JP2015053502A - Multilayer ceramic capacitor - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a multilayer ceramic capacitor with high reliability which has no structural defect, less decrease in coverage of an inner electrode which is a ratio at which the inner electrode covers a dielectric ceramic layer.SOLUTION: In a multilayer ceramic capacitor including a plurality of dielectric ceramic layers and a ceramic laminate body having a plurality of inner electrodes laminated via the dielectric ceramic layers, a dielectric ceramic layer 11 contains a perovskite type compound having Ba and Ti, and an inner electrode 12 is configured by including: (a) Ni as a main component; (b) a segregation 20a which is scattered in the inner electrode in a manner of being buried in the inner electrode and contains the perovskite type compound having Ba and Ti at a ratio of no less than 2%; (c) a columnar segregation 20b which penetrates through the inner electrode from one principal surface side to the other principal surface side and contains the perovskite type compound having Ba and Ti at a ratio of no more than 5%, or no segregation 20b. Further, an average thickness of the inner electrode is set to be no more than 0.4 μm.

Description

  The present invention relates to a multilayer ceramic capacitor, and more particularly, to a multilayer ceramic capacitor including a ceramic multilayer body (capacitor body) having a plurality of dielectric ceramic layers and a plurality of internal electrodes laminated via the dielectric ceramic layers.

  In recent years, with the reduction in size and weight of electronic devices, multilayer ceramic capacitors that are small in size and capable of acquiring a large capacity are widely used. For example, the multilayer ceramic capacitor is electrically connected to a ceramic multilayer body (capacitor body) having a plurality of dielectric ceramic layers and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric ceramic layers. As such, those having a structure in which external electrodes are arranged are widely known.

As such a multilayer ceramic capacitor, barium titanate is contained as a main component, and a component represented by (1-x) BaZrO ₃ + xSrZrO ₃ is contained in BaZrO ₃ and SrZrO _{3 with} respect to 100 mol of barium titanate. 5 to 15 mol in terms of conversion, 3 to 5 mol in terms of Mg oxide in terms of MgO, 4 to 6 mol in terms of oxide of rare earth elements in terms of R ₂ O ₃ , at least one selected from Mn, Cr, Co and Fe The elemental oxide contains 0.5 to 1.5 mol in terms of MnO, Cr ₂ O ₃ , Co ₃ O ₄ and Fe ₂ O ₃ , and the compound containing Si contains _{2.5 to 4} mol in terms of Si. A multilayer ceramic capacitor (multilayer ceramic capacitor) in which an internal electrode made of nickel is disposed in a dielectric using a dielectric ceramic composition in which x is 0.4 to 0.9 has been proposed.

  The dielectric ceramic composition described above has a high relative dielectric constant under high electric field strength and good temperature characteristics and reliability even when the dielectric ceramic layer is thinned. For this reason, it is said that a multilayer ceramic capacitor having a high temperature load life can be obtained even in a multilayer ceramic capacitor using the same.

  In recent years, however, dielectric ceramic layers and internal electrodes have been made thinner and multilayered for the purpose of downsizing and increasing the capacity of multilayer ceramic capacitors, and structural defects such as cracks and delamination and coverage of internal electrodes As a result of such problems, a more reliable multilayer ceramic capacitor has been demanded.

JP 2011-207696 A

  The present invention solves the above-described problems, and provides a highly reliable multilayer ceramic capacitor that is free from structural defects and has a low internal electrode coverage reduction that is a ratio of the internal electrode covering the dielectric ceramic layer. The purpose is to provide.

In order to solve the above problems, the multilayer ceramic capacitor of the present invention is
A ceramic laminate comprising a plurality of dielectric ceramic layers and a plurality of internal electrodes laminated via the dielectric ceramic layers, and an external electrode disposed in the ceramic laminate so as to be electrically connected to the internal electrodes A multilayer ceramic capacitor comprising:
The dielectric ceramic layer includes a perovskite type compound having Ba and Ti,
The internal electrode is
(A) Ni as a main component,
(B) containing a segregated material including a perovskite type compound having Ba and Ti, which is scattered in the internal electrode in such a manner as to be buried in the internal electrode, in a ratio of 2% or more;
(C) A columnar segregated material containing a perovskite type compound having Ba and Ti that penetrates the internal electrode from one main surface side to the other main surface side is contained in a proportion of 5% or less. Characteristic multilayer ceramic capacitor.

  In the multilayer ceramic capacitor of the present invention, it is preferable that the average thickness of the internal electrodes is 0.4 μm or less.

