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JP2016166120A - Processing method of laminated substrate, and processing device of laminated substrate by laser beam - Google Patents

Processing method of laminated substrate, and processing device of laminated substrate by laser beam Download PDF

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JP2016166120A
JP2016166120A JP2015255698A JP2015255698A JP2016166120A JP 2016166120 A JP2016166120 A JP 2016166120A JP 2015255698 A JP2015255698 A JP 2015255698A JP 2015255698 A JP2015255698 A JP 2015255698A JP 2016166120 A JP2016166120 A JP 2016166120A
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laminated substrate
substrate
resin layer
laser beam
processing
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智史 國生
Tomoji Kokusho
智史 國生
剛史 池田
Tsuyoshi Ikeda
剛史 池田
山本 幸司
Koji Yamamoto
山本  幸司
郁祥 中谷
Fumiyoshi Nakatani
郁祥 中谷
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Mitsuboshi Diamond Industrial Co Ltd
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Mitsuboshi Diamond Industrial Co Ltd
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Priority to KR1020160019279A priority Critical patent/KR20160108148A/en
Priority to TW105104788A priority patent/TW201706221A/en
Priority to CN201610118125.3A priority patent/CN105935838A/en
Publication of JP2016166120A publication Critical patent/JP2016166120A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material

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Abstract

PROBLEM TO BE SOLVED: To process a brittle material substrate and a resin layer constituting a laminated substrate, simultaneously in a high quality.SOLUTION: A processing method includes a first step and a second step. In the first step, a laminated substrate G comprising a glass substrate 11, and a resin layer 12 formed on the surface of the glass substrate 11 is prepared. In the second step, a laser beam having a prescribed wavelength is condensed onto the glass substrate 11 to irradiate the laminated substrate G, and thereby a laser beam irradiation part of the resin layer 12 is modified, to thereby lower brittle fracture strength more than that of its periphery, and simultaneously generates a crack on the glass substrate 11.SELECTED DRAWING: Figure 2

Description

本発明は、積層基板の加工方法、特に、脆性材料基板の表面に樹脂層が積層された積層基板を加工するための方法に関する。また、本発明は、レーザ光による積層基板の加工装置に関する。   The present invention relates to a method for processing a laminated substrate, and more particularly to a method for processing a laminated substrate in which a resin layer is laminated on the surface of a brittle material substrate. The present invention also relates to an apparatus for processing a laminated substrate using a laser beam.

薄膜太陽電池や液晶表示装置等においては、ガラス基板上に保護膜としての樹脂層が設けられる場合がある。そして、このような基板は、1枚の大型のマザー基板から複数の単位基板に分断される。   In a thin film solar cell, a liquid crystal display device, or the like, a resin layer as a protective film may be provided on a glass substrate. Such a substrate is divided into a plurality of unit substrates from one large mother substrate.

このような積層基板の分断方法が特許文献1に示されている。この特許文献1の方法では、ガラス基板表面に形成された保護用の樹脂層に対して、分断予定ラインに沿ってレーザ光が照射される。このレーザ光の照射によって樹脂層の一部が除去され、ガラス基板の一部が露出される。また、ガラス基板には加工前に初期亀裂が形成されており、その後、ガラス基板にレーザ光を照射し、ウォータジェットにより冷却することによって亀裂を進展させ、分断される。   Patent Document 1 discloses such a method for dividing a laminated substrate. In the method disclosed in Patent Document 1, a protective resin layer formed on the surface of a glass substrate is irradiated with laser light along a planned dividing line. By this laser light irradiation, a part of the resin layer is removed, and a part of the glass substrate is exposed. Moreover, the initial crack is formed in the glass substrate before processing, and thereafter, the glass substrate is irradiated with a laser beam and cooled by a water jet, whereby the crack is developed and divided.

