, a compact configuration is obtained by adjusting the Zernike coefficient of the estimated wavefront using the point image data of the focused state and the defocused state acquired by the optical sensor. Thus, wavefront measurement with desired accuracy can be performed. In addition, by using an imaging optical system and an optical sensor provided in an optical device such as an optical telescope, the device configuration can be made compact, and when mounted on a satellite, the arrangement space in the satellite can be reduced. Savings are possible. Furthermore, by using the focus adjustment mechanism of the optical system, wavefront measurement can be performed with a simple optical system.

2.第2実施形態
本発明の第2実施形態による波面測定装置は、異なる波長の点像をそれぞれ取得して、波長毎に、上述した第1実施形態と同様の波面測定を行うことができる。以下、図1に示す第1実施形態と同じ機能部には同一参照番号を付して説明は省略する。
2. Second Embodiment A wavefront measuring apparatus according to a second embodiment of the present invention can acquire point images of different wavelengths and perform the same wavefront measurement as in the first embodiment described above for each wavelength. In the following, the same functional units as those in the first embodiment shown in FIG.

図7に示すように、本実施形態において利用される光学装置10の光学センサ12は、複数の波長(ここでは3つの波長λ1〜λ3)をそれぞれ検出する受光素子からなるものとする。第1実施形態と同様に、結像光学系11により焦点面12a上に形成される画像は点像であり、受光素子は波長λ1−λ3の各々の点像データを波長毎の波面測定部100aへ出力する。各波長の点像データは、第1実施形態と同様に処理されて波面測定が行われるので、詳細は省略する。   As shown in FIG. 7, the optical sensor 12 of the optical device 10 used in the present embodiment is assumed to include light receiving elements that respectively detect a plurality of wavelengths (here, three wavelengths λ1 to λ3). As in the first embodiment, the image formed on the focal plane 12a by the imaging optical system 11 is a point image, and the light receiving element converts each point image data of the wavelengths λ1 to λ3 to the wavefront measuring unit 100a for each wavelength. Output to. Since the point image data of each wavelength is processed in the same manner as in the first embodiment and wavefront measurement is performed, details are omitted.

波長λ1−λ3毎の点像データを取得する光学センサ12は、各画素に波長λ1−λ3にそれぞれ対応する3つの受光素子(CCDセンサ、CMOSセンサ等)を設けた構成でもよいし、各波長の光を受光する受光素子を一列に配列したラインセンサをそれぞれの波長数分だけ所定間隔で平行に配列した構成でもよいし、あるいは、波長毎に2次元センサを設けた構成でもよい。各波長の光を受光する方法としては、同一特性の受光素子に波長λ1−λ3の各波長だけを透過するフィルタを設けた構成を採用できる。   The optical sensor 12 that acquires point image data for each wavelength λ1-λ3 may have a configuration in which each pixel is provided with three light receiving elements (CCD sensor, CMOS sensor, etc.) corresponding to the wavelengths λ1-λ3. A configuration may be employed in which line sensors each having a light receiving element that receives the light in a line are arranged in parallel at a predetermined interval corresponding to the number of wavelengths, or a configuration in which a two-dimensional sensor is provided for each wavelength. As a method for receiving light of each wavelength, a configuration in which a filter that transmits only the wavelengths λ1 to λ3 is provided in a light receiving element having the same characteristics can be employed.

3.適用例
上述した各実施形態による波長測定装置は種々の結像光学系を有する光学装置に搭載することができる。いくつかの例を以下に示す。
3. Application Examples The wavelength measuring devices according to the above-described embodiments can be mounted on optical devices having various imaging optical systems. Some examples are given below.

図8において、結像光学系400は、1次鏡401、2次鏡402および3次鏡403の3枚の鏡と折返し平面鏡404とからなる。ここでは、平面鏡404が焦点調整機構13により光軸方向に移動可能であり、所定距離だけ移動することで、上述したように焦点面を所定の焦点はずし距離dfだけ変化させることができる。   In FIG. 8, the imaging optical system 400 includes three mirrors, a primary mirror 401, a secondary mirror 402, and a tertiary mirror 403, and a folded plane mirror 404. Here, the plane mirror 404 can be moved in the optical axis direction by the focus adjustment mechanism 13, and by moving the plane mirror 404 by a predetermined distance, the focal plane can be changed by the predetermined defocusing distance df as described above.