  By setting the average thickness of the internal electrodes to 0.4 μm or less, it is possible to suppress the structural defects and make the effect of preventing the deterioration of the coverage of the internal electrodes more remarkable.

  As described above, the multilayer ceramic capacitor of the present invention is a perovskite type having Ba and Ti, in which the internal electrode mainly composed of Ni is scattered in the internal electrode in such a manner that (a) it is buried in the internal electrode. A columnar segregated material containing a perovskite type compound having Ba and Ti, containing a segregated material containing a compound in a ratio of 2% or more and (b) penetrating the internal electrode from one main surface side to the other main surface side. 5% or less is contained or not contained, so that the linear expansion coefficient of the internal electrode mainly composed of Ni is brought close to the linear expansion coefficient of the dielectric ceramic layer, and the dielectric ceramic layer and the internal Providing highly reliable multilayer ceramic capacitors that are free from structural defects such as cracks and delamination due to the difference in coefficient of linear expansion from the electrodes, and that the internal electrode coverage is not reduced. Rukoto becomes possible.

  In addition, since the columnar segregated material penetrating the internal electrode lowers the coverage of the internal electrode, the content is preferably small and may not be included.

It is sectional drawing which shows the structure of the multilayer ceramic capacitor concerning embodiment of this invention. 1 is a perspective view showing a configuration of a multilayer ceramic capacitor according to an embodiment of the present invention. The figure which shows typically the state in which the segregated material scattered in the internal electrode in the aspect which is buried in the internal electrode of the multilayer ceramic capacitor of this invention, and the columnar segregated material which penetrates an internal electrode exist. It is. It is a figure for demonstrating the method to investigate the existing rate of the segregated substance containing the perovskite type compound which has Ba and Ti contained in an internal electrode, and the method to investigate the average thickness of an internal electrode.

  Embodiments of the present invention will be described below to describe the features of the present invention in more detail.

[Embodiment 1]
(1) Production of barium titanate powder In order to obtain a dielectric ceramic raw material, BaCO ₃ and TiO ₂ powders having a purity of 99% by weight or more were prepared in a ratio of Ba: Ti = 1: 1.
Next, this blended powder was wet-mixed with a ball mill and uniformly dispersed, and then subjected to a drying treatment to obtain an adjusted powder. The obtained adjusted powder was calcined at 1000 ° C. to obtain barium titanate powder as a main component powder having an average particle diameter of 150 nm.

On the other hand, MgO, Al ₂ O ₃ , V ₂ O ₅ , MnO ₂ , Dy ₂ O ₃ , and SiO ₂ powders (subcomponent powders) were prepared as subcomponents.
Next, the MgO, Al ₂ O ₃ , V ₂ O ₅ , MnO ₂ , Dy ₂ O ₃ , and SiO ₂ powders have a content of Mg, Al, V, Mn, Dy, and Si with respect to 100 mole parts of Ti. Weighed so as to be fixed (Mg1.3 mol part, Al0.5 mol part, V0.1 mol part, Mn0.1 mol part, Dy1.0 mol part, Si1.5 mol part) By adding, a mixed powder was obtained.
This mixed powder was wet-mixed with a ball mill and uniformly dispersed, and then subjected to a drying treatment to obtain a dielectric ceramic raw material.

(2) Production of ceramic green sheet for dielectric ceramic layer Next, a polyvinyl butyral binder, a plasticizer and ethanol as an organic solvent are added to the dielectric ceramic raw material, and these are wet-mixed by a ball mill to obtain a ceramic slurry. Produced. And this ceramic slurry was sheet-formed by a lip method to obtain a rectangular ceramic green sheet.

(3) Preparation of conductive paste Ni powder having an average particle size of 0.2 μm, which is a conductive component, was prepared. Further, an additive (for co-material) barium titanate powder to be added to the conductive paste having the same average particle diameter of 0.02 μm as the above-mentioned main component powder was prepared.

Further, for addition (for common material), Dy is 1.0 mol part and Mg is 1.3 mol part with respect to 100 mol parts of Ti in the above-mentioned additive (common material) barium titanate powder. ) Dy ₂ O ₃ powder and MgO powder for addition (for common material) were prepared.
In addition, an organic vehicle in which ethylcellulose was dissolved in terpineol was prepared.

And the powders prepared as described above (Ni powder, additive (for co-material) barium titanate powder, additive (for co-material) MgO powder, additive (for co-material) Dy ₂ O ₃ powder) A three-roll mill was used to disperse in the organic vehicle to produce a conductive paste for forming internal electrodes.