特表平10−506087号公報Japanese National Patent Publication No. 10-506087

特許文献1の方法では、ガラス基板表面に形成された樹脂層の一部がレーザ光の照射によって蒸発し、除去される。このとき、除去された樹脂が飛散し、基板上に異物として付着したり、また、樹脂層の表面が酸化して、後工程でスクライブ加工ができないといった問題が生じる場合がある。さらに、加工部周辺に変色部分が発生して加工幅が大きくなったり、高出力のレーザが必要になる等の問題もある。また、特許文献1の方法では、レーザ光による加工前に、ガラス基板に初期亀裂を形成する必要がある。   In the method of Patent Document 1, a part of the resin layer formed on the glass substrate surface is evaporated and removed by laser light irradiation. At this time, the removed resin may scatter and adhere as foreign matter on the substrate, or the surface of the resin layer may oxidize, resulting in a problem that scribing cannot be performed in a later step. In addition, there are problems such as discolored portions around the processed portion, increasing the processing width, and requiring a high-power laser. Moreover, in the method of patent document 1, it is necessary to form an initial crack in a glass substrate before the process by a laser beam.

本発明の課題は、積層基板を構成する脆性材料基板及び樹脂層を同時に、しかも高い品質で加工できるようにすることにある。   An object of the present invention is to enable a brittle material substrate and a resin layer constituting a laminated substrate to be processed simultaneously with high quality.

本発明の一側面に係る積層基板の加工方法は、以下の工程を含んでいる。
第1工程:脆性材料基板と、脆性材料基板の表面に形成された樹脂層と、からなる積層基板を準備する。
第2工程:所定の波長のレーザ光を、脆性材料基板に集光するようにして積層基板に照射し、樹脂層のレーザ光照射部分を改質して脆性破壊強度を周囲のそれよりも低下させると同時に脆性材料基板に亀裂を生じさせる。
A method for processing a laminated substrate according to one aspect of the present invention includes the following steps.
1st process: The laminated substrate which consists of a brittle material board | substrate and the resin layer formed in the surface of a brittle material board | substrate is prepared.
Second step: irradiating the laminated substrate with laser light of a predetermined wavelength so as to be focused on the brittle material substrate, modifying the laser light irradiated portion of the resin layer to lower the brittle fracture strength than that of the surroundings At the same time, the brittle material substrate is cracked.

この方法では、脆性材料基板の表面に樹脂層が形成された積層基板に対して、所定の波長のレーザ光が照射される。このレーザ光の照射によって、レーザ光の照射された樹脂層及び脆性材料基板が同時に加工される。特に、樹脂層のレーザ光が照射された部分は、樹脂層が除去されることなく改質される。この改質によって、樹脂層のレーザ光照射部分の脆性破壊強度が、周囲の部分に比較して低くなる。このため、高い品質で、かつ短い加工時間で積層基板を加工することができる。   In this method, laser light having a predetermined wavelength is irradiated onto a laminated substrate in which a resin layer is formed on the surface of a brittle material substrate. By this laser light irradiation, the resin layer irradiated with the laser light and the brittle material substrate are processed simultaneously. In particular, the portion of the resin layer irradiated with the laser light is modified without removing the resin layer. By this modification, the brittle fracture strength of the laser light irradiated portion of the resin layer becomes lower than that of the surrounding portion. For this reason, a laminated substrate can be processed with high quality and a short processing time.

このような方法では、レーザ光を、例えば積層基板の分断予定ラインに沿って照射することによって、分断予定ラインの樹脂層を除去することなく、後の分断工程によって樹脂層及び脆性材料基板を分断することができる。したがって、樹脂層の飛散による加工品質の低下を抑え、かつ低い出力のレーザ光で加工を行うことができる。   In such a method, the resin layer and the brittle material substrate are divided by a subsequent dividing step without removing the resin layer of the planned dividing line, for example, by irradiating laser light along the scheduled dividing line of the laminated substrate. can do. Therefore, it is possible to suppress the deterioration of the processing quality due to the scattering of the resin layer and perform the processing with a low output laser beam.

