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JP2015088694A - Vacuum processing apparatus - Google Patents

Vacuum processing apparatus Download PDF

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JP2015088694A
JP2015088694A JP2013228378A JP2013228378A JP2015088694A JP 2015088694 A JP2015088694 A JP 2015088694A JP 2013228378 A JP2013228378 A JP 2013228378A JP 2013228378 A JP2013228378 A JP 2013228378A JP 2015088694 A JP2015088694 A JP 2015088694A
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vacuum
chamber
vacuum processing
processing
processing apparatus
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JP2015088694A5 (en
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田内 勤
Tsutomu Tauchi
勤 田内
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a vacuum processing apparatus high in productivity per installation area and excellent in processing stability.SOLUTION: A vacuum processing apparatus includes: an atmospheric pressure side block having an atmosphere conveyance chamber where a plurality of cassette mounting bases are disposed on a front side; and a vacuum side block including a plurality of vacuum conveyance chambers 104, 104' disposed behind the atmosphere conveyance chamber in order to divide a conveyance path for a sample before processing and for a sample after processing and a vacuum processing chamber 103 connected to the vacuum conveyance chambers 104, 104' and having a plurality of valves 120, 120' corresponding to the vacuum conveyance chambers 104, 104'.

Description

本発明は、真空処理装置に関する。   The present invention relates to a vacuum processing apparatus.

半導体処理装置、特に、減圧された装置内において処理対象を処理する真空処理装置においては、処理の微細化、精密化とともに、処理対象である半導体被処理基板(以下、「ウェハ」という。)の処理の効率の向上が求められてきた。このために、近年では、一つの装置に複数の処理室が接続されて備えられたマルチチャンバ装置が開発され、クリーンルームの設置面積あたりの生産性の効率を向上させることが行われてきた。   2. Description of the Related Art In a semiconductor processing apparatus, particularly a vacuum processing apparatus that processes a processing target in a decompressed apparatus, a semiconductor substrate to be processed (hereinafter referred to as “wafer”) that is a processing target as well as miniaturization and refinement of the processing. Improvements in processing efficiency have been demanded. For this reason, in recent years, a multi-chamber apparatus in which a plurality of processing chambers are connected to one apparatus has been developed, and the efficiency of productivity per installation area of a clean room has been improved.

このような複数の処理室あるいはチャンバを備えて処理を行う真空処理装置では、それぞれの処理室あるいはチャンバが、内部のガスやその圧力が減圧可能に調節され、ウェハを搬送するためのロボットアーム等が備えられた搬送室(搬送チャンバ)に接続されている。   In such a vacuum processing apparatus that includes a plurality of processing chambers or chambers and performs processing, each processing chamber or chamber is adjusted so that the internal gas and its pressure can be reduced, and a robot arm for carrying a wafer, etc. Is connected to a transfer chamber (transfer chamber) provided with.

設置面積当たりの生産性を向上するためにより多くのチャンバを設置することが求められ、また搬送速度を向上して多くのウェハを搬送することが重要になっている。   In order to improve the productivity per installation area, it is required to install more chambers, and it is important to improve the transfer speed and transfer more wafers.

特表2007−511104号公報Special table 2007-511104 gazette

発明者等は複数のチャンバが備えられた真空処理装置を用いて設置面積当たりの生産性を向上する際の従来技術の課題について検討した結果、以下のことが判った。   The inventors have studied the problems of the prior art when improving the productivity per installation area using a vacuum processing apparatus provided with a plurality of chambers. As a result, the following has been found.

すなわち、真空処理装置を構成するチャンバが複数設置された場合に、処理を行う前のウェハと処理行った後のウェハの混在が発生し、処理中に使用されたガスなどの雰囲気を処理後のウェハが持ち出すことにより、処理前のウェハに影響を与え、今後更に処理の微細化、精密化が進んだ場合に処理の安定性・再現性を阻害する恐れがある。   That is, when a plurality of chambers constituting the vacuum processing apparatus are installed, a mixture of wafers before processing and wafers after processing occurs, and the atmosphere such as gas used during processing is processed after processing. When the wafer is taken out, the wafer before processing is affected, and if the processing is further miniaturized and refined in the future, the stability and reproducibility of the processing may be hindered.

また、複数のチャンバが取り付けられた真空処理装置において、お互いのチャンバ雰囲気の影響を防ぐためにチャンバに設けられたゲートバルブは排他的な動作で同時に開く動作が行えないため、ウェハの搬出が同時に行えず、今後処理速度を向上する上で障害となることが懸念された。   In addition, in a vacuum processing system with multiple chambers attached, the gate valves provided in the chambers cannot be opened simultaneously by exclusive operation in order to prevent the influence of each other's chamber atmosphere. However, there were concerns that it would be an obstacle to improving the processing speed in the future.