In addition, the compounding amount of powder for common materials (additive (for common materials) barium titanate, additive (for common materials) MgO powder, additive (for common materials) Dy ₂ O ₃ powder) It mixed so that the powder for co-material might be the ratio (wt%) shown in Table 1 with respect to 100 parts by weight of Ni.

(4) Production of monolithic ceramic capacitor (4-1) Printing of conductive paste on ceramic green sheet The conductive paste produced as described above is screen-printed on the ceramic green sheet, and the conductive to be used as an internal electrode. Conductive paste film (internal electrode pattern) was formed.

(4-2) Lamination Next, 300 layers of the ceramic green sheet on which the conductive paste film is formed are laminated so that the side from which the conductive paste film is drawn is alternate, and the conductive paste is formed on both sides of the lamination direction. A ceramic green sheet for an outer layer on which no film was formed was laminated to obtain an unfired laminate that became a capacitor body after firing.

(4-3) Firing The obtained laminate was heated in a N ₂ atmosphere at a temperature of 350 ° C. for 3 hours to burn the binder, and then kept at a heating rate of 100 ° C./min and a maximum temperature of 1200 ° C. for 10 minutes. And calcining under conditions of a reducing atmosphere composed of H ₂ —N ₂ —H ₂ O gas having an oxygen partial pressure of 10 ⁻⁴ MPa. In addition, the cooling rate was the rate shown in Table 1. As a result, a sintered capacitor body (ceramic laminate) was obtained.

(4-4) Formation of External Electrode Next, a Cu paste containing glass frit is applied to both end faces of the capacitor main body and baked at a temperature of 800 ° C. in an N ₂ atmosphere to electrically connect with the internal electrode. A connected external electrode was formed.
Thereby, the multilayer ceramic capacitor (sample) 50 of the sample numbers 1-10 of Table 1 which has a structure as shown in FIG. 1 and FIG. 2 was obtained.

  The external dimensions of the multilayer ceramic capacitor thus obtained are as follows: length L = 1.0 mm when the dimension in the L direction in FIG. 2 is the length, the dimension in the W direction is the width, and the dimension in the T direction is the thickness. The width W was 0.5 mm and the thickness T was 0.5 mm.

(4-5) Configuration of Multilayer Ceramic Capacitor As shown in FIGS. 1 and 2, the multilayer ceramic capacitor 50 includes a plurality of laminated dielectric ceramic layers 11 and a plurality of interfaces between the dielectric ceramic layers 11. The ceramic laminated body (capacitor main body) 10 having a plurality of internal electrodes 12 disposed on the two sides of the ceramic laminated body 10 and the internal electrodes 12 drawn alternately on the opposite end faces are connected to both end faces of the ceramic laminated body 10. And a pair of external electrodes 13a, 13b. The external electrodes 13a and 13b may be configured to include a Ni plating layer and a Sn plating layer.

  In the multilayer ceramic capacitor 50 according to the embodiment of the present invention, the internal electrodes 12 are scattered in the internal electrodes 12 in such a manner that the internal electrodes 12 are entirely buried in the internal electrodes 12 as schematically shown in FIG. The segregated material 20a and the columnar segregated material 20b penetrating the internal electrode 12 from one main surface side to the other main surface side (in the thickness direction) are included. The segregated material 20 a scattered in the internal electrode 12 is surrounded by the internal electrode 12. The columnar segregated material 20 b penetrating the internal electrode 12 is in contact with the two dielectric ceramic layers 11 disposed above and below the thickness direction of the internal electrode 12.

  The segregated material 20a which does not penetrate the former internal electrode 12 and is scattered in a manner such that the whole is buried in the internal electrode 12 includes the linear expansion coefficient of the internal electrode 12 mainly composed of Ni, and the dielectric ceramic layer. 11 is reduced, the occurrence of structural defects such as cracks and delamination is prevented, and the decrease in the coverage of the internal electrode, which is the ratio of the internal electrode covering the dielectric ceramic layer, is suppressed. Fulfills the function.

  On the other hand, the columnar segregated material 20b penetrating the internal electrode 12 lowers the coverage of the internal electrode 12 (the ratio in which the internal electrode 12 covers the dielectric ceramic layer 11), so that the content is preferably small. It is a segregated material that may not be contained.