本発明の別の側面に係る積層基板の加工方法は、第2工程では、レーザ光照射部分の体積を膨張又は変色させて改質を行う。   In the method for processing a laminated substrate according to another aspect of the present invention, in the second step, the volume of the laser light irradiated portion is expanded or discolored to perform modification.

本発明のさらに別の側面に係る積層基板の加工方法は、第2工程では、レーザ光照射部分に亀裂を生じさせて改質を行う。   In the method for processing a laminated substrate according to still another aspect of the present invention, in the second step, the laser beam irradiated portion is cracked to perform modification.

本発明のさらに別の側面に係る積層基板の加工方法は、第1工程では、波長が515〜1080nmのレーザ光を照射する。   In the multilayer substrate processing method according to still another aspect of the present invention, laser light having a wavelength of 515 to 1080 nm is irradiated in the first step.

本発明のさらに別の側面に係る積層基板の加工方法は、第1工程では、パルス幅が50psec〜15nsecのパルスレーザ光を照射する。   In the multilayer substrate processing method according to still another aspect of the present invention, in the first step, a pulse laser beam having a pulse width of 50 psec to 15 nsec is irradiated.

本発明のさらに別の側面に係る積層基板の加工方法は、第2工程では、集光レンズのNAが0.17psec〜0.7nsecのパルスレーザ光を照射する。   In the method for processing a laminated substrate according to still another aspect of the present invention, in the second step, pulsed laser light having a condensing lens NA of 0.17 psec to 0.7 nsec is irradiated.

本発明のさらに別の側面に係る積層基板の加工方法は、積層基板には分断予定ラインが設定されている。そして、第2工程では、樹脂層の分断予定ラインに沿ってレーザ光を照射し、脆性材料基板及び樹脂層を、分断予定ラインに沿って分断する第3工程をさらに含む。   In the method for processing a laminated substrate according to still another aspect of the present invention, a dividing line is set on the laminated substrate. The second step further includes a third step of irradiating the laser beam along the planned division line of the resin layer to divide the brittle material substrate and the resin layer along the planned division line.

本発明のさらに別の側面に係る積層基板の加工方法は、積層基板には分断予定ラインが設定されている。そして、第2工程では、分断予定ラインに沿ってレーザ光を照射し、脆性材料基板及び樹脂層を、分断予定ラインに沿って分断する第3工程をさらに含む。   In the method for processing a laminated substrate according to still another aspect of the present invention, a dividing line is set on the laminated substrate. The second step further includes a third step of irradiating the laser beam along the planned dividing line and dividing the brittle material substrate and the resin layer along the planned dividing line.

本発明の一側面に係るレーザ光による積層基板の加工装置は、脆性材料基板の表面に樹脂層が積層された積層基板を加工するための装置であって、支持手段と、レーザ光照射手段と、を備えている。支持手段は積層基板を支持する。レーザ光照射手段は、所定の波長のレーザ光を、脆性材料基板に集光するようにして積層基板に照射し、樹脂層のレーザ光照射部分を改質して脆性破壊強度を周囲のそれよりも低下させるとともに脆性材料基板に亀裂を生じさせる。   An apparatus for processing a laminated substrate with a laser beam according to one aspect of the present invention is an apparatus for processing a laminated substrate in which a resin layer is laminated on the surface of a brittle material substrate, and includes a supporting unit, a laser beam irradiating unit, It is equipped with. The support means supports the laminated substrate. The laser beam irradiation means irradiates the laminated substrate with a laser beam having a predetermined wavelength so as to be focused on the brittle material substrate, and modifies the laser beam irradiated portion of the resin layer so that the brittle fracture strength is higher than that of the surroundings. As well as causing cracks in the brittle material substrate.

以上のような本発明では、積層基板を構成する脆性材料基板及び樹脂層を、同時に高い加工品質で加工することができる。   In the present invention as described above, the brittle material substrate and the resin layer constituting the laminated substrate can be simultaneously processed with high processing quality.