このように従来技術では、真空処理装置の設置面積あたりのウェハの処理能力に限界があること及び処理の安定性・再現性が損なわれ将来製品での歩留まりが低下することが危惧された。   As described above, in the prior art, there is a concern that there is a limit to the wafer processing capacity per installation area of the vacuum processing apparatus, and that the stability and reproducibility of the processing are impaired and the yield in future products is reduced.

本発明の目的は、設置面積あたりの生産性が高く、処理の安定性に優れた真空処理装置を提供することにある。   An object of the present invention is to provide a vacuum processing apparatus having high productivity per installation area and excellent processing stability.

上記課題を解決するために、例えば特許請求の範囲に記載の構成と処理手順を採用する。
本願は上記課題を解決する手段を複数含んでいるが、例えば、複数のカセット台が前面側に配置された大気搬送室を有する大気圧側ブロックと、前記大気搬送室の後方に配置された壁に区切られた複数の真空搬送室および前記真空搬送室に接続され、複数の前記真空搬送室に対応した複数のバルブを有する真空処理室を含む真空側ブロックと、を備えたことを特徴とする真空処理装置とする。
In order to solve the above problems, for example, the configuration and processing procedure described in the claims are adopted.
The present application includes a plurality of means for solving the above-described problems. For example, an atmospheric pressure side block having an atmospheric transfer chamber in which a plurality of cassette stands are arranged on the front side, and a wall arranged behind the atmospheric transfer chamber A plurality of vacuum transfer chambers, and a vacuum block connected to the vacuum transfer chamber and including a vacuum processing chamber having a plurality of valves corresponding to the plurality of vacuum transfer chambers. A vacuum processing apparatus is used.

また、処理する試料が挿入されたカセットを載せるためのカセット台が前面側に配置された大気搬送室を有する大気圧側ブロックと、前記大気搬送室に接続されたロック室および前記ロック室に接続された真空搬送室および前記真空搬送室に接続された真空処理室を有する真空側ブロックと、を有する真空処理装置において、
前記真空搬送室は、前記試料を前記ロック室から前記真空処理室に搬送する際に通過する第一領域と、前記真空処理室で処理した後、前記試料を前記ロック室に搬送する際に通過する第二領域とを有し、前記第一領域と第二領域とは互いに分離されており、バルブの開閉により互いに独立して前記真空処理室に接続されるものであることを特徴とする真空処理装置とする。
Further, an atmospheric pressure side block having an atmospheric transfer chamber in which a cassette stand for placing a cassette into which a sample to be processed is placed is arranged on the front side, a lock chamber connected to the atmospheric transfer chamber, and a lock chamber connected to the lock chamber In a vacuum processing apparatus having a vacuum transfer chamber and a vacuum block having a vacuum processing chamber connected to the vacuum transfer chamber,
The vacuum transfer chamber passes through the first region that passes when the sample is transferred from the lock chamber to the vacuum processing chamber, and passes when the sample is transferred to the lock chamber after being processed in the vacuum processing chamber. The first region and the second region are separated from each other, and are connected to the vacuum processing chamber independently of each other by opening and closing a valve. A processing device is used.

本発明によれば、設置面積あたりの生産性が高く、処理の安定性に優れた真空処理装置を提供するができる。   According to the present invention, it is possible to provide a vacuum processing apparatus having high productivity per installation area and excellent processing stability.

本発明の第一及び第二の実施例に係る真空処理装置の全体の構成を説明するための概略上面図である。It is a schematic top view for demonstrating the whole structure of the vacuum processing apparatus which concerns on the 1st and 2nd Example of this invention. 本発明の第一の実施例に係る真空処理装置の要部断面図である。It is principal part sectional drawing of the vacuum processing apparatus which concerns on the 1st Example of this invention. 本発明の第二の実施例に係る真空処理装置において、試料を処理室に搬入し、処理をする場合の要部断面図である。In the vacuum processing apparatus which concerns on the 2nd Example of this invention, it is principal part sectional drawing in the case of carrying a sample in a process chamber and processing. 本発明の第二の実施例に係る真空処理装置において、試料を処理室から搬出する場合の要部断面図である。In the vacuum processing apparatus which concerns on the 2nd Example of this invention, it is principal part sectional drawing in the case of carrying out a sample from a process chamber.

以下、本発明による真空処理装置の実施例を図面により詳細に説明する。   Embodiments of a vacuum processing apparatus according to the present invention will be described below in detail with reference to the drawings.