(5) Presence ratio of segregated matter including perovskite type compound having Ba and Ti scattered in internal electrode About samples of sample numbers 1 to 10 in Table 1 prepared as described above, by the method described below The segregated material 20a interspersed in the internal electrode 12, that is, a segregation containing a perovskite-type compound having Ba and Ti, which does not penetrate the internal electrode 12 and is scattered in a manner such that the whole is buried in the internal electrode 12. The existence ratio of the product 20a (see FIG. 3) was examined. In this embodiment, the abundance ratio of the segregated material 20a was examined by TEM-EDX analysis.
Hereinafter, with reference to FIG. 4, a method for confirming the existence ratio of segregated substances scattered in the internal electrode will be described.

First, three samples (multilayer ceramic capacitors) shown in Table 1 are prepared, and the surface (LT surface) defined by the length direction (L direction) and the thickness direction (T direction) of the sample is exposed. The periphery of each sample was hardened with resin.
Next, the LT side surface of the sample was polished by a polishing machine. At this time, polishing was performed to a depth of about 1/4 of the width direction (W direction) of the sample, and the LT surface (LT polished end surface), which was a polished surface, was exposed. In order to eliminate sagging of the internal electrode due to polishing, the polished surface was processed by ion milling after polishing.

Then, as shown in FIG. 4, the region where the internal electrode 12 is laminated at the center in the L direction is divided into three equal parts in the T direction, and divided into three regions, an upper region, an intermediate region, and a lower region. And the central part vicinity of each area | region was made into thin pieces and the thin piece sample with a thickness of 100 nm was produced.
Similarly, a thin piece sample was produced at a depth of about ½ in the width direction (W direction) of the sample and a depth of about ¾. Therefore, the number of samples 3 × 3 polished surfaces × 3 regions = 27 thin sample samples were produced.

  The visual field range of observation in each region was set to a range in which two layers of internal electrodes can be observed in the stacking direction in the vertical direction (stacking direction, T direction). Further, the visual field range in the lateral direction (direction perpendicular to the stacking direction, L direction) is the same length as the visual field range in the stacking direction (T direction).

  Then, from the result of the TEM-EDX analysis, using the image processing software, the area of the internal electrode in the image (the area where the segregated material 20a containing the perovskite type compound having Ba and Ti is present, and And the area of the segregated segregated material 20a including the perovskite type compound having Ba and Ti).

Then, the presence ratio of the segregated material 20a scattered in the internal electrode 12 was determined by the following formula (1).
Presence ratio (%) of segregated substances scattered on internal electrodes = (area of segregated substances / area of internal electrodes) × 100 (1)

In this embodiment, the ratio of the segregated substances scattered on the internal electrodes is an average value of 27 thin sample samples.
Table 1 shows the abundance ratio (%) of segregated substances scattered in the internal electrode, obtained as described above.

(6) Presence ratio of columnar segregates containing a perovskite type compound having Ba and Ti penetrating through the internal electrode Presence ratio of columnar segregates containing a perovskite type compound having Ba and Ti penetrating the internal electrode is The method described below was performed by WDX analysis.
Hereinafter, a method for confirming the existence ratio of the columnar segregated material penetrating the internal electrode will be described with reference to FIG.
First, three samples (multilayer ceramic capacitors) shown in Table 1 are prepared, and the surface (LT surface) defined by the length direction (L direction) and the thickness direction (T direction) of the sample is exposed. The periphery of each sample was hardened with resin.

  Next, the LT side surface of the sample was polished by a polishing machine. At this time, polishing was performed to a depth of about 1/4 of the width direction (W direction) of the sample, and the LT surface (LT polished end surface), which was a polished surface, was exposed. In order to eliminate sagging of the internal electrode due to polishing, the polished surface was processed by ion milling after polishing.

  For the polished sample, as shown in FIG. 4, the region where the internal electrode 12 is laminated is divided into three equal parts in the T direction at a position about 1/2 of the L polishing end face of the sample in the L direction. The area was divided into three areas: an area, an intermediate area, and a lower area.

WDX analysis was performed near the center of each region. The viewing field range in each region was set to a range in which five internal electrodes could be observed in the stacking direction in the vertical direction (stacking direction, T direction). The visual field range in the horizontal direction (direction perpendicular to the stacking direction, L direction) was the same as the visual field range in the stacking direction (T direction).
Similarly, WDX analysis was performed at a depth of about ½ in the width direction (W direction) of the sample and a depth of about ¾. Therefore, WDX analysis was performed on 3 samples × 3 polishing surfaces × 3 regions = 27 locations.