加工対象としての積層基板の断面部分図。FIG. 3 is a partial cross-sectional view of a multilayer substrate as a processing target. 加工方法の第2工程を説明するための積層基板の断面図。Sectional drawing of the laminated substrate for demonstrating the 2nd process of a processing method. 本発明の一実施形態による加工装置の概略構成図。The schematic block diagram of the processing apparatus by one Embodiment of this invention.

[加工対象]
図1は、本発明の一実施形態による方法によって分断される積層基板の断面を示している。この積層基板Gは、例えば強化ガラス等のガラス基板11の表面に、保護層としてのポリエステルフィルム(以下、単に「樹脂層」と記す)12を積層して形成されている。また、ここでは、積層基板Gは1枚の大型のマザー基板であり、このマザー基板には、例えばX,Y方向に分断予定ラインが設定されている。そして、この分断予定ラインに沿ってマザー基板が複数の単位基板に分断される。
[Processing target]
FIG. 1 shows a cross section of a laminated substrate cut by a method according to an embodiment of the present invention. The laminated substrate G is formed by laminating a polyester film (hereinafter simply referred to as “resin layer”) 12 as a protective layer on the surface of a glass substrate 11 such as tempered glass. In addition, here, the laminated substrate G is a single large mother substrate, and a division line is set in the mother substrate, for example, in the X and Y directions. Then, the mother substrate is divided into a plurality of unit substrates along the division line.

なお、図1は模式図であって、ガラス基板11及び樹脂層12の厚み等は模式化して示している。また、図における一点鎖線dは、分断予定ラインが設定された位置を示している。   FIG. 1 is a schematic diagram, and the thickness and the like of the glass substrate 11 and the resin layer 12 are schematically shown. Moreover, the dashed-dotted line d in a figure has shown the position where the division | segmentation scheduled line was set.

[加工(分断)方法]
積層基板Gを分断する場合は、まず、分断予定ラインdに沿って、樹脂層12が形成された側からレーザ光を照射する。以下、樹脂層12を改質する場合の例を説明する。
[Processing (partitioning) method]
When the laminated substrate G is divided, first, laser light is irradiated from the side on which the resin layer 12 is formed along the division line d. Hereinafter, an example of modifying the resin layer 12 will be described.

この場合は、照射するレーザ光の条件としては、図2に示すように、樹脂層12において、レーザ光Lが照射された領域Rが改質されると同時に、ガラス基板11の内部に又は表面から内部にかけて亀裂Cが生じる程度のレーザ光とする。   In this case, as a condition of the laser beam to be irradiated, as shown in FIG. 2, in the resin layer 12, the region R irradiated with the laser beam L is modified, and at the same time, the inside of the glass substrate 11 or the surface The laser beam is such that a crack C is generated from the inside to the inside.

ここで、「改質」とは、樹脂層12のレーザ光が照射された領域Rが、以下のような物理的変化を起こし、周囲の部分に比較して脆性破壊強度がより低下することを意味する。
・レーザ光が照射された部分の体積が膨張する
・レーザ光が照射された部分が変色する
・レーザ光が照射された部分に亀裂が発生する
Here, “modification” means that the region R of the resin layer 12 irradiated with the laser light undergoes the following physical changes, and the brittle fracture strength is further reduced as compared with the surrounding portion. means.
・ The volume of the part irradiated with laser light expands. ・ The part irradiated with laser light changes color. ・ The crack occurs in the part irradiated with laser light.

以上のような改質によって、レーザ光が照射された部分は、他の部分に比較してもろくなる。   Due to the modification as described above, the portion irradiated with the laser light becomes brittle compared to other portions.