本発明の第一の実施例に係る真空処理装置の全体の構成の概略について図1を用いて説明する。   An outline of the overall configuration of the vacuum processing apparatus according to the first embodiment of the present invention will be described with reference to FIG.

図1に示す本実施例に係る真空処理室を含む真空処理装置100は、大きく分けて、大気側ブロック101と真空側ブロック102とにより構成される。大気側ブロック101は、大気圧下で被処理物である半導体ウェハ等を搬送、収納位置決め等を行う部分であり、真空側ブロック102は、大気圧から減圧された圧力下でウェハ等の基板状の試料を予め定められた真空処理室内に搬送し、処理を行うブロックである。そして、真空側ブロック102の前述した搬送や処理を行う真空側ブロック102の箇所と大気側ブロック101との間に、試料を内部に有した状態で圧力を大気圧と真空圧との間で上下させる部分(ロック室105)を備えている。   A vacuum processing apparatus 100 including a vacuum processing chamber according to the present embodiment shown in FIG. 1 is roughly composed of an atmosphere side block 101 and a vacuum side block 102. The atmosphere-side block 101 is a part that carries a semiconductor wafer or the like to be processed under atmospheric pressure, performs storage positioning, and the like, and the vacuum-side block 102 is a substrate shape such as a wafer under a pressure reduced from the atmospheric pressure. This sample is a block for transporting the sample into a predetermined vacuum processing chamber and performing processing. And between the location of the vacuum side block 102 which performs the above-mentioned conveyance and processing of the vacuum side block 102 and the atmosphere side block 101, the pressure is increased and lowered between the atmospheric pressure and the vacuum pressure with the sample inside. A portion (lock chamber 105) is provided.

大気側ブロック101は、内部に大気側搬送ロボット109を備えた略直方体形状の筐体106を有し、この筐体106の前面側に取付けられていて、処理用またはクリーニング用の被処理物としての試料(ウェハ)が収納されているカセットがその上に載せられる複数のカセット台107が備えられている。ここでは、カセット台を3個記載したがこの数に限らない。   The atmosphere-side block 101 has a substantially rectangular parallelepiped casing 106 having an atmosphere-side transfer robot 109 inside, and is attached to the front side of the casing 106 as a processing object for processing or cleaning. A plurality of cassette stands 107 are provided on which cassettes in which samples (wafers) are stored are placed. Here, three cassette stands are described, but the number is not limited to this.

真空側ブロック102は、第一の真空搬送室104と大気側ブロック101との間に配置され、試料を大気側と真空側との間でやりとりする試料を内部に有した状態で圧力を大気圧と真空圧との間でやりとりをするロック室105をひとつ又は複数備えている。第一の真空搬送室104は平面形状が略直方形状であり、内部が減圧されその内部に試料が搬送されて、試料を処理する真空処理室103が2面に接続可能である。本実施例では2つを接続する。また他の一辺に第二の真空搬送室110との間で試料をやりとりする真空搬送中間室111を備えている。   The vacuum side block 102 is disposed between the first vacuum transfer chamber 104 and the atmosphere side block 101, and the pressure is set to atmospheric pressure in a state where the sample is exchanged between the atmosphere side and the vacuum side. One or a plurality of lock chambers 105 that communicate between the vacuum pressure and the vacuum pressure are provided. The first vacuum transfer chamber 104 has a substantially rectangular shape in plan view, and the inside of the first vacuum transfer chamber 104 is decompressed and the sample is transferred to the inside, so that the vacuum processing chamber 103 for processing the sample can be connected to two surfaces. In this embodiment, two are connected. In addition, a vacuum transfer intermediate chamber 111 for exchanging samples with the second vacuum transfer chamber 110 is provided on the other side.

さらに、真空搬送中間室111の一方には第一の真空搬送室104が接続され、他の一方には第二の真空搬送室110が接続されている。第二の真空搬送室110も平面形状が略直方形状であり、3つの真空処理室103が接続可能であるが本実施例では2つが接続されている。
この真空側ブロック102は、全体が減圧されて高い真空度の圧力に維持可能な容器である。
Furthermore, the first vacuum transfer chamber 104 is connected to one of the vacuum transfer intermediate chambers 111, and the second vacuum transfer chamber 110 is connected to the other one. The planar shape of the second vacuum transfer chamber 110 is also a substantially rectangular shape, and three vacuum processing chambers 103 can be connected, but in the present embodiment, two are connected.
The vacuum block 102 is a container that can be maintained at a high degree of vacuum by reducing the pressure as a whole.