図9において、光学望遠鏡500は、1次鏡501、2次鏡502、第1折曲鏡503、3次鏡504および第2折曲鏡505からなる結像光学系を有し、さらに第2折曲鏡505を移動させる焦点調整機構13が設けられている。   In FIG. 9, an optical telescope 500 has an imaging optical system including a primary mirror 501, a secondary mirror 502, a first folding mirror 503, a tertiary mirror 504, and a second folding mirror 505, and further includes a second optical mirror. A focus adjustment mechanism 13 for moving the folding mirror 505 is provided.

1次鏡501と2次鏡502とは同じ光軸上に設けられ、1次鏡501により集光された入射光束が2次鏡502で反射され、1次鏡501の中央部に設けられた開口部501aを通過する。開口部501aを通過した光束は第1折曲鏡503で3次鏡504へ折り曲げられ、3次鏡504により集光された後、第2折曲鏡505で反射されて光学センサ12上に結像する。焦点調整機構13は第2折返し鏡503を光軸方向に沿って所定の距離だけ移動させることで、上述したように焦点面を所定の焦点はずし距離dfだけ変化させることができる。   The primary mirror 501 and the secondary mirror 502 are provided on the same optical axis, and the incident light beam condensed by the primary mirror 501 is reflected by the secondary mirror 502 and provided at the center of the primary mirror 501. It passes through the opening 501a. The light beam that has passed through the opening 501 a is bent by the first folding mirror 503 to the tertiary mirror 504, collected by the tertiary mirror 504, reflected by the second folding mirror 505, and then coupled onto the optical sensor 12. Image. The focus adjustment mechanism 13 can change the focal plane by a predetermined defocus distance df as described above by moving the second folding mirror 503 along the optical axis direction by a predetermined distance.

図10において、光学望遠鏡600は、1次鏡601、2次鏡602、3次鏡603、第1折曲鏡604、および第2折曲鏡605からなる結像光学系を有し、さらに第1折曲鏡604を移動させる焦点調整機構13が設けられている。   In FIG. 10, an optical telescope 600 has an imaging optical system including a primary mirror 601, a secondary mirror 602, a tertiary mirror 603, a first folding mirror 604, and a second folding mirror 605. A focus adjusting mechanism 13 for moving the one folding mirror 604 is provided.

1次鏡601と2次鏡602とは同じ光軸上に設けられ、1次鏡601により集光された入射光束が2次鏡602で反射され、1次鏡601の中央部に設けられた開口部601aを通過する。開口部601aを通過した光束は3次鏡603により集光された後、第1折曲鏡604および第2折曲鏡605でそれぞれ反射されて光学センサ12上に結像する。焦点調整機構13は第1折曲鏡604を光軸方向に沿って所定の距離だけ移動させることで、上述したように焦点面を所定の焦点はずし距離dfだけ変化させることができる。   The primary mirror 601 and the secondary mirror 602 are provided on the same optical axis, and the incident light beam condensed by the primary mirror 601 is reflected by the secondary mirror 602 and provided at the center of the primary mirror 601. It passes through the opening 601a. The light beam that has passed through the opening 601 a is collected by the tertiary mirror 603 and then reflected by the first and second folding mirrors 604 and 605 to form an image on the optical sensor 12. The focus adjustment mechanism 13 can change the focal plane by a predetermined defocusing distance df as described above by moving the first folding mirror 604 by a predetermined distance along the optical axis direction.