以上のようにして、改質領域R及び亀裂Cが形成された積層基板Gに対して、分断予定ラインの両側を押圧する。これにより、ガラス基板11及び樹脂層12を、同時に分断することができる。   As described above, both sides of the planned dividing line are pressed against the laminated substrate G in which the modified region R and the crack C are formed. Thereby, the glass substrate 11 and the resin layer 12 can be divided | segmented simultaneously.

[実施例1]
以上のような加工を行う場合には、照射するレーザ光として、以下のような仕様のレーザ光を用いるのが好ましい。
波長:532nm
レーザ出力:1.0W
走査速度:500mm/s
集光径:φ5μm
パルス幅:0.5nsec
なお、レーザ光の仕様としては、以上の実施例1の仕様以外に、以下の条件によって加工してもよい。
波長:515〜1080nm
パルス幅:50psec〜15nsec
集光レンズのNA:0.17psec〜0.7nsec
[Example 1]
In the case of performing the above processing, it is preferable to use a laser beam having the following specifications as the laser beam to be irradiated.
Wavelength: 532nm
Laser output: 1.0W
Scanning speed: 500mm / s
Condensing diameter: φ5μm
Pulse width: 0.5nsec
In addition to the specification of the first embodiment, the laser light may be processed under the following conditions.
Wavelength: 515-1080nm
Pulse width: 50 psec to 15 nsec
NA of condenser lens: 0.17 psec to 0.7 nsec

[加工装置]
図4に、以上のような加工方法を実施するための加工装置の概略構成を示している。この加工装置25は、レーザ光線発振器26aやレーザ制御部26bを含むレーザ光線発振ユニット26と、レーザ光を所定の方向に導くための複数のミラーを含む伝送光学系27と、伝送光学系27からのレーザ光を集光させるための集光レンズ28と、を有している。レーザ光線発振ユニット26からは、ビーム強度等の照射条件が制御されたパルスレーザ光が出射される。レーザ光線発振ユニット26、伝送光学系27、及び集光レンズ28により、積層基板にレーザ光を照射するレーザ光照射手段が構成されている。
[Processing equipment]
FIG. 4 shows a schematic configuration of a processing apparatus for performing the above processing method. The processing device 25 includes a laser beam oscillation unit 26 including a laser beam oscillator 26 a and a laser control unit 26 b, a transmission optical system 27 including a plurality of mirrors for guiding laser light in a predetermined direction, and a transmission optical system 27. And a condensing lens 28 for condensing the laser beam. From the laser beam oscillation unit 26, pulsed laser light whose irradiation conditions such as beam intensity are controlled is emitted. The laser beam oscillating unit 26, the transmission optical system 27, and the condensing lens 28 constitute a laser beam irradiation unit that irradiates the laminated substrate with laser beams.

例えば、レーザ光線発振器26aとして、発振するレーザ光の周波数やパルス幅の切り替え機構を有する発振器を使用することによって、積層基板の樹脂層の吸収率を変更することができる。レーザ光の波長は、樹脂層で吸収される波長であれば特に限定されないが、例えば、1030〜1080nm(基本波)、基本波の2倍波、600〜980nmの波長を有するレーザ光が使用できる。   For example, the absorptance of the resin layer of the multilayer substrate can be changed by using an oscillator having a mechanism for switching the frequency and pulse width of the oscillating laser light as the laser beam oscillator 26a. The wavelength of the laser beam is not particularly limited as long as it is absorbed by the resin layer. For example, a laser beam having a wavelength of 1030 to 1080 nm (fundamental wave), a double wave of the fundamental wave, and 600 to 980 nm can be used. .