第一の真空搬送室104および第二の真空搬送室110は、その内部が搬送室とされており、それぞれの搬送室内には、真空下でロック室105と真空処理室103または真空搬送中間室111との間で試料を搬送するための真空搬送ロボット108がその中央に配置されている。この真空搬送ロボット108は、そのアーム上に試料が載せられて、第一の真空搬送室104では真空処理室103に配置された試料台上とロック室105または真空搬送中間室111の何れかとの間で試料の搬入、搬出を行い、第二の真空搬送室110では真空搬送中間室111と真空処理室103との間で試料の搬入、搬出を行う。これら真空処理室103、ロック室105および真空搬送中間室111と真空搬送室104の搬送室との間には、それぞれ気密に閉塞、開放可能なバルブ120により連通する通路が設けられており、この通路は、バルブ120により開閉される。   The inside of the first vacuum transfer chamber 104 and the second vacuum transfer chamber 110 is a transfer chamber, and each of the transfer chambers has a lock chamber 105 and a vacuum processing chamber 103 or a vacuum transfer intermediate chamber under vacuum. A vacuum transfer robot 108 for transferring a sample to and from 111 is disposed at the center thereof. In this vacuum transfer robot 108, a sample is placed on its arm, and in the first vacuum transfer chamber 104, the sample is placed on the sample stage placed in the vacuum processing chamber 103 and either the lock chamber 105 or the vacuum transfer intermediate chamber 111. Samples are carried in and out, and in the second vacuum transfer chamber 110, the samples are carried in and out between the vacuum transfer intermediate chamber 111 and the vacuum processing chamber 103. Between the vacuum processing chamber 103, the lock chamber 105, and the vacuum transfer intermediate chamber 111 and the transfer chamber of the vacuum transfer chamber 104, there are provided passages that are communicated by valves 120 that can be hermetically closed and opened, respectively. The passage is opened and closed by a valve 120.

図2にロック室105と第一の真空搬送室104およびそこに接続された真空処理室103の断面図を示す。   FIG. 2 shows a cross-sectional view of the lock chamber 105, the first vacuum transfer chamber 104, and the vacuum processing chamber 103 connected thereto.

ロック室105、105’と第一の真空搬送室104、104’は上下に複数配置されており、そこにそれぞれ接続される真空搬送室104、104’との間にそれぞれバルブ120、120’を備えている。また、真空搬送室104と104’には、それぞれ独立して制御可能な真空搬送ロボット108、108’が設置されている。真空処理室103は上下に2つのバルブ120、120’を備えており、それぞれが真空搬送室104と真空搬送室104’に接続されている。   A plurality of the lock chambers 105 and 105 ′ and the first vacuum transfer chambers 104 and 104 ′ are arranged above and below, and valves 120 and 120 ′ are respectively provided between the vacuum transfer chambers 104 and 104 ′ connected thereto. I have. The vacuum transfer chambers 104 and 104 'are provided with vacuum transfer robots 108 and 108' that can be independently controlled. The vacuum processing chamber 103 is provided with two valves 120 and 120 'on the upper and lower sides, and each is connected to the vacuum transfer chamber 104 and the vacuum transfer chamber 104'.

次に、図1に示した構成を有する真空処理装置により、試料に対する処理を行う際の試料の搬送過程の概要を説明する。   Next, an outline of a sample transport process when the sample is processed by the vacuum processing apparatus having the configuration shown in FIG. 1 will be described.

複数のカセット台107の何れか上に載せられたカセット内に収納された複数の半導体ウェハ等の試料は、真空処理装置100の動作を調節する図示しない制御装置の判断の下に、または、真空処理装置100が設置される製造ラインの制御装置等からの指令を受けて、その処理が開始される。制御装置からの指令を受けた大気側搬送ロボット109は、カセット内の特定の試料をカセットから取り出し、取り出した試料を大気圧状態のロック室105に搬送する。   Samples such as a plurality of semiconductor wafers housed in a cassette placed on any one of the plurality of cassette tables 107 are subjected to a determination by a control device (not shown) that adjusts the operation of the vacuum processing apparatus 100 or a vacuum. In response to a command from a production line control device or the like on which the processing apparatus 100 is installed, the processing is started. Upon receiving the command from the control device, the atmosphere-side transfer robot 109 takes out a specific sample in the cassette from the cassette, and transfers the taken-out sample to the lock chamber 105 in the atmospheric pressure state.