なお、上述した各実施形態および各適用例に用いられる焦点調整機構13は、結像光学系11の所定の光学要素を光軸方向に移動させることで所定の焦点はずし距離dfが得られる直動機構であればよい。移動させる所定の光学要素としては、結像光学系11を構成する平面鏡が望ましく、たとえば図2に示す反射鏡11b、図8に示す平面鏡404、図9に示す第2折返し鏡505、図10に示す第1折曲鏡604などである。このような平面鏡を所定距離だけ正確に移動させる焦点調整機構13の一例として、図11に焦点調整機構13aを示す。   The focus adjustment mechanism 13 used in each of the above-described embodiments and application examples is a linear motion that can obtain a predetermined defocus distance df by moving a predetermined optical element of the imaging optical system 11 in the optical axis direction. Any mechanism may be used. As the predetermined optical element to be moved, a plane mirror constituting the imaging optical system 11 is desirable. For example, the reflecting mirror 11b shown in FIG. 2, the plane mirror 404 shown in FIG. 8, the second folding mirror 505 shown in FIG. A first folding mirror 604 shown. As an example of the focus adjustment mechanism 13 for accurately moving such a plane mirror by a predetermined distance, FIG. 11 shows a focus adjustment mechanism 13a.

図11に例示するように、焦点調整機構13aは、焦点調整するための反射鏡を取り付ける取付面1301をリニアガイド1302に沿って移動させるための直動機構1303を有する。直動機構1303は、たとえばねじ機構をアクチュエータ1304により回転させることで、ナットに固定された取付面1301を光軸方向に所定の距離dfだけ直線移動させることができる。アクチュエータ1304は焦点制御系20により制御される。なお、上記各実施形態および適用例で使用される焦点調整機構13は図11に示す焦点調整機構13aの構成に限定されるものではない。   As illustrated in FIG. 11, the focus adjustment mechanism 13 a includes a linear motion mechanism 1303 for moving a mounting surface 1301 to which a reflecting mirror for focus adjustment is attached along the linear guide 1302. The linear motion mechanism 1303 can linearly move the attachment surface 1301 fixed to the nut by a predetermined distance df by rotating a screw mechanism by an actuator 1304, for example. The actuator 1304 is controlled by the focus control system 20. The focus adjustment mechanism 13 used in each of the above embodiments and application examples is not limited to the configuration of the focus adjustment mechanism 13a shown in FIG.

本発明は衛星に搭載され軌道上での波面推定に使用される波面センサに利用可能である。   The present invention can be used for a wavefront sensor mounted on a satellite and used for wavefront estimation in orbit.

10 光学装置
11 結像光学系
11b 反射鏡
12 光学センサ
12a 焦点面
12f 合焦点像
12df 焦点はずれ点像
13、13a 焦点調整機構
14 透過波面
20 焦点制御系
30 制御部
100 波面測定部
100a 波長毎の波面測定部
101 透過波面計算部
102 点像応答解析部
103 誤差評価部
104 Zernike係数更正部
105 メモリ
106 光学センサ点像応答生成部
DESCRIPTION OF SYMBOLS 10 Optical apparatus 11 Imaging optical system 11b Reflector 12 Optical sensor 12a Focal plane 12f In-focus image 12df Out-of-focus point image 13, 13a Focus adjustment mechanism 14 Transmitted wave surface 20 Focus control system 30 Control unit 100 Wavefront measuring unit 100a For every wavelength Wavefront measurement unit 101 Transmission wavefront calculation unit 102 Point image response analysis unit 103 Error evaluation unit 104 Zernike coefficient correction unit 105 Memory 106 Optical sensor point image response generation unit

Claims (18)