積層基板Gはテーブル29に載置されている。テーブル29は、駆動制御部30によって駆動制御され、水平面内で移動が可能である。すなわち、テーブル29に載置された積層基板Gと、集光レンズ28から照射されるレーザ光線と、は水平面内で相対移動が可能である。また、レーザ光と積層基板Gが載置されるテーブル29とは、相対的に上下方向に移動が可能である。レーザ制御部26b及び駆動制御部30は、加工制御部21によって制御されるようになっている。   The laminated substrate G is placed on the table 29. The table 29 is driven and controlled by the drive control unit 30 and can move in a horizontal plane. That is, the laminated substrate G placed on the table 29 and the laser beam irradiated from the condenser lens 28 can be relatively moved in a horizontal plane. Further, the laser beam and the table 29 on which the laminated substrate G is placed can move relatively in the vertical direction. The laser control unit 26 b and the drive control unit 30 are controlled by the processing control unit 21.

なお、加工制御部31は、マイクロコンピュータで構成されており、レーザ制御部26b及び駆動制御部30を制御して、前述のような加工を実行する。   The processing control unit 31 is configured by a microcomputer, and controls the laser control unit 26b and the drive control unit 30 to execute the processing as described above.

[他の実施形態]
本発明は以上のような実施形態に限定されるものではなく、本発明の範囲を逸脱することなく種々の変形又は修正が可能である。
[Other Embodiments]
The present invention is not limited to the above-described embodiments, and various changes or modifications can be made without departing from the scope of the present invention.

(a)前記実施形態では、ガラス基板の表面に樹脂層が形成された積層基板を例にとって説明したが、脆性材料基板の表面に樹脂層が形成された積層基板であれば、本発明を同様に適用することができる。具体的には、脆性材料基板の材質を、シリコン、アルミナセラミック、LTCC、窒化アルミニウム、窒化シリコンとし、樹脂層の材質を、シリコーン、エポキシ、ソルダーレジストとすることができる。また、樹脂層は、複数の樹脂層が積層された多層膜であってもよい。なお、使用するレーザの波長は、脆性材料基板及び樹脂層の材質に応じて、上述した波長の範囲に限らず、適宜選定することとしてもよい。   (A) In the embodiment described above, a laminated substrate in which a resin layer is formed on the surface of a glass substrate has been described as an example. However, the present invention is similarly applied to a laminated substrate in which a resin layer is formed on the surface of a brittle material substrate. Can be applied to. Specifically, the material of the brittle material substrate can be silicon, alumina ceramic, LTCC, aluminum nitride, or silicon nitride, and the material of the resin layer can be silicone, epoxy, or solder resist. The resin layer may be a multilayer film in which a plurality of resin layers are stacked. Note that the wavelength of the laser to be used is not limited to the above-described wavelength range, and may be appropriately selected according to the material of the brittle material substrate and the resin layer.

(b)また、前記実施形態では、積層基板の樹脂層が形成された側から樹脂層にレーザ光を照射することとしたが、脆性材料基板を透過し樹脂層で吸収されるレーザ照射条件であれば、脆性材料基板側から樹脂層にレーザ光を照射することとしてもよい。   (B) In the above embodiment, the laser light is irradiated onto the resin layer from the side of the laminated substrate on which the resin layer is formed. However, under the laser irradiation conditions that pass through the brittle material substrate and are absorbed by the resin layer. If present, the resin layer may be irradiated with laser light from the brittle material substrate side.

(c)前記実施形態では、積層基板を分断する際に本発明を適用したが、他の加工にも本発明を同様に適用することができる。   (C) In the above embodiment, the present invention is applied when the laminated substrate is divided. However, the present invention can be similarly applied to other processing.

11 ガラス基板
12 ポリエステルフィルム(樹脂層)
G 積層基板
11 Glass substrate 12 Polyester film (resin layer)
G Multilayer substrate

Claims (8)