試料が搬送されて格納されたロック室105は、搬送された試料を収納した状態でバルブ120が閉塞されて密封され所定の圧力まで減圧される。その後、第一の真空搬送室104に面した側のバルブ120が開放されてロック室105と第一の真空搬送室104の搬送室とが連通され、真空搬送ロボット108は、そのアームをロック室105内に伸張させて、ロック室105内の試料を第一の真空搬送室104側に搬送する。真空搬送ロボット108は、そのアームに載せた試料を、カセットから取り出した際に予め定められた真空処理室103又は真空搬送中間室111の何れかに搬入する。   The lock chamber 105 in which the sample is transported and stored is sealed with the valve 120 closed in a state where the transported sample is stored, and the pressure is reduced to a predetermined pressure. Thereafter, the valve 120 on the side facing the first vacuum transfer chamber 104 is opened so that the lock chamber 105 communicates with the transfer chamber of the first vacuum transfer chamber 104, and the vacuum transfer robot 108 moves its arm to the lock chamber. The sample in the lock chamber 105 is transferred to the first vacuum transfer chamber 104 side by being extended into the inside 105. The vacuum transfer robot 108 carries the sample placed on the arm into either the predetermined vacuum processing chamber 103 or the vacuum transfer intermediate chamber 111 when the sample is taken out from the cassette.

試料が所定の真空処理室103に搬送された後、この処理室と第一の真空搬送室104との間を開閉するバルブ120が閉じられて処理室が封止される。その後、処理室内に処理用のガスが導入されて試料が処理される。   After the sample is transferred to the predetermined vacuum processing chamber 103, the valve 120 that opens and closes between the processing chamber and the first vacuum transfer chamber 104 is closed to seal the processing chamber. Thereafter, a processing gas is introduced into the processing chamber to process the sample.

試料の処理が終了し、処理用のガスが停止され、処理室内から処理ガスが排気された後、真空処理室103に設置された他方のバルブ120’を開き、第一の真空搬送室104’に真空搬送ロボット108’により搬送される。その後、真空処理室103側のバルブ120’を閉じロック室105’と接続されたゲートバルブ120’を開にし、真空状態のロック室105’へと搬送される。ロック室105’に試料が搬送されると、このロック室105’と第一の真空搬送室104’の搬送室とを連通する通路を開閉するバルブ120’が閉じられて第一の真空搬送室104’の搬送室が密封され、ロック室105’内の圧力が大気圧まで上昇させられる。なお、真空処理室での処理の終了は、処理時間から求めることもできるし、処理室内の所定ガスの濃度を検出することにより知ることもできる。また、ロック室105と105’内の圧力は独立に制御することができるため、一方を大気圧状態、一方を真空状態とすることができる。   After the processing of the sample is finished, the processing gas is stopped, and the processing gas is exhausted from the processing chamber, the other valve 120 ′ installed in the vacuum processing chamber 103 is opened, and the first vacuum transfer chamber 104 ′ is opened. Is transferred by the vacuum transfer robot 108 '. Thereafter, the valve 120 ′ on the vacuum processing chamber 103 side is closed, the gate valve 120 ′ connected to the lock chamber 105 ′ is opened, and the vacuum chamber 105 ′ is transferred to the vacuum lock chamber 105 ′. When the sample is transported to the lock chamber 105 ′, the valve 120 ′ that opens and closes the passage that connects the lock chamber 105 ′ and the transport chamber of the first vacuum transport chamber 104 ′ is closed, and the first vacuum transport chamber is closed. The transfer chamber 104 ′ is sealed, and the pressure in the lock chamber 105 ′ is increased to atmospheric pressure. Note that the end of the processing in the vacuum processing chamber can be obtained from the processing time or can be known by detecting the concentration of a predetermined gas in the processing chamber. Further, since the pressures in the lock chambers 105 and 105 'can be controlled independently, one can be set to an atmospheric pressure state and the other can be set to a vacuum state.

その後、筐体106の内側のバルブ120’が開放されてロック室105’の内部と筐体106の内部とが連通され、大気側搬送ロボット109は、ロック室105’から元のカセットに試料を搬送してカセット内の元の位置に戻す。   Thereafter, the valve 120 ′ inside the housing 106 is opened to allow the inside of the lock chamber 105 ′ to communicate with the inside of the housing 106, and the atmosphere-side transfer robot 109 transfers the sample from the lock chamber 105 ′ to the original cassette. Transport it back to its original position in the cassette.