  Using the image processing software, the area of the internal electrode in the image (the area where the segregated material 20a containing the perovskite type compound having Ba and Ti exists, and the perovskite type having the columnar Ba and Ti are present. And the area of the columnar segregated material including the perovskite type compound having Ba and Ti penetrating the internal electrode.

And the abundance ratio of the columnar segregated material 20b penetrating the internal electrode 12 was determined by the following formula (2).
Presence ratio of columnar segregated material penetrating internal electrode (%) = (area of columnar segregated material penetrating internal electrode / area of internal electrode) × 100 (2)
In this embodiment, the ratio of the columnar segregated material penetrating through the internal electrode is the average value of the number of samples 3 × 3 polished surfaces × 3 regions.
Table 1 shows the abundance (%) of columnar segregated material penetrating the internal electrode, as determined above.

(7) Measurement of average thickness of internal electrode The thickness of the internal electrode layer was measured using a scanning electron microscope. Hereinafter, a method for measuring the average thickness of the internal electrodes will be described with reference to FIG.
First, three samples (multilayer ceramic capacitors) shown in Table 1 are prepared, and the surface (LT surface) defined by the length direction (L direction) and the thickness direction (T direction) of the sample is exposed. The periphery of each sample was hardened with resin.

  Next, the LT side surface of the sample was polished by a polishing machine. At this time, polishing was performed to a depth of about ½ of the width direction (W direction) of the sample to expose the LT surface (LT polished end surface) as a polished surface. In order to eliminate sagging of the internal electrode due to polishing, the polished surface was processed by ion milling after polishing.

  For the polished sample, the thickness of the internal electrode was measured. In measuring the thickness of the internal electrode, as shown in FIG. 4, a straight line L <b> 1 that is substantially orthogonal to the internal electrode 12 is drawn (assumed) at a position about ½ of the LT polished end face of the sample in the L direction.

  Next, the region where the internal electrode 12 of the sample was laminated was divided into three equal parts in the T direction, and was divided into three regions: an upper region, an intermediate region, and a lower region.

Except for the outermost internal electrode in each region, five internal electrodes on the straight line L1 were randomly selected in each region, and the thickness was measured. The thickness of the internal electrode layer was measured using a scanning electron microscope.
Therefore, the average thickness of the internal electrodes in the first embodiment is the average value of the thicknesses of the internal electrodes at the number of samples 3 × 3 regions × 5 layers = 45 locations.
However, parts that could not be measured due to a lack of internal electrodes were excluded from the measurement target.
Table 1 shows the average thickness of the internal electrodes determined as described above.

(8) Measurement of coverage of internal electrode The coverage which is the ratio which the internal electrode has coat | covered the dielectric ceramic layer among the area | regions where the internal electrode 12 is arrange | positioned was measured with the following method.

First, five samples (multilayer ceramic capacitors) shown in Table 1 were prepared, and the ceramic laminate (capacitor body) was peeled and divided along the interface between the internal electrode and the dielectric ceramic layer near the center in the T direction. The vicinity of the central portion of the exposed internal electrode (position of about 1/2 in the L direction and about 1/2 in the W direction) of the internal electrode is observed with a microscope having a magnification of 500 times. By taking a 500-fold photomicrograph and performing image processing, the coverage of the internal electrode (ratio of the area where the internal electrode exists) was quantified, and an average value was obtained.
If the coverage of the internal electrode is less than 80%, it is not preferable because the intended capacitance cannot be obtained.
Table 1 shows the measurement results of the internal electrode coverage.

(9) Confirmation of Structural Defect Generation State In order to investigate the structural defect occurrence state, the number of samples with delamination and cracks was examined by the following method.

  First, 72 samples (multilayer ceramic capacitors) shown in Table 1 were prepared. The prepared samples were examined for the presence or absence of delamination and cracks (number of samples generated) by an ultrasonic flaw detection test.

The results are shown in Table 1. In Table 1, the relationship between the number of samples in which either delamination or cracks occurred and the number of samples used in the test (number of samples in which either delamination or cracks occurred / number of samples used in the test) is shown. Show.
In Table 1, the sample numbered with * is a sample outside the scope of the present invention.

  In Table 1, the common material indicates the ratio (wt%) of the barium titanate powder for common material to 100 parts by weight of Ni constituting the internal electrode.