脆性材料基板と、前記脆性材料基板の表面に形成された樹脂層と、からなる積層基板を準備する第1工程と、
所定の波長のレーザ光を、前記脆性材料基板に集光するようにして前記積層基板に照射し、前記樹脂層のレーザ光照射部分を改質して脆性破壊強度を周囲のそれよりも低下させると同時に前記脆性材料基板に亀裂を生じさせる第2工程と、
を含む積層基板の加工方法。
A first step of preparing a laminated substrate comprising a brittle material substrate and a resin layer formed on the surface of the brittle material substrate;
The laminated substrate is irradiated with a laser beam having a predetermined wavelength so as to be focused on the brittle material substrate, and the laser beam irradiated portion of the resin layer is modified to lower the brittle fracture strength than that of the surroundings. At the same time, a second step of causing a crack in the brittle material substrate,
A method for processing a laminated substrate including:
前記第2工程では、前記樹脂層のレーザ光照射部分の体積を膨張又は変色させて改質を行う、請求項1に記載の積層基板の加工方法。   The method for processing a laminated substrate according to claim 1, wherein in the second step, the modification is performed by expanding or changing a volume of a laser light irradiation portion of the resin layer. 前記第2工程では、前記樹脂層のレーザ光照射部分に亀裂を生じさせて改質を行う、請求項1に記載の積層基板の加工方法。   2. The method for processing a laminated substrate according to claim 1, wherein in the second step, the laser beam irradiation portion of the resin layer is cracked to perform modification. 前記第2工程では、波長が515〜1080nmのレーザ光を照射する、請求項1から3のいずれかに記載の積層基板の加工方法。   4. The method for processing a laminated substrate according to claim 1, wherein in the second step, laser light having a wavelength of 515 to 1080 nm is irradiated. 5. 前記第2工程では、パルス幅が50psec〜15nsecのパルスレーザ光を照射する、請求項1から4のいずれかに記載の積層基板の加工方法。   5. The method for processing a laminated substrate according to claim 1, wherein in the second step, a pulse laser beam having a pulse width of 50 psec to 15 nsec is irradiated. 前記第2工程では、集光レンズのNAが0.17psec〜0.7nsecのパルスレーザ光を照射する、請求項1から5のいずれかに記載の積層基板の加工方法。   6. The method for processing a laminated substrate according to claim 1, wherein in the second step, pulse laser light having a NA of 0.17 psec to 0.7 nsec is applied to the condenser lens. 前記積層基板には分断予定ラインが設定されており、
前記第2工程では、前記分断予定ラインに沿ってレーザ光を照射し、
前記脆性材料基板及び前記樹脂層を、分断予定ラインに沿って分断する第3工程をさらに含む、
請求項1から6のいずれかに記載の積層基板の加工方法。
A line to be divided is set in the laminated substrate,
In the second step, a laser beam is irradiated along the dividing line.
Further includes a third step of dividing the brittle material substrate and the resin layer along a line to be divided.
The processing method of the laminated substrate in any one of Claim 1 to 6.
脆性材料基板の表面に樹脂層が積層された積層基板を加工するための装置であって、
前記積層基板を支持する支持手段と、
所定の波長のレーザ光を、前記脆性材料基板に集光するようにして前記積層基板に照射し、前記樹脂層のレーザ光照射部分を改質して脆性破壊強度を周囲のそれよりも低下させるとともに前記脆性材料基板に亀裂を生じさせるレーザ光照射手段と、
を備えたレーザ光による積層基板の加工装置。
An apparatus for processing a laminated substrate in which a resin layer is laminated on the surface of a brittle material substrate,
Support means for supporting the laminated substrate;
The laminated substrate is irradiated with a laser beam having a predetermined wavelength so as to be focused on the brittle material substrate, and the laser beam irradiated portion of the resin layer is modified to lower the brittle fracture strength than that of the surroundings. And a laser beam irradiation means for generating a crack in the brittle material substrate,
A laminated substrate processing apparatus using a laser beam.
JP2015255698A 2015-03-06 2015-12-28 Processing method of laminated substrate, and processing device of laminated substrate by laser beam Pending JP2016166120A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109514744A (en) * 2017-09-19 2019-03-26 株式会社迪思科 wafer processing method
JP2019050265A (en) * 2017-09-08 2019-03-28 株式会社ディスコ Wafer processing method
CN112334824A (en) * 2018-06-18 2021-02-05 凸版印刷株式会社 Lighting sheet and method for manufacturing the same
EP4357065A4 (en) * 2021-06-14 2025-09-03 Nitto Denko Corp METHOD FOR DIVIDING COMPOSITE MATERIAL