以上説明したように試料を搬送することにより、真空処理室103で処理した試料は第一の真空搬送室104’を介してロック室105’へ搬送されるため、処理前の試料が通過するロック室105及び第一の真空搬送室104を、処理後のウェハに付着した所定のガスはその反応生成物により汚染することがない。これにより、処理前の試料の状態を一定にでき(処理品質の向上)、安定して再現性良く処理を実行することができる。なお、本実施例では第一の真空搬送室104、104’とロック室105、105’を配置したが、ロック室は分離せず、第一の真空搬送室のみ分離しても効果が得られる。但し、両者をそれぞれ分離した方がより高い効果を得ることができる。   Since the sample processed in the vacuum processing chamber 103 is transferred to the lock chamber 105 ′ via the first vacuum transfer chamber 104 ′ by transferring the sample as described above, the lock through which the unprocessed sample passes is transferred. The predetermined gas adhering to the processed wafer in the chamber 105 and the first vacuum transfer chamber 104 is not contaminated by the reaction product. Thereby, the state of the sample before processing can be made constant (improvement of processing quality), and processing can be executed stably with good reproducibility. In this embodiment, the first vacuum transfer chambers 104 and 104 ′ and the lock chambers 105 and 105 ′ are arranged. However, the lock chamber is not separated, and the effect can be obtained by separating only the first vacuum transfer chamber. . However, a higher effect can be obtained by separating the two.

また、第一の真空搬送室104、104’及びロック室105、105’を縦に積層して配置することにより、真空処理装置が配置される床面積が増加することはない。   Further, by arranging the first vacuum transfer chambers 104 and 104 ′ and the lock chambers 105 and 105 ′ vertically stacked, the floor area on which the vacuum processing apparatus is disposed does not increase.

真空搬送中間室111及び第二の真空搬送室110も複数配置することにより、又縦に積層して配置することにより、同様の効果が得られる。   The same effect can be obtained by arranging a plurality of vacuum transfer intermediate chambers 111 and second vacuum transfer chambers 110 and also by stacking them vertically.

本実施例では同じ真空搬送室104に備えられたバルブ120、真空処理室104’に備えられたバルブ120’はそれぞれの真空搬送室の中で排他的に開閉される。すなわち、真空搬送中間室111に搬送された試料は第一の真空搬送室104との間を開閉するバルブ120が閉じられて真空搬送中間室111が封止される。その後、真空搬送中間室111と第二の真空搬送室110との間を開閉するバルブ120を開けて、第二の真空搬送室に備えられた真空搬送ロボット108を伸張させて、第二の真空搬送室内110に試料を搬送する。真空搬送ロボット108は、そのアームに載せた試料を、カセットから取り出した際に予め定められたいずれかの真空処理室103に搬送する。   In the present embodiment, the valve 120 provided in the same vacuum transfer chamber 104 and the valve 120 ′ provided in the vacuum processing chamber 104 ′ are opened and closed exclusively in the respective vacuum transfer chambers. That is, the sample transferred to the vacuum transfer intermediate chamber 111 is closed by the valve 120 that opens and closes between the first vacuum transfer chamber 104 and the vacuum transfer intermediate chamber 111. Thereafter, the valve 120 that opens and closes between the vacuum transfer intermediate chamber 111 and the second vacuum transfer chamber 110 is opened, the vacuum transfer robot 108 provided in the second vacuum transfer chamber is extended, and the second vacuum is set. The sample is transferred to the transfer chamber 110. The vacuum transfer robot 108 transfers the sample placed on the arm to one of the predetermined vacuum processing chambers 103 when the sample is taken out from the cassette.

また、1つの真空処理室に備えられたバルブ120とバルブ120’も排他的に制御される。すなわち、処理前の試料と処理後の試料が直接交わることのない状態で搬送される。   Further, the valve 120 and the valve 120 ′ provided in one vacuum processing chamber are controlled exclusively. That is, the sample before processing and the sample after processing are transported in a state where they do not cross each other directly.

以上説明したように、複数のロック室’、複数の第一の真空搬送室、複数の真空搬送中間室、複数の第二の真空搬送室を独立して制御することにより、スループットが向上する等搬送効率を向上することができる。
以上、本実施例によれば、設置面積あたりの生産性が高く、処理の安定性に優れた真空処理装置を提供することができる。
As described above, the throughput is improved by independently controlling the plurality of lock chambers', the plurality of first vacuum transfer chambers, the plurality of vacuum transfer intermediate chambers, and the plurality of second vacuum transfer chambers, etc. The conveyance efficiency can be improved.
As described above, according to this embodiment, it is possible to provide a vacuum processing apparatus with high productivity per installation area and excellent processing stability.

本発明に係る第2の実施例について図2と図3を用いて説明する。なお、実施例1に記載され本実施例に未記載の事項は特段の事情がない限り本実施例にも適用することができる。   A second embodiment according to the present invention will be described with reference to FIGS. Note that the matters described in the first embodiment and not described in the present embodiment can be applied to the present embodiment as long as there is no special circumstances.

図3は、本実施例に係る真空処理装置において、試料を処理室に搬入する場合の要部断面図である。また、図4は、試料を処理室から搬出する場合の要部断面図である。大気圧ブロック側やロック室105、105’から第一の真空搬送室104、104’までの構成は図2と同様であり、真空処理室103に備えられたステージ210は図示しない上下機構を有している。試料を、第一の真空搬送室104から真空処理室103に搬入するために、第一の真空搬送室104と真空処理室103の間に備えられたバルブ120を開く場合は、ステージ210を上方に移動し真空処理室内の容積を小さくして、試料の処理中は無駄な空間を排除する構造とした。図3の状態でガスが導入され、ポンプ220で排気を行い処理が行われる。試料の処理が終了したことが検出されると、図4に示すとおり、ステージ210は下方に下降し、第一の真空搬送室104’と真空処理室103との間のバルブ120’が開き、第一の真空搬送室104’へ真空搬送ロボット108により試料が搬送される。   FIG. 3 is a cross-sectional view of a main part when a sample is carried into the processing chamber in the vacuum processing apparatus according to the present embodiment. FIG. 4 is a cross-sectional view of the main part when the sample is carried out of the processing chamber. The structure from the atmospheric pressure block side and the lock chambers 105 and 105 ′ to the first vacuum transfer chambers 104 and 104 ′ is the same as that in FIG. 2, and the stage 210 provided in the vacuum processing chamber 103 has a vertical mechanism (not shown). doing. When the valve 120 provided between the first vacuum transfer chamber 104 and the vacuum processing chamber 103 is opened in order to transfer the sample from the first vacuum transfer chamber 104 to the vacuum processing chamber 103, the stage 210 is moved upward. The volume inside the vacuum processing chamber is reduced to eliminate the useless space during sample processing. Gas is introduced in the state of FIG. 3 and exhausted by the pump 220 for processing. When it is detected that the processing of the sample is completed, as shown in FIG. 4, the stage 210 is lowered downward, and the valve 120 ′ between the first vacuum transfer chamber 104 ′ and the vacuum processing chamber 103 is opened, The sample is transferred to the first vacuum transfer chamber 104 ′ by the vacuum transfer robot 108.

この場合もバルブ120とバルブ120’は排他的に制御され処理前後の試料が交わることのない状態で処理される。   Also in this case, the valve 120 and the valve 120 ′ are controlled exclusively and processed in a state where the samples before and after the processing do not intersect.

本実施例は、真空処理室103にバルブ120、120’を2個設置することで大きくなった容積を従来装置同様に処理容積にすることが出来、試料処理を複数のバルブを持たない真空処理室と同様な処理が可能となる。   In this embodiment, the volume increased by installing two valves 120 and 120 ′ in the vacuum processing chamber 103 can be made the processing volume as in the conventional apparatus, and the sample processing can be performed by vacuum processing without a plurality of valves. Processing similar to that in the room can be performed.

以上、本実施例においても実施例1と同様の効果を得ることができる。また、真空処理室を仕切る手段を備えることにより、処理時の処理室内容積を低減でき、導入ガス量の低減、排気効率の向上等を図ることができる。   As described above, also in the present embodiment, the same effect as in the first embodiment can be obtained. Further, by providing means for partitioning the vacuum processing chamber, the processing chamber volume during processing can be reduced, and the amount of introduced gas can be reduced, the exhaust efficiency can be improved, and the like.

なお、本発明は上記した実施例に限定されるものではなく、様々な変形例が含まれる。例えば、上記した実施例は本発明を分かりやすく説明するために詳細に説明したものであり、必ずしも説明した全ての構成を備えるものに限定されるものではない。また、ある実施例の構成の一部を他の実施例の構成に置き換えることも可能であり、また、ある実施例の構成に他の実施例の構成を加えることも可能である。また、各実施例の構成の一部について、他の構成の追加・削除・置換をすることが可能である。   In addition, this invention is not limited to an above-described Example, Various modifications are included. For example, the above-described embodiments have been described in detail for easy understanding of the present invention, and are not necessarily limited to those having all the configurations described. Further, a part of the configuration of a certain embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of a certain embodiment. Further, it is possible to add, delete, and replace other configurations for a part of the configuration of each embodiment.

100…真空処理装置、101…大気側ブロック、102…真空側ブロック、103…真空処理室、104、104’…第一の真空搬送室、105、105’…ロック室、106…筐体、107…カセット台、108、108’…真空搬送ロボット、109…大気搬送ロボット、110…第二の真空搬送室、111…真空搬送中間室、120、120’…バルブ、210…ステージ、220…ポンプ。 DESCRIPTION OF SYMBOLS 100 ... Vacuum processing apparatus, 101 ... Atmosphere side block, 102 ... Vacuum side block, 103 ... Vacuum processing chamber, 104, 104 '... First vacuum transfer chamber, 105, 105' ... Lock chamber, 106 ... Housing, 107 ... cassette stage, 108, 108 '... vacuum transfer robot, 109 ... atmospheric transfer robot, 110 ... second vacuum transfer chamber, 111 ... vacuum transfer intermediate chamber, 120, 120' ... valve, 210 ... stage, 220 ... pump.

Claims (7)

複数のカセット台が前面側に配置された大気搬送室を有する大気圧側ブロックと、前記大気搬送室の後方に配置された壁に区切られた複数の真空搬送室および前記真空搬送室に接続され、複数の前記真空搬送室に対応した複数のバルブを有する真空処理室を含む真空側ブロックと、を備えたことを特徴とする真空処理装置。   Connected to the atmospheric pressure side block having an atmospheric transfer chamber having a plurality of cassette stands arranged on the front side, a plurality of vacuum transfer chambers partitioned by a wall arranged behind the atmospheric transfer chamber, and the vacuum transfer chamber And a vacuum block including a vacuum processing chamber having a plurality of valves corresponding to the plurality of vacuum transfer chambers. 請求項1に記載の真空処理装置において、
前記バルブは、前記真空搬送室が各々に連結された前記真空処理室との間を開閉するものであり、排他的に開閉されることを特徴とする真空処理装置。
The vacuum processing apparatus according to claim 1,
The said valve | bulb opens and closes between the said vacuum processing chamber with which the said vacuum conveyance chamber was each connected, The vacuum processing apparatus characterized by the above-mentioned.
請求項1又は2に記載の真空処理装置であって
前記真空処理室には上下動可能なステージと前記ステージで封止可能な壁が設置されていることを特徴とする真空処理装置。
The vacuum processing apparatus according to claim 1, wherein a stage that can be moved up and down and a wall that can be sealed by the stage are installed in the vacuum processing chamber.
処理する試料が挿入されたカセットを載せるためのカセット台が前面側に配置された大気搬送室を有する大気圧側ブロックと、前記大気搬送室に接続されたロック室および前記ロック室に接続された真空搬送室および前記真空搬送室に接続された真空処理室を有する真空側ブロックと、を有する真空処理装置において、
前記真空搬送室は、前記試料を前記ロック室から前記真空処理室に搬送する際に通過する第一領域と、前記真空処理室で処理した後、前記試料を前記ロック室に搬送する際に通過する第二領域とを有し、前記第一領域と第二領域とは互いに分離されており、バルブの開閉により互いに独立して前記真空処理室に接続されるものであることを特徴とする真空処理装置。
An atmospheric pressure side block having an atmospheric transfer chamber in which a cassette stage for placing a cassette into which a sample to be processed is placed is arranged on the front side, a lock chamber connected to the atmospheric transfer chamber, and a lock chamber connected to the lock chamber In a vacuum processing apparatus having a vacuum transfer chamber and a vacuum block having a vacuum processing chamber connected to the vacuum transfer chamber,
The vacuum transfer chamber passes through the first region that passes when the sample is transferred from the lock chamber to the vacuum processing chamber, and passes when the sample is transferred to the lock chamber after being processed in the vacuum processing chamber. The first region and the second region are separated from each other, and are connected to the vacuum processing chamber independently of each other by opening and closing a valve. Processing equipment.
請求項4に記載の真空処理装置において、
前記第一領域と前記第二領域は、前記真空搬送室内で縦方向に積層されて配置されていることを特徴とする真空処理装置。
The vacuum processing apparatus according to claim 4, wherein
The vacuum processing apparatus, wherein the first region and the second region are stacked in the vertical direction in the vacuum transfer chamber.
請求項4又は5に記載の真空処理装置において、
前記第一領域には第一真空搬送ロボットが、前記第二領域には第二真空搬送ロボットが配置されており、
前記第一真空ロボットと前記第二真空ロボットとは互いに独立して制御可能であることを特徴とする真空処理装置。
In the vacuum processing apparatus according to claim 4 or 5,
A first vacuum transfer robot is disposed in the first area, and a second vacuum transfer robot is disposed in the second area.
The vacuum processing apparatus, wherein the first vacuum robot and the second vacuum robot can be controlled independently of each other.
請求項6に記載の真空処理装置において、
前記第一真空搬送ロボットは、前記試料を前記真空処理室へ搬送する搬入専用ロボットであり、
前記第二真空搬送ロボットは、前記試料を真空処理室から搬送する搬出専用ロボットであることを特徴とする真空処理装置。
The vacuum processing apparatus according to claim 6,
The first vacuum transfer robot is a dedicated robot for transferring the sample to the vacuum processing chamber,
The vacuum processing apparatus according to claim 2, wherein the second vacuum transfer robot is a robot for carrying out the sample from the vacuum processing chamber.
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