少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定方法であって、
a)点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得し、
b)推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算し、
c)前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する、
ことを特徴とする波面測定方法。
A wavefront measurement method for measuring a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing,
a) By capturing a point image, the first and second images are respectively acquired as point image responses;
b) calculating point image responses respectively corresponding to at least the first wavefront before defocusing and the second wavefront after defocusing generated using the estimated wavefront;
c) changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response;
A wavefront measuring method characterized by the above.
結像光学系の焦点調整により焦点面を所定の焦点はずし距離だけ移動させることで、前記第一画像および前記第二画像を光学センサにより撮像することを特徴とする請求項1に記載の波面測定方法。   2. The wavefront measurement according to claim 1, wherein the first image and the second image are picked up by an optical sensor by moving a focal plane by a predetermined defocusing distance by adjusting a focus of the imaging optical system. Method. 前記推定される波面を表現する多項式の焦点シフトを示す係数を変更することで前記焦点はずし後の波面を生成することを特徴とする請求項1または2に記載の波面測定方法。   The wavefront measurement method according to claim 1, wherein the defocused wavefront is generated by changing a coefficient indicating a focal shift of a polynomial expressing the estimated wavefront. 前記計算された点像応答と前記取得された点像応答との誤差が所定レベル以上であれば、前記計算された点像応答が前記取得された点像応答に近づくように前記推定される波面をを変更することを特徴とする請求項1−3のいずれか1項に記載の波面測定方法。   If the error between the calculated point image response and the acquired point image response is greater than or equal to a predetermined level, the estimated wavefront so that the calculated point image response approaches the acquired point image response The wavefront measuring method according to claim 1, wherein the wavefront measuring method is changed. 前記計算された点像応答が前記取得された点像応答に近づくように前記推定される波面を表現する多項式の少なくとも1つの係数を変更する、ことを特徴とする請求項4に記載の波面測定方法。   5. The wavefront measurement according to claim 4, wherein at least one coefficient of a polynomial representing the estimated wavefront is changed so that the calculated point spread response approaches the acquired point spread response. Method. 前記計算された点像応答と前記取得された点像応答との誤差が所定レベル以上であれば、前記計算された点像応答が前記取得された点像応答に近づくように前記推定される波面を変更し、上記b)およびc)を前記誤差が前記所定レベルより小さくなるまで繰り返す、ことを特徴とする請求項4または5に記載の波面測定方法。   If the error between the calculated point image response and the acquired point image response is greater than or equal to a predetermined level, the estimated wavefront so that the calculated point image response approaches the acquired point image response 6. The wavefront measuring method according to claim 4 or 5, wherein b) and c) are repeated until the error becomes smaller than the predetermined level. 前記計算された点像応答と前記取得された点像応答との誤差は、前記第一波面に対応する点像応答と前記第一画像に対応する点像応答との誤差と、前記第二波面に対応する点像応答と前記第二画像に対応する点像応答との誤差と、のうち大きい方であることを特徴とする請求項1−6のいずれか1項に記載の波面測定方法。   The error between the calculated point image response and the acquired point image response is the error between the point image response corresponding to the first wavefront and the point image response corresponding to the first image, and the second wavefront. The wavefront measurement method according to claim 1, wherein an error between a point image response corresponding to the second image and a point image response corresponding to the second image is a larger one. 少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定装置であって、
点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得する点像応答取得手段と、
推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算する計算手段と、
前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する評価手段と、
を有することを特徴とする波面測定装置。
A wavefront measuring device for measuring a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing,
Point image response acquisition means for acquiring the first and second images as point image responses by capturing point images; and
Calculating means for calculating point image responses respectively corresponding to at least the first wavefront before defocusing and the second wavefront after defocusing generated using the estimated wavefront;
Evaluation means for changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response;
A wavefront measuring apparatus comprising:
結像光学系の焦点調整により焦点面を所定の焦点はずし距離だけ移動させ、前記第一画像および前記第二画像を光学センサにより撮像する制御手段をさらに有することを特徴とする請求項8に記載の波面測定装置。   9. The apparatus according to claim 8, further comprising control means for moving the focal plane by a predetermined defocus distance by adjusting the focus of the imaging optical system, and imaging the first image and the second image with an optical sensor. Wavefront measuring device. 前記計算手段が、前記推定される波面を表現する多項式の焦点シフトを示す係数を変更することで前記焦点はずし後の波面を生成することを特徴とする請求項8または9に記載の波面測定装置。   10. The wavefront measuring apparatus according to claim 8, wherein the calculation unit generates the wavefront after the defocusing by changing a coefficient indicating a focal shift of a polynomial expressing the estimated wavefront. . 前記評価手段が、前記計算された点像応答と前記取得された点像応答との誤差が所定レベル以上であれば、前記計算された点像応答が前記取得された点像応答に近づくように前記推定される波面を変更することを特徴とする請求項8−10のいずれか1項に記載の波面測定装置。   If the error between the calculated point image response and the acquired point image response is greater than or equal to a predetermined level, the evaluation means causes the calculated point image response to approach the acquired point image response. The wavefront measuring apparatus according to claim 8, wherein the estimated wavefront is changed. 前記評価手段が、前記計算された点像応答が前記取得された点像応答に近づくように前記推定される波面を表現する多項式の少なくとも1つの係数を変更する、ことを特徴とする請求項11に記載の波面測定装置。   12. The evaluation means changes at least one coefficient of a polynomial representing the estimated wavefront so that the calculated point spread response approaches the acquired point spread response. The wavefront measuring apparatus described in 1. 前記評価手段が、前記計算された点像応答と前記取得された点像応答との誤差が所定レベル以上であれば、前記計算された点像応答が前記取得された点像応答に近づくように前記推定される波面を変更し、前記誤差が前記所定レベルより小さくなるまで前記計算を繰り返すように前記計算手段を制御する、ことを特徴とする請求項11または12に記載の波面測定装置。   If the error between the calculated point image response and the acquired point image response is greater than or equal to a predetermined level, the evaluation means causes the calculated point image response to approach the acquired point image response. 13. The wavefront measuring apparatus according to claim 11 or 12, wherein the wavefront measuring apparatus is configured to change the estimated wavefront and to control the calculation means so as to repeat the calculation until the error becomes smaller than the predetermined level. 前記計算された点像応答と前記取得された点像応答との誤差は、前記第一波面に対応する点像応答と前記第一画像に対応する点像応答との誤差と、前記第二波面に対応する点像応答と前記第二画像に対応する点像応答との誤差と、のうち大きい方であることを特徴とする請求項8−13のいずれか1項に記載の波面測定装置。   The error between the calculated point image response and the acquired point image response is the error between the point image response corresponding to the first wavefront and the point image response corresponding to the first image, and the second wavefront. The wavefront measuring apparatus according to claim 8, which is a larger one of an error between a point image response corresponding to the point image response and a point image response corresponding to the second image. 少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定システムであって、
結像光学系と、前記結像光学系の焦点調整手段と、前記結像光学系の焦点面に設けられた光学センサと、を有する光学装置と、
前記焦点調整手段を制御することで前記焦点はずしを実行し、前記光学センサにより点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得する点像応答取得手段と、
推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算する計算手段と、
前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する評価手段と、
を有することを特徴とする波面測定システム。
A wavefront measurement system for measuring a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing,
An optical apparatus comprising: an imaging optical system; a focus adjusting unit of the imaging optical system; and an optical sensor provided on a focal plane of the imaging optical system;
Point image response acquisition means for executing the defocusing by controlling the focus adjustment means, and acquiring the first and second images as point image responses by capturing point images by the optical sensor;
Calculating means for calculating point image responses respectively corresponding to at least the first wavefront before defocusing and the second wavefront after defocusing generated using the estimated wavefront;
Evaluation means for changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response;
A wavefront measuring system comprising:
少なくとも焦点はずし前の第一画像と焦点はずし後の第二画像とに基づいて透過波面を測定する波面測定装置としてコンピュータを機能させるプログラムであって、
a)点像を撮像することで前記第一および第二画像をそれぞれ点像応答として取得する機能と、
b)推定される波面を用いて生成された少なくとも焦点はずし前の第一波面と焦点はずし後の第二波面とにそれぞれ対応する点像応答を計算する機能と、
c)前記計算された点像応答と前記取得された点像応答との誤差に基づいて前記推定される波面を変更する機能と、
を前期コンピュータに実現することを特徴とするプログラム。
A program that causes a computer to function as a wavefront measuring device that measures a transmitted wavefront based on at least a first image before defocusing and a second image after defocusing,
a) a function of acquiring the first and second images as point image responses by capturing a point image;
b) a function for calculating point image responses respectively corresponding to at least the first wavefront before defocusing and the second wavefront after defocusing generated using the estimated wavefront;
c) a function of changing the estimated wavefront based on an error between the calculated point image response and the acquired point image response;
A program characterized by realizing the above in a computer in the previous term.
請求項16に記載のプログラムを実行するコンピュータを搭載したシステム。   A system including a computer that executes the program according to claim 16. 請求項8−13のいずれか1項に記載の波面測定装置を設けた宇宙飛翔体。   A spacecraft provided with the wavefront measuring apparatus according to any one of claims 8-13.
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