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6871095B2 (en) * 2017-07-14 2021-05-12 株式会社ディスコ Manufacturing method of glass interposer
CN107414289B (en) * 2017-07-27 2019-05-17 京东方科技集团股份有限公司 Laser lift-off method and laser lift-off system
JP6918418B2 (en) * 2017-09-08 2021-08-11 株式会社ディスコ Wafer processing method
JP6918419B2 (en) * 2017-09-08 2021-08-11 株式会社ディスコ Wafer processing method
JP7009027B2 (en) * 2017-09-08 2022-01-25 株式会社ディスコ Wafer processing method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002192370A (en) * 2000-09-13 2002-07-10 Hamamatsu Photonics Kk Laser beam machining method
WO2014030521A1 (en) * 2012-08-21 2014-02-27 旭硝子株式会社 Method for cutting composite sheet, method for cutting glass sheet, and cut piece of composite sheet

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5622540A (en) 1994-09-19 1997-04-22 Corning Incorporated Method for breaking a glass sheet
JP3929393B2 (en) * 2002-12-03 2007-06-13 株式会社日本エミック Cutting device
JP4256214B2 (en) * 2003-06-27 2009-04-22 株式会社ディスコ Plate-shaped material dividing device
JP4563097B2 (en) * 2003-09-10 2010-10-13 浜松ホトニクス株式会社 Semiconductor substrate cutting method
JP4851795B2 (en) * 2006-01-13 2012-01-11 株式会社ディスコ Wafer divider
JP5011048B2 (en) * 2007-09-27 2012-08-29 三星ダイヤモンド工業株式会社 Processing method of brittle material substrate
JP2011200926A (en) * 2010-03-26 2011-10-13 Mitsuboshi Diamond Industrial Co Ltd Laser beam machining method and brittle material substrate
JP5170196B2 (en) * 2010-09-24 2013-03-27 三星ダイヤモンド工業株式会社 Method for dividing brittle material substrate with resin
JP5988599B2 (en) * 2012-02-09 2016-09-07 株式会社ディスコ Workpiece division method
JP2014033164A (en) * 2012-08-06 2014-02-20 Disco Abrasive Syst Ltd Wafer processing method and laser processing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002192370A (en) * 2000-09-13 2002-07-10 Hamamatsu Photonics Kk Laser beam machining method
WO2014030521A1 (en) * 2012-08-21 2014-02-27 旭硝子株式会社 Method for cutting composite sheet, method for cutting glass sheet, and cut piece of composite sheet

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019050265A (en) * 2017-09-08 2019-03-28 株式会社ディスコ Wafer processing method
CN109514744A (en) * 2017-09-19 2019-03-26 株式会社迪思科 wafer processing method
KR20190032193A (en) * 2017-09-19 2019-03-27 가부시기가이샤 디스코 Wafer processing method
JP2019054188A (en) * 2017-09-19 2019-04-04 株式会社ディスコ Wafer processing method
JP7007052B2 (en) 2017-09-19 2022-01-24 株式会社ディスコ Wafer processing method
KR102607962B1 (en) * 2017-09-19 2023-11-29 가부시기가이샤 디스코 Wafer processing method
CN112334824A (en) * 2018-06-18 2021-02-05 凸版印刷株式会社 Lighting sheet and method for manufacturing the same
CN112334824B (en) * 2018-06-18 2024-05-03 凸版印刷株式会社 Light modulation sheet and manufacturing method thereof
EP4357065A4 (en) * 2021-06-14 2025-09-03 Nitto Denko Corp METHOD FOR DIVIDING COMPOSITE MATERIAL

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