<Evaluation>
As shown in Table 1, the segregated material containing a perovskite compound having Ba and Ti, which is scattered in the internal electrode, is contained at a ratio of 2% or more, and the internal electrode is disposed from one main surface side to the other main surface. In the case of the sample of Sample Nos. 1 to 5 having a columnar segregated material containing a perovskite type compound having Ba and Ti penetrating to the side, that is, the sample satisfying the requirements of the present invention, It was confirmed that a multilayer ceramic capacitor having a high coverage of 80% or more and free from structural defects such as delamination and cracks can be obtained.

  In the case of sample numbers 1 to 5 in Table 1 that satisfy the requirements of the present invention, the temperature drop rate in the firing process is as high as 100 ° C./min. Therefore, the common material in the internal electrode (perovskite type compound having Ba and Ti is The substance which becomes a segregated substance) is not easily discharged in the temperature lowering process, and tends to remain in the internal electrode. As a result, the content of segregated material containing the perovskite type compound having Ba and Ti scattered in the internal electrode becomes 2% or more, and the linear expansion coefficient of the internal electrode (Ni electrode) is the linear expansion coefficient of the dielectric ceramic layer. It is considered that structural defects are less likely to occur because

  On the other hand, the content of the segregated material including the perovskite type compound having Ba and Ti scattered in the internal electrode is less than 2%, or the internal electrode penetrates from one main surface side to the other main surface side. In the case of the sample Nos. 6 to 10 in which the content of the columnar segregated material including the perovskite type compound having Ba and Ti exceeds 5%, that is, the sample not satisfying the requirements of the present invention, the coverage is less than 80%. It was confirmed that it was lowered or occurrence of structural defects was observed, which was not preferable.

  In addition, in the case of the sample of sample number 6 among the samples of sample numbers 6 to 10 that do not satisfy the requirements of the present invention, since the blending ratio of the common material is too large, a large amount of the common material remains in the internal electrode, and accordingly The content of the columnar segregated material penetrating the internal electrode was also 5% or more (8%), and the coverage of the internal electrode was reduced to 60%, which was confirmed to be undesirable.

  Moreover, in the case of the sample of sample number 7, since the amount of co-material was small, it was confirmed that the segregated matter in the internal electrode was reduced and the structural defect was increased.

  In the case of sample No. 8, since the rate of temperature decrease is slow, it is confirmed that the common material is discharged in the temperature decreasing step, the proportion of segregated substances scattered in the internal electrode decreases, and the structural defect increases. It was done.

  In the case of samples Nos. 9 and 10, it was confirmed that the number of structural defects increased because the internal electrodes were thin. From this result, it can be seen that when the thickness of the internal electrode is reduced, the influence of the segregated substances scattered increases, and the adverse effect when the thickness falls below the range of the present invention increases.

  From the above results, the requirements of the present invention, the content of segregated matter including a perovskite type compound having Ba and Ti interspersed in the internal electrode is 2% or more, and Ba and Ti penetrate the internal electrode. It was confirmed that a highly reliable multilayer ceramic capacitor can be obtained by satisfying the requirement that the content of the columnar segregated material including the perovskite type compound having 5% or less.

  In addition, this invention is not limited to the said embodiment, A various application and deformation | transformation are possible within the scope of the invention.

10 Capacitor body (ceramic laminate)
DESCRIPTION OF SYMBOLS 11 Dielectric ceramic layer 12 Internal electrode 13a, 13b External electrode 20a Segregated material scattered in internal electrode 20b Columnar segregated material which penetrates internal electrode 50 Multilayer ceramic capacitor L Length of multilayer ceramic capacitor T Height of multilayer ceramic capacitor W Width of multilayer ceramic capacitor

Claims (2)

A ceramic laminate comprising a plurality of dielectric ceramic layers and a plurality of internal electrodes laminated via the dielectric ceramic layers, and an external electrode disposed in the ceramic laminate so as to be electrically connected to the internal electrodes A multilayer ceramic capacitor comprising:
The dielectric ceramic layer includes a perovskite type compound having Ba and Ti,
The internal electrode is
(A) Ni as a main component,
(B) containing a segregated material including a perovskite type compound having Ba and Ti, which is scattered in the internal electrode in such a manner as to be buried in the internal electrode, in a ratio of 2% or more;
(C) A columnar segregated material containing a perovskite type compound having Ba and Ti that penetrates the internal electrode from one main surface side to the other main surface side is contained in a proportion of 5% or less. Characteristic multilayer ceramic capacitor.   The multilayer ceramic capacitor according to claim 1, wherein an average thickness of the internal electrodes is 0.4 μm or less.

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