JP2014064017A - 投影露光システム用の少なくとも1つの磁石を有するアクチュエータ - Google Patents
投影露光システム用の少なくとも1つの磁石を有するアクチュエータ Download PDFInfo
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- KPLQYGBQNPPQGA-UHFFFAOYSA-N cobalt samarium Chemical compound [Co].[Sm] KPLQYGBQNPPQGA-UHFFFAOYSA-N 0.000 description 1
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- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000002427 irreversible effect Effects 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
- G02B26/085—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting means being moved or deformed by electromagnetic means
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0006—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means to keep optical surfaces clean, e.g. by preventing or removing dirt, stains, contamination, condensation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/02—Permanent magnets [PM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/02—Permanent magnets [PM]
- H01F7/0205—Magnetic circuits with PM in general
- H01F7/0221—Mounting means for PM, supporting, coating, encapsulating PM
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/08—Electromagnets; Actuators including electromagnets with armatures
- H01F7/16—Rectilinearly-movable armatures
- H01F7/1607—Armatures entering the winding
- H01F7/1623—Armatures having T-form
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F7/00—Magnets
- H01F7/06—Electromagnets; Actuators including electromagnets
- H01F7/08—Electromagnets; Actuators including electromagnets with armatures
- H01F7/16—Rectilinearly-movable armatures
- H01F7/1638—Armatures not entering the winding
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Public Health (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Micromachines (AREA)
Abstract
【解決手段】投影露光システム用のアクチュエータは少なくとも1つのマニピュレータ表面23と少なくとも1つの磁石及びコイル15と磁石保持板12及びコイル板11とを備える。マニピュレータ表面23は可動である。磁石及びコイル15はマニピュレータ表面23を作動させる。磁石保持板は磁石を取付ける。コイル板11はコイル15を収容する。電流がコイルを流れるとマニピュレータ表面を動かすことができるように磁石を接続する。マニピュレータ表面23を接続材料を用いずに一体接続部又は母材の連続性を保った結合による接続部を介して磁石保持板12に少なくとも部分的に保持する。
【選択図】図4
Description
Claims (7)
- 投影露光システム用のアクチュエータであって、可動である少なくとも1つのマニピュレータ表面(23)と、前記マニピュレータ表面を作動させる少なくとも1つの磁石及びコイルと、前記磁石を取付ける磁石保持板(12)及び前記コイル(15)を収容するコイル板(11)とを備え、電流が前記コイルを流れると、前記磁石を、したがって前記マニピュレータ表面を動かすことができるように、これらを互いに接続した、アクチュエータにおいて、
前記マニピュレータ表面を、付加的な接続材料を用いずに一体接続部又は母材の連続性を保った結合による接続部を介して、前記磁石保持板に少なくとも部分的に保持したことを特徴とする、アクチュエータ。 - 請求項1に記載のアクチュエータにおいて、
前記マニピュレータ表面を前記磁石に対向するよう構成したことを特徴とする、アクチュエータ。 - 請求項1又は2に記載のアクチュエータにおいて、
前記マニピュレータ表面を、前記磁石用のハウジング又はカプセルハウジングにより少なくとも部分的に形成したことを特徴とする、アクチュエータ。 - 請求項1から3のいずれか1項に記載のアクチュエータにおいて、
一方で前記マニピュレータ表面及び/又は前記磁石ハウジングと、他方で前記磁石保持板の少なくとも1つの取付領域との間の接続部を、少なくとも1つのばね棒により形成したことを特徴とする、アクチュエータ。 - 請求項1から4のいずれか1項に記載のアクチュエータにおいて、
前記マニピュレータ表面及び/又は前記磁石ハウジング、前記ばね棒及び/又は前記取付領域を、前記磁石保持板の固体材料からマイクロパターニングプロセスにより加工したことを特徴とする、アクチュエータ。 - 請求項1から5のいずれか1項に記載のアクチュエータにおいて、
スペーサ及びミラーを前記マニピュレータ表面に配置したことを特徴とする、アクチュエータ。 - 請求項1から6のいずれか1項に記載のアクチュエータにおいて、
前記磁石保持板及び前記コイル板を、母材の連続性を保った結合による接続部及び/又は接続材料を介して互いに接続したことを特徴とする、アクチュエータ。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009008209A DE102009008209A1 (de) | 2009-02-10 | 2009-02-10 | Aktuator mit mindestens einem Magneten für eine Projektionsbelichtungsanlage sowie Projektionsbelichtungsanlage mit einem Magneten und Herstellungsverfahren hierfür |
| DE102009008209.3 | 2009-02-10 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| JP2011548661A Division JP5411296B2 (ja) | 2009-02-10 | 2010-02-02 | 投影露光システム用の少なくとも1つの磁石を有するアクチュエータ、その製造方法、及び磁石を有する投影露光システム |
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| JP2014064017A true JP2014064017A (ja) | 2014-04-10 |
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| JP2011548661A Active JP5411296B2 (ja) | 2009-02-10 | 2010-02-02 | 投影露光システム用の少なくとも1つの磁石を有するアクチュエータ、その製造方法、及び磁石を有する投影露光システム |
| JP2013230965A Pending JP2014064017A (ja) | 2009-02-10 | 2013-11-07 | 投影露光システム用の少なくとも1つの磁石を有するアクチュエータ |
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| Country | Link |
|---|---|
| US (1) | US9025128B2 (ja) |
| JP (2) | JP5411296B2 (ja) |
| KR (1) | KR101552754B1 (ja) |
| CN (1) | CN102388343B (ja) |
| DE (1) | DE102009008209A1 (ja) |
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| US9083227B2 (en) * | 2011-09-09 | 2015-07-14 | Asml Holding N.V. | Linear motor and lithography arrangement including linear motor |
| CN105841718B (zh) * | 2015-01-29 | 2020-08-04 | 万渡江 | 一种跌倒传感器 |
| CN109972027A (zh) * | 2018-12-24 | 2019-07-05 | 南昌航空大学 | 一种通过低熔点PrCu晶间相添加制备各向异性CeFeB永磁合金的方法 |
| DE102023203205A1 (de) * | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Verfahren zur Herstellung eines MEMS-Spiegelarrays und MEMS-Spiegelarray |
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Also Published As
| Publication number | Publication date |
|---|---|
| US20120008121A1 (en) | 2012-01-12 |
| KR20110126677A (ko) | 2011-11-23 |
| WO2010091977A1 (de) | 2010-08-19 |
| KR101552754B1 (ko) | 2015-09-11 |
| CN102388343A (zh) | 2012-03-21 |
| US9025128B2 (en) | 2015-05-05 |
| JP2012517695A (ja) | 2012-08-02 |
| CN102388343B (zh) | 2015-01-21 |
| JP5411296B2 (ja) | 2014-02-12 |
| DE102009008209A1 (de) | 2010-08-19 